CN105510806A - Connection test device, insulation test device and test system of universal test machine - Google Patents

Connection test device, insulation test device and test system of universal test machine Download PDF

Info

Publication number
CN105510806A
CN105510806A CN201610016701.3A CN201610016701A CN105510806A CN 105510806 A CN105510806 A CN 105510806A CN 201610016701 A CN201610016701 A CN 201610016701A CN 105510806 A CN105510806 A CN 105510806A
Authority
CN
China
Prior art keywords
circuit
test
voltage
many grades
input
Prior art date
Application number
CN201610016701.3A
Other languages
Chinese (zh)
Other versions
CN105510806B (en
Inventor
赵凌云
Original Assignee
南京协辰电子科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南京协辰电子科技有限公司 filed Critical 南京协辰电子科技有限公司
Priority to CN201610016701.3A priority Critical patent/CN105510806B/en
Publication of CN105510806A publication Critical patent/CN105510806A/en
Application granted granted Critical
Publication of CN105510806B publication Critical patent/CN105510806B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors

Abstract

The invention discloses a connection test device, an insulation test device and a test system of a universal test machine. The connection test device comprises a first test end, a second test end, a multi-range constant-current circuit, a multi-range adjustable amplification circuit and a first voltage comparison circuit, wherein the first test end is connected with one end of the multi-range constant-current circuit and one end of the multi-range adjustable amplification circuit; the second test end is grounded; the first test end and the second test end are respectively used for being connected with two points to be tested on a circuit board to be tested; the other end of the multi-range constant-current circuit is connected with preset connection test voltage; the other end of the multi-range adjustable amplification circuit is connected with the first voltage comparison circuit; the first voltage comparison circuit is used for comparing voltage output by the first voltage comparison circuit with first reference voltage; when the voltage is higher than the first reference voltage, failed connection between the two points to be tested is judged.

Description

The test macro of connection test device, insulated test device and universal testing machine

Technical field

The present invention relates to pcb board field tests, be specifically related to the test macro of a kind of connection test device, insulated test device and universal testing machine.

Background technology

Along with using the product of large scale integrated circuit constantly to occur, the Installation And Test work of corresponding PCB is more and more important.The universal test of printed circuit board is the measuring technology that PCB industry is traditional.General testing electrical property technology the earliest can trace back to late nineteen seventies early eighties, because components and parts at that time all adopt standard packaging (Pitch is 100mil), PCB also only has THT (through hole technology) density level, so American-European test machine manufacturer just devises the test machine of a standard grid, as long as the element on PCB and wiring are arranged according to gauged distance, then each test point all can drop on standard network lattice point, because all PCB can be general at that time, therefore be called universal testing machine.

Universal testing machine of the prior art by parameter acquisition to model, specification error scope, compare with Board Under Test and judge whether qualified.Test operation summary: only need manually by needle-bar pressing, system will automatic business processing, and draws product quality result, and remove artificial factor of judgment from, its speed is that manual test is incomparable.System by gathering, Control card and testing software form, external programmable A C/DC power supply and DC load, high sampling rate product can match external oscillograph.System can synchronism detection to PCBA multi signal, and the convenient conversion of the operation interface of hommization, modular programmed environment and machine (Model), for enterprise uses manpower and material resources sparingly, enhances productivity, thus bring economic benefit to enterprise.

But, in the test circuit of existing universal testing machine, conducting metering circuit measurement range is probably 10 Ω ~ 100 Ω ± 10%, insulation test circuit test specification is 1M Ω ~ 50M Ω ± 10%, along with more and more higher to the requirement of pcb board card test in the industry, when carrying out carbon plate test, metering circuit can not meet test request.Therefore just need to carry out Curve guide impeller to test circuit.

Summary of the invention

Therefore, the technical problem to be solved in the present invention is that the measurement range of circuit board conducting, insulation test circuit in prior art is narrower.

For this reason, the technical scheme that the embodiment of the present invention provides is:

A kind of connection test device, comprising: the first test lead, the second test lead, many grades of constant-current source circuits, many grades of adjustable amplifying circuits and the first voltage comparator circuits, wherein

First test lead is connected with one end of many grades of constant-current source circuits and many grades of adjustable amplifying circuits;

Second test lead ground connection, whether the first test lead and the second test lead are for being connected with the tested point of two on circuit board under test respectively, qualified with the conducting tested between these two tested points;

Another termination of many grades of constant-current source circuits presets continuity test voltage, for providing for two tested points the steady current varied in size;

The other end of many grades of adjustable amplifying circuits connects the first voltage comparator circuit, for according to obtain control signal select enlargement factor by the voltage amplification between two tested points, and by amplify after voltage input to the first voltage comparator circuit;

The voltage that first voltage comparator circuit is used for many grades of adjustable amplifying circuits to export is compared with the first reference voltage, when the voltage that many grades of adjustable amplifying circuits export is greater than the first reference voltage, judge that the conducting carried out between two tested points of continuity test is defective.

Preferably, many grades of constant-current source circuits comprise source of stable pressure circuit, many grades of resistor voltage divider circuits, gating switch UC26 and constant-current source circuits, the burning voltage that source of stable pressure circuit exports exports the multiple voltage varied in size after many grades of resistor voltage divider circuits, gating switch UC26 selects wherein a kind of voltage according to the control signal obtained, and this voltage connects constant-current source circuit and exports steady current.

Preferably, many grades of constant-current source circuits also comprise the first adjustable amplifying circuit of enlargement factor, and the first amplifying circuit is arranged between source of stable pressure circuit and many grades of resistor voltage divider circuits, for adjusting the input voltage of many grades of resistor voltage divider circuits.

Preferably, also comprise addressing circuit, the input end of addressing circuit obtains control signal, output terminal is connected with the address input end of gating switch UC26, and addressing circuit exports different address signals with a passage in optionally conducting gating switch UC26 according to the control signal of acquisition.

Preferably, many grades of adjustable amplifying circuits comprise operational amplifier UC28A, resistance R62, multiple feedback resistance circuit and the gating switch UC27 controlled by the control signal obtained, one end of resistance R62 taps into the voltage between two tested points of row continuity test, the other end is connected with the first input end of operational amplifier UC28A, one end of multiple feedback resistance circuit is connected with the first input end of operational amplifier UC28A respectively, the other end is corresponding with multiple input ends of gating switch UC27 respectively to be connected, the output terminal of gating switch UC27 is connected with the output terminal of operational amplifier UC28A, second input end grounding of operational amplifier UC28A.

A kind of insulated test device, comprising: the 3rd test lead, the 4th test lead, operational amplification circuit and the second voltage comparator circuit, wherein

Operational amplification circuit comprises multiple feedback circuit and operational amplifier U17A, one end of multiple feedback circuit is connected with the first input end of operational amplifier U17A respectively, the other end is connected the output terminal as operational amplification circuit with the output terminal of operational amplifier U17A respectively, second input end grounding of operational amplifier U17A;

Each of multiple feedback circuit includes the first feedback resistance and gate-controlled switch that are connected in series, and gate-controlled switch is used for according to the control signal conducting obtained or disconnects corresponding feedback circuit to adjust the enlargement factor of operational amplification circuit;

3rd test lead is connected with the first input end of operational amplifier U17A;

4th test termination presets Insulation test voltage, and whether the 3rd test lead and the 4th test lead are for being connected with the tested point of two on circuit board under test respectively, qualified with the insulation tested between these two tested points;

The output terminal of operational amplification circuit is connected with the second voltage comparator circuit, for Insulation test voltage amplification will be preset, and the voltage after amplifying is inputed to the second voltage comparator circuit, the enlargement factor of operational amplification circuit is determined by the resistance between the resistance of the feedback circuit of conducting and two tested points;

Second voltage comparator circuit, for the voltage that exported by operational amplification circuit compared with the second reference voltage, when the voltage that operational amplification circuit exports is greater than the second reference voltage, judges that the insulation carried out between two tested points of Insulation test is defective.

