CN106291190A - Pin test structure under ZIF connector - Google Patents
Pin test structure under ZIF connector Download PDFInfo
- Publication number
- CN106291190A CN106291190A CN201610673357.5A CN201610673357A CN106291190A CN 106291190 A CN106291190 A CN 106291190A CN 201610673357 A CN201610673357 A CN 201610673357A CN 106291190 A CN106291190 A CN 106291190A
- Authority
- CN
- China
- Prior art keywords
- pin
- pin block
- zif connector
- needle cover
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 57
- 239000000523 sample Substances 0.000 claims abstract description 36
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 238000010276 construction Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 7
- 238000006073 displacement reaction Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- 238000005474 detonation Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a kind of simple in construction, testing efficiency height, low cost and pin test structure under the ZIF connector that product test automatization requires can be met.The present invention includes pcb board (1), pin block (2), needle cover (3), at least two springs (4) and pin block fix seat (5), pin block (2) is fixedly installed some probes (6), needle cover is provided with and passes for probe and the pin hole (31) consistent with the number of probe, the lower end of spring is fixed on pin block, upper end withstands on the downside of needle cover, boss (32) it is additionally provided with in needle cover, fix to be provided with on seat at pin block and push up friction tight chuck (51) mutually with boss (32), pcb board and pin block all fix with pin block that seat is fixing to be connected, on pin block, some probes shift to install, probe to arrange position corresponding with at the crest of the PIN on ZIF connector to be measured.Present invention can apply to test apparatus field.
Description
Technical field
The present invention relates to test apparatus field, particularly relate to pin test structure under a kind of ZIF connector.
Background technology
At present ZIF connector due to the width of PIN the least, bandpass only has 0.08mm, and PIN and PIN it
Between distance the least, usually 0.175mm, so using the mode of lower pin test to there is the biggest difficulty.Existing fixture
Test ZIF connector main method be use artificial insert row line mode test, but the test mode of insert row line exist with
Under several shortcomings:
1, the proportion of goods damageds of winding displacement are the highest, need often to change winding displacement, cause cost to increase；
2, work efficiency is extremely low: owing to insert row line is by manually carrying out, take time and effort, and winding displacement is inserted and not in place can be affected test passes
Rate；
3, output bas line test request can not be met.
Summary of the invention
The technical problem to be solved is to overcome the deficiencies in the prior art, it is provided that a kind of simple in construction, test effect
Rate is high, low cost and can meet pin test structure under the ZIF connector that product test automatization requires.
The technical solution adopted in the present invention is: the present invention includes pcb board, pin block, needle cover, at least two springs and pin block
Fixing seat, is fixedly installed some probes on described pin block, described needle cover is provided with for described probe through and with institute
Stating the pin hole that the number of probe is consistent, the lower end of described spring is fixed on described pin block, and upper end withstands on the downside of described needle cover
On face, described needle cover is additionally provided with boss, fixes to be provided with on seat at described pin block and push up friction tight card mutually with described boss
Platform, described pcb board and described pin block all fix with described pin block that seat is fixing to be connected, on described pin block, and some described probes mistake
Position is arranged, described probe to arrange position corresponding with at the crest of the PIN on ZIF connector to be measured.
Such scheme is visible, and probe is shifted to install on pin block by the present invention, and it arranges position and is connected with ZIF to be measured
At the crest of the PIN on device corresponding, and the distance at the crest of two of the arbitrary neighborhood on ZIF connector PIN is
Farthest, and mutually stagger, so that will not contact with adjacent PIN during pin under probe, it is to avoid cause PIN and PIN
Short circuit between foot, it is ensured that the effectiveness of test and high efficiency.It addition, use the structure of the present invention to carry out ZIF connector test, its
Can be used for automatically testing in automation equipment, the requirement of product test automatization can be met, insert row artificial with existing employing
The mode of line is compared, and it reduces greatly artificial input, and its cost of labor greatly reduces.Between pin block and needle cover
Arranging spring makes both mutually exclusive, and in needle cover arrange boss and pin block fix on seat arrange chuck mutually push up
Tightly, when not carrying out ZIF connector test, the boss in needle cover holds out against the chuck fixing seat at pin block under spring force
On, and now the upper end of probe be hidden in needle cover, will not expose on needle cover, thus probe is well protected
Protect；When carry out ZIF connector test time, ZIF connector is pressed in needle cover, and needle cover is pressed down, until probe expose needle cover it
Go up and hold out against at the crest of the PIN of ZIF connector to be measured, thus stably ZIF connector is tested, it is ensured that survey
Examination qualification rate and testing efficiency.
