CN105427895A - Nonvolatile memory chip test and use method used for video cloud application - Google Patents
Nonvolatile memory chip test and use method used for video cloud application Download PDFInfo
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- CN105427895A CN105427895A CN201510772627.3A CN201510772627A CN105427895A CN 105427895 A CN105427895 A CN 105427895A CN 201510772627 A CN201510772627 A CN 201510772627A CN 105427895 A CN105427895 A CN 105427895A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
The invention discloses a nonvolatile memory chip test and use method used for video cloud application. A front-end video monitor realizes video acquisition and recording, and a cloud platform is in charge of control management and video playback. A memory in the video cloud application is low in data retention time requirements and low in data random write performance requirements, and continuous writing takes a leading for data; requirements on data read performance are low, and a probability that the data is read after the data is read is low; and requirements on data storage quality are low. According to the above characteristics, the invention provides the test and use method for lowering the cost of the nonvolatile memory chip in the video cloud application, the nonvolatile memory chips which do not meet any test condition in the test process are reused, and the test and use method is used for large-volume storage devices in the video cloud application. The nonvolatile memory chips which are supposed to abandon are reused to greatly lower the cost of the nonvolatile memory chips in the video cloud application and lighten environment pollution.
Description
Technical field
The present invention relates to video cloud field of storage, particularly relate to a kind of nonvolatile memory chip test for video cloud application and using method.
Background technology
Nonvolatile memory is the nonvolatile solid state memory technology still preserving data after a kind of power-off, it is provided with the superiority such as low-power consumption, read or write speed be fast, is widely used in mobile terminal device (being referred to as the application of a class) and data center field (being referred to as b class to apply) etc.The application of different field is also different to the performance requirement of nonvolatile memory.Such as the application of a class is at least greater than 5 years to the data hold time (dataretention) of nonvolatile memory, and the application of b class will be at least 10 years to the data hold time (dataretention) of nonvolatile memory.Be no matter the application of a class or the application of b class, to nonvolatile memory chip random write performance with to read performance requirement all very high, storing quality to data also has very high requirement, if data to store quality low, then can the stability of influential system.
Under normal circumstances, non-volatile memory chips (die) all can through a large amount of tests and quality testing before encapsulation is dispatched from the factory.No matter last NAND chip application is to which kind of field, testing standard, screening conditions are all identical.Only have those NAND wafers that have passed testing process just packed and then after encapsulation testing process, the NAND chip that finally only have passed all testing processs above just can be sold to client, is applied in different fields.As shown in Figure 1 be a slice NAND wafer (wafer), all non-volatile memory chips in this sheet wafer all can through a series of test link and screening, NAND wafer eventually through all testing standards just packedly can enter packaging and testing link, these qualified NAND wafers are just likely finally applied to mobile terminal or server field etc., and those NAND wafers not meeting any one testing standard will be dropped, this is not only the waste to wafer resource, also can give environment simultaneously.Wafer yield (yield) is exactly the ratio by non-volatile memory chips sum on the non-volatile memory chips number of all tests and this sheet wafer in this sheet wafer.Wafer yield is higher, also just means that the production cost of manufacturer is lower, and the procurement price of client is also lower.But in fact, the yield at the non-volatile memory products initial stage of any technique of new generation is non-constant, this adds the production cost of manufacturer undoubtedly, price is always high makes nonvolatile memory cannot be applied in other special dimensions, and this is also the main cause that NAND solid state hard disc cannot replace mechanical hard disk (HDD) and stores.
Video cloud application (being referred to as the application of c class) is the application that another kind needs massive store, such as, and safety and protection monitoring system.Compare a class and the application of b class, this application requires much lower to the retention time of storer, only may need half a year, 30 days or shorter one week etc., also seldom random writing operations and read operation can be carried out to storer, only there occurs abnormal conditions just can transfer storer and carry out read operation, also very low to the storage quality requirements of storer.Supervisory system in a such as community, the most of the time particularly at night, store a large amount of inessential data, such as road, leaf etc., and the behavioral data of the people of real concern only accounts for little part in video.If little storage errors occur the bitstream data stored in this video, affect the quality of whole video hardly.Can find out, video cloud application is lower to the performance requirement of storer, and to capacity requirement very high (each moment is at generation video data), therefore be nearly all the mechanical hard disk adopting cost lower in the market, if adopt nonvolatile memory solid state hard disc, must not bear in cost and price Shang Shi video cloud supplier.
To sum up describe, the present invention proposes a kind of method reducing nonvolatile memory cost in video cloud application.Re-use the NAND chip that those do not meet arbitrary test condition in testing process, and for the mass-memory unit in video cloud application.Re-use these NAND chips that should be dropped and not only greatly reduce NAND chip cost in video cloud application, but also can environmental pollution be reduced.
