CN105510806B - The test system of connection test device and universal testing machine - Google Patents

The test system of connection test device and universal testing machine Download PDF

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Publication number
CN105510806B
CN105510806B CN201610016701.3A CN201610016701A CN105510806B CN 105510806 B CN105510806 B CN 105510806B CN 201610016701 A CN201610016701 A CN 201610016701A CN 105510806 B CN105510806 B CN 105510806B
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circuit
test
voltage
gear
output
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CN105510806A (en
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赵凌云
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Nanjing Xie Chen Electronic Science And Technology Co Ltd
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Nanjing Xie Chen Electronic Science And Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors

Abstract

The invention discloses the test system of a kind of connection test device and universal testing machine, which includes:First test lead, the second test lead, multi gear constant-current source circuit, multi-gear adjustable amplifying circuit and first voltage comparison circuit, wherein the first test lead is connect with one end of multi gear constant-current source circuit and multi-gear adjustable amplifying circuit;Second test lead is grounded, and the first test lead and the second test lead with two tested points on circuit board under test for connecting respectively;Another termination of multi gear constant-current source circuit presets continuity test voltage;The other end of multi-gear adjustable amplifying circuit connects first voltage comparison circuit;First voltage comparison circuit, when the voltage is more than the first reference voltage, judges that the conducting between two tested points is unqualified for comparing with the first reference voltage the voltage that multi-gear adjustable amplifying circuit exports.

Description

The test system of connection test device and universal testing machine
Technical field
The present invention relates to pcb board testing fields, and in particular to a kind of test system of connection test device and universal testing machine System.
Background technology
With using the product of large scale integrated circuit to continuously emerge, the Installation And Test work of corresponding PCB is more next It is more important.The universal test of printed circuit board is the traditional measuring technology of PCB industries.Earliest general electrical testing technology can chase after It traces back to late nineteen seventies early eighties, since component at that time is all made of standard packaging (Pitch 100mil), PCB is also Only THT (through-hole technology) density level, so American-European test machine manufacturer just devises the test machine of a standard grid, as long as Element and wiring on PCB are arranged according to gauged distance, then each test point can be fallen on standard mesh point, because working as Shi Suoyou PCB can be general, therefore referred to as universal testing machine.
Universal testing machine in the prior art sets error range by the parameter acquisition to model, is carried out with Board Under Test Relatively and judge whether qualification.Test operation summary:Only need needle bed be pressed manually, system will automatic business processing, and Go out product quality as a result, removing artificial factor of judgment from, speed is that manual test is incomparable.System is by acquisition, control panel Card and test software composition, external programmable A C/DC power supplys and DC load, high sampling rate product can match external oscillograph. System to PCBA multi signals can synchronism detection, the operation interface of hommization, modular programmed environment and machine (Model) Facilitate conversion, use manpower and material resources sparingly for enterprise, improve production efficiency, to bring economic benefit to enterprise.
But in the test circuit of existing universal testing machine, conducting measuring circuit measurement range is about the Ω of 10 Ω~100 ± 10%, insulation test circuit test scope is 1M Ω~50M Ω ± 10%, as the requirement in the industry to the test of pcb board card is got over Come higher, when carrying out carbon plate test, measuring circuit has been unable to meet test request.Therefore it just needs to change test circuit Into design.
Invention content
Therefore, the technical problem to be solved in the present invention is circuit board conducting, the survey of insulation test circuit in the prior art It is relatively narrow to measure range.
For this purpose, the technical solution that the embodiment of the present invention is provided is:
A kind of connection test device, including:First test lead, the second test lead, multi gear constant-current source circuit, multi-gear adjustable are put Big circuit and first voltage comparison circuit, wherein
First test lead is connect with one end of multi gear constant-current source circuit and multi-gear adjustable amplifying circuit;
Second test lead is grounded, and the first test lead and the second test lead are for be measured with two on circuit board under test respectively Point connection, it is whether qualified to test the conducting between two tested points;
Another termination of multi gear constant-current source circuit presets continuity test voltage, of different sizes for being provided for two tested points Constant current;
The other end of multi-gear adjustable amplifying circuit connects first voltage comparison circuit, for being selected according to the control signal of acquisition The amplification factor selected is and more electric to first voltage by amplified control source by the voltage amplification between two tested points Road;
First voltage comparison circuit is used to compare the voltage that multi-gear adjustable amplifying circuit exports with the first reference voltage, When multi-gear adjustable amplifying circuit output voltage be more than the first reference voltage when, judge carry out continuity test two tested points it Between conducting it is unqualified.
Preferably, multi gear constant-current source circuit includes voltage stabilizing source circuit, multi gear resistor voltage divider circuit, gating switch UC26 and perseverance Current source circuit, the burning voltage of the source of stable pressure circuit output different multiple voltage of output size after multi gear resistor voltage divider circuit, According to the control signal behavior one of which voltage of acquisition, which connects constant-current source circuit and exports constant electricity gating switch UC26 Stream.
Preferably, multi gear constant-current source circuit further includes adjustable first amplifying circuit of amplification factor, and the first amplifying circuit is set It sets between voltage stabilizing source circuit and multi gear resistor voltage divider circuit, the input voltage for adjusting multi gear resistor voltage divider circuit.
Preferably, further include addressing circuit, the input terminal of addressing circuit, which obtains, controls signal, output end and choosing Open up close UC26 address input end connection, addressing circuit according to the control signal of acquisition export different address signals with Selectively turn on a channel in gating switch UC26.
Preferably, multi-gear adjustable amplifying circuit include operational amplifier UC28A, resistance R62, multiple feedback resistance circuits and By the gating switch UC27 of the control signal control obtained, one end of resistance R62 tap into row continuity test two tested points it Between voltage, the other end and operational amplifier UC28A first input end connect, one end of multiple feedback resistance circuits respectively with The first input end connection of operational amplifier UC28A, the other end are correspondingly connected with the multiple input end of gating switch UC27 respectively, The output end of gating switch UC27 is connect with the output end of operational amplifier UC28A, the second input terminal of operational amplifier UC28A Ground connection.
