CN105680862A - High speed and high precision analog-digital conversion method and device thereof for imaging sensor - Google Patents
High speed and high precision analog-digital conversion method and device thereof for imaging sensor Download PDFInfo
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/20—Increasing resolution using an n bit system to obtain n + m bits
- H03M1/201—Increasing resolution using an n bit system to obtain n + m bits by dithering
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/18—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
- H03M1/188—Multi-path, i.e. having a separate analogue/digital converter for each possible range
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
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Abstract
The invention relates to a high speed and high precision analog-digital conversion method and a device thereof for an imaging sensor, the method comprises the steps: in a first level analog-digital conversion of the invention, a received pixel signal is compared with m reference signals, corresponding high-order data is outputted, and pixel signal range is divided into (m+1) sub-sections; according to the high-order data, corresponding fixed offset voltage of the received pixel signal is reduced and amplified, so that sub-section range of the processed pixel signal and voltage range of a second level analog-digital converter are consistent; second level analog-digital conversion is performed on the obtained pixel signal, and low-order data is outputted. A user can perform corresponding process on the pixel data outputted after the second level analog-digital conversion according to the high-order data, and at last, pixel data corresponding to the pixel signal is obtained. According to the invention, a relative big dynamic range can be reached, a relative high signal to noise ratio can be obtained, noise in fixed mode can be reduced, and composite images have good quality.
Description
Technical field
The invention belongs to semiconductor image detection technology field, be specifically related to a kind of imageing sensor D conversion method and device thereof.
Background technology
Analog-digital converter in imageing sensor is for being converted to digital signal by picture element signal. The analog-digital converter of traditional imageing sensor such as ramp type analog-digital converter at least needs 2 when carrying out the analog digital conversion of N positionNSecondary clock count, as shown in Figure 1. So when carrying out the conversion of high bit number, it is necessary to the longer analog digital conversion time, limit the frame frequency of imageing sensor.
Entering into the optical signal M in the photosensitive unit of imageing sensor, self is with light discrete noise, and its noise is sized toWhen optical signal is stronger, himself with discrete noise also can increase simultaneously.
" a kind of high speed analog-to-digital conversion method for imageing sensor and device thereof " (publication number: CN105262965A disclosed in Chinese invention patent publication, publication date: 2016.1.20) in, it is proposed to a kind of two-stage analog digital conversion scheme utilizing light discrete noise. Its ultimate principle is as shown in Figure 2 a and 2 b. In the first order, input signal and several reference signals are compared, slightly change, the high position data of output conversion signal. According to high position data, input signal is carried out the amplification of corresponding multiple, then the signal after amplification is carried out second level conversion. In the transformation process of the second level, when inputting picture element signal and being less, the multiple of many gain amplifiers is relatively big, and therefore equivalence is less to the quantizing noise of analog-digital converter input. When inputting picture element signal and being bigger, the multiple of many gain amplifiers is less, therefore equivalence is relatively big to the quantizing noise of analog-digital converter input, but as long as ensureing this equivalent quantization noise light discrete noise less than input picture element signal, can ensure that picture quality is unaffected.
Compared to traditional slope analog-digital converter, this two-stage analog digital conversion scheme using optical noise can be greatly improved the speed of analog digital conversion, obtains bigger dynamic range simultaneously.But as it is shown on figure 3, after the first order is changed, some gear voltage amplifications are not covered with the whole swing range of amplifier, so can cause the loss of corresponding gear signal to noise ratio, when synthesizing final image, very big signal to noise ratio saltus step can be caused when gear saltus step, reduce the quality of image.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of signal to noise ratio height, the measured high-speed, high precision D conversion method for imageing sensor of composograph matter and device thereof.
