CN105575949A - Function device and test mode starting circuit and test mode starting method thereof - Google Patents
Function device and test mode starting circuit and test mode starting method thereof Download PDFInfo
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- CN105575949A CN105575949A CN201410527425.8A CN201410527425A CN105575949A CN 105575949 A CN105575949 A CN 105575949A CN 201410527425 A CN201410527425 A CN 201410527425A CN 105575949 A CN105575949 A CN 105575949A
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Abstract
A function device and a test mode starting circuit and a test mode starting method thereof are provided. The test mode starting circuit comprises a pulse signal generation module, a resistor-capacitor circuit, a current generation module, an output capacitor and a comparator. The pulse signal generation module generates a pulse signal to an input end. The resistor-capacitor circuit is electrically connected to the input end to receive the pulse signal, and generates a trigger signal at intervals of a preset time period. The current generation module generates a charging current to an output end in response to the trigger signal. The output capacitor is electrically connected to the output end to receive the charging current, and gradually increases the output voltage of the output end. The comparator is electrically connected to the output end to receive the output voltage and a reference voltage, and the comparator compares the output voltage with the reference voltage and generates a test mode starting signal when the output voltage is greater than the reference voltage.
Description
Technical field
The invention relates to a kind of circuit design technique, and relate to a kind of functional device and test pattern start-up circuit thereof and method especially.
Background technology
Semiconductor integrated circuit can adopt test pattern start-up circuit to produce test pattern enabling signal usually.Integrated circuit (IC) apparatus is switched to test pattern by test pattern enabling signal, with the functional circuit in testing integrated circuits device.In known design, test pattern enabling signal be by higher than or the control voltage lower than a specific voltage level realizes.When integrated circuit (IC) apparatus detects this control voltage, namely switch to test pattern by operating mode.
But integrated circuit (IC) apparatus unexpectedly may be switched to test pattern due to the impact of noise, such as, at the ground noise that the input of test pattern enabling signal occurs.On the other hand, if the ceiling voltage that the voltage level of this control voltage can bear higher than integrated circuit (IC) apparatus inner member, then the inner member of these integrated circuit (IC) apparatus may suffer damage due to the input of control voltage.
Therefore, how designing a new functional device and test pattern start-up circuit thereof and method, to solve the above problems, is industry problem demanding prompt solution.
Summary of the invention
Therefore, an aspect of the present invention is to provide a kind of test pattern start-up circuit, comprises: pulse signal generation module, appearance resistance (resistor – capacitor; RC) circuit, current generating module, output capacitance and comparator.Pulse signal generation module produces pulse signal to input.Hold resistance circuit and be electrically connected at input, with return pulse signal, and produce triggering signal every preset time period.Current generating module response triggering signal produces charging current to output.Output capacitance is electrically connected at output, to receive charging current, and makes the output voltage of output progressively increase.Comparator is electrically connected at output, and to receive output voltage and reference voltage, wherein comparator compares output voltage and reference voltage, to produce test pattern enabling signal when output voltage is greater than reference voltage.
According to one embodiment of the invention, wherein hold resistance circuit and comprise: electric capacity and resistance.Electric capacity has first end and the second end, and wherein first end is electrically connected at pulse signal generation module, and with return pulse signal, the second end is electrically connected to current generating module.Between the second end that resistance is electrically connected at electric capacity and earthing potential.
According to another embodiment of the present invention, wherein current generating module comprises current mirror, current mirror also comprises the reference path with trigger transistor and the outgoing route being electrically connected to output, wherein trigger transistor is electrically connected at appearance resistance circuit, with according to triggering signal conducting, and trigger current mirror is to produce reference current and to produce charging current at outgoing route in reference path.
According to further embodiment of this invention, the pin position that the functional circuit that wherein input is functional device provides.
According to yet another embodiment of the invention, wherein functional circuit is switched to test pattern by operating mode by test pattern enabling signal.
Another aspect of the present invention is to provide a kind of functional device, comprises: functional circuit and test pattern start-up circuit.Test pattern start-up circuit comprises: pulse signal generation module, appearance resistance circuit, current generating module, output capacitance and comparator.Pulse signal generation module produces pulse signal to input.Hold resistance circuit and be electrically connected at input, with return pulse signal, and produce triggering signal every preset time period.Current generating module response triggering signal produces charging current to output.Output capacitance is electrically connected at output, to receive charging current, and makes the output voltage of output progressively increase.Comparator is electrically connected at output, to receive output voltage and reference voltage, wherein comparator compares output voltage and reference voltage, to produce test pattern enabling signal when output voltage is greater than reference voltage to functional circuit, switch to test pattern to make functional circuit by operating mode.