A kind of insulated test device, including:Third test lead, the 4th test lead, operational amplification circuit and second voltage ratio Compared with circuit, wherein
Operational amplification circuit includes multiple feedback circuits and operational amplifier U17A, one end of multiple feedback circuits respectively with The first input end connection of operational amplifier U17A, output end of the other end respectively with operational amplifier U17A are connected to operation The output end of amplifying circuit, the second input end grounding of operational amplifier U17A;
Each of multiple feedback circuits includes the first feedback resistance and controllable switch being connected in series with, and controllable switch is used According to the control signal conduction of acquisition or disconnecting corresponding feedback circuit to adjust the amplification factor of operational amplification circuit;
Third test lead is connect with the first input end of operational amplifier U17A;
4th test termination preset Insulation test voltage, third test lead and the 4th test lead for respectively with circuit under test Two tested points connection on plate, it is whether qualified to test the insulation between two tested points;
The output end of operational amplification circuit is connect with second voltage comparison circuit, for putting default Insulation test voltage Greatly, and by amplified control source to second voltage comparison circuit, the amplification factor of operational amplification circuit is by the feedback that is connected Resistance between the resistance of circuit and two tested points determines;
Second voltage comparison circuit, the voltage for exporting operational amplification circuit compare with the second reference voltage, when Operational amplification circuit output voltage be more than the second reference voltage when, judge carry out Insulation test two tested points between it is exhausted Edge is unqualified.
A kind of test system of universal testing machine, including multi gear constant-current source circuit, multi-gear adjustable amplifying circuit, first voltage Comparison circuit, operational amplification circuit and second voltage comparison circuit, the first controllable switch and the five, the 6th test leads, wherein
5th test lead of test system and the 6th test lead are connect with two tested points on circuit board under test respectively, with Test whether conducting between two tested points is qualified or whether insulation is qualified;
When carrying out continuity test, the 6th test lead connects with one end of multi gear constant-current source circuit and multi-gear adjustable amplifying circuit It connects;When carrying out Insulation test, the 6th test termination presets Insulation test voltage;
Another termination of multi gear constant-current source circuit presets continuity test voltage, to be measured for two for progress continuity test Point provides constant current of different sizes;
The other end of multi-gear adjustable amplifying circuit connects first voltage comparison circuit, for being selected according to the control signal of acquisition The amplification factor selected is by the voltage amplification between two tested points for carrying out continuity test, and by amplified control source to One voltage comparator circuit;
First voltage comparison circuit is used to compare the voltage that multi-gear adjustable amplifying circuit exports with the first reference voltage, When multi-gear adjustable amplifying circuit output voltage be more than the first reference voltage when, judge carry out continuity test two tested points it Between conducting it is unqualified;
Operational amplification circuit includes multiple feedback circuits and operational amplifier U17A, one end of multiple feedback circuits respectively with The first input end connection of operational amplifier U17A, output end of the other end respectively with operational amplifier U17A are connected to operation The output end of amplifying circuit, the second input end grounding of operational amplifier U17A;
Each of multiple feedback circuits includes the first feedback resistance and controllable switch being connected in series with, and controllable switch is used According to the control signal conduction of acquisition or disconnecting corresponding feedback circuit to adjust the amplification factor of operational amplification circuit;
5th test lead is connect with the first input end of operational amplifier U17A;
The output end of operational amplification circuit is connect with second voltage comparison circuit, for putting default Insulation test voltage Greatly, and by amplified control source to second voltage comparison circuit, the amplification factor of operational amplification circuit is by the feedback that is connected Resistance between the resistance of circuit and two tested points for carrying out Insulation test determines;
Second voltage comparison circuit, the voltage for exporting operational amplification circuit compare with the second reference voltage, when Operational amplification circuit output voltage be more than the second reference voltage when, judge carry out Insulation test two tested points between it is exhausted Edge is unqualified;
First controllable switch is arranged between the first input end and output end of operational amplifier U17A, is carrying out conducting survey When examination, whole feedback circuits are disconnected according to control signal, and be closed the first controllable switch so that the first of operational amplifier U17A The voltage of input terminal is equal to the voltage of its second input terminal.
Preferably, further include switching circuit for being closed or disconnecting the test system, switching circuit includes second controllable Switch and the control circuit being connect with the second controllable switch control terminal, one end of the second controllable switch is with operational amplifier U17A's First input end connects, and the other end is connect with the 5th test lead of the test system, and control circuit is for receiving control signal simultaneously The break-make of the second controllable switch is controlled according to the control signal.
Preferably, control circuit includes power circuit, third controllable switch and the first photoelectric isolating circuit, power circuit with Third controllable switch is connected in series with the control terminal for being followed by the second controllable switch, and the input terminal of the first photoelectric isolating circuit receives control The control terminal of signal, output end and third controllable switch is connected to control the break-make of third controllable switch.
Preferably, which further includes relay circuit and the second photoelectric isolating circuit, and relay circuit is arranged in multi gear Between constant-current source circuit and the 6th test lead of the test system, the second photoelectric isolating circuit one termination presets Insulation test electricity Pressure, the other end are connect with the 6th test lead of the test system, and relay circuit and the second photoelectric isolating circuit are used for according to control Signal processed switches the on off operating mode of insulated test device and connection test device.
Preferably, further include multiple for switching the 4th controllable switch of tested point, carry out Insulation test two are to be measured A tested point in two tested points of point and/or progress continuity test is connect with the 5th test lead of the test system, separately One tested point is connect by the 4th controllable switch with the 6th test lead of the test system respectively, the break-make of the 4th controllable switch By the control signal control obtained.
Preferably, further include that theoretical value provides circuit, for providing the first reference voltage in continuity test, surveyed in insulation The second reference voltage is provided when examination, it includes D/A converting circuit and reference voltage circuit, digital-to-analogue conversion electricity that theoretical value, which provides circuit, Road is used to export corresponding voltage according to the control instruction of acquisition, and reference voltage circuit provides benchmark electricity for D/A converting circuit Pressure.
Technical solution of the present invention has the following advantages that:
1. connection test device provided in an embodiment of the present invention, can be according to reality when carrying out the continuity test of circuit board It needs to select the different stalls of multi gear constant-current source circuit to provide different size of constant current for two tested points, can also lead to It crosses and voltage of the different stalls of multi-gear adjustable amplifying circuit between two tested points is selected to select different amplification factors.Cause This, the connection test device is when carrying out the continuity test of circuit board with larger measurement range.
2. connection test device provided in an embodiment of the present invention, in multi gear constant-current source circuit, be by voltage stabilizing source circuit to Constant-current source circuit provides input voltage, the stability of its output current is further ensured, to improve connection test device Measurement accuracy.
3. connection test device provided in an embodiment of the present invention, multi gear constant-current source circuit further includes that amplification factor is adjustable First amplifying circuit, the first amplifying circuit are arranged between voltage stabilizing source circuit and multi gear resistor voltage divider circuit, the first amplification electricity Road further expands the adjustable extent of multi gear constant-current source circuit output current, to also further expand continuity test dress The test scope set.
