CN105575949B - Functional device and its test pattern start-up circuit and method - Google Patents
Functional device and its test pattern start-up circuit and method Download PDFInfo
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- CN105575949B CN105575949B CN201410527425.8A CN201410527425A CN105575949B CN 105575949 B CN105575949 B CN 105575949B CN 201410527425 A CN201410527425 A CN 201410527425A CN 105575949 B CN105575949 B CN 105575949B
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Abstract
A kind of functional device and its test pattern start-up circuit and method.The test pattern start-up circuit, comprising：Pulse signal generation module holds resistance circuit, current generating module, output capacitance and comparator.Pulse signal generation module generates pulse signal to input terminal.Hold resistance circuit and be electrically connected at input terminal, with return pulse signal, and trigger signal is generated every preset period of time.Current generating module response trigger signal generates charging current to output terminal.Output capacitance is electrically connected at output terminal, to receive charging current, and gradually rises the output voltage of output terminal.Comparator is electrically connected at output terminal, and with Rreceive output voltage and reference voltage, wherein comparator compares output voltage and reference voltage, to generate test pattern enabling signal when output voltage is more than reference voltage.
Description
Technical field
The invention relates to a kind of circuit design technique, and in particular to a kind of functional device and its test pattern
Start-up circuit and method.
Background technology
Semiconductor integrated circuit would generally generate test pattern enabling signal using test pattern start-up circuit.Test mould
IC apparatus is switched to test pattern by formula enabling signal, to test the functional circuit in IC apparatus.Known
Design in, test pattern enabling signal is realized by the control voltage for being above or below a specific voltage level.When
When IC apparatus detects this control voltage, i.e., test pattern is switched to by operating mode.
However, IC apparatus may unexpectedly be switched to test pattern due to the influence of noise, such as surveying
Try the ground noise that the input terminal of mode starting signal occurs.On the other hand, if the voltage level of this control voltage is higher than collection
The ceiling voltage that can bear into circuit device internal element, then the internal element of these IC apparatus may be due to control
The input of voltage processed and be damaged.
Therefore, a new functional device and its test pattern start-up circuit and method how are designed, it is above-mentioned to solve
Problem is industry urgent problem to be solved.
The content of the invention
Therefore, an aspect of the invention is to provide a kind of test pattern start-up circuit, comprising：Pulse signal generation module,
Hold resistance (resistor-capacitor；RC) circuit, current generating module, output capacitance and comparator.Pulse signal generates
Module generates pulse signal to input terminal.Hold resistance circuit and be electrically connected at input terminal, with return pulse signal, and when default
Between the cycle generate trigger signal.Current generating module response trigger signal generates charging current to output terminal.Output capacitance is electrical
Output terminal is connected to, to receive charging current, and gradually rises the output voltage of output terminal.Comparator is electrically connected at output
End, with Rreceive output voltage and reference voltage, wherein comparator compares output voltage and reference voltage, in output voltage
Test pattern enabling signal is generated during more than reference voltage.
According to one embodiment of the invention, included wherein holding resistance circuit：Capacitance and resistance.Capacitance has first end and the
Two ends, wherein first end are electrically connected at pulse signal generation module, and with return pulse signal, second end is electrically connected to electric current
Generation module.Resistance is electrically connected between second end and the earthing potential of capacitance.
According to another embodiment of the present invention, wherein current generating module includes current mirror, and current mirror, which also includes, has triggering
The reference path of transistor and the outgoing route for being electrically connected to output terminal, wherein triggering electric transistor is connected to Rong Zu electricity
Road, to be turned on according to trigger signal, and trigger current mirror is in reference path generation reference current and in outgoing route generation
Charging current.
According to further embodiment of this invention, the foot position that wherein input terminal provides for the functional circuit of functional device.
According to yet another embodiment of the invention, functional circuit is switched to survey by wherein test pattern enabling signal by operating mode
Die trial formula.
Another aspect of the present invention is to provide a kind of functional device, comprising：Functional circuit and test pattern start-up circuit.