Further, the upper surface of described needle cover is provided with the test trough suitable with ZIF connector to be measured, institute
State pin hole and expose in described test trough, the edge of described test trough is provided with fillet surface.
Such scheme is visible, and the fillet surface that test trough and test trough edge are arranged enables to ZIF to be measured even
Connecing device can para-position and importing well when testing, it is ensured that accuracy that test connects and the high efficiency of test.
Yet further, the lower end of described probe is fixing with described pcb board to be connected, the upper surface square crossing of described probe
It is provided with inverted triangle groove, in the formation contact, junction of two adjacent triangular grooves.
Such scheme is visible, test contact one end of probe is configured with the structure of multiple contact, it is ensured that connect
Reliability, thus ensure that being smoothed out of test.
The most further, described pin block fix be additionally provided with on seat location hole, hole, described location and contour screw phase
Coordinate.
Such scheme is visible, to match with hole, location by contour screw, and when installing, whole pin block module is
Float, when carrying out product test, each product there may be several different adapters, different adapters
There is certain height tolerance in paster, uses the pin block modular structure that the present invention floats, it is possible to meets various connections well
The test of device.
The most further, the number of described spring is set to four, and four described springs are in the surrounding of described pin block
It is uniformly distributed.
Such scheme is visible, uses four springs and is uniformly distributed setting in the surrounding of pin block, which ensure that being subject to of needle cover
Power is uniform, and needle cover will not offset, and then ensure that the service life of probe and being smoothed out of test.
Accompanying drawing explanation
Fig. 1 is the easy structure schematic diagram of the positive angle of the described present invention；
Fig. 2 is the simple schematic diagram of detonation configuration at the present invention the first visual angle；
Fig. 3 is the simple schematic diagram of detonation configuration at the present invention the second visual angle；
Fig. 4 is the simple schematic diagram of sectional structure of the present invention；
Fig. 5 is the easy structure schematic diagram of described probe；
Fig. 6 is the easy structure schematic diagram of the PIN part of described ZIF connector；
Fig. 7 is the easy structure schematic diagram that the pin hole in described needle cover projects to ZIF connector.
Detailed description of the invention
As shown in Figures 1 to 7, the present invention includes that pcb board 1, pin block 2,3, at least two springs 4 of needle cover and pin block fix seat
5.Being provided with alignment pin 11 on the downside of described pin block 2, the setting of alignment pin 11 is easy for can be quick when pcb board is installed
Location, ground.Described pin block 2 is fixedly installed some probes 6, described needle cover 3 is provided with for described probe 6 through and
The pin hole 31 consistent with the number of described probe 6.For different ZIF connector to be measured 8, in the number of probes of pin block and needle cover
Pin hole number be arranged to consistent with the PIN number of ZIF connector 8 to be measured.Therefore for the ZIF connector of different batches,
If more needle exchange block and its corresponding needle cover.The lower end of described spring 4 is fixed on described pin block 2, and upper end withstands on institute
State on the downside of needle cover 3.The number of described spring 4 is set to four, and four described springs 4 are equal in the surrounding of described pin block 2
Even distribution.It is additionally provided with boss 32 in described needle cover 3, fixes to be provided with on seat 5 holding out against with described boss 32 phase at described pin block
The chuck 51 coordinated.Described pcb board 1 and described pin block 2 all fix with described pin block that seat 5 is fixing to be connected.On described pin block 2,
Described probe 6 shifts to install, described probe 6 to arrange position relative with at the crest of the PIN on ZIF connector to be measured 7
Should.
