CN105425170A - Intelligent aged load - Google Patents
Intelligent aged load Download PDFInfo
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- CN105425170A CN105425170A CN201510903419.2A CN201510903419A CN105425170A CN 105425170 A CN105425170 A CN 105425170A CN 201510903419 A CN201510903419 A CN 201510903419A CN 105425170 A CN105425170 A CN 105425170A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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Abstract
The invention discloses an intelligent aged load. The intelligent aged load comprises a main power MOSFET, an MCU, a CC control module, a CV control module, a mode change over switch module, a current sampling module, a voltage sampling module, a voltage selection module, a serial-to-paralleled signal module, a display module and a key module. The intelligent aged load acquires current and voltage signals through the current sampling module and the voltage sampling module, and compares the current and voltage signals with preset indexes, and then adjusts a G-pole signal of the main power MOSFET by dynamically adjusting the duty ratio of a 14-pin PWM so as to realize accuracy and constancy of the load during the overall aging process. The intelligent aged load utilizes coordination of a digital circuit and an analog circuit, and can realize whole-process control through a MCU singlechip to achieve the requirement for dynamically changing the aging mode, and can autonomously set corresponding aging indexes through keys and realize individual index setting and alarm function. The intelligent aged load has the advantages of being low in cost, being flexible in configuration, being low in artificial cost, and being able to bring super high production efficiency for different scales of enterprises.
Description
Technical field
The present invention relates to aging of product utility appliance, specifically a kind of intelligent aged load.
Background technology
Production enterprise inherently relates to the problem of aging producing product in process of production, and existing enterprise generally adopts the high-power resistance matched with product aging to realize, or adopts high-grade electronic load aging to realize.Employing resistance mode is aging, and maximum shortcoming is that resistance value can change along with temperature variation, so in whole aging of product process, its load always in dynamic change, and adopts resistance aging, unavoidably in order to coordinate product, several resistance adopt series connection or parallel way to reach the object preset and be in debt, and in ageing process, product index goes wrong, supvr can not be fed back to, certainly will need to arrange special personnel, the going of not timing is patrolled and examined, and causes the waste of personnel.Although adopt electronic load mode to realize agingly can realizing omnidistance high precision load function, obviously its cost is not that general enterprises can bear, and bulky.
Summary of the invention
The present invention is to solve difficulty is selected in the load that the production enterprise that prior art exists is encountered in aging of product process, cost is high, the problem problem that artificial demand is large, aims to provide a kind of intelligent aged load.
For solving the problem, the present invention is by the following technical solutions: intelligent aged load, comprise main power MOSFET, MCU, CC control module, CV control module, mode conversion switch module, current sample module, voltage sample module, voltage selection module, string turn and signaling module, display module and key-press module, the leakage of described main power MOSFET, source electrode are connected respectively to and are aging between the output terminal of power supply and ground, it is characterized in that:
The source current signal of the described main power MOSFET of current sample module acquires, and output current sampled signal is to MCU;
The drain voltage signal of the described main power MOSFET of voltage sample module acquires, and output voltage sampled signal is to voltage selection module;
Described voltage selection module receives the control signal of MCU, selects corresponding voltage sampling signal, and outputs to CV control module and MCU;
Described MCU detects current sampling signal and voltage sampling signal, produces CC control module, CV control module and mode conversion switch module described in pwm control signal control;
Described CC control module receives the pwm control signal that MCU exports, and outputs to mode conversion switch module after amplifier; When mode conversion switch module is switched to constant current mode, drive main power MOSFET;
Described CV control module receives the pwm control signal that MCU exports, and outputs to mode conversion switch module after amplifier; When mode conversion switch module is switched to constant voltage mode, drive main power MOSFET;
Described mode conversion switch is according to the control signal of MCU, select the output signal of conducting CC control module and CV control module, regulate the signal of described main power MOSFET to realize being aging the burn-in test of power supply by the dutycycle of dynamic conditioning PWM;
Described string turns and signaling module receives the serial signal of MCU output and is converted into parallel output to display module.