In order to solve above-mentioned technical problem, the high-speed, high precision D conversion method for imageing sensor of the present invention is as follows:
Step one, utilize the first order analog digital conversion picture element signal of reception and m reference signal to be compared, according to the comparative result corresponding high position data of output, and the picture element signal scope of input is divided into (m+1) individual subinterval, wherein m >=1;
Step 2, set picture element signal VinSubinterval, place is Vil～Vih, i=1,2 ... (m+1); Fixing offset voltage corresponding to this subinterval is Vofi, corresponding amplification is Gi; The picture element signal V that then will receiveinCut VofiAfter amplify G againiTimes; Wherein Vofi=Vil; If second level analog-digital converter voltage range for Voutl～Vouth, amplification Gi(V should be metil-Vofi)×Gi=Voutl, (Vih-Vofi)×Gi=Vouth;
Step 3, the picture element signal that step 2 is obtained carry out two grades of analog digital conversion, export low data.
In described step 3, while the picture element signal that step 2 is obtained carries out two grades of analog digital conversion output low datas, next periodic pixel signal carries out first order analog digital conversion, and output high position data also amplifies corresponding multiple after being cut corresponding fixing offset voltage again.
Realize the above-mentioned device for the high-speed, high precision D conversion method of imageing sensor and include first order analog-digital converter, many gain amplifiers with subtraction function and second level analog-digital converter; Picture element signal is input to first order analog-digital converter and the many gain amplifiers with subtraction function; Multiple outputs of first order analog-digital converter are connected to the corresponding input of outside and the many gain amplifiers with subtraction function; The output of the many gain amplifiers with subtraction function is connected to second level analog-digital converter.
The picture element signal of reception and m reference signal are compared by described first order analog digital conversion, export corresponding high position data, and picture element signal scope is divided into (m+1) individual subinterval; According to high position data, the picture element signal of reception is cut corresponding offset voltage and amplifies corresponding multiple again so that the scope in the subinterval, picture element signal place after process is consistent with second level analog-digital converter voltage range; The picture element signal obtained is carried out two grades of analog digital conversion, exports low data. User can process accordingly according to the pixel data that second level analog digital conversion is exported by high position data, finally gives the pixel data corresponding with picture element signal.
Described first order analog-digital converter adopts slope analog-digital converter.
Described second level analog-digital converter adopts slope analog-digital converter.
Described first order analog-digital converter can also adopt full parellel formula analog-digital converter.
Described second level analog-digital converter can also adopt gradual approaching A/D converter.
Present invention additionally comprises sampling hold circuit, described sampling hold circuit is connected between the many gain amplifiers with subtraction function and second level analog-digital converter.
When adopting two grades of analog-digital converters of the present invention that picture element signal is changed, it is possible to carry out serial conversion.It is input to first order analog-digital converter by picture element signal to change, utilizes the many gain amplifiers with subtraction function that it is made difference processing and amplifying afterwards, then the result after process is sent in the analog-digital converter of the second level and changes. In this serial conversion mode, the level Four of the required process of signal conversion works successively, designs relatively easy but spended time is relatively long.
In order to further reduce the analog digital conversion time, the present invention places sampling hold circuit between the many gain amplifiers with subtraction function and second level analog-digital converter, when picture element signal through first order analog digital conversion and do difference amplify after, kept the pixel signal voltage being input to second level analog-digital converter constant by sampling hold circuit, the second level analog-digital converter signal many gain amplifiers with subtraction function exported carries out analog digital conversion. While picture element signal after amplifying is carried out analog digital conversion by second level analog-digital converter, first order analog-digital converter and the many gain amplifiers with subtraction function next periodic pixel signal is carried out first order analog digital conversion and differ from amplification with doing. So, the second level is changed and front two-stage concurrent working, further reduces the analog digital conversion time, improves conversion efficiency.
In the present invention, the input voltage range of second level analog-digital converter is fixed, and each subinterval scope being input to the picture element signal place of this grade of analog-digital converter is also processed into consistent with the input voltage range of second level analog-digital converter. So, the input picture element signal in each subinterval can obtain maximum signal to noise ratio in analog-digital conversion process. And along with the value of gear m is more big, the phenomenon of signal to noise ratio saltus step is more inconspicuous, and the gray value of image also can increase, it is thus achieved that better image resolution.
