CN105466603A - An automatic calibration method for temperature measurement by a thermometer, a temperature measurement probe and a thermometer - Google Patents
An automatic calibration method for temperature measurement by a thermometer, a temperature measurement probe and a thermometer Download PDFInfo
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- CN105466603A CN105466603A CN201510895997.6A CN201510895997A CN105466603A CN 105466603 A CN105466603 A CN 105466603A CN 201510895997 A CN201510895997 A CN 201510895997A CN 105466603 A CN105466603 A CN 105466603A
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Abstract
The embodiment of the invention discloses a temperature calibration method, a probe and a temperature measurement apparatus, and relates to the technical field of temperature measurement. The above method comprises the following steps: preset information stored in the temperature measurement apparatus is obtained in advance, and calibration of the temperature measured by the probe is carried out according to the preset information. Temperature measurement is carried out through application of the scheme provided by the embodiment of the invention to ensure each thermometer probe to undergo customized calibration so as to raise the accuracy of temperature measurement.
Description
Technical field
The present invention relates to technical field of temperature measurement, particularly a kind of automatic calibrating method of measuring tempeature of thermometer, temperature probe and thermometer.
Background technology
In recent years, along with the development of technology, utilize the electronic thermometer of electronic technology measuring tempeature to arise at the historic moment, replace mercury thermometer gradually, electronic thermometer obtains the trust of user day by day, becomes indispensable health, medical necessary article in hospital or general family gradually.But, because the various viral species of today are various, germ is omnipresent, user is in hospital or improve too the requirement of sanitary condition at home, while people are desirably in and can obtain accurate body temperature measurement, also expect can have exclusivity to the use of thermometer, not mixed with other people, to guarantee not by the pollution of other infectors.Secondly, due to the difference of measuring object, single thermometer probe is often difficult to meet different measurement environment, and the thermometer buying number of different types can increase the weight of burden economically.
For this reason, the existing thermometer being proposed probe in the art and can changing.For replaceable probe, producer pursues the consistance of device usually, thus when changing probe, reduces the error of the temperature measurement result brought because of the individual difference of temperature sensor as far as possible.But this is also inadequate, because can only guarantee in statistical significance that most temperature sensor is when being employed into thermometer to the consistance of the devices such as temperature sensor, the thermometric error brought is positioned within controlled range, can not ensure that the temperature characterisitic of each temperature sensor is measured and calibrate.Meanwhile, thermometer probe, because the difference of conductor length, welding position shape, sensor individuals attribute, all can cause the difference of whole probe on electric conductivity, thus the measuring error causing different probes to obtain after inserting identical main control part is different.The error that the uncertainty of the resistance in the resistance that long lead brings and whole piece circuit is brought, can be reflected in final temperature measurement result.
Summary of the invention
The uncontrollable problem of consistance for above-mentioned device, the embodiment of the invention discloses a kind of temperature correction method, probe and temperature measuring equipment, guarantees that each thermometer probe can obtain the calibration customized.
For achieving the above object, the embodiment of the invention discloses a kind of temperature correction method, described method comprises:
Obtain the presupposed information be stored in advance in temperature measuring equipment probe;
According to described presupposed information, the temperature by described probe measurement is calibrated.
In a kind of specific implementation of the present invention, described presupposed information is the number information of described probe.
In a kind of specific implementation of the present invention, described according to described presupposed information, the temperature by described probe measurement is calibrated, comprising:
Search the calibration information corresponding with the number information of described probe;
According to described calibration information, the temperature by described probe measurement is calibrated.
In a kind of specific implementation of the present invention, described presupposed information is and the described calibration information mated of popping one's head in.
In a kind of specific implementation of the present invention, described according to described presupposed information, the temperature by described probe measurement is calibrated, comprising:
The calibration information stored in the described probe of direct reading; And
According to described calibration information, the temperature by described probe measurement is calibrated.
In a kind of specific implementation of the present invention, described calibration information is: the calibrated resistance value of described probe and/or the compensating parameter of described probe.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
The resistance value of the described probe measured is deducted described calibrated resistance value, as the first resistance value of described probe;
According to described first resistance value, calculate the temperature value that described probe measurement arrives.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
The resistance value of the described probe measured is multiplied by described compensating parameter, as the second resistance value of described probe;
According to described second resistance value, calculate the temperature value that described probe measurement arrives.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
The resistance value of the described probe measured is deducted described calibrated resistance value, as the 3rd resistance value of described probe
The resistance value of the described probe measured is multiplied by described compensating parameter, as the 4th resistance value of described probe;
By described 3rd resistance value and the 4th resistance value sum divided by two, obtain the 5th resistance value;
According to described 5th resistance value, calculate the temperature value that described probe measurement arrives.
In a kind of specific implementation of the present invention, described calibration information is the calibration curve parameter of described temperature measuring equipment.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
The temperature correction curve containing resistance-vs. temperature is built according to described calibration curve parameter;
Based on resistance value and the described temperature correction curve of the described probe measured, obtain the measuring tempeature of described temperature measuring equipment.
In a kind of specific implementation of the present invention, described in search the calibration information corresponding with the number information of described probe, comprising:
The number information of the described probe obtained is sent to inquiry end by described temperature measuring equipment; And
The calibration information corresponding with the number information of described probe is received from described inquiry termination.
In a kind of specific implementation of the present invention, the number information of the described probe obtained is sent to inquiry end by described temperature measuring equipment, comprising:
Described temperature measuring equipment sets up communication link with inquiry end in a wired or wireless fashion;
By described communication link, the number information of described probe is sent to described inquiry end.
In a kind of specific implementation of the present invention, described inquiry end is mobile phone.