A test macro for universal testing machine, comprises many grades of constant-current source circuits, many grades of adjustable amplifying circuit, the first voltage comparator circuit, operational amplification circuit and the second voltage comparator circuit, the first gate-controlled switch and the 5th, the 6th test leads, wherein

5th test lead of test macro is connected with the tested point of two on circuit board under test respectively with the 6th test lead, and to test, whether conducting between these two tested points is qualified or whether insulation is qualified;

When carrying out continuity test, the 6th test lead is connected with one end of many grades of constant-current source circuits and many grades of adjustable amplifying circuits; When carrying out Insulation test, the 6th test termination presets Insulation test voltage;

Another termination of many grades of constant-current source circuits presets continuity test voltage, provides for the tested point of two for carrying out continuity test the steady current varied in size;

The other end of many grades of adjustable amplifying circuits connects the first voltage comparator circuit, for the enlargement factor selected according to the control signal obtained by carry out continuity test two tested points between voltage amplification, and the voltage after amplifying is inputed to the first voltage comparator circuit;

The voltage that first voltage comparator circuit is used for many grades of adjustable amplifying circuits to export is compared with the first reference voltage, when the voltage that many grades of adjustable amplifying circuits export is greater than the first reference voltage, judge that the conducting carried out between two tested points of continuity test is defective;

Operational amplification circuit comprises multiple feedback circuit and operational amplifier U17A, one end of multiple feedback circuit is connected with the first input end of operational amplifier U17A respectively, the other end is connected the output terminal as operational amplification circuit with the output terminal of operational amplifier U17A respectively, second input end grounding of operational amplifier U17A;

Each of multiple feedback circuit includes the first feedback resistance and gate-controlled switch that are connected in series, and gate-controlled switch is used for according to the control signal conducting obtained or disconnects corresponding feedback circuit to adjust the enlargement factor of operational amplification circuit;

5th test lead is connected with the first input end of operational amplifier U17A;

The output terminal of operational amplification circuit is connected with the second voltage comparator circuit, for Insulation test voltage amplification will be preset, and the voltage after amplifying is inputed to the second voltage comparator circuit, the enlargement factor of operational amplification circuit is determined by the resistance between the resistance of the feedback circuit of conducting and two tested points carrying out Insulation test;

Second voltage comparator circuit, for the voltage that exported by operational amplification circuit compared with the second reference voltage, when the voltage that operational amplification circuit exports is greater than the second reference voltage, judges that the insulation carried out between two tested points of Insulation test is defective;

Between the first input end that first gate-controlled switch is arranged on operational amplifier U17A and output terminal, when carrying out continuity test, whole feedback circuit is disconnected according to control signal, and closed first gate-controlled switch, make the voltage of the first input end of operational amplifier U17A equal the voltage of its second input end.

Preferably, also comprise the on-off circuit for closing or disconnect this test macro, the control circuit that on-off circuit comprises the second gate-controlled switch and is connected with the second gate-controlled switch control end, one end of second gate-controlled switch is connected with the first input end of operational amplifier U17A, the other end is connected with the 5th test lead of this test macro, and control circuit is used for reception control signal and controls the break-make of the second gate-controlled switch according to this control signal.

Preferably, control circuit comprises power circuit, the 3rd gate-controlled switch and the first photoelectric isolating circuit, connect the control end of the second gate-controlled switch after power circuit and the 3rd gate-controlled switch are connected in series, input end reception control signal, the output terminal of the first photoelectric isolating circuit are connected with the control end of the 3rd gate-controlled switch the break-make controlling the 3rd gate-controlled switch.

Preferably, this system also comprises relay circuit and the second photoelectric isolating circuit, relay circuit is arranged between many grades of constant-current source circuits and the 6th test lead of this test macro, second photoelectric isolating circuit one termination presets Insulation test voltage, the other end is connected with the 6th test lead of this test macro, and relay circuit and the second photoelectric isolating circuit are used for the on off operating mode switching insulated test device and connection test device according to control signal.

Preferably, also comprise multiple the 4th gate-controlled switch for switching tested point, carry out two tested points of Insulation test and/or carry out a tested point in two tested points of continuity test and be connected with the 5th test lead of this test macro, another tested point is connected with the 6th test lead of this test macro respectively by the 4th gate-controlled switch, and the break-make of the 4th gate-controlled switch is controlled by the control signal obtained.

Preferably, also comprise theoretical value and circuit is provided, for providing the first reference voltage when continuity test, second reference voltage is provided when Insulation test, theoretical value provides circuit to comprise D/A converting circuit and reference voltage circuit, the steering order that D/A converting circuit is used for according to obtaining exports corresponding voltage, and reference voltage circuit provides reference voltage for D/A converting circuit.

Technical solution of the present invention, tool has the following advantages:

1. the connection test device that provides of the embodiment of the present invention, the different gear of many grades of constant-current source circuits can be selected according to actual needs when carrying out the continuity test of circuit board thus provide the steady current of different size for two tested points, also by selecting the different gears of many grades of adjustable amplifying circuits to be that voltage between two tested points selects different enlargement factors.Therefore, this connection test device has larger measurement range when carrying out the continuity test of circuit board.

2. the connection test device that provides of the embodiment of the present invention, in its many grades of constant-current source circuits, is provide input voltage by source of stable pressure circuit to constant-current source circuit, further ensures the stability of its output current, thus improve the measurement accuracy of connection test device.

3. the connection test device that provides of the embodiment of the present invention, its many grades of constant-current source circuits also comprise the first adjustable amplifying circuit of enlargement factor, first amplifying circuit is arranged between source of stable pressure circuit and many grades of resistor voltage divider circuits, this the first amplifying circuit expands the adjustable extent of many grades of constant-current source circuit output currents further, thus also expands the test specification of this connection test device further.

4. the insulated test device that provides of the embodiment of the present invention, can different feedback circuits according to actual needs on gating operational amplifier U17A when carrying out the Insulation test of circuit board, thus select different enlargement factors.Therefore, this insulated test device has larger measurement range when carrying out Insulation test.

5. the test macro of universal testing machine that provides of the embodiment of the present invention, both can Insulation test between two tested points on realizing circuit plate, also can realize the continuity test between two tested points.When carrying out Insulation test, each feedback circuit in operational amplification circuit comprises the first feedback resistance and gate-controlled switch that are connected in series, the break-make of each gate-controlled switch is controlled by the control signal obtained, thus the different feedback circuit of conducting is with the different enlargement factor of Selecting operation amplifying circuit, thus improve the measurement range of Insulation test.When carrying out continuity test, many grades of constant-current source circuits can select different gears to export the electric current of different size to two tested points according to the control signal obtained, many grades of adjustable amplifying circuits also can select different gears to adjust its enlargement factor according to the control signal obtained, thus improve the measurement range of continuity test, namely the test macro of this universal testing machine all has larger test specification when carrying out Insulation test and continuity test.

6. the test macro of universal testing machine that provides of the embodiment of the present invention, its theoretical value provides circuit directly can export the voltage of corresponding size according to the control signal obtained, therefore when carrying out continuity test or Insulation test, the control signal that the gear etc. that the gear selected according to insulated test device or connection test device are selected generates can directly the control theory value reference voltage that provides circuit to export correspondence with compare with real output value determine insulation between two tested points or conducting whether qualified.

Accompanying drawing explanation

In order to be illustrated more clearly in the specific embodiment of the invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.

