CN106486170B - The potential bad block localization method and device of solid state hard disk - Google Patents
The potential bad block localization method and device of solid state hard disk Download PDFInfo
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- CN106486170B CN106486170B CN201610831985.1A CN201610831985A CN106486170B CN 106486170 B CN106486170 B CN 106486170B CN 201610831985 A CN201610831985 A CN 201610831985A CN 106486170 B CN106486170 B CN 106486170B
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
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Abstract
The invention discloses the potential bad block localization methods and device of solid state hard disk, and this method comprises the following steps: presetting the bad block table of reserved block table and multiple ranks in firmware；When being operated at a normal temperature to the overall read/write data for carrying out sequence address, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, when being operated at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and potential bad block is replaced using the reserved block in reserved block table, and contraposition erroneous block carries out classification processing and is added in the bad block table of corresponding rank.The potential bad block of solid state hard disk can be accurately positioned in the present invention, can be improved the effective rate of utilization of chip capacity, improve the stability of Fixed disk.
Description
Technical field
The present invention relates to the potential bad block localization methods and dress of technical field of data storage more particularly to a kind of solid state hard disk
It sets.
Background technique
The features such as NAND FLASH due to its long service life, program speed is fast, and the erasing time is short, non-volatile is suitable for
Solid state hard disk stores electronic information.With existing semiconductor technology and technique progress, the storage of NAND FLASH (SLC to TLC)
The bit data of unit storage are increasing, and line width is decreased to 19nm from 28nm.Cost is reduced increasing unit memory capacity in this way
Situation under, cause that structure is more complicated, so as to cause the growth of error probability.
It is easy to happen bit flipping mistake when in use, it is necessary to increase the complexity of correcting data error algorithm when in use.
The physical operations of NAND FLASH is mainly what unit carried out with block (Block).So when certain mistakes that can not be corrected occurs in block
It mistakes, since the mistake of data may cause the unstable of whole system.
NAND FLASH chip producer has only carried out simple physical testing after its encapsulation, does not carry out to its performance
Test comprehensively.Its internal bad block positioning is mainly written and read under normal temperature environment to be carried out with erasing move, can not be effective
Bad block is positioned, it is even more impossible to position wherein potential bad block and bit-errors block and carry out reasonable utilization.The side of common lookup bad block
Case: first in firmware, setting one can not error correction wrong bit threshold value (be typically chosen Nand Flash producer offer)；Its
It is secondary the physical operations such as to be wiped chip, be written and read at normal temperature；Finally further according to the wrong phenomenon of period data into
Row bad block label.Such way can not find out completely the bad block in chip, and it is even more impossible to position to potential bad block therein.
The appearance of bad block will cause the corrupt data of system, to reduce the reliability of system.If positioned using general bad block, it is
The stability of the system of maintenance, needs to increase the complexity of correcting data error algorithm.It in realization can restricted and NAND FLASH
Some performances of chip itself, correcting data error algorithm can not improve, therefore the stability of system is by certain restriction.
Summary of the invention
The technical problems to be solved by the present invention are: providing a kind of potential bad block localization method of solid state hard disk, it is intended to quasi-
The potential bad block for determining position solid state hard disk, can be improved the effective rate of utilization of chip capacity, improve the stability of Fixed disk.
In order to solve the above-mentioned technical problem, the technical solution adopted by the present invention are as follows: a kind of the potential bad of solid state hard disk is provided
Block localization method, burning has firmware in the solid state hard disk, and this method comprises the following steps:
The bad block table of reserved block table and multiple ranks is preset in firmware, wherein the rank of the bad block table is by position
The number of errors of data divides；
When operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than setting bad block threshold value
Potential bad block and repairable bit-errors block message, wherein institute's bit errors block message includes physical address and the position of block
Number of errors；
When operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than setting bad block threshold value
Potential bad block and repairable bit-errors block message, wherein institute's bit errors block message includes physical address and the position of block
Number of errors；
Potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and using in reserved block table
Reserved block replaces potential bad block, and contraposition erroneous block carries out classification processing and is added in the bad block table of corresponding rank.