Beneficial effects of the present invention:
1, the scope of second level analog-digital converter is fixed, quantizing noise is also fixed, can be reduced the input noise of equivalence by the amplification of the many gain amplifiers with subtraction function, the details in a play not acted out on stage, but told through dialogues improving sensor reads noiseproof feature, and then adds the dynamic range of image.
2, due to the existence of two-stage analog-digital converter, even if there is erroneous judgement in first order analog digital conversion, without the situations such as leakage code occur, it is not necessary to extra design ensures.
3, the structure of second level analog-digital converter is comparatively flexible, is possible not only to adopt slope analog-digital converter, it would however also be possible to employ other such as gradual approaching A/D converter etc.
4, analog digital conversion slope in the second level is fixed, it is only necessary to an analog-digital converter, enormously simplify the structure of sensor, reduces fixed model noise.
5, the picture element signal of input compares with m reference voltage, is divided into (m+1) individual subinterval, when m value increases, can obtain more gray value, increase the resolution of image.
6, the picture element signal in arbitrary subinterval is processed into consistent with the full range of second level analog-digital converter when being input to second level analog-digital converter, so ensures that the signal conversion of each gear can obtain maximum signal to noise ratio.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
Fig. 1 is traditional D conversion method schematic diagram.
Fig. 2 a is the structured flowchart of a kind of implementation of the high speed analog-to-digital conversion device (CN105262965A) in prior art for imageing sensor, and Fig. 2 b is data serial transformation process schematic diagrams.
Fig. 3 is the limitation schematic diagram of the high speed analog-to-digital conversion device (CN105262965A) in prior art for imageing sensor.
Fig. 4 a is the structured flowchart of the high-speed, high precision modulus serial conversion device for one-mega for imageing sensor, and Fig. 4 b is the schematic diagram adopting the present invention to carry out serial conversion.
Fig. 5 a is the structured flowchart of the high-speed, high precision modulus Parallel transformation device for imageing sensor, and Fig. 5 b is the schematic diagram adopting the present invention to carry out Parallel transformation.
Fig. 6 is the structured flowchart of the embodiment of the present invention 1.
Fig. 7 is data serial transformation process schematic diagram in the embodiment of the present invention 1.
Fig. 8 is the structured flowchart of embodiment 2.
Fig. 9 is data serial transformation process schematic diagram in the embodiment of the present invention 2.
Detailed description of the invention
As shown in fig. 4 a, the present invention includes first order analog-digital converter for the high-speed, high precision analog-digital commutator of imageing sensor, many gain amplifiers with subtraction function and second level analog-digital converter. Picture element signal is input to first order analog-digital converter and the many gain amplifiers with subtraction function; First order analog-digital converter has the outfan corresponding with m reference voltage; Picture element signal and m reference voltage are compared by first order analog-digital converter, obtain the multidigit high position data of correspondence according to comparative result, and the full width scope of picture element signal is divided into (m+1) individual subinterval. Multidigit high position data exports outside and the corresponding input of the many gain amplifiers with subtraction function by corresponding outfan; The output of the many gain amplifiers with subtraction function is connected to second level analog-digital converter.
When adopting said apparatus that picture element signal is changed, it is possible to carry out serial conversion. Its process is as shown in Figure 4 b. First picture element signal and m reference voltage are compared and obtain multidigit high position data, picture element signal is divided into (m+1) individual subinterval simultaneously. According to high position data, the picture element signal of input is cut corresponding fixing offset voltage and then amplifies corresponding multiple again so that the subinterval scope at the pixel place after process is consistent with second level analog-digital converter voltage range (sets picture element signal VinSubinterval, place is Vil～Vih, i=1,2 ... (m+1); Offset voltage corresponding to this subinterval is Vofi, corresponding amplification is Gi, second level analog-digital converter voltage range for Voutl～Vouth, then Vofi=Vil, amplification Gi(V should be metil-Vofi)×Gi=Voutl, (Vih-Vofi)×Gi=Vouth), then the picture element signal obtained is sent in the analog-digital converter of the second level changes, export multidigit low data.
