CN105427895B - Nonvolatile memory chip test for video cloud application and application method - Google Patents
Nonvolatile memory chip test for video cloud application and application method Download PDFInfo
- Publication number
- CN105427895B CN105427895B CN201510772627.3A CN201510772627A CN105427895B CN 105427895 B CN105427895 B CN 105427895B CN 201510772627 A CN201510772627 A CN 201510772627A CN 105427895 B CN105427895 B CN 105427895B
- Authority
- CN
- China
- Prior art keywords
- test
- nonvolatile memory
- memory chip
- video cloud
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention discloses a kind of nonvolatile memory chip test for video cloud application and application methods, and head end video monitor realizes video acquisition and recording, and cloud platform is responsible for control management and video playback.Memory in video cloud application requires data hold time low；To data random write performance require it is low, data be be continuously written into account for it is leading；Low to the requirement of data reading performance, the probability being read after data storage is relatively low；It is relatively low to the quality requirement of data storage.According to These characteristics, the present invention proposes a kind of test and application method reducing nonvolatile memory cost in video cloud application, those nonvolatile memory chips for being unsatisfactory for any test condition during the test are re-used, and for the mass-memory unit in video cloud application.It re-uses the nonvolatile memory chip that these should be dropped and not only substantially reduces nonvolatile memory chip cost in video cloud application, but also can reduce environmental pollution.
Description
Technical field
The present invention relates to video cloud field of storage more particularly to a kind of nonvolatile memory cores for video cloud application
Built-in testing and application method.
Background technology
Nonvolatile memory is the nonvolatile solid state storage technology for remaining to preserve data after a kind of power-off, it is provided with
The superiority such as low-power consumption, read or write speed be fast, are widely used in mobile terminal device (being referred to as the application of a classes) and data center
Field (being referred to as the application of b classes) etc..The application of different field is also different to the performance requirement of nonvolatile memory.Such as a
Class, which is applied, is at least greater than the data hold time (data retention) of nonvolatile memory 5 years, and the application pair of b classes
The data hold time (data retention) of nonvolatile memory must be at least 10 years.The either application of a classes or b classes
Using, it is all very high to nonvolatile memory chip random write performance and reading performance requirement, also have to data storage quality very high
Requirement, if data storage quality it is low, the stability of system can be influenced.
Under normal conditions, non-volatile memory chips (die) can all pass through a large amount of test and matter before encapsulation is dispatched from the factory
Amount detection.No matter which kind of field last NAND chip is applied to, testing standard, screening conditions are all identical.Only those are logical
Then having crossed the NAND chips of testing process can just be packaged using the testing process after encapsulation, finally only passed through above
The NAND chip of all testing process can just be sold to client, be applied in different fields.As shown in Fig. 1 a piece of
NAND wafers (wafer), all non-volatile memory chips in this piece wafer can all pass through a series of test session and
Screening, can just be packaged eventually by the NAND chips of all testing standards into packaging and testing link, these qualified NAND
Chip is possible to final application to mobile terminal or server field etc., and those are unsatisfactory for any one testing standard
NAND chips will be dropped, this is not only the waste to chip resource, while also can also cause environmental pollution.Wafer yield
(yield) be exactly non-volatile memory chips number in the piece wafer by all tests with it is non-volatile in the piece wafer
The ratio of memory chips sum.Wafer yield is higher, also means that the production cost of manufacturer is lower, the buying of client
Price is also lower.But in fact, it is any a new generation technique non-volatile memory products initial stage yield be it is excessively poor, this
The production cost of manufacturer is undoubtedly increased, price remains high always so that nonvolatile memory can not be applied to other
In special dimension, this is also the main reason for NAND solid state disks can not replace mechanical hard disk (HDD) to store.
