CN105467176A - A double layer floating type high density connector - Google Patents

A double layer floating type high density connector Download PDF

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Publication number
CN105467176A
CN105467176A CN201510917655.XA CN201510917655A CN105467176A CN 105467176 A CN105467176 A CN 105467176A CN 201510917655 A CN201510917655 A CN 201510917655A CN 105467176 A CN105467176 A CN 105467176A
Authority
CN
China
Prior art keywords
plate
needle
floating
density connector
floating type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510917655.XA
Other languages
Chinese (zh)
Inventor
宋瑄
陈国梁
裴中伟
张磊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sifo Technology (snd) Co Ltd
Original Assignee
Sifo Technology (snd) Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sifo Technology (snd) Co Ltd filed Critical Sifo Technology (snd) Co Ltd
Priority to CN201510917655.XA priority Critical patent/CN105467176A/en
Publication of CN105467176A publication Critical patent/CN105467176A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00Component parts of measuring arrangements not specially adapted for a specific variable
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06705Apparatus for holding or moving single probes

Abstract

The invention relates to a double layer floating type high density connector comprising a fixing seat and a pin bearing plate arranged on the fixing seat. The two sides of the pin bearing plate are provided with probe space limiting plates. A floating support plate is arranged between the two probe space limiting plates. The fixing seat in the invention comprises several upper fixing plates and lower fixing plates which are connected by return springs. The two sides of each lower fixing plate are vertically connected with guide pillars. The double layer floating type high density connector of the invention is precise in positioning, and can substantially prolong the test service life of double-end pins. In a test process of products, the yield rate can be raised radically; influences by maloperation can be reduced; and simultaneously, the rate of incorrect testing can be lowered.

