CN203164237U - Electronic load module of power supply aging test and power supply aging test system - Google Patents
Electronic load module of power supply aging test and power supply aging test system Download PDFInfo
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- CN203164237U CN203164237U CN 201320098157 CN201320098157U CN203164237U CN 203164237 U CN203164237 U CN 203164237U CN 201320098157 CN201320098157 CN 201320098157 CN 201320098157 U CN201320098157 U CN 201320098157U CN 203164237 U CN203164237 U CN 203164237U
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Abstract
The utility model provides an electronic load module of a power supply aging test and a power supply aging test system. The electronic load module of power supply aging test provides an intelligent electronic load module controlled by a MCU. The system uses an upper computer to uniformly manage a plurality of electronic load modules of the power supply aging test, and uniformly display and store. The system is an intelligent power supply aging system.
Description
Technical field
The utility model relates to the electronic load field in the power source aging testing apparatus, and is particularly a kind of for aging testing systems such as the programmable electronic load blocks of switch power supply aging test and the aging car of being made up of many such electronic load modules, burn-in chambers.
Background technology
For reliability, stability and the security of checking and improving power supply product, power supply product is carried out burn-in test become a important step in this type of product processes flow process.So-called " wearing out " refers to that the mal-condition that simulates a kind of high temperature carries out testing at full capacity for a long time (being burn in process or pot machine again to power supply product, English is called: Burn-in Test), and to simulate the performance that mal-condition that actual use may occur is checked product.
Traditional fictitious load that aging testing apparatus uses is many, and also with regard to first generation aging equipment, its advantage is that cost is low based on high-power resistance, and is simple.But because kind and the specification of power supply product are various, same power supply factory often has a lot of types, and the output specification of every kind of type is not quite similar, the impedance of required fictitious load and power are also different, therefore the shortcoming of traditional resistor-type aging equipment is also just more and more outstanding, mainly shows as follows:
1. resistance is fixed, and optional specification is few, much needs to factory's custom-made;
2. power specification is various, and resistance can't accurately match aging required accurate electric current;
3. resistance error is big, and easily produces deviation after the temperature rise, can't guarantee that product 100% load is aging;
4. adjusting the load size needs to calculate earlier, selects pull-up resistor can only obtain the approximate current value;
5. ageing process can't be monitored automatically, needs manually inspection one by one, the low and easy under-enumeration of efficient;
6. can't record the ageing process parameter, be not easy to the quality tracing management;
7. can't generate aging form, be not easy to analysis and the assessment of product quality;
Be directed to the aging above-mentioned outstanding shortcoming of load of resistor-type, the aging equipment that the second generation occurred, it is the load of easy adjustable type simulation electronic, though cost is high more a lot of than the product of the first generation, but can be according to the specification regulating load electric current of product, when overcoming the product thread-changing, aging equipment need be changed the misery of corresponding resistor, has also improved aging precision and efficient simultaneously to a certain extent.Second generation load has overcome first three shortcoming of first generation load, but 4 shortcomings in back are still outstanding, can't satisfy the demand of modern production technology.Though the market has the test type electronic load instrument of a lot of standards can satisfy aging requirement fully on performance and function at present, but this quasi-instrument is expensive, bulky usually, and its design is primarily aimed at test such as research and development, engineering, production usefulness, is difficult to realize that the system group network of up to a hundred passages is used in enormous quantities aging.
The utility model content
The purpose of this utility model is in order to overcome the deficiency of present electronic load, design a kind of intelligence the power source aging test the electronic load module and with the power source aging test macro of one group of such electronic load module centralized management.
The technical solution of the utility model is: the electronic load module of power source aging test, described electronic load module comprises driving circuit and as one group of field effect transistor of fictitious load, the source of described field effect transistor, drain electrode is connected respectively between the output terminal and ground of the power supply that is worn out, described driving circuit produces the driving signal and links to each other with the grid of described field effect transistor, grid current by controlling described field effect transistor or voltage are realized the burn-in test to the power supply that is worn out, also comprise the control and management system that the electronic load unit is controlled, described control and management system comprises micro controller unit, feedback circuit and the communication interface circuit of communicating by letter with host computer;
Described feedback circuit comprises current detection circuit and the voltage detecting circuit of the power supply that test is worn out, and the testing result that described current detection circuit and voltage detecting circuit detect is input to described micro controller unit;
Described micro controller unit receives the detected electric current of described feedback circuit and magnitude of voltage, produce control signal and control described driving circuit, drive described field effect transistor by driving circuit, making described fictitious load is the fictitious load of constant current or constant voltage mode.