Video cloud application (being referred to as the application of c classes) is another application field for needing massive store, for example, security is supervised
Control system.Compared to a classes and b class applications, this application is much lower to the retention time requirement of memory, may only need half
One week etc. in year, 30 days or shorter also can seldom random writing operations and read operation be carried out to memory, only had occurred different
Reason condition can just transfer memory and carry out read operation, also very low to the storage quality requirement of memory.Such as in a cell
Monitoring system, most of the time especially at night, store a large amount of inessential data, such as road, leaf etc. in video,
And the behavioral data of the people of real concern only accounts for seldom part.If the bitstream data stored in the video occurs seldom
Storage mistake, hardly influence the quality of entire video.As can be seen that video cloud apply to the performance requirement of memory compared with
It is low, and to capacity requirement very high (each moment is generating video data), therefore be nearly all to use cost currently on the market
If lower mechanical hard disk is that video cloud supplier determines on cost and price using nonvolatile memory solid state disk
It cannot bear.
It to sum up describes, the present invention proposes a kind of method reducing nonvolatile memory cost in video cloud application.
Those NAND chips that any test condition is unsatisfactory in testing process are re-used, and for the great Rong in video cloud application
Measure storage device.It re-uses the NAND chip that these should be dropped and not only greatly reduces NAND chip in video cloud application
Cost, but also can reduce environmental pollution.
Invention content
In view of the drawbacks described above of the prior art, the technical problem to be solved by the present invention is to how in video cloud storage
The use cost of nonvolatile memory is reduced in.
To achieve the above object, the present invention provides a kind of nonvolatile memory chip tests for video cloud application
Method includes the following steps：
S1, data center's class application test and/or mobile terminal class are carried out to the nonvolatile memory bare die on wafer
Using test；It is naked for the nonvolatile memory for meeting data center's class application test and/or the application test of mobile terminal class
Piece then enters S2 or S3；For not meeting data center's class application test and/or mobile terminal class using the non-volatile of test
Memory die then enters S4；
S2, bare die is packaged, data center's class application test is carried out to the nonvolatile memory chip after encapsulation
And/or mobile terminal class application test；For meeting data center's class application test and/or mobile terminal class using the non-of test
Volatile memory chip then enters S3；For not meeting data center's class application test and/or the application test of mobile terminal class
Nonvolatile memory chip then enter S4；；
S3, direct goods dispatch；
S4, video cloud application test is carried out；For meeting the nonvolatile memory bare die or core of video cloud application test
Piece then enters S6 or S3；Nonvolatile memory bare die for not meeting video cloud application test then enters S5；
S5, it directly abandons；
S6, bare die is packaged, video cloud application test is carried out to the nonvolatile memory chip after encapsulation；For
The nonvolatile memory chip or chip for meeting video cloud application test then enter S3；For not meeting video cloud application test
Nonvolatile memory chip then enter S5.
Further, the video cloud includes data hold time test, the test of data random write performance, number using test
Quality test is stored according to reading performance and data.
Further, data center's class includes data hold time test, the survey of data random write performance using test
Examination, data reading performance and data store quality test.
Further, the mobile terminal class includes data hold time test, the survey of data random write performance using test
Examination, data reading performance and data store quality test.
Further, data center's class application test, mobile terminal class application test and video cloud application test by
The same test supplier completes or is completed by different suppliers.
Further, the nonvolatile memory chip is nand flash memory chip.
The present invention also provides any nonvolatile memory chips for video cloud application of such as claim 1-5
Application method includes the following steps：
S71, offer meet the nonvolatile memory chip of video cloud application test；
S72, the data hold time numerical value for determining each nonvolatile memory chip when video cloud application is tested
It is stored on the physical address that data hold time is best in this nonvolatile memory chip；
S73, automatically according to timer to needing the region refreshed to carry out refreshing behaviour on every nonvolatile memory chip
Make, the timing set by the timer is shorter than the data hold time of the nonvolatile memory chip.
Further, the timer is located on the solid-state memory where the nonvolatile memory chip or is located at
In the other equipment for carrying out data interaction with solid-state memory.