Description

Double-deck floating type high-density connector
Technical field
The present invention relates to high-density connector double-ended needle test manufacture field, particularly relate to a kind of double-deck floating type high-density connector.
Background technology
Current, when high-density connector uses double-ended needle to test, bore on needle plate often and beat stepped hole, probe inserts needle plate, and this needle plate is referred to as to carry a needle plate; Carry below needle plate and be referred to as probe limiting plate with the plate of the next spacing probe of stepped hole form; Bore the float plate of punching hole to be compressed by stage clip control lifting with surface, probe in floating plate hole without interfere through, this float plate is referred to as floating support plate; Control the mode of the drift error of floating support plate with (or other counter structures) position limiting structure carrying needle plate, there is following defect:
When 1, considering that double-ended needle backshank is thinner (during about 0.1mm), the stepped hole of probe limiting plate is not easily processed, difficult processing, detects the problems such as difficult;
2, utilize contour structures spacing, positioning error is large, and machining precision Consideration is more, and operational wear should not clean, and hinders support plate lifting of floating, time serious, floating support plate can be made to depart from, cause grinding probe, finally cause broken needle;
3, detent mechanism is too single, does not have structure to float, and cause test inaccurate, time serious, mechanism scraps.
Because above-mentioned defect, the design people, actively in addition research and innovation, to founding a kind of double-deck floating type high-density connector, make it have more value in industry.
Summary of the invention
For solving the problems of the technologies described above, the object of this invention is to provide a kind of can precise positioning, probe long service life, the high floating type high-density connector of bilayer of test yield.
The floating type high-density connector of bilayer of the present invention, comprises
-holder: described holder comprises the upper mounted plate and bottom plate that are connected by some back-moving springs, described bottom plate both sides are vertically connected with guide pillar;
-carry needle plate, within described year, needle plate is fixed on described bottom plate;
-probe limiting plate, described probe limiting plate is arranged on described year needle plate both sides;
-be arranged on floating support plate described in two between probe limiting plate, be connected with stage clip between described year needle plate and described floating support plate.
Further, some floating screws be punctured in described year needle plate are connected with between fixed plate and described bottom plate.
Further, fixed plate be also connected with some contour screws corresponding with each described back-moving spring respectively between bottom plate.
By such scheme, the floating type high-density connector of bilayer of the present invention can precise positioning, greatly can improve the test serviceable life of double-ended needle, in the test process of product, fundamentally can improve yield, reduce maloperation to the impact of probe, reduce false failure rate simultaneously.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, coordinates accompanying drawing to be described in detail as follows below with preferred embodiment of the present invention.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples for illustration of the present invention, but are not used for limiting the scope of the invention.
See Fig. 1, the double-deck floating type high-density connector of the one described in a preferred embodiment of the present invention, comprises
-holder: holder comprises the upper mounted plate 11 and bottom plate 12 that are connected by some back-moving springs 13, and both sides are vertically connected with guide pillar 14 to bottom plate 12;
-carry needle plate 20, carry needle plate 20 and be fixed on bottom plate 12;
-probe limiting plate 30, probe limiting plate 30 is arranged on and carries on needle plate 20 both sides;
-be arranged on floating support plate 40 between two probe limiting plates 30, be connected with stage clip 50 between needle plate 20 and floating support plate 40 carrying.
Visible, the holder in the present invention is double-deck floating type structure, and floating type holder arranges two guide pillars 14, guarantees to be fixed on bottom plate 12 carries needle plate 20 under the guiding of two guide pillars 14, is freely elevated, reduction grinding.
For preventing carrying needle plate 20 in the guiding process of guide pillar 14, press down with floating support plate 40 problem departed from because operation unbalance stress causes carrying needle plate 20, the present invention is also connected with some contour screws 70 corresponding with each back-moving spring 13 respectively between upper mounted plate 11 with bottom plate 12, concrete, the present invention is provided with four back-moving springs 13 and four contour screws 70, contour screw 70 not only plays vertically-guided effect to back-moving spring 13, negative function can also be played to the reacting force of back-moving spring 13, play the effect of auxiliary guiding simultaneously.
Under the stressed decline of upper mounted plate 11, ballast needle plate 20 and the process of floating support plate 40 are that one-level is floated, and realize precise positioning.
Further, the present invention is connected with some floating screws 60 be punctured in year needle plate 20 between upper mounted plate 11 and bottom plate 12.Specifically carrying needle plate 20 and between upper mounted plate 11 and bottom plate 12, adding four contour floating screws 60, floating screw 60 can play floating correcting effect to carrying needle plate 20 with floating support plate 40, to overcome the error between tested materials and parts, improve test yield.
When holder continues to press down, to make to carry the process that contacts with floating support plate 40 of needle plate 20 be that secondary is floating, eating on needle stroke, while ensureing the depth of parallelism that floating support plate 40 is elevated, reducing and eat needle stroke more than 40%, reduce the probability of broken needle from origin, increase yield.When holder covers certain one stroke in the vertical direction along guide pillar 14, flip flop equipment 80 will carry needle plate 20 to be pushed open, by the effect of floating screw 60, now probe limiting plate 30 removes the restriction to floating support plate 40 vertical direction, make to carry needle plate 20 can to float in XY direction with floating support plate 40, ensure that the accuracy of test.
Utilize probe limiting plate 30 and each floating screw 60 to carry out the spacing of vertical direction to floating support plate 40 in the present invention, and year needle plate 20 can be floated in XY direction with floating support plate 40, utilize secondary relocation mechanism, ensure that the accuracy of test; Utilize two guide pillars 14 to realize accurate guide-localization with contour screw 70, can weaken the dispersancy of back-moving spring 13 simultaneously, avoid that floating support plate 40 departs from, probe wearing and tearing, ensure that the serviceable life of probe.
The above is only the preferred embodiment of the present invention; be not limited to the present invention; should be understood that; for those skilled in the art; under the prerequisite not departing from the technology of the present invention principle; can also make some improvement and modification, these improve and modification also should be considered as protection scope of the present invention.

Claims (3)

1. the floating type high-density connector of bilayer, is characterized in that: comprise
-holder: described holder comprises the upper mounted plate and bottom plate that are connected by some back-moving springs, described bottom plate both sides are vertically connected with guide pillar;
-carry needle plate, within described year, needle plate is fixed on described bottom plate;
-probe limiting plate, described probe limiting plate is arranged on described year needle plate both sides;
-be arranged on floating support plate described in two between probe limiting plate, be connected with stage clip between described year needle plate and described floating support plate.
2. the floating type high-density connector of bilayer according to claim 1, is characterized in that: be connected with some floating screws be punctured in described year needle plate between fixed plate and described bottom plate.
3. the floating type high-density connector of bilayer according to claim 1, is characterized in that: fixed plate be also connected with some contour screws corresponding with each described back-moving spring respectively between bottom plate.
CN201510917655.XA 2015-12-10 2015-12-10 A double layer floating type high density connector Pending CN105467176A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510917655.XA CN105467176A (en) 2015-12-10 2015-12-10 A double layer floating type high density connector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510917655.XA CN105467176A (en) 2015-12-10 2015-12-10 A double layer floating type high density connector