Further, in the electronic load module of above-mentioned power source aging test: also comprise pattern switching and control circuit, described pattern is switched and control circuit is controlled by constant current or the constant voltage control signal of micro controller unit output;
Described pattern commutation circuit comprises constant voltage mode signal output apparatus and constant current mode signal output apparatus;
Described control circuit comprises constant-current control circuit and constant-voltage control circuit, described constant-voltage control circuit comprises comparer U503A, the worn out output terminal of power supply of "+" termination of described comparer U503A, the reference voltage that "-" termination is arranged by described micro controller unit, power end links to each other with the constant voltage mode signal, when the constant voltage mode signal was effective, comparer U503A gets electric work generation made described driving circuit connect described driving circuit at the driving signal of constant voltage mode work;
Described constant-current control circuit comprises operational amplifier U504A, the reference voltage that "+" termination of described operational amplifier U504A is arranged by described micro controller unit, "-" end of described comparer U504A links to each other with output terminal and constitutes voltage follower, power end links to each other with described constant current mode signal, when the constant current mode signal was effective, generation made described driving circuit connect described driving circuit at the driving signal of constant current mode work.
Further, in the electronic load module of above-mentioned power source aging test: in described constant-voltage control circuit, between the output terminal of "+" end of described comparer U503A and the power supply that worn out, also be provided with by resistance R 101, R102 and R103 and form bleeder circuit, described resistance R 102 and R103 are connected in parallel between "+" end and ground of comparer U503A, and resistance R 101 is serially connected between the output terminal of "+" end of U503A and the power supply that worn out.
Further, in the electronic load module of above-mentioned power source aging test: described driving circuit comprises operational amplifier U101, exchanges negative feedback capacitor C 101, and MOSFET drives resistance R 109 and MOSFET grid bleeder resistance R110; The constant current signal output terminal of the described constant-current control circuit of homophase termination of described operational amplifier U101 or connect the constant voltage signal output part of constant-voltage control circuit by unidirectional isolating diode D101, the anode of unidirectional isolating diode D101 connects the constant voltage signal output part of constant-voltage control circuit; The end of oppisite phase of described operational amplifier U101 is by exchanging the output terminal that negative feedback capacitor C 101 meets operational amplifier U101, the output terminal of operational amplifier U101 drives resistance R 109 by MOSFET and connects grid as the MOSFET of fictitious load, and MOSFET grid bleeder resistance R110 is connected between the output terminal and ground of operational amplifier U101.
Further, in the electronic load module of above-mentioned power source aging test: before the in-phase end of the constant current of described constant-current control circuit or constant-voltage control circuit or constant voltage signal output part and described operational amplifier U101 joins, also be respectively arranged with constant current control signal bleeder circuit and constant voltage control signal bleeder circuit;
Described constant current control signal bleeder circuit comprises divider resistance R107, R108 and R105; Described divider resistance R107 is serially connected between the in-phase end of the output terminal of follower U504A and operational amplifier U101, is connected after divider resistance R108 and the R105 parallel connection between the in-phase end and ground of operational amplifier U101;
Described constant voltage control signal bleeder circuit comprises divider resistance R104, R108 and R105; Described divider resistance R104 is serially connected between the in-phase end of the negative electrode of unidirectional isolating diode D101 and operational amplifier U101, is connected after divider resistance R108 and the R105 parallel connection between the in-phase end and ground of operational amplifier U101.
Further, in the electronic load module of above-mentioned power source aging test: described constant voltage mode signal output apparatus comprises triode Q503 and triode Q504, the collector of described triode Q503 connects the base stage of described triode Q504 by current-limiting resistance R518, the ground level of described triode Q503 connects described micro controller unit by current-limiting resistance R517, the grounded emitter of described triode Q503, the emitter welding system power supply of described triode Q504, described triode Q504 collector drives the constant voltage mode pilot lamp by current-limiting resistance R519, and described constant voltage mode signal is drawn by described triode Q504 collector;
The constant current mode signal output apparatus comprises: triode Q505, triode Q506 and triode Q507; The base stage of described triode Q505 connects micro controller unit by current-limiting resistance R520, the grounded emitter of triode Q505, and the collector of described triode Q505 is by current-limiting resistance R521 welding system power supply; The base stage of described triode Q506 links to each other with the collector of described triode Q505, the grounded emitter of triode Q506, the collector of triode Q506 connects the base stage of described triode Q507 by current-limiting resistance R522, the emitter welding system power supply of described triode Q507, triode Q507 collector drives the constant current mode pilot lamp by current-limiting resistance R523, and the constant current mode signal is drawn by triode Q507 collector.