Preferably, when the read/write data operation for carrying out sequence address respectively at a temperature of extreme value, record is more than setting
It the step of potential bad block of bad block threshold value and repairable bit-errors block message, specifically includes:
Under the maximum temperature threshold value that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note
Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value；
Under the minimum temperature threshold that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note
Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.
Preferably, described that the potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and utilize
After the step of reserved block in reserved block table replaces potential bad block, further includes:
The overall read/write operation that random address is carried out at a temperature of extreme value to block of withing a hook at the end is replaced, and record is more than to set
The potential bad block and repairable bit-errors block message of fixed bad block threshold value.
Preferably, contraposition erroneous block carries out classification processing and is added to after the step in the bad block table of corresponding rank,
Further include:
Judge to whether there is reserved block in reserved block table,
If continuing to replace potential bad block with reserved block there are reserved block in reserved block table；
If reserved block is not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block
To the threshold value for reaching bit-errors block.
In order to solve the above-mentioned technical problem, another technical solution used in the present invention are as follows: a kind of solid state hard disk is provided
Potential bad block positioning device, burning has firmware in the solid state hard disk, which includes:
Presetting module, for presetting the bad block table of reserved block table and multiple ranks in firmware, wherein the bad block
The rank of table is divided by the number of errors of position data；
First logging modle, when for being operated at a normal temperature to the overall read/write data for carrying out sequence address, record
More than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message includes
The physical address and bit-errors number of block；
Second logging modle, when for being operated at a temperature of extreme value to the overall read/write data for carrying out sequence address, record
More than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message includes
The physical address and bit-errors number of block；
Locating module, for by be more than set bad block threshold value potential bad block be added in the bad block table of initialization, and benefit
Potential bad block is replaced with the reserved block in reserved block table, and contraposition erroneous block carries out classification processing and is added to corresponding rank
Bad block table in.
Preferably, second logging modle specifically includes the first recording unit and the second recording unit,
First recording unit, for being carried out sequentially to overall under the maximum temperature threshold value that solid state hard disk is born
When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value；
Second recording unit, for being carried out sequentially to overall under the minimum temperature threshold that solid state hard disk is born
When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.
Preferably, described device further includes third logging modle, for withing a hook at the end the overall in extreme value temperature of block to replacement
When the lower read/write operation for carrying out random address, record is more than the potential bad block for setting bad block threshold value and repairable bit-errors
Block message.
Preferably, described device further includes judgment module, for whether there is reserved block in judging reserved block table,
There are when reserved block, continue to replace potential bad block with reserved block in reserved block table；
When reserved block being not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block
To the threshold value for reaching bit-errors block.
The beneficial effects of the present invention are: this programme mainly uses following step: preset in firmware reserved block table with
And the bad block table of multiple ranks, when operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than to set
The potential bad block and repairable bit-errors block message of fixed bad block threshold value, to overall progress sequence address at a temperature of extreme value
When read/write data operates, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, will be more than
The potential bad block for setting bad block threshold value is added in the bad block table of initialization, and potential using the reserved block replacement in reserved block table
Bad block, and contraposition erroneous block carry out classification processing and are added in the bad block table of corresponding rank, pass through normal temperature, extreme value
The temperature read/write operation overall to Fixed disk can find out potential bad block, and potential bad by using reserved block replacement
Block, and be stored in initialization bad block table, the position of potential bad block can be positioned；In addition, bit-errors block can also provide replacement block,
The stability that Fixed disk can be improved in turn ensures that NAND FLASH chip capacity is effectively utilized.
Detailed description of the invention
Fig. 1 is the method flow diagram of potential bad one embodiment of block localization method of solid state hard disk of the present invention；
Fig. 2 is the block diagram of one embodiment of potential bad block positioning device of solid state hard disk of the present invention.
Specific embodiment
To explain the technical content, the achieved purpose and the effect of the present invention in detail, below in conjunction with embodiment and cooperate attached
Figure is explained.
