A kind of measuring device of satellite difference current potential
Technical field
The present invention relates to satellite protection field more particularly to a kind of surveys of the satellite difference current potential for middle high orbit satellite
Measure device.
Background technique
Satellite surface due to the adhewsive action of space plasma, charge by the surface that will form similar ground electrostatic charging,
Surface charging will cause between satellite and space environment there are potential difference, this i.e. satellite surface floating potential.When satellite surface with
Occur excessive potential difference between space environment, for example, minus 20,000 volts of high pressures can be caused in satellite, thus can
Cause between satellite surface and space environment or surface different piece between since current potential difference is excessive and Discharge Phenomena
(i.e. such as the static discharge on ground), or cause the apparatus measures of satellite inaccurate.Static discharge can release current impulse, electricity
Magnetic field impulse and thermal pulse, current impulse and electromagnetic pulse all can directly or indirectly be coupled into satellite electron system, and interference is even
Injure safety satellite.Therefore, it is necessary to measure satellite surface charging, so that the protection design and fortune pipe for satellite provide technology and build
View.
Satellite structure after satellite surface charging current potential between space plasma be referred to as satellite structure current potential,
Current potential at different surfaces after satellite surface charging between satellite structure ground is referred to as satellite difference current potential, and satellite is filled
For discharge of electricity detection, the measurement for satellite difference current potential is one of important content.
Currently, the potential measurement of satellite surface charging can be using by Langmuir probe method, capacitance partial pressure method, coulostatic analysis
The methods of device method and approach are realized.Comparatively, Langmuir probe method measurement accuracy is high, but the potential range that can be measured
It is narrow;Capacitance partial pressure method measuring principle is simple, simple for structure, but capacitance partial pressure method measurement is sample and non-satellite skin-surface;
Electrostatic analyzer method measuring principle understands, technology maturation, but opposed configuration is complicated.
Summary of the invention
Therefore, in order to overcome the above problem, the present invention provides a kind of satellite difference potential test device, comprising: collimator,
Accelerate aperture plate, sensor, electronics and casing, in which: accelerating aperture plate includes two layers, this two layers acceleration aperture plate is added respectively
Strong electrical field is formed in the cavity that different high pressures are carried to accelerate aperture plate to be constituted at two layers, after space electronic enters acceleration aperture plate
It is accelerated;Sensor includes at least a piece of semiconductor transducer, when space electronic enters the semiconductor transducer due to loss
Energy and evoke electric signal pulse in its two lateral electrode;The electric signal that electronics are used to provide sensor is handled,
It to provide the signal of reflection space electronic sedimentary energy in sensor, and analyzes and obtains the energy of space electronic, measurement enters
The power spectrum of the space electronic of measuring device of the present invention, and the energy where the peak value of the power spectrum according to the space electronic measured
Point obtains satellite difference potential value.
One embodiment of measuring device according to the present invention, electronics include: main amplifier, for will all the way at
The signal of shape circuit output amplifies;Circuit is protected at peak, for carrying out peak value of pulse holding to the amplified signal of main amplifier;
A/D Acquisition Circuit, for carrying out analog-to-digital conversion to the signal after peak holding;FPGA circuitry, for all A/D to be acquired electricity
The digital signal that rood arrives carries out height analysis and data processing, wherein different amplitudes represents the electronics or matter of different-energy
Son.
Another embodiment of measuring device according to the present invention, electronics include: main amplifier, and being used for will all the way
The signal of wave-shaping circuit output amplifies;Circuit is protected at peak, for carrying out peak value of pulse guarantor to the amplified signal of main amplifier
It holds;A/D Acquisition Circuit, for carrying out analog-to-digital conversion to the signal after peak holding;FPGA circuitry, for adopting all A/D
The digital signal that collector obtains carries out height analysis and data processing, wherein different amplitudes represents the electronics of different-energy
Or proton;The charge signal of preamplifier, the reaction charged particle sedimentary energy for exporting sensor amplifies simultaneously
It is transformed into voltage pulse signal;And wave-shaping circuit, the voltage pulse signal for exporting preamplifier shape output.
Preferably, measuring device of the invention is embeddedly mounted on satellite surface, and its outer surface and satellite external surface
Vertical height difference is less than ± 2mm.
Preferably, in measuring device of the invention, the depth of parallelism of aperture plate and sensor is accelerated to be not less than 30 degree, to avoid
Cause accelerating field distortion to cause measurement error to be amplified as far as possible.
