CN106486170B - The potential bad block localization method and device of solid state hard disk - Google Patents

The potential bad block localization method and device of solid state hard disk Download PDF

Info

Publication number
CN106486170B
CN106486170B CN201610831985.1A CN201610831985A CN106486170B CN 106486170 B CN106486170 B CN 106486170B CN 201610831985 A CN201610831985 A CN 201610831985A CN 106486170 B CN106486170 B CN 106486170B
Authority
CN
China
Prior art keywords
block
bad block
errors
reserved
bit
Prior art date
Application number
CN201610831985.1A
Other languages
Chinese (zh)
Other versions
CN106486170A (en
Inventor
陈俊
李四林
李慕霄
Original Assignee
深圳忆数存储技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳忆数存储技术有限公司 filed Critical 深圳忆数存储技术有限公司
Priority to CN201610831985.1A priority Critical patent/CN106486170B/en
Publication of CN106486170A publication Critical patent/CN106486170A/en
Application granted granted Critical
Publication of CN106486170B publication Critical patent/CN106486170B/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details

Abstract

The invention discloses the potential bad block localization methods and device of solid state hard disk, and this method comprises the following steps: presetting the bad block table of reserved block table and multiple ranks in firmware;When being operated at a normal temperature to the overall read/write data for carrying out sequence address, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, when being operated at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and potential bad block is replaced using the reserved block in reserved block table, and contraposition erroneous block carries out classification processing and is added in the bad block table of corresponding rank.The potential bad block of solid state hard disk can be accurately positioned in the present invention, can be improved the effective rate of utilization of chip capacity, improve the stability of Fixed disk.

Description

The potential bad block localization method and device of solid state hard disk

Technical field

The present invention relates to the potential bad block localization methods and dress of technical field of data storage more particularly to a kind of solid state hard disk It sets.

Background technique

The features such as NAND FLASH due to its long service life, program speed is fast, and the erasing time is short, non-volatile is suitable for Solid state hard disk stores electronic information.With existing semiconductor technology and technique progress, the storage of NAND FLASH (SLC to TLC) The bit data of unit storage are increasing, and line width is decreased to 19nm from 28nm.Cost is reduced increasing unit memory capacity in this way Situation under, cause that structure is more complicated, so as to cause the growth of error probability.

It is easy to happen bit flipping mistake when in use, it is necessary to increase the complexity of correcting data error algorithm when in use. The physical operations of NAND FLASH is mainly what unit carried out with block (Block).So when certain mistakes that can not be corrected occurs in block It mistakes, since the mistake of data may cause the unstable of whole system.

NAND FLASH chip producer has only carried out simple physical testing after its encapsulation, does not carry out to its performance Test comprehensively.Its internal bad block positioning is mainly written and read under normal temperature environment to be carried out with erasing move, can not be effective Bad block is positioned, it is even more impossible to position wherein potential bad block and bit-errors block and carry out reasonable utilization.The side of common lookup bad block Case: first in firmware, setting one can not error correction wrong bit threshold value (be typically chosen Nand Flash producer offer);Its It is secondary the physical operations such as to be wiped chip, be written and read at normal temperature;Finally further according to the wrong phenomenon of period data into Row bad block label.Such way can not find out completely the bad block in chip, and it is even more impossible to position to potential bad block therein. The appearance of bad block will cause the corrupt data of system, to reduce the reliability of system.If positioned using general bad block, it is The stability of the system of maintenance, needs to increase the complexity of correcting data error algorithm.It in realization can restricted and NAND FLASH Some performances of chip itself, correcting data error algorithm can not improve, therefore the stability of system is by certain restriction.

Summary of the invention

The technical problems to be solved by the present invention are: providing a kind of potential bad block localization method of solid state hard disk, it is intended to quasi- The potential bad block for determining position solid state hard disk, can be improved the effective rate of utilization of chip capacity, improve the stability of Fixed disk.