Please refer to Fig. 1, in the embodiment of the present invention, the potential bad block localization method of the solid state hard disk, the solid state hard disk
Middle burning has firmware, and this method comprises the following steps:
Step S10, the bad block table of reserved block table and multiple ranks is preset in firmware, wherein the bad block table
Rank is divided by the number of errors of position data.In this step, the rank of bad block table is determined by there is the number of bit mistake, can
It is set as the bad block table of 2bit, the specific size of the bad block table ... of 3bit, the bad block table of N bit, bad block table can be according to reality
Requirement determine.
Step S20, when operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than setting
The potential bad block of bad block threshold value and repairable bit-errors block message, wherein institute's bit errors block message includes the physics of block
Address and bit-errors number.In this step, the bad block that can position normal temperature at this time obtains initial bad blocks table, avoids in extreme value
These bad blocks of resetting under temperature environment, so as to improve location efficiency.In this step, it is hard that normal temperature can be solid-state
Temperature range of disk in the environment of room temperature.
Step S30, when operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than setting
The potential bad block of bad block threshold value and repairable bit-errors block message, wherein institute's bit errors block message includes the physics of block
Address and bit-errors number.In this step, it is contemplated that Gu the environment of too hard disk applications and the work of solid state hard disk abnormal condition
When, often there are some potential bad blocks, the read-write operation of data is had an impact.For this purpose, feelings of this step in extreme value temperature
Being written and read totally to solid state hard disk under condition, to find out potential bad block, in this way, can reduce error rate.
Step S40, the potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and utilizes reservation
Reserved block in block table replaces potential bad block, and contraposition erroneous block carries out classification processing and is added to the bad block of corresponding rank
In table.In this step, by the way that potential bad block is added in the bad block table of initialization, to position the position of potential bad block, and
The potential bad block can be substituted with reserved block, achieve the purpose that the stability for improving entire solid state hard disk.In order to make full use of
The memory space of chip, in this step, also contraposition erroneous block carries out classification processing, and the bit-errors block of classification processing can be replaced
Potential bad block, in this way, realizing the memory space for making full use of chip.
The beneficial effects of the present invention are: this programme mainly uses following step: preset in firmware reserved block table with
And the bad block table of multiple ranks, when operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than to set
The potential bad block and repairable bit-errors block message of fixed bad block threshold value, to overall progress sequence address at a temperature of extreme value
When read/write data operates, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, will be more than
The potential bad block for setting bad block threshold value is added in the bad block table of initialization, and potential using the reserved block replacement in reserved block table
Bad block, and contraposition erroneous block carry out classification processing and are added in the bad block table of corresponding rank, pass through normal temperature, extreme value
The temperature read/write operation overall to Fixed disk can find out potential bad block, and potential bad by using reserved block replacement
Block, and be stored in initialization bad block table, the position of potential bad block can be positioned；In addition, bit-errors block can also provide replacement block,
It can be improved the effective rate of utilization of chip capacity, so as to improve the stability of Fixed disk.
In a specific embodiment, the step S30, specifically includes:
Under the maximum temperature threshold value that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note
Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value；
Under the minimum temperature threshold that solid state hard disk is born, when being operated to the overall read/write data for carrying out sequence address, note
Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.
In the present embodiment, mainly the overall of solid state hard disk is written and read using very high temperature and extremely low temperature, certainly,
The very high temperature refers to that the maximum temperature threshold value that solid state hard disk is born, the extremely low temperature refer to the minimum temperature threshold that solid state hard disk is born
Value.It should be noted that can also use in the present embodiment and carry out the precipitous temperature of temperature slope between very high temperature and extremely low temperature
Variation, when being operated to the overall read/write data for carrying out sequence address, record be more than setting bad block threshold value potential bad block and can
The bit-errors block message of correction.The block of the read-write operation of solid state hard disk is detected by three kinds of above-mentioned temperature environments, with
Potential bad block is found out, the instability problem for reducing the transformation because of working environment, and solid state hard disk being caused to work.
In a specific embodiment, the potential bad block more than setting bad block threshold value is added to just in the step S40
In the bad block table of beginningization, and after the step of replacing potential bad block using the reserved block in reserved block table, further includes:
The overall read/write operation that random address is carried out at a temperature of extreme value to block of withing a hook at the end is replaced, and record is more than to set
The potential bad block and repairable bit-errors block message of fixed bad block threshold value.