Test pattern start-up circuit includes：Pulse signal generation module holds resistance circuit, current generating module, output capacitance and compares
Device.Pulse signal generation module generates pulse signal to input terminal.Hold resistance circuit and be electrically connected at input terminal, to receive pulse letter
Number, and generate trigger signal every preset period of time.Current generating module response trigger signal generates charging current to output
End.Output capacitance is electrically connected at output terminal, to receive charging current, and gradually rises the output voltage of output terminal.Compare
Device is electrically connected at output terminal, and with Rreceive output voltage and reference voltage, wherein comparator compares output voltage and reference
Voltage, to generate test pattern enabling signal to functional circuit when output voltage is more than reference voltage, so that functional circuit
Test pattern is switched to by operating mode.
According to one embodiment of the invention, included wherein holding resistance circuit：Capacitance and resistance.Capacitance has first end and the
Two ends, wherein first end are electrically connected at pulse signal generation module, and with return pulse signal, second end is electrically connected to electric current
Generation module.Resistance is electrically connected between second end and the earthing potential of capacitance.
According to another embodiment of the present invention, wherein current generating module includes current mirror, and current mirror, which also includes, has triggering
The reference path of transistor and the outgoing route for being electrically connected to output terminal, wherein triggering electric transistor is connected to Rong Zu electricity
Road, to be turned on according to trigger signal, and trigger current mirror is in reference path generation reference current and in outgoing route generation
Charging current.
According to further embodiment of this invention, wherein input terminal is the foot position that functional circuit provides.
The another aspect of the present invention is to start method providing a kind of test pattern, applied to including functional circuit and survey
In the functional device of die trial formula start-up circuit, test pattern starts method and comprises the steps of.It is produced by pulse signal generation module
Pulse signal is given birth to input terminal；By being electrically connected at the appearance resistance circuit return pulse signal of input terminal, and every preset time week
Phase generates trigger signal；Charging current is generated to output terminal by current generating module response trigger signal；It is defeated by being electrically connected at
The output capacitance of outlet receives charging current, and gradually rises the output voltage of output terminal；By being electrically connected at output terminal
Comparator Rreceive output voltage and reference voltage；And output voltage and reference voltage are compared by comparator, to export
Voltage generates test pattern enabling signal when being more than reference voltage, so that functional circuit switches to test mould by operating mode
Formula.
According to one embodiment of the invention, wherein current generating module includes current mirror, and current mirror also includes brilliant with triggering
The reference path of body pipe and the outgoing route for being electrically connected to output terminal, wherein triggering electric transistor is connected to Rong Zu electricity
Road, test pattern start method and include：Triggering transistor is made to be turned on according to trigger signal, and trigger current mirror；And by electric current
Mirror generates reference current in reference path and generates charging current in outgoing route.
According to another embodiment of the present invention, wherein pulse signal continues to be generated by pulse signal generation module, until output
Until voltage is more than reference voltage.
Therefore it is an advantage of the current invention that the test pattern start-up circuit in functional device can be generated only in pulse signal
When, the test pattern of startup function circuit, to avoid functional circuit test pattern by dc noise or ground noise mistake
Ground starts, and is readily achieved above-mentioned purpose.
Description of the drawings
Fig. 1 is a kind of circuit diagram of functional device in one embodiment of the invention；And
Fig. 2 is the flow chart of the test pattern startup method in one embodiment of the invention.
Reference numeral explanation
1：Functional device 10：Test pattern start-up circuit
100：Pulse signal generation module 101：Capacitance
102：Hold resistance circuit 103：Resistance
104：Current generating module 105：Reference path
106：Output capacitance 107：Outgoing route
108：Comparator 109：Trigger transistor
12：Functional circuit 200：Test pattern starts method
201-207：Step
Specific embodiment
It refer to Fig. 1.Fig. 1 is a kind of circuit diagram of functional device 1 in one embodiment of the invention.Functional device 1, which includes, to be surveyed
Die trial formula start-up circuit 10 and functional circuit 12.
In different embodiments, functional circuit can be any performing the circuit of a specific function.Functional circuit 12 can
It operates in operating mode and test pattern, and test pattern start-up circuit 10 can be used to generate test pattern enabling signal AT
To functional circuit 12, functional circuit 12 is made to switch to test pattern by operating mode.
