CN105388842A - Part surface machining defect positioning method - Google Patents
Part surface machining defect positioning method Download PDFInfo
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- CN105388842A CN105388842A CN201510915417.5A CN201510915417A CN105388842A CN 105388842 A CN105388842 A CN 105388842A CN 201510915417 A CN201510915417 A CN 201510915417A CN 105388842 A CN105388842 A CN 105388842A
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- interpolation section
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- track interpolation
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
- G05B19/402—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for positioning, e.g. centring a tool relative to a hole in the workpiece, additional detection means to correct position
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Abstract
The invention discloses a part surface machining defect positioning method and belongs to the numerical control machining technical field. The method includes the following steps that: S1, the interpolation data of a part machining cutter path and running state data of a machine tool are acquired, and instruction signals of each cutter path interpolation section are extracted, or the instruction signals and feedback signals of each cutter path interpolation section are extracted, and derivative signals can be obtained through calculation according to the instruction signals and the feedback signals; S2, n progressive color intervals are divided, and color values corresponding to each cutter path interpolation section are obtained through calculation according to the instruction signals or the derivative signals; S3, colors are attached to each three-dimensional cutter path interpolation section according to the color values obtained in the step S2, so that a three-dimensional chromatogram can be formed; and S4, the three-dimensional chromatogram in the step S3 is observed, and horizontal or vertical discontinuous positions of the colors in the three-dimensional chromatogram are the positions of defects of a part correspondingly. With the part surface machining defect positioning method of the invention adopted, the machining defects of the part can be positioned quickly and intuitively.
Description
Technical field
The invention belongs to CNC processing technology field, more specifically, relate to a kind of localization method of piece surface manufacturing deficiency.
Background technology
In control procedure, there is a large amount of intermediate data in digital control system by control algolithm process, generated by cutter path and Cutting Process parameter, also have a large amount of sampled signals from the sensor feedback lathe, motor simultaneously.
Real-time data signal in these process includes command signal, feedback signal and derivative signal three kinds.Command signal, also claims director data, is the cycles per instruction that digital control system exports in control procedure, comprises the location of instruction data after NC Interpolation.Feedback signal be digital control system in control procedure, from the signal that the sensor feedback motor and lathe is returned, the sample rate current data etc. of the motor actual location data of returning as encoder feedback, tracking error, Hall element feedback.Derivative signal is the value obtained by computing method such as difference, conversion and statistics from command signal and the above-mentioned two kinds of signals of feedback signal, as the aggregate velocity of interpolation section, acceleration and prompt degree.These data-signals are precious data sources that the large market demand under current network manufacturing environment is needed badly with service, and they can provide important evidence for piece surface manufacturing deficiency location.
At present, complex curved surface parts is processed, detect its surface whether defectiveness and to position defect be all the general conventional method continued to use, namely detected by Surface Flaw Detection device, coordinate measuring machine or roughness measuring instrument after part machines.In the Chinese patent " a kind of pick-up unit for curve surface work pieces surface imperfection " of application number 201410292616.0, by the pick-up unit that miniature zooming microscopic system, light-source system, loading cover etc. form, part after processing is carried out taking pictures, image acquisition, detect curved surface part surface imperfection.
But, under the job shop environment nowadays focusing on production efficiency, these detection methods and process more consuming time and inconvenient, and then inconvenient locating element surface working defect.Checkedly to cut although existing Path simulation software can meet in the processing preparatory stage, owe the primary demand of cutting, the defect location of cutting simulation on geometric model and geometry cutter track can be realized, but cannot predict the surface defects of parts of reality processing, and then can not process whether defectiveness carries out rapid evaluation and defect location to part is actual.
Summary of the invention
For above defect or the Improvement requirement of prior art, the invention provides a kind of localization method of piece surface manufacturing deficiency, it obtains three dimensional chromatogram according to command signal or derivative signal, uncontinuity that is horizontal in three dimensional chromatogram or longitudinal color can be found intuitively, get final product the fault location of quick position processing parts, especially complex curved surface parts is suitable for, can when do not need to cut or a single-piece trial cut once location defect quickly and intuitively, solve that curved surface part suface processing quality is measured, the technical matters of location defect inconvenience thus.
For achieving the above object, according to one aspect of the present invention, provide a kind of localization method of piece surface manufacturing deficiency, it is characterized in that, it comprises the steps:
S1: the interpolation data and the lathe running state data that gather part processing cutter track, extracts the command signal of each cutter track interpolation section, or
Extract command signal and the feedback signal of each cutter track interpolation section, and calculate acquisition derivative signal according to described command signal and feedback signal;
S2: mark off between n progressive chromatic zones, calculate according to described command signal or described derivative signal the color value obtaining each cutter track interpolation section correspondence;
S3: calculate the color value obtained according to step S2, enclose color to each three-dimensional cutter track interpolation line segment, forms three dimensional chromatogram;
S4: observe three dimensional chromatogram described in step S3, in this three dimensional chromatogram, the transverse direction of color or longitudinal uncontinuity place correspond to the defective locations place of part.