Fig. 1 is the structured flowchart of the connection test device of the embodiment of the present invention 1;

Fig. 2 is the circuit diagram of many grades of constant-current source circuits in Fig. 1;

Fig. 3 is the circuit diagram of the addressing circuit in Fig. 2;

Fig. 4 is the circuit diagram of many grades of adjustable amplifying circuits in Fig. 1;

Fig. 5 is the circuit diagram arranging pressure limited protection circuit before many grades of adjustable amplifying circuits in FIG and voltage follower circuit;

Fig. 6 is the structured flowchart of the insulated test device of the embodiment of the present invention 2;

Fig. 7 is the one-piece construction block diagram of the test macro of the universal testing machine of the embodiment of the present invention 3;

Fig. 8 is the circuit diagram of the on-off circuit in Fig. 7;

Fig. 9 is the circuit diagram of the control circuit of on-off circuit in Fig. 7;

Figure 10 is the circuit diagram of the relay circuit in Fig. 7;

Figure 11 is the circuit diagram of the second photoelectric isolating circuit in Fig. 7;

Figure 12 provides the circuit diagram of circuit for the theoretical value in Fig. 7;

Figure 13 and Figure 14 is the integrated circuit schematic diagram of the test macro of universal testing machine in the embodiment of the present invention 3.

Embodiment

Be clearly and completely described technical scheme of the present invention below in conjunction with accompanying drawing, obviously, described embodiment is the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.

In describing the invention, it should be noted that, term " first ", " second ", " the 3rd " only for describing object, and can not be interpreted as instruction or hint relative importance.In addition, unless otherwise clearly defined and limited, term " connection " should be interpreted broadly, such as, can be directly be connected, also indirectly can be connected by intermediary, can also be the connection of two element internals, can be wireless connections, also can be wired connection.For the ordinary skill in the art, concrete condition above-mentioned term concrete meaning in the present invention can be understood.

In addition, if below in the described different embodiment of the present invention involved technical characteristic do not form conflict each other and just can be combined with each other.

Embodiment 1

Present embodiments provide a kind of connection test device, various control signals in the present embodiment, steering order are exported by the host computer be connected with this connection test device, as shown in Figure 1, comprise: the first test lead, the second test lead, many grades of constant-current source circuits, many grades of adjustable amplifying circuits and the first voltage comparator circuits, wherein

First test lead is connected with one end of many grades of constant-current source circuits and many grades of adjustable amplifying circuits;

Second test lead ground connection, whether the first test lead and the second test lead are for being connected with the tested point of two on circuit board under test respectively, qualified with the conducting tested between these two tested points;

Another termination of many grades of constant-current source circuits presets continuity test voltage, for providing for two tested points the steady current varied in size;

The other end of many grades of adjustable amplifying circuits connects the first voltage comparator circuit, for according to obtain control signal select enlargement factor by the voltage amplification between two tested points, and by amplify after voltage input to the first voltage comparator circuit;

The voltage that first voltage comparator circuit is used for many grades of adjustable amplifying circuits to export is compared with the first reference voltage, when the voltage that many grades of adjustable amplifying circuits export is greater than the first reference voltage, judge that the conducting carried out between two tested points of continuity test is defective.

The connection test device that the embodiment of the present invention provides, when carrying out continuity test, its first test lead is connected with the tested point of two on circuit board under test respectively with the second test lead, and preset continuity test voltage, the suitable gear in many grades of constant-current source circuits and many grades of adjustable amplifying circuits is selected according to the control signal obtained.Afterwards, the first corresponding reference voltage is selected according to the gear of the many grades of constant-current source circuits selected and the gear of many grades of adjustable amplifying circuits.Now the electric current of many grades of constant-current source circuit outputs is certain, and the enlargement factor of many grades of adjustable amplifying circuits is also certain, and the resistance between two tested points is larger, and its voltage is larger, and the voltage of many grades of adjustable amplifying circuit outputs is also larger; Otherwise the voltage of many grades of adjustable amplifying circuit outputs is less.Therefore, if the voltage of many grades of adjustable amplifying circuit outputs is greater than the first reference voltage, then the conducting between these two tested points is defective.

The connection test device that the embodiment of the present invention provides, can select the different gear of many grades of constant-current source circuits according to actual needs when carrying out the continuity test of circuit board thus provide the steady current of different size for two tested points, the voltage that also can be between two tested points carrying out continuity test selects different enlargement factors.Therefore, this connection test device has larger measurement range when carrying out the continuity test of circuit board.

As preferred embodiment, as shown in Figure 2, many grades of constant-current source circuits comprise source of stable pressure circuit, many grades of resistor voltage divider circuits, gating switch UC26 (74HC4051) and constant-current source circuits, the burning voltage that source of stable pressure circuit exports exports the multiple voltage varied in size after many grades of resistor voltage divider circuits, gating switch UC26 selects wherein a kind of voltage according to the control signal obtained, and this voltage connects constant-current source circuit and exports steady current.

In many grades of constant-current source circuits in the present embodiment, be provide input voltage by source of stable pressure circuit to constant-current source circuit, further ensure the stability of its output current, thus improve the measurement accuracy of connection test device.

Particularly, above-mentioned source of stable pressure circuit comprises controllable accurate source of stable pressure Z2 (TL431), resistance R50, diode D19, resistance R52, electric capacity CP7 and electric capacity C106, the negative electrode of controllable accurate source of stable pressure Z2 and with reference to pole respectively with one end of resistance R50, the anode of diode D19 connects, another termination power supply of resistance R50, the anode of controllable accurate source of stable pressure Z2 connects default continuity test voltage (GNDH), the negative electrode of diode D19 connects default continuity test voltage by resistance R52, electric capacity CP7 is connected with the negative electrode of controllable accurate source of stable pressure Z2 respectively with one end of electric capacity C106, the other end connects default continuity test voltage respectively.The negative electrode of controllable accurate source of stable pressure Z2 and the junction of electric capacity CP7, C106 are as the output terminal of this source of stable pressure circuit.Preset the voltage between continuity test voltage and GNDH and GND, the voltage when carrying out continuity test between GNDH and GND is lower, such as, can be 24V.

Above-mentioned many grades of resistor voltage divider circuits comprise resistance R53-R58, R99-104 and R114, one end of resistance R53 is as the input end of these many grades of resistor voltage divider circuits, connect default continuity test voltage after the other end and resistance R54-R58, R99-101, R103, R104 and R114 are sequentially connected in series, resistance R102 is in parallel with resistance R101.The junction of resistance R54 and R55 is connected with the first input end of gating switch UC26, the junction of resistance R55 and R56 is connected with second input end of gating switch UC26, the junction of resistance R56 and R57 is connected with the 3rd input end of gating switch UC26, in source of stable pressure circuit, the negative electrode of diode D19 is connected with the four-input terminal of gating switch UC26, the junction of resistance R57 and R58 is connected with the 5th input end of gating switch UC26, the junction of resistance R101 and R103 is connected with the 6th input end of gating switch UC26, the junction of resistance R103 and R104 is connected with the 7th input end of gating switch UC26, the junction of resistance R104 and R114 is connected with the 8th input end of gating switch UC26.

Above-mentioned constant-current source circuit comprises amplifier U25B (LF353D), field effect transistor QN1 and resistance R64, the in-phase input end of amplifier U25B is connected with the output terminal of gating switch UC26, output terminal is connected with the grid of field effect transistor QN1, inverting input is connected with the source electrode of field effect transistor QN1, the drain electrode of field effect transistor QN1, as the output terminal of this constant-current source circuit, connects default continuity test voltage after the source electrode of field effect transistor QN1 is connected with resistance R64.

