CN105388165B - The defect monitoring method of light polarizing film - Google Patents
The defect monitoring method of light polarizing film Download PDFInfo
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- CN105388165B CN105388165B CN201510546614.4A CN201510546614A CN105388165B CN 105388165 B CN105388165 B CN 105388165B CN 201510546614 A CN201510546614 A CN 201510546614A CN 105388165 B CN105388165 B CN 105388165B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/894—Pinholes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N5/00—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
- G01N9/26—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by measuring pressure differences
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
Abstract
The present invention relates to a kind of defect monitoring methods of light polarizing film, in more detail, by the inclusion of such as next stage, defect can be made to quantize, improve the homogeneity of product, can predict defect in the production line, can improve significantly production efficiency: (S1) photographs and identifies the stage in region existing for spot to the light polarizing film transferred；(S2) it measures the difference of the brightness of the stained region and reference area and obtains the stage of intensity of brightness；(S3) intensity of brightness of each spot is scaled to the stage of percentile；(S4) selectes the typical value (G) of spot in the luminance intensity value that the percentile is 65~100, and the stage that defect has occurred is determined in the case where the typical value (G) of the spot is more than defect a reference value.
Description
Technical field
The light polarizing film for the defects of spot generated in the manufacture of light polarizing film can be easily found out the present invention relates to one kind
Defect monitoring method.
Background technique
Liquid crystal display, organic light emitting display, electric field emission display (FED), plasma display panel (PDP) etc. are each
Kind image display device is widely developed and uses recently.
On the other hand, occur various bad in manufacturing process of the image display device before outbound, checked by multiple
Journey, wherein one in the component that image display device at most uses is the optical films such as light polarizing film, phase difference film, therefore, light
One of the main reason for defect for learning film is the poor prognostic cause of image display device.Detection for the defect of optical film, firstly,
It discriminates whether correctly to be determined for defect, then, if being determined as defect, carries out the repairing according to defect
(repair) it or discards, removing of defect cause etc. in turn, in terms of the yield of manufacturing process, it may be said that be important portion
Point.
The manufacture of optical film, for mass production, usually using production line procedures.Therefore, the detection of defect passes through in life
The specific position of producing line continuously photographs to optical film, differentiates defect in the part of photography and carries out.
In the differentiation of defect, find to exhaustive that previous various defects are important.Associated with it, South Korea discloses specially
Benefit the 2010-24753rd, which discloses, to be compared to the area of the closed curve comprising foreign matter and foreign matter to differentiate production line morphology
Foreign matter method.
Recently since the enlargement tendency of optical film, the original cost of component rise, result requires sentencing for more accurate defect
Therefore other method is still required to correctly differentiate the method for defect.
Existing technical literature
Patent document
Patent document 1: KR published patent the 2010-24753rd
Summary of the invention
Subject to be solved by the invention
The purpose of the present invention is to provide be correctly predicted defect, change by carrying out process conditions in advance etc. rapidly
Reply can reduce the monitoring method of the light polarizing film of the disqualification rate of product significantly.
In addition, the present invention provides the defect for predicting defect, the light polarizing film that can significantly improve production efficiency in the production line
Monitoring method.
Technical measure:
1. a kind of defect monitoring method of light polarizing film comprising:
(S1) stage in the region existing for the image recognition spot to the light polarizing film photography transferred；
(S2) in described image it is each to each spot measurement stained region and reference area brightness difference and obtain bright
Spend the stage of intensity；
(S3) intensity of brightness of each spot is scaled to the stage of percentile；With
(S4) typical value (G) that spot is selected in the luminance intensity value that the percentile is 65~100, in the spot
Typical value (G) be more than defect a reference value in the case where alert defect generation stage.
2. the defect monitoring method of the light polarizing film according to 1, wherein the photography monitoring device of the light polarizing film into
Row, which includes:
In the light source that the side of the light polarizing film configures；
In the ministry of photography that the other side of the light polarizing film configures；With
It is filtered in the light source at least one inspection vertical with the light polarizing film with configuration, absorption axiss between the ministry of photography with polarisation
Wave device.