Test pattern start-up circuit 10 includes：Pulse signal generation module 100 holds resistance circuit 102, current generating module
104th, output capacitance 106 and comparator 108.
Pulse signal generation module 100 generates pulse signal CLK to an input terminal IN.In one embodiment, input terminal IN
The foot position provided for functional circuit 12.
Hold resistance circuit 102 and be electrically connected at input terminal IN.In one embodiment, hold resistance circuit 102 include capacitance 101 and
Resistance 103.
Capacitance 101 has first end and second end.Wherein, the first end of capacitance 101 and pulse signal generation module 100
Input terminal IN is electrically connected at, with return pulse signal CLK.The second end of capacitance 101 is electrically connected to current generating module
104.Resistance 103 is electrically connected between the second end of capacitance 101 and earthing potential GND.
Hold 102 return pulse signal CLK of resistance circuit, and trigger signal TR is generated every preset period of time.Implement one
In example, this preset period of time and the cycle of pulse signal CLK are substantially the same.Holding resistance circuit 102 can filter out from input
The direct current signal of IN is held, to generate trigger signal TR only in response to the pulse signal CLK of exchange.More specifically, resistance circuit is held
102 because any dc noise or ground noise do not generate trigger signal TR.In one embodiment, trigger signal TR is one
The pulse signal of transient state.
In the present embodiment, current generating module 104 includes current mirror, this current mirror includes reference path 105 and electricity
Property is connected to the output the outgoing route 107 of O.
Reference path 105 includes the triggering transistor 109 for being electrically connected at and holding resistance circuit 102, to receive trigger signal TR.
Transistor 109 is triggered to be turned on according to trigger signal TR, and trigger current mirror.When current mirror is triggered, reference path 105 will produce
Raw reference current Iref, and outgoing route 107 will generate charging current Ich.Therefore, charging current Ich will be generated to output terminal
O。
Output capacitance 106 is electrically connected at output terminal O, to receive charging current Ich from output terminal O, and makes output terminal O's
Output voltage Vo gradually rises.In one embodiment, since current mirror is triggered by triggering transistor 109, and crystal is triggered
Pipe 109 is in response to be turned on every the trigger signal TR that preset period of time generates, therefore output voltage Vo is stepped ground
It rises.
Comparator 108 is electrically connected at output terminal O, with Rreceive output voltage Vo and reference voltage Vref.Comparator 108
Output voltage Vo and reference voltage Vref are compared.When output voltage Vo is more than reference voltage Vref, comparator 108
Test pattern enabling signal AT is generated to functional circuit 12, so that functional circuit 12 switches to test pattern by operating mode.
Therefore, the present invention functional device 1 in, test pattern start-up circuit 10 can only when pulse signal CLK is generated,
The test pattern of startup function circuit 12, to avoid functional circuit 12 test pattern by dc noise or ground noise mistake
Ground starts.
Fig. 2 is in one embodiment of the invention, and test pattern starts the flow chart of method 200.Test pattern starts method 200
The functional device 1 illustrated such as Fig. 1 is can be applied to, in the test pattern start-up circuit 10 that particularly functional device 1 includes.Test mould
Formula starts method 200 and comprises the steps of that (it will be understood that mentioned step in the present embodiment, bright its is suitable except especially chatting
Outside sequence person, its tandem can be adjusted according to actual needs or even can simultaneously or partially be performed simultaneously).
In step 201, pulse signal CLK is generated to input terminal IN by pulse signal generation module 100.
In step 202, trigger signal is generated by 102 return pulse signal CLK of appearance resistance circuit, and every preset period of time
TR。
In step 203, trigger signal TR is responded by current generating module 104 and generates charging current Ich to output terminal O.
In step 204, charging current Ich is received by output capacitance 106, and make the output voltage Vo of output terminal O progressively on
It rises.
In step 205, by 108 Rreceive output voltage Vo of comparator and reference voltage Vref, and compared by comparator 108
Output voltage Vo and reference voltage Vref, and judge whether output voltage Vo is more than reference voltage Vref.