The above-mentioned many grades of constant-current source circuits that this enforcement provides, can the voltage varied in size be selected to be input in constant-current source circuit by the control signal obtained, thus the steady current that output varies in size is to two tested points carrying out continuity test, expands the test specification of continuity test.In addition, these many grades of constant-current source circuit reliabilities are high, and the current constant of output, also improves the reliability of test result.

As further preferred embodiment, as shown in Figure 2, many grades of constant-current source circuits also comprise the first adjustable amplifying circuit of enlargement factor, and the first amplifying circuit is arranged between source of stable pressure circuit and many grades of resistor voltage divider circuits, for adjusting the input voltage of many grades of resistor voltage divider circuits.This first amplifying circuit comprises amplifier U25A (LF353D), resistance R51, variable resistor VR1 and electric capacity C105, the in-phase input end of amplifier U25A is connected with the output terminal of source of stable pressure circuit, output terminal is connected with the input end of many grades of resistor voltage divider circuits, the two ends of variable resistor VR1 are connected with the inverting input of amplifier U25A, output terminal respectively, electric capacity C105 is in parallel with variable resistor VR1, and one end of resistance R51 is connected with the inverting input of amplifier U25A, another termination presets continuity test voltage.

In the embodiment of the present invention, this enlargement factor expands the adjustable extent of many grades of constant-current source circuit output currents further by the first amplifying circuit that variable resistor VR1 regulates, thus also expands the test specification of this connection test device further.

Particularly, this connection test device also comprises addressing circuit, the input end of addressing circuit obtains control signal, output terminal is connected with the address input end of gating switch UC26, and addressing circuit exports different address signals with a passage in optionally conducting gating switch UC26 according to the control signal of acquisition.As shown in Figure 3, this addressing circuit comprises d type flip flop UC18 (74HCT374), inverter buffer UC24-A/UC24-B/UC24-C (7406), photo-coupler T21/T22/T23 (PC817) and resistance R59-R61, resistance R47-R49, the input end of d type flip flop UC18 is connected to obtain control signal with host computer, wherein three output terminals are connected with the input end of inverter buffer UC24-A/UC24-B/UC24-C respectively, the output terminal of inverter buffer UC24-A/UC24-B/UC24-C is connected with the negative electrode of photo-coupler T21/T22/T23 respectively, the anode of photo-coupler T21/T22/T23 is connected with power supply respectively by resistance R47-R49, the emitter of photo-coupler T21/T22/T23 is connected with three address input ends of gating switch UC26 respectively.One end of resistance R59-R61 is connected with the emitter of photo-coupler T21/T22/T23 respectively, the other end all connects default continuity test voltage, and the collector of photo-coupler T21/T22/T23 connects power supply respectively.

This addressing circuit in the embodiment of the present invention makes host computer can control gating switch UC26 easily, thus selects the voltage that is input in constant-current source circuit easily.The quick switching being many grades of constant-current source circuit gears is provided convenience.

As preferred embodiment, as shown in Figure 4, above-mentioned many grades of adjustable amplifying circuits comprise operational amplifier UC28A, resistance R62, multiple feedback resistance circuit and the gating switch UC27 controlled by the control signal obtained, one end of resistance R62 taps into the voltage between two tested points of row continuity test, the other end is connected with the first input end of operational amplifier UC28A, one end of multiple feedback resistance circuit is connected with the first input end of operational amplifier UC28A respectively, the other end is corresponding with multiple input ends of gating switch UC27 respectively to be connected, the output terminal of gating switch UC27 is connected with the output terminal of operational amplifier UC28A, second input end grounding of operational amplifier UC28A.Particularly, these many grades of adjustable amplifying circuits are anti-phase scaling circuit, wherein multiple feedback resistance circuit is respectively and is connected successively the first feedback resistance circuit formed by resistance R63-R67, to be connected successively the second feedback resistance circuit formed by resistance R77-R80, to be connected successively the 3rd feedback resistance circuit formed by resistance R81-R83, to be connected the 4th feedback resistance circuit formed by resistance R84 and R68, the 5th feedback resistance circuit be made up of resistance R85, by resistance R69, R73 and R74 connect successively formed the 6th feedback resistance circuit, to be connected successively the 7th feedback resistance circuit formed by resistance R93-R95, the 8th feedback resistance circuit be made up of resistance R109.First feedback resistance circuit to one end of the 8th feedback resistance circuit connects with the inverting input of amplifier UC28A respectively, the other end is connected to the 8th input end is corresponding with the first input end of gating switch UC27 respectively.

In addition, as shown in Figure 3, three address input ends of gating switch UC27 are connected with three output terminals of d type flip flop UC18 in addressing circuit respectively, these three output terminals are also connected with the input end of inverter buffer UC24-A/UC24-B/UC24-C simultaneously, and namely host computer also controls gating switch UC27 while controlling gating switch UC26 by addressing circuit.

In the embodiment of the present invention, host computer only needs generation steering order and exports just can control gating switch UC26 and UC27 simultaneously, namely facilitates gear switch during continuity test.

As further preferred embodiment, as shown in Figure 5, the voltage follower circuit also comprising pressure limited protection circuit successively between many grades of adjustable amplifying circuits and the first test lead of connection test device and be made up of amplifier UC28B, pressure limited protection circuit comprises voltage stabilizing diode ZDP1 and resistance R, R0, resistance R, one end of R0 is connected with the first test lead of connection test device respectively, the other end of resistance R is connected with the positive pole of voltage stabilizing diode ZDP1, the other end of resistance R0 and the negative pole common ground of voltage stabilizing diode ZDP1, resistance R is connected with the in-phase input end of amplifier UC28B as the output terminal of this pressure limited protection circuit with the junction of voltage stabilizing diode ZDP1, the output terminal of amplifier UC28B is connected with resistance R62.Wherein, voltage stabilizing diode ZDP1 is 12V, for limiting the maximum voltage exporting to many grades of adjustable amplifying circuits, prevents late-class circuit damaged.

Embodiment 2

Present embodiments provide a kind of insulated test device, various control signals in the present embodiment, steering order are exported by the host computer be connected with this insulated test device, as shown in Figure 6, comprising: the 3rd test lead, the 4th test lead, operational amplification circuit and the second voltage comparator circuit, wherein

Operational amplification circuit comprises multiple feedback circuit and operational amplifier U17A, one end of multiple feedback circuit is connected with the first input end of operational amplifier U17A respectively, the other end is connected the output terminal as operational amplification circuit with the output terminal of operational amplifier U17A respectively, second input end grounding of operational amplifier U17A;

Each of multiple feedback circuit includes the first feedback resistance and gate-controlled switch that are connected in series, and gate-controlled switch is used for according to the control signal conducting obtained or disconnects corresponding feedback circuit to adjust the enlargement factor of operational amplification circuit;

3rd test lead is connected with the first input end of operational amplifier U17A;

4th test termination presets Insulation test voltage, and whether the 3rd test lead and the 4th test lead are for being connected with the tested point of two on circuit board under test respectively, qualified with the insulation tested between these two tested points;

The output terminal of operational amplification circuit is connected with the second voltage comparator circuit, for Insulation test voltage amplification will be preset, and the voltage after amplifying is inputed to the second voltage comparator circuit, the enlargement factor of operational amplification circuit is determined by the resistance between the resistance of the feedback circuit of conducting and two tested points;

Second voltage comparator circuit, for the voltage that exported by operational amplification circuit compared with the second reference voltage, when the voltage that operational amplification circuit exports is greater than the second reference voltage, judges that the insulation carried out between two tested points of Insulation test is defective.