In order to solve the above-mentioned technical problem, the technical solution adopted by the present invention are as follows: a kind of the potential bad of solid state hard disk is provided Block localization method, burning has firmware in the solid state hard disk, and this method comprises the following steps:

The bad block table of reserved block table and multiple ranks is preset in firmware, wherein the rank of the bad block table is by position The number of errors of data divides;

When operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than setting bad block threshold value Potential bad block and repairable bit-errors block message, wherein institute's bit errors block message includes physical address and the position of block Number of errors;

When operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than setting bad block threshold value Potential bad block and repairable bit-errors block message, wherein institute's bit errors block message includes physical address and the position of block Number of errors;

Potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and using in reserved block table Reserved block replaces potential bad block, and contraposition erroneous block carries out classification processing and is added in the bad block table of corresponding rank.

Preferably, when the read/write data operation for carrying out sequence address respectively at a temperature of extreme value, record is more than setting It the step of potential bad block of bad block threshold value and repairable bit-errors block message, specifically includes:

Under the maximum temperature threshold value that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value;

Under the minimum temperature threshold that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.

Preferably, described that the potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and utilize After the step of reserved block in reserved block table replaces potential bad block, further includes:

The overall read/write operation that random address is carried out at a temperature of extreme value to block of withing a hook at the end is replaced, and record is more than to set The potential bad block and repairable bit-errors block message of fixed bad block threshold value.

Preferably, contraposition erroneous block carries out classification processing and is added to after the step in the bad block table of corresponding rank, Further include:

Judge to whether there is reserved block in reserved block table,

If continuing to replace potential bad block with reserved block there are reserved block in reserved block table;

If reserved block is not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block To the threshold value for reaching bit-errors block.

In order to solve the above-mentioned technical problem, another technical solution used in the present invention are as follows: a kind of solid state hard disk is provided Potential bad block positioning device, burning has firmware in the solid state hard disk, which includes:

Presetting module, for presetting the bad block table of reserved block table and multiple ranks in firmware, wherein the bad block The rank of table is divided by the number of errors of position data;

First logging modle, when for being operated at a normal temperature to the overall read/write data for carrying out sequence address, record More than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message includes The physical address and bit-errors number of block;

Second logging modle, when for being operated at a temperature of extreme value to the overall read/write data for carrying out sequence address, record More than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message includes The physical address and bit-errors number of block;

Locating module, for by be more than set bad block threshold value potential bad block be added in the bad block table of initialization, and benefit Potential bad block is replaced with the reserved block in reserved block table, and contraposition erroneous block carries out classification processing and is added to corresponding rank Bad block table in.

Preferably, second logging modle specifically includes the first recording unit and the second recording unit,

First recording unit, for being carried out sequentially to overall under the maximum temperature threshold value that solid state hard disk is born When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value;

Second recording unit, for being carried out sequentially to overall under the minimum temperature threshold that solid state hard disk is born When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.

Preferably, described device further includes third logging modle, for withing a hook at the end the overall in extreme value temperature of block to replacement When the lower read/write operation for carrying out random address, record is more than the potential bad block for setting bad block threshold value and repairable bit-errors Block message.

Preferably, described device further includes judgment module, for whether there is reserved block in judging reserved block table,

There are when reserved block, continue to replace potential bad block with reserved block in reserved block table;

When reserved block being not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block To the threshold value for reaching bit-errors block.

The beneficial effects of the present invention are: this programme mainly uses following step: preset in firmware reserved block table with And the bad block table of multiple ranks, when operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than to set The potential bad block and repairable bit-errors block message of fixed bad block threshold value, to overall progress sequence address at a temperature of extreme value When read/write data operates, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, will be more than The potential bad block for setting bad block threshold value is added in the bad block table of initialization, and potential using the reserved block replacement in reserved block table Bad block, and contraposition erroneous block carry out classification processing and are added in the bad block table of corresponding rank, pass through normal temperature, extreme value The temperature read/write operation overall to Fixed disk can find out potential bad block, and potential bad by using reserved block replacement Block, and be stored in initialization bad block table, the position of potential bad block can be positioned;In addition, bit-errors block can also provide replacement block, The stability that Fixed disk can be improved in turn ensures that NAND FLASH chip capacity is effectively utilized.

Detailed description of the invention

Fig. 1 is the method flow diagram of potential bad one embodiment of block localization method of solid state hard disk of the present invention;

Fig. 2 is the block diagram of one embodiment of potential bad block positioning device of solid state hard disk of the present invention.

