CN105281664A - Device and method for detecting solar assembly potential-induced degradation (PID) effect resisting capacity - Google Patents
Device and method for detecting solar assembly potential-induced degradation (PID) effect resisting capacity Download PDFInfo
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- CN105281664A CN105281664A CN201510095724.3A CN201510095724A CN105281664A CN 105281664 A CN105281664 A CN 105281664A CN 201510095724 A CN201510095724 A CN 201510095724A CN 105281664 A CN105281664 A CN 105281664A
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The present invention discloses a device for detecting a solar assembly potential-induced degradation (PID) effect resisting capacity. The device is used for detecting the PID effect resisting capability of a solar assembly, and comprises a power supply and an environmental cabinet for forming an environment required for detection, and the environmental cabinet is internally provided with an insulation support. The device is characterized in that an ultraviolet lamp source is disposed inside the environmental cabinet, an aluminum side frame of the solar assembly is connected with a positive electrode of the power supply and is earthed, the solar assembly is connected with a junction box, and positive and negative electrode terminals of the junction box are in a short circuit and connected with a negative electrode of the power supply. Meanwhile, a method for detecting the PID effect resisting capability of the solar assembly by using the above device is also provided. With adoption of the device and the method, technical problems that solar assembly PID testing conditions are inconsistent with actural outdoor using conditions in the prior art and testing accuracy is impacted are solved; attenuation of the assembly in an outdoor environment is truly simulated, and the PID effect resisting capability of the solar assembly is accurately detected, which has guiding significance in reduction and prevention of PID phenomena.
Description
Technical field
The present invention relates to a kind of attenuation test device and method thereof of solar components, particularly relate to checkout gear and the detection method thereof of the anti-PID effect capability of a kind of solar components, belong to solar assembly test technical field.
Technical background
Solar components is under certain humiture and voltage environment during long-term work, due to module frame ground connection, at the assembly of solar components square formation negative pole end work, battery opposite side frame forms negative voltage, cause producing leakage current between component package material, the phenomenon of component deterioration is made to be referred to as potential induction attenuation (PID, potential-induceddegradation) effect.PID effect shows to there is leakage current between glass and encapsulating material, encapsulating material, backboard, forms leakage current passage between glass and frame.A large amount of positive charges is gathered in battery front surface, and destroy the passivation of cell piece, battery is occurred, and shunt(shunts), cause the power reduction of assembly, EL(Electroluminescence, electroluminescence) there is blackspot.The external factor affecting PID decay is mainly amblent air temperature aspect; High temperature, high humidity, high UV(ultraviolet, ultraviolet) easily there is PID phenomenon in irradiation situation.The cell piece that internal factor main manifestations adopts for assembly, encapsulating material, backboard and glass quality quality etc.
In prior art, the test decayed about solar components PID is mainly carried out according to the regulation in IEC draft standard, and its principal element considered is the voltage of temperature, humidity and loading.But, generally use the EVA of the anti-PID of high resistivity to improve the anti-PID performance of assembly in current industry, and because EVA can issue solution estranged in the effect of ultraviolet and humiture in the actual use procedure of solar components, resistivity is declined, this means that the anti-PID performance of EVA also can obviously decline.Therefore, the environment that the test that existing solar components PID decays is simulated and the actual environment used of solar components inconsistent, accurately cannot test solar components PID attenuation.Be necessary to introduce UV irradiation in the anti-PID test process of solar cell, the result of assessment like this can be more consistent with the outdoor behaviour in service of reality.
summary of the invention:
The present invention is directed in prior art, the outdoor service condition of crystal silicon solar assembly PID test condition and reality is inconsistent, the accuracy of impact test, accurately cannot test the technical problem of solar components PID attenuation, a kind of checkout gear and detection method thereof of the anti-PID effect capability of solar components closer to the actual outdoor behaviour in service of solar module are provided.
For this reason, the present invention adopts following technical scheme:
The checkout gear of the anti-PID effect capability of a kind of solar components, for detecting the anti-PID effect capability of solar components (3), comprise power supply (1), the environmental cabinet (4) of the required environment of test can be formed, insulating support (6) is set in environmental cabinet (4), its spy is: in described environmental cabinet (4), be provided with UV lamp source (5), the aluminium frame (3a) of solar components (3) connects the positive electrode of power supply (1) and ground connection, solar components (3) connects terminal box (2),, the anode and cathode terminals short circuit of terminal box (2) is also connected with power supply (1) negative pole.
Further, described power supply (1) is DC constant voltage source, and its voltage range is 0 ~ 2000V.
Further, the main irradiation wave band of described UV lamp source (5) is the irradiation intensity of 280 ~ 385nm, 280 ~ 385nm wave band is 100 ~ 300w.m
2, the irradiation evenness in solar components (3) experiment plane is ± 15%.