According to one embodiment of the invention, wherein hold resistance circuit and comprise: electric capacity and resistance.Electric capacity has first end and the second end, and wherein first end is electrically connected at pulse signal generation module, and with return pulse signal, the second end is electrically connected to current generating module.Between the second end that resistance is electrically connected at electric capacity and earthing potential.
According to another embodiment of the present invention, wherein current generating module comprises current mirror, current mirror also comprises the reference path with trigger transistor and the outgoing route being electrically connected to output, wherein trigger transistor is electrically connected at appearance resistance circuit, with according to triggering signal conducting, and trigger current mirror is to produce reference current and to produce charging current at outgoing route in reference path.
According to further embodiment of this invention, the wherein pin position that provides for functional circuit of input.
Another aspect of the present invention is providing a kind of test pattern starting method, and be applied in the functional device comprising functional circuit and test pattern start-up circuit, test pattern starting method comprises the following step.Pulse signal is produced to input by pulse signal generation module; By the appearance resistance circuit return pulse signal being electrically connected at input, and produce triggering signal every preset time period; Respond triggering signal by current generating module and produce charging current to output; Receive charging current by the output capacitance being electrically connected at output, and make the output voltage of output progressively increase; Output voltage and reference voltage is received by the comparator being electrically connected at output; And compare output voltage and reference voltage by comparator, to produce test pattern enabling signal when output voltage is greater than reference voltage, switch to test pattern to make functional circuit by operating mode.
According to one embodiment of the invention, wherein current generating module comprises current mirror, current mirror also comprises the reference path with trigger transistor and the outgoing route being electrically connected to output, wherein trigger transistor is electrically connected at appearance resistance circuit, test pattern starting method comprises: make trigger transistor according to triggering signal conducting, and trigger current mirror; And produced reference current by current mirror in reference path and produce charging current at outgoing route.
According to another embodiment of the present invention, wherein pulse signal continues to be produced by pulse signal generation module, until output voltage is greater than reference voltage.
Therefore the invention has the advantages that, test pattern start-up circuit in functional device can only when pulse signal produces, the test pattern of start-up performance circuit, to avoid the test pattern of functional circuit to be started mistakenly by DC noise or ground noise, and reaches above-mentioned object easily.
Accompanying drawing explanation
Fig. 1 is the circuit diagram of a kind of functional device in one embodiment of the invention; And
Fig. 2 is the flow chart of the test pattern starting method in one embodiment of the invention.
Reference numeral explanation
1: functional device 10: test pattern start-up circuit
100: pulse signal generation module 101: electric capacity
102: hold resistance circuit 103: resistance
104: current generating module 105: reference path
106: output capacitance 107: outgoing route
108: comparator 109: trigger transistor
12: functional circuit 200: test pattern starting method
201-207: step
Embodiment
Please refer to Fig. 1.Fig. 1 is in one embodiment of the invention, a kind of circuit diagram of functional device 1.Functional device 1 comprises test pattern start-up circuit 10 and functional circuit 12.
In different embodiments, functional circuit can be any circuit in order to perform a specific function.Functional circuit 12 can operate in operating mode and test pattern, and test pattern start-up circuit 10 can, in order to produce test pattern enabling signal AT to functional circuit 12, make functional circuit 12 switch to test pattern by operating mode.
Test pattern start-up circuit 10 comprises: pulse signal generation module 100, appearance resistance circuit 102, current generating module 104, output capacitance 106 and comparator 108.
Pulse signal generation module 100 produces pulse signal CLK to input IN.In one embodiment, the pin position that provides for functional circuit 12 of input IN.
Hold resistance circuit 102 and be electrically connected at input IN.In one embodiment, hold resistance circuit 102 and comprise electric capacity 101 and resistance 103.
Electric capacity 101 has first end and the second end.Wherein, first end and the pulse signal generation module 100 of electric capacity 101 are electrically connected at input IN, with return pulse signal CLK.Second end of electric capacity 101 is electrically connected to current generating module 104.Between the second end that resistance 103 is electrically connected at electric capacity 101 and earthing potential GND.