The insulated test device that the present embodiment provides, when carrying out Insulation test, its the 3rd test lead is needed to be connected with the tested point of two on circuit board under test respectively with the 4th test lead, and preset Insulation test voltage, host computer exports corresponding control signal according to actual needs to the feedback circuit selecting conducting suitable, to select suitable enlargement factor.Afterwards, according to selecting the feedback circuit of conducting to select the second corresponding reference voltage.Resistance between two tested points is larger, and the voltage that operational amplification circuit exports is less; Otherwise the voltage that operational amplification circuit exports is larger.Therefore, if the voltage that operational amplification circuit exports is greater than the second reference voltage, then illustrate that the insulation between these two tested points is defective.

The insulated test device that the embodiment of the present invention provides, can different feedback circuits according to actual needs on gating operational amplifier U17A when carrying out the Insulation test of circuit board, thus select different enlargement factors.Therefore, this insulated test device has larger measurement range when carrying out Insulation test.

Embodiment 3

As shown in Figure 7, present embodiments provide a kind of test macro of universal testing machine, various control signals in the present embodiment, steering order are exported by the host computer be connected with this test macro, comprise many grades of constant-current source circuits, many grades of adjustable amplifying circuit, the first voltage comparator circuit, operational amplification circuit and the second voltage comparator circuit, the first gate-controlled switch and the 5th, the 6th test leads, wherein

5th test lead of test macro is connected with the tested point of two on circuit board under test respectively with the 6th test lead, and to test, whether conducting between these two tested points is qualified or whether insulation is qualified;

When carrying out continuity test, the 6th test lead is connected with one end of many grades of constant-current source circuits and many grades of adjustable amplifying circuits; When carrying out Insulation test, the 6th test termination presets Insulation test voltage;

Another termination of many grades of constant-current source circuits presets continuity test voltage, provides for the tested point of two for carrying out continuity test the steady current varied in size;

The other end of many grades of adjustable amplifying circuits connects the first voltage comparator circuit, for the enlargement factor selected according to the control signal obtained by carry out continuity test two tested points between voltage amplification, and the voltage after amplifying is inputed to the first voltage comparator circuit;

The voltage that first voltage comparator circuit is used for many grades of adjustable amplifying circuits to export is compared with the first reference voltage, when the voltage that many grades of adjustable amplifying circuits export is greater than the first reference voltage, judge that the conducting carried out between two tested points of continuity test is defective;

Operational amplification circuit comprises multiple feedback circuit and operational amplifier U17A, one end of multiple feedback circuit is connected with the first input end of operational amplifier U17A respectively, the other end is connected the output terminal as operational amplification circuit with the output terminal of operational amplifier U17A respectively, second input end grounding of operational amplifier U17A;

Each of multiple feedback circuit includes the first feedback resistance and gate-controlled switch that are connected in series, and gate-controlled switch is used for according to the control signal conducting obtained or disconnects corresponding feedback circuit to adjust the enlargement factor of operational amplification circuit;

5th test lead is connected with the first input end of operational amplifier U17A;

The output terminal of operational amplification circuit is connected with the second voltage comparator circuit, for Insulation test voltage amplification will be preset, and the voltage after amplifying is inputed to the second voltage comparator circuit, the enlargement factor of operational amplification circuit is determined by the resistance between the resistance of the feedback circuit of conducting and two tested points carrying out Insulation test;

Second voltage comparator circuit, for the voltage that exported by operational amplification circuit compared with the second reference voltage, when the voltage that operational amplification circuit exports is greater than the second reference voltage, judges that the insulation carried out between two tested points of Insulation test is defective;

Between the first input end that first gate-controlled switch is arranged on operational amplifier U17A and output terminal, when carrying out continuity test, whole feedback circuit is disconnected according to control signal, and closed first gate-controlled switch, make the voltage of the first input end of operational amplifier U17A equal the voltage of its second input end.Namely when carrying out continuity test, the second input end equipotential of the 5th test lead of this test macro and the ground connection of operational amplifier U17A.

The test macro of the universal testing machine that the present embodiment provides, both can Insulation test between two tested points on realizing circuit plate, also can realize the continuity test between two tested points.When carrying out Insulation test, the control signal that host computer exports can carry out the different feedback circuit of conducting to select different enlargement factors (and disconnecting the first gate-controlled switch) by controlling gate-controlled switch, thus improves the measurement range of Insulation test.When carrying out continuity test, host computer can control the size of current of the output selecting many grades of constant-current source circuits and the enlargement factor of many grades of adjustable amplifying circuits, thus improve the measurement range of continuity test, namely the test macro of this universal testing machine all has larger test specification when carrying out Insulation test and continuity test.

Particularly, as shown in figure 13, above-mentioned many grades of constant-current source circuits and many grades of adjustable amplifying circuits can adopt the physical circuit described in above-described embodiment 1.The control signal that gating switch UC26 in many grades of constant-current source circuits and the gating switch UC27 in many grades of adjustable amplifying circuits also can adopt the addressing circuit in embodiment 1 to export according to host computer controls.As shown in figure 14, above-mentioned operational amplification circuit also comprises diode D513 and D514, electric capacity CP17 and stabilivolt ZD26, ZD27, diode D513 is connected with the first input end of operational amplifier U17A and the second input end respectively with after D514 reverse parallel connection, the two ends of electric capacity CP17 are connected with the first input end of operational amplifier U17A, output terminal respectively, are connected respectively after stabilivolt ZD26, ZD27 differential concatenation with the first input end of operational amplifier U17A, output terminal.

Particularly, as shown in Fig. 7,8 and 9, the test macro of the universal testing machine that the present embodiment provides also comprises the on-off circuit for closing or disconnect this test macro, the control circuit that on-off circuit comprises the second gate-controlled switch P1 and is connected with the second gate-controlled switch P1 control end, one end of second gate-controlled switch P1 is connected with the first input end of operational amplifier U17A, the other end is connected with the 5th test lead of this test macro, and this control circuit is used for reception control signal and controls the break-make of the second gate-controlled switch P1 according to this control signal.

Particularly, as shown in figures 9 and 14, control circuit comprises power circuit, the 3rd gate-controlled switch U5 (MC14066) and the first photoelectric isolating circuit, connect the control end of the second gate-controlled switch P1 after power circuit and the 3rd gate-controlled switch U5 are connected in series, input end reception control signal, the output terminal of the first photoelectric isolating circuit are connected with the control end of the 3rd gate-controlled switch U5 the break-make controlling the 3rd gate-controlled switch U5.Power circuit comprises power module UN308 (B0505S-W5) and electric capacity CP1, and the positive output end of power module UN308 is connected with the two ends of electric capacity CP1 respectively with negative output terminal.The positive output end of power supply UN308 is connected with the first end of the second gate-controlled switch P1 by diode D2, the negative output terminal of power supply UN308 is connected with the control end of the second gate-controlled switch P1 with the 3rd gate-controlled switch U5 by resistance RP1 successively, the control end of the second gate-controlled switch P1 is connected by resistance RP71 with first end, and second end of the second gate-controlled switch P1 is connected with the 5th test lead of this test macro.Particularly, the second gate-controlled switch P1 is PNP type triode (MMBTA92 (2D)).First photoelectric isolating circuit comprises optocoupler T24 (6N137), resistance R113, resistance R107 and voltage stabilizing diode ZD62, the anode of optocoupler T24 connects+5V voltage, negative electrode by resistance R113 and to be connected control signal to receive host computer with host computer, Enable Pin VE and the power end VCC of optocoupler T24 connect power supply respectively, and earth terminal GND ground connection, the output terminal of optocoupler T24 are connected with the control end of the 3rd gate-controlled switch U5.In addition, the output terminal of optocoupler T24 connects power supply by resistance R107, and is connect communicatively by voltage stabilizing diode ZD62.