4. insulated test device provided in an embodiment of the present invention, can be according to reality when carrying out the Insulation test of circuit board It needs to gate the different feedback circuits on operational amplifier U17A, to select different amplification factors.Therefore, the Insulation test Device is when carrying out Insulation test with larger measurement range.
5. the test system of universal testing machine provided in an embodiment of the present invention, two both may be implemented on circuit board are to be measured Insulation test between point, can also realize the continuity test between two tested points.When carrying out Insulation test, operation amplifier Each feedback circuit in circuit includes the first feedback resistance and controllable switch being connected in series with, and each controllable switch leads to The disconnected control signal by obtaining controls, to which different feedback circuits be connected with the different times magnification of Selecting operation amplifying circuit Number, to improve the measurement range of Insulation test.When carrying out continuity test, multi gear constant-current source circuit can be according to the control of acquisition For the different gear of signal behavior processed to export different size of electric current to two tested points, multi-gear adjustable amplifying circuit can also root According to the different gear of control signal behavior of acquisition to adjust its amplification factor, to improve the measurement range of continuity test, I.e. the test system of the universal testing machine all has larger test scope when carrying out Insulation test and continuity test.
6. the test system of universal testing machine provided in an embodiment of the present invention, theoretical value provides circuit can direct basis The voltage of the corresponding size of control signal output of acquisition, therefore when carrying out continuity test or Insulation test, according to Insulation test The control signal of the generations such as the gear of device selection or the gear of connection test device selection can directly control theoretical value offer The corresponding reference voltage of circuit output relatively determines whether are insulation between two tested points or conducting with real output value It is qualified.
Description of the drawings
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art Embodiment or attached drawing needed to be used in the description of the prior art are briefly described, it should be apparent that, in being described below Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor It puts, other drawings may also be obtained based on these drawings.
Fig. 1 is the structure diagram of the connection test device of the embodiment of the present invention 1;
Fig. 2 is the circuit diagram of the multi gear constant-current source circuit in Fig. 1;
Fig. 3 is the circuit diagram of the addressing circuit in Fig. 2;
Fig. 4 is the circuit diagram of the multi-gear adjustable amplifying circuit in Fig. 1;
Fig. 5 be setting multi-gear adjustable amplifying circuit in Fig. 1 before pressure limited protection circuit and voltage follower circuit Circuit diagram;
Fig. 6 is the structure diagram of the insulated test device of the embodiment of the present invention 2;
Fig. 7 is the overall structure block diagram of the test system of the universal testing machine of the embodiment of the present invention 3;
Fig. 8 is the circuit diagram of the switching circuit in Fig. 7;
Fig. 9 is the circuit diagram of the control circuit of the switching circuit in Fig. 7;
Figure 10 is the circuit diagram of the relay circuit in Fig. 7;
Figure 11 is the circuit diagram of the second photoelectric isolating circuit in Fig. 7;
Figure 12 provides the circuit diagram of circuit for the theoretical value in Fig. 7;
Figure 13 and Figure 14 is the integrated circuit schematic diagram of the test system of universal testing machine in the embodiment of the present invention 3.
Specific implementation mode
Technical scheme of the present invention is clearly and completely described below in conjunction with attached drawing, it is clear that described implementation Example is a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, ordinary skill The every other embodiment that personnel are obtained without making creative work, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that term " first ", " second ", " third " are used for description purposes only, It is not understood to indicate or imply relative importance.In addition unless specifically defined or limited otherwise, term " connection " should be done It broadly understood, for example, it may be being connected directly, can also can also be inside two elements indirectly connected through an intermediary Connection, can be wirelessly connected, can also be wired connection.It for the ordinary skill in the art, can be specific Situation understands the concrete meaning of above-mentioned term in the present invention.
As long as in addition, technical characteristic involved in invention described below different embodiments non-structure each other It can be combined with each other at conflict.
Embodiment 1
Present embodiments provide a kind of connection test device, the various control signals, control instruction in the present embodiment by with The host computer output of connection test device connection, as shown in Figure 1, including:First test lead, the second test lead, multi gear constant current Source circuit, multi-gear adjustable amplifying circuit and first voltage comparison circuit, wherein
First test lead is connect with one end of multi gear constant-current source circuit and multi-gear adjustable amplifying circuit;
Second test lead is grounded, and the first test lead and the second test lead are for be measured with two on circuit board under test respectively Point connection, it is whether qualified to test the conducting between two tested points;
Another termination of multi gear constant-current source circuit presets continuity test voltage, of different sizes for being provided for two tested points Constant current;
The other end of multi-gear adjustable amplifying circuit connects first voltage comparison circuit, for being selected according to the control signal of acquisition The amplification factor selected is and more electric to first voltage by amplified control source by the voltage amplification between two tested points Road;
First voltage comparison circuit is used to compare the voltage that multi-gear adjustable amplifying circuit exports with the first reference voltage, When multi-gear adjustable amplifying circuit output voltage be more than the first reference voltage when, judge carry out continuity test two tested points it Between conducting it is unqualified.
Connection test device provided in an embodiment of the present invention, when carrying out continuity test, by its first test lead and second Test lead is connect with two tested points on circuit board under test respectively, and default continuity test voltage, is believed according to the control of acquisition Number selection multi gear constant-current source circuit and multi-gear adjustable amplifying circuit in suitable gear.Later, according to the multi gear constant-current source of selection The gear of circuit and the gear of multi-gear adjustable amplifying circuit select corresponding first reference voltage.Multi gear constant-current source circuit is defeated at this time The electric current gone out is certain, and the amplification factor of multi-gear adjustable amplifying circuit is also certain, and the resistance between two tested points is bigger, voltage Bigger, the voltage of multi-gear adjustable amplifying circuit output is also bigger;Conversely, the voltage of multi-gear adjustable amplifying circuit output is smaller.Cause This, if the voltage of multi-gear adjustable amplifying circuit output is more than the first reference voltage, the conducting between two tested points is not It is qualified.
Connection test device provided in an embodiment of the present invention, can be according to practical need when carrying out the continuity test of circuit board Select the different stalls of multi gear constant-current source circuit to provide different size of constant current for two tested points, can also for into Voltage between two tested points of row continuity test selects different amplification factors.Therefore, which is carrying out With larger measurement range when the continuity test of circuit board.
As preferred embodiment, as shown in Fig. 2, multi gear constant-current source circuit includes voltage stabilizing source circuit, multi gear resistance point Volt circuit, gating switch UC26 (74HC4051) and constant-current source circuit, the burning voltage of source of stable pressure circuit output is through multi gear resistance The different multiple voltage of output size after bleeder circuit, gating switch UC26 are electric according to the control signal behavior one of which of acquisition Pressure, the voltage connect constant-current source circuit output constant current.
