CN104345276A - Method for testing attenuation of photovoltaic assembly - Google Patents
Method for testing attenuation of photovoltaic assembly Download PDFInfo
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- CN104345276A CN104345276A CN201310329453.4A CN201310329453A CN104345276A CN 104345276 A CN104345276 A CN 104345276A CN 201310329453 A CN201310329453 A CN 201310329453A CN 104345276 A CN104345276 A CN 104345276A
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Abstract
The invention relates to a method for testing the attenuation of a photovoltaic assembly. The method comprises the following steps of: first, selecting a photovoltaic assembly and carrying out an initial test, wherein the initial test comprises the appearance testing of the photovoltaic assembly, power output testing, and EL testing; second, placing the photovoltaic assembly in an environment case, connecting the photovoltaic assembly to ground, determining the conduction between the photovoltaic assembly and the ground, and then performing short circuit on the photovoltaic assembly by using a power line and connecting the photovoltaic assembly to a high-voltage power device; third, adjusting the environment case to perform testing; and fourth, taking out the photovoltaic assembly after the testing is finished and performing the power output testing and the EL testing. The method is used for assessing a capability of bearing system bias voltage of the photovoltaic assembly, and testing the capabilities of bearing various environmental factors, such as system voltage, humidity, and temperature of the photovoltaic assembly within reasonable cost and time, and has guidance meaning to reduce and prevent PID phenomena. One end of the photovoltaic assembly is connected with the ground and high voltage is applied to the photovoltaic assembly after the photovoltaic assembly is subjected to short circuit. Thus, testing safety is improved and the personal safety of a tester is protected in testing process.
Description
Technical field
The present invention relates to technical field of photovoltaic module test, particularly relate to the method for testing of a kind of photovoltaic module decay.
Background technology
The producer that photovoltaic module makes generally promises to undertake the quality guarantee of 25 years to its product.At development of new photovoltaic cell or when changing at assembly starting material, also all need the reliability verifying photovoltaic module after changing material.Meanwhile, photovoltaic module photovoltaic module during outside work is in the state that series connection exports electricity, and assembly self is in the condition of high temperature, and ambient humidity also fluctuates with seasonal variations.Adopt being 85 ± 2 DEG C to the test environment of photovoltaic module in existing IEC international standard, 85 ± 5%RH, this test needs the cycle reaching 1000 hours, cannot meet the demand of enterprise to material, Product evaluation.
When photovoltaic module work, assembly is the form of series connection, and the module frame of composition array also can carry out ground connection, causes between single component and frame and forms bias voltage.If under all component is in negative bias in a middle block assembly and inverter cathode output end in an array, then more there will be decay the closer to negative output terminal component power.Above-mentioned the reason of decay is that the humiture that environment is high makes to form leakage current between cell piece and ground connection frame.Encapsulating material, backboard, defines leakage current passage between glass and frame, a large amount of accumulation, on cell piece surface, causes the passivation of cell piece, causes open-circuit voltage, short-circuit current and fill factor, curve factor to reduce, and EL takes the bad phenomenon such as image display blackspot.
Therefore, the method for testing of a kind of photovoltaic module decay of exploitation is needed badly.
Summary of the invention
The object of the invention is the defect overcoming prior art existence, the method for testing that a kind of photovoltaic module is decayed is provided.
The technical scheme realizing the object of the invention is: a kind of method of testing of photovoltaic module decay, comprises the following steps:
Step one, chooses photovoltaic module and carries out initial testing, described initial testing comprise photovoltaic module outward appearance, power stage test and EL test;
Step 2, put the photovoltaic module in step one into environmental cabinet, then described photovoltaic module ground connection is determined the conduction on itself and ground, then photovoltaic module is connected with high-voltage power apparatus, then to the bias voltage of this photovoltaic module applying+1000V ~-1000V by power lead short circuit;
Step 3, adjusting ambient case is tested the photovoltaic module in step 2, and the humidity of environmental cabinet is set to 83 ~ 87 DEG C, and humidity is set to 80 ~ 90RH;
Step 4, takes out photovoltaic module and carries out power stage test and EL test after step 3 test terminates.
Further, the terminal box that photovoltaic module described in described step one comprises laminate, is arranged at the aluminum alloy frame at described laminate two ends and is connected with described laminate, in described step 2, described aluminum alloy frame ground connection is determined the conduction on itself and ground, described terminal box is connected with described high-voltage power apparatus.
Further, the terminal box that photovoltaic module described in described step one comprises laminate and is connected with described laminate, by photovoltaic module outside surface coated copper layers of foil in described step 2, utilize copper foil tape by copper foil layer ground connection and determine the conduction on itself and ground, described terminal box is connected with described high-voltage power apparatus.
Further, photovoltaic module described in described step one comprises photovoltaic module to be measured and contrast photovoltaic module.