3. the defect monitoring method of the light polarizing film according to 2, wherein by the inspection polagizing filter with described inclined
Light source side and the ministry of photography side are respectively arranged on the basis of light film, absorption axiss are parallel to each other.
4. the defect monitoring method of the light polarizing film according to 1, wherein the spot is included in the side of film direction of travel
The inside for the quadrangle that length is 2mm or more, the length on the side vertical with film direction of travel is 1~20mm, with reference area
The difference of brightness is 3~20gray.
5. the defect monitoring method of the light polarizing film according to 1, wherein the apperance of the spot be selected from it is linear, round and
Ellipse.
6. the defect monitoring method of the light polarizing film according to 1, wherein be in the percentile that (S4) converts in the stage
In 80~90 luminance intensity value, the typical value (G) of spot is selected, is more than defect a reference value in the typical value (G) of the spot
In the case where, alert the generation of defect.
7. the defect monitoring method of the light polarizing film according to 1, wherein at (S4) in the stage, continuous 2 times of G value with
In the case where being above more than defect a reference value, the generation of defect is alerted.
8. the defect monitoring method of the light polarizing film according to 1, wherein at (S4) in the stage, continuous 2 times of G value with
Upper is more than defect a reference value, while in also increased situation, alerting the generation of defect.
The effect of invention
The defect monitoring method of light polarizing film of the invention, by providing the method that can be correctly predicted defect, Neng Goujin
Row first passes through change of process conditions etc. in advance and rapidly copes with, therefore can reduce the disqualification rate of product significantly.
In addition, the defect monitoring method of light polarizing film of the invention, can predict defect in the production line, improve life significantly
Produce efficiency.
Detailed description of the invention
Fig. 1 is the brief flow chart of the defect monitoring method as one embodiment of the invention, light polarizing film.
Fig. 2 is the attached drawing for briefly illustrating the monitoring device of the defect monitoring method for light polarizing film.
Fig. 3 is the attached drawing for briefly illustrating an embodiment of spot defect.
Fig. 4 be the defect alarm data that is related to of comparing embodiment 1 and with the attached drawing of the data of orthogonal b value.
Specific embodiment
The present invention relates to the defect monitoring methods of light polarizing film, in more detail, by including: (S1) with inclined to what is transferred
The stage in region existing for the image recognition spot of light film photography；(S2) the measurement spot each for each spot in described image
The difference of the brightness of region and reference area and obtain the stage of intensity of brightness；(S3) intensity of brightness of each spot is scaled
The stage of percentile；(S4) selectes the typical value (G) of spot in the luminance intensity value that the percentile is 65~100,
In the case that the typical value (G) of the spot is more than defect a reference value, the stage of the generation of defect is alerted, so as to correctly
It predicts defect, change of process conditions etc. can be carried out in advance and rapidly coped with, therefore can be reduced significantly not conforming to for product
Lattice rate.Furthermore it is possible to predict defect in the production line, production efficiency is improved significantly.
The present invention is described in more detail referring to the drawings.
Fig. 1 is the attached of the flow chart of the defect monitoring method for the light polarizing film that briefly diagram one embodiment of the invention is related to
Figure.
Firstly, the region (S1) existing for the image recognition spot to the light polarizing film photography transferred.
Usual light polarizing film be produced by continuous process, such as reel-to-reel (Roll-to-Roll) process while by while move
Side is sent to carry out.Therefore, in order to differentiate the defect of light polarizing film, from the top for the light polarizing film transferred in constant direction to light polarizing film
Photograph and obtain the image of light polarizing film.
In the present invention, the photographs of light polarizing film can by the inclusion of the ministry of photography, light source, inspection polagizing filter prison
It controls device (referring to Fig. 2) and obtains.The monitoring device can be following device: configure light in the side of check object light polarizing film
Source configures the ministry of photography in the other side of light polarizing film, vertical with the light polarizing film in the light source and configuration absorption axiss between the ministry of photography
At least one inspection polagizing filter.In addition, being filtered to by check object light polarizing film and inspection with polarisation with described device
The light of wave device is photographed, and photographs can be obtained.