In the present embodiment, in addition reserved block, which is replaced, to be needed after potential bad block to testing totally, comprising: in normal temperature
Under when being operated to the overall read/write data for carrying out random address, record is more than the potential bad block of setting bad block threshold value and can entangle
Positive bit-errors block message；Under the maximum temperature threshold value that solid state hard disk is born, to the overall read/write data for carrying out random address
When operation, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value；It is born in solid state hard disk
Minimum temperature threshold under, when operating to the overall read/write data for carrying out random address, record is more than the latent of setting bad block threshold value
In bad block and repairable bit-errors block message.In the present embodiment, the Fixed disk for replacing block of withing a hook at the end is carried out randomly
Data are read and write in location.In conjunction with the above-mentioned potential scheme quickly of positioning, this present embodiment is by searching solid hard disk in early period
The potential bad block of Suo Dingwei, the probability for occurring bad block in normal use process will drastically reduce, to ensure that use process
The stability of system.
In a specific embodiment, erroneous block is aligned in the step S40 to carry out classification processing and be added to corresponding
After step in the bad block table of rank, further includes:
Judge to whether there is reserved block in reserved block table,
If continuing to replace potential bad block with reserved block there are reserved block in reserved block table；
If reserved block is not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block
To the threshold value for reaching bit-errors block.
In the present embodiment, it is contemplated that be classified the bit-errors block of processing, it is likely that be exactly the object block that potential bad block occurs, be
It is set to obtain separately being stored in bit-errors block in the bad block table of classification processing more preferably using the stable situation of system is had no effect on.
In order to make full use of overall memory space, in the present solution, considering to make bit-errors block according to the sequence of error rate from less to more
Replacement for potential bad block is fast.Simultaneously it is considered that the problem of performance of reserved block is due to bit-errors block, the present embodiment first judges to protect
It stays in block table with the presence or absence of reserved block, then decides whether enable bit erroneous block further according to the presence or absence of reserved block.It should be noted that
, when using bit-errors block as replacement block, the setting of bit-errors threshold value should be much smaller than NAND FLASH chip producer
The threshold value of offer can so guarantee to be not in a large amount of bad block as far as possible.It is also desirable to which the minimum of bit-errors block is arranged
Block threshold value sounds a warning when being lower than threshold value, guarantees to guarantee that the stability of system data is wanted in solid state hard disk use process
It asks.
Referring to figure 2., the embodiment of the present invention, the potential bad block positioning device of the solid state hard disk, in the solid state hard disk
Burning has firmware, which includes:
Presetting module 10, for presetting the bad block table of reserved block table and multiple ranks in firmware, wherein described bad
The rank of block table is divided by the number of errors of position data；In the presetting module 10, the rank of bad block table is by there are the more of bit mistake
It is few to determine, it may be configured as the bad block table of 2bit, the bad block table ... of 3bit, the bad block table of N bit, the specific size of bad block table
It can be determined according to actual requirement.
First logging modle 20, when for being operated at a normal temperature to the overall read/write data for carrying out sequence address, note
Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message packet
Include the physical address and bit-errors number of block.First logging modle 20, can position normal temperature bad block obtain it is initial bad
Block table avoids these bad blocks of resetting under extreme value temperature environment, so as to improve location efficiency.
Second logging modle 30, when for being operated at a temperature of extreme value to the overall read/write data for carrying out sequence address, note
Record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value, wherein institute's bit errors block message packet
Include the physical address and bit-errors number of block.In view of the solid too environment of hard disk applications and the work of solid state hard disk abnormal condition
When, often there are some potential bad blocks, the read-write operation of data is had an impact.It, can be with for this purpose, second logging modle 30
Being written and read totally to solid state hard disk in the case where extreme value temperature, to find out potential bad block, in this way, can reduce mistake
Accidentally rate.