Intelligent aged load of the present invention, by current sample module and voltage sample module acquires electric current and voltage signal, then with the Indexes Comparison preset, by the dutycycle of dynamic conditioning 14 pin PWM, regulate the G pole signal of main power MOSFET, realize the precise constant of load in omnidistance ageing process.The present invention adopts digital circuit and mimic channel to coordinate, and by MCU chip microcontroller whole-process control, reaches the requirement dynamically changing aging mode, and independently arranges corresponding Ageing Index by button, realize independent setup measures and warning function.Compared with prior art, the maximum advantage of the present invention is with low cost, and flexible configuration, cost of labor demand is low.Meanwhile, because the present invention adopts modular design, high production efficiency can be brought for the enterprise of different scales.
As improvement of the present invention, the pwm control signal that described MCU produces outputs to described CC control module and CV control module through filtering circuit.
As a further improvement on the present invention, intelligent aged load is also provided with indicating lamp module and/or buzzing alarm module, realizes warning function when Ageing Index exceedes preset value.
Improve further as of the present invention, intelligent aged load is also provided with fan heat radiation module again, opens fan dispel the heat when temperature exceedes setting value.
Improve further as of the present invention, intelligent aged load is also provided with the power module for powering to each modular circuit again.Described power module comprises controllable accurate mu balanced circuit, DC/DC transducer and three-terminal voltage-stabilizing circuit.It is+12V that controllable accurate mu balanced circuit accurately arranges output voltage by two resistance, DC/DC transducer utilizes the function of its reverser to provide-12V magnitude of voltage, three-terminal voltage-stabilizing circuit provides+5V magnitude of voltage, enables power module meet the power supply needs of each module in the present invention's intelligence aged load.
Improve further again as of the present invention, be also provided with communication module, for connecting PC or intelligent aged load self.Arranged address and the master slave mode of aged load by button, the present invention can add network savvy, coordinates PC computer upper computer software to realize data acquisition, monitoring and management function.
Further improve as of the present invention, the current signal of described current sample module acquires, by being input to MCU after amplifier, this discharge circuit is also provided with electric current automatic calibration module.The input negative terminal of transport and placing device is clamped on zero by this electric current automatic calibration module, thus improves the precision of current signal.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments, the invention will be further described.
Fig. 1 is circuit structure diagram of the present invention.
Fig. 2 is the circuit structure diagram of controllable accurate stabilized voltage supply of the present invention.
Fig. 3 is the circuit structure diagram of DC/DC transducer of the present invention.
Fig. 4 is the circuit structure diagram of three-terminal voltage-stabilizing circuit of the present invention.
Fig. 5 is the circuit structure diagram of MCU of the present invention.
Fig. 6 is the peripheral circuit diagram of MCU of the present invention.
Fig. 7 is the circuit structure diagram of filtering circuit of the present invention, CC control module, current sample module and electric current automatic calibration module.
Fig. 8 is the circuit structure diagram of voltage sample module of the present invention.
Fig. 9 is the circuit structure diagram of voltage selection module of the present invention.
Figure 10 is the circuit structure diagram of CV control module of the present invention.
Figure 11 is the circuit structure diagram of mode conversion switch module of the present invention.
Figure 12 is the circuit structure diagram that string of the present invention turns OFF signal module.
Figure 13 is the circuit structure diagram of display module of the present invention.
Figure 14 is the circuit structure diagram of communication module of the present invention.
Figure 15 is the circuit structure diagram of indicating lamp module of the present invention.
Figure 16 is the circuit structure diagram of key-press module of the present invention.
Figure 17 is the circuit structure diagram of buzzing alarm module of the present invention.
Figure 18 is the circuit structure diagram of fan heat radiation module of the present invention.
Figure 19 is circuit block diagram of the present invention.