It according to another embodiment of the present invention, can be by inspection polagizing filter with light polarizing film in the monitoring device
On the basis of light source side configure 1, or the ministry of photography side configure 1.
According to still another embodiment of the invention, the inspection polagizing filter can be on the basis of the light polarizing film in light
1 (referring to Fig. 2) is respectively configured in source and the ministry of photography side.In this case, two check with the absorption axiss of polagizing filter with
Light polarizing film is vertical, but these absorption axiss are parallel to each other.The feelings of each 1 polagizing filter are respectively configured in light source side and the ministry of photography side
Under condition, the reliability of defects detection can be further increased.
If the light polarizing film of check object is qualified product, the orthogonal polagizing filter of polarization direction and light polarizing film it
Between the light that passes through disappear, therefore obtain the video of black, if check object light polarizing film there are spot, polarisation in this section
Direction change, therefore result obtains the video of the part (that is, part of spot) bright there are light leakage.
It is so-called " spot " in the present invention, be light polarizing film average homogeneity except part, be according to differentiate result can
Be determined as it is normal within the scope of (qualified moral character spot) or can determine that " defect " for the bad reason as product
Part.
Identification with the image of acquisition to region existing for spot, can be in the average homogeneity for setting light polarizing film
Afterwards, the image in the region comprising the part (part of spot) other than this is carried out using image processing software etc..
Fig. 3 is the video photography of spot defect.
If enumerating the concrete example of the stained region, can be included in the side of film direction of travel length be 2mm with
The difference of the brightness of the inside and reference area for the quadrangle that the length on upper, vertical with film direction of travel side is 1~20mm is 3
The region of~20gray.
The upper limit of the length on the side of the film direction of travel, as long as then having no spy within the length of the film of measure object
It does not limit.For example, in the case where being photographed with the interval 1m to light polarizing film, the length on the side of the film direction of travel of stained region
The upper limit can be 1m.In addition, being not particularly limited to the shape of the stained region, can be linear, round, oval.
Then in described image it is each for each spot measurement stained region and reference area brightness difference, obtain bright
It spends intensity (S2).
It is so-called " reference area " in the present invention, refer to the part that defect is not present in light polarizing film, it is meant that the region
There is no pass through the light of the orthogonal light polarizing film of polarization direction and inspection polagizing filter, can obtain black when irradiation light
Video image part.
It is so-called " intensity of brightness " in addition, in the present invention, it is meant that brightness in the stained region and reference area of selection it
The value of difference, difference is bigger, and intensity is bigger.
Next, the intensity of brightness of each spot is scaled percentile (S3).
Then, the typical value (G) that spot is selected in the luminance intensity value that the percentile is 65~100, in the dirt
In the case that the typical value (G) of stain is more than defect a reference value, the generation (S4) of defect is alerted.
It is so-called " typical value of spot " in the present invention, it is that the generation probability in the luminance intensity value of spot as defect is high
The pre-selected value of value.There is no particular limitation on it, according to the characteristic of applicable product, or according to which kind of degree can
By degree detect defect, or the completeness according to required by product degree and change.In order to most excellent reliability detection
Defect, from 65 percentiles~100 percentiles selection in the percentile of the intensity of brightness.For example, can be by 85 percentiles
Luminance intensity value be appointed as the typical value of spot.
So-called " percentile (percentile rank) ", it is meant that be distributed upper table in the intensity of brightness of certain given group
The value for showing the relative position of each intensity of brightness, the hundred of the intensity of brightness certain relative to certain in the intensity of brightness distribution of certain group
Quartile refers to the percentage relative to all examples for being located at the example of its insufficient intensity of brightness.Calculate the method energy of percentile
Enough found out using commonly known method.
For example, the intensity of brightness of measurement spot, wherein if the intensity of brightness of 85 percentiles is 3.0, it is meant that brightness is strong
Spending the spot less than 3.0 is the 85% of entire objects spot.