Hold resistance circuit 102 return pulse signal CLK, and produce triggering signal TR every preset time period.In one embodiment, this preset time period is identical in fact with the cycle of pulse signal CLK.Hold resistance circuit 102 can filtering from the direct current signal of input IN, produce triggering signal TR with the pulse signal CLK only responding interchange.More specifically, resistance circuit 102 is held not because of any DC noise or ground noise generation triggering signal TR.In one embodiment, triggering signal TR is the pulse signal of a transient state.
In the present embodiment, current generating module 104 comprises current mirror, and this current mirror comprises reference path 105 and is electrically connected to the outgoing route 107 of output O.
Reference path 105 comprises the trigger transistor 109 being electrically connected at and holding resistance circuit 102, to receive triggering signal TR.Trigger transistor 109 is according to triggering signal TR conducting, and trigger current mirror.When current mirror is triggered, reference path 105 will produce reference current Iref, and outgoing route 107 will produce charging current Ich.Therefore, charging current Ich will produce to output O.
Output capacitance 106 is electrically connected at output O, to receive charging current Ich from output O, and makes the output voltage Vo of output O progressively increase.In one embodiment, because current mirror triggered by trigger transistor 109, and trigger transistor 109 be response every preset time period produce the conducting of triggering signal TR institute, therefore output voltage Vo be stepped rise.
Comparator 108 is electrically connected at output O, to receive output voltage Vo and reference voltage Vref.Comparator 108 couples of output voltage Vo and reference voltage Vref compare.When output voltage Vo is greater than reference voltage Vref, comparator 108 produces test pattern enabling signal AT to functional circuit 12, switches to test pattern to make functional circuit 12 by operating mode.
Therefore, in functional device 1 of the present invention, test pattern start-up circuit 10 can only when pulse signal CLK produces, and the test pattern of start-up performance circuit 12, is started by DC noise or ground noise mistakenly to avoid the test pattern of functional circuit 12.
Fig. 2 is in one embodiment of the invention, the flow chart of test pattern starting method 200.Test pattern starting method 200 can be applicable to the functional device 1 as Fig. 1 illustrates, in the test pattern start-up circuit 10 that particularly functional device 1 comprises.Test pattern starting method 200 comprises the following step (should be appreciated that, step mentioned in the present embodiment, except chatting its order person bright especially, all can adjust its tandem according to actual needs, even can perform simultaneously or partly simultaneously).
In step 201, produce pulse signal CLK to input IN by pulse signal generation module 100.
In step 202, by appearance resistance circuit 102 return pulse signal CLK, and produce triggering signal TR every preset time period.
In step 203, respond triggering signal TR by current generating module 104 and produce charging current Ich to output O.
In step 204, receive charging current Ich by output capacitance 106, and make the output voltage Vo of output O progressively increase.
In step 205, receive output voltage Vo and reference voltage Vref by comparator 108, and compare output voltage Vo and reference voltage Vref by comparator 108, and judge whether output voltage Vo is greater than reference voltage Vref.
When output voltage Vo is not more than reference voltage Vref, flow process will be back to step 205, to continue to compare output voltage Vo and reference voltage Vref.And on the other hand, when output voltage Vo is greater than reference voltage Vref, comparator 108 will produce test pattern enabling signal AT in step 206.
Then in step 207, functional circuit 12 switches to test pattern by operating mode.
Although this disclosure discloses as above with execution mode; so itself and be not used to limit this disclosure; those skilled in the art; not departing from the spirit and scope of this disclosure; can be used for a variety of modifications and variations, therefore the protection range of this disclosure should be as the criterion with claims of the application.
Claims (12)
1. a test pattern start-up circuit, comprises:
One pulse signal generation module, in order to produce pulse signal to input;
One holds resistance circuit, is electrically connected at this input, to receive this pulse signal, and produces a triggering signal every a preset time period;
One current generating module, produces charging current to output in order to respond this triggering signal;
One output capacitance, is electrically connected at this output, to receive this charging current, and makes an output voltage of this output progressively increase; And
One comparator, is electrically connected at this output, and to receive this output voltage and a reference voltage, wherein this comparator compares this output voltage and this reference voltage, to produce a test pattern enabling signal when this output voltage is greater than this reference voltage.
2. test pattern start-up circuit as claimed in claim 1, wherein this appearance resistance circuit comprises:
One electric capacity, have a first end and one second end, wherein this first end is electrically connected at this pulse signal generation module, and to receive this pulse signal, this second end is electrically connected to this current generating module; And
One resistance, between this second end being electrically connected at this electric capacity and an earthing potential.