In this serial conversion mode, the level Four of the required process of signal conversion works successively.
As shown in Figure 5 a, the device for the high-speed, high precision analog digital conversion of imageing sensor of the present invention can also include sampling hold circuit. Picture element signal is input to first order analog-digital converter and the many gain amplifiers with subtraction function; First order analog-digital converter has the outfan corresponding with m reference voltage; Picture element signal and m reference voltage are compared by first order analog-digital converter, obtain the multidigit high position data of correspondence according to comparative result. Multidigit high position data exports outside and the corresponding input of the many gain amplifiers with subtraction function by corresponding outfan; The output of the many gain amplifiers with subtraction function is connected to second level analog-digital converter by sampling hold circuit.
When adopting said apparatus that picture element signal is changed, it is possible to carry out Parallel transformation. As shown in Figure 5 b, first picture element signal is input to first order analog-digital converter and carries out conversion output multidigit high position data, according to high position data the picture element signal of input cut corresponding fixing offset voltage and amplify corresponding multiple (same with serial conversion mode, amplification Gi(V should be metil-Vofi)×Gi=Voutl, (Vih-Vofi)×Gi=Vouth;), the picture element signal after processed is sampled holding circuit and maintains, and is then carried out analog digital conversion by the second level analog-digital converter picture element signal to maintaining and is exported multidigit low data. In this operating mode, second level conversion and front two-stage concurrent working, namely while the picture element signal after amplifying is carried out analog digital conversion and exports multidigit low data by second level analog-digital converter, first order analog-digital converter and the many gain amplifiers with subtraction function next periodic pixel signal is carried out first order analog digital conversion and differ from amplification with doing.
Embodiment 1
As shown in Figure 6, first order analog-digital converter adopts 2 slope analog-digital converters; Second level analog-digital converter adopts 8 slope analog-digital converters; Many gain amplifiers with subtraction function are 4 gain amplifiers with subtraction function.
Assuming the 0～1.6v that ranges for of picture element signal, first order analog-digital converter reference voltage is 0.2v, 0.4v, 0.8v, and the voltage range that second level analog-digital converter sets is as 0～1.6v. So picture element signal can be divided into 4 intervals by three reference voltages, respectively 0～0.2v, 0.2v～0.4v, 0.4v～0.8v, 0.8v～1.6v, they are corresponding four fixing offset voltage V accordingly respectivelyof1、Vof2、Vof3、Vof4, and four corresponding amplification G1、G2、G3、G4. Can obtain according to the subinterval scope after processing is consistent with the voltage range that second level analog-digital converter sets: Vof1=0v, G1=8; Vof2=0.2v, G2=8; Vof3=0.4v, G3=4; Vof4=0.8v, G4=2. As it is shown in fig. 7, picture element signal D conversion method is specific as follows:
When pixel signal voltage Vin is when 0v～0.2v subinterval, 2 high position datas being exported correspondence by first order AfD converter output mouth 1 are 00, the output on the one hand of this high position data judges fixing offset voltage and gain amplification to be transferred to the input port 1 of 4 gain amplifiers with subtraction function on the other hand to outside for user. Now picture element signal is cut 0v offset voltage by 4 gain amplifiers with subtraction function, then amplifies 8 times, is then output to second level analog-digital converter; The picture element signal of amplification is carried out analog digital conversion and obtains the low data of 8 and be output to outside by second level analog-digital converter, for user.
When pixel signal voltage Vin is when 0.2v～0.4v subinterval, 2 high position datas being exported correspondence by first order AfD converter output mouth 2 are 01, the output on the one hand of this high position data judges fixing offset voltage and gain amplification to be transferred to the input port 2 with subtraction function 4 gain amplifier on the other hand to outside for user. Now picture element signal is cut the fixing offset voltage of 0.2v by band subtraction function 4 gain amplifier, then amplifies 8 times, is then output to second level analog-digital converter; The picture element signal of amplification is carried out analog digital conversion and obtains the low data of 8 and be output to outside by second level analog-digital converter, for user.