As concrete embodiment, as shown in Figure 7, in the test macro of the universal testing machine that the present embodiment provides, also comprise relay circuit and the second photoelectric isolating circuit, relay circuit is arranged between many grades of constant-current source circuits and the 6th test lead of this test macro, second photoelectric isolating circuit one termination presets Insulation test voltage, the other end is connected with the 6th test lead of this test macro, and this relay circuit and the second photoelectric isolating circuit are used for switching Insulation test function and continuity test function according to control signal.Particularly, when carrying out Insulation test, opening the second photoelectric isolating circuit and disconnecting relay circuit; When carrying out continuity test, opening relay circuit and disconnecting the second photoelectric isolating circuit.

Particularly, as shown in Figure 10 and 13, above-mentioned relay circuit comprises relay UC33 (AD4C111), inverter buffer UC24-D and UC24-F (7406), resistance R111 and R112, LED 4 and LED5, 6 pins of relay UC33 are connected with 7 pins and are connected with the 6th test lead of this test macro afterwards, 8 pins are connected with the output terminal of many grades of constant-current source circuits by diode D1, 5 pins are connected with the input end of many grades of adjustable amplifying circuits, 1 pin connects power supply after sending and receiving optical diode LED5 and resistance R111 successively, 2 pins are connected with reception control signal by inverter buffer UC24-F with host computer, 3 pins connect power supply after sending and receiving optical diode LED4 and resistance R112 successively, 4 pins are connected with reception control signal with host computer by inverter buffer UC24-D.

As shown in figures 11 and 13, above-mentioned second photoelectric isolating circuit comprises optocoupler UNX1 (AQV254H), resistance R117-R119, inverter buffer UC5-D and UC5-E (7406), 1 pin of optocoupler UNX1 connects power supply by resistance R119, the input end of inverter buffer UC5-D is connected with host computer, output terminal is connected with the input end of inverter buffer UC5-E and one end of resistance R117 respectively, another termination power supply of resistance R117, the output terminal of inverter buffer UC5-E respectively with 2 pins of optocoupler UNX1, one end of resistance R118 connects, another termination power supply of resistance R118, 4 pins of optocoupler UNX1 connect with the 6th test lead of this test macro, 6 pins of optocoupler UNX1 connect default Insulation test voltage.Preferably, 6 pins of optocoupler UNX1 are connected with one end of resistance R75, another termination of resistance R75 presets Insulation test voltage, and electric capacity C96 is in parallel with resistance R75.

As preferred embodiment, as shown in figure 12, the test macro of universal testing machine also comprises theoretical value provides circuit, for providing the first reference voltage when continuity test, second reference voltage is provided when Insulation test, theoretical value provides circuit to comprise D/A converting circuit and reference voltage circuit, and the steering order that D/A converting circuit is used for according to obtaining exports corresponding voltage, and reference voltage circuit provides reference voltage for D/A converting circuit.

Particularly, as shown in figure 12, D/A converting circuit comprises digital to analog converter UC13 (TLC5615), its DIN hold, SCLK end and hold the control signal be all connected with host computer to receive host computer, REFIN end is connected with the output terminal of reference voltage circuit, and OUT exports the first reference voltage or the second reference voltage after holding the voltage follower by being made up of amplifier UC14A (LF353D).The voltage follower that said reference potential circuit comprises controllable accurate source of stable pressure Z1 (TL431), resistance R5, electric capacity CP5 and formed by amplifier UC19A (LF353D), the negative electrode of controllable accurate source of stable pressure Z1 is connected with one end of resistance R5, one end of electric capacity CP5 respectively with reference to pole, the anode of controllable accurate source of stable pressure Z1, the other end ground connection of electric capacity CP5, the input end of this voltage follower is connected, exports termination digital to analog converter UC13 REFIN with the negative electrode of controllable accurate source of stable pressure Z1 holds, another termination power supply of resistance R5.Theoretical value provides circuit also to comprise the voltage comparator circuit be made up of amplifier UC15, two input ends of amplifier UC15 are connected with the output terminal of amplifier UC19A, the output terminal of amplifier UC14A respectively, for the voltage swing that benchmark potential circuit and D/A converting circuit export.In the present embodiment, under normal circumstances, the voltage of the output of amplifier UC14A should be greater than the voltage of amplifier UC19A output, if D/A converting circuit has occurred causing its output voltage to reduce to when being less than voltage that amplifier UC19A exports, should the voltage comparator circuit that be made up of amplifier UC15 just can output abnormality signal in time, thus make user can Timeliness coverage D/A converting circuit fault.Resistance R6 is as pull-up resistor, and its one end is connected with the output terminal of amplifier UC15, another termination power supply.

In the test macro of the universal testing machine that the embodiment of the present invention provides, when carrying out Insulation test, host computer is according to the feedback circuit of operational amplification circuit gating, namely the enlargement factor selected, export different control signals and provide circuit to theoretical value, this theoretical value provides circuit just can export corresponding voltage as the second reference voltage according to the control signal of host computer, compares judge that whether the insulation between two tested points is qualified with the voltage of the actual output of operational amplification circuit.When carrying out continuity test, the enlargement factor of the size of current that host computer exports according to many grades of constant-current source circuits and many grades of adjustable amplifying circuits exports different control signals provides circuit to theoretical value, this theoretical value provides circuit just to export corresponding voltage as the first reference voltage according to the control signal of host computer, compares judge that whether the conducting between two tested points is qualified with the forward voltage of many grades of adjustable amplifying circuits.Therefore, this theoretical value provides circuit to have the advantages that to export different voltage according to the control signal of host computer, ensure that the test macro of this universal testing machine has wider test specification.

As other preferred embodiment, as shown in figure 14, the test macro of this universal testing machine also comprises multiple the 4th gate-controlled switch for switching tested point, carry out two tested points of Insulation test and/or carry out a tested point in two tested points of continuity test and be connected with the 5th test lead of this test macro, another tested point is connected with the 6th test lead of this test macro respectively by the 4th gate-controlled switch, and the break-make of the 4th gate-controlled switch is controlled by the control signal obtained.Particularly, as shown in figure 14, in the present embodiment, one end of a 4th gate-controlled switch NC7 is connected with a tested point in two tested points carrying out Insulation test, the other end is connected with the 6th test lead (i.e. GNDT) of this test macro, and wherein namely resistance R3 represents the resistance between two tested points carrying out Insulation test; One end of another the 4th gate-controlled switch NC8 is connected with a tested point in two tested points carrying out continuity test, the other end is connected with the 6th test lead (i.e. GNDT) of this test macro, and wherein namely resistance R1 represents the resistance between two tested points carrying out continuity test.Above-mentioned the 4th gate-controlled switch for switching tested point is controlled by 8 addressable latch U6 (74HCT259) by host computer.

Obviously, above-described embodiment is only for clearly example being described, and the restriction not to embodiment.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here exhaustive without the need to also giving all embodiments.And thus the apparent change of extending out or variation be still among the protection domain of the invention.