In above inventive concept, three dimensional chromatogram can be the three dimensional chromatogram of the different grey of gray-scale value or the three dimensional chromatogram of colour.Obtain three dimensional chromatogram according to command signal or derivative signal, can find uncontinuity that is horizontal in three dimensional chromatogram or longitudinal color intuitively, in three dimensional chromatogram, the discontinuous place of color corresponds to the fault location of processing parts.
Further, in step S2, the method calculating the color value obtaining each cutter track interpolation section correspondence comprises the steps:
(1) the maximal value F of command signal or derivative signal in cutter track interpolation section is determined
maxwith minimum value F
min;
(2) command signal value of cutter track interpolation section or derivative signal value are divided into n signal spacing, then each signal spacing size is as follows:
Wherein, n is the command signal value of cutter track interpolation section or the signal spacing number of derivative signal value division, and Δ F is the command signal value of cutter track interpolation section or the size of derivative signal value demarcation interval;
(3) if the signal value F of a jth cutter track interpolation section
jmeet following Rule of judgment:
(F
min+(i-1)·ΔF)≤F
j＜(F
min+i·ΔF)
Wherein, i=1, the number between 2,3..., n, n chromatic zones, j=1,2,3 ..., M, M are the number of cutter track interpolation section,
The then signal value F of a jth cutter track interpolation section
jjust drop in i-th chromatic zones, by the color value C that a cutter track interpolation section jth signal value is enclosed
i, C
ibe the color value in i-th chromatic zones, i=1,2,3..., n;
If the signal value F of a jth cutter track interpolation section
j> F
maxor F
j< F
min, then a jth cutter track interpolation section is enclosed separately a color value, this color value is different from the color value between described n progressive chromatic zones.
Further, in step S1, extract command signal and the feedback signal of each cutter track interpolation section, and adopt difference, conversion and statistical method to calculate derivative signal according to described command signal and feedback signal.
Further, described derivative signal comprises prompt degree, tracking error and aggregate velocity.
In general, the above technical scheme conceived by the present invention compared with prior art, can obtain following beneficial effect:
In the present invention, according to command signal or the derivative signal of numerically-controlled machine, calculate and form three dimensional chromatogram, change signal data into color value, directly by observing the color uncontinuity of chromatogram, can navigate to processing parts defective locations very intuitively, fast, determine piece surface whether defectiveness is provided convenience for user is quick and convenient, and then provides parameter optimization countermeasure to save the time to user.The method can realize processed complex curved surface part (part as the material expensive such as avigation piece, blade) not to be needed to cut or only need trial cut once (when being formed three dimensional chromatogram by command signal without the need to cutting, when forming three dimensional chromatogram by derivative signal, need trial cut once), the position of user's quick position finished surface defect, the workpiece reduced because repeatedly trial cut produces can be allowed to waste.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of the localization method of piece surface manufacturing deficiency in the embodiment of the present invention;
Fig. 2 calculates the schematic diagram obtaining derivative signal in cutter track interpolation section in the embodiment of the present invention;
Fig. 3 be in the embodiment of the present invention in cutter spacing interpolation section aggregate velocity be divided into n (n=5) individual interval time corresponding n chromatic zones between schematic diagram;
Fig. 4 (a) is the three dimensional chromatogram of aggregate velocity in the embodiment of the present invention; Fig. 4 (b) is the photo of the processing parts of aggregate velocity three dimensional chromatogram in corresponding diagram 4 (a).
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.In addition, if below in described each embodiment of the present invention involved technical characteristic do not form conflict each other and just can mutually combine.
Fig. 1 is the process flow diagram of the localization method of piece surface manufacturing deficiency in the embodiment of the present invention, and as seen from the figure, the inventive method mainly comprises four large steps:
S1: the interpolation data and the lathe running state data that gather part processing cutter track, extracts the command signal of each cutter track interpolation section, or
Extract command signal and the feedback signal of each cutter track interpolation section, and calculate acquisition derivative signal (corresponding to: gather processing real time signal data) according to described command signal and feedback signal;
S2: mark off between n progressive chromatic zones, calculate according to described command signal or described derivative signal the color value (corresponding to: the color value calculating each cutter track interpolation section according to signal magnitude) obtaining each cutter track interpolation section correspondence;
S3: calculate the color value obtained according to step S2, enclose color to each three-dimensional cutter track interpolation line segment, forms three dimensional chromatogram (correspond to: color to each cutter track interpolation section, form three dimensional chromatogram);
S4: observe three dimensional chromatogram described in step S3, in this three dimensional chromatogram, the transverse direction of color or longitudinal uncontinuity place correspond to the defective locations place (observe the uncontinuity feature of chromatogram color, navigate to defective locations) of part.