Locating module 40, for by be more than set bad block threshold value potential bad block be added in the bad block table of initialization, and
Potential bad block is replaced using the reserved block in reserved block table, and contraposition erroneous block carries out classification processing and is added to corresponding grade
In other bad block table.The locating module 40 can be oriented potential by the way that potential bad block to be added in the bad block table of initialization
The position of bad block, and the potential bad block can be substituted with reserved block, reach the mesh for improving the stability of entire solid state hard disk
's.In order to make full use of the memory space of chip, this locating module can also align erroneous block and carry out classification processing, the classification
The bit-errors block of processing can replace potential bad block, in this way, realizing the memory space for making full use of chip.
In a specific embodiment, second logging modle 30 specifically includes the first recording unit and the second record
Member,
First recording unit, for being carried out sequentially to overall under the maximum temperature threshold value that solid state hard disk is born
When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value；
Second recording unit, for being carried out sequentially to overall under the minimum temperature threshold that solid state hard disk is born
When the read/write data operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.
In the present embodiment, first recording unit and the second recording unit, mainly using very high temperature and extremely low temperature to solid
State hard disk is written and read totally, and certainly, which refers to the maximum temperature threshold value that solid state hard disk is born, the extremely low temperature
Refer to the minimum temperature threshold that solid state hard disk is born.It should be noted that in the present embodiment, the second logging modle can also include
Third recording unit, the third recording unit can be become using the precipitous temperature of temperature slope is carried out between very high temperature and extremely low temperature
Change, when operating to the overall read/write data for carrying out sequence address, record is more than the potential bad block of setting bad block threshold value and can entangle
Positive bit-errors block message.The block of the read-write operation of solid state hard disk is detected by three kinds of above-mentioned temperature environments, to look for
The instability problem that potential bad block out reduces the transformation because of working environment, and solid state hard disk is caused to work.
In a specific embodiment, described device further includes third logging modle, for withing a hook at the end the complete of block to replacement
When disk carries out the read/write operation of random address at a temperature of extreme value, record be more than setting bad block threshold value potential bad block and can
The bit-errors block message of correction.
In the present embodiment, which can need in addition to carry out to overall after reserved block replaces potential bad block
The record data of test.The step of detection, specifically includes: at a normal temperature to the overall read/write data for carrying out random address
When operation, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value；It is born in solid state hard disk
Maximum temperature threshold value under, when operating to the overall read/write data for carrying out random address, record is more than the latent of setting bad block threshold value
In bad block and repairable bit-errors block message；Under the minimum temperature threshold that solid state hard disk is born, carried out at random to overall
When the read/write data operation of address, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value.
In the present embodiment, random address read-write data are carried out to the Fixed disk for replacing block of withing a hook at the end.It is potential fast in conjunction with above-mentioned positioning
Fast scheme, this present embodiment positions potential bad block by scanning in early period to solid hard disk, in normal use process
The probability for bad block occur will drastically reduce, to ensure that the stability of use process system.
Whether total in a specific embodiment, described device further includes judgment module, for depositing in judging reserved block table
In reserved block,
There are when reserved block, continue to replace potential bad block with reserved block in reserved block table；
When reserved block being not present in reserved block table, it is straight that potential bad block is replaced according to the sequence of the number of errors of bit-errors block
To the threshold value for reaching bit-errors block.
In view of the bit-errors block of classification processing, it is likely that be exactly the object block that potential bad block occurs, in order to obtain it
More preferable utilize has no effect on the stable situation of system, bit-errors block is separately stored in the bad block table of classification processing.In order to sufficiently sharp
With overall memory space, in the present solution, considering bit-errors block according to error rate sequence from less to more as potential bad block
Replacement it is fast.Simultaneously it is considered that the problem of performance of reserved block is due to bit-errors block, the present embodiment are first judged by judgment module
It whether there is reserved block in reserved block table, then decide whether enable bit erroneous block further according to the presence or absence of reserved block.It needs to infuse
Meaning, when using bit-errors block as replacement block, the setting of bit-errors threshold value should be much smaller than NAND FLASH chip factory
The threshold value that family provides can so guarantee to be not in a large amount of bad block as far as possible.It is also desirable to which bit-errors block is arranged most
Few block threshold value, sounds a warning when being lower than threshold value, guarantees the stability that can guarantee system data in solid state hard disk use process
It is required that.