Further, described environmental cabinet (4) is for providing hot and humid experimental box, and wherein temperature setting range is 60 ~ 85 DEG C, and precision is ± 2 DEG C, and humid control scope is 30 ~ 85%, and precision is ± 5%.
Meanwhile, the present invention also provides a kind of detection method using the anti-PID effect capability of the solar components of above-mentioned detection device, for detecting the anti-PID effect capability of solar components (3), comprises the steps:
A. solar components (3) to be detected is placed on the insulating support (6) in environmental cabinet (4);
B. turn on UV lamp source (5) and carry out UV irradiation, meanwhile, the humiture in the case that controls environment (4) and supply voltage within the scope of test request, the leakage current of monitor component;
C. according to the actual requirement setting testing time;
D. the outward appearance of solar components (3) the power of solar components (3), EL and wet electric leakage before and after test test before and after observation test.
Further, described power supply (1) is DC constant voltage source, and its voltage range is 0 ~ 2000V.
Further, the main irradiation wave band of described UV lamp source (5) is the irradiation intensity of 280 ~ 385nm, 280 ~ 385nm wave band is 100 ~ 300w.m
2, the irradiation evenness in solar components (3) experiment plane is ± 15%.
Further, described UV lamp source (5) be xenon lamp, LED.
Further, described environmental cabinet (4) is for providing hot and humid experimental box, and wherein temperature setting range is 60 ~ 85 DEG C, and precision is ± 2 DEG C, and humid control scope is 30 ~ 85%, and precision is ± 5%.
Further, the described testing time is 24h ~ 600h.
The present invention by increasing UV irradiation in PID test process, ensure that solar components is subject to the effect of high temperature, high humidity, UV irradiation and power source bias when testing simultaneously, the decay of simulated assembly out of doors in environment more truly, thus the ability that solar components bears system bias voltage is fully assessed in PID test process, measure the anti-PID effect capability of solar components more exactly, to minimizing and prevention PID phenomenon, there is directive significance.
Accompanying drawing explanation
Fig. 1 is the structural representation of checkout gear of the present invention.
Embodiment
Be further described in detail structure of the present invention below in conjunction with the drawings and specific embodiments, part same as the prior art in the present invention is with reference to prior art.
As shown in Figure 1, the checkout gear of the anti-PID effect capability of solar components of the present invention, for detecting the anti-PID effect capability of solar components 3, comprise power supply 1, the environmental cabinet 4 of the required environment of test can be formed, arrange insulating support 6 in environmental cabinet 4, be provided with UV lamp source 5 in environmental cabinet 4, the aluminium frame 3a of solar components 3 connects the positive electrode of power supply 1 and ground connection, solar components 3 connects terminal box 2, and the anode and cathode terminals short circuit of terminal box 2 is also connected with power supply 1 negative pole.Power supply 1 is DC constant voltage source, and its voltage range is 0 ~ 2000V.UV lamp source 5 adopts xenon lamp, and its main irradiation wave band is the irradiation intensity of 280 ~ 385nm, 280 ~ 385nm wave band is 100 ~ 300w.m
2, solar components 3 irradiation evenness of testing in plane is ± 15%.
Environmental cabinet 2 is for providing hot and humid experimental box, and wherein temperature setting range is 60 ~ 85 DEG C, and precision is ± 2 DEG C, and humid control scope is 30 ~ 85%, and precision is ± 5%.
The detection method of the anti-PID effect capability of solar components of use above-mentioned detection device of the present invention, for detecting the anti-PID effect capability of solar components 3, comprises the steps:
A. solar components 3 to be detected is placed on the insulating support 6 in environmental cabinet 4;
B. turn on UV lamp source 5 and carry out UV irradiation, meanwhile, the humiture in case 4 of controling environment and supply voltage within the scope of test request, the leakage current of monitor component;
C. according to the actual requirement setting testing time;
D. the outward appearance of solar components 3 power of solar components 3, EL and wet electric leakage before and after test test before and after observation test.
In the present embodiment, the main irradiation wave band in UV lamp source 5 is the irradiation intensity of 280 ~ 385nm, 280 ~ 385nm wave band is 250w.m
2, it is 85 DEG C ± 2 DEG C that temperature controls, and humidity is 85% ± 5%, and voltage is 1000V, and the testing time is 192 hours.
Test the outward appearance the power of test suite, EL and wet electric leakage of before starting, observing solar components 3; The outward appearance the power of test suite, EL and wet electric leakage of in 8h, observing solar components 3 are tested; Component power, EL situation that compare test is forward and backward, can characterize the anti-PID performance of solar components.
Certainly, the present invention also has other execution modes, is only preferred embodiment of the present invention above, is not used for limiting practical range of the present invention, and all equivalences done according to the content of the application's the scope of the claims change and modify, and all should be technology category of the present invention.