In a kind of specific implementation of the present invention, before described acquisition is stored in advance in the presupposed information in temperature measuring equipment probe, described method also comprises:
Obtain multiple temperature-resistance Value Datas pair of described temperature measuring equipment;
Based on described multiple temperature-resistance Value Data to the temperature correction curve obtaining described temperature measuring equipment; And
The parameter information relevant to described temperature correction curve is stored in the probe of described temperature measuring equipment as presupposed information.
For achieving the above object, the embodiment of the invention discloses a kind of probe, for temperature measuring equipment, described probe comprises:
Temperature sensor, is connected to Plug Division by coupled circuit;
Storer, described storer stores presupposed information, and described presupposed information corresponds to the electrical properties of described coupled circuit and described temperature sensor.
In a kind of specific implementation of the present invention, described presupposed information is the number information of described probe.
In a kind of specific implementation of the present invention, described presupposed information is and the described calibration information mated of popping one's head in.
In a kind of specific implementation of the present invention, described calibration information is: the calibrated resistance value of described probe and/or the compensating parameter of described probe.
In a kind of specific implementation of the present invention, described calibration information is the calibration curve parameter of described temperature measuring equipment.
For achieving the above object, the embodiment of the invention discloses a kind of temperature measuring equipment, described temperature measuring equipment comprises:
Probe, is previously stored with presupposed information in described probe;
Main control part, described main control part is removably connected with described probe, and according to described presupposed information, calibrates the temperature by described probe measurement.
In a kind of specific implementation of the present invention, described presupposed information is the number information of described probe.
In a kind of specific implementation of the present invention, described according to described presupposed information, the temperature by described probe measurement is calibrated, comprising:
Described main control part searches the calibration information corresponding with the number information of described probe; And
Described main control part, according to described calibration information, is calibrated the temperature by described probe measurement.
In a kind of specific implementation of the present invention, described presupposed information is and the described calibration information mated of popping one's head in.
In a kind of specific implementation of the present invention, described according to described presupposed information, the temperature by described probe measurement is calibrated, comprising:
Described main control part directly reads the calibration information stored in described probe; And
Described main control part, according to described calibration information, is calibrated the temperature by described probe measurement.
In a kind of specific implementation of the present invention, described calibration information is: the calibrated resistance value of described probe and/or the compensating parameter of described probe.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
The resistance value of the described probe measured is deducted described calibrated resistance value by described main control part, as the first resistance value of described probe;
Described main control part, according to described first resistance value, calculates the temperature value that described probe measurement arrives.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
The resistance value of the described probe measured is multiplied by described compensating parameter by described main control part, as the second resistance value of described probe;
Described main control part, according to described second resistance value, calculates the temperature value that described probe measurement arrives.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
The resistance value of the described probe measured is deducted described calibrated resistance value by described main control part, as the 3rd resistance value of described probe
The resistance value of the described probe measured is multiplied by described compensating parameter by described main control part, as the 4th resistance value of described probe;
Described 3rd resistance value and the 4th resistance value sum divided by two, are obtained the 5th resistance value by described main control part;
Described main control part, according to described 5th resistance value, calculates the temperature value that described probe measurement arrives.
In a kind of specific implementation of the present invention, described probe is replaceable probe.
In a kind of specific implementation of the present invention, described main control part with described replaceable pop one's head in be connected time, read described presupposed information;
Judge whether described replaceable probe is the probe mated with described main control part based on described presupposed information.
In a kind of specific implementation of the present invention, when detect described can with when to change probe be the probe mated with described main control part, described main control part generates alert notification.
In a kind of specific implementation of the present invention, described calibration information is the calibration curve parameter of described temperature measuring equipment.
In a kind of specific implementation of the present invention, described according to described calibration information, the temperature by described probe measurement is calibrated, comprising:
Described main control part builds the temperature correction curve containing resistance-vs. temperature according to described calibration curve parameter;
Described main control part, based on the resistance value of the described probe measured and described temperature correction curve, obtains the measuring tempeature of described temperature measuring equipment.
In a kind of specific implementation of the present invention, described in search the calibration information corresponding with the number information of described probe, comprising:
The number information of the described probe obtained is sent to inquiry end by described main control part; And
Described main control part receives the calibration information corresponding with the number information of described probe from described inquiry termination.
In a kind of specific implementation of the present invention, the number information of the described probe obtained is sent to inquiry end by described main control part, comprising:
Described main control part sets up communication link with described inquiry end in a wired or wireless fashion;
The number information of described probe is sent to described inquiry end by described communication link by described main control part.
In a kind of specific implementation of the present invention, described inquiry end is mobile phone.
In a kind of specific implementation of the present invention, in described probe, prestore presupposed information, comprising:
Obtain multiple temperature-resistance Value Datas pair of described temperature measuring equipment;
Based on described multiple temperature-resistance Value Data to the temperature correction curve obtaining described temperature measuring equipment; And
The parameter information relevant to described temperature correction curve is stored in the probe of described temperature measuring equipment as presupposed information.