Further, in the electronic load module of above-mentioned power source aging test: also comprise the intelligent heat dissipation device, described intelligent heat dissipation device comprises temperature-detecting device, fan control unit and fan, the working temperature of the real-time detected electrons load blocks of described temperature-detecting device, the detection signal of described temperature-detecting device divides two-way output, one the road delivers to described fan control unit, described fan control unit is higher than 45 ℃ in temperature, start fan, when temperature is lower than 45 ℃, stop fan; Described micro controller unit is delivered on another road, and when temperature was higher than 100 ℃, load blocks quit work, and when the load blocks temperature is lower than 100 ℃, resumes work automatically.
The utility model has also designed a kind of power source aging test macro of being made up of the electronic load module of one group of power source aging test, this system can be carried out burn-in test to some by aging power supply simultaneously, by the unified control of host computer and supervision, show and the record test process, realize power source aging test automation and intellectuality, the technical scheme of this power source aging test macro is: this power source aging test macro comprises the electronic load module of one group of power source aging test, each passage of the electronic load module of each power source aging test carries out burn-in test to tested power supply respectively, also comprise host computer, described host computer interconnects by the electronic load module of communicator and the test of each power source aging respectively, receive test mode information and indication information that the electronic load module of each power source aging test is uploaded, and test mode information and indication information are shown and store.
Further, in the above-mentioned power source aging test macro: the communicator between the electronic load module of described host computer and the test of each power source aging is the asynchronous serial communication device, comprises the RS-485 communication interface circuit of the electronic load module that is separately positioned on host computer and the test of each power source aging.
Further, in the above-mentioned power source aging test macro: the system power supply of the electronic load module of described each power source aging test is unified to be arranged.
Excellent, the shortcoming of the aging load of the electronic load of the utility model combined standard type and preceding two generations have been carried out optimal design at the demand of power source aging test specially, employing high-performance MCU(micro controller unit) as the core of control module, modular design.Belong to the aging load of the third generation.Its advantage is as follows:
1. it is optional that same module is up to three kinds of patterns of CC/CV/LED, compatible multiple power supply product;
2. same module is in specification limit, and the voltage/current value can be set arbitrarily, accurately the matching product specification;
3. load model and flexible setting for parameters are quick, can the overall situation set, i.e. also separated regions or setting at different levels;
4. aging of product parameter is monitored in real time, and bad product space can be accurately located in automatic screening abnormal products and alarm;
5. load arranges wide ranges, draws to carry the precision height, can adapt to the power supply product of plurality of specifications;
6. can record and the electric property of reviewing all test products, be convenient to attributional analysis;
7. the computer Centralized Monitoring is managed, and can effectively supervise the quality of aging processing procedure;
8. can generate aging statistical tables and reports automatically, make things convenient for the engineering staff to carry out attributional analysis and assessment;
9. system features in convenient, a people can manage a plurality of aging zones, saves labour turnover;
10. modular structural design makes things convenient for system maintenance;
Below in conjunction with specific embodiment the utility model is done comparatively detailed description.
Description of drawings
Fig. 1 is the electronic load module principle block diagram of the utility model embodiment 1 power source aging test.
Fig. 2 is the utility model embodiment 1 power source aging test principle block diagram.
Fig. 3 is the constant current/constant voltage mode commutation circuit schematic diagram that uses among the utility model embodiment 1.
Fig. 4 is constant current/constant voltage mode control circuit and the driving circuit schematic diagram that uses among the utility model embodiment 1.