Preferably, in measuring device of the invention, accelerating grid Netcom crosses aperture among metal film and is made;When respectively
Secondly forming strong electrical field in the internal cavities that two layers of aperture plate are constituted when layer aperture plate loads high pressure;And aperture plate is for space electricity
The transmitance of son is not less than 30%.
Preferably, in measuring device of the invention, semiconductor transducer uses to be greater than 0.1mm, be less than 3mm, spirit
Quick area is not less than the silicon or diamond class sensor of 2mm × 2mm, and the corresponding preamplifier of semiconductor transducer is using integrated
Amplifier capacitive feedback mode.
Preferably, the electrical ground potential of measuring device of the invention and the ground potential of the whole star structure of satellite are consistent, or
Potential difference is known definite value between person.
Optionally, measuring device of the invention also includes satellite interface circuit, for being communicated with satellite bus.
The spy that satellite difference potential test device of the invention has simple opposed configuration, clear principle, installation requirement low
Point.It may be mounted on all kinds of satellites of middle high orbit, for measuring the surface of satellite surface covering or other component and defending
Star structurally between potential difference.
Detailed description of the invention
Fig. 1 is the schematic diagram of the installation site of satellite difference potential test device of the invention on satellite.
Relation schematic diagram of the Fig. 2 between satellite surface position and the current potential of space plasma.
Fig. 3 is the structural schematic diagram of a preferred embodiment of the different potential test device of satellite of the invention.
Fig. 4 be satellite difference potential test device of the invention a preferred embodiment in include acceleration aperture plate bow
View.
Fig. 5 is the electrical realization principle frame of a preferred embodiment of satellite difference potential test device according to the present invention
Figure.
Appended drawing reference
1, measurable secondary electron 2, measuring device 3, satellite surface
4, space plasma sheaths 5, space plasma current potential 6, satellite structure current potential
7, satellite surface current potential 8, satellite surface secondary electron 9, collimator
10, accelerate aperture plate 11, sensor 12, casing
13, electronics
Specific embodiment
Satellite difference potential test device of the present invention is described in detail with reference to the accompanying drawings and examples.
Fig. 1 shows the schematic diagram of the installation site of satellite difference potential test device of the invention on satellite, measurement
Device 2 is embeddedly mounted on satellite surface 3, and its outer surface differs with the vertical height of satellite external surface 3 and is less than ± 2mm.
Space plasma sheaths 4 are the region that space plasma is disturbed by satellite, and plasma potential is uneven in the region
It is even, one is presented from satellite surface is high and gradually decreases to inside satellite distribution.
Fig. 2 be the present invention relates to satellite surface different parts between and between space plasma electric potential relation is shown
It is intended to.As shown in Fig. 2, being zero potential with undisturbed space plasma current potential 5, satellite surface current potential 7 is negative potential, because
It is higher and be charged to the magnitude negative potential of -20kV to be typically due to space plasma temperature in the satellite of middle high orbit.In addition
Satellite surface current potential 7 can be caused inconsistent with the ground potential of satellite structure due to differences such as secondary electron reflectivity, capacitors.When defending
When star catalogue face is irradiated by space ion or sunlight, secondary electron can be released, electron temperature is eV magnitude, and appearance is presented
It is worth the electron Spectrum in eV magnitude, these secondary electrons will receive the attraction of other high potentials and fly to elsewhere, such as high electricity
The measuring device of the space plasma of position or opposite high potential, secondary electron during flying to measuring device can constantly by
To surface differences charging potential difference acceleration and obtain energy, so as to cause reach measuring device secondary electron compare satellite surface
The power spectrum of secondary electron integrally shifts.In this way, according to the electron spectrum that measuring device obtains, according to above-mentioned energy spectral migration machine
System, can provide difference current potential size.