Publications (1)

Publication Number Publication Date
CN105467176A true CN105467176A (en) 2016-04-06

Family

ID=55605099

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510917655.XA Pending CN105467176A (en) 2015-12-10 2015-12-10 A double layer floating type high density connector

Country Status (1)

Country Link
CN (1) CN105467176A (en)

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1995014314A1 (en) * 1993-11-16 1995-05-26 Formfactor, Inc. Contact structure for interconnections, interposer, semiconductor assembly and method
CN2804877Y (en) * 2005-02-22 2006-08-09 郑进财 Improvements for measuring means for testing use
CN201016994Y (en) * 2007-03-30 2008-02-06 天津光电新雨电子通信设备有限公司 PCB testing jig
CN101178428A (en) * 2006-11-10 2008-05-14 株式会社友华 Relay connector
CN202837345U (en) * 2012-10-17 2013-03-27 苏州工业园区世纪福科技有限公司 Novel in circuit test (ICT) fixture
CN202836600U (en) * 2012-10-25 2013-03-27 苏州工业园区世纪福科技有限公司 Double-ended probe test device for high-density connectors
CN203422394U (en) * 2013-06-26 2014-02-05 陈妙妙 FPC connector
CN203630166U (en) * 2013-12-06 2014-06-04 珠海市运泰利自动化设备有限公司 Testing clamp
CN203965580U (en) * 2013-12-23 2014-11-26 苏州路之遥科技股份有限公司 A kind of ICT measurement jig for detection of circuit board plug connector
CN104391138A (en) * 2014-11-05 2015-03-04 中山市智牛电子有限公司 Buffer structure of stage pressing plate
CN204595020U (en) * 2015-03-13 2015-08-26 苏州欧菲特电子技术研发有限公司 Automatically upspring, self-locking and on push away floating mechanism for testing
CN205333698U (en) * 2015-12-10 2016-06-22 苏州世纪福智能装备股份有限公司 Double -deck floating high -density connector

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1995014314A1 (en) * 1993-11-16 1995-05-26 Formfactor, Inc. Contact structure for interconnections, interposer, semiconductor assembly and method
CN2804877Y (en) * 2005-02-22 2006-08-09 郑进财 Improvements for measuring means for testing use
CN101178428A (en) * 2006-11-10 2008-05-14 株式会社友华 Relay connector
CN201016994Y (en) * 2007-03-30 2008-02-06 天津光电新雨电子通信设备有限公司 PCB testing jig
CN202837345U (en) * 2012-10-17 2013-03-27 苏州工业园区世纪福科技有限公司 Novel in circuit test (ICT) fixture
CN202836600U (en) * 2012-10-25 2013-03-27 苏州工业园区世纪福科技有限公司 Double-ended probe test device for high-density connectors
CN203422394U (en) * 2013-06-26 2014-02-05 陈妙妙 FPC connector
CN203630166U (en) * 2013-12-06 2014-06-04 珠海市运泰利自动化设备有限公司 Testing clamp
CN203965580U (en) * 2013-12-23 2014-11-26 苏州路之遥科技股份有限公司 A kind of ICT measurement jig for detection of circuit board plug connector
CN104391138A (en) * 2014-11-05 2015-03-04 中山市智牛电子有限公司 Buffer structure of stage pressing plate
CN204595020U (en) * 2015-03-13 2015-08-26 苏州欧菲特电子技术研发有限公司 Automatically upspring, self-locking and on push away floating mechanism for testing
CN205333698U (en) * 2015-12-10 2016-06-22 苏州世纪福智能装备股份有限公司 Double -deck floating high -density connector

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Application publication date: 20160406

RJ01 Rejection of invention patent application after publication