Embodiment
In the present embodiment, the electronic load module of power source aging test as shown in Figure 1, the electronic load module of power source aging test comprises driving circuit and as one group of field effect transistor of fictitious load, the source of field effect transistor, drain electrode is connected respectively between the output terminal and ground of the power supply that is worn out, driving circuit produces the driving signal and links to each other with the grid of described field effect transistor, grid current by controlling described field effect transistor or voltage are realized the burn-in test to the power supply that is worn out, also comprise the control and management system that the electronic load unit is controlled, the control and management system comprises micro controller unit, feedback circuit and the communication interface circuit of communicating by letter with host computer; Feedback circuit comprises current detection circuit and the voltage detecting circuit of the power supply that test is worn out, and the testing result that current detection circuit and voltage detecting circuit detect is input to described micro controller unit; Micro controller unit receives the detected electric current of described feedback circuit and magnitude of voltage, produce control signal and control described driving circuit, drive described field effect transistor by driving circuit, making described fictitious load is the fictitious load of constant current or constant voltage mode.Comprise also in the control and management system by the pattern of microprogrammed control unit control and switching and control circuit that as shown in Figure 3, Figure 4, pattern is switched and control circuit is controlled by constant current or the constant voltage control signal of micro controller unit output;
The pattern commutation circuit comprises constant voltage mode signal CVPOW output circuit and constant current mode signal CCPOW output circuit; Control circuit comprises constant-current control circuit and constant-voltage control circuit, described constant-voltage control circuit comprises comparer U503A, the worn out output terminal of power supply of "+" termination of described comparer U503A, the reference voltage that "-" termination is arranged by described micro controller unit, power end links to each other with constant voltage mode signal CVPOW, when constant voltage mode signal CVPOW was effective, comparer U503A gets electric work generation made described driving circuit connect described driving circuit at the driving signal of constant voltage mode work;
Equally, constant-current control circuit comprises voltage follower U504A, "+" end of voltage follower U504A links to each other with "-" end of described comparer U503A, namely be connected to the reference voltage that is arranged by described micro controller unit, because U504A "-" end links to each other with the output terminal of U504A, constitute voltage follower, its output voltage equals to connect the reference voltage by described micro controller unit setting of U504A in-phase input end, power end links to each other with constant current mode signal CCPOW, when constant current mode signal CCPOW was effective, generation made described driving circuit connect driving circuit at the driving signal of constant current mode work.Constant voltage mode signal CVPOW output circuit comprises triode Q503 and triode Q504, the collector of described triode Q503 connects the base stage of described triode Q504 by current-limiting resistance R518, the ground level of described triode Q503 connects described micro controller unit by current-limiting resistance R517, the grounded emitter of described triode Q503, the emitter welding system power supply of described triode Q504, described triode Q504 collector drives the constant voltage mode pilot lamp by current-limiting resistance R519, and constant voltage mode signal CVPOW is drawn by described triode Q504 collector.
Constant current mode signal (CCPOW) output circuit comprises: triode Q505, triode Q506 and triode Q507; The base stage of described triode Q505 connects micro controller unit by current-limiting resistance R520, the grounded emitter of triode Q505, and the collector of described triode Q505 is by current-limiting resistance R521 welding system power supply; The collector of the base stage of described triode Q506 and described triode Q505 connects, the grounded emitter of triode Q506, the collector of triode Q506 connects the base stage of described triode Q507 by current-limiting resistance R522, the emitter welding system power supply of described triode Q507, triode Q507 collector drives the constant current mode pilot lamp by current-limiting resistance R523, and constant current mode signal (CCPOW) is drawn by triode Q507 collector.In the electronic load module that the power source aging of present embodiment is tested, also comprise the intelligent heat dissipation device, the intelligent heat dissipation device comprises temperature-detecting device, fan control unit and fan, the working temperature of the real-time detected electrons load blocks of described temperature-detecting device, the detection signal of described temperature-detecting device divides two-way output, one the road delivers to described fan control unit, described fan control unit is higher than 45 ℃ in temperature, starts fan, stops fan when temperature is lower than 45 ℃; Described micro controller unit is delivered on another road, and when temperature was higher than 100 ℃, load blocks quit work, and when temperature was lower than 100 ℃, load blocks was resumed work automatically.
Concrete, in the present embodiment, the basic functional principle of the electronic load module of power source aging test is as follows:
Module arranges a unique address for each module by " address code selector switch " on the module when composition system (as aging car, burn-in chamber etc.), just host computer can accurately navigate to each passage of each module like this.When system powered on operation, host computer can scan and show the connection status of each module.Adopt photoelectricity to isolate between micro controller unit and the RS-485 telecommunication circuit.Because the standard interface that serial communication is used of host computer (computer) is generally rs-232 standard, so need to use RS232 and the RS485 photoelectricity isolating converter of conversion mutually between module and the host computer.