The upper surface of described needle cover 3 is provided with the test trough 33 suitable with ZIF connector to be measured, described pin hole
31 expose in described test trough 33, and the edge of described test trough 33 is provided with fillet surface 34.Setting of fillet surface 34
Put so that ZIF connector to be measured can para-position and importing well when testing, it is ensured that the accuracy that test connects
High efficiency with test.The lower end of described probe 6 is fixing with described pcb board 1 to be connected, the upper surface square crossing of described probe 6
It is provided with inverted triangle groove 61, in the formation contact, junction 62 of two adjacent triangular grooves 61.PIN due to ZIF connector
Smaller, use the floricome structure with multiple contact can guarantee that probe is effective with the connection of PIN well.Described
Pin block is fixed and is additionally provided with hole 52, location on seat 5, matches with contour screw in hole, described location 52.Come with fixed by contour screw
Matching in hole, position, when installing, whole pin block module is to float；When carrying out product test, may on each product
There are several different adapters, there is certain height tolerance in the paster of different adapters, uses the present invention to float
Pin block modular structure, it is possible to meet test to various adapters well.It addition, use the purpose of contour screw to be to ensure that
Pin block module has certain activeness, thus ensures pin block module and adapter automatic aligning.
Present invention uses directly in the mode of the upper and lower pin of ZIF connector, solve the survey in the past using artificial insert row line
Examination mode, It greatly reduces cost of labor, makes whole pin block module be applicable to output bas line requirement, improves work effect
Rate, its stable testing, measuring accuracy is high, and test percent of pass is high；And compact conformation, simple, assembling maintaining is easy to operate.
Present invention can apply to test apparatus field.
Claims (5)
1. under a ZIF connector pin test structure, it is characterised in that: described test structure include pcb board (1), pin block (2),
Needle cover (3), at least two springs (4) and pin block fix seat (5), are fixedly installed some probes (6) on described pin block (2),
Described needle cover (3) is provided with and passes for described probe (6) and the pin hole (31) consistent with the number of described probe (6), institute
The lower end stating spring (4) is fixed on described pin block (2), and upper end withstands on the downside of described needle cover (3), described needle cover (3)
On be additionally provided with boss (32), fix to be provided with on seat (5) at described pin block and push up friction tight chuck mutually with described boss (32)
(51), described pcb board (1) and described pin block (2) all fix with described pin block that seat (5) is fixing to be connected, on described pin block (2),
Some described probes (6) shift to install, the crest arranging position and the PIN on ZIF connector to be measured of described probe (6)
Locate corresponding.
Pin test structure under ZIF connector the most according to claim 1, it is characterised in that: in the upper end of described needle cover (3)
Being provided with the test trough (33) suitable with ZIF connector to be measured on face, described pin hole (31) exposes in described test trough
(33), on, the edge of described test trough (33) is provided with fillet surface (34).
Under ZIF connector the most according to claim 1 pin test structure, it is characterised in that: the lower end of described probe (6) with
Described pcb board (1) is fixing to be connected, and the upper surface square crossing of described probe (6) is provided with inverted triangle groove (61), adjacent two
The formation contact, junction (62) of individual triangular groove (61).
Pin test structure under ZIF connector the most according to claim 1, it is characterised in that: fix seat (5) at described pin block
On be additionally provided with location hole (52), match with contour screw in hole, described location (52).