Summary of the invention
Because the above-mentioned defect of prior art, technical matters to be solved by this invention is in the application of video cloud storage, how to reduce the use cost of nonvolatile memory.
For achieving the above object, the invention provides a kind of nonvolatile memory chip method of testing for video cloud application, comprise the following steps:
S1, data center's class application testing and/or mobile terminal class application testing are carried out to the nonvolatile memory nude film on wafer; Then S2 or S3 is entered for the nonvolatile memory nude film meeting data center's class application testing and/or mobile terminal class application testing; Then S4 is entered for the nonvolatile memory nude film not meeting data center's class application testing and/or mobile terminal class application testing;
S2, nude film to be encapsulated, data center's class application testing and/or mobile terminal class application testing are carried out to the nonvolatile memory chip after encapsulation; Then S3 is entered for the nonvolatile memory chip meeting data center's class application testing and/or mobile terminal class application testing; Then S4 is entered for the nonvolatile memory chip not meeting data center's class application testing and/or mobile terminal class application testing; ;
S3, direct goods dispatch;
S4, carry out video cloud application testing; Then S6 or S3 is entered for the nonvolatile memory nude film or chip that meet video cloud application testing; Then S5 is entered for the nonvolatile memory nude film not meeting video cloud application testing;
S5, directly to abandon;
S6, nude film to be encapsulated, video cloud application testing is carried out to the nonvolatile memory chip after encapsulation; Then S3 is entered for the nonvolatile memory chip or chip that meet video cloud application testing; Then S5 is entered for the nonvolatile memory chip not meeting video cloud application testing.
Further, described video cloud application testing comprises data hold time test, the test of data random write performance, data read performance and data store quality test.
Further, described data center class application testing comprises data hold time test, the test of data random write performance, data read performance and data store quality test.
Further, described mobile terminal class application testing comprises data hold time test, the test of data random write performance, data read performance and data store quality test.
Further, described data center class application testing, mobile terminal class application testing and video cloud application testing are completed by same test supplier or are completed by different suppliers.
Further, described nonvolatile memory chip is nand flash memory chip.
Present invention also offers as any nonvolatile memory chip using method applied for video cloud of claim 1-5, comprise the following steps:
S71, provide the nonvolatile memory chip meeting video cloud application testing;
S72, by each nonvolatile memory chip when video cloud application testing on the established data retention time value storage physical address that data hold time is best in this nonvolatile memory chip;
S73, automatically carry out refresh operation according to timer to every nonvolatile memory chip needing the region refreshed, the timing set by described timer is shorter than the data hold time of described nonvolatile memory chip.
Further, described timer be positioned at described nonvolatile memory chip place solid-state memory on or be positioned at and carry out on other equipment of data interaction with solid-state memory.
Further, described refresh operation is sense data and again writes back.
Further, described nonvolatile memory chip is nand flash memory chip.
Video cloud (videocloud) application be a kind of based on cloud computing technology with the application of satisfying magnanimity video storage and management, it is exactly more typically safety defense monitoring system, head end video watch-dog realizes video acquisition and recording, and cloud platform is responsible for control and management and video playback.Storer in video cloud application has one or more feature following and is called video cloud application standard:
1. pair data hold time requires lower than a class and the application of b class, such as, be half a year, 30 days or shorter 7 days;
2. pair data random write performance requires that data random write performance does not need very well lower than a class and the application of b class, namely in video cloud is applied data with write continuously account for leading;
3. pair data read performance requirement lower than a class and the application of b class, because the probability that data are read after storing in video cloud application is lower;
4. the quality requirements of pair data storage is lower, ECC (ErrorCorrectingCode, data store and make a mistake with some data bit unavoidable in reading process, a kind of technology that can realize error detection and correction of ECC) can not revise that to store all data bit made a mistake in data be also can be received completely.Namely the bit of mistake can be comprised in the data read after ECC revises.
According to the These characteristics of memory requirement in video cloud application, the present invention proposes a kind of method reducing nonvolatile memory cost in video cloud application, re-use the NAND chip that those do not meet arbitrary test condition in test process, and for the mass-memory unit in video cloud application.Re-use these NAND chips that should be dropped and not only greatly reduce NAND chip cost in video cloud application, but also can environmental pollution be reduced.