After module powers on, wait for that host computer issues the concrete operations instruction, the load end of module is not in closed condition before receiving instruction, namely can not draw to carry, and is equivalent to open-circuit condition.Host computer will draw parameters such as the pattern of carrying, voltage, electric current by passing to the micro controller unit of module under the communication interface, micro controller unit selects to draw accordingly the pattern of carrying according to instruction control " pattern switching " circuit, simultaneously providing corresponding D/A(D/A according to instruction) signal level is to " FEEDBACK CONTROL " circuit, and the parameter of " driving circuit " basis " pattern switchings " circuit and " FEEDBACK CONTROL " circuit is gone to drive field effect transistor (MOSFET) and is drawn year." voltage detecting " and " current detecting " circuit is real-time will deliver to from the voltage and current signal that load end samples " A/D(mould/number) converter " carry out data acquisition, wait for that host computer reads.
The working temperature of the real-time detection module spreader surface of " temperature detection " circuit, detection signal are divided two-way output, and one the road delivers to " fan control unit ", when temperature is higher than 45 ℃, start fan and carry out forced refrigeration.Fan stops when temperature is lower than 45 ℃, to reduce the product power consumption.Micro controller unit (MCU) is delivered on another road, and when temperature was higher than 100 ℃, module stops to draw carried, and closes output, and host computer also can provide corresponding demonstration.When temperature fell back to below 100 ℃, module was resumed work automatically.Fan control and overheat protector have all designed return difference control, prevent that control circuit from moving back and forth in temperature control critical point, improved system stability.
The individual module of this framed structure can be designed to single channel and any hyperchannel number according to customer demand, and modal have single channel, 2 passages, 4 passages, 8 passages.The power maximum of individual module can be accomplished 1KW.
Adopt RS-485 serial isolated communication between module and the host computer, reduced the interference between module and the module.6 the 5559(that each module is provided with two parallel connections docks use with 6 5557 terminals) terminal is as communication interface, is convenient to being connected between module and the module, simplifies layout and the cabling of system bus.
Module adopts 12V direct current supply, power interface adopts two 4 5559 terminals (docking use with 4 5557 terminals) and connects, when forming system, and can be by the industrial power centrally connected power supply, the simplification system installs and wiring, make the configuration of system and maintenance become simply, flexible.The load input interface uses 20 5559 terminals, docks with 20 5557 terminals on the tool plate (interface conversion plate).
The pattern of module is switched and control circuit, and the pattern of module is switched by CC/CV pattern commutation circuit shown in Figure 3 and CC/CV mode control circuit shown in Figure 4 and finished jointly.When the CC/CV control signal of MCU output was high level, module was constant voltage (CV) pattern, was used for the power supply of aging constant current output, as charger, LED driving power etc.; When the CC/CV control signal of MCU output was low level, module was constant current (CC) pattern, was used for the power supply of aging constant voltage output, as power supply adaptor, industrial power etc.
Concrete control principle: during constant voltage mode, the CC/CV control signal of MCU output is high level, Q503 shown in Figure 3, Q504 conducting, and " CVPOW+ " has positive supply output, gives amplifier U503A power supply shown in Figure 4; At this moment, also because of the conducting of MCU output high level, therefore, Q506, Q507 end Q505 shown in Figure 3, and " CCPOW+ " no-output is so amplifier U504A shown in Figure 4 quits work because of no positive supply power supply.Because the U503A operate as normal, its inverting input "-" connects the control voltage that is arranged by described micro controller unit; The output level of the aging power supply of quilt is through resistance R 101, (being the output level component) is connected to the in-phase input end "+" of U503A after R102 and the R103 dividing potential drop, if be higher than the control voltage that micro controller unit arranges by the output component of aging power supply, U503A the 1st pin output high level, after amplifying, driving circuit make the field effect transistor (MOSFET) as fictitious load deepen conducting, internal resistance diminishes, making by the output current of aging power supply increases, because the power supply that uses constant voltage mode to wear out, its output is controlled to be constant current mode, when load current reaches the constant current point of its setting, its output current no longer increases, and output voltage begins to descend.When being descended by the output voltage of aging power supply, the component of voltage of U503A in-phase end "+" descends thereupon, when the level of U503A in-phase end is lower than the level of its end of oppisite phase, U503A is output as low level, driving circuit output weakens, the described field effect transistor conducting degree of depth as fictitious load is shoaled, and internal resistance increases, and the output current of the power supply that worn out is corresponding to be reduced.And so forth, through after the of short duration adjustment, circuit can enter a stable equilibrium state, the control voltage that the micro controller unit that makes the output voltage component of the aging power supply of quilt that connects U503A in-phase end "+" equal to be connected to U503A end of oppisite phase "-" arranges.At this moment, the worn out output voltage of power supply is constant on set electrical voltage point.Thereby realization module " CV " pattern is drawn and is carried a function;