Claims (12)

1. a connection test device, is characterized in that, comprising: the first test lead, the second test lead, many grades of constant-current source circuits, many grades of adjustable amplifying circuits and the first voltage comparator circuits, wherein
Described first test lead is connected with one end of described many grades of constant-current source circuits and described many grades of adjustable amplifying circuits;
Described second test lead ground connection, whether described first test lead and described second test lead are for being connected with the tested point of two on circuit board under test respectively, qualified with the conducting tested between these two tested points;
Another termination of described many grades of constant-current source circuits presets continuity test voltage, for providing for described two tested points the steady current varied in size;
The other end of described many grades of adjustable amplifying circuits connects described first voltage comparator circuit, for according to obtain control signal select enlargement factor by the voltage amplification between described two tested points, and by amplify after voltage input to described first voltage comparator circuit;
The voltage that described first voltage comparator circuit is used for described many grades of adjustable amplifying circuits to export is compared with the first reference voltage, when the voltage that described many grades of adjustable amplifying circuits export is greater than described first reference voltage, judge that the conducting carried out between two tested points of continuity test is defective.
2. connection test device as claimed in claim 1, it is characterized in that, described many grades of constant-current source circuits comprise source of stable pressure circuit, many grades of resistor voltage divider circuits, gating switch UC26 and constant-current source circuits, the burning voltage that described source of stable pressure circuit exports exports the multiple voltage varied in size after described many grades of resistor voltage divider circuits, gating switch UC26 selects wherein a kind of voltage according to the control signal obtained, and this voltage connects described constant-current source circuit and exports steady current.
3. connection test device as claimed in claim 2, it is characterized in that, described many grades of constant-current source circuits also comprise the first adjustable amplifying circuit of enlargement factor, described first amplifying circuit is arranged between described source of stable pressure circuit and described many grades of resistor voltage divider circuits, for adjusting the input voltage of described many grades of resistor voltage divider circuits.
4. connection test device as claimed in claim 2 or claim 3, it is characterized in that, also comprise addressing circuit, the input end of described addressing circuit obtains control signal, output terminal is connected with the address input end of described gating switch UC26, and described addressing circuit exports different address signals with a passage in optionally gating switch UC26 described in conducting according to the control signal of acquisition.
5. the connection test device according to any one of claim 1-4, it is characterized in that, described many grades of adjustable amplifying circuits comprise operational amplifier UC28A, resistance R62, multiple feedback resistance circuit and the gating switch UC27 controlled by the control signal obtained, one end of described resistance R62 taps into the voltage between two tested points of row continuity test, the other end is connected with the first input end of described operational amplifier UC28A, one end of described multiple feedback resistance circuit is connected with the first input end of described operational amplifier UC28A respectively, the other end is corresponding with multiple input ends of described gating switch UC27 respectively to be connected, the output terminal of described gating switch UC27 is connected with the output terminal of described operational amplifier UC28A, second input end grounding of described operational amplifier UC28A.
6. an insulated test device, is characterized in that, comprising: the 3rd test lead, the 4th test lead, operational amplification circuit and the second voltage comparator circuit, wherein
Described operational amplification circuit comprises multiple feedback circuit and operational amplifier U17A, one end of described multiple feedback circuit is connected with the first input end of described operational amplifier U17A respectively, the other end is connected the output terminal as described operational amplification circuit with the output terminal of described operational amplifier U17A, second input end grounding of described operational amplifier U17A respectively;
Each of described multiple feedback circuit includes the first feedback resistance and gate-controlled switch that are connected in series, and described gate-controlled switch is used for according to the control signal conducting obtained or disconnects corresponding described feedback circuit to adjust the enlargement factor of described operational amplification circuit;
Described 3rd test lead is connected with the first input end of described operational amplifier U17A;
Described 4th test termination presets Insulation test voltage, and whether described 3rd test lead and described 4th test lead are for being connected with the tested point of two on circuit board under test respectively, qualified with the insulation tested between these two tested points;
The output terminal of described operational amplification circuit is connected with described second voltage comparator circuit, for by described default Insulation test voltage amplification, and the voltage after amplifying is inputed to described second voltage comparator circuit, the enlargement factor of described operational amplification circuit is determined by the resistance between the resistance of the described feedback circuit of conducting and described two tested points;
Second voltage comparator circuit, for voltage that described operational amplification circuit is exported compared with the second reference voltage, when the voltage that described operational amplification circuit exports is greater than described second reference voltage, judge that the insulation carried out between two tested points of Insulation test is defective.
7. the test macro of a universal testing machine, it is characterized in that, comprise many grades of constant-current source circuits, many grades of adjustable amplifying circuit, the first voltage comparator circuit, operational amplification circuit and the second voltage comparator circuit, the first gate-controlled switch and the 5th, the 6th test leads, wherein
Described 5th test lead of described test macro is connected with the tested point of two on circuit board under test respectively with described 6th test lead, and to test, whether conducting between these two tested points is qualified or whether insulation is qualified;
When carrying out continuity test, described 6th test lead is connected with one end of described many grades of constant-current source circuits and described many grades of adjustable amplifying circuits; When carrying out Insulation test, described 6th test termination presets Insulation test voltage;
Another termination of described many grades of constant-current source circuits presets continuity test voltage, provides for the tested point of two for carrying out continuity test the steady current varied in size;
The other end of described many grades of adjustable amplifying circuits connects described first voltage comparator circuit, for the enlargement factor selected according to the control signal obtained by carry out continuity test two tested points between voltage amplification, and the voltage after amplifying is inputed to described first voltage comparator circuit;
The voltage that described first voltage comparator circuit is used for described many grades of adjustable amplifying circuits to export is compared with the first reference voltage, when the voltage that described many grades of adjustable amplifying circuits export is greater than described first reference voltage, judge that the conducting carried out between two tested points of continuity test is defective;
Described operational amplification circuit comprises multiple feedback circuit and operational amplifier U17A, one end of described multiple feedback circuit is connected with the first input end of described operational amplifier U17A respectively, the other end is connected the output terminal as described operational amplification circuit with the output terminal of described operational amplifier U17A, second input end grounding of described operational amplifier U17A respectively;
Each of described multiple feedback circuit includes the first feedback resistance and gate-controlled switch that are connected in series, and described gate-controlled switch is used for according to the control signal conducting obtained or disconnects corresponding described feedback circuit to adjust the enlargement factor of described operational amplification circuit;
Described 5th test lead is connected with the first input end of described operational amplifier U17A;
The output terminal of described operational amplification circuit is connected with described second voltage comparator circuit, for by described default Insulation test voltage amplification, and the voltage after amplifying is inputed to described second voltage comparator circuit, the enlargement factor of described operational amplification circuit is determined by the resistance between the resistance of the described feedback circuit of conducting and two tested points carrying out Insulation test;
Second voltage comparator circuit, for voltage that described operational amplification circuit is exported compared with the second reference voltage, when the voltage that described operational amplification circuit exports is greater than described second reference voltage, judge that the insulation carried out between two tested points of Insulation test is defective;
Between the first input end that described first gate-controlled switch is arranged on described operational amplifier U17A and output terminal, when carrying out continuity test, whole described feedback circuit is disconnected according to control signal, and closed described first gate-controlled switch, make the voltage of the first input end of described operational amplifier U17A equal the voltage of its second input end.
8. the test macro of universal testing machine as claimed in claim 7, it is characterized in that, also comprise the on-off circuit for closing or disconnect this test macro, the control circuit that described on-off circuit comprises the second gate-controlled switch and is connected with described second gate-controlled switch control end, one end of described second gate-controlled switch is connected with the first input end of described operational amplifier U17A, the other end is connected with the 5th test lead of this test macro, and described control circuit is used for reception control signal and controls the break-make of described second gate-controlled switch according to this control signal.
9. the test macro of universal testing machine as claimed in claim 7 or 8, it is characterized in that, described control circuit comprises power circuit, the 3rd gate-controlled switch and the first photoelectric isolating circuit, connect the control end of described second gate-controlled switch after described power circuit and described 3rd gate-controlled switch are connected in series, input end reception control signal, the output terminal of described first photoelectric isolating circuit are connected with the control end of described 3rd gate-controlled switch the break-make controlling described 3rd gate-controlled switch.
10. the test macro of universal testing machine as claimed in any one of claims 7-9, is characterized in that:
Also comprise relay circuit and the second photoelectric isolating circuit, described relay circuit is arranged between described many grades of constant-current source circuits and the 6th test lead of this test macro, described in described second photoelectric isolating circuit one termination, default Insulation test voltage, the other end are connected with the 6th test lead of this test macro, and described relay circuit and described second photoelectric isolating circuit are used for the on off operating mode switching described insulated test device and described connection test device according to control signal.
The test macro of 11. universal testing machines according to any one of claim 7-10, it is characterized in that, also comprise multiple the 4th gate-controlled switch for switching tested point, carry out two tested points of Insulation test and/or carry out a tested point in two tested points of continuity test and be connected with the 5th test lead of this test macro, another tested point is connected with the 6th test lead of this test macro respectively by described 4th gate-controlled switch, and the break-make of described 4th gate-controlled switch is controlled by the control signal obtained.
The test macro of 12. universal testing machines according to any one of claim 7-11, it is characterized in that, also comprise theoretical value and circuit is provided, for providing described first reference voltage when continuity test, described second reference voltage is provided when Insulation test, described theoretical value provides circuit to comprise D/A converting circuit and reference voltage circuit, the steering order that described D/A converting circuit is used for according to obtaining exports corresponding voltage, and described reference voltage circuit provides reference voltage for described D/A converting circuit.
CN201610016701.3A 2016-01-11 2016-01-11 The test system of connection test device and universal testing machine CN105510806B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610016701.3A CN105510806B (en) 2016-01-11 2016-01-11 The test system of connection test device and universal testing machine