Further, the present invention proposes the method for testing that a kind of location meets the NAND chip of video cloud application, as shown in Figure 2.Wherein, the stage 1. with the stage be 2. the test link of traditional NAND chip to filter out the NAND chip meeting a class and/or the application of b class, 4. 3. the stage be the present invention with the stage to filter out the NAND chip meeting video cloud application and the test link increased.1. the above-mentioned stage can be from complete any one test phase to shipment of wafer manufacturing at NAND chip.When NAND chip enter test phase 1. time, the NAND chip of the test and screening conditions that only have passed the stage 1 just can enter test link 2. of next stage or direct goods dispatch (be 1. NAND chip last test phase dispatch from the factory before when the stage); And the NAND chip 1. do not tested by the stage and screen just is entered the stage and 3. tests to filter out the NAND chip meeting c class application standard, meet the stage 3. test condition just can enter the next stage and 4. test link or direct goods dispatch (be 3. chip last test phase dispatch from the factory before when the stage).By above-mentioned testing process, thus locate and filter out the NAND chip that those meet video cloud application conditions of the present invention (as above one or more feature), and under conventional situation, these NAND chips can be dropped.
Test phase 1. and 2. and test phase 3. and 4. can be completed by same test supplier, also can be completed by different suppliers.
After filtering out the NAND chip meeting c class application standard, the present invention propose a kind of by these NAND chip application to video cloud application in method, as shown in Figure 3.Wherein 2. equipment be the solid-state memory be at least made up of the NAND chip of the some described c of meeting class application standards and memory controller or processor, and 1. equipment be equipment higher level equipment 2..Because the data retention time of the NAND chip meeting video cloud of the present invention application can not be oversize, therefore just may need regularly to refresh to guarantee data integrity and reliability.The equipment refresh interval DRI (Devicerefreshinterval) of our define equipment 2. solid-state memory, described DRI should by equipment 2. in the shortest NAND chip of data hold time determine.The firmware information (comprising data hold time) of every NAND chip should be determined when testing, and these information should be stored on physical address that in NAND chip, the retention time is best (data hold time is greater than DRI), in order to avoid these information were lost before refresh operation arrives.According to refresh timer equipment 1. or equipment 2. go up, the refresh scheme of solid-state memory of the present invention can have following two schemes.
Scheme 1: as shown in Figure 2, if 2. equipment carry refresh timer (timer on such as memory controller or processor) in solid state hard disc storer, the memory controller in so described solid state hard disc storer or processor just can automatically regularly (being determined by DRI) carry out refresh operation (sense data also writes back again) to every NAND chip needing the region refreshed.Such as, whole equipment refresh interval is 2. set as 7 days, and namely the most short data retention time of all NAND chips should be more than or equal to 7 days.So 2. middle memory controller or processor, under the triggering of timer, performed a refresh operation every 7 days to all NAND chips needing the region refreshed, thus ensure the data integrity of solid-state memory equipment.
Scheme 2: as shown in Figure 2, if equipment 2. in there is no timer, and higher level equipment 1. in timer, so can by higher level equipment 1. (such as PC) regularly send refresh command, then the memory controller of equipment 2. in solid state hard disc storer or processor receive and orders and perform refresh command, so to equipment 2. in all NAND chips on need the region of refreshing to carry out refresh operation.
Be described further below with reference to the technique effect of accompanying drawing to design of the present invention, concrete structure and generation, to understand object of the present invention, characteristic sum effect fully.
Accompanying drawing explanation
Fig. 1 is NAND wafer (Wafer) schematic diagram;
Wherein, 1 represents NAND wafer (Wafer), the wafer of 2 expression test passes, the wafer of 3 expression test failures;
Fig. 2 is the NAND chip detecting method meeting video cloud application of a preferred embodiment of the present invention;
Fig. 3 is the method in these NAND chip application being applied to video cloud of a preferred embodiment of the present invention;
Fig. 4 is the safety defense monitoring system schematic diagram of a preferred embodiment of the present invention.
Embodiment
Lift a specific embodiment to be below further elaborated.
There are Micron, Intel, Samsung, Hynix, Toshiba etc. in the producer now commercially producing NAND chip, these manufacturers can abandon a large amount of not by the chip of a class and/or b class application testing and screening criteria in NAND chip testing process, the present invention can re-use these discarded NAND chips to meet video cloud application, and concrete steps are as follows.
Step 1: buy those not by the NAND chip of a class and/or b class application testing and screening criteria from above-mentioned producer with very low very low price;
Step 2: domestic test business men carries out a series of test to filter out the NAND chip meeting video cloud application standard again to above-mentioned NAND chip;
Step 3: the solid state hard disc control processor of above-mentioned the NAND chip and independent research that meet video cloud application standard is assembled into cheap solid state hard disc storer;
Step 4: by above-mentioned cheap solid state hard disc memory application in video cloud application (such as safety defense monitoring system).