On the contrary, during constant current mode, the CC/CV control signal of micro controller unit output is low level, and Q503, Q504 end, the output of " CVPOW+ " no-voltage, and U503A quits work because of the non-transformer power supply; Simultaneously, because the CC/CV control signal is low level, Q505 also ends, and the conducting owing to pull-up resistor R521 welding system power supply of Q506 base stage, and then make also conducting of PNP triode Q507, " CCPOW+ " exports positive supply, be that U504A can operate as normal, its in-phase end connects the control voltage that micro controller unit arranges, its inverting input "-" links to each other with output terminal and constitutes voltage follower, that is to say that the voltage of its first pin output equals the input voltage of in-phase end "+", but electric current obtains amplifying, R106 between output terminal and ground, improves the antijamming capability of control circuit as the pull-up resistor cross-over connection of U504A.As shown in Figure 4, the control voltage " DA1 " that micro controller unit arranges is delivered to driving circuit again after R107 and R108 and R105 dividing potential drop after voltage follower U504A carries out the electric current amplification.Described driving circuit comprises, operational amplifier U101 exchanges negative feedback capacitor C 101, and MOSFET drives resistance R 109 and MOSFET grid bleeder resistance R110.When the control voltage " DA1 " that arranges when micro controller unit be 0V, voltage follower U504A output also be 0V, and then operational amplifier U101 output also is 0V, as the field effect transistor MOSFET shutoff of fictitious load, did not namely draw year.The control voltage " DA1 " that arranges when micro controller unit is during greater than 0V, voltage follower U504A exports identical voltage, after R107 and R108 and R105 dividing potential drop, deliver to the in-phase input end of operational amplifier U101, because the pressure drop (current sampling signal IS101 just) at current sampling resistor R115 and R116 two ends is 0V before the field effect transistor conducting, be connected to the inverting input of operational amplifier U101 through electric R111, therefore when controlling voltage signal " DA1 " greater than 0V, the in-phase end level of operational amplifier U101 is higher than end of oppisite phase, be output as high level, through driving the field effect transistor Q101 conducting that resistance R 109 drives as fictitious load, carry being drawn by aging power supply.After the Q101 conducting, load current produces pressure drop at sample resistance R115, R116 two ends, and namely current sampling signal " IS101 " is delivered to the U101 end of oppisite phase by feedback resistance R111.When current sampling signal " IS101 " during greater than the component of " DA1 ", the operational amplifier output voltage reduces, the Q101 conducting degree of depth is shoaled, internal resistance increases, and reduces load current, when one timing of DA1 level, operational amplifier enters steady state (SS), make load current constant on the current point that DA1 sets, the realization constant current is drawn and is carried a function, and just module is in " CC " pattern.
Claims (10)
1. the electronic load module of power source aging test, described electronic load module comprises driving circuit and as one group of field effect transistor of fictitious load, the source of described field effect transistor, drain electrode is connected respectively between the output terminal and ground of the power supply that is worn out, described driving circuit produces the driving signal and links to each other with the grid of described field effect transistor, grid current by controlling described field effect transistor or voltage are realized the burn-in test to the power supply that is worn out, it is characterized in that: also comprise the control and management system that the electronic load unit is controlled, described control and management system comprises micro controller unit, feedback circuit and the communication interface circuit of communicating by letter with host computer;
Described feedback circuit comprises current detection circuit and the voltage detecting circuit of the power supply that test is worn out, and the testing result that described current detection circuit and voltage detecting circuit detect is input to described micro controller unit;
Described micro controller unit receives the detected electric current of described feedback circuit and magnitude of voltage, produce control signal and control described driving circuit, drive described field effect transistor by driving circuit, making described fictitious load is the fictitious load of constant current or constant voltage mode.