When pixel signal voltage Vin is when 0.4v～0.8v subinterval, 2 high position datas being exported correspondence by first order AfD converter output mouth 3 are 10, the output on the one hand of this high position data judges fixing offset voltage and gain amplification to be transferred to the input port 3 with subtraction function 4 gain amplifier on the other hand to outside for user. Now picture element signal is cut the fixing offset voltage of 0.4v by band subtraction function 4 gain amplifier, then amplifies 4 times, is then output to second level analog-digital converter;The picture element signal of amplification is carried out analog digital conversion and obtains the low data of 8 and be output to outside by second level analog-digital converter, for user.
When pixel signal voltage Vin is when 0.8v～1.6v subinterval, 2 high position datas being exported correspondence by first order AfD converter output mouth 4 are 11, the output on the one hand of this high position data judges fixing offset voltage and gain amplification to be transferred to the input port 4 of 4 gain amplifiers with subtraction function on the other hand to outside for user. Now picture element signal is cut the fixing offset voltage of 0.8v by 4 gain amplifiers with subtraction function, then amplifies 2 times, is then output to second level analog-digital converter; The picture element signal of amplification is carried out analog digital conversion and obtains the low data of 8 and be output to outside by second level analog-digital converter, for user.
Embodiment 2
As shown in Figure 8, first order analog-digital converter adopts 1 full parellel formula analog-digital converter; Second level analog-digital converter adopts 8 gradual approaching A/D converters; Many gain amplifiers with subtraction function are 2 gain amplifiers with subtraction function.
Assuming that picture element signal ranges for 0～1.6v, first order analog-digital converter reference voltage is 0.2v, and the voltage range that second level analog-digital converter sets is as 0～1.6v. So picture element signal can be divided into 2 subintervals, respectively 0～0.2v and 0.2v～1.6v by a reference voltage. They are corresponding two corresponding fixing offset voltage V respectivelyof1、Vof2, and two corresponding amplification G1、G2. Can obtain according to the subinterval scope after processing is consistent with the voltage range that second level analog-digital converter sets: Vof1=0v, G1=8; Vof2=0.2v, G2=8/7. As it is shown in figure 9, picture element signal D conversion method is specific as follows:
When pixel signal voltage Vin is when 0v～0.2v subinterval, 1 high position data being exported correspondence by first order full parellel formula AfD converter output mouth 1 is 0, the output on the one hand of this high position data judges fixing offset voltage and gain amplification to be transferred to the input port 1 of 2 gain amplifiers with subtraction function on the other hand to outside for user. Now picture element signal is cut 0v offset voltage by 2 gain amplifiers with subtraction function, then amplifies 8 times, and the picture element signal after process is sampled holding circuit and maintains. Then the picture element signal maintained exports to second level gradual approaching A/D converter; The picture element signal of amplification is carried out analog digital conversion and obtains the low data of 8 and be output to outside by second level gradual approaching A/D converter, for user. Introduction due to sampling hold circuit so that the work that first order analog digital conversion and second level analog digital conversion can be parallel, adds the operating rate of system.
When pixel signal voltage Vin is when 0.2v～1.6v subinterval, 1 high position data being exported correspondence by first order full parellel formula AfD converter output mouth 2 is 1, the output on the one hand of this high position data judges regulation offset voltage and gain amplification to outside for user, is transferred to the input port 2 of 2 gain amplifiers with subtraction function on the other hand. Now picture element signal is cut 0.2v offset voltage by 2 gain amplifiers with subtraction function, then amplifies 8/7 times, and the picture element signal after process is sampled holding circuit and maintains. Then the picture element signal maintained exports to second level gradual approaching A/D converter; The picture element signal of amplification is carried out analog digital conversion and obtains the low data of 8 and be output to outside by second level gradual approaching A/D converter, for user.Introduction due to sampling hold circuit so that the work that first order analog digital conversion and second level analog digital conversion can be parallel, adds the operating rate of system.