Further, multimeter is utilized to determine the conduction with ground in described step 2.
Further, in described step 3, the test duration of environmental cabinet is 48 hours or 96 hours.
The present invention has positive effect: the present invention is used for assessing the ability that photovoltaic module bears system bias voltage, at rational cost with in the time, test light photovoltaic assembly bears the various environmental factor abilities such as system voltage, humidity, temperature, has directive significance to minimizing and prevention PID phenomenon etc.; And photovoltaic module one end ground connection, and the after-applied high pressure of short circuit, improve the security of test, the personal safety of tester in relay testing process.
Accompanying drawing explanation
In order to make content of the present invention more easily be clearly understood, below according to specific embodiment also by reference to the accompanying drawings, the present invention is further detailed explanation, wherein:
Fig. 1 is the equipment structure chart that the present invention tests.
Wherein: 1, environmental cabinet, 2, power lead, 3, high-voltage power apparatus, 4, ground, 5, photovoltaic module.
Embodiment
Embodiment 1
As shown in Figure 1, a kind of method of testing of photovoltaic module decay, comprises the following steps:
Step one, choose photovoltaic module 5 and carry out initial testing, the terminal box that photovoltaic module 5 comprises laminate, is arranged at the aluminum alloy frame at laminate two ends and is connected with laminate, initial testing comprise photovoltaic module 5 outward appearance, power stage test and EL test;
Step 2, put the photovoltaic module 5 in step one into environmental cabinet 1, then multimeter is utilized to determine the conduction on itself and ground 4 aluminum alloy frame ground connection, again terminal box is connected with high-voltage power apparatus 3 by power lead 2 short circuit by photovoltaic module 5, then this photovoltaic module 5 is applied to the bias voltage of-1000V;
Step 3, the photovoltaic module 5 in adjusting ambient case 1 pair of step 2 is tested, and the humidity of environmental cabinet 1 is set to 85 DEG C, and humidity is set to 85RH;
Step 4, takes out photovoltaic module 5 and carries out power stage test and EL test after step 3 test terminates.
The present embodiment is used for assessing the ability that photovoltaic module 5 bears system bias voltage, and at rational cost with in the time, test light photovoltaic assembly 5 bears the various environmental factor abilities such as system voltage, humidity, temperature, has directive significance to minimizing and prevention PID phenomenon etc.; And photovoltaic module 5 ground connection the after-applied high pressure of short circuit, improve the security of test, the personal safety of tester in relay testing process.
Embodiment 2
As the second preferred embodiment, all the other are identical with embodiment 1, and difference is, the method for testing that the present embodiment provides a kind of photovoltaic module to decay, and comprise the following steps:
Step one, chooses photovoltaic module 5 and carries out initial testing, the terminal box that photovoltaic module 5 comprises laminate and is connected with laminate, initial testing comprise photovoltaic module 5 outward appearance, power stage test and EL test;
Step 2, put the photovoltaic module 5 in step one into environmental cabinet 1, then by photovoltaic module 5 outside surface coated copper layers of foil, utilize copper foil tape by copper foil layer ground connection and determine the conduction on itself and ground 4, again terminal box is connected with high-voltage power apparatus 3 by power lead 2 short circuit by photovoltaic module 5, then this photovoltaic module 5 is applied to the bias voltage of-600V;
Step 3, the photovoltaic module 5 in adjusting ambient case 1 pair of step 2 is tested, and the humidity of environmental cabinet 1 is set to 83 DEG C, and humidity is set to 80RH, and the test duration is 48 hours;
Step 4, takes out photovoltaic module 5 and carries out power stage test and EL test after step 3 test terminates.
The method of testing the decay of this photovoltaic module 5 during photovoltaic module 5 aluminium-fre e alloy frame is provided in the present embodiment, meets the testing requirement of different photovoltaic module, convenient.
Embodiment 3
As the 3rd preferred embodiment, all the other are identical with embodiment 1 or 2, and difference is, the method for testing that the present embodiment provides a kind of photovoltaic module to decay, and comprise the following steps:
Step one, chooses photovoltaic module 5 and carries out initial testing, photovoltaic module 5 comprise photovoltaic module to be measured and contrast photovoltaic module, initial testing comprise photovoltaic module 5 outward appearance, power stage test and EL test;
Step 2, put the photovoltaic module to be measured in step one and contrast photovoltaic module into environmental cabinet 1, then by photovoltaic module to be measured and contrast photovoltaic module ground connection determine the conduction on itself and ground 4 respectively, again photovoltaic module to be measured is also connected with high-voltage power apparatus 3 by power lead 2 short circuit respectively with contrast photovoltaic module, then treats the bias voltage of light-metering photovoltaic assembly and contrast photovoltaic module applying+1000V;
Step 3, the photovoltaic module to be measured in adjusting ambient case 1 pair of step 2 and contrast photovoltaic module are tested, and the humidity of environmental cabinet 1 is set to 87 DEG C, and humidity is set to 90RH, and the test duration is 96 hours;
Step 4, takes out photovoltaic module to be measured and contrasts photovoltaic module and carry out power stage test and EL test after step 3 test terminates.
