CN105954662A - 一种功率二极管反向击穿电压分级测试装置 - Google Patents
一种功率二极管反向击穿电压分级测试装置 Download PDFInfo
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- CN105954662A CN105954662A CN201610443741.6A CN201610443741A CN105954662A CN 105954662 A CN105954662 A CN 105954662A CN 201610443741 A CN201610443741 A CN 201610443741A CN 105954662 A CN105954662 A CN 105954662A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
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CN105954662B CN105954662B (zh) | 2017-04-12 |
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Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106841970A (zh) * | 2017-03-02 | 2017-06-13 | 成都优博创通信技术股份有限公司 | 计算apd击穿电压的方法及其电路 |
CN107774590A (zh) * | 2017-10-31 | 2018-03-09 | 南通皋鑫电子股份有限公司 | 一种高压二极管管芯筛选系统 |
CN109492324A (zh) * | 2018-11-25 | 2019-03-19 | 西北工业大学 | 基于载波的d类放大器双积分滑模控制器设计方法及电路 |
CN109696617A (zh) * | 2019-02-13 | 2019-04-30 | 中国科学院半导体研究所 | 电信号侦测电路和装置 |
CN111426927A (zh) * | 2018-12-24 | 2020-07-17 | 东南大学 | 一种功率半导体器件动态电学应力施加装置及测试方法 |
CN113030676A (zh) * | 2021-02-26 | 2021-06-25 | 陕西三海测试技术开发有限责任公司 | 一种基于临近颗粒法的二极管三极管晶圆测试方法 |
CN109444552B (zh) * | 2018-11-28 | 2021-12-28 | 航天新长征大道科技有限公司 | 一种火工品电阻测试装置和火工品电阻测试方法 |
US11733296B2 (en) | 2020-04-17 | 2023-08-22 | Honeywell Federal Manufacturing & Technologies, Llc | Screening method for pin diodes used in microwave limiters |
CN116699568A (zh) * | 2023-07-28 | 2023-09-05 | 中测国检(北京)科技有限责任公司 | 一种基于雪崩二极管的测距频率检测用光电转换装置 |
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JPH09269354A (ja) * | 1996-04-02 | 1997-10-14 | Fuji Electric Co Ltd | 半導体素子のオフ動作特性試験方法 |
CN101109783A (zh) * | 2006-07-18 | 2008-01-23 | 杨少辰 | 一种发光二极管的电性参数测试电路 |
CN103048600A (zh) * | 2012-12-05 | 2013-04-17 | 电子科技大学 | 一种半导体器件反向击穿电压测试系统 |
CN103389451A (zh) * | 2013-07-24 | 2013-11-13 | 广东瑞谷光纤通信有限公司 | 一种雪崩光电二极管的测试方法及测试装置 |
CN104297657A (zh) * | 2014-10-22 | 2015-01-21 | 温州大学 | 数字化大功率微波二极管反向动态波形及损耗功率测试系统 |
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2016
- 2016-06-18 CN CN201610443741.6A patent/CN105954662B/zh active Active
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JPH09269354A (ja) * | 1996-04-02 | 1997-10-14 | Fuji Electric Co Ltd | 半導体素子のオフ動作特性試験方法 |
CN101109783A (zh) * | 2006-07-18 | 2008-01-23 | 杨少辰 | 一种发光二极管的电性参数测试电路 |
CN103048600A (zh) * | 2012-12-05 | 2013-04-17 | 电子科技大学 | 一种半导体器件反向击穿电压测试系统 |
CN103389451A (zh) * | 2013-07-24 | 2013-11-13 | 广东瑞谷光纤通信有限公司 | 一种雪崩光电二极管的测试方法及测试装置 |
CN104297657A (zh) * | 2014-10-22 | 2015-01-21 | 温州大学 | 数字化大功率微波二极管反向动态波形及损耗功率测试系统 |
Non-Patent Citations (1)
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黄飞: "APD雪崩二极管测试系统的设计与实现", 《武汉理工大学硕士学位论文》 * |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106841970A (zh) * | 2017-03-02 | 2017-06-13 | 成都优博创通信技术股份有限公司 | 计算apd击穿电压的方法及其电路 |
CN107774590A (zh) * | 2017-10-31 | 2018-03-09 | 南通皋鑫电子股份有限公司 | 一种高压二极管管芯筛选系统 |
CN109492324A (zh) * | 2018-11-25 | 2019-03-19 | 西北工业大学 | 基于载波的d类放大器双积分滑模控制器设计方法及电路 |
CN109492324B (zh) * | 2018-11-25 | 2020-11-17 | 西北工业大学 | 基于载波的d类放大器双积分滑模控制器设计方法及电路 |
CN109444552B (zh) * | 2018-11-28 | 2021-12-28 | 航天新长征大道科技有限公司 | 一种火工品电阻测试装置和火工品电阻测试方法 |
CN111426927A (zh) * | 2018-12-24 | 2020-07-17 | 东南大学 | 一种功率半导体器件动态电学应力施加装置及测试方法 |
CN111426927B (zh) * | 2018-12-24 | 2022-06-21 | 东南大学 | 一种功率半导体器件动态电学应力施加装置及测试方法 |
CN109696617A (zh) * | 2019-02-13 | 2019-04-30 | 中国科学院半导体研究所 | 电信号侦测电路和装置 |
CN109696617B (zh) * | 2019-02-13 | 2024-05-07 | 中国科学院半导体研究所 | 电信号侦测电路和装置 |
US11733296B2 (en) | 2020-04-17 | 2023-08-22 | Honeywell Federal Manufacturing & Technologies, Llc | Screening method for pin diodes used in microwave limiters |
CN113030676A (zh) * | 2021-02-26 | 2021-06-25 | 陕西三海测试技术开发有限责任公司 | 一种基于临近颗粒法的二极管三极管晶圆测试方法 |
CN116699568A (zh) * | 2023-07-28 | 2023-09-05 | 中测国检(北京)科技有限责任公司 | 一种基于雪崩二极管的测距频率检测用光电转换装置 |
CN116699568B (zh) * | 2023-07-28 | 2024-01-12 | 中测国检(北京)科技有限责任公司 | 一种基于雪崩二极管的测距频率检测用光电转换装置 |
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Effective date of registration: 20180426 Address after: 515426 Jieyang County, Guangdong province Jiexi town Longtan Town, the village under the ridge. Patentee after: JIEYANG SHENKE ELECTRONIC CO.,LTD. Address before: 518000 Guangdong Shenzhen Longhua New District big wave street Longsheng community Tenglong road gold rush e-commerce incubation base exhibition hall E commercial block 706 Patentee before: Shenzhen Meliao Technology Transfer Center Co.,Ltd. |
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Address after: 515426 Jieyang County, Guangdong province Jiexi town Longtan Town, the village under the ridge. Patentee after: Guangdong Shenke Electronics Co.,Ltd. Address before: 515426 Jieyang County, Guangdong province Jiexi town Longtan Town, the village under the ridge. Patentee before: JIEYANG SHENKE ELECTRONIC CO.,LTD. |