CN105954589B - 一种多芯片系统的相位测量方法及装置 - Google Patents
一种多芯片系统的相位测量方法及装置 Download PDFInfo
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- CN105954589B CN105954589B CN201610246985.5A CN201610246985A CN105954589B CN 105954589 B CN105954589 B CN 105954589B CN 201610246985 A CN201610246985 A CN 201610246985A CN 105954589 B CN105954589 B CN 105954589B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
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CN105954589B true CN105954589B (zh) | 2019-03-22 |
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CN113759166B (zh) * | 2021-09-09 | 2024-01-05 | 林永成 | 电力系统中功率因数的检测方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101706527A (zh) * | 2009-10-30 | 2010-05-12 | 西安交通大学 | 基于电流高频分量时频特征的电弧故障检测方法 |
CN101813725A (zh) * | 2010-04-15 | 2010-08-25 | 南京邮电大学 | 一种低频率信号的相位差测量方法 |
CN102095934A (zh) * | 2010-12-17 | 2011-06-15 | 南京邮电大学 | 一种交流电信号的相位差测量方法 |
CN102778606A (zh) * | 2012-07-26 | 2012-11-14 | 南京邮电大学 | 一种交流电的瞬时相位的数字化测量方法 |
CN204666727U (zh) * | 2015-05-22 | 2015-09-23 | 淮安苏达电气有限公司 | 基于gps的大型地网接地阻抗测量装置 |
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101706527A (zh) * | 2009-10-30 | 2010-05-12 | 西安交通大学 | 基于电流高频分量时频特征的电弧故障检测方法 |
CN101813725A (zh) * | 2010-04-15 | 2010-08-25 | 南京邮电大学 | 一种低频率信号的相位差测量方法 |
CN102095934A (zh) * | 2010-12-17 | 2011-06-15 | 南京邮电大学 | 一种交流电信号的相位差测量方法 |
CN102778606A (zh) * | 2012-07-26 | 2012-11-14 | 南京邮电大学 | 一种交流电的瞬时相位的数字化测量方法 |
CN204666727U (zh) * | 2015-05-22 | 2015-09-23 | 淮安苏达电气有限公司 | 基于gps的大型地网接地阻抗测量装置 |
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Address after: 310053 Binjiang District, Hangzhou, No. six and road, a building (North), building B4004, room, four Applicant after: Hangzhou Wan Hi-Tech Co.,Ltd. Address before: 310053 Binjiang District, Hangzhou, No. six and road, a building (North), building four, B4004, Applicant before: Wangao (Hangzhou) Technology Co.,Ltd. |
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Application publication date: 20160921 Assignee: Ningbo Yijie Microelectronics Co.,Ltd. Assignor: Hangzhou Wan Hi-Tech Co.,Ltd. Contract record no.: X2022980018687 Denomination of invention: A Phase Measurement Method and Device for Multichip System Granted publication date: 20190322 License type: Common License Record date: 20221026 |