The invention is not restricted to above-described embodiment, wherein the first analog-digital converter and the second analog-digital converter can also select the figure place of other kinds of analog-digital converter, high position data and low data to set flexibly flexibly. Many gain amplifiers are also not necessarily limited to above-mentioned amplification. Therefore, every make on the claims in the present invention 1,3 technical scheme basis any simply change form, all the invention is intended within protection domain.
Claims (8)
1. the high-speed, high precision D conversion method for imageing sensor, it is characterised in that comprise the steps:
Step one, utilize the first order analog digital conversion picture element signal of reception and m reference signal to be compared, according to the comparative result corresponding high position data of output, and the picture element signal scope of input is divided into (m+1) individual subinterval, wherein m >=1;
Step 2, set picture element signal VinSubinterval, place is Vil～Vih, i=1,2 ... (m+1); Fixing offset voltage corresponding to this subinterval is Vofi, corresponding amplification is Gi; The picture element signal V that then will receiveinCut VofiAfter amplify G againiTimes; Second level analog-digital converter voltage range is Voutl～Vouth, amplification Gi(V should be metil-Vofi)×Gi=Voutl, (Vih-Vofi)×Gi=Vouth;
Step 3, the picture element signal that step 2 is obtained carry out two grades of analog digital conversion, export low data.
2. the high-speed, high precision D conversion method for imageing sensor according to claim 1, it is characterized in that in described step 3, while the picture element signal that step 2 is obtained carries out two grades of analog digital conversion output low datas, next periodic pixel signal carries out first order analog digital conversion, and also it amplifies corresponding multiple after cutting corresponding fixing offset voltage to output high position data again.
3. the device realizing as claimed in claim 1 high-speed, high precision D conversion method for imageing sensor, it is characterised in that include first order analog-digital converter, many gain amplifiers with subtraction function and second level analog-digital converter; Picture element signal is input to first order analog-digital converter and the many gain amplifiers with subtraction function; Multiple outputs of first order analog-digital converter are connected to the corresponding input of outside and the many gain amplifiers with subtraction function; The output of the many gain amplifiers with subtraction function is connected to second level analog-digital converter.
4. the high-speed, high precision analog-digital commutator for imageing sensor according to claim 3, it is characterised in that described first order analog-digital converter adopts slope analog-digital converter.
5. the high-speed, high precision analog-digital commutator for imageing sensor according to claim 3, it is characterised in that described second level analog-digital converter adopts slope analog-digital converter.
6. the high-speed, high precision analog-digital commutator for imageing sensor according to claim 3, it is characterised in that described first order analog-digital converter adopts full parellel formula analog-digital converter.
7. the high-speed, high precision analog-digital commutator for imageing sensor according to claim 3, it is characterised in that described second level analog-digital converter adopts gradual approaching A/D converter.
8. the high-speed, high precision analog-digital commutator for imageing sensor according to claim 3, it is characterised in that also including sampling hold circuit, described sampling hold circuit is connected between the many gain amplifiers with subtraction function and second level analog-digital converter.
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| CN110351499A (en) * | 2018-04-06 | 2019-10-18 | 爱思开海力士有限公司 | Image sensering device |
| CN113382186A (en) * | 2020-03-09 | 2021-09-10 | 格科微电子（上海）有限公司 | Method for improving performance of image sensor |
| CN114207390A (en) * | 2021-08-16 | 2022-03-18 | 迪克创新科技有限公司 | Photosensitive device and related electronic device |
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| CN114207390A (en) * | 2021-08-16 | 2022-03-18 | 迪克创新科技有限公司 | Photosensitive device and related electronic device |
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Application publication date: 20160615 |