It is to provide input voltage to constant-current source circuit by voltage stabilizing source circuit in multi gear constant-current source circuit in the present embodiment, The stability for further ensuring its output current, to improve the measurement accuracy of connection test device.
Specifically, above-mentioned voltage stabilizing source circuit includes controllable accurate source of stable pressure Z2 (TL431), resistance R50, diode D19, electricity Hinder R52, capacitance CP7 and capacitance C106, controllable accurate source of stable pressure Z2 cathode and with reference to pole respectively with one end of resistance R50, two The anode of pole pipe D19 connects, and another termination power supply of resistance R50, the anode of controllable accurate source of stable pressure Z2 connects default conducting The cathode of test voltage (GNDH), diode D19 meets default continuity test voltage, capacitance CP7 and capacitance C106 by resistance R52 One end connect respectively with the cathode of controllable accurate source of stable pressure Z2, the other end connects default continuity test voltage respectively.Controllable accurate The cathode of source of stable pressure Z2 and output end of the junction of capacitance CP7, C106 as the voltage stabilizing source circuit.Default continuity test voltage That is the voltage between GNDH and GND, the voltage when carrying out continuity test between GNDH and GND is relatively low, may be, for example, 24V.
Above-mentioned multi gear resistor voltage divider circuit includes resistance R53-R58, R99-104 and R114, and one end of resistance R53 is used as should The input terminal of multi gear resistor voltage divider circuit, the other end are sequentially connected in series with resistance R54-R58, R99-101, R103, R104 and R114 Connection is followed by default continuity test voltage, and resistance R102 is in parallel with resistance R101.It is opened with gating the junction of resistance R54 and R55 Close the first input end connection of UC26, the junction of resistance R55 and R56 are connect with the second input terminal of gating switch UC26, electricity Resistance R56 and R57 junction connect with the third input terminal of gating switch UC26, in voltage stabilizing source circuit diode D19 cathode It is connect with the 4th input terminal of gating switch UC26, the 5th input terminal of the junction of resistance R57 and R58 and gating switch UC26 It connects, the junction of resistance R101 and R103 are connect with the 6th input terminal of gating switch UC26, the company of resistance R103 and R104 Connect place connect with the 7th input terminal of gating switch UC26, the junction of resistance R104 and R114 and gating switch UC26 the 8th Input terminal connects.
Above-mentioned constant-current source circuit includes amplifier U25B (LF353D), field-effect tube QN1 and resistance R64, and amplifier U25B's is same Phase input terminal connect with the output end of gating switch UC26, the grid connection of output end and field-effect tube QN1, inverting input with The source electrode of field-effect tube QN1 connects, the output end of field-effect tube QN1 to drain as the constant-current source circuit, field-effect tube QN1's Source electrode is connect with resistance R64 is followed by default continuity test voltage.
Above-mentioned multi gear constant-current source circuit provided by the embodiment, can will be of different sizes by the control signal behavior of acquisition In control source to constant-current source circuit, to which the different constant current of output size gives two tested points of progress continuity test, Expand the test scope of continuity test.In addition, the multi gear constant-current source circuit reliability is high, the electric current of output is constant, also improves The reliability of test result.
As further preferred embodiment, as shown in Fig. 2, multi gear constant-current source circuit further includes that amplification factor is adjustable First amplifying circuit, the first amplifying circuit is arranged between voltage stabilizing source circuit and multi gear resistor voltage divider circuit, for adjusting multi gear The input voltage of resistor voltage divider circuit.First amplifying circuit includes amplifier U25A (LF353D), resistance R51, variable resistance VR1 With capacitance C105, the in-phase input end of amplifier U25A connect with the output end of voltage stabilizing source circuit, output end and multi gear electric resistance partial pressure The input terminal of circuit connects, and the both ends of variable resistance VR1 are connect with the inverting input of amplifier U25A, output end respectively, capacitance C105 is in parallel with variable resistance VR1, and one end of resistance R51 is connect with the inverting input of amplifier U25A, another termination is preset and led Logical test voltage.
In the embodiment of the present invention, the first amplifying circuit which can be adjusted by variable resistance VR1 further expands The big adjustable extent of multi gear constant-current source circuit output current, to also further expand the test model of the connection test device It encloses.
Specifically, which further includes addressing circuit, and the input terminal of addressing circuit obtains control The address input end of signal, output end and gating switch UC26 connects, and addressing circuit is exported according to the control signal of acquisition Different address signals is to selectively turn on a channel in gating switch UC26.As shown in figure 3, the addressing circuit Including d type flip flop UC18 (74HCT374), inverter buffer UC24-A/UC24-B/UC24-C (7406), photo-coupler T21/ The input terminal of T22/T23 (PC817) and resistance R59-R61, resistance R47-R49, d type flip flop UC18 are connect with host computer to obtain Control signal, wherein three output ends are connect with the input terminal of inverter buffer UC24-A/UC24-B/UC24-C respectively, reverse phase The output end of buffer UC24-A/UC24-B/UC24-C is connect with the cathode of photo-coupler T21/T22/T23 respectively, optical coupling The anode of device T21/T22/T23 is connect by resistance R47-R49 with power supply respectively, the hair of photo-coupler T21/T22/T23 Emitter-base bandgap grading is connect with three address input ends of gating switch UC26 respectively.One end of resistance R59-R61 respectively with photo-coupler The emitter connection of T21/T22/T23, the other end connect default continuity test voltage, the current collection of photo-coupler T21/T22/T23 Pole connects power supply respectively.
The addressing circuit in the embodiment of the present invention allows host computer easily to control gating switch UC26, from And easily select the voltage being input in constant-current source circuit.As being switched fast for multi gear constant-current source circuit gear provides just Profit.
As preferred embodiment, as shown in figure 4, above-mentioned multi-gear adjustable amplifying circuit include operational amplifier UC28A, Resistance R62, multiple feedback resistance circuits and the gating switch UC27 by the control signal control obtained, a termination of resistance R62 The first input end for carrying out the voltage between two tested points of continuity test, the other end and operational amplifier UC28A connects, more One end of a feedback resistance circuit is connect with the first input end of operational amplifier UC28A respectively, the other end is opened with gating respectively The multiple input end for closing UC27 is correspondingly connected with, and the output end of gating switch UC27 is connect with the output end of operational amplifier UC28A, The second input end grounding of operational amplifier UC28A.Specifically, which is reverse phase scaling circuit, Plurality of feedback resistance circuit is respectively the first feedback resistance circuit formed to be sequentially connected in series by resistance R63-R67, by resistance R77-R80 is sequentially connected in series the second feedback resistance circuit to be formed, is sequentially connected in series the third feedback resistance formed by resistance R81-R83 Circuit, the 4th feedback resistance circuit formed of being connected by resistance R84 and R68, the 5th feedback resistance electricity being made of resistance R85 Road is sequentially connected in series the 6th feedback resistance circuit formed by resistance R69, R73 and R74, is sequentially connected in series and is formed by resistance R93-R95 The 7th feedback resistance circuit, the 8th feedback resistance circuit that is made of resistance R109.First feedback resistance circuit is to the 8th anti- One end of feed resistance circuit connect with the inverting input of amplifier UC28A respectively, the other end respectively with gating switch UC27 the One input terminal to the 8th input terminal is correspondingly connected with.
