CN102866342A - Potential induced attenuation testing method of silicon solar assemblies - Google Patents

Potential induced attenuation testing method of silicon solar assemblies Download PDF

Info

Publication number
CN102866342A
CN102866342A CN2012103233589A CN201210323358A CN102866342A CN 102866342 A CN102866342 A CN 102866342A CN 2012103233589 A CN2012103233589 A CN 2012103233589A CN 201210323358 A CN201210323358 A CN 201210323358A CN 102866342 A CN102866342 A CN 102866342A
Authority
CN
China
Prior art keywords
testing
voltage
test
assembly
assemblies
Prior art date
Application number
CN2012103233589A
Other languages
Chinese (zh)
Inventor
马跃
崔成丽
夏建汉
Original Assignee
欧贝黎新能源科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 欧贝黎新能源科技股份有限公司 filed Critical 欧贝黎新能源科技股份有限公司
Priority to CN2012103233589A priority Critical patent/CN102866342A/en
Publication of CN102866342A publication Critical patent/CN102866342A/en

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Abstract

The invention discloses a potential induced attenuation testing method of silicon solar assemblies, relating to the technical field of solar assemblies testing. The testing method comprises the steps of preparing three assemblies in same specification, randomly drawing one assemblies as a control part, and taking the other two assemblies as assemblies to be tested; carrying out sunning insolation pretreatment with certain intensity on the assemblies firstly, then carrying out primary testing, including appearance, insulation performance, electrical performance and EL (Electroluminescent) testing of the assemblies and wet leakage current testing; and in the testing process, recording a leakage current value, taking out the assemblies to restore for a period of time after the testing, and carrying out testing on the insulation performance, EL, wet leakage current and electrical performance. The potential induced attenuation testing method is used for evaluating the capability of bearing system bias voltage of the solar components and testing the capability of bearing various environmental factors such as system voltage, humidity and temperature of the solar components within reasonable cost and time and has a guiding significance in reducing and preventing a PID (Plazma Injection Damage) phenomenon and the like.

Description

A kind of electromotive force of silicon solar assembly is induced decay testing method
Technical field:
The present invention relates to the solar assembly test technical field, especially in use to the attenuation test of solar components, the electromotive force that is specifically related to a kind of silicon solar assembly is induced decay testing method.
Background technology:
When solar components is worked under certain humiture and high voltage environment for a long time, because the high strength bias voltage constantly passes through assembly, cause having leakage current between the component package material, and the phenomenon that makes assembly produce corrosion and decline is referred to as electromotive force and induces decay (PID) effect.This effect shows between glass, the encapsulating material and has leakage current, forms the leakage current passage between encapsulating material, backboard, glass and the frame.A large amount of accumulation cause the passivation of cell piece on the cell piece surface, cause open-circuit voltage, short-circuit current and fill factor, curve factor to reduce, and the EL photographic images shows the bad phenomenon such as blackspot.Influence factor is also more, is divided into two kinds of factors of internal and external reasons.External cause is mainly reflected in the amblent air temperature aspect; Internal factor is mainly manifested in cell piece, encapsulating material, backboard and the glass quality quality etc. that the preparation assembly adopts.The kill mechanism of inducing like this has multiple explanation, common several being explained as follows, and when solar components or component system are worked under high bias condition,
1. the semiconductor active district is influenced, causes lamination: the migration of ion in the active layer, and cause accumulation or charged ion to pass the semiconductor material surface electric charge, affect the active region of semiconductor material surface.The gathering (such as the gathering of sodion at glass surface) of ion can cause lamination when serious;
2. the performance degradation of semiconductor junction and distributary phenomenon: the ion migration can occur in the active layer, makes the performance degradation of semiconductor junction and causes shunting;
3. ionization corrosion and the in a large number transport phenomena of metallic ions: usually because the moisture that occurs in the encapsulation process can cause electrolytic corrosion and the electro-ionic migration of metal guide.
At present the assembly test method of this kind special effects do not had unified standard.
Summary of the invention:
The electromotive force that the purpose of this invention is to provide a kind of silicon solar assembly is induced decay testing method, and it is used for the test that the solar components electromotive force is induced decay.This method of testing is used