Further, the refresh operation is to read data and write back again.
Further, the nonvolatile memory chip is nand flash memory chip.
Video cloud (video cloud) application be it is a kind of based on cloud computing technology to meet massive video storage and management
Using, than it is more typical be exactly safety defense monitoring system, head end video monitor realizes video acquisition and recording, and cloud platform is responsible for
Control management and video playback.Video cloud application in memory have the characteristics that it is following one or more referred to as video cloud is answered
Use standard：
1. pair data hold time requires to be less than a classes and b class applications, e.g. half a year, 30 days or shorter 7 days；
2. pair data random write performance requires to be less than a classes and b class applications, data random write performance need not be fine, that is, exists
Video cloud application in data be be continuously written into account for it is leading；
3. pair data reading performance requires to be less than a classes and b class applications, because being read after data storage in video cloud application
Probability be relatively low；
4. the quality requirement of pair data storage is relatively low, (Error Correcting Code, data are stored and were read ECC
Mistake occurs for some inevitable data bit in journey, and ECC is exactly a kind of technology that can realize error detection and correction) it cannot repair completely
The positive data bit for storing all generation mistakes in data are also can be received.It can in the data read after ECC is corrected
To include the bit of mistake.
The These characteristics of memory requirement in being applied according to video cloud, it is non-that the present invention proposes that one kind reduces in video cloud application
The method of volatile memory cost re-uses those NAND chips for being unsatisfactory for any test condition during the test,
And for the mass-memory unit in video cloud application.The NAND chip that these should be dropped is re-used not only to drop significantly
NAND chip cost in low video cloud application, but also can reduce environmental pollution.
Further, the present invention proposes that a kind of positioning meets the test method of the NAND chip of video cloud application, such as Fig. 2 institutes
Show.Wherein, the stage, to be 1. 2. the test session of traditional NAND chip with the stage met a classes and/or b classes are applied to filter out
3. 4. NAND chip, stage are that the present invention meets the NAND chip and increased test that video cloud is applied to filter out with the stage
Link.1. the above-mentioned stage can be any one test phase finished from wafer manufacturing in NAND chip to shipment.Work as NAND
When chip enters test phase 1., the NAND chip of the test and screening conditions that have only passed through the stage 1 can just enter next
Stage test session 2. or direct goods dispatch (being 1. the last one test phase of NAND chip before manufacture when the stage)；And
The NAND chip 1. tested and screened not over the stage is put into the stage and 3. tests and meet c class application standards to filter out
NAND chip, meeting the stage, 3. test condition could 4. 3. test session or direct goods dispatch (be when the stage into next stage
The last one test phase of chip before manufacture).By above-mentioned testing process, meet this hair to position and filter out those
The NAND chip of photopic vision frequency cloud application condition (one or more feature as described above), and under conventional situation, these NAND
Chip can be dropped.
1. and 2. test phase and 3. and 4. test phase can be completed by the same test supplier, can also be by not
Same supplier completes.
After filtering out the NAND chip for meeting c class application standards, present invention proposition is a kind of to be applied to these NAND chips
Method in video cloud application, as shown in Figure 3.Wherein 2. equipment is at least by several NAND for meeting c class application standards
1. the solid-state memory that chip and storage control or processor are constituted, equipment are the higher level equipment of equipment 2..Due to meeting this
The data retention time of the NAND chip of invention video cloud application will not be too long, therefore may need to be periodically flushed to ensure number
According to integrality and reliability.We define equipment refresh interval DRI (the Device refresh of equipment 2. solid-state memory
Interval), the DRI should 2. the middle shortest NAND chip of data hold time determines by equipment.Every NAND chip
Firmware information (including data hold time) should be determined in test, and these information should be stored in NAND chip and protect
(data hold time is more than DRI) is held on time best physical address, in case these information are lost before refresh operation arrival
It loses.According to refresh timer equipment 1. or equipment 2. on, the refresh scheme of solid-state memory of the present invention can have following
Two schemes.