Claims (10)
1. the checkout gear of the anti-PID effect capability of solar components, for detecting the anti-PID effect capability of solar components (3), comprise power supply (1), the environmental cabinet (4) of the required environment of test can be formed, insulating support (6) is set in environmental cabinet (4), its spy is: in described environmental cabinet (4), be provided with UV lamp source (5), the aluminium frame (3a) of solar components (3) connects the positive electrode of power supply (1) and ground connection, solar components (3) connects terminal box (2), and the anode and cathode terminals short circuit of terminal box (2) is also connected with power supply (1) negative pole.
2. the checkout gear of the anti-PID effect capability of solar components according to claim 1, is characterized in that: described power supply (1) is DC constant voltage source, and its voltage range is 0 ~ 2000V.
3. the checkout gear of the anti-PID effect capability of solar components according to claim 1, is characterized in that: the main irradiation wave band of described UV lamp source (5) is the irradiation intensity of 280 ~ 385nm, 280 ~ 385nm wave band is 100 ~ 300w.m
2, the irradiation evenness in solar components (3) experiment plane is ± 15%.
4. the checkout gear of the anti-PID effect capability of solar components according to claim 1, is characterized in that: described UV lamp source (5) is xenon lamp, LED.
5. the checkout gear of the anti-PID effect capability of solar components according to claim 1, it is characterized in that: described environmental cabinet (4) is for providing hot and humid experimental box, wherein temperature setting range is 60 ~ 85 DEG C, precision is ± 2 DEG C, humid control scope is 30 ~ 85%, and precision is ± 5%.
6. using a detection method for the anti-PID effect capability of solar components of the arbitrary described checkout gear of claim 1-4, for detecting the anti-PID effect capability of solar components (3), comprising the steps:
A. solar components (3) to be detected is placed on the insulating support (6) in environmental cabinet (4);
B. turn on UV lamp source (5) and carry out UV irradiation, meanwhile, the humiture in the case that controls environment (4) and supply voltage within the scope of test request, the leakage current of monitor component;
C. according to the actual requirement setting testing time;
D. the outward appearance of solar components (3) the power of solar components (3), EL and wet electric leakage before and after test test before and after observation test.
7. the detection method of the anti-PID effect capability of solar components according to claim 6, is characterized in that: described power supply (1) is DC constant voltage source, and its voltage range is 0 ~ 2000V.
8. the detection method of the anti-PID effect capability of solar components according to claim 6, it is characterized in that: described UV lamp source (5) is xenon lamp, LED, its main irradiation wave band is the irradiation intensity of 280 ~ 385nm, 280 ~ 385nm wave band is 100 ~ 300w.m
2, the irradiation evenness in solar components (3) experiment plane is ± 15%.
9. the detection method of the anti-PID effect capability of solar components according to claim 6, it is characterized in that: described environmental cabinet (4) is for providing hot and humid experimental box, wherein temperature setting range is 60 ~ 85 DEG C, precision is ± 2 DEG C, humid control scope is 30 ~ 85%, and precision is ± 5%.
10. the detection method of the anti-PID effect capability of solar components according to claim 6, is characterized in that: the described testing time is 24h ~ 600h.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510095724.3A CN105281664A (en) | 2015-03-04 | 2015-03-04 | Device and method for detecting solar assembly potential-induced degradation (PID) effect resisting capacity |
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| CN201510095724.3A CN105281664A (en) | 2015-03-04 | 2015-03-04 | Device and method for detecting solar assembly potential-induced degradation (PID) effect resisting capacity |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105915177A (en) * | 2016-05-04 | 2016-08-31 | 西安交通大学 | Crystalline silicon photovoltaic power station PID online detection method |
| CN111900930A (en) * | 2020-06-24 | 2020-11-06 | 西安交通大学 | PID (proportion integration differentiation) detection method by utilizing reverse saturation current and leakage current density of photovoltaic module |
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| CN104065339A (en) * | 2014-07-15 | 2014-09-24 | 江苏顺风光电科技有限公司 | Experiment board of solar battery assembly PID and testing method thereof |
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Patent Citations (6)
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| CN105915177A (en) * | 2016-05-04 | 2016-08-31 | 西安交通大学 | Crystalline silicon photovoltaic power station PID online detection method |
| CN105915177B (en) * | 2016-05-04 | 2017-12-08 | 西安交通大学 | A kind of crystalline silicon photovoltaic power station PID online test methods |
| CN111900930A (en) * | 2020-06-24 | 2020-11-06 | 西安交通大学 | PID (proportion integration differentiation) detection method by utilizing reverse saturation current and leakage current density of photovoltaic module |
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Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant after: TRINA SOLAR Co.,Ltd. Address before: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant before: trina solar Ltd. Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant after: trina solar Ltd. Address before: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant before: CHANGZHOU TRINA SOLAR ENERGY Co.,Ltd. |
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Application publication date: 20160127 |