It is so-called " defect a reference value " in the present invention, it is the luminance intensity value of fixed defect warning, is if G value
High more than the generation probability of the defect a reference value then defect and pre-selected value.There is no particular limitation on it, according to applicable
Product characteristic or according to the reliability of which kind of degree detect defect, or the completeness according to required by product
Degree and change.
The available intensity of brightness for being actually determined as defect of the defect a reference value, such as 80%, 90%, 95%,
100% intensity of brightness is selected.
But, in the case where 1 spot is only detected in the image of photography, by the luminance intensity value and defect of the spot
A reference value compares.
In the luminance intensity value that the percentile of the conversion is 65~100, the typical value (G) of spot is selected, it will be described
In the case that the typical value (G) of spot is compared with defect a reference value, judgement can more correctly predict the generation probability of defect, by
This pre- change for first passing through process conditions etc. is rapidly coped with, and can reduce the disqualification rate of product significantly.
According to another embodiment of the present invention, at (S4) in the stage, in the brightness that percentile is 80~90 percentiles
The typical value (G) that spot is selected in intensity value, in the case where the typical value (G) of the spot is more than defect a reference value, judgement
It is high for the generation probability of spot defect, the generation of defect can be alerted.
It according to another embodiment of the present invention, is more than defect benchmark at G value continuous 2 times or more at (S4) in the stage
In the case where value, the generation of defect can be alerted, in this case, is judged as that the generation probability of defect is higher.
In addition, according to another embodiment of the present invention, increasing while being more than defect a reference value G value continuous 2 times or more
In the case where, the generation of defect can be alerted, in this case, is judged as that the generation probability of defect is higher.
The number that G value continues to exceed defect a reference value can change according to the degree of the completeness required by product.For example,
In order to detect defect with the reliability of highest level, in the case where being more than number is 2 times or more, it can be seen that producing scarce
It falls into.In addition, increment rate is bigger, defect while being more than defect a reference value G value continuous 2 times or more in increased situation
Generating probability can further increase.
Below in order to facilitate understanding of the invention, illustrate preferred embodiment, these embodiments only to the present invention into
Row illustrates, and the range of appended Patent right requirement is not intended to limit, to those skilled in the art, in scope of the invention
It is it will be apparent that moreover, such deformation in the range of technical idea various changes and amendment can be carried out to embodiment
Also belong to the range of appended Patent right requirement certainly with amendment.
Embodiment 1
For the light polarizing film manufactured by roll-to-roll process, every 1m photographs in the direction of travel, to be included in film row
Into direction while length be 2mm or more, be vertical with film direction of travel while length be 1~20mm quadrangle inside,
And the spot that the difference of the brightness of reference area is 3~20gray is object, measures the lightness of each stained region.
Then, the difference for measuring the brightness of stained region and reference area, calculates intensity of brightness, is scaled percentile.
The luminance intensity value of 85 percentiles of the scaled value is chosen to be to the typical value (G value) of spot, is more than to make in G value
For defect a reference value 3.2 in the case where, alerted the generation of defect.
Defect monitoring has been carried out using light polarizing film of the method for 500,000m.
Test method: orthogonal b value determines
For identical check object light polarizing film, orthogonal b value is measured, compared with the defect monitored results of the embodiment 1,
Its result data is shown in Fig. 4.
According to following benchmark, the generation of defect can determine, orthogonal b value has mutually inversely proportional with luminance intensity value
Tendency.
<the determining defects benchmark of orthogonal b value>
Qualified product: the situation more than -0.7
It alerts the generation of defect: being more than -0.9 and -0.7 situation below
It is unqualified: -0.9 situation below
Referring to Fig. 4, using the orthogonal b value of the G value of defect monitoring method of the present invention changed and measure, variation
Pattern is consistent, it may thus be appreciated that the failure prediction probability of monitoring method of the invention is very excellent.