In addition, as shown in figure 3, three address input ends of gating switch UC27 are triggered with D in addressing circuit respectively Three output ends of device UC18 connect, and three output ends are also defeated with inverter buffer UC24-A/UC24-B/UC24-C simultaneously Enter end connection, i.e. host computer also controls gating switch UC27 while controlling gating switch UC26 by addressing circuit.
In the embodiment of the present invention, host computer only needs to generate a control instruction and output can control gating simultaneously and open UC26 and UC27 is closed, that is, facilitates gear switch when continuity test.
As further preferred embodiment, as shown in figure 5, the of multi-gear adjustable amplifying circuit and connection test device The voltage follower circuit for including successively also pressure limited protection circuit between one test lead and being made of amplifier UC28B, voltage-limiting protection electricity Road includes zener diode ZDP1 and resistance R, R0, and one end of resistance R, R0 connect with the first test lead of connection test device respectively It connects, the other end of resistance R is connect with the anode of zener diode ZDP1, the other end of resistance R0 and bearing for zener diode ZDP1 Output end and amplifier UC28B of the junction of extremely common ground connection, resistance R and zener diode ZDP1 as the pressure limited protection circuit In-phase input end connection, the output end of amplifier UC28B connect with resistance R62.Wherein, zener diode ZDP1 is 12V, is used for Limitation output prevents late-class circuit to be damaged to the maximum voltage of multi-gear adjustable amplifying circuit.
Embodiment 2
Present embodiments provide a kind of insulated test device, the various control signals, control instruction in the present embodiment by with The host computer output of insulated test device connection, as shown in fig. 6, including:Third test lead, the 4th test lead, operation amplifier Circuit and second voltage comparison circuit, wherein
Operational amplification circuit includes multiple feedback circuits and operational amplifier U17A, one end of multiple feedback circuits respectively with The first input end connection of operational amplifier U17A, output end of the other end respectively with operational amplifier U17A are connected to operation The output end of amplifying circuit, the second input end grounding of operational amplifier U17A;
Each of multiple feedback circuits includes the first feedback resistance and controllable switch being connected in series with, and controllable switch is used According to the control signal conduction of acquisition or disconnecting corresponding feedback circuit to adjust the amplification factor of operational amplification circuit;
Third test lead is connect with the first input end of operational amplifier U17A;
4th test termination preset Insulation test voltage, third test lead and the 4th test lead for respectively with circuit under test Two tested points connection on plate, it is whether qualified to test the insulation between two tested points;
The output end of operational amplification circuit is connect with second voltage comparison circuit, for putting default Insulation test voltage Greatly, and by amplified control source to second voltage comparison circuit, the amplification factor of operational amplification circuit is by the feedback that is connected Resistance between the resistance of circuit and two tested points determines;
Second voltage comparison circuit, the voltage for exporting operational amplification circuit compare with the second reference voltage, when Operational amplification circuit output voltage be more than the second reference voltage when, judge carry out Insulation test two tested points between it is exhausted Edge is unqualified.
Insulated test device provided in this embodiment is needed when carrying out Insulation test by its third test lead and the 4th Test lead is connect with two tested points on circuit board under test respectively, and default Insulation test voltage, and host computer is according to practical need Corresponding control signal is exported to select to be connected suitable feedback circuit, to select suitable amplification factor.Later, according to choosing The feedback circuit for selecting conducting selects corresponding second reference voltage.Resistance between two tested points is bigger, operational amplification circuit The voltage of output is smaller;Conversely, the voltage of operational amplification circuit output is bigger.Therefore, if the electricity of operational amplification circuit output Pressure is more than the second reference voltage, then illustrates that the insulation between two tested points is unqualified.
Insulated test device provided in an embodiment of the present invention, can be according to practical need when carrying out the Insulation test of circuit board The different feedback circuits on operational amplifier U17A are gated, to select different amplification factors.Therefore, which fills It sets when carrying out Insulation test with larger measurement range.
Embodiment 3
As shown in fig. 7, a kind of test system of universal testing machine is present embodiments provided, the various controls in the present embodiment Signal, control instruction are exported by the host computer being connect with the test system, including multi gear constant-current source circuit, multi-gear adjustable amplification electricity Road, first voltage comparison circuit, operational amplification circuit and second voltage comparison circuit, the first controllable switch and the five, the 6th Test lead, wherein
5th test lead of test system and the 6th test lead are connect with two tested points on circuit board under test respectively, with Test whether conducting between two tested points is qualified or whether insulation is qualified;
When carrying out continuity test, the 6th test lead connects with one end of multi gear constant-current source circuit and multi-gear adjustable amplifying circuit It connects;When carrying out Insulation test, the 6th test termination presets Insulation test voltage;
Another termination of multi gear constant-current source circuit presets continuity test voltage, to be measured for two for progress continuity test Point provides constant current of different sizes;
The other end of multi-gear adjustable amplifying circuit connects first voltage comparison circuit, for being selected according to the control signal of acquisition The amplification factor selected is by the voltage amplification between two tested points for carrying out continuity test, and by amplified control source to One voltage comparator circuit;
First voltage comparison circuit is used to compare the voltage that multi-gear adjustable amplifying circuit exports with the first reference voltage, When multi-gear adjustable amplifying circuit output voltage be more than the first reference voltage when, judge carry out continuity test two tested points it Between conducting it is unqualified;
Operational amplification circuit includes multiple feedback circuits and operational amplifier U17A, one end of multiple feedback circuits respectively with The first input end connection of operational amplifier U17A, output end of the other end respectively with operational amplifier U17A are connected to operation The output end of amplifying circuit, the second input end grounding of operational amplifier U17A;
Each of multiple feedback circuits includes the first feedback resistance and controllable switch being connected in series with, and controllable switch is used According to the control signal conduction of acquisition or disconnecting corresponding feedback circuit to adjust the amplification factor of operational amplification circuit;
5th test lead is connect with the first input end of operational amplifier U17A;
The output end of operational amplification circuit is connect with second voltage comparison circuit, for putting default Insulation test voltage Greatly, and by amplified control source to second voltage comparison circuit, the amplification factor of operational amplification circuit is by the feedback that is connected Resistance between the resistance of circuit and two tested points for carrying out Insulation test determines;
Second voltage comparison circuit, the voltage for exporting operational amplification circuit compare with the second reference voltage, when Operational amplification circuit output voltage be more than the second reference voltage when, judge carry out Insulation test two tested points between it is exhausted Edge is unqualified;
First controllable switch is arranged between the first input end and output end of operational amplifier U17A, is carrying out conducting survey When examination, whole feedback circuits are disconnected according to control signal, and be closed the first controllable switch so that the first of operational amplifier U17A The voltage of input terminal is equal to the voltage of its second input terminal.I.e. when carrying out continuity test, the 5th test lead of the test system With the second input terminal equipotential of the ground connection of operational amplifier U17A.