As seen from the above, in the scheme that the embodiment of the present invention provides, by storing through corrected presupposed information in advance in the probe of temperature measuring equipment, after described probe is correctly installed to described temperature measuring equipment, by described presupposed information, the correction parameter of described probe can be known, so that carry out the correction of probe measurement temperature according to correction parameter.According to the difference of probe kind, its information type stored is also different, is convenient to the producer like this and arranges control information according to the Production requirement of reality.By arranging dissimilar correction parameter, described temperature measuring equipment can adopt multiple correcting algorithm to compare correction to the temperature measured, and improves the accuracy of correcting algorithm.Known accordingly, the temperature correction scheme that the application embodiment of the present invention provides carries out temperature survey, significantly can overcome the thermometric error brought owing to changing temp probe, improve thermometric accuracy.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
The schematic diagram of a kind of temperature measuring equipment that Fig. 1 provides for the embodiment of the present invention;
The circuit connection diagram of a kind of temperature measuring equipment that Fig. 2 provides for the embodiment of the present invention;
The schematic diagram of the probe of a kind of temperature measuring equipment that Fig. 3 provides for the embodiment of the present invention;
A kind of temperature correction method flow diagram that Fig. 4 provides for the embodiment of the present invention;
The another kind of temperature correction method flow diagram that Fig. 5 provides for the embodiment of the present invention;
The another kind of temperature correction method temperature calibration curve schematic diagram that Fig. 6 provides for the embodiment of the present invention.
Embodiment
Be described below in conjunction with the accompanying drawing 1-6 in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
A kind of temperature measuring equipment that Fig. 1 provides for the embodiment of the present invention.This temperature measuring equipment comprises main control part 101 and replaceable probe 104.Main control part 101 is provided with display screen 102, thermometric electronic package is provided with in main control part 101, main control part 101 is provided with socket towards one end of replaceable probe 104, one end of replaceable probe 104 is provided with temperature sensor 106 and temperature survey 107, the other end is provided with plug 103, temperature sensor 106 and temperature survey 107 is connected, for the temperature of measuring tempeature measuring head 107 perception, be electrically connected by wire 105 between temperature sensor 106 with plug 103, plug 103 removably to insert in the socket 103 of main control part 101 and is electrically connected to thermometric electronic package 40.
The thermometric electronic package 40 of main control part 101 and inside thereof can adopt various structure well known in the art to realize, and can have various conventional components.Such as, main control part 101 can comprise switch, open switch when take temperature, closing switch when take temperature is complete.Main control part 101 can also comprise pilot lamp, this pilot lamp can according to the green and red two kinds of colors of the Temperature displaying of display screen 102, the temperature shown when display screen 102 can show green light lower than during preset temperature range, the temperature shown when display screen 102 can show red light higher than during preset temperature range, thus reminds user's temperature too high.Thermometric electronic package 40 can be designed as the combination of the various electronic components comprised needed for thermometric.These are that those skilled in the art can appropriate design, do not repeat them here.
Utilize temperature measuring equipment of the present invention, replaceable probe 104 is removable, can reuse main control part 101 to greatest extent like this.When measuring object (human body or animal body etc.) or position (oral cavity, oxter or rectum etc.) change, maybe when needs are to operations such as current feeler lever carry out disinfection, only replaceable probe 104 can be changed, housing can repeatedly use, and significantly can save cost like this.
In addition, temperature measuring equipment of the present invention can also comprise the plug detection means (not shown) be arranged in main control part 101.Like this, test plug whether can insert, insert situation about whether putting in place, main control part 101 is also provided with the insertion pilot lamp be connected with plug detection means.So convenient prompting user inserts situation.
Display screen 102 preferably OLED display screen.Current conventional temperature measurement mechanism display screen is all LED display, although can reading easily in real time, but LED display needs just can see registration under backlight condition, preferably OLED display screen is adopted for solving this shortcoming, it adopts the self-emissive light source that luminous organic material, DC low-voltage drive, response effect is fast, luminescence efficiency is high and angular field of view is wide, like this can convenient reading exactly, be that daytime or night are all practical.Replaceable probe 104 can be flexible at least partially.Like this, traditional clinical thermometer can be avoided to cause thermometric inaccurate because of not putting well when take temperature, flexible replaceable probe 104 can change the angle of replaceable probe 104 according to the situation at thermometric position, replaceable probe 104 can be allowed so fully to contact with thermometric position, and the body temperature of measurement is more accurate.
Main control part 101 can also comprise the wireless signal device for communicating with external devices.Such as, this wireless signal device can be Bluetooth communication equipment, as bluetooth 4.0 communication facilities.When the temperature measured exceedes predetermined value, the temperature registration of clinical thermometer display screen automatically can be sent to the external devices such as mobile phone or computer with announcement of warning by this wireless signal device, and person has a fever to illustrate thermometric, needs timely diagnosis and treatment.
Main control part 101 can also comprise gravity sensor or acceleration transducer, and this gravity sensor or acceleration transducer can be used to the sleep and the motion conditions that detect thermometric object.This situation may be displayed on display screen, and such user can find out current kinetic situation easily.Can not measure when moving, this avoid because thermometric object motion causes the inaccurate of thermometric.
Main control part 101 can also there is the charging inlet for charging.After testing a period of time, just charging inlet charges to temperature measuring equipment thus.
Temperature sensor 106 can adopt polytype heat sensitive sensor to realize, and such as PTC type thermal resistor and NTC are thermal resistors.Positive temperature coefficient thermistor (PTC) and negative tempperature coefficient thermistor is divided into according to temperature coefficient difference.PTC (PositiveTemperatureCoeffiCient) type thermal resistor at a certain temperature resistance sharply increases, has thermistor phenomenon or the material of positive temperature coefficient (PTC), the sintered body that this material is is principal ingredient with BaTiO3 or SrTiO3 or PbTiO3, the oxide such as Nb, Ta, Bi, Sb, Y, La wherein mixing trace carries out atomicity control and makes it semiconducting, often by materials such as the BaTiO3 of this semiconductor transformation referred to as partly leading (body) porcelain; Also add the oxide of Mn, Fe, Cu, Cr of increasing its positive temperature coefficient simultaneously and play the additive of other effects, adopt that general ceramic process is shaped, high temperature sintering and make metatitanic acid platinum etc. and solid solution semiconducting thereof, thus obtaining the thermistor material of positive characteristic, its temperature coefficient and Curie-point temperature change with component and sintering condition (especially chilling temperature) difference.NTC (NegativeTemperatureCoeffiCient) type thermal resistor is with the exponentially relation reduction of temperature rising resistance, thermistor phenomenon and the material with negative temperature coefficient.This material be utilize two or more the metal oxide such as manganese, copper, silicon, cobalt, iron, nickel, zinc fully to mix, the semiconductor ceramics of the technique such as shaping, sintering.NTC temperature-sensitive semiconductor is the oxide ceramics of spinel structure or other structures mostly, has negative temperature coefficient, and resistance value can approximate representation be:
RT＝RT0*EXP(Bn*(1/T-1/T0))
Resistance value when RT, RT0 are respectively temperature T, T0 in formula, Bn is material constant.