Fig. 3 is the structural schematic diagram of a preferred embodiment of satellite difference potential test device of the invention.Such as Fig. 3 institute
Show, comprising: collimator 9 accelerates aperture plate 10, sensor 11, casing 12 and electronics 13, in which: accelerate the aperture plate 10 to include
Two layers, this two layers of aperture plate is loaded different high pressures respectively to form strong electrical field in the cavity that two layers of aperture plate is constituted, empty
Between electronics enter accelerate aperture plate after due to strong electrical field effect and be accelerated;Sensor 11 includes at least a piece of semiconductor sensing
Device evokes electric signal pulse in its two lateral electrode due to off-energy when space electronic enters the semiconductor transducer;Electricity
Electric signal of the sub- department of the Chinese Academy of Sciences point 13 for providing sensor 11 is handled, and is sunk in sensor 11 with providing reflection space electronic
The signal of product energy, and analyze and obtain the energy of electronics.Measurement obtain enter this measuring device space electronic power spectrum, and according to
According to the energy point where the peak value of the space electronic power spectrum measured, satellite difference potential value is obtained.
In one embodiment of the invention, the depth of parallelism of aperture plate and sensor is accelerated to be not less than 30 degree, to avoid causing
Accelerating field distortion to cause measurement error to be amplified as far as possible.
One embodiment of measuring device according to the present invention, electronics 13 include: main amplifier, and being used for will all the way
The signal that the signal of wave-shaping circuit output or the signal of two-way wave-shaping circuit output export after adder circuit amplifies;Peak
Circuit is protected, for carrying out peak value of pulse holding respectively to the amplified signal of each main amplifier;A/D Acquisition Circuit, for pair
Signal after peak holding carries out analog-to-digital conversion;FPGA circuitry, digital signal for obtaining all A/D Acquisition Circuits into
Line amplitude analysis and data processing, wherein different amplitudes represents the electronics or proton of different-energy.
One embodiment of measuring device according to the present invention, electronics 13 further include preamplifier and forming electricity
Road, preamplifier are used to amplify the charge signal for the reaction charged particle sedimentary energy that sensor exports respectively and turn
Become voltage pulse signal, the voltage pulse signal forming output that wave-shaping circuit exports preamplifier.It is according to the present invention
One preferred embodiment, when which is mounted on satellite, outer surface is concordant with satellite external surface.
In one embodiment of the present of invention, semiconductor transducer uses to be greater than 0.1mm, be less than 3mm, sensitive area
Silicon or diamond class sensor not less than 2mm × 2mm, the corresponding preamplifier of semiconductor transducer is using integrated transporting discharging electricity
Hold feedback system.
Fig. 4 be satellite difference potential test device according to the present invention a preferred embodiment in include acceleration aperture plate
Top view.In this preferred embodiment, aperture plate is accelerated to be made of the metal material of such as stainless steel, and the two is preferably complete
In parallel, if the two is not exclusively parallel, that is, certain angle is presented, then will lead to accelerating field distortion so as to cause measurement error
Become larger, the measurement bigger error of angle is bigger.Transmitance for space electronic is 90%.Alternatively, measurement of the invention dress
Aperture plate is accelerated to be not less than 30% to the transmitance of space electronic in setting.
Preferably, in measuring device of the invention, the electrical ground potential of device and the ground potential of the whole star structure of satellite are kept
Unanimously, or between potential difference be known definite value.
According to one embodiment of present invention, semiconductor transducer uses with a thickness of 0.3mm ion implantation type Si-PIN, spirit
Quick area's diameter is 12mm, and the corresponding preamplifier of semiconductor transducer uses integrated transporting discharging capacitive feedback mode.
Optionally, measuring device of the invention also includes satellite interface circuit, for being communicated with satellite bus.
Fig. 5 show the electrical realization principle block diagram of measuring device according to an embodiment of the invention, wherein dotted line
In all parts constitute the measuring device.Specifically, space electronic successively enters sensor 11 after accelerating aperture plate 10,
In 11 internal loss energy of sensor, then evoke electric signal pulse in two lateral electrode of sensor.Utilize pre-amplification circuit, forming
Circuit, main amplifying circuit are amplified to electric signal and shaping, and peak is finally recycled to protect the variation peak value that circuit obtains voltage, and
The variation peak value that will acquire gives A/D Acquisition Circuit.A/D Acquisition Circuit output end is connected with the input terminal of FPGA circuitry, FPGA
Circuit is combined processing to signal, and then FPGA circuitry transmits the data to satellite electron system by satellite interface circuit
System.
It should be noted last that the above examples are only used to illustrate the technical scheme of the present invention and are not limiting.Although ginseng
It is described the invention in detail according to embodiment, those skilled in the art should understand that, to technical side of the invention
Case is modified or replaced equivalently, and without departure from the spirit and scope of technical solution of the present invention, should all be covered in the present invention
Scope of the claims in.