In order to explanation the inventive method specifically, be further described below again below in conjunction with specific embodiment:
S1: gather a process data text file from lathe, form cutter spacing interpolation segment signal data, process data comprise command signal and feedback signal two kinds of data types.Command signal is the kinematic axis X, Y, Z axis location of instruction after digital control system interpolation; Feedback signal is kinematic axis X, Y, Z axis feedback position after digital control system interpolation, spindle motor current and motion feed shaft X, Y, Z axis electric current.
Use difference method, can also calculate derivative signal by command signal and feedback information, available following computing formula calculates aggregate velocity, acceleration, the prompt degree of each cutter spacing interpolation section respectively.Fig. 2 calculates the schematic diagram obtaining derivative signal in cutter track interpolation section in the embodiment of the present invention, concrete:
Current cutter track interpolation section P
ip
i+1aggregate velocity V
icomputing formula is:
Wherein, i=1,2,3..., n, n are total hop count of cutter track interpolation section, and Δ T is interpolation cycle, Δ T=1ms in the present embodiment, Δ S
i=| P
ip
i+1| be i-th cutter track interpolated point P
iwith the i-th+1 cutter track interpolated point P
i+1between distance.
Current cutter track interpolation section
acceleration a
icomputing formula is:
Wherein, V
ibe i-th cutter track interpolation section P
ip
i+1aggregate velocity, V
i-1be the i-th-1 cutter track interpolation section P
i-1p
iaggregate velocity;
Current cutter track interpolation section
prompt degree J
icomputing formula is:
Wherein, a
ibe i-th cutter track interpolation section P
ip
i+1acceleration, a
i-1be the i-th-1 cutter track interpolation section P
i-1p
iacceleration.
In addition, also according to command signal and feedback signal, current cutter track interpolation section P can be calculated
ip
i+1with error T
e:
Wherein, C
ibe the location of instruction of i-th interpolated point, T
ifor the physical location of i-th interpolated point of feedback, C
i+1be the location of instruction of the i-th+1 interpolated point, T
i+1for the physical location of the i-th+1 interpolated point of feedback, | C
it
i| be the location of instruction C of i-th interpolated point
iwith the physical location T of feedback
ispacing, | C
i+1t
i+1be the location of instruction C of the i-th+1 interpolated point
i+1with the physical location T of feedback
i+1spacing.
Sometimes, directly can carry out next step calculating according to command signal, need to utilize command signal and feedback signal sometimes and then calculate derivative signal, just can carry out the calculating of step S2.
S2: mark off between n progressive chromatic zones, for aggregate velocity, the color value between the chromatic zones calculating each cutter track interpolation section correspondence according to aggregate velocity size, is specially:
(1) at the aggregate velocity V of all cutter spacing interpolation sections
1, V
2, V
3..., V
min, determine maximum aggregate velocity V
max, V
maxequal the program speed F (during as F=5000mm/min) in G code program, wherein minimum aggregate velocity value V
min=0.
(2) aggregate velocity of cutter spacing interpolation section is divided into n (n=5) individual interval.Fig. 3 be in the embodiment of the present invention in cutter spacing interpolation section aggregate velocity be divided into n (n=5) individual interval time corresponding n chromatic zones between schematic diagram.After being divided into five intervals, the size in each interval is:
Wherein, n is the signal spacing number that the aggregate velocity of cutter track interpolation section divides, and n is 5.
(3) if the signal value V of a jth cutter track interpolation section
jmeet following Rule of judgment:
(V
min+(i-1)·ΔV)≤V
j＜(V
min+i·ΔV)
Wherein, i=1, the number between 2,3..., n, n chromatic zones, j=1,2,3 ..., M, M are the number of cutter track interpolation section,
The then signal value V of a jth cutter track interpolation section
jjust drop in i-th chromatic zones, a jth cutter track interpolation section color value C
i, C
ibe the color value in i-th chromatic zones, i=1,2,3..., n, n are 5;
If the signal value F of a jth cutter track interpolation section
j> F
maxor F
j< F
min, then a jth cutter track interpolation section is enclosed separately a color value, this color value is different from the color value between described n progressive chromatic zones.
As shown in Figure 3, by five interval corresponding five kinds of progressive colors, represent by light green color, bottle green, cyan, light blue, blue 5 kinds of progressive colors, an interval correspond to a color value, and i-th interval color value is designated as C
i, i=1,2,3..., n.Like this, according to step (2), the color of a jth cutter track interpolation section is C
i, apparent color can be carried out with HLS color value.In addition, for V
j> V
maxor V
j< V
mintime, a jth cutter track interpolation section is enclosed separately a kind of color value C
o, as gray value, this place is possible manufacturing deficiency place.