Fig. 2 illustrates the circuit composition of the typical radiation thermometer of such as clinical thermometer or common electron temperature equipment.This thermometer, comprises the probe 10 and temperature sensor 106 that may be used for determining target temperature.In an illustrated embodiment, probe 104 communicates with CPU (central processing unit) 202.Utilize various signal format, such as simulate or numeral, CPU (central processing unit) 202 and probe 104 alternatively via other communication link, such as can pass through wireless communication link.
Probe 104 comprises the temperature sensor 106 for measurement target, and user stores the first memory 203 of probe presupposed information, stores the presupposed information of probe 104 in which memory.In the embodiment shown in Figure 2, temperature sensor 106 communicates with CPU (central processing unit) 202 via respective lead-in wire with temperature variant resistor.Temperature sensor 106 communicates with A/D converter 205 via a passage, for measuring the different output voltages of thermoelectric element.Wherein, other signal regulating equipment and/or software also can be included in thermometer, such as gain-adjusted, bandpass filtering and buffering, as the skilled personnel can understand.
CPU (central processing unit) 202 also comprises memory means, for storing data, and the calibration factor of described data such as discussing in detail below.In shown example, memory means is divided into three parts: for the fast erasable ROM (read-only memory) (ROM) 207 of storage code, the second memory 206 of being correlated with for storing temperature correction data and the random access memory (RAM) 208 being used as working storage.Without departing from the present invention, other memory means can be increased.CPU (central processing unit) 202 also comprises the software 209 for storing the instruction of CPU (central processing unit) 202 operating temperature meter.In an example, this software component 209 is stored in ROM207.
According to another preferred embodiment, also disclose a kind of probe 104, the individual components that this probe 104 can be used as temperature measuring equipment uses, and see Fig. 3, probe 104 comprises: temperature sensor 106 and storer 108.
Temperature sensor 106 is connected by the plug 103 of coupled circuit with probe 104, plug 103 can be common communication connector, except the headset plug pattern shown in Fig. 3, can also be the connector of other common pattern such as USB, serial ports, so that carry out communications setting according to different application scenarioss.Coupled circuit, except comprising wire 105, can also comprise and connect the electrical part such as pad, circuit connector.
Except temperature sensor 106, be also provided with storer 108 in probe 104, storer 108 and plug 103 communicate to connect, and the main control part being convenient to temperature measuring equipment reads the presupposed information stored in storer 108 by plug 103.Based on this presupposed information, the electrical properties information of coupled circuit and temperature sensor 106 can be obtained, by electrical properties information, the temperature survey parameter accurately of probe 104 can be known, so that main control part is calibrated the temperature that probe 104 is measured.
Polytype information can be stored in storer 108, include but not limited to the calibrated resistance value of the number information of probe, probe, the compensating parameter of described probe, the type of probe or the temperature calibration curve parameter etc. relevant to probe.
According to another preferred embodiment, see Fig. 4, disclose a kind of temperature correction method, described method comprises:
S401: obtain the presupposed information be stored in advance in temperature measuring equipment probe.
Producer, when producing replaceable sensor probe, in order to ensure the temperature measurement accuracy of popping one's head in, measures the offset resistance value of this probe or the compensating parameter corresponding with this offset resistance value in advance.Above-mentioned information can store according to various ways.
First kind of way, stores the number information of probe in probe, offset resistance value corresponding for this number information or compensating parameter is stored in main control part.Now only need the number information reading probe from described probe.
The second way, directly stores offset resistance value or the compensating parameter of probe, now directly reads this offset resistance value or compensating parameter in probe.
S402: according to described presupposed information, calibrates the temperature by described probe measurement.
If store the number information of probe in described probe, then the main frame of temperature measuring equipment directly can search offset resistance value or the compensating parameter of this numbering correspondence according to this number information.
If offset resistance value or the compensating parameter for the depositing probe that store in described probe, now the main frame of temperature measuring equipment directly can carry out temperature correction according to this offset resistance value or compensating parameter.
For example, the ID of the first thermometer probe is: 3345, be stored in the rom chip among probe, main control part, after probe connects, reads ID, and from the association table of main control part, reads the calibration information corresponding to this ID (3345), such as: probe type is short, calibration information can be the resistance value 3.51 ohm of this probe, or direct compensating parameter, and such as 0.976.Main control part, according to the calibration information of 3.51 ohm, determines that compensating parameter is 0.976, according to this compensating parameter to probe calibration; Main control part also can according to direct compensating parameter, and such as 0.976, the measurement result of probe is compensated, is then shown to user.
For NTC thermistor, the method for tabling look-up can be adopted to obtain temperature value, and this just involves the corresponding relation of temperature and resistance, see table 1.