Specific embodiment

To explain the technical content, the achieved purpose and the effect of the present invention in detail, below in conjunction with embodiment and cooperate attached Figure is explained.

Please refer to Fig. 1, in the embodiment of the present invention, the potential bad block localization method of the solid state hard disk, the solid state hard disk Middle burning has firmware, and this method comprises the following steps:

Step S10, the bad block table of reserved block table and multiple ranks is preset in firmware, wherein the bad block table Rank is divided by the number of errors of position data.In this step, the rank of bad block table is determined by there is the number of bit mistake, can It is set as the bad block table of 2bit, the specific size of the bad block table ... of 3bit, the bad block table of N bit, bad block table can be according to reality Requirement determine.

Step S20, when operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than setting The potential bad block of bad block threshold value and repairable bit-errors block message, wherein institute's bit errors block message includes the physics of block Address and bit-errors number.In this step, the bad block that can position normal temperature at this time obtains initial bad blocks table, avoids in extreme value These bad blocks of resetting under temperature environment, so as to improve location efficiency.In this step, it is hard that normal temperature can be solid-state Temperature range of disk in the environment of room temperature.

Step S30, when operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than setting The potential bad block of bad block threshold value and repairable bit-errors block message, wherein institute's bit errors block message includes the physics of block Address and bit-errors number.In this step, it is contemplated that Gu the environment of too hard disk applications and the work of solid state hard disk abnormal condition When, often there are some potential bad blocks, the read-write operation of data is had an impact.For this purpose, feelings of this step in extreme value temperature Being written and read totally to solid state hard disk under condition, to find out potential bad block, in this way, can reduce error rate.

Step S40, the potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and utilizes reservation Reserved block in block table replaces potential bad block, and contraposition erroneous block carries out classification processing and is added to the bad block of corresponding rank In table.In this step, by the way that potential bad block is added in the bad block table of initialization, to position the position of potential bad block, and The potential bad block can be substituted with reserved block, achieve the purpose that the stability for improving entire solid state hard disk.In order to make full use of The memory space of chip, in this step, also contraposition erroneous block carries out classification processing, and the bit-errors block of classification processing can be replaced Potential bad block, in this way, realizing the memory space for making full use of chip.

The beneficial effects of the present invention are: this programme mainly uses following step: preset in firmware reserved block table with And the bad block table of multiple ranks, when operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than to set The potential bad block and repairable bit-errors block message of fixed bad block threshold value, to overall progress sequence address at a temperature of extreme value When read/write data operates, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, will be more than The potential bad block for setting bad block threshold value is added in the bad block table of initialization, and potential using the reserved block replacement in reserved block table Bad block, and contraposition erroneous block carry out classification processing and are added in the bad block table of corresponding rank, pass through normal temperature, extreme value The temperature read/write operation overall to Fixed disk can find out potential bad block, and potential bad by using reserved block replacement Block, and be stored in initialization bad block table, the position of potential bad block can be positioned;In addition, bit-errors block can also provide replacement block, It can be improved the effective rate of utilization of chip capacity, so as to improve the stability of Fixed disk.

In a specific embodiment, the step S30, specifically includes:

Under the maximum temperature threshold value that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value;

Under the minimum temperature threshold that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.

In the present embodiment, mainly the overall of solid state hard disk is written and read using very high temperature and extremely low temperature, certainly, The very high temperature refers to that the maximum temperature threshold value that solid state hard disk is born, the extremely low temperature refer to the minimum temperature threshold that solid state hard disk is born Value.It should be noted that can also use in the present embodiment and carry out the precipitous temperature of temperature slope between very high temperature and extremely low temperature Variation, when being operated to the overall read/write data for carrying out sequence address, record be more than setting bad block threshold value potential bad block and can The bit-errors block message of correction.The block of the read-write operation of solid state hard disk is detected by three kinds of above-mentioned temperature environments, with Potential bad block is found out, the instability problem for reducing the transformation because of working environment, and solid state hard disk being caused to work.

In a specific embodiment, the potential bad block more than setting bad block threshold value is added to just in the step S40 In the bad block table of beginningization, and after the step of replacing potential bad block using the reserved block in reserved block table, further includes:

The overall read/write operation that random address is carried out at a temperature of extreme value to block of withing a hook at the end is replaced, and record is more than to set The potential bad block and repairable bit-errors block message of fixed bad block threshold value.