S3: each cutter track interpolation section color value C calculated according to step S2
i, carry out painted and 3-D display to three-dimensional cutter track interpolation line segment, form three dimensional chromatogram, three dimensional chromatogram is the different grey chromatograms of gray-scale value or colored chromatogram;
In Practical Project practice, can also select to carry out painted with acceleration (derivative signal), torque current (command signal), tracking error (command signal) isochromatic spectrum variable, carry out three dimensional chromatogram display.
S4: in three dimensional chromatogram, observes the horizontal and vertical uncontinuity of color, and in three-dimensional chromatogram, the discontinuous place of color corresponds to processing parts fault location.
Fig. 4 (a) is the three dimensional chromatogram of aggregate velocity in the embodiment of the present invention; Fig. 4 (b) is the photo of the processing parts of aggregate velocity three dimensional chromatogram in corresponding diagram 4 (a).As seen from the figure, it is a curve surface work pieces, can see that the aggregate velocity chromatogram of chamfered region is blue (aggregate velocity is higher) by the three-dimensional interpolation cutter track chromatogram of aggregate velocity, and adjacent bevel surfaces region synthesis speed chromatogram is jade-green (aggregate velocity is relatively low), form turquoise color and change discontinuous region, in conjunction with the photo of surface of the work after actual processing, can see that there are five obvious indentures at inclined-plane place, this indenture is manufacturing deficiency place.
In above embodiment, the three dimensional chromatogram of aggregate velocity is utilized to get final product the manufacturing deficiency position on positioning workpieces surface.From this data type of aggregate velocity, for the parameter optimization of user provides guidance.Like this, user can optimize the parameter of digital control system speeds control aspect, eliminates the manufacturing deficiency of surface of the work.
In the inventive method, employing be based on chromatogram localization method, surface defects of parts position can be navigated to intuitively and determine its Crack cause, for user optimization parameter, fast eliminating manufacturing deficiency reference is provided, greatly facilitate user.
Those skilled in the art will readily understand; the foregoing is only preferred embodiment of the present invention; not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (4)
1. a localization method for piece surface manufacturing deficiency, is characterized in that, it comprises the steps:
S1: the interpolation data and the lathe running state data that gather part processing cutter track, extracts the command signal of each cutter track interpolation section, or
Extract command signal and the feedback signal of each cutter track interpolation section, and calculate acquisition derivative signal according to described command signal and feedback signal;
S2: mark off between n progressive chromatic zones, calculate according to described command signal or described derivative signal the color value obtaining each cutter track interpolation section correspondence;
S3: calculate the color value obtained according to step S2, enclose color to each three-dimensional cutter track interpolation line segment, forms three dimensional chromatogram;
S4: observe three dimensional chromatogram described in step S3, in this three dimensional chromatogram, the transverse direction of color or longitudinal uncontinuity place correspond to the defective locations place of part.
2. the localization method of a kind of piece surface manufacturing deficiency as claimed in claim 1, is characterized in that, in step S2, the method calculating the color value obtaining each cutter track interpolation section correspondence comprises the steps:
(1) the maximal value F of command signal or derivative signal in cutter track interpolation section is determined
maxwith minimum value F
min;
(2) command signal value of cutter track interpolation section or derivative signal value are divided into n signal spacing, then each signal spacing size is as follows:
Wherein, n is the command signal value of cutter track interpolation section or the signal spacing number of derivative signal value division, and Δ F is the command signal value of cutter track interpolation section or the size of derivative signal value demarcation interval;
(3) if the signal value F of a jth cutter track interpolation section
jmeet following Rule of judgment:
(F
min+(i-1)·ΔF)≤F
j＜(F
min+i·ΔF)
Wherein, i=1, the number between 2,3..., n, n chromatic zones, j=1,2,3 ..., M, M are the number of cutter track interpolation section,
The then signal value F of a jth cutter track interpolation section
jjust drop in i-th chromatic zones, by a jth color value C that cutter track interpolation section is enclosed
i, C
ibe the color value in i-th chromatic zones, i=1,2,3..., n;
If the signal value F of a jth cutter track interpolation section
j> F
maxor F
j< F
min, then a jth cutter track interpolation section is enclosed separately a color value, this color value is different from the color value between described n progressive chromatic zones.
3. the localization method of a kind of piece surface manufacturing deficiency as claimed in claim 1 or 2, it is characterized in that, in step S1, extract command signal and the feedback signal of each cutter track interpolation section, and adopt difference, conversion and statistical method to calculate derivative signal according to described command signal and feedback signal.
4. the localization method of a kind of piece surface manufacturing deficiency as claimed in claim 1 or 2, it is characterized in that, described derivative signal comprises prompt degree, tracking error and aggregate velocity.
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|---|---|---|---|
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Family
ID=55421228
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Application publication date: 20160309 |