Scheme 1：As shown in Figure 2, if 2. equipment carries refresh timer (such as storage control in solid state disk memory
Timer on device or processor processed), then storage control or processor in the solid state disk memory
Automatic periodically (being determined by DRI) (reads data and again to needing the region refreshed to carry out refresh operation on every NAND chip
It writes back).For example, the refresh interval of whole equipment 2. is set as 7 days, i.e., the most short data retention time of all NAND chips
It should be greater than or equal to 7 days.So 2. middle storage control or processor are under the triggering of timer for equipment, every 7 days to institute
There is the region for needing to refresh on NAND chip to execute a refresh operation, to ensure the data integrity of solid-state memory.
Scheme 2：As shown in Fig. 2, if equipment 2. in there is no a timer, and higher level equipment 1. in carry timer, then
Can by higher level equipment, 1. (such as PC) periodically sends refresh command, the then equipment 2. storage in solid state disk memory
Controller or processor, which receive to order, simultaneously executes refresh command, so to equipment 2. in all NAND chips on need to refresh
Region carries out refresh operation.
The technique effect of the design of the present invention, concrete structure and generation is described further below with reference to attached drawing, with
It is fully understood from the purpose of the present invention, feature and effect.
Description of the drawings
Fig. 1 is NAND wafers (Wafer) schematic diagram；
Wherein, 1 NAND wafers (Wafer) are indicated, 2 indicate the chip of test passes, and 3 indicate the chip of test failure；
Fig. 2 is the NAND chip test method for meeting video cloud application of a preferred embodiment of the present invention；
Fig. 3 is the method being applied to these NAND chips in video cloud application of a preferred embodiment of the present invention；
Fig. 4 is the safety defense monitoring system schematic diagram of a preferred embodiment of the present invention.
Specific implementation mode
A specific embodiment is named to be further elaborated.
There are Micron, Intel, Samsung, Hynix, Toshiba etc. in the producer of production NAND chip currently on the market, this
A little manufacturers can abandon a large amount of not by a classes and/or b classes application test and screening criteria in NAND chip test process
Chip, the present invention can re-use these discarded NAND chips to meet video cloud application, be as follows shown.
Step 1:Those are bought from above-mentioned producer with very low very low price to fail through a classes and/or the application test of b classes
With the NAND chip of screening criteria；
Step 2:Country's test business men carries out above-mentioned NAND chip a series of tests and meets video cloud to filter out and answer again
With the NAND chip of standard；
Step 3:By the solid state disk control process of the above-mentioned NAND chip and independent research for meeting video cloud application standard
Device is assembled into cheap solid state disk memory；
Step 4:By above-mentioned cheap solid state disk memory application in video cloud application (such as safety monitoring system
System).
Such as the memory used in current safety defense monitoring system is all mostly mechanical hard disk, meets performance requirement
Price is very cheap simultaneously.And the solid-state memory for applying the present invention cheap is equally applicable to safety defense monitoring system
In, and performance is also got well than traditional mechanical hard disk.If Fig. 4 is simple safety defense monitoring system schematic diagram, equipment 0, equipment 1
And be all the head end video monitoring device of Internet of Things to equipment n-1, and the memory that they are used all is above-mentioned cheap
NAND solid state disk memories, equipment n is a long-range data center.Equipment 0, equipment 1 and to consolidating in equipment n-1
State harddisk memory can be constantly continuously written into data, and seldom be read, only just meeting when something unexpected happened situation
Video data is transferred temporarily.If minimum only 7 days of the data hold time of these solid state disk memories, front end is set
It is standby only local to preserve video data 7 days, then by transmission of network to high in the clouds data center to back up, and headend equipment
Also just without refreshing the data in solid-state memory.Therefore this method for reducing nonvolatile memory cost of the present invention is complete
It can be applied in video cloud application.
