CN105701793B - 用于数字化真实材料外观的方法及装置 - Google Patents

用于数字化真实材料外观的方法及装置 Download PDF

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CN105701793B
CN105701793B CN201510917597.0A CN201510917597A CN105701793B CN 105701793 B CN105701793 B CN 105701793B CN 201510917597 A CN201510917597 A CN 201510917597A CN 105701793 B CN105701793 B CN 105701793B
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CN105701793A (zh
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马丁·伦普
贝亚特·弗里克
艾德里安·科勒布伦纳
克里斯多夫·施瓦兹
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X Rite Switzerland GmbH
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/00Three-dimensional [3D] image rendering
    • G06T15/10Geometric effects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/57Measuring gloss
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00Indexing scheme for image data processing or generation, in general
    • G06T2200/04Indexing scheme for image data processing or generation, in general involving 3D image data

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  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Computer Graphics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
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  • Signal Processing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201510917597.0A 2014-12-11 2015-12-10 用于数字化真实材料外观的方法及装置 Active CN105701793B (zh)

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EP14197409.7 2014-12-11
EP14197409.7A EP3032241B1 (en) 2014-12-11 2014-12-11 Method and apparatus for digitizing the appearance of a real material

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CN105701793A CN105701793A (zh) 2016-06-22
CN105701793B true CN105701793B (zh) 2021-05-28

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US (2) US10026215B2 (https=)
EP (1) EP3032241B1 (https=)
JP (1) JP6661336B2 (https=)
CN (1) CN105701793B (https=)
DE (1) DE202015102081U1 (https=)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6604744B2 (ja) * 2015-05-03 2019-11-13 キヤノン株式会社 画像処理装置、画像処理方法、画像形成システム及びプログラム
US10564096B2 (en) * 2015-09-14 2020-02-18 University Of Florida Research Foundation, Incorporated Method for measuring bi-directional reflectance distribution function (BRDF) and associated device
US20170109895A1 (en) * 2015-10-19 2017-04-20 Honeywell International Inc. Apparatus and method for measuring haze of sheet materials or other materials using off-axis detector
US11170514B2 (en) * 2015-10-27 2021-11-09 Canon Kabushiki Kaisha Image processing apparatus, image processing method, 3D printing system, and storage medium
CZ307214B6 (cs) * 2016-11-30 2018-03-28 ÄŚeskĂ© vysokĂ© uÄŤenĂ­ technickĂ© v Praze Přenosné zařízení pro měření geometrie objektu a prostorově proměnné funkce odrazivosti na povrchu vzorku s multiplikací prvků podílejících se na zobrazování a snímacích systémů na pohyblivých ramenech umožňující terénní měření
US10636140B2 (en) * 2017-05-18 2020-04-28 Applied Materials Israel Ltd. Technique for inspecting semiconductor wafers
JP6950544B2 (ja) * 2018-01-17 2021-10-13 トヨタ自動車株式会社 シミュレーション装置、反射特性の推定方法、及びプログラム
US11209360B2 (en) 2018-03-16 2021-12-28 Konica Minolta, Inc. Color tone quantification device for glossy color, color tone measurement device for glossy color and color tone quantification method for glossy color
WO2019182906A1 (en) 2018-03-17 2019-09-26 Nvidia Corporation Shadow denoising in ray-tracing applications
US11436791B2 (en) * 2018-04-30 2022-09-06 The Regents Of The University Of California Methods and systems for acquiring svBRDF measurements
JP7087687B2 (ja) * 2018-06-01 2022-06-21 株式会社サタケ 穀物の光沢測定装置
KR102599207B1 (ko) * 2018-07-20 2023-12-15 삼성전자 주식회사 전자 디바이스의 표면 측정 장치 및 방법
US10991079B2 (en) 2018-08-14 2021-04-27 Nvidia Corporation Using previously rendered scene frames to reduce pixel noise
US10883823B2 (en) 2018-10-18 2021-01-05 Cyberoptics Corporation Three-dimensional sensor with counterposed channels
US11295969B2 (en) 2018-11-27 2022-04-05 International Business Machines Corporation Hybridization for characterization and metrology
US11480868B2 (en) 2019-03-22 2022-10-25 International Business Machines Corporation Determination of optical roughness in EUV structures
KR102894125B1 (ko) * 2019-06-28 2025-12-04 주식회사 고영테크놀러지 대상체의 3차원 형상을 결정하기 위한 장치 및 방법
JP7326972B2 (ja) * 2019-07-30 2023-08-16 株式会社リコー 表面特性評価方法、表面特性評価装置、及び表面特性評価プログラム
US10805549B1 (en) * 2019-08-20 2020-10-13 Himax Technologies Limited Method and apparatus of auto exposure control based on pattern detection in depth sensing system
EP4078148B1 (en) * 2019-12-19 2024-02-07 Teknologian Tutkimuskeskus VTT OY Method and apparatus for determining the quality of fresh concrete or the like
JP7411928B2 (ja) * 2019-12-26 2024-01-12 株式会社Rutilea 物品撮影装置
WO2022002676A1 (en) * 2020-06-29 2022-01-06 Basf Coatings Gmbh Uses of a bi-directional texture function
CN113138027A (zh) * 2021-05-07 2021-07-20 东南大学 一种基于双向折射率分布函数的远红外非视域物体定位方法
EP4184145B1 (de) * 2021-11-17 2023-08-30 KRÜSS GmbH, Wissenschaftliche Laborgeräte Vorrichtung zur erfassung einer geometrie eines auf einer probenoberfläche angeordneten tropfens
JP7800196B2 (ja) * 2022-02-21 2026-01-16 日本電気株式会社 外観検査装置、外観検査装置の制御方法、および外観検査装置の制御プログラム