The above description is only an embodiment of the present invention, is not intended to limit the scope of the invention, all to utilize this hair
Equivalents made by bright specification and accompanying drawing content are applied directly or indirectly in relevant technical field, similarly include
In scope of patent protection of the invention.
Claims (2)
1. a kind of potential bad block localization method of solid state hard disk, which is characterized in that burning has firmware, the party in the solid state hard disk
Method includes the following steps:
The bad block table of reserved block table and multiple ranks is preset in firmware, wherein the rank of the bad block table is by position data
Number of errors divide；
When operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than the latent of setting bad block threshold value
In bad block and repairable bit-errors block message, wherein institute's bit errors block message includes the physical address and bit-errors of block
Number；
When operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than the latent of setting bad block threshold value
In bad block and repairable bit-errors block message, wherein institute's bit errors block message includes the physical address and bit-errors of block
Number；
Potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and utilizes the reservation in reserved block table
Block replaces potential bad block, and contraposition erroneous block carries out classification processing and is added in the bad block table of corresponding rank；
It is described that the potential bad block more than setting bad block threshold value is added in the bad block table of initialization, and using in reserved block table
Reserved block was replaced after the step of potential bad block, further includes:
The overall read/write operation that random address is carried out at a temperature of extreme value to block of withing a hook at the end is replaced, and record is more than that setting is bad
The potential bad block of block threshold value and repairable bit-errors block message；
Contraposition erroneous block carries out classification processing and is added to after the step in the bad block table of corresponding rank, further includes:
Judge to whether there is reserved block in reserved block table,
If continuing to replace potential bad block with reserved block there are reserved block in reserved block table；
If reserved block is not present in reserved block table, potential bad block is replaced until reaching according to the sequence of the number of errors of bit-errors block
The threshold value of erroneous block in place.
2. a kind of potential bad block positioning device of solid state hard disk, which is characterized in that burning has firmware in the solid state hard disk, the dress
It sets and includes:
Presetting module, for presetting the bad block table of reserved block table and multiple ranks in firmware, wherein the bad block table
Rank is divided by the number of errors of position data；
First logging modle, when for operating at a normal temperature to the overall read/write data for carrying out sequence address, record is more than
Set the potential bad block and repairable bit-errors block message of bad block threshold value, wherein institute's bit errors block message includes block
Physical address and bit-errors number；
Second logging modle, when for operating at a temperature of extreme value to the overall read/write data for carrying out sequence address, record is more than
Set the potential bad block and repairable bit-errors block message of bad block threshold value, wherein institute's bit errors block message includes block
Physical address and bit-errors number；
Locating module, for by be more than set bad block threshold value potential bad block be added in the bad block table of initialization, and using protect
The reserved block in block table is stayed to replace potential bad block, and contraposition erroneous block carries out classification processing and is added to the bad of corresponding rank
In block table；
Described device further includes third logging modle, for carrying out randomly at a temperature of extreme value to replacement the overall of block of withing a hook at the end
When the read/write operation of location, record is more than the potential bad block and repairable bit-errors block message of setting bad block threshold value；
Described device further includes judgment module, for whether there is reserved block in judging reserved block table,