When output voltage Vo is not more than reference voltage Vref, flow will be back to step 205, to continue to output voltage Vo
And reference voltage Vref is compared.And on the other hand, when output voltage Vo is more than reference voltage Vref, comparator 108 will
Test pattern enabling signal AT is generated in step 206.
Then in step 207, functional circuit 12 switches to test pattern by operating mode.
Although this disclosure is disclosed as above with embodiment, so it is not limited to this disclosure, this field
Technical staff in the spirit and scope for not departing from this disclosure, can be used for a variety of modifications and variations, therefore this disclosure
Protection domain should be subject to following claims.
Claims (12)
1. a kind of test pattern start-up circuit, comprising：
One pulse signal generation module, to generate a pulse signal to an input terminal；
One holds resistance circuit, is electrically connected at the input terminal, to receive the pulse signal, and generates one every a preset period of time
Trigger signal；
One current generating module generates a charging current a to output terminal to respond the trigger signal；
One output capacitance is electrically connected at the output terminal, to receive the charging current, and make an output voltage of the output terminal by
Step rises；And
One comparator is electrically connected at the output terminal, to receive the output voltage and a reference voltage, the wherein comparator ratio
Compared with the output voltage and the reference voltage, start letter to generate a test pattern when the output voltage is more than the reference voltage
Number.
2. test pattern start-up circuit as described in claim 1, wherein the appearance resistance circuit include：
One capacitance has a first end and a second end, and the wherein first end is electrically connected at the pulse signal generation module,
To receive the pulse signal, which is electrically connected to the current generating module；And
One resistance is electrically connected between the second end and the earthing potential of the capacitance.
3. test pattern start-up circuit as described in claim 1, the wherein current generating module include a current mirror, the electric current
Mirror also includes the reference path with a triggering transistor and is electrically connected to an outgoing route of the output terminal, wherein should
Triggering electric transistor is connected to the appearance resistance circuit, to be turned on according to the trigger signal, and triggers the current mirror in the reference
Path generates a reference current and generates the charging current in the outgoing route.
4. test pattern start-up circuit as described in claim 1, the wherein input terminal are a functional circuit of a functional device
The foot position provided.
5. test pattern start-up circuit as claimed in claim 4, wherein the test pattern enabling signal by the functional circuit by
One operating mode switches to a test pattern.
6. a kind of functional device, comprising：
One functional circuit；And
One test pattern start-up circuit, comprising：
One pulse signal generation module, to generate a pulse signal to an input terminal；
One holds resistance circuit, is electrically connected at the input terminal, to receive the pulse signal, and generates one every a preset period of time
Trigger signal；
One current generating module generates a charging current a to output terminal to respond the trigger signal；
One output capacitance is electrically connected at the output terminal, to receive the charging current, and make an output voltage of the output terminal by
Step rises；And
One comparator is electrically connected at the output terminal, to receive the output voltage and a reference voltage, the wherein comparator ratio
Compared with the output voltage and the reference voltage, start letter to generate a test pattern when the output voltage is more than the reference voltage
Number to the functional circuit, so that the functional circuit switches to a test pattern by an operating mode.
7. functional device as claimed in claim 6, wherein the appearance resistance circuit include：
One capacitance has a first end and a second end, and the wherein first end is electrically connected at the pulse signal generation module,
To receive the pulse signal, which is electrically connected to the current generating module；And
One resistance is electrically connected between the second end and the earthing potential of the capacitance.
8. functional device as claimed in claim 6, the wherein current generating module include a current mirror, which also includes
A reference path of transistor is triggered with one and is electrically connected to an outgoing route of the output terminal, wherein the triggering crystal
Pipe is electrically connected at the appearance resistance circuit, to be turned on according to the trigger signal, and triggers the current mirror to be generated in the reference path
One reference current and generate the charging current in the outgoing route.
9. functional device as claimed in claim 6, the wherein input terminal are the foot position that the functional circuit provides.