In the present embodiment, in addition reserved block, which is replaced, to be needed after potential bad block to testing totally, comprising: in normal temperature Under when being operated to the overall read/write data for carrying out random address, record is more than the potential bad block of setting bad block threshold value and can entangle Positive bit-errors block message;Under the maximum temperature threshold value that solid state hard disk is born, to the overall read/write data for carrying out random address When operation, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value;It is born in solid state hard disk Minimum temperature threshold under, when operating to the overall read/write data for carrying out random address, record is more than the latent of setting bad block threshold value In bad block and repairable bit-errors block message.In the present embodiment, the Fixed disk for replacing block of withing a hook at the end is carried out randomly Data are read and write in location.In conjunction with the above-mentioned potential scheme quickly of positioning, this present embodiment is by searching solid hard disk in early period The potential bad block of Suo Dingwei, the probability for occurring bad block in normal use process will drastically reduce, to ensure that use process The stability of system.

In a specific embodiment, erroneous block is aligned in the step S40 to carry out classification processing and be added to corresponding After step in the bad block table of rank, further includes:

Judge to whether there is reserved block in reserved block table,

If continuing to replace potential bad block with reserved block there are reserved block in reserved block table;

If reserved block is not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block To the threshold value for reaching bit-errors block.

In the present embodiment, it is contemplated that be classified the bit-errors block of processing, it is likely that be exactly the object block that potential bad block occurs, be It is set to obtain separately being stored in bit-errors block in the bad block table of classification processing more preferably using the stable situation of system is had no effect on. In order to make full use of overall memory space, in the present solution, considering to make bit-errors block according to the sequence of error rate from less to more Replacement for potential bad block is fast.Simultaneously it is considered that the problem of performance of reserved block is due to bit-errors block, the present embodiment first judges to protect It stays in block table with the presence or absence of reserved block, then decides whether enable bit erroneous block further according to the presence or absence of reserved block.It should be noted that , when using bit-errors block as replacement block, the setting of bit-errors threshold value should be much smaller than NAND FLASH chip producer The threshold value of offer can so guarantee to be not in a large amount of bad block as far as possible.It is also desirable to which the minimum of bit-errors block is arranged Block threshold value sounds a warning when being lower than threshold value, guarantees to guarantee that the stability of system data is wanted in solid state hard disk use process It asks.

Referring to figure 2., the embodiment of the present invention, the potential bad block positioning device of the solid state hard disk, in the solid state hard disk Burning has firmware, which includes:

Presetting module 10, for presetting the bad block table of reserved block table and multiple ranks in firmware, wherein described bad The rank of block table is divided by the number of errors of position data;In the presetting module 10, the rank of bad block table is by there are the more of bit mistake It is few to determine, it may be configured as the bad block table of 2bit, the bad block table ... of 3bit, the bad block table of N bit, the specific size of bad block table It can be determined according to actual requirement.

First logging modle 20, when for being operated at a normal temperature to the overall read/write data for carrying out sequence address, note Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message packet Include the physical address and bit-errors number of block.First logging modle 20, can position normal temperature bad block obtain it is initial bad Block table avoids these bad blocks of resetting under extreme value temperature environment, so as to improve location efficiency.

Second logging modle 30, when for being operated at a temperature of extreme value to the overall read/write data for carrying out sequence address, note Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message packet Include the physical address and bit-errors number of block.In view of the solid too environment of hard disk applications and the work of solid state hard disk abnormal condition When, often there are some potential bad blocks, the read-write operation of data is had an impact.It, can be with for this purpose, second logging modle 30 Being written and read totally to solid state hard disk in the case where extreme value temperature, to find out potential bad block, in this way, can reduce mistake Accidentally rate.

Locating module 40, for by be more than set bad block threshold value potential bad block be added in the bad block table of initialization, and Potential bad block is replaced using the reserved block in reserved block table, and contraposition erroneous block carries out classification processing and is added to corresponding grade In other bad block table.The locating module 40 can be oriented potential by the way that potential bad block to be added in the bad block table of initialization The position of bad block, and the potential bad block can be substituted with reserved block, reach the mesh for improving the stability of entire solid state hard disk 's.In order to make full use of the memory space of chip, this locating module can also align erroneous block and carry out classification processing, the classification The bit-errors block of processing can replace potential bad block, in this way, realizing the memory space for making full use of chip.