2. the electronic load module of power source aging test according to claim 1 is characterized in that: also comprise pattern switching and control circuit, described pattern is switched and control circuit is exported by micro controller unit constant current or the control of constant voltage control signal;
Described pattern commutation circuit comprises constant voltage mode signal output apparatus and constant current mode signal output apparatus;
Described control circuit comprises constant-current control circuit and constant-voltage control circuit, described constant-voltage control circuit comprises comparer U503A, the worn out output terminal of power supply of "+" termination of described comparer U503A, the reference voltage that "-" termination is arranged by described micro controller unit, power end links to each other with the constant voltage mode signal, when the constant voltage mode signal was effective, comparer U503A gets electric work generation made described driving circuit connect described driving circuit at the driving signal of constant voltage mode work;
Described constant-current control circuit comprises operational amplifier U504A, the reference voltage that "+" termination of described operational amplifier U504A is arranged by described micro controller unit, "-" end of described operational amplifier U504A links to each other with output terminal and constitutes voltage follower, power end links to each other with described constant current mode signal, when the constant current mode signal was effective, generation made described driving circuit connect described driving circuit at the driving signal of constant current mode work.
3. the electronic load module of power source aging according to claim 2 test, it is characterized in that: in described constant-voltage control circuit, between the output terminal of "+" end of described comparer U503A and the power supply that worn out, also be provided with by resistance R 101, R102 and R103 and form bleeder circuit, described resistance R 102 and R103 are connected in parallel between "+" end and ground of comparer U503A, and resistance R 101 is serially connected between the output terminal of "+" end of U503A and the power supply that worn out.
4. the electronic load module of power source aging according to claim 2 test, it is characterized in that: described driving circuit comprises operational amplifier U101, exchanges negative feedback capacitor C 101, MOSFET drives resistance R 109 and MOSFET grid bleeder resistance R110; The constant current signal output terminal of the described constant-current control circuit of homophase termination of described operational amplifier U101 or connect the constant voltage signal output part of constant-voltage control circuit by unidirectional isolating diode D101, the anode of unidirectional isolating diode D101 connects the constant voltage signal output part of constant-voltage control circuit; The end of oppisite phase of described operational amplifier U101 is by exchanging the output terminal that negative feedback capacitor C 101 meets operational amplifier U101, the output terminal of operational amplifier U101 drives resistance R 109 by MOSFET and connects grid as the MOSFET of fictitious load, and MOSFET grid bleeder resistance R110 is connected between the output terminal and ground of operational amplifier U101.
5. the electronic load module of power source aging according to claim 4 test is characterized in that: also be respectively arranged with constant current control signal bleeder circuit and constant voltage control signal bleeder circuit before the in-phase end of the constant current of described constant-current control circuit or constant-voltage control circuit or constant voltage signal output part and described operational amplifier U101 joins;
Described constant current control signal bleeder circuit comprises divider resistance R107, R108 and R105; Described divider resistance R107 is serially connected between the in-phase end of the output terminal of follower U504A and operational amplifier U101, is connected after divider resistance R108 and the R105 parallel connection between the in-phase end and ground of operational amplifier U101;
Described constant voltage control signal bleeder circuit comprises divider resistance R104, R108 and R105; Described divider resistance R104 is serially connected between the in-phase end of the negative electrode of unidirectional isolating diode D101 and operational amplifier U101, is connected after divider resistance R108 and the R105 parallel connection between the in-phase end and ground of operational amplifier U101.
6. according to the electronic load module of arbitrary described power source aging test in the claim 2 to 4, it is characterized in that: described constant voltage mode signal output apparatus comprises triode Q503 and triode Q504, the collector of described triode Q503 connects the base stage of described triode Q504 by current-limiting resistance R518, the ground level of described triode Q503 connects described micro controller unit by resistance R 517, the grounded emitter of described triode Q503, the emitter welding system power supply of described triode Q504, described triode Q504 collector drives the constant voltage mode pilot lamp by current-limiting resistance R519, and described constant voltage mode signal is drawn by described triode Q504 collector;
The constant current mode signal output apparatus comprises: triode Q505, triode Q506 and triode Q507; The base stage of described triode Q505 connects micro controller unit by current-limiting resistance R520, the grounded emitter of triode Q505, and the collector of described triode Q505 is by current-limiting resistance R521 welding system power supply; The base stage of described triode Q506 links to each other with the collector of described triode Q505, the grounded emitter of triode Q506, the collector of triode Q506 connects the base stage of described triode Q507 by current-limiting resistance R522, the emitter welding system power supply of described triode Q507, triode Q507 collector drives the constant current mode pilot lamp by current-limiting resistance R523, and the constant current mode signal is drawn by triode Q507 collector.