Choose light-metering photovoltaic assembly and contrast photovoltaic module in the present embodiment, when for photovoltaic module material altering, a kind of assessment of changing material and decaying to photovoltaic module is provided, meets the testing requirement of different photovoltaic module, convenient.
Above-described specific embodiment; object of the present invention, technical scheme and beneficial effect are further described; be understood that; the foregoing is only specific embodiments of the invention; be not limited to the present invention; within the spirit and principles in the present invention all, any amendment made, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (6)
1. a method of testing for photovoltaic module decay, is characterized in that, comprise the following steps:
Step one, chooses photovoltaic module and carries out initial testing, described initial testing comprise photovoltaic module outward appearance, power stage test and EL test;
Step 2, put the photovoltaic module in step one into environmental cabinet, then described photovoltaic module ground connection is determined the conduction on itself and ground, then photovoltaic module is connected with high-voltage power apparatus, then to the bias voltage of this photovoltaic module applying+1000V ~-1000V by power lead short circuit;
Step 3, adjusting ambient case is tested the photovoltaic module in step 2, and the humidity of environmental cabinet is set to 83 ~ 87 DEG C, and humidity is set to 80 ~ 90RH;
Step 4, takes out photovoltaic module and carries out power stage test and EL test after step 3 test terminates.
2. the method for testing of photovoltaic module decay according to claim 1, it is characterized in that, the terminal box that photovoltaic module described in described step one comprises laminate, is arranged at the aluminum alloy frame at described laminate two ends and is connected with described laminate, in described step 2, described aluminum alloy frame ground connection is determined the conduction on itself and ground, described terminal box is connected with described high-voltage power apparatus.
3. the method for testing of photovoltaic module decay according to claim 1, it is characterized in that, the terminal box that photovoltaic module described in described step one comprises laminate and is connected with described laminate, by photovoltaic module outside surface coated copper layers of foil in described step 2, utilize copper foil tape by copper foil layer ground connection and determine the conduction on itself and ground, described terminal box is connected with described high-voltage power apparatus.
4. according to the method for testing of the arbitrary described photovoltaic module decay of claim 1-3, it is characterized in that, photovoltaic module described in described step one comprises photovoltaic module to be measured and contrast photovoltaic module.
5. the method for testing of photovoltaic module decay according to claim 4, is characterized in that, utilize multimeter to determine the conduction with ground in described step 2.
6. the method for testing of photovoltaic module decay according to claim 5, it is characterized in that, in described step 3, the test duration of environmental cabinet is 48 hours or 96 hours.
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| CN201310329453.4A CN104345276A (en) | 2013-08-01 | 2013-08-01 | Method for testing attenuation of photovoltaic assembly |
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| CN108028625A (en) * | 2015-09-18 | 2018-05-11 | 信越化学工业株式会社 | Solar power system and its application method |
| CN108226021A (en) * | 2017-12-26 | 2018-06-29 | 米亚索能光伏科技有限公司 | The weatherability detection method and system of a kind of photovoltaic module |
| CN112054766A (en) * | 2020-08-20 | 2020-12-08 | 国家电投集团西安太阳能电力有限公司 | Method for testing and evaluating PID (proportion integration differentiation) performance of battery pack |
| CN112928988A (en) * | 2021-03-02 | 2021-06-08 | 中国科学院电工研究所 | Accelerated aging test method and system for photovoltaic module |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108028625A (en) * | 2015-09-18 | 2018-05-11 | 信越化学工业株式会社 | Solar power system and its application method |
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| CN108226021A (en) * | 2017-12-26 | 2018-06-29 | 米亚索能光伏科技有限公司 | The weatherability detection method and system of a kind of photovoltaic module |
| WO2019127308A1 (en) * | 2017-12-26 | 2019-07-04 | 米亚索能光伏科技有限公司 | Method and system for detecting weather resistance of photovoltaic assembly |
| CN112054766A (en) * | 2020-08-20 | 2020-12-08 | 国家电投集团西安太阳能电力有限公司 | Method for testing and evaluating PID (proportion integration differentiation) performance of battery pack |
| CN112928988A (en) * | 2021-03-02 | 2021-06-08 | 中国科学院电工研究所 | Accelerated aging test method and system for photovoltaic module |
| CN112928988B (en) * | 2021-03-02 | 2022-07-19 | 中国科学院电工研究所 | Accelerated aging test method and system for photovoltaic module |
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Application publication date: 20150211 |