In a specific embodiment, second logging modle 30 specifically includes the first recording unit and the second record Member,

First recording unit, for being carried out sequentially to overall under the maximum temperature threshold value that solid state hard disk is born When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value;

Second recording unit, for being carried out sequentially to overall under the minimum temperature threshold that solid state hard disk is born When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.

In the present embodiment, first recording unit and the second recording unit, mainly using very high temperature and extremely low temperature to solid State hard disk is written and read totally, and certainly, which refers to the maximum temperature threshold value that solid state hard disk is born, the extremely low temperature Refer to the minimum temperature threshold that solid state hard disk is born.It should be noted that in the present embodiment, the second logging modle can also include Third recording unit, the third recording unit can be become using the precipitous temperature of temperature slope is carried out between very high temperature and extremely low temperature Change, when operating to the overall read/write data for carrying out sequence address, record is more than the potential bad block of setting bad block threshold value and can entangle Positive bit-errors block message.The block of the read-write operation of solid state hard disk is detected by three kinds of above-mentioned temperature environments, to look for The instability problem that potential bad block out reduces the transformation because of working environment, and solid state hard disk is caused to work.

In a specific embodiment, described device further includes third logging modle, for withing a hook at the end the complete of block to replacement When disk carries out the read/write operation of random address at a temperature of extreme value, record be more than setting bad block threshold value potential bad block and can The bit-errors block message of correction.

In the present embodiment, which can need in addition to carry out to overall after reserved block replaces potential bad block The record data of test.The step of detection, specifically includes: at a normal temperature to the overall read/write data for carrying out random address When operation, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value;It is born in solid state hard disk Maximum temperature threshold value under, when operating to the overall read/write data for carrying out random address, record is more than the latent of setting bad block threshold value In bad block and repairable bit-errors block message;Under the minimum temperature threshold that solid state hard disk is born, carried out at random to overall When the read/write data operation of address, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value. In the present embodiment, random address read-write data are carried out to the Fixed disk for replacing block of withing a hook at the end.It is potential fast in conjunction with above-mentioned positioning Fast scheme, this present embodiment positions potential bad block by scanning in early period to solid hard disk, in normal use process The probability for bad block occur will drastically reduce, to ensure that the stability of use process system.

Whether total in a specific embodiment, described device further includes judgment module, for depositing in judging reserved block table In reserved block,

There are when reserved block, continue to replace potential bad block with reserved block in reserved block table;

When reserved block being not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block To the threshold value for reaching bit-errors block.

In view of the bit-errors block of classification processing, it is likely that be exactly the object block that potential bad block occurs, in order to obtain it More preferable utilize has no effect on the stable situation of system, bit-errors block is separately stored in the bad block table of classification processing.In order to sufficiently sharp With overall memory space, in the present solution, considering bit-errors block according to error rate sequence from less to more as potential bad block Replacement it is fast.Simultaneously it is considered that the problem of performance of reserved block is due to bit-errors block, the present embodiment are first judged by judgment module It whether there is reserved block in reserved block table, then decide whether enable bit erroneous block further according to the presence or absence of reserved block.It needs to infuse Meaning, when using bit-errors block as replacement block, the setting of bit-errors threshold value should be much smaller than NAND FLASH chip factory The threshold value that family provides can so guarantee to be not in a large amount of bad block as far as possible.It is also desirable to which bit-errors block is arranged most Few block threshold value, sounds a warning when being lower than threshold value, guarantees the stability that can guarantee system data in solid state hard disk use process It is required that.

The above description is only an embodiment of the present invention, is not intended to limit the scope of the invention, all to utilize this hair Equivalents made by bright specification and accompanying drawing content are applied directly or indirectly in relevant technical field, similarly include In scope of patent protection of the invention.