10. a kind of test pattern starts method, applied to the work(comprising a functional circuit and a test pattern start-up circuit
In energy device, which starts method and includes：
One pulse signal a to input terminal is generated by a pulse signal generation module；
The pulse signal is received by the appearance resistance circuit for being electrically connected at the input terminal, and one is generated every a preset period of time
Trigger signal；
The trigger signal is responded by a current generating module and generates a charging current a to output terminal；
The charging current is received by the output capacitance for being electrically connected at the output terminal, and make an output voltage of the output terminal by
Step rises；
The output voltage and a reference voltage are received by the comparator for being electrically connected at the output terminal；And
The output voltage and the reference voltage are compared by the comparator, to be generated when the output voltage is more than the reference voltage
One test pattern enabling signal, so that the functional circuit switches to a test pattern by an operating mode.
11. test pattern as claimed in claim 10 starts method, the wherein current generating module includes a current mirror, the electricity
Stream mirror also includes the reference path with a triggering transistor and is electrically connected to an outgoing route of the output terminal, wherein
The triggering electric transistor is connected to the appearance resistance circuit, which starts method and include：
The triggering transistor is made to be turned on according to the trigger signal, and triggers the current mirror；And
A reference current is generated in the reference path and generate the charging current in the outgoing route by the current mirror.
12. test pattern as claimed in claim 10 starts method, the wherein pulse signal continues to be generated by the pulse signal
Module generates, until the output voltage is more than the reference voltage.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410527425.8A CN105575949B (en) | 2014-10-09 | 2014-10-09 | Functional device and its test pattern start-up circuit and method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410527425.8A CN105575949B (en) | 2014-10-09 | 2014-10-09 | Functional device and its test pattern start-up circuit and method |
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| CN105575949A CN105575949A (en) | 2016-05-11 |
| CN105575949B true CN105575949B (en) | 2018-05-29 |
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| CN109490761B (en) * | 2019-01-22 | 2024-03-01 | 上海艾为电子技术股份有限公司 | Test mode entering method and system |
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| DE4434792C1 (en) * | 1994-09-29 | 1996-05-23 | Telefunken Microelectron | Dual-mode MOS integrated circuit with switched-input current mirror |
| US6526536B1 (en) * | 1996-12-12 | 2003-02-25 | Holtek Semiconductor Inc. | Apparatus within an integrated circuit for preventing the integrated circuit from erroneously entering a test mode operation |
| CN101042939A (en) * | 2006-03-22 | 2007-09-26 | 恩益禧电子股份有限公司 | Semiconductor apparatus and test method therefor |
| CN102025263A (en) * | 2009-09-17 | 2011-04-20 | 台湾积体电路制造股份有限公司 | Power supply starting detection circuit |
| TW201217804A (en) * | 2010-10-19 | 2012-05-01 | Himax Analogic Inc | Dc-to-dc converter having test circuit |
| CN102478627A (en) * | 2010-11-24 | 2012-05-30 | 精工电子有限公司 | Test mode setting circuit |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7309999B2 (en) * | 2002-11-27 | 2007-12-18 | Inapac Technology, Inc. | Electronic device having an interface supported testing mode |
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2014
- 2014-10-09 CN CN201410527425.8A patent/CN105575949B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4434792C1 (en) * | 1994-09-29 | 1996-05-23 | Telefunken Microelectron | Dual-mode MOS integrated circuit with switched-input current mirror |
| US6526536B1 (en) * | 1996-12-12 | 2003-02-25 | Holtek Semiconductor Inc. | Apparatus within an integrated circuit for preventing the integrated circuit from erroneously entering a test mode operation |
| CN101042939A (en) * | 2006-03-22 | 2007-09-26 | 恩益禧电子股份有限公司 | Semiconductor apparatus and test method therefor |
| CN102025263A (en) * | 2009-09-17 | 2011-04-20 | 台湾积体电路制造股份有限公司 | Power supply starting detection circuit |
| TW201217804A (en) * | 2010-10-19 | 2012-05-01 | Himax Analogic Inc | Dc-to-dc converter having test circuit |
| CN102478627A (en) * | 2010-11-24 | 2012-05-30 | 精工电子有限公司 | Test mode setting circuit |
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| CN105575949A (en) | 2016-05-11 |
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