Table 1 temperature and the thermistor table of comparisons
Suppose that central processing unit 202 is 6102.35 ohm by the probe resistance that A/D converter collects, and be 4.52 ohm from the correcting offset resistance value that probe memory reads, now probe resistance is modified to:
6102.35-4.52=6097.83 ohm
Known by look-up table one, revised resistance value is positioned in the middle of 36 degrees Celsius and the resistance value corresponding to 37 degrees Celsius, and the temperature T that can be obtained probe acquires by interpolation calculation is:
(37-36)/(6028.4-6278.658)＝(T-36)/(6097.83-6278.658)
T=(37-36) * (6097.83-6278.658)/(6028.4-6278.658)+36=36.723 degree Celsius
Alternatively account form, formula Rt=R*EXP (B* (1/T1-1/T2)) can be adopted to carry out calculating the temperature that records of current probe, in formula, Rt is the resistance of thermistor at T1 temperature, R is the nominal resistance of thermistor under T2 normal temperature, B value is the parameter of thermistor, here T1 and T2 refers to K degree and kelvin degree, and K degree=273.15 (absolute temperature)+degree Celsius.
When calculating, if the correcting offset resistance value read from probe is R1, then above-mentioned formula is modified to: (Rt – R1)=R*EXP (B* (1/T1-1/T2)), now can obtain revised temperature value T1 by substituting into known parameter value.
Except adopting correcting offset resistance value to carry out except temperature correction calculating, compensating parameter can also be obtained and carry out temperature correction calculating.
Suppose that central processing unit 202 is 6102.35 ohm by the probe resistance that A/D converter collects, and be 0.9963 from the compensating parameter that probe memory reads, now probe resistance is modified to:
6102.35*0.9963=6097.83 ohm
Known by look-up table one, revised resistance value is positioned in the middle of 36 degrees Celsius and the resistance value corresponding to 37 degrees Celsius, and the temperature T that can be obtained probe acquires by interpolation calculation is:
(37-36)/(6028.4-6278.658)＝(T-36)/(6097.83-6278.658)
T=(37-36) * (6097.83-6278.658)/(6028.4-6278.658)+36=36.723 degree Celsius.
Alternatively account form, formula Rt=R*EXP (B* (1/T1-1/T2)) can be adopted to carry out calculating the temperature that records of current probe, in formula, Rt is the resistance of thermistor at T1 temperature, R is the nominal resistance of thermistor under T2 normal temperature, B value is the parameter of thermistor, here T1 and T2 refers to K degree and kelvin degree, and K degree=273.15 (absolute temperature)+degree Celsius.
When calculating, if be ɑ from the compensating parameter of probe reading, then above-mentioned formula is modified to: Rt* ɑ=R*EXP (B* (1/T1-1/T2)), now can obtain revised temperature value T1 by substituting into known parameter value.
As another embodiment of the present invention, see Fig. 6, the mode of curve can be adopted to calibrate the temperature measured.As shown in Figure 6, temperature calibration curve is nonlinearities change curve, wherein transverse axis is used for representing the resistance of the temperature probe calculated, the longitudinal axis is used for representing the temperature corresponding with resistance, the base measuring temperature that namely the present invention will obtain, wherein, the measurement unit of transverse axis and the longitudinal axis can adopt common measurement unit, the unit of such as transverse axis resistance is ohm, and the unit of longitudinal axis temperature is degree Celsius.
For the curve in Fig. 6, various ways can be adopted in thermometer to store, a kind of mode adopts as shown in the data in table 1, the resistance v. temperature data pair in surveying range are stored with the least unit preset, for not measured resistance value in Table 1, adopt the mode of difference to carry out the measurement of relevant temperature, the advantage of this mode is that calculated amount is little, the computing time of temperature value is little, and shortcoming needs more multibyte storage space to store data.
Being different from the mode of table 1, in order to save the storage space of thermometer, the mode of fitting of a polynomial can being adopted to represent this calibration curve, for example, following polynomial expression can be adopted to represent the curve in Fig. 6:
T＝a+b*R+c*R
2+d*R
3+e*R
4
Wherein, a, b, c, d, e calibration parameter corresponding to calibration curve, specifically, this calibration parameter is fixing constant, and different thermometer probe is due to the difference of resistance characteristic, and the calibration parameter corresponding to each thermometer probe also can be different.
As a kind of embodiment, above-mentioned calibration parameter is stored in the probe of thermometer as the calibration information of thermometer, and when thermometer starts measuring tempeature, the main control part of thermometer reads this calibration parameter, simulate temperature calibration curve, by the current temperature measured of this profile lookup.
Alternatively embodiment, also only can store the numbering of probe in thermometer probe, and main control part searches corresponding calibration parameter according to this numbering.Search in the local calibration parameter database that calibration parameter can store in main control part storer and carry out, also can send Query Information and carry out by externally inquiring about end.
Before thermometer is by the inquiry of external inquiry end, needs and external inquiry end establish a communications link, this communication connection can adopt and common are line or radio connection, carries out exchanges data as by the various ways such as bluetooth, ZIGBEE, WIFI, infrared communication, GSM, CDMA, WCDMA, LTE.Inquiry end can be the intelligent terminals such as mobile phone, also can be the high in the clouds querying server of specialty.
In order to the calibration effect of precision can be reached, before thermometer dispatches from the factory, need to measure the calibration curve of each thermometer.Automatic measurement machine can be adopted, certain batch of probe is calibrated one by one; Such as probe is placed in the water of 37 DEG C, rear end is connected with computing machine by adapting appts, the resistance that measuring now pops one's head in externally presents.Because inherently thermistor of popping one's head in is main, so, when given different probe temperature, probe can externally present different resistances, when the data of follow-on test some groups this (T, R) are to (as (T1 in Fig. 6, R1), (T2, R2) data to) after, just can simulate above-mentioned calibration curve, approximating method such as: least square method etc.
