CN105487522A - Test system and method of gate control system - Google Patents
Test system and method of gate control system Download PDFInfo
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- CN105487522A CN105487522A CN201510821924.2A CN201510821924A CN105487522A CN 105487522 A CN105487522 A CN 105487522A CN 201510821924 A CN201510821924 A CN 201510821924A CN 105487522 A CN105487522 A CN 105487522A
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- card
- gating device
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
Abstract
The invention relates to a test system of a gate control system. The test system comprises a simulated test system and a gate controller. The simulated test system comprises a CPU, a digital IO card, a 16-bit data collection card, a power supply module, a digital oscilloscope, an IO isolator, a relay card, a dynamic torsion module, a motor braking simulation system, a waveform generator, a rotating speed and stroke collection module, a current collection module, an LAN communication port and a pulse control card, wherein the digital IO card and the 16-bit data collection card are in communication connection with the CPU via a PCI bus, the digital oscilloscope is electrically connected with the output end of the 16-bit data collection card, one end of the motor braking simulation system is in communication connection with the 16-bit data collection card, and the other end of the motor braking simulation system is in bidirectional communication connection with the gate controller via the dynamic torsion module. According to the invention, a load feedback loop is added to a dynamomter, the time sequence is recorded at high speed, related parameters and working time sequence in the working process of the gate control system are recorded, and related electronic and physical parameters are restored approximately via recording files according to the working time sequence.
Description
Technical field
The present invention relates to the test macro of door control system, particularly relate to the test macro of a kind of subway, high ferro door control system.
Background technology
Test macro is integration unit product quality checking, Performance Evaluation, parameter measurement, fault diagnosis being contained to hardware and software.All electronic products, all can through multiple basic parameter, performance parameter and functional test from production run; The first big country that China produces as electronic product, electronic information manufacturing industry income scale leaps to the whole world first; Over nearly 10 years, the subway high ferro transport leading world especially of China, become the big country of power of high ferro outlet, but the test of the door control system of subway high ferro is all halt manual test and the common test based on theoretical value, momentum when can not simulate the environment of train in running at high speed and switch gate and inertia.There is significant limitation in such test, causes train may there are some and draw trouble safely.
China's track traffic achieves develop rapidly over the years, but the test of the door control system of subway, high ferro is all halt manual test and the common test based on theoretical value, momentum when can not simulate the environment of train in running at high speed and switch gate and inertia, there is significant limitation in such test, causes train may there are some and draw trouble safely.
Summary of the invention
For overcoming the deficiencies in the prior art, the object of the present invention is to provide the artificial intelligence test macro of the door sequential operationally, momentum, inertia, torsion, resistance, rotating speed etc. of an emulation subway high ferro, be intended to improve subway, high ferro door control system quality and further promote its safety coefficient.
For achieving the above object, the present invention is achieved through the following technical solutions:
A test macro for door control system, comprising: emulation test system and gating device, and wherein said emulation test system comprises:
CPU; Digital I/O card, 16 bit data capture cards, be connected with described CPU communication respectively by pci bus;
Supply module, its one end is connected with described CPU communication, and the other end is electrically connected with described gating device in the mode of powering to described gating device;
Digital oscilloscope, it is electrically connected with the output terminal of described 16 bit data capture cards, for receiving and show the signal of described gating device;
IO isolator, relay card, be that one end is connected with described digital I/O card communication respectively, the other end is connected with described gating device communication;
Dynamic torsion module, its output terminal connects the input end of described 16 bit data capture cards;
Motor braking analogue system, its one end is connected with described 16 bit data capture card communications, the other end respectively with described gating device, by being connected with described gating device both-way communication after described dynamic torsion module;
Waveform generator, its one end is connected with the output terminal of described 16 bit data capture cards, and the other end is connected with described gating device communication;
Rotating speed, pass acquires module and current acquisition module, be the input end that output terminal connects described 16 bit data capture cards respectively, the other end is connected with described gating device communication;
Lan network PORT COM, Pulse Width Control card, be that one end is connected with described CPU communication respectively, the other end is connected with described gating device both-way communication.
Preferably, the test macro of described door control system, wherein, described CPU is industrial computer.
Preferably, the test macro of described door control system, wherein, described digital I/O card is 96 passage digital I/O card.
Preferably, the test macro of described door control system, wherein, described IO isolator is high speed 32 passage Digital I/O isolators.
A method of testing for door control system, comprises the following steps:
Step 1) be project document by gating device reference record, and be loaded in emulation test system;
Step 2) select the project needing emulation;
Step 3) resolve the parameter of described project;
Step 4) start to perform emulation;
Step 5) reduction gating device IO action sequence, load step 2 simultaneously) in the project chosen;
Step 6) judge whether the parameter of the project chosen equals predetermined target value, if be greater than predetermined target value, then reduces the parameter of this project; If be less than predetermined target value, then increase the parameter of this project, until the parameter of this project equals predetermined target value; When the parameter of this project equals desired value, continue;
Step 7) judge output current wave whether within the scope of current waveform ripple cover, if output current wave is within the scope of current waveform ripple cover, then continue, otherwise test crash;
Step 8) judge to export digital waveform whether within the scope of voltage waveform ripple cover, if export digital waveform within the scope of voltage waveform ripple cover, then test is passed through, otherwise test crash;
Step 9) by described step 5) to step 8) and test record uploading data storehouse and preserve.