7. the electronic load module of power source aging according to claim 6 test, it is characterized in that: also comprise the intelligent heat dissipation device, described intelligent heat dissipation device comprises temperature-detecting device, fan control unit and fan, the working temperature of the real-time detected electrons load blocks of described temperature-detecting device, the detection signal of described temperature-detecting device divides two-way output, one the road delivers to described fan control unit, described fan control unit is higher than 45 ℃ in temperature, start fan, when temperature is lower than 45 ℃, stop fan; Described micro controller unit is delivered on another road, and when temperature was higher than 100 ℃, load blocks quit work, and when the load blocks temperature is lower than 100 ℃, resumes work automatically.
8. the power source aging test macro formed of the electronic load module of a power source aging according to claim 1 test, this power source aging test macro comprises the electronic load module of one group of power source aging test, the electronic load module of each power source aging test is carried out burn-in test to tested power supply respectively, it is characterized in that: also comprise host computer, described host computer interconnects by the electronic load module of communicator and the test of each power source aging respectively, receive test mode information and indication information that the electronic load module of each power source aging test is uploaded, and test mode information and indication information are shown and store.
9. power source aging test macro according to claim 8, it is characterized in that: the communicator between the electronic load module of described host computer and the test of each power source aging is the asynchronous serial communication device, comprises the RS-485 communication interface circuit of the electronic load module that is separately positioned on host computer and the test of each power source aging.
10. power source aging test macro according to claim 8 is characterized in that: the unified setting of the system power supply of the electronic load module of described each power source aging test.
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| CN 201320098157 CN203164237U (en) | 2013-03-05 | 2013-03-05 | Electronic load module of power supply aging test and power supply aging test system |
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| CN 201320098157 CN203164237U (en) | 2013-03-05 | 2013-03-05 | Electronic load module of power supply aging test and power supply aging test system |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103472345A (en) * | 2013-10-11 | 2013-12-25 | 中国电子科技集团公司第三十八研究所 | Aging detection circuit of grounding wire of electric equipment |
| CN105425170A (en) * | 2015-12-09 | 2016-03-23 | 浙江榆阳电子有限公司 | Intelligent aged load |
| CN104062604B (en) * | 2014-07-10 | 2017-01-25 | 重庆灿源电子有限公司 | Automatic testing system (ATS) |
| CN107884606A (en) * | 2017-12-15 | 2018-04-06 | 安阳普莱电子照明有限公司 | A kind of electronic load device and the method using electronic load device Test driver |
| CN109245529A (en) * | 2018-10-24 | 2019-01-18 | 广州金升阳科技有限公司 | A kind of generating positive and negative voltage output power supply circuit |
| CN109975586A (en) * | 2019-04-12 | 2019-07-05 | 西安太乙电子有限公司 | A kind of constant current electronic load circuit and its working method |
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2013
- 2013-03-05 CN CN 201320098157 patent/CN203164237U/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103472345A (en) * | 2013-10-11 | 2013-12-25 | 中国电子科技集团公司第三十八研究所 | Aging detection circuit of grounding wire of electric equipment |
| CN103472345B (en) * | 2013-10-11 | 2015-11-18 | 中国电子科技集团公司第三十八研究所 | A kind of electrical equipment grounding line burn-in test circuit |
| CN104062604B (en) * | 2014-07-10 | 2017-01-25 | 重庆灿源电子有限公司 | Automatic testing system (ATS) |
| CN105425170A (en) * | 2015-12-09 | 2016-03-23 | 浙江榆阳电子有限公司 | Intelligent aged load |
| CN107884606A (en) * | 2017-12-15 | 2018-04-06 | 安阳普莱电子照明有限公司 | A kind of electronic load device and the method using electronic load device Test driver |
| CN109245529A (en) * | 2018-10-24 | 2019-01-18 | 广州金升阳科技有限公司 | A kind of generating positive and negative voltage output power supply circuit |
| CN109975586A (en) * | 2019-04-12 | 2019-07-05 | 西安太乙电子有限公司 | A kind of constant current electronic load circuit and its working method |
| CN109975586B (en) * | 2019-04-12 | 2021-08-24 | 西安太乙电子有限公司 | Constant-current electronic load circuit and working method thereof |
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