For this calibration curve, a N rank polynomial expression to its storage mode in computing machine, after having had this calibration equation/calibration curve, this polynomial coefficient storage in N rank in thermometer, wait after inserting probe, main frame just reads these parameters from probe, then, individual in probe thermometric process, according to the resistance value that it externally presents, use above-mentioned calibration curve, just can obtain the temperature of measurand this moment.
As an example, the curve of institute's matching is preserved namely enough with 5 order polynomial forms, that is to say, preserve 5 data in thermometer probe, or these 5 data associated with the sensor 's number of thermometer, thermometer inquires about this 5 calibration curve parameters by the mode of inquiry thermometer probe numbering.
Temperature correction is carried out by the mode of fitting of a polynomial temperature calibration curve, only need to store less preset data in the storer of probe, save the storage space of storer, simultaneously by local or external inquiry end inquiry correlated fitting curve data, improve accuracy.
Temperature correction method, probe and temperature measuring equipment in above-described embodiment, except using in general temperature survey, cancer cell thermometer can also be used for or realize in the mode of cancer cell thermometer, for measuring the temperature anomaly produced because of the growth of cancer cell in human body accurately, and the calibration steps in some embodiments, then can be used for the automatic calibration of the temperature measurement result to above-mentioned cancer cell thermometer.
It should be noted that, in this article, the such as relational terms of first and second grades and so on is only used for an entity or operation to separate with another entity or operational zone, and not necessarily requires or imply the relation that there is any this reality between these entities or operation or sequentially.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thus make to comprise the process of a series of key element, method, article or equipment and not only comprise those key elements, but also comprise other key elements clearly do not listed, or also comprise by the intrinsic key element of this process, method, article or equipment.When not more restrictions, the key element limited by statement " comprising ... ", and be not precluded within process, method, article or the equipment comprising described key element and also there is other identical element.
One of ordinary skill in the art will appreciate that all or part of step realized in said method embodiment is that the hardware that can carry out instruction relevant by program has come, described program can be stored in computer read/write memory medium, here the alleged storage medium obtained, as: ROM/RAM, magnetic disc, CD etc.
The foregoing is only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.All any amendments done within the spirit and principles in the present invention, equivalent replacement, improvement etc., be all included in protection scope of the present invention.
Claims (38)
1. a temperature correction method, is characterized in that, described method comprises:
Obtain the presupposed information be stored in advance in temperature measuring equipment probe;
According to described presupposed information, the temperature by described probe measurement is calibrated.
2. method according to claim 1, is characterized in that:
Preferably, described presupposed information is the number information of described probe.
3. method according to claim 2, is characterized in that, described according to described presupposed information, calibrates, comprising the temperature by described probe measurement:
Search the calibration information corresponding with the number information of described probe;
According to described calibration information, the temperature by described probe measurement is calibrated.
4. method according to claim 1, is characterized in that:
Described presupposed information is and the described calibration information mated of popping one's head in.
5. method according to claim 4, is characterized in that, described according to described presupposed information, calibrates, comprising the temperature by described probe measurement:
The calibration information stored in the described probe of direct reading; And
According to described calibration information, the temperature by described probe measurement is calibrated.
6. the method according to claim 3 or 5, is characterized in that:
Described calibration information is: the calibrated resistance value of described probe and/or the compensating parameter of described probe.
7. method according to claim 6, is characterized in that, described according to described calibration information, calibrates, comprising the temperature by described probe measurement:
The resistance value of the described probe measured is deducted described calibrated resistance value, as the first resistance value of described probe;
According to described first resistance value, calculate the temperature value that described probe measurement arrives.
8. method according to claim 6, is characterized in that, described according to described calibration information, calibrates, comprising the temperature by described probe measurement:
The resistance value of the described probe measured is multiplied by described compensating parameter, as the second resistance value of described probe;
According to described second resistance value, calculate the temperature value that described probe measurement arrives.
9. method according to claim 6, is characterized in that, described according to described calibration information, calibrates, comprising the temperature by described probe measurement:
The resistance value of the described probe measured is deducted described calibrated resistance value, as the 3rd resistance value of described probe
The resistance value of the described probe measured is multiplied by described compensating parameter, as the 4th resistance value of described probe;
By described 3rd resistance value and the 4th resistance value sum divided by two, obtain the 5th resistance value;
According to described 5th resistance value, calculate the temperature value that described probe measurement arrives.
10. the method according to claim 3 or 5, is characterized in that:
Described calibration information is the calibration curve parameter of described temperature measuring equipment.
11. methods according to claim 10, is characterized in that, described according to described calibration information, calibrate, comprising the temperature by described probe measurement:
The temperature correction curve containing resistance-vs. temperature is built according to described calibration curve parameter;
Based on resistance value and the described temperature correction curve of the described probe measured, obtain the measuring tempeature of described temperature measuring equipment.
12. methods according to claim 3, is characterized in that, described in search the calibration information corresponding with the number information of described probe, comprising:
The number information of the described probe obtained is sent to inquiry end by described temperature measuring equipment; And
The calibration information corresponding with the number information of described probe is received from described inquiry termination.
13. methods according to claim 12, is characterized in that, the number information of the described probe obtained is sent to inquiry end by described temperature measuring equipment, comprising:
Described temperature measuring equipment sets up communication link with inquiry end in a wired or wireless fashion;
By described communication link, the number information of described probe is sent to described inquiry end.
14. methods according to claim 12 or 13, is characterized in that:
Described inquiry end is mobile phone.