There are when reserved block, continue to replace potential bad block with reserved block in reserved block table；
When reserved block being not present in reserved block table, potential bad block is replaced until reaching according to the sequence of the number of errors of bit-errors block
The threshold value of erroneous block in place.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610831985.1A CN106486170B (en) | 2016-09-06 | 2016-09-06 | The potential bad block localization method and device of solid state hard disk |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610831985.1A CN106486170B (en) | 2016-09-06 | 2016-09-06 | The potential bad block localization method and device of solid state hard disk |
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| Publication Number | Publication Date |
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| CN106486170A CN106486170A (en) | 2017-03-08 |
| CN106486170B true CN106486170B (en) | 2019-11-26 |
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| CN106981315B (en) * | 2017-03-10 | 2020-06-16 | 记忆科技(深圳)有限公司 | Method for identifying bad blocks of solid state disk |
| CN108628718B (en) * | 2018-03-29 | 2021-02-09 | 深圳忆联信息系统有限公司 | SSD (solid State disk) management method for reducing temperature influence and SSD |
| CN110364216B (en) * | 2018-04-09 | 2022-03-01 | 合肥沛睿微电子股份有限公司 | Solid state disk and operation method thereof |
| CN108536450B (en) * | 2018-06-19 | 2023-04-04 | 北京航星中云科技有限公司 | Method and device for card-opening and production-measuring of board-mounted solid-state disk |
| CN109582239B (en) * | 2018-12-03 | 2022-02-18 | 郑州云海信息技术有限公司 | SSD bad block table storage method, device, equipment and storage medium |
| CN109830257A (en) * | 2019-01-24 | 2019-05-31 | 山东华芯半导体有限公司 | A kind of method of weak piece of NAND Flash screening |
| CN109918022B (en) * | 2019-02-22 | 2021-11-09 | 山东华芯半导体有限公司 | SSD open card bad block table inheritance method |
| CN109979518B (en) * | 2019-03-07 | 2021-04-20 | 深圳警翼智能科技股份有限公司 | Bad area identification method and system for storage medium of law enforcement recorder |
| CN110517718B (en) * | 2019-08-22 | 2021-06-08 | 深圳忆联信息系统有限公司 | Method and system for effectively screening new and bad blocks of particles |
| CN111045603B (en) * | 2019-11-29 | 2022-11-22 | 苏州浪潮智能科技有限公司 | Bad block replacement method and device for solid state disk |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101320596A (en) * | 2008-06-10 | 2008-12-10 | 北京时代民芯科技有限公司 | Bad block management method facing high-capacity FLASH solid memory |
| CN101320592A (en) * | 2008-07-08 | 2008-12-10 | 北京时代民芯科技有限公司 | High-capacity FLASH solid memory controller |
| CN101388255A (en) * | 2008-10-31 | 2009-03-18 | 成都市华为赛门铁克科技有限公司 | Solid hard disk using method and apparatus |
| CN101510445A (en) * | 2009-03-19 | 2009-08-19 | 北京中星微电子有限公司 | Method and apparatus for storing and reading bad block meter of memory |
| CN101859604A (en) * | 2009-04-10 | 2010-10-13 | 国民技术股份有限公司 | Utilization method of flash memory bad block |
| CN102969028A (en) * | 2012-10-18 | 2013-03-13 | 记忆科技(深圳)有限公司 | Method, system, and flash memory of ECC dynamic adjustment |
| CN104380262A (en) * | 2012-06-29 | 2015-02-25 | 英特尔公司 | Bad block management mechanism |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009266258A (en) * | 2008-04-22 | 2009-11-12 | Hitachi Ltd | Semiconductor device |
| KR20150029402A (en) * | 2013-09-10 | 2015-03-18 | 에스케이하이닉스 주식회사 | Data storing system and operating method thereof |
-
2016
- 2016-09-06 CN CN201610831985.1A patent/CN106486170B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101320596A (en) * | 2008-06-10 | 2008-12-10 | 北京时代民芯科技有限公司 | Bad block management method facing high-capacity FLASH solid memory |
| CN101320592A (en) * | 2008-07-08 | 2008-12-10 | 北京时代民芯科技有限公司 | High-capacity FLASH solid memory controller |
| CN101388255A (en) * | 2008-10-31 | 2009-03-18 | 成都市华为赛门铁克科技有限公司 | Solid hard disk using method and apparatus |
| CN101510445A (en) * | 2009-03-19 | 2009-08-19 | 北京中星微电子有限公司 | Method and apparatus for storing and reading bad block meter of memory |
| CN101859604A (en) * | 2009-04-10 | 2010-10-13 | 国民技术股份有限公司 | Utilization method of flash memory bad block |
| CN104380262A (en) * | 2012-06-29 | 2015-02-25 | 英特尔公司 | Bad block management mechanism |
| CN102969028A (en) * | 2012-10-18 | 2013-03-13 | 记忆科技(深圳)有限公司 | Method, system, and flash memory of ECC dynamic adjustment |
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