Claims (2)

1. a kind of potential bad block localization method of solid state hard disk, which is characterized in that burning has firmware, the party in the solid state hard disk Method includes the following steps:
The bad block table of reserved block table and multiple ranks is preset in firmware, wherein the rank of the bad block table is by position data Number of errors divide;
When operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than the latent of setting bad block threshold value In bad block and repairable bit-errors block message, wherein institute's bit errors block message includes the physical address and bit-errors of block Number;
When operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than the latent of setting bad block threshold value In bad block and repairable bit-errors block message, wherein institute's bit errors block message includes the physical address and bit-errors of block Number;
Potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and utilizes the reservation in reserved block table Block replaces potential bad block, and contraposition erroneous block carries out classification processing and is added in the bad block table of corresponding rank;
It is described that the potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and using in reserved block table Reserved block was replaced after the step of potential bad block, further includes:
The overall read/write operation that random address is carried out at a temperature of extreme value to block of withing a hook at the end is replaced, and record is more than that setting is bad The potential bad block of block threshold value and repairable bit-errors block message;
Contraposition erroneous block carries out classification processing and is added to after the step in the bad block table of corresponding rank, further includes:
Judge to whether there is reserved block in reserved block table,
If continuing to replace potential bad block with reserved block there are reserved block in reserved block table;
If reserved block is not present in reserved block table, potential bad block is replaced until reaching according to the sequence of the number of errors of bit-errors block The threshold value of erroneous block in place.
2. a kind of potential bad block positioning device of solid state hard disk, which is characterized in that burning has firmware in the solid state hard disk, the dress It sets and includes:
Presetting module, for presetting the bad block table of reserved block table and multiple ranks in firmware, wherein the bad block table Rank is divided by the number of errors of position data;
First logging modle, when for operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than Set the potential bad block and repairable bit-errors block message of bad block threshold value, wherein institute's bit errors block message includes block Physical address and bit-errors number;
Second logging modle, when for operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than Set the potential bad block and repairable bit-errors block message of bad block threshold value, wherein institute's bit errors block message includes block Physical address and bit-errors number;
Locating module, for by be more than set bad block threshold value potential bad block be added in the bad block table of initialization, and using protect The reserved block in block table is stayed to replace potential bad block, and contraposition erroneous block carries out classification processing and is added to the bad of corresponding rank In block table;
Described device further includes third logging modle, for carrying out randomly at a temperature of extreme value to replacement the overall of block of withing a hook at the end When the read/write operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value;
Described device further includes judgment module, for whether there is reserved block in judging reserved block table,
There are when reserved block, continue to replace potential bad block with reserved block in reserved block table;
When reserved block being not present in reserved block table, potential bad block is replaced until reaching according to the sequence of the number of errors of bit-errors block The threshold value of erroneous block in place.
CN201610831985.1A 2016-09-06 2016-09-06 The potential bad block localization method and device of solid state hard disk CN106486170B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610831985.1A CN106486170B (en) 2016-09-06 2016-09-06 The potential bad block localization method and device of solid state hard disk

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610831985.1A CN106486170B (en) 2016-09-06 2016-09-06 The potential bad block localization method and device of solid state hard disk

Publications (2)

Publication Number Publication Date
CN106486170A CN106486170A (en) 2017-03-08
CN106486170B true CN106486170B (en) 2019-11-26

Family

ID=58268652

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610831985.1A CN106486170B (en) 2016-09-06 2016-09-06 The potential bad block localization method and device of solid state hard disk

Country Status (1)

Country Link
CN (1) CN106486170B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106981315A (en) * 2017-03-10 2017-07-25 记忆科技(深圳)有限公司 A kind of solid state hard disc bad block knows method for distinguishing

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101320596A (en) * 2008-06-10 2008-12-10 北京时代民芯科技有限公司;中国航天时代电子公司第七七二研究所 Bad block management method facing high-capacity FLASH solid memory
CN101320592A (en) * 2008-07-08 2008-12-10 北京时代民芯科技有限公司;中国航天时代电子公司第七七二研究所 High-capacity FLASH solid memory controller
CN101388255A (en) * 2008-10-31 2009-03-18 成都市华为赛门铁克科技有限公司 Solid hard disk using method and apparatus
CN101510445A (en) * 2009-03-19 2009-08-19 北京中星微电子有限公司 Method and apparatus for storing and reading bad block meter of memory
CN101859604A (en) * 2009-04-10 2010-10-13 国民技术股份有限公司 Utilization method of flash memory bad block
CN102969028A (en) * 2012-10-18 2013-03-13 记忆科技(深圳)有限公司 Method, system, and flash memory of ECC dynamic adjustment
CN104380262A (en) * 2012-06-29 2015-02-25 英特尔公司 Bad block management mechanism