15. methods according to claim 1, is characterized in that, before described acquisition is stored in advance in the presupposed information in temperature measuring equipment probe, described method also comprises:
Obtain multiple temperature-resistance Value Datas pair of described temperature measuring equipment;
Based on described multiple temperature-resistance Value Data to the temperature correction curve obtaining described temperature measuring equipment; And
The parameter corresponding with described temperature correction curve is stored in the probe of described temperature measuring equipment as described presupposed information.
16. 1 kinds of probes, for temperature measuring equipment, it is characterized in that, described probe comprises:
Temperature sensor, is connected to Plug Division by coupled circuit;
Storer, described storer stores presupposed information, and described presupposed information corresponds to the electrical properties of described coupled circuit and described temperature sensor.
17. probes according to claim 16, is characterized in that:
Described presupposed information is the number information of described probe.
18. probes according to claim 16, is characterized in that:
Described presupposed information is and the described calibration information mated of popping one's head in.
19. probes according to claim 18, is characterized in that:
Described calibration information is: the calibrated resistance value of described probe and/or the compensating parameter of described probe.
20. probes according to claim 18, is characterized in that:
Described calibration information is the calibration curve parameter of described temperature measuring equipment.
21. 1 kinds of temperature measuring equipments, is characterized in that, described temperature measuring equipment comprises:
Probe, is previously stored with presupposed information in described probe;
Main control part, described main control part is removably connected with described probe, and according to described presupposed information, calibrates the temperature by described probe measurement.
22. temperature measuring equipments according to claim 21, is characterized in that:
Described presupposed information is the number information of described probe.
23. temperature measuring equipments according to claim 22, is characterized in that, described according to described presupposed information, calibrate, comprising the temperature by described probe measurement:
Described main control part searches the calibration information corresponding with the number information of described probe; And
Described main control part, according to described calibration information, is calibrated the temperature by described probe measurement.
24. temperature measuring equipments according to claim 21, is characterized in that:
Described presupposed information is and the described calibration information mated of popping one's head in.
25. temperature measuring equipments according to claim 24, is characterized in that, described according to described presupposed information, calibrate, comprising the temperature by described probe measurement:
Described main control part directly reads the calibration information stored in described probe; And
Described main control part, according to described calibration information, is calibrated the temperature by described probe measurement.
26. temperature measuring equipments according to claim 23 or 25, is characterized in that:
Described calibration information is: the calibrated resistance value of described probe and/or the compensating parameter of described probe.
27. temperature measuring equipments according to claim 26, is characterized in that, described according to described calibration information, calibrate, comprising the temperature by described probe measurement:
The resistance value of the described probe measured is deducted described calibrated resistance value by described main control part, as the first resistance value of described probe;
Described main control part, according to described first resistance value, calculates the temperature value that described probe measurement arrives.
28. temperature measuring equipments according to claim 26, is characterized in that, described according to described calibration information, calibrate, comprising the temperature by described probe measurement:
The resistance value of the described probe measured is multiplied by described compensating parameter by described main control part, as the second resistance value of described probe;
Described main control part, according to described second resistance value, calculates the temperature value that described probe measurement arrives.
29. temperature measuring equipments according to claim 26, is characterized in that, described according to described calibration information, calibrate, comprising the temperature by described probe measurement:
The resistance value of the described probe measured is deducted described calibrated resistance value by described main control part, as the 3rd resistance value of described probe
The resistance value of the described probe measured is multiplied by described compensating parameter by described main control part, as the 4th resistance value of described probe;
Described 3rd resistance value and the 4th resistance value sum divided by two, are obtained the 5th resistance value by described main control part;
Described main control part, according to described 5th resistance value, calculates the temperature value that described probe measurement arrives.
30. temperature measuring equipments according to claim 21, is characterized in that:
Described probe is replaceable probe.
31. temperature measuring equipments according to claim 30, is characterized in that:
Described main control part with described replaceable pop one's head in be connected time, read described presupposed information;
Judge whether described replaceable probe is the probe mated with described main control part based on described presupposed information.
32. temperature measuring equipments according to claim 31, is characterized in that:
When detect described can with when to change probe be the probe mated with described main control part, described main control part generates alert notification.
33. temperature measuring equipments according to claim 23 or 25, is characterized in that:
Described calibration information is the calibration curve parameter of described temperature measuring equipment.
34. temperature measuring equipments according to claim 33, is characterized in that, described according to described calibration information, calibrate, comprising the temperature by described probe measurement:
Described main control part builds the temperature correction curve containing resistance-vs. temperature according to described calibration curve parameter;
Described main control part, based on the resistance value of the described probe measured and described temperature correction curve, obtains the measuring tempeature of described temperature measuring equipment.
35. temperature measuring equipments according to claim 23, is characterized in that, described in search the calibration information corresponding with the number information of described probe, comprising:
The number information of the described probe obtained is sent to inquiry end by described main control part; And
Described main control part receives the calibration information corresponding with the number information of described probe from described inquiry termination.
36. temperature measuring equipments according to claim 35, is characterized in that, the number information of the described probe obtained is sent to inquiry end by described main control part, comprising:
Described main control part sets up communication link with described inquiry end in a wired or wireless fashion;
The number information of described probe is sent to described inquiry end by described communication link by described main control part.
37. temperature measuring equipments according to claim 35 or 36, is characterized in that:
Described inquiry end is mobile phone.
38. temperature measuring equipments according to claim 21, is characterized in that, prestore presupposed information, comprising in described probe:
Obtain multiple temperature-resistance Value Datas pair of described temperature measuring equipment;
Based on described multiple temperature-resistance Value Data to the temperature correction curve obtaining described temperature measuring equipment; And
The parameter information relevant to described temperature correction curve is stored in the probe of described temperature measuring equipment as presupposed information.