Claims (8)
1. a kind of defect monitoring method of light polarizing film comprising:
(S1) stage in the region existing for the image recognition spot to the light polarizing film photography transferred；
(S2) in described image the difference of the brightness of measurement stained region each to each spot and reference area and to obtain brightness strong
The stage of degree；
(S3) for the intensity of brightness of each spot, by the insufficient example of intensity of brightness of each spot divided by all things
The intensity of brightness of each spot, is scaled the stage of percentile by example；With
(S4) the typical value G that spot is selected in the luminance intensity value that the percentile is 65~100, in the representative of the spot
Stage of the value G more than the generation for alerting defect in the case where defect a reference value.
2. the defect monitoring method of light polarizing film according to claim 1, wherein the photography monitoring device of the light polarizing film
It carries out, which includes:
In the light source that the side of the light polarizing film configures；
In the ministry of photography that the other side of the light polarizing film configures；With
It is filtered in the light source at least one inspection vertical with the light polarizing film with configuration, absorption axiss between the ministry of photography with polarisation
Device.
3. the defect monitoring method of light polarizing film according to claim 2, wherein by the inspection polagizing filter with institute
It states and is respectively arranged at light source side and the ministry of photography side on the basis of light polarizing film, absorption axiss are parallel to each other.
4. the defect monitoring method of light polarizing film according to claim 1, wherein the spot is included in film direction of travel
While length be 2mm or more, be vertical with film direction of travel while length be 1~20mm quadrangle inside, with reference region
The difference of the brightness in domain is 3~20gray.
5. the defect monitoring method of light polarizing film according to claim 1, wherein the apperance of the spot is selected from linear, circle
Shape and ellipse.
6. the defect monitoring method of light polarizing film according to claim 1, wherein in the percentage that (S4) converts in the stage
Position is more than defect a reference value in the typical value G of the spot to select the typical value G of spot in 80~90 luminance intensity value
In the case where, alert the generation of defect.
7. the defect monitoring method of light polarizing film according to claim 1, wherein at (S4) in the stage, G value continuous 2
It is secondary above more than in the case where defect a reference value, alert the generation of defect.
8. the defect monitoring method of light polarizing film according to claim 1, wherein at (S4) in the stage, G value continuous 2
It is secondary above more than defect a reference value, while in also increased situation, alert the generation of defect.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2014-0115246 | 2014-09-01 | ||
| KR1020140115246A KR101702841B1 (en) | 2014-09-01 | 2014-09-01 | Method for monitoring defect in polaroid films |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105388165A CN105388165A (en) | 2016-03-09 |
| CN105388165B true CN105388165B (en) | 2019-05-03 |
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ID=55420694
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510546614.4A Active CN105388165B (en) | 2014-09-01 | 2015-08-31 | The defect monitoring method of light polarizing film |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2016050939A (en) |
| KR (1) | KR101702841B1 (en) |
| CN (1) | CN105388165B (en) |
| TW (1) | TW201610418A (en) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI588470B (en) * | 2016-06-28 | 2017-06-21 | 住華科技股份有限公司 | Defect detecting device |
| JP6470455B1 (en) * | 2017-09-13 | 2019-02-13 | 日東電工株式会社 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| TWI748108B (en) * | 2017-09-13 | 2021-12-01 | 日商日東電工股份有限公司 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| JP6470456B1 (en) * | 2017-09-13 | 2019-02-13 | 日東電工株式会社 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| JP6470457B1 (en) * | 2017-09-13 | 2019-02-13 | 日東電工株式会社 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| TWI743373B (en) * | 2017-09-13 | 2021-10-21 | 日商日東電工股份有限公司 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| CN109187577A (en) * | 2018-08-29 | 2019-01-11 | 深圳市盛波光电科技有限公司 | A kind of polaroid recessiveness defect light detection means and method |
| JP6890160B2 (en) * | 2018-10-15 | 2021-06-18 | 日東電工株式会社 | Polarizing plate with retardation layer and image display device using it |
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| CN105388165A (en) | 2016-03-09 |
| JP2016050939A (en) | 2016-04-11 |
| KR101702841B1 (en) | 2017-02-06 |
| TW201610418A (en) | 2016-03-16 |
| KR20160026400A (en) | 2016-03-09 |
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