The test system of universal testing machine provided in this embodiment both may be implemented between two tested points on circuit board Insulation test, can also realize the continuity test between two tested points.When carrying out Insulation test, the control of host computer output Signal processed can by control controllable switch come different feedback circuits is connected with select different amplification factors (and disconnect first Controllable switch), to improve the measurement range of Insulation test.When carrying out continuity test, host computer can be with control selections multi gear The amplification factor of the size of current and multi-gear adjustable amplifying circuit of the output of constant-current source circuit, to improve the survey of continuity test Range is measured, i.e. the test system of the universal testing machine all has larger test model when carrying out Insulation test and continuity test It encloses.
Specifically, as shown in figure 13, above-mentioned implementation can be used in above-mentioned multi gear constant-current source circuit and multi-gear adjustable amplifying circuit Physical circuit described in example 1.The gating in gating switch UC26 and multi-gear adjustable amplifying circuit in multi gear constant-current source circuit Switch UC27 can also be used the addressing circuit in embodiment 1 and be controlled the control signal that is exported according to host computer.Such as figure Shown in 14, above-mentioned operational amplification circuit further includes diode D513 and D514, capacitance CP17 and voltage-stabiliser tube ZD26, ZD27, two poles It is connect respectively with the first input end of operational amplifier U17A and the second input terminal after pipe D513 and D514 reverse parallel connection, capacitance The both ends of CP17 are connect with the first input end of operational amplifier U17A, output end respectively, voltage-stabiliser tube ZD26, ZD27 differential concatenation It is connect respectively with the first input end of operational amplifier U17A, output end afterwards.
Specifically, as shown in Fig. 7,8 and 9, the test system of universal testing machine provided in this embodiment further includes for closing The switching circuit of the test system is closed or disconnects, switching circuit includes the second controllable switch P1 and controlled with the second controllable switch P1 The control circuit of connection, one end of the second controllable switch P1 is held to be connect with the first input end of operational amplifier U17A, the other end It is connect with the 5th test lead of the test system, the control circuit is for receiving control signal and according to control signal control the The break-make of two controllable switch P1.
Specifically, as shown in figures 9 and 14, control circuit includes power circuit, third controllable switch U5 (MC14066) and One photoelectric isolating circuit, power circuit are connected in series with the control terminal for being followed by the second controllable switch P1 with third controllable switch U5, the The control terminal that the input terminal of one photoelectric isolating circuit receives control signal, output end and third controllable switch U5 is connected to control this The break-make of third controllable switch U5.Power circuit includes power module UN308 (B0505S-W5) and capacitance CP1, power module The positive output end and negative output terminal of UN308 is connect with the both ends of capacitance CP1 respectively.The positive output end of power supply UN308 passes through two poles Pipe D2 is connect with the first end of the second controllable switch P1, and the negative output terminal of power supply UN308 passes sequentially through resistance RP1 and third is controllable Switch U5 is connect with the control terminal of the second controllable switch P1, and the control terminal and first end of the second controllable switch P1 pass through resistance RP71 Connection, the second end of the second controllable switch P1 are connect with the 5th test lead of the test system.Specifically, the second controllable switch P1 For PNP type triode (MMBT A92 (2D)).First photoelectric isolating circuit includes optocoupler T24 (6N137), resistance R113, resistance The anode of R107 and zener diode ZD62, optocoupler T24 connect+5V voltages, cathode and host computer connection to connect by resistance R113 The control signal of host computer is received, the Enable Pin VE and power end VCC of optocoupler T24 connect power supply, the ground terminal of optocoupler T24 respectively The control terminal of GND ground connection, output end and third controllable switch U5 connects.In addition, the output end of optocoupler T24 is connect by resistance R107 Power supply, and connect communicatively by zener diode ZD62.
As specific embodiment, as shown in fig. 7, in the test system of universal testing machine provided in this embodiment, also Including relay circuit and the second photoelectric isolating circuit, relay circuit is arranged in multi gear constant-current source circuit and the test system Between 6th test lead, the second photoelectric isolating circuit one termination preset Insulation test voltage, the other end and the test system the Six test leads connect, and the relay circuit and the second photoelectric isolating circuit are used to switch Insulation test function according to control signal With continuity test function.Specifically, it when carrying out Insulation test, opens the second photoelectric isolating circuit and disconnects relay circuit; When carrying out continuity test, opens relay circuit and disconnect the second photoelectric isolating circuit.
Specifically, as shown in Figure 10 and 13, above-mentioned relay circuit includes relay UC33 (AD4C111), inverter buffer 6 pins of device UC24-D and UC24-F (7406), resistance R111 and R112, Light-emitting diode LED 4 and LED5, relay UC33 It is connect with the 6th test lead of the test system after being connected with 7 pins, 8 pins pass through diode D1 and multi gear constant-current source circuit Output end connection, 5 pins connect with the input terminal of multi-gear adjustable amplifying circuit, 1 pin sending and receiving optical diode LED5 and electricity successively Resistance R111 is followed by power supply, 2 pins and is connect with host computer by inverter buffer UC24-F to receive control signal, 3 pins Sending and receiving optical diode LED4 and resistance R112 is followed by power supply successively, 4 pins pass through inverter buffer UC24-D and host computer Connection is to receive control signal.
As shown in figures 11 and 13, above-mentioned second photoelectric isolating circuit includes optocoupler UNX1 (AQV254H), resistance R117- R119, inverter buffer UC5-D and UC5-E (7406), 1 pin of optocoupler UNX1 connect power supply, reverse phase by resistance R119 The input terminal of buffer UC5-D connect with host computer, output end respectively with the input terminal of inverter buffer UC5-E and resistance R117 One end connection, another termination power supply of resistance R117, the output end of inverter buffer UC5-E is respectively with optocoupler UNX1's One end connection of 2 pins, resistance R118, another termination power supply of resistance R118,4 pins of optocoupler UNX1 and the test system The 6th test lead connection connection of system, 6 pins of optocoupler UNX1 connect default Insulation test voltage.Preferably, the 6 of optocoupler UNX1 are drawn Foot is connect with one end of resistance R75, another termination of resistance R75 presets Insulation test voltage, and capacitance C96 and resistance R75 is simultaneously Connection.