Preferably, the method for testing of described door control system, wherein, described step 2) in project comprise the IO temporal and logic relation of rotating speed, resistance, torsion, inertia, momentum, emulation test system.
Preferably, the method for testing of described door control system, wherein, when described step 2) in selected item be rotating speed, described step 5) predetermined target value of medium speed is 0-5000 revolution per second; When described step 2) in selected item be resistance, described step 5) in the predetermined target value of resistance be 30-200N; When described step 2) in selected item be torsion, described step 5) in the predetermined target value of torsion be 0-20Nm; When described step 2) in selected item be inertia, described step 5) in the predetermined target value of inertia be 50-200kgm
2; When described step 2) in selected item be momentum, described step 5) in the predetermined target value of momentum be 5-50kgm/s, when described step 2) in selected item be the IO temporal and logic relation of emulation test system, described step 5) in the predetermined target value of IO temporal and logic relation of emulation test system be sampling rate within 2 minutes be the digital waveform of 1kHz.
Beneficial effect of the present invention: this case adds load feedback loop on the basis of dynamometer machine, high speed sequential writing function, correlation parameter and work schedule is recorded in the door control system course of work of reality, again during simulation reduction, work schedule approximate reduction associated electrical and physical parameter are pressed by log file by testing software on computing machine, as momentum inertia when motor torsion, door motion, and on off state etc., compared with prior art, following advantage is also possessed:
(1) test macro of the door control system of subway, high ferro has the running parameter function recording door control system truly;
(2) have the data recorded are reverted to simulator by testing software, and simulate door control system operationally electricity ginseng and the physical parameter such as sequence, momentum, inertia, friction force more really;
(3) emulation test system adopts closed loop benefit to taste loop, completely solves the impact of temperature variation on load torsion;
(4) can to arrange in pairs or groups configurable software application platform, to realize the editable software test item management of secondary, what built-in connection data storehouse connect that product realize product can tracing management.
Accompanying drawing explanation
Fig. 1 is the structural representation of the test macro of the door control system described in one embodiment of the invention;
The schematic flow sheet of the method for testing that Fig. 2 is the door control system described in one embodiment of the invention when option is resistance, torsion situation.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further detail, can implement according to this with reference to instructions word to make those skilled in the art.
A test macro for door control system, refers to accompanying drawing 1, comprising: emulation test system and gating device, and wherein said emulation test system comprises:
CPU; Digital I/O card, 16 bit data capture cards, be connected with described CPU communication respectively by pci bus;
Supply module, its one end is connected with described CPU communication, and the other end is electrically connected with described gating device in the mode of powering to described gating device;
Digital oscilloscope, it is electrically connected with the output terminal of described 16 bit data capture cards, for receiving and show the signal of described gating device;
IO isolator, relay card, be that one end is connected with described digital I/O card communication respectively, the other end is connected with described gating device communication;
Dynamic torsion module, its output terminal connects the input end of described 16 bit data capture cards;
Motor braking analogue system, its one end is connected with described 16 bit data capture card communications, the other end respectively with described gating device, by being connected with described gating device both-way communication after described dynamic torsion module;
Waveform generator, its one end is connected with the output terminal of described 16 bit data capture cards, and the other end is connected with described gating device communication;
Rotating speed, pass acquires module and current acquisition module, be the input end that output terminal connects described 16 bit data capture cards respectively, the other end is connected with described gating device communication;
Lan network PORT COM, Pulse Width Control card, be that one end is connected with described CPU communication respectively, the other end is connected with described gating device both-way communication.
Further, described CPU is industrial computer.
Further, described digital I/O card is 96 passage digital I/O card.
Further, described IO isolator is high speed 32 passage Digital I/O isolators.
A method of testing for door control system, refers to accompanying drawing 2, comprises the following steps:
Step 1) be project document by gating device reference record, and be loaded in emulation test system;
Step 2) select the project needing emulation;
Step 3) resolve the parameter of described project;
Step 4) start to perform emulation;
Step 5) reduction gating device IO action sequence, load step 2 simultaneously) in the project chosen;
Step 6) judge whether the parameter of the project chosen equals predetermined target value, if be greater than predetermined target value, then reduces the parameter of this project; If be less than predetermined target value, then increase the parameter of this project, until the parameter of this project equals predetermined target value; When the parameter of this project equals desired value, continue;
Step 7) judge output current wave whether within the scope of current waveform ripple cover, if output current wave is within the scope of current waveform ripple cover, then continue, otherwise test crash;
Step 8) judge to export digital waveform whether within the scope of voltage waveform ripple cover, if export digital waveform within the scope of voltage waveform ripple cover, then test is passed through, otherwise test crash;
Step 9) by described step 5) to step 8) and test record uploading data storehouse and preserve.
Further, described step 2) in project comprise the IO temporal and logic relation of rotating speed, resistance, torsion, inertia, momentum, emulation test system.