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0452905A1 (en) * 1990-04-18 1991-10-23 Hitachi, Ltd. Method and apparatus for inspecting surface pattern of object
CN1364230A (zh) * 1999-06-01 2002-08-14 加拿大国家研究委员会 三维光扫描
US20030231174A1 (en) * 2002-06-17 2003-12-18 Wojciech Matusik Modeling and rendering of surface reflectance fields of 3D objects
US20080232679A1 (en) * 2005-08-17 2008-09-25 Hahn Daniel V Apparatus and Method for 3-Dimensional Scanning of an Object
CN103649677A (zh) * 2011-07-13 2014-03-19 法罗技术股份有限公司 利用空间光调制器来查找物体的三维坐标的装置和方法
WO2014091214A1 (en) * 2012-12-12 2014-06-19 The University Of Birmingham Surface geometry imaging

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2353512A (en) * 1943-05-05 1944-07-11 Simmon Alfred Photographic enlarger
DE1489395B2 (de) * 1965-06-01 1971-07-22 Maehler & Kaege Elektrotechnische Spezialfabnk AG, 6507 Ingelheim Abblendbare kontrolleuchte
US5710876A (en) * 1995-05-25 1998-01-20 Silicon Graphics, Inc. Computer graphics system for rendering images using full spectral illumination data
US6084663A (en) * 1997-04-07 2000-07-04 Hewlett-Packard Company Method and an apparatus for inspection of a printed circuit board assembly
GB9911266D0 (en) * 1999-05-15 1999-07-14 Metcalfe Nicholas Display apparatus
US6950104B1 (en) * 2000-08-30 2005-09-27 Microsoft Corporation Methods and systems for animating facial features, and methods and systems for expression transformation
US7102647B2 (en) * 2001-06-26 2006-09-05 Microsoft Corporation Interactive horizon mapping
JP4335589B2 (ja) * 2002-06-27 2009-09-30 ミツビシ・エレクトリック・リサーチ・ラボラトリーズ・インコーポレイテッド 3dオブジェクトをモデル化する方法
CN101184986B (zh) * 2005-04-25 2012-06-13 爱色丽公司 使用空间欠采样双向反射分布功能测量表面的外观属性
JP5251678B2 (ja) * 2009-03-31 2013-07-31 ソニー株式会社 外観検査用照明装置および外観検査装置
CN101901302A (zh) * 2010-07-16 2010-12-01 中国人民解放军信息工程大学 复杂空间目标光散射建模方法
CN102175012A (zh) * 2011-03-17 2011-09-07 赵景琪 一种光源调整装置
WO2014153022A1 (en) * 2013-03-14 2014-09-25 University Of Southern California Specular object scanner for measuring reflectance properties of objects
US20150032430A1 (en) 2013-07-29 2015-01-29 X-Rite Europe Gmbh Visualization Method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0452905A1 (en) * 1990-04-18 1991-10-23 Hitachi, Ltd. Method and apparatus for inspecting surface pattern of object
CN1364230A (zh) * 1999-06-01 2002-08-14 加拿大国家研究委员会 三维光扫描
US20030231174A1 (en) * 2002-06-17 2003-12-18 Wojciech Matusik Modeling and rendering of surface reflectance fields of 3D objects
US20080232679A1 (en) * 2005-08-17 2008-09-25 Hahn Daniel V Apparatus and Method for 3-Dimensional Scanning of an Object
CN103649677A (zh) * 2011-07-13 2014-03-19 法罗技术股份有限公司 利用空间光调制器来查找物体的三维坐标的装置和方法
WO2014091214A1 (en) * 2012-12-12 2014-06-19 The University Of Birmingham Surface geometry imaging

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
《DOME II:A Parallelized BTF Acquisition System》;SCHWARTZ,C.et al.;《PROCEEDINGS OF EUROGRAPHICS WORKSHOP ON MATERIAL APPEARANCE MODELING:ISSUES AND ACQUISITION》;20130630;第25页第1段-27页第2段,第28页,图1 *

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Publication number Publication date
JP2016114598A (ja) 2016-06-23
EP3032241A1 (en) 2016-06-15
EP3032241B1 (en) 2023-03-01
CN105701793A (zh) 2016-06-22
US10332306B2 (en) 2019-06-25
US10026215B2 (en) 2018-07-17
JP6661336B2 (ja) 2020-03-11
US20160171748A1 (en) 2016-06-16
DE202015102081U1 (de) 2016-03-17
US20180322686A1 (en) 2018-11-08

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