CN105867075B - 毛细管放电z箍缩极紫外光光刻光源的收集系统 - Google Patents
毛细管放电z箍缩极紫外光光刻光源的收集系统 Download PDFInfo
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- CN105867075B CN105867075B CN201610444231.0A CN201610444231A CN105867075B CN 105867075 B CN105867075 B CN 105867075B CN 201610444231 A CN201610444231 A CN 201610444231A CN 105867075 B CN105867075 B CN 105867075B
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2004—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2008—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the reflectors, diffusers, light or heat filtering means or anti-reflective means used
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70033—Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70175—Lamphouse reflector arrangements or collector mirrors, i.e. collecting light from solid angle upstream of the light source
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Microscoopes, Condenser (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
层数 | 10 | 9 | 8 | 7 | 6 |
xA | -650.0000 | -664.8980 | -675.6770 | -683.6900 | -689.7694 |
yA | 173.2051 | 152.8036 | 135.4877 | 120.6155 | 107.7159 |
xR | -717.1675 | -728.3411 | -736.2967 | -742.1440 | -746.5437 |
yR | 222.3171 | 192.2628 | 168.0774 | 148.0794 | 131.2124 |
xB | -858.8445 | -858.8445 | -858.8445 | -858.8445 | -858.8445 |
yB | 228.8557 | 197.3754 | 172.2167 | 151.5159 | 134.1191 |
层数 | 5 | 4 | 3 | 2 | 1 |
xA | -694.4542 | -698.1084 | -700.9859 | -703.2686 | -705.0905 |
yA | 96.4375 | 86.5126 | 77.7332 | 69.9342 | 62.9827 |
xR | -749.9132 | -752.5289 | -754.5810 | -756.2044 | -757.4971 |
yR | 116.7726 | 104.2694 | 93.3473 | 83.7402 | 75.2436 |
xB | -858.8445 | -858.8445 | -858.8445 | -858.8445 | -858.8445 |
yB | 119.2661 | 106.4317 | 95.2383 | 85.4050 | 76.7169 |
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610444231.0A CN105867075B (zh) | 2016-06-20 | 2016-06-20 | 毛细管放电z箍缩极紫外光光刻光源的收集系统 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610444231.0A CN105867075B (zh) | 2016-06-20 | 2016-06-20 | 毛细管放电z箍缩极紫外光光刻光源的收集系统 |
Publications (2)
Publication Number | Publication Date |
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CN105867075A CN105867075A (zh) | 2016-08-17 |
CN105867075B true CN105867075B (zh) | 2017-10-03 |
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Application Number | Title | Priority Date | Filing Date |
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CN201610444231.0A Active CN105867075B (zh) | 2016-06-20 | 2016-06-20 | 毛细管放电z箍缩极紫外光光刻光源的收集系统 |
Country Status (1)
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CN (1) | CN105867075B (zh) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5076349B2 (ja) * | 2006-04-18 | 2012-11-21 | ウシオ電機株式会社 | 極端紫外光集光鏡および極端紫外光光源装置 |
CN104570623A (zh) * | 2015-02-16 | 2015-04-29 | 哈尔滨工业大学 | Xe介质毛细管放电检测用极紫外光源的光学收集系统 |
CN104619104B (zh) * | 2015-02-16 | 2017-03-01 | 哈尔滨工业大学 | Xe介质毛细管放电检测用极紫外光源系统 |
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2016
- 2016-06-20 CN CN201610444231.0A patent/CN105867075B/zh active Active
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CN105867075A (zh) | 2016-08-17 |
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Effective date of registration: 20230224 Address after: 150027 Room 412, Unit 1, No. 14955, Zhongyuan Avenue, Building 9, Innovation and Entrepreneurship Plaza, Science and Technology Innovation City, Harbin Hi tech Industrial Development Zone, Heilongjiang Province Patentee after: Heilongjiang Industrial Technology Research Institute Asset Management Co.,Ltd. Address before: Building 9, accelerator, 14955 Zhongyuan Avenue, Songbei District, Harbin City, Heilongjiang Province Patentee before: INDUSTRIAL TECHNOLOGY Research Institute OF HEILONGJIANG PROVINCE |