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| CN201510895997.6A CN105466603A (en) | 2015-12-07 | 2015-12-07 | An automatic calibration method for temperature measurement by a thermometer, a temperature measurement probe and a thermometer |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105955338A (en) * | 2016-07-19 | 2016-09-21 | 浙江绍兴苏泊尔生活电器有限公司 | Plateau self-adaptive method for food processor |
| CN105942988A (en) * | 2016-05-17 | 2016-09-21 | 杭州欧汇科技有限公司 | Electronic thermometer and calibration method based on electronic thermometer |
| CN106214133A (en) * | 2016-08-04 | 2016-12-14 | 斯凯瑞利（北京）科技有限公司 | A kind of two-sided multi-point temperature measurement method and system |
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| CN108955952A (en) * | 2018-09-25 | 2018-12-07 | 浙江敏源传感科技有限公司 | A kind of digital temperature sensor and its temperature correction method, storage medium |
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| WO2020154952A1 (en) * | 2019-01-30 | 2020-08-06 | 深圳市科曼医疗设备有限公司 | Intracranial temperature measurement and calculation method, and intracranial temperature measurement apparatus |
| CN111623898A (en) * | 2020-06-24 | 2020-09-04 | 广东纽恩泰新能源科技发展有限公司 | NTC thermistor temperature and resistance detection method and temperature sensor detection method |
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| WO2021051204A1 (en) * | 2019-09-20 | 2021-03-25 | Photon Control Inc. | Calibration system for fiber optic temperature probe |
| CN113588128A (en) * | 2020-04-30 | 2021-11-02 | 斯沃奇集团研究及开发有限公司 | Method for calibrating at least one electronic temperature sensor |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5792951A (en) * | 1994-01-18 | 1998-08-11 | Cambridge Accusense, Inc. | Measurement system with self calibrating probe |
| CN2476008Y (en) * | 2001-03-14 | 2002-02-06 | 捷威科技股份有限公司 | Replaceable measuring head thermometer |
| CN1525183A (en) * | 2003-02-25 | 2004-09-01 | 安捷伦科技有限公司 | Probe based information storage for probes used for opens detection in in-circuit testing |
| US20050249263A1 (en) * | 2001-06-27 | 2005-11-10 | Yerlikaya Y D | Temperature probe adapter |
| CN102697485A (en) * | 2012-06-20 | 2012-10-03 | 苏州市辛涛电子科技有限公司 | Electronic thermometer with replaceable temperature measuring head |
| CN103698056A (en) * | 2013-12-16 | 2014-04-02 | 杭州华安医疗保健用品有限公司 | Calibrated temperature error correction device and correction method |
-
2015
- 2015-12-07 CN CN201510895997.6A patent/CN105466603A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5792951A (en) * | 1994-01-18 | 1998-08-11 | Cambridge Accusense, Inc. | Measurement system with self calibrating probe |
| CN2476008Y (en) * | 2001-03-14 | 2002-02-06 | 捷威科技股份有限公司 | Replaceable measuring head thermometer |
| US20050249263A1 (en) * | 2001-06-27 | 2005-11-10 | Yerlikaya Y D | Temperature probe adapter |
| CN1525183A (en) * | 2003-02-25 | 2004-09-01 | 安捷伦科技有限公司 | Probe based information storage for probes used for opens detection in in-circuit testing |
| US20060279295A1 (en) * | 2003-02-25 | 2006-12-14 | Crook David T | Probe based information storage for probes used for opens detection in in-circuit testing |
| CN1296719C (en) * | 2003-02-25 | 2007-01-24 | 安捷伦科技有限公司 | Probe based information storage for probes used for opens detection in in-circuit testing |
| CN102697485A (en) * | 2012-06-20 | 2012-10-03 | 苏州市辛涛电子科技有限公司 | Electronic thermometer with replaceable temperature measuring head |
| CN103698056A (en) * | 2013-12-16 | 2014-04-02 | 杭州华安医疗保健用品有限公司 | Calibrated temperature error correction device and correction method |
Non-Patent Citations (1)
| Title |
|---|
| 中国地质科学院地质力学研究院: "热敏电阻的标定和实例", 《地热专辑 第二辑》 * |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105942988A (en) * | 2016-05-17 | 2016-09-21 | 杭州欧汇科技有限公司 | Electronic thermometer and calibration method based on electronic thermometer |
| CN105955338A (en) * | 2016-07-19 | 2016-09-21 | 浙江绍兴苏泊尔生活电器有限公司 | Plateau self-adaptive method for food processor |
| CN106214133A (en) * | 2016-08-04 | 2016-12-14 | 斯凯瑞利（北京）科技有限公司 | A kind of two-sided multi-point temperature measurement method and system |
| CN106343962A (en) * | 2016-08-04 | 2017-01-25 | 斯凯瑞利（北京）科技有限公司 | Single-face multi-point temperature measuring method and system |
| CN108955952A (en) * | 2018-09-25 | 2018-12-07 | 浙江敏源传感科技有限公司 | A kind of digital temperature sensor and its temperature correction method, storage medium |
| WO2020154951A1 (en) * | 2019-01-30 | 2020-08-06 | 深圳市科曼医疗设备有限公司 | High-stability intracranial temperature measurement and calculation method and measurement device |
| WO2020154952A1 (en) * | 2019-01-30 | 2020-08-06 | 深圳市科曼医疗设备有限公司 | Intracranial temperature measurement and calculation method, and intracranial temperature measurement apparatus |
| WO2021051204A1 (en) * | 2019-09-20 | 2021-03-25 | Photon Control Inc. | Calibration system for fiber optic temperature probe |
| CN113588128A (en) * | 2020-04-30 | 2021-11-02 | 斯沃奇集团研究及开发有限公司 | Method for calibrating at least one electronic temperature sensor |
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