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009266258A (en) * 2008-04-22 2009-11-12 Hitachi Ltd Semiconductor device
KR20150029402A (en) * 2013-09-10 2015-03-18 에스케이하이닉스 주식회사 Data storing system and operating method thereof

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101320596A (en) * 2008-06-10 2008-12-10 北京时代民芯科技有限公司;中国航天时代电子公司第七七二研究所 Bad block management method facing high-capacity FLASH solid memory
CN101320592A (en) * 2008-07-08 2008-12-10 北京时代民芯科技有限公司;中国航天时代电子公司第七七二研究所 High-capacity FLASH solid memory controller
CN101388255A (en) * 2008-10-31 2009-03-18 成都市华为赛门铁克科技有限公司 Solid hard disk using method and apparatus
CN101510445A (en) * 2009-03-19 2009-08-19 北京中星微电子有限公司 Method and apparatus for storing and reading bad block meter of memory
CN101859604A (en) * 2009-04-10 2010-10-13 国民技术股份有限公司 Utilization method of flash memory bad block
CN104380262A (en) * 2012-06-29 2015-02-25 英特尔公司 Bad block management mechanism
CN102969028A (en) * 2012-10-18 2013-03-13 记忆科技(深圳)有限公司 Method, system, and flash memory of ECC dynamic adjustment

Also Published As

Publication number Publication date
CN106486170A (en) 2017-03-08

Similar Documents

Publication Publication Date Title
CN103377010B (en) The system and method for managing the unreliable memory in data-storage system
US8793554B2 (en) Switchable on-die memory error correcting engine
US8443259B2 (en) Apparatus, system, and method for using multi-level cell solid-state storage as single level cell solid-state storage
US9400705B2 (en) Hardwired remapped memory
US9389954B2 (en) Memory redundancy to replace addresses with multiple errors
TWI569273B (en) Method for read disturbance management in non-volatile memory devices
US9703698B2 (en) Data writing method, memory controller and memory storage apparatus
US8694852B2 (en) Nonvolatile memory devices with age-based variability of read operations and methods of operating same
KR101721154B1 (en) Memory system with configurable error thresholds and failure analysis capability
TWI479495B (en) Reading method, memory controller, and memory storage device
US7877669B2 (en) Non-volatile memory with error detection
KR101079502B1 (en) Memory system
US8949507B2 (en) Method for performing block management, and associated memory device and controller thereof
KR101557736B1 (en) Emerging bad block detection
US8578242B1 (en) Data storage device employing seed array for data path protection
US8533385B2 (en) Method for preventing read-disturb happened in non-volatile memory and controller thereof
US8412987B2 (en) Non-volatile memory to store memory remap information
US9952939B1 (en) System and method for lower page data recovery in a solid state drive
US8429334B2 (en) Method for preventing data loss during solder reflow process and memory device using the same
US9053808B2 (en) Flash memory with targeted read scrub algorithm
KR101563647B1 (en) Memory system and data processing method thereof
US20120236658A1 (en) Systems and methods for refreshing non-volatile memory
US8015371B2 (en) Storage apparatus and method of managing data storage area
US8898372B2 (en) Memory storage device, memory controller, and data writing method
US8910002B2 (en) NAND flash-based storage device with built-in test-ahead for failure anticipation

Legal Events

Date Code Title Description
PB01 Publication
C06 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CP02 Change in the address of a patent holder

Address after: Room LM, 9 / F, building B, Baoneng Science Park, Qingxiang Road, Longhua District, Shenzhen City, Guangdong Province

Patentee after: SHENZHEN RECADATA TECHNOLOGY CO., LTD.

Address before: 11, B16, building 518000, building A, new energy building, Nanhai Avenue, Shenzhen, Guangdong, Nanshan District

Patentee before: SHENZHEN RECADATA TECHNOLOGY CO., LTD.

CP02 Change in the address of a patent holder