Further, when described step 2) in selected item be rotating speed, described step 5) predetermined target value of medium speed is 0-5000 revolution per second; When described step 2) in selected item be resistance, described step 5) in the predetermined target value of resistance be 30-200N; When described step 2) in selected item be torsion, described step 5) in the predetermined target value of torsion be 0-20Nm; When described step 2) in selected item be inertia, described step 5) in the predetermined target value of inertia be 50-200kgm
2; When described step 2) in selected item be momentum, described step 5) in the predetermined target value of momentum be 5-50kgm/s, when described step 2) in selected item be the IO temporal and logic relation of emulation test system, described step 5) in the predetermined target value of IO temporal and logic relation of emulation test system be sampling rate within 2 minutes be the digital waveform of 1kHz.
Although embodiment of the present invention are open as above, but it is not restricted to listed in instructions and embodiment utilization, it can be applied to various applicable the field of the invention completely, for those skilled in the art, can easily realize other amendment, therefore do not deviating under the universal that claim and equivalency range limit, the present invention is not limited to specific details and illustrates here and the legend described.
Claims (7)
1. a test macro for door control system, is characterized in that, comprising: emulation test system and gating device, and wherein said emulation test system comprises:
CPU; Digital I/O card, 16 bit data capture cards, be connected with described CPU communication respectively by pci bus;
Supply module, its one end is connected with described CPU communication, and the other end is electrically connected with described gating device in the mode of powering to described gating device;
Digital oscilloscope, it is electrically connected with the output terminal of described 16 bit data capture cards, for receiving and show the signal of described gating device;
IO isolator, relay card, be that one end is connected with described digital I/O card communication respectively, the other end is connected with described gating device communication;
Dynamic torsion module, its output terminal connects the input end of described 16 bit data capture cards;
Motor braking analogue system, its one end is connected with described 16 bit data capture card communications, the other end respectively with described gating device, by being connected with described gating device both-way communication after described dynamic torsion module;
Waveform generator, its one end is connected with the output terminal of described 16 bit data capture cards, and the other end is connected with described gating device communication;
Rotating speed, pass acquires module and current acquisition module, be the input end that output terminal connects described 16 bit data capture cards respectively, the other end is connected with described gating device communication;
Lan network PORT COM, Pulse Width Control card, be that one end is connected with described CPU communication respectively, the other end is connected with described gating device both-way communication.
2. the test macro of door control system as claimed in claim 1, it is characterized in that, described CPU is industrial computer.
3. the test macro of door control system as claimed in claim 2, it is characterized in that, described digital I/O card is 96 passage digital I/O card.
4. the test macro of door control system as claimed in claim 3, is characterized in that, described IO isolator is high speed 32 passage Digital I/O isolators.
5. a method of testing for door control system, is characterized in that, comprises the following steps:
Gating device reference record is project document by step 1), and is loaded in emulation test system;
Step 2) select the project needing emulation;
Step 3) resolves the parameter of described project;
Step 4) starts to perform emulation;
Step 5) reduction gating device IO action sequence, load step 2 simultaneously) in the project chosen;
Step 6) judges whether the parameter of the project chosen equals predetermined target value, if be greater than predetermined target value, then reduces the parameter of this project; If be less than predetermined target value, then increase the parameter of this project, until the parameter of this project equals predetermined target value; When the parameter of this project equals desired value, continue;
Step 7) judges output current wave whether within the scope of current waveform ripple cover, if output current wave is within the scope of current waveform ripple cover, then continues, otherwise test crash;
Step 8) judges to export digital waveform whether within the scope of voltage waveform ripple cover, if export digital waveform within the scope of voltage waveform ripple cover, then test is passed through, otherwise test crash;
Described step 5) is preserved to the test record uploading data storehouse of step 8) by step 9).
6. the method for testing of door control system as claimed in claim 5, is characterized in that, described step 2) in project comprise the IO temporal and logic relation of rotating speed, resistance, torsion, inertia, momentum, emulation test system.
7. the method for testing of door control system as claimed in claim 6, is characterized in that, when described step 2) in selected item be rotating speed, the predetermined target value of described step 5) medium speed is 0-5000 revolution per second; When described step 2) in selected item be resistance, in described step 5), the predetermined target value of resistance is 30-200N; When described step 2) in selected item be torsion, in described step 5), the predetermined target value of torsion is 0-20Nm; When described step 2) in selected item be inertia, in described step 5), the predetermined target value of inertia is 50-200kgm2; When described step 2) in selected item be momentum, in described step 5), the predetermined target value of momentum is 5-50kgm/s, when described step 2) in selected item be the IO temporal and logic relation of emulation test system, in described step 5), the predetermined target value of the IO temporal and logic relation of emulation test system is the sampling rate within 2 minutes is the digital waveform of 1kHz.
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| CN201510821924.2A CN105487522A (en) | 2015-11-24 | 2015-11-24 | Test system and method of gate control system |
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| CN201510821924.2A CN105487522A (en) | 2015-11-24 | 2015-11-24 | Test system and method of gate control system |
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Application publication date: 20160413 |