Embodiment
With reference to Fig. 1, intelligent aged load of the present invention, comprise main power MOSFET, MCU, CC control module, CV control module, mode conversion switch module, current sample module, voltage sample module, voltage selection module, string turn and signaling module, display module, key-press module, filtering circuit, indicating lamp module, buzzing alarm module, fan heat radiation module, power module, communication module and electric current automatic calibration module, leakage, the source electrode of described main power MOSFET are connected respectively to and are aging between the output terminal of power supply and ground.
With reference to Fig. 2, Fig. 3 and Fig. 4, described power module comprises controllable accurate mu balanced circuit, DC/DC transducer and three-terminal voltage-stabilizing circuit.It is+12V that controllable accurate mu balanced circuit accurately arranges output voltage by the resistance of adjusting resistance R58 and R59.DC/DC transducer utilizes the function of its reverser can provide-12V magnitude of voltage; Three-terminal voltage-stabilizing circuit then provides+5V magnitude of voltage.Above-mentioned three power modules can meet the needs to each module for power supply in the present invention's intelligence aged load.
With reference to the core that Fig. 5 and Fig. 6, MCU are the present invention's intelligence aged load, whole Based Intelligent Control is all realized by this MCU.In the present embodiment, adopt 8 high-performance MCU of atmel corp, 14th pin is PWM output pin, coordinate front end RC filtering circuit and amplifier to realize PWM->DA to change, and by current sample module and voltage sample module acquires electric current and voltage signal, then and the Indexes Comparison preset, by the dutycycle of dynamic conditioning 14 pin PWM, regulate the G pole signal of main power MOSFET, realize the precise constant of load in omnidistance ageing process.
With reference to Fig. 6, resistance R10, R11 and electric capacity C8, C9 form CR filtering circuit, and the pwm signal PWM1 that MCU the 14th pin exports obtains DC component signal at DAC1 end after CR filtering circuit.
Operational amplifier U1A, resistance R12, R8, electric capacity C10, feedback resistance R4 and feedback capacity C2 forms CC control module.Mode conversion switch is outputted to from CC1 end after the PWM DC component signal that MCU exports by CC control module amplifies.When mode conversion switch module is switched to constant current mode, drive main power MOSFET.
Between the source electrode being connected to main power MOSFET after sampling resistor Rs1 and Rs2 parallel connection and ground, its current signal gathered outputs to the 37th pin of MCU after operational amplifier U1D amplifies by ADC-CC1 end.Electric current automatic calibration module is also provided with between the output terminal and ground of operational amplifier U1D.This electric current automatic calibration module adopts 4051 digital control simulant electronic switches, and the input negative terminal of operational amplifier U1D is clamped on zero, thus improves the precision of current signal.
With reference to Fig. 8, described voltage sample module is the bleeder circuit be made up of resistance R41, R43, R44, R46 and diode D5, D6, D7, D8, the two ends of this bleeder circuit connect drain electrode and the ground of main power MOSFET respectively, and three centre taps DIV1, DIV2 and DIV3 are connected respectively to 13,14 and 15 pin of voltage selection module.
With reference to Fig. 9, described voltage selection module adopts 4051 digital control simulant electronic switches, 13, the voltage signal of 14 and 15 pin receiver voltage sampling modules, and 11 pin and 12 pin receive the control signal of MCU, select corresponding voltage sampling signal, and output to CV control module from COM pin.
With reference to Figure 10, described CV control module comprises and being made up of voltage follower U1B and operational amplifier U1C.The output terminal of the positive termination voltage selection module of input of voltage follower U1B, forms the voltage acquisition end ADC-CV1 of MCU, and is connected to 36 pin of MCU after the output terminal resistance in series R5 of voltage follower U1B.