As preferred embodiment, as shown in figure 12, the test system of universal testing machine further includes that theoretical value provides electricity Road provides the second reference voltage in Insulation test for providing the first reference voltage in continuity test, and theoretical value provides electricity Road includes D/A converting circuit and reference voltage circuit, and D/A converting circuit is used to be exported according to the control instruction of acquisition corresponding Voltage, reference voltage circuit provide reference voltage for D/A converting circuit.
Specifically, as shown in figure 12, D/A converting circuit includes digital analog converter UC13 (TLC5615), the ends DIN, The ends SCLK andEnd is connect with host computer to receive the control signal of host computer, the output at the ends REFIN and reference voltage circuit End connection, OUT terminal after the voltage follower that is made of amplifier UC14A (LF353D) by exporting the first reference voltage or second Reference voltage.Said reference potential circuit includes controllable accurate source of stable pressure Z1 (TL431), resistance R5, capacitance CP5 and by amplifier The voltage follower that UC19A (LF353D) is formed, the cathode of controllable accurate source of stable pressure Z1 and with reference to pole respectively with resistance R5 one One end connection at end, capacitance CP5, the anode of controllable accurate source of stable pressure Z1, the other end ground connection of capacitance CP5, the voltage follower Input terminal connect with the cathode of controllable accurate source of stable pressure Z1, export the ends REFIN of termination digital analog converter UC13, resistance R5's Another termination power supply.It further includes the voltage comparator circuit being made of amplifier UC15 that theoretical value, which provides circuit, amplifier UC15's Two input terminals are connect with the output end of the output end of amplifier UC19A, amplifier UC14A respectively, are used for benchmark voltage circuit With the voltage swing of D/A converting circuit output.In the present embodiment, under normal circumstances, the voltage of the output of amplifier UC14A should More than the voltage of amplifier UC19A outputs, if D/A converting circuit occurs that its output voltage is caused to drop below amplifier When the voltage of UC19A outputs, the voltage comparator circuit that should be made of amplifier UC15 can output abnormality signal in time, to make User can have found D/A converting circuit failure in time.Resistance R6 is as pull-up resistor, the output end of one end and amplifier UC15 Connection, another termination power supply.
In the test system of universal testing machine provided in an embodiment of the present invention, when carrying out Insulation test, host computer according to The feedback circuit of operational amplification circuit gating, the i.e. amplification factor of selection export different control signals and provide electricity to theoretical value Road, which provides circuit can export corresponding voltage as the second reference voltage according to the control signal of host computer, with It is compared to judge whether the insulation between two tested points is qualified with the voltage of operational amplification circuit reality output.Carry out When continuity test, the amplification factor of size of current and multi-gear adjustable amplifying circuit that host computer is exported according to multi gear constant-current source circuit It exports different control signals and provides circuit to theoretical value, which provides circuit and just exported according to the control signal of host computer Corresponding voltage is compared to judge that two are waited for the conducting voltage with multi-gear adjustable amplifying circuit as the first reference voltage Whether the conducting between measuring point is qualified.Therefore, which provides circuit and has according to the control signal of host computer output difference The characteristics of voltage, ensure that the test system of the universal testing machine has wider test scope.
As other preferred embodiments, as shown in figure 14, the test system of the universal testing machine further includes multiple use In the 4th controllable switch of switching tested point, carries out two tested points of Insulation test and/or two of progress continuity test wait for A tested point in measuring point is connect with the 5th test lead of the test system, another tested point is controllably opened by the 4th respectively Pass is connect with the 6th test lead of the test system, and the break-make of the 4th controllable switch is controlled by the control signal obtained.Specifically, As shown in figure 14, in the present embodiment in two tested points of one end of a 4th controllable switch NC7 and progress Insulation test The connection of one tested point, the other end are connect with the 6th test lead (i.e. GNDT) of the test system, wherein resistance R3 be indicate into Resistance between two tested points of row Insulation test;One end of another the 4th controllable switch NC8 and progress continuity test Tested point connection in two tested points, the other end are connect with the 6th test lead (i.e. GNDT) of the test system, wherein Resistance R1 is the resistance for indicating to carry out between two tested points of continuity test.It is above-mentioned controllably to be opened for switching the 4th of tested point Pass is controlled by host computer by 8 addressable latch U6 (74HCT259).
Obviously, the above embodiments are merely examples for clarifying the description, and does not limit the embodiments.It is right For those of ordinary skill in the art, can also make on the basis of the above description it is other it is various forms of variation or It changes.There is no necessity and possibility to exhaust all the enbodiments.And it is extended from this it is obvious variation or It changes still within the protection scope of the invention.

Claims (12)

1. a kind of connection test device, which is characterized in that including:First test lead, the second test lead, multi gear constant-current source circuit, Multi-gear adjustable amplifying circuit and first voltage comparison circuit, wherein
First test lead is connect with one end of the multi gear constant-current source circuit and the multi-gear adjustable amplifying circuit;
Second test lead ground connection, first test lead and second test lead for respectively on circuit board under test Two tested point connections, it is whether qualified to test the conducting between two tested points;
Another termination of the multi gear constant-current source circuit presets continuity test voltage, for providing size for described two tested points Different constant currents;
The other end of the multi-gear adjustable amplifying circuit connects the first voltage comparison circuit, for being believed according to the control of acquisition The amplification factor of number selection is by the voltage amplification between described two tested points, and by amplified control source to described first Voltage comparator circuit;
The voltage and the first reference voltage phase that the first voltage comparison circuit is used to export the multi-gear adjustable amplifying circuit Compare, when the voltage of multi-gear adjustable amplifying circuit output is more than first reference voltage, judges to carry out continuity test Two tested points between conducting it is unqualified.
2. connection test device as described in claim 1, which is characterized in that the multi gear constant-current source circuit includes source of stable pressure electricity Road, multi gear resistor voltage divider circuit, gating switch UC26 and constant-current source circuit, the burning voltage of the source of stable pressure circuit output is through institute State the different multiple voltage of output size after multi gear resistor voltage divider circuit, gating switch UC26 is according to the control signal behavior of acquisition One of which voltage, the voltage connect the constant-current source circuit output constant current.