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201810373470.0A CN108828428A (en) 2016-01-11 2016-01-11 Insulated test device
CN201610016701.3A CN105510806B (en) 2016-01-11 2016-01-11 The test system of connection test device and universal testing machine

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN201810373470.0A Division CN108828428A (en) 2016-01-11 2016-01-11 Insulated test device

Publications (2)

Publication Number Publication Date
CN105510806A true CN105510806A (en) 2016-04-20
CN105510806B CN105510806B (en) 2018-10-02

Family

ID=55718923

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201810373470.0A CN108828428A (en) 2016-01-11 2016-01-11 Insulated test device
CN201610016701.3A CN105510806B (en) 2016-01-11 2016-01-11 The test system of connection test device and universal testing machine

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN201810373470.0A CN108828428A (en) 2016-01-11 2016-01-11 Insulated test device

Country Status (1)

Country Link
CN (2) CN108828428A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106680630A (en) * 2016-12-29 2017-05-17 北京金风科创风电设备有限公司 Conductive slip ring fault test device and test method
CN108152542A (en) * 2017-12-28 2018-06-12 北京航天新风机械设备有限责任公司 A kind of CPCI type high voltage relay modules for Insulation test and continuity test
CN108616222A (en) * 2018-07-10 2018-10-02 南京工业大学 A kind of multi gear for clarifying smoke exports high voltage power supply
CN110031742A (en) * 2018-01-12 2019-07-19 神讯电脑(昆山)有限公司 Wiring board connects tin detection circuit

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108021122B (en) * 2017-12-12 2020-03-31 中国航发沈阳黎明航空发动机有限责任公司 Vibration test fault diagnosis method for aircraft engine

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080018338A1 (en) * 2006-07-20 2008-01-24 Microinspection, Inc. Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same
CN202494750U (en) * 2012-03-22 2012-10-17 杭州士兰微电子股份有限公司 Testing device of integrated circuit pin open short
CN103033738A (en) * 2012-12-20 2013-04-10 全天自动化能源科技(东莞)有限公司 Automatic test system for circuit board
CN204882782U (en) * 2015-08-24 2015-12-16 无锡博一光电科技有限公司 Short circuit testing arrangement is opened to circuit board
CN205581264U (en) * 2016-01-11 2016-09-14 南京协辰电子科技有限公司 Test system of conduction testing device and universal test machine

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008102096A (en) * 2006-10-20 2008-05-01 Fanuc Ltd Insulation resistance degradation detector of motor
CN203422168U (en) * 2013-09-05 2014-02-05 济钢集团有限公司 Temperature difference detector
CN203773014U (en) * 2014-04-02 2014-08-13 青岛青整电子设备有限公司 DC 110V online insulation detection apparatus
CN204479699U (en) * 2014-12-23 2015-07-15 北京新能源汽车股份有限公司 To the device that the insulating property of the high-voltage wiring harness of electric automobile are measured

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080018338A1 (en) * 2006-07-20 2008-01-24 Microinspection, Inc. Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same
CN202494750U (en) * 2012-03-22 2012-10-17 杭州士兰微电子股份有限公司 Testing device of integrated circuit pin open short
CN103033738A (en) * 2012-12-20 2013-04-10 全天自动化能源科技(东莞)有限公司 Automatic test system for circuit board
CN204882782U (en) * 2015-08-24 2015-12-16 无锡博一光电科技有限公司 Short circuit testing arrangement is opened to circuit board
CN205581264U (en) * 2016-01-11 2016-09-14 南京协辰电子科技有限公司 Test system of conduction testing device and universal test machine

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106680630A (en) * 2016-12-29 2017-05-17 北京金风科创风电设备有限公司 Conductive slip ring fault test device and test method
CN106680630B (en) * 2016-12-29 2019-11-19 北京金风科创风电设备有限公司 Conducting slip ring fault testing apparatus and test method
CN108152542A (en) * 2017-12-28 2018-06-12 北京航天新风机械设备有限责任公司 A kind of CPCI type high voltage relay modules for Insulation test and continuity test
CN110031742A (en) * 2018-01-12 2019-07-19 神讯电脑(昆山)有限公司 Wiring board connects tin detection circuit
CN108616222A (en) * 2018-07-10 2018-10-02 南京工业大学 A kind of multi gear for clarifying smoke exports high voltage power supply

Also Published As

Publication number Publication date
CN105510806B (en) 2018-10-02
CN108828428A (en) 2018-11-16

Similar Documents

Publication Publication Date Title
CN103176470B (en) The experimental system of MMC flexible direct-current transmission of electricity Control protection equipment and method
CN104345262A (en) Universal circuit board test system
CN107255759A (en) A kind of electric vehicle alternating-current charging pile automatic checkout system
CN101713802B (en) Fault on-line repairing method for satellite power supply and distribution test system
CN202815077U (en) Multi-channel voltage current tester
CN204347228U (en) A kind of engine special test equipment field calibration device
CN103440803B (en) The authentic training system of 10kV power distribution equipment real voltage analog current closed loop
CN2919266Y (en) Direct current electronic loading device
CN104614668A (en) Circuit board testing system
CN103278769B (en) A kind of checkout gear of relay
JP2012105536A (en) Battery simulation system performing error simulation
CN103149386B (en) Electronic load module of power supply aging test and power supply aging test system
CN205049678U (en) Short circuit testing arrangement is opened to camera module
CN101566849A (en) Functional parameter test system for automobile electronic controller and test method thereof
CN204595599U (en) Based on the automobile electronic controller general-utility test platform of CANoe
CN104849579A (en) System and method for testing sensitive elements of over-current protection and voltage monitoring device
CN102621462A (en) Multiway cable rapid insulation detection system and multiway cable insulation detection method
CN104297623A (en) Automatic test system for onboard cable integrity
CN101488276B (en) Wireless test system for cable
CN102520288A (en) Primary-rising based current differential protection synchronization performance testing system and testing method
CN202548240U (en) Automated test platform for photovoltaic grid-connected micro-inverter
CN103092246B (en) System and method for power supply monitoring
CN203673003U (en) Multi-core cable automatic tester
CN103675586A (en) Testing method and system for long-distance multi-core cable
US8736280B2 (en) High speed data bus tester

Legal Events

Date Code Title Description
PB01 Publication
C06 Publication
SE01 Entry into force of request for substantive examination
C10 Entry into substantive examination
GR01 Patent grant
GR01 Patent grant