With reference to Figure 11, described mode conversion switch adopts 4051 digital control simulant electronic switches, for switching different aging functions.According to the control signal of MCU, conducting CC control module and CV is selected to control, or its combination, make intelligent aged load operate in CC pattern, CV pattern or CR pattern.The G pole of the main power MOSFET of output COM termination of mode conversion switch, regulates the signal of described main power MOSFET to realize being aging the burn-in test of power supply by the dutycycle of dynamic conditioning PWM.
With reference to Figure 12, described string turns and signaling module receives the serial signal of MCU output and is converted into parallel output to display module.
With reference to Figure 13, described display module is used for display interface, and electric current, voltage the parameter such as settings.
With reference to Figure 14, described communication module, for connecting PC or intelligent aged load self.Address and the master slave mode of aged load are set by button, enable the present invention add network savvy, coordinate PC computer upper computer software to realize data acquisition, monitoring and management function.
With reference to Figure 15, described indicating lamp module adopts LED charactron, independently can arrange corresponding Ageing Index in conjunction with button, realizes aging and warning function separately.
With reference to Figure 16, described key-press module, is used for arranging Ageing Index, also can arrange address and the master slave mode of aged load, realizes networking.
With reference to Figure 17, described buzzing alarm module, realizes warning function when Ageing Index exceedes preset value.
With reference to Figure 18, described fan heat radiation module, opens fan and dispels the heat when temperature exceedes setting value.
Intelligent aged load of the present invention, can networking mutually, independently can switch master slave mode, Self address can be set arbitrarily, can connect at most 250 forms a whole for connecting computer, carried out the various parameters of each networking aged load of dynamic monitoring by upper computer software, also can form a whole connection intelligent aged load, realizes aging function substantially fast.Intelligent aged load of the present invention can significantly coordinate production line to realize the aging function of product, each intelligent aged load has complete function, band arranges button, various ageing parameter can be set, warning function is realized when Ageing Index exceedes preset value, thus can enhance productivity significantly, save production cost.
It is understood that above-described embodiment is just to explanation of the present invention, instead of limitation of the present invention, any innovation and creation do not exceeded in spirit of the present invention, all fall within protection scope of the present invention.
Claims (8)
1. intelligent aged load, comprise main power MOSFET, MCU, CC control module, CV control module, mode conversion switch module, current sample module, voltage sample module, voltage selection module, string turn and signaling module, display module and key-press module, the leakage of described main power MOSFET, source electrode are connected respectively to and are aging between the output terminal of power supply and ground, it is characterized in that:
The source current signal of the described main power MOSFET of current sample module acquires, and output current sampled signal is to MCU;
The drain voltage signal of the described main power MOSFET of voltage sample module acquires, and output voltage sampled signal is to voltage selection module;
Described voltage selection module receives the control signal of MCU, selects corresponding voltage sampling signal, and outputs to CV control module and MCU;
Described MCU detects current sampling signal and voltage sampling signal, produces CC control module, CV control module and mode conversion switch module described in pwm control signal control;
Described CC control module receives the pwm control signal that MCU exports, and outputs to mode conversion switch module after amplifier; When mode conversion switch module is switched to constant current mode, drive main power MOSFET;
Described CV control module receives the pwm control signal that MCU exports, and outputs to mode conversion switch module after amplifier; When mode conversion switch module is switched to constant voltage mode, drive main power MOSFET;
Described mode conversion switch is according to the control signal of MCU, select the output signal of conducting CC control module and CV control module, regulate the signal of described main power MOSFET to realize being aging the burn-in test of power supply by the dutycycle of dynamic conditioning PWM;
Described string turns and signaling module receives the serial signal of MCU output and is converted into parallel output to display module.
2. intelligent aged load as claimed in claim 1, is characterized in that the pwm control signal that described MCU produces outputs to described CC control module and CV control module through filtering circuit.
3. intelligent aged load as claimed in claim 1, is characterized in that also being provided with indicating lamp module and/or buzzing alarm module, realizes warning function when Ageing Index exceedes preset value.