The storer such as used in current safety defense monitoring system is all mechanical hard disk mostly, and while meeting performance requirement, price is very cheap.And apply the cheap solid-state memory of the present invention and can be applied to equally in safety defense monitoring system, and performance is also good than traditional mechanical hard disk.If Fig. 4 is simple safety defense monitoring system schematic diagram, equipment 0, equipment 1 and be all the head end video watch-dog of Internet of Things to equipment n-1, and the storer that they adopt is all above-mentioned cheap NAND solid state hard disc storer, equipment n is a long-range data center.Equipment 0, equipment 1 and constantly can be write data continuously to the solid state hard disc storer in equipment n-1, and seldom read, only just can be transferred video data when something unexpected happened situation time temporarily.If the data hold time of these solid state hard disc storeies is minimum only have 7 days, so front-end equipment only can preserve video data 7 days in this locality, then send high in the clouds data center to backup by network, and front-end equipment is also just without the need to refreshing the data in solid-state memory.Therefore the method for this reduction nonvolatile memory of the present invention cost can be applied in video cloud application completely.
More than describe preferred embodiment of the present invention in detail.Should be appreciated that the ordinary skill of this area just design according to the present invention can make many modifications and variations without the need to creative work.Therefore, all technician in the art, all should by the determined protection domain of claims under this invention's idea on the basis of existing technology by the available technical scheme of logical analysis, reasoning, or a limited experiment.
Claims (10)
1., for a nonvolatile memory chip method of testing for video cloud application, it is characterized in that, comprise the following steps:
S1, data center's class application testing and/or mobile terminal class application testing are carried out to the nonvolatile memory nude film on wafer; Then S2 or S3 is entered for the nonvolatile memory nude film meeting data center's class application testing and/or mobile terminal class application testing; Then S4 is entered for the nonvolatile memory nude film not meeting data center's class application testing and/or mobile terminal class application testing;
S2, nude film to be encapsulated, data center's class application testing and/or mobile terminal class application testing are carried out to the nonvolatile memory chip after encapsulation; Then S3 is entered for the nonvolatile memory chip meeting data center's class application testing and/or mobile terminal class application testing; Then S4 is entered for the nonvolatile memory chip not meeting data center's class application testing and/or mobile terminal class application testing; ;
S3, direct goods dispatch;
S4, carry out video cloud application testing; Then S6 or S3 is entered for the nonvolatile memory nude film or chip that meet video cloud application testing; Then S5 is entered for the nonvolatile memory nude film not meeting video cloud application testing;
S5, directly to abandon;
S6, nude film to be encapsulated, video cloud application testing is carried out to the nonvolatile memory chip after encapsulation; Then S3 is entered for the nonvolatile memory chip or chip that meet video cloud application testing; Then S5 is entered for the nonvolatile memory chip not meeting video cloud application testing.
2. as claimed in claim 1 for the nonvolatile memory chip method of testing of video cloud application, it is characterized in that, described video cloud application testing comprises data hold time test, the test of data random write performance, data read performance and data store quality test.
3. as claimed in claim 1 for the nonvolatile memory chip method of testing of video cloud application, it is characterized in that, described data center class application testing comprises data hold time test, the test of data random write performance, data read performance and data store quality test.
4. as claimed in claim 1 for the nonvolatile memory chip method of testing of video cloud application, it is characterized in that, described mobile terminal class application testing comprises data hold time test, the test of data random write performance, data read performance and data store quality test.
5. as claimed in claim 1 for the nonvolatile memory chip method of testing of video cloud application, it is characterized in that, described data center class application testing, mobile terminal class application testing and video cloud application testing are completed by same test supplier or are completed by different suppliers.
6., as the nonvolatile memory chip method of testing for video cloud application in claim 1-5 as described in any, it is characterized in that, described nonvolatile memory chip is nand flash memory chip.
7., as any nonvolatile memory chip using method applied for video cloud of claim 1-5, it is characterized in that, comprise the following steps:
S71, provide the nonvolatile memory chip meeting video cloud application testing;
S72, by each nonvolatile memory chip when video cloud application testing on the established data retention time value storage physical address that data hold time is best in this nonvolatile memory chip;
S73, automatically carry out refresh operation according to timer to every nonvolatile memory chip needing the region refreshed, the timing set by described timer is shorter than the data hold time of described nonvolatile memory chip.
8. as claimed in claim 7 for the nonvolatile memory chip using method of video cloud application, it is characterized in that, on the solid-state memory that described timer is positioned at described nonvolatile memory chip place or be positioned at and carry out on other equipment of data interaction with solid-state memory.
9. as claimed in claim 7 for the nonvolatile memory chip using method of video cloud application, it is characterized in that, described refresh operation is sense data and again writes back.
10., as the nonvolatile memory chip using method for video cloud application in claim 8-9 as described in any, described nonvolatile memory chip is nand flash memory chip.
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Cited By (1)
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