3. connection test device as claimed in claim 2, which is characterized in that the multi gear constant-current source circuit further includes times magnification Adjustable first amplifying circuit of number, the first amplifying circuit setting is in the voltage stabilizing source circuit and multi gear electric resistance partial pressure electricity Between road, the input voltage for adjusting the multi gear resistor voltage divider circuit.
4. connection test device as claimed in claim 2, which is characterized in that further include addressing circuit, described address choosing The input terminal for selecting circuit obtains control signal, output end is connect with the address input end of the gating switch UC26, described address Selection circuit exports different address signals to selectively turn in the gating switch UC26 according to the control signal of acquisition A channel.
5. connection test device as claimed in claim 3, which is characterized in that further include addressing circuit, described address choosing The input terminal for selecting circuit obtains control signal, output end is connect with the address input end of the gating switch UC26, described address Selection circuit exports different address signals to selectively turn in the gating switch UC26 according to the control signal of acquisition A channel.
6. the connection test device as described in any one of claim 1-5, which is characterized in that the multi-gear adjustable amplifying circuit The gating switch controlled including operational amplifier UC28A, resistance R62, multiple feedback resistance circuits and the control signal by obtaining Voltage that one end of UC27, the resistance R62 tap between two tested points of row continuity test, the other end are put with the operation The first input end connection of big device UC28A, one end of the multiple feedback resistance circuit respectively with the operational amplifier UC28A First input end connection, multiple input end of the other end respectively with the gating switch UC27 be correspondingly connected with, the gating is opened The output end for closing UC27 is connect with the output end of the operational amplifier UC28A, the second input of the operational amplifier UC28A End ground connection.
7. a kind of test system of universal testing machine, which is characterized in that including multi gear constant-current source circuit, multi-gear adjustable amplification electricity Road, first voltage comparison circuit, operational amplification circuit and second voltage comparison circuit, the first controllable switch and the 5th test End, the 6th test lead, wherein
The 5th test lead of the test system and the 6th test lead are to be measured with two on circuit board under test respectively Point connection, to test, whether the conducting between two tested points is qualified or whether insulation is qualified;
When carrying out continuity test, the 6th test lead and the multi gear constant-current source circuit and the multi-gear adjustable amplifying circuit One end connection;When carrying out Insulation test, the 6th test termination presets Insulation test voltage;
Another termination of the multi gear constant-current source circuit presets continuity test voltage, to be measured for two for progress continuity test Point provides constant current of different sizes;
The other end of the multi-gear adjustable amplifying circuit connects the first voltage comparison circuit, for being believed according to the control of acquisition The amplification factor of number selection is by the voltage amplification between two tested points for carrying out continuity test, and by amplified control source To the first voltage comparison circuit;
The voltage and the first reference voltage phase that the first voltage comparison circuit is used to export the multi-gear adjustable amplifying circuit Compare, when the voltage of multi-gear adjustable amplifying circuit output is more than first reference voltage, judges to carry out continuity test Two tested points between conducting it is unqualified;
The operational amplification circuit includes multiple feedback circuits and operational amplifier U17A, one end point of the multiple feedback circuit It is not connect with the first input end of the operational amplifier U17A, the other end output end with the operational amplifier U17A respectively It is connected to the output end of the operational amplification circuit, the second input end grounding of the operational amplifier U17A;
Each of the multiple feedback circuit includes the first feedback resistance and controllable switch being connected in series with, described controllably to open It closes for according to the control signal conduction of acquisition or disconnecting the corresponding feedback circuit to adjust the operational amplification circuit Amplification factor;
5th test lead is connect with the first input end of the operational amplifier U17A;
The output end of the operational amplification circuit is connect with the second voltage comparison circuit, is used for the default Insulation test Voltage amplification, and by amplified control source to the second voltage comparison circuit, the times magnification of the operational amplification circuit Number is determined by the resistance between the resistance and two tested points for carrying out Insulation test of the feedback circuit be connected;
Second voltage comparison circuit, the voltage for exporting the operational amplification circuit compare with the second reference voltage, when When the voltage of the operational amplification circuit output is more than second reference voltage, two tested points for carrying out Insulation test are judged Between insulation it is unqualified;
First controllable switch is arranged between the first input end and output end of the operational amplifier U17A, is being led When logical test, all feedback circuits are disconnected according to control signal, and be closed first controllable switch so that the operation The voltage of the first input end of amplifier U17A is equal to the voltage of its second input terminal.
8. the test system of universal testing machine as claimed in claim 7, which is characterized in that further include for being closed or disconnecting this The switching circuit of test system, the switching circuit include the second controllable switch and are connect with the second controllable switch control terminal Control circuit, one end of second controllable switch connect with the first input end of the operational amplifier U17A, the other end It is connect with the 5th test lead of the test system, the control circuit is for receiving control signal and being controlled according to the control signal The break-make of second controllable switch.
9. the test system of universal testing machine as claimed in claim 8, which is characterized in that the control circuit includes power supply electricity Road, third controllable switch and the first photoelectric isolating circuit, the power circuit are connected in series with the third controllable switch and are followed by The input terminal of the control terminal of second controllable switch, first photoelectric isolating circuit receives control signal, output end and institute The control terminal for stating third controllable switch is connected to control the break-make of the third controllable switch.
10. the test system of universal testing machine as claimed in claim 7, it is characterised in that:
Further include relay circuit and the second photoelectric isolating circuit, the relay circuit is arranged in the multi gear constant-current source circuit Between the 6th test lead of the test system, second photoelectric isolating circuit one terminate the default Insulation test voltage, The other end is connect with the 6th test lead of the test system, and the relay circuit and second photoelectric isolating circuit are used for root Switch the on off operating mode of insulated test device and connection test device according to control signal.
11. the test system of universal testing machine as claimed in claim 7, which is characterized in that further include it is multiple for switch wait for 4th controllable switch of measuring point carries out in two tested points of Insulation test and/or two tested points of progress continuity test One tested point is connect with the 5th test lead of the test system, another tested point respectively by the 4th controllable switch with 6th test lead of the test system connects, and the break-make of the 4th controllable switch is controlled by the control signal obtained.
12. the test system of the universal testing machine as described in any one of claim 7-11, which is characterized in that further include theory Value provides circuit and provides second benchmark in Insulation test for providing first reference voltage in continuity test Voltage, it includes D/A converting circuit and reference voltage circuit that the theoretical value, which provides circuit, and the D/A converting circuit is used for root Corresponding voltage is exported according to the control instruction of acquisition, the reference voltage circuit provides benchmark electricity for the D/A converting circuit Pressure.
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Inventor after: Wang Peng

Inventor before: Zhao Lingyun