4. intelligent aged load as claimed in claim 1, is characterized in that also being provided with fan heat radiation module, opens fan dispel the heat when temperature exceedes setting value.
5. intelligent aged load as claimed in claim 1, is characterized in that also being provided with the power module for powering to each modular circuit.
6. intelligent aged load as claimed in claim 5, is characterized in that described power module comprises controllable accurate mu balanced circuit, DC/DC transducer and three-terminal voltage-stabilizing circuit.
7. intelligent aged load as claimed in claim 1, is characterized in that also being provided with communication module, for connecting PC or intelligent aged load self.
8. intelligent aged load as claimed in claim 1, is characterized in that the current signal of described current sample module acquires is by being input to MCU after amplifier, this discharge circuit is also provided with electric current automatic calibration module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510903419.2A CN105425170A (en) | 2015-12-09 | 2015-12-09 | Intelligent aged load |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510903419.2A CN105425170A (en) | 2015-12-09 | 2015-12-09 | Intelligent aged load |
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| CN105425170A true CN105425170A (en) | 2016-03-23 |
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| CN201510903419.2A Pending CN105425170A (en) | 2015-12-09 | 2015-12-09 | Intelligent aged load |
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| CN202837425U (en) * | 2012-08-23 | 2013-03-27 | 安徽理工大学 | Low-power consumption direct-current electronic load |
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| TWI438459B (en) * | 2012-02-21 | 2014-05-21 | Chroma Ate Inc | A power supply test circuit for reducing surge current and its method |
| CN204166424U (en) * | 2014-11-06 | 2015-02-18 | 浙江师范大学 | Simple intelligent High-accuracy direct current electronic load |
| CN204389660U (en) * | 2015-02-05 | 2015-06-10 | 中国人民解放军装甲兵工程学院 | A kind of electronic load device based on field effect tubular type |
| CN204595181U (en) * | 2015-03-31 | 2015-08-26 | 安徽工程大学 | Based on the device of TMS320F2812 DC Electronic Loads |
| CN205263281U (en) * | 2015-12-09 | 2016-05-25 | 浙江榆阳电子有限公司 | Ageing load of intelligence |
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2015
- 2015-12-09 CN CN201510903419.2A patent/CN105425170A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101154811A (en) * | 2007-09-19 | 2008-04-02 | 北京索英电气技术有限公司 | Wide-region energy feedback method for multi-output switch power source and its implementing circuit |
| TWI438459B (en) * | 2012-02-21 | 2014-05-21 | Chroma Ate Inc | A power supply test circuit for reducing surge current and its method |
| CN202837425U (en) * | 2012-08-23 | 2013-03-27 | 安徽理工大学 | Low-power consumption direct-current electronic load |
| CN103149386A (en) * | 2013-03-05 | 2013-06-12 | 深圳市中科源电子有限公司 | Electronic load module of power supply aging test and power supply aging test system |
| CN203164237U (en) * | 2013-03-05 | 2013-08-28 | 深圳市中科源电子有限公司 | Electronic load module of power supply aging test and power supply aging test system |
| CN204166424U (en) * | 2014-11-06 | 2015-02-18 | 浙江师范大学 | Simple intelligent High-accuracy direct current electronic load |
| CN204389660U (en) * | 2015-02-05 | 2015-06-10 | 中国人民解放军装甲兵工程学院 | A kind of electronic load device based on field effect tubular type |
| CN204595181U (en) * | 2015-03-31 | 2015-08-26 | 安徽工程大学 | Based on the device of TMS320F2812 DC Electronic Loads |
| CN205263281U (en) * | 2015-12-09 | 2016-05-25 | 浙江榆阳电子有限公司 | Ageing load of intelligence |
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Inventor after: Wu Haiyan Inventor after: Yan Hailin Inventor after: Yang Wu Inventor after: Fang Jiemiao Inventor before: Yan Hailin Inventor before: Wu Haiyan Inventor before: Fang Jiemiao |
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Application publication date: 20160323 |
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