CN105510336B - 平面图像获取装置 - Google Patents
平面图像获取装置 Download PDFInfo
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- CN105510336B CN105510336B CN201511000279.4A CN201511000279A CN105510336B CN 105510336 B CN105510336 B CN 105510336B CN 201511000279 A CN201511000279 A CN 201511000279A CN 105510336 B CN105510336 B CN 105510336B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Facsimile Scanning Arrangements (AREA)
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Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201511000279.4A CN105510336B (zh) | 2015-12-28 | 2015-12-28 | 平面图像获取装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201511000279.4A CN105510336B (zh) | 2015-12-28 | 2015-12-28 | 平面图像获取装置 |
Publications (2)
Publication Number | Publication Date |
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CN105510336A CN105510336A (zh) | 2016-04-20 |
CN105510336B true CN105510336B (zh) | 2018-06-15 |
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Application Number | Title | Priority Date | Filing Date |
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CN201511000279.4A Active CN105510336B (zh) | 2015-12-28 | 2015-12-28 | 平面图像获取装置 |
Country Status (1)
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CN (1) | CN105510336B (zh) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103148361A (zh) * | 2011-12-06 | 2013-06-12 | 欧司朗股份有限公司 | 照明装置 |
CN103827627A (zh) * | 2011-09-26 | 2014-05-28 | 美德客科技有限公司 | 非接触式部件检查装置及部件检查方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2963336B2 (ja) * | 1994-04-28 | 1999-10-18 | 東光株式会社 | 印刷監視装置 |
JP3341963B2 (ja) * | 1995-06-21 | 2002-11-05 | エヌ・ティ・ティ・ファネット・システムズ株式会社 | 欠陥検査装置 |
JP3496644B2 (ja) * | 2001-01-12 | 2004-02-16 | シーシーエス株式会社 | 検査用照明装置 |
JP5097993B2 (ja) * | 2008-08-28 | 2012-12-12 | シーシーエス株式会社 | 光照射装置 |
KR101193278B1 (ko) * | 2010-09-27 | 2012-10-19 | 삼성전기주식회사 | 핀 그리드 어레이 패키지 기판의 제조를 위한 리드핀 검사 장치 및 이를 이용한 리드핀 검사 방법 |
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2015
- 2015-12-28 CN CN201511000279.4A patent/CN105510336B/zh active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103827627A (zh) * | 2011-09-26 | 2014-05-28 | 美德客科技有限公司 | 非接触式部件检查装置及部件检查方法 |
CN103148361A (zh) * | 2011-12-06 | 2013-06-12 | 欧司朗股份有限公司 | 照明装置 |
Also Published As
Publication number | Publication date |
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CN105510336A (zh) | 2016-04-20 |
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GR01 | Patent grant | ||
CP03 | Change of name, title or address |
Address after: 100094 Beijing city Haidian District Cui Hunan loop 13 Hospital No. 7 Building 7 room 701 Patentee after: Lingyunguang Technology Co.,Ltd. Address before: 100094 Beijing city Haidian District road Tamatsu wisdom Valley Center Building 2 Patentee before: LUSTER LIGHTTECH GROUP Co.,Ltd. |
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CP03 | Change of name, title or address | ||
CP01 | Change in the name or title of a patent holder |
Address after: 100094 701, 7 floor, 7 building, 13 Cui Hunan Ring Road, Haidian District, Beijing. Patentee after: Lingyunguang Technology Co.,Ltd. Address before: 100094 701, 7 floor, 7 building, 13 Cui Hunan Ring Road, Haidian District, Beijing. Patentee before: Beijing lingyunguang Technology Group Co.,Ltd. Address after: 100094 701, 7 floor, 7 building, 13 Cui Hunan Ring Road, Haidian District, Beijing. Patentee after: Beijing lingyunguang Technology Group Co.,Ltd. Address before: 100094 701, 7 floor, 7 building, 13 Cui Hunan Ring Road, Haidian District, Beijing. Patentee before: LUSTER LIGHTTECH GROUP Co.,Ltd. |
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CP01 | Change in the name or title of a patent holder |