5. according to pin test structure under the ZIF connector described in any one of Claims 1-4, it is characterised in that: described spring
(4) number is set to four, and four described springs (4) are uniformly distributed in the surrounding of described pin block (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610673357.5A CN106291190B (en) | 2016-08-16 | 2016-08-16 | ZIF connector lower needle test structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610673357.5A CN106291190B (en) | 2016-08-16 | 2016-08-16 | ZIF connector lower needle test structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106291190A true CN106291190A (en) | 2017-01-04 |
| CN106291190B CN106291190B (en) | 2023-07-25 |
Family
ID=57671759
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610673357.5A Active CN106291190B (en) | 2016-08-16 | 2016-08-16 | ZIF connector lower needle test structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106291190B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108680774A (en) * | 2018-07-18 | 2018-10-19 | 珠海市运泰利自动化设备有限公司 | ZIF winding displacements first turn over rear hidden visual interlocking fool-proof mechanism |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202133690U (en) * | 2011-05-23 | 2012-02-01 | 家原探针工业有限公司 | Improved Probe Probe |
| CN202256408U (en) * | 2011-10-27 | 2012-05-30 | 纬创资通股份有限公司 | probe |
| CN203117235U (en) * | 2013-01-09 | 2013-08-07 | 矽品科技（苏州）有限公司 | Test probe |
| CN203786157U (en) * | 2014-03-26 | 2014-08-20 | 深圳市明信测试设备有限公司 | Conversion device for PCB connector test |
| CN203838194U (en) * | 2014-04-28 | 2014-09-17 | 昆山明创电子科技有限公司 | PCB board small needle testing tool |
| CN204230530U (en) * | 2014-07-01 | 2015-03-25 | 昆山恒睿测控软件有限公司 | Tapered relocation mechanism |
| CN204789649U (en) * | 2015-07-14 | 2015-11-18 | 珠海市运泰利自动化设备有限公司 | ZIF connector hypodermic needle surveys test panel |
| CN105467176A (en) * | 2015-12-10 | 2016-04-06 | 苏州世纪福智能装备股份有限公司 | A double layer floating type high density connector |
| CN105629151A (en) * | 2015-12-16 | 2016-06-01 | 珠海市运泰利自动化设备有限公司 | Precision test probe module set |
| CN205958669U (en) * | 2016-08-16 | 2017-02-15 | 珠海市运泰利自动化设备有限公司 | ZIF connector hypodermic needle tests structure |
-
2016
- 2016-08-16 CN CN201610673357.5A patent/CN106291190B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202133690U (en) * | 2011-05-23 | 2012-02-01 | 家原探针工业有限公司 | Improved Probe Probe |
| CN202256408U (en) * | 2011-10-27 | 2012-05-30 | 纬创资通股份有限公司 | probe |
| CN203117235U (en) * | 2013-01-09 | 2013-08-07 | 矽品科技（苏州）有限公司 | Test probe |
| CN203786157U (en) * | 2014-03-26 | 2014-08-20 | 深圳市明信测试设备有限公司 | Conversion device for PCB connector test |
| CN203838194U (en) * | 2014-04-28 | 2014-09-17 | 昆山明创电子科技有限公司 | PCB board small needle testing tool |
| CN204230530U (en) * | 2014-07-01 | 2015-03-25 | 昆山恒睿测控软件有限公司 | Tapered relocation mechanism |
| CN204789649U (en) * | 2015-07-14 | 2015-11-18 | 珠海市运泰利自动化设备有限公司 | ZIF connector hypodermic needle surveys test panel |
| CN105467176A (en) * | 2015-12-10 | 2016-04-06 | 苏州世纪福智能装备股份有限公司 | A double layer floating type high density connector |
| CN105629151A (en) * | 2015-12-16 | 2016-06-01 | 珠海市运泰利自动化设备有限公司 | Precision test probe module set |
| CN205958669U (en) * | 2016-08-16 | 2017-02-15 | 珠海市运泰利自动化设备有限公司 | ZIF connector hypodermic needle tests structure |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108680774A (en) * | 2018-07-18 | 2018-10-19 | 珠海市运泰利自动化设备有限公司 | ZIF winding displacements first turn over rear hidden visual interlocking fool-proof mechanism |
| CN108680774B (en) * | 2018-07-18 | 2024-02-13 | 珠海市运泰利自动化设备有限公司 | ZIF flat cable turns over earlier and then hidden visual interlocking prevents slow-witted mechanism |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106291190B (en) | 2023-07-25 |
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