3. test pattern start-up circuit as claimed in claim 1, wherein this current generating module comprises a current mirror, this current mirror also comprises a reference path with a trigger transistor and the outgoing route being electrically connected to this output, wherein this trigger transistor is electrically connected at this appearance resistance circuit, with according to this triggering signal conducting, and trigger this current mirror to produce a reference current in this reference path and to produce this charging current in this outgoing route.
4. test pattern start-up circuit as claimed in claim 1, the pin position that the functional circuit that wherein this input is a functional device provides.
5. test pattern start-up circuit as claimed in claim 4, wherein this functional circuit is switched to a test pattern by an operating mode by this test pattern enabling signal.
6. a functional device, comprises:
One functional circuit; And
One test pattern start-up circuit, comprises:
One pulse signal generation module, in order to produce pulse signal to input;
One holds resistance circuit, is electrically connected at this input, to receive this pulse signal, and produces a triggering signal every a preset time period;
One current generating module, produces charging current to output in order to respond this triggering signal;
One output capacitance, is electrically connected at this output, to receive this charging current, and makes an output voltage of this output progressively increase; And
One comparator, be electrically connected at this output, to receive this output voltage and a reference voltage, wherein this comparator compares this output voltage and this reference voltage, to produce a test pattern enabling signal when this output voltage is greater than this reference voltage to this functional circuit, switch to a test pattern to make this functional circuit by an operating mode.
7. functional device as claimed in claim 6, wherein this appearance resistance circuit comprises:
One electric capacity, have a first end and one second end, wherein this first end is electrically connected at this pulse signal generation module, and to receive this pulse signal, this second end is electrically connected to this current generating module; And
One resistance, between this second end being electrically connected at this electric capacity and an earthing potential.
8. functional device as claimed in claim 6, wherein this current generating module comprises a current mirror, this current mirror also comprises a reference path with a trigger transistor and the outgoing route being electrically connected to this output, wherein this trigger transistor is electrically connected at this appearance resistance circuit, with according to this triggering signal conducting, and trigger this current mirror to produce a reference current in this reference path and to produce this charging current in this outgoing route.
9. functional device as claimed in claim 6, wherein the pin position that provides for this functional circuit of this input.
10. a test pattern starting method, be applied in the functional device comprising a functional circuit and a test pattern start-up circuit, this test pattern starting method comprises:
Pulse signal to one input is produced by a pulse signal generation module;
Hold resistance circuit by be electrically connected at this input one and receive this pulse signal, and produce a triggering signal every a preset time period;
Respond this triggering signal by a current generating module and produce charging current to output;
Receive this charging current by the output capacitance being electrically connected at this output, and make an output voltage of this output progressively increase;
This output voltage and a reference voltage is received by the comparator being electrically connected at this output; And
Compare this output voltage and this reference voltage by this comparator, to produce a test pattern enabling signal when this output voltage is greater than this reference voltage, switch to a test pattern to make this functional circuit by an operating mode.
11. test pattern starting methods as claimed in claim 10, wherein this current generating module comprises a current mirror, this current mirror also comprises a reference path with a trigger transistor and the outgoing route being electrically connected to this output, wherein this trigger transistor is electrically connected at this appearance resistance circuit, and this test pattern starting method comprises:
Make this trigger transistor according to this triggering signal conducting, and trigger this current mirror; And
Produced a reference current by this current mirror in this reference path and produce this charging current at this outgoing route.
12. test pattern starting methods as claimed in claim 10, wherein this pulse signal continues to be produced, until this output voltage is greater than this reference voltage by this pulse signal generation module.
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| CN201410527425.8A CN105575949B (en) | 2014-10-09 | 2014-10-09 | Functional device and its test pattern start-up circuit and method |
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| CN201410527425.8A CN105575949B (en) | 2014-10-09 | 2014-10-09 | Functional device and its test pattern start-up circuit and method |
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| CN105575949B CN105575949B (en) | 2018-05-29 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109490761A (en) * | 2019-01-22 | 2019-03-19 | 上海艾为电子技术股份有限公司 | A kind of test pattern access method and system |
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| US6526536B1 (en) * | 1996-12-12 | 2003-02-25 | Holtek Semiconductor Inc. | Apparatus within an integrated circuit for preventing the integrated circuit from erroneously entering a test mode operation |
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| CN109490761A (en) * | 2019-01-22 | 2019-03-19 | 上海艾为电子技术股份有限公司 | A kind of test pattern access method and system |
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| CN105575949B (en) | 2018-05-29 |
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