The preferred embodiment of the present invention has been described in detail above.It should be appreciated that the ordinary skill of this field is without wound
The property made labour, which according to the present invention can conceive, makes many modifications and variations.Therefore, all technician in the art
Pass through the available technology of logical analysis, reasoning, or a limited experiment on the basis of existing technology under this invention's idea
Scheme, all should be in the protection domain being defined in the patent claims.
Claims (10)
1. a kind of nonvolatile memory chip test method for video cloud application, which is characterized in that include the following steps：
S1, data center's class application test and/or mobile terminal class application are carried out to the nonvolatile memory bare die on wafer
Test；For meeting the nonvolatile memory bare die of data center's class application test and/or the application test of mobile terminal class then
Into S2 or S3；For not meeting the non-volatile memories of data center's class application test and/or the application test of mobile terminal class
Device bare die then enters S4；
S2, bare die is packaged, to the nonvolatile memory chip after encapsulation carry out data center class application test and/or
The application test of mobile terminal class；For meeting data center's class application test and/or mobile terminal class using the non-volatile of test
Property memory chip then enter S3；For not meeting data center's class application test and/or mobile terminal class using the non-of test
Volatile memory chip then enters S4；
S3, direct goods dispatch；
S4, video cloud application test is carried out；The nonvolatile memory bare die tested or chip are applied for meeting video cloud then
Into S6 or S3；Nonvolatile memory bare die for not meeting video cloud application test then enters S5；
S5, it directly abandons；
S6, bare die is packaged, video cloud application test is carried out to the nonvolatile memory chip after encapsulation；For meeting
The nonvolatile memory chip or chip of video cloud application test then enter S3；For not meeting the non-of video cloud application test
Volatile memory chip then enters S5.
2. the nonvolatile memory chip test method for video cloud application as described in claim 1, which is characterized in that
The video cloud includes that data hold time test, the test of data random write performance, data reading performance and data are deposited using test
Store up quality test.
3. the nonvolatile memory chip test method for video cloud application as described in claim 1, which is characterized in that
Data center's class includes data hold time test, the test of data random write performance, data reading performance sum number using test
According to storage quality test.
4. the nonvolatile memory chip test method for video cloud application as described in claim 1, which is characterized in that
The mobile terminal class includes data hold time test, the test of data random write performance, data reading performance sum number using test
According to storage quality test.
5. the nonvolatile memory chip test method for video cloud application as described in claim 1, which is characterized in that
Data center's class application test, mobile terminal class application test and video cloud application are tested complete by the same test supplier
It is completed at or by different suppliers.
6. the nonvolatile memory chip test side for video cloud application as described in any in claim 1-5
Method, which is characterized in that the nonvolatile memory chip is nand flash memory chip.
7. the test method as described in claim 1-5 any nonvolatile memory chips applied for video cloud,
It is characterized in that, includes the following steps：
S71, offer meet the nonvolatile memory chip of video cloud application test；
S72, the data hold time numerical value that each nonvolatile memory chip is determined when video cloud application is tested is stored
In this nonvolatile memory chip on the best physical address of data hold time；
S73, automatically according to timer to needed on every nonvolatile memory chip the region refreshed carry out refresh operation, institute
The timing stated set by timer is shorter than the data hold time of the nonvolatile memory chip.
8. the nonvolatile memory chip test method for video cloud application as claimed in claim 7, which is characterized in that
The timer is located on the solid-state memory where the nonvolatile memory chip or is located at and solid-state memory carries out
In the other equipment of data interaction.
9. the nonvolatile memory chip test method for video cloud application as claimed in claim 7, which is characterized in that
The refresh operation is to read data and write back again.
10. the nonvolatile memory chip test side for video cloud application as described in any in claim 8-9
Method, the nonvolatile memory chip are nand flash memory chip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510772627.3A CN105427895B (en) | 2015-11-12 | 2015-11-12 | Nonvolatile memory chip test for video cloud application and application method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510772627.3A CN105427895B (en) | 2015-11-12 | 2015-11-12 | Nonvolatile memory chip test for video cloud application and application method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105427895A CN105427895A (en) | 2016-03-23 |
| CN105427895B true CN105427895B (en) | 2018-10-23 |
Family
ID=55506044
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510772627.3A Active CN105427895B (en) | 2015-11-12 | 2015-11-12 | Nonvolatile memory chip test for video cloud application and application method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105427895B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107360050B (en) * | 2016-05-10 | 2020-08-18 | 杭州海康威视数字技术股份有限公司 | Automatic testing method and device for performance of video cloud storage node |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102890971A (en) * | 2012-10-22 | 2013-01-23 | 上海宏力半导体制造有限公司 | Reliability test method for memory |
| CN104079892A (en) * | 2014-07-17 | 2014-10-01 | 山东同方焮通经贸有限公司 | Video cloud monitoring method and system based on Internet |
| CN104572298A (en) * | 2014-12-31 | 2015-04-29 | 四达时代通讯网络技术有限公司 | Video cloud platform resource dispatching method and device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9082474B2 (en) * | 2011-04-21 | 2015-07-14 | Micron Technology, Inc. | Method and apparatus for providing preloaded non-volatile memory content |
-
2015
- 2015-11-12 CN CN201510772627.3A patent/CN105427895B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102890971A (en) * | 2012-10-22 | 2013-01-23 | 上海宏力半导体制造有限公司 | Reliability test method for memory |
| CN104079892A (en) * | 2014-07-17 | 2014-10-01 | 山东同方焮通经贸有限公司 | Video cloud monitoring method and system based on Internet |
| CN104572298A (en) * | 2014-12-31 | 2015-04-29 | 四达时代通讯网络技术有限公司 | Video cloud platform resource dispatching method and device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105427895A (en) | 2016-03-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108172262A (en) | Memory device and its operating method comprising recoverable volatile memory | |
| CN103854705A (en) | Method and system for providing smart memory architecture | |
| US7401270B2 (en) | Repair of semiconductor memory device via external command | |
| CN101853217B (en) | Cache controlling apparatus, information processing apparatus, and computer-readable recording medium on or in which cache controlling program is recorded | |
| US20140245084A1 (en) | Methods and systems for monitoring write operations of non-volatile memory | |
| US8862953B2 (en) | Memory testing with selective use of an error correction code decoder | |
| US10521294B2 (en) | Patrol scrub periods based on power status | |
| CN106484316A (en) | Method for managing a memory device, memory device and controller | |
| CN106682162A (en) | Log management method and device | |
| CN109614324A (en) | A kind of method for generating test case and device | |
| CN103247347A (en) | Method and system for providing smart memory architecture | |
| CN108511029B (en) | Built-in self-test and repair system and method for dual-port SRAM array in FPGA | |
| CN102298543A (en) | Memory management method and memory management device | |
| KR20170044347A (en) | Memory device and operating method for memory device | |
| US11604693B2 (en) | Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same | |
| CN105229742A (en) | memory access speed | |
| CN109872763B (en) | Memory system for improving reliability of memory and memory management method thereof | |
| CN108170366A (en) | Storage medium management method, device and storage device in storage device | |
| CN104751888A (en) | Power-fail protection method and device for nonvolatile memory | |
| CN103279402B (en) | Data reconstruction method based on multilevel-cell solid state hard disc and solid state hard disc | |
| CN105427895B (en) | Nonvolatile memory chip test for video cloud application and application method | |
| US20090287957A1 (en) | Method for controlling a memory module and memory control unit | |
| US20120269018A1 (en) | Memory system having memory and memory controller and operation method thereof | |
| CN109324932A (en) | Data-storage system, date storage method and the method for manufacturing solid state drive | |
| CN115543678B (en) | Method, system, storage medium and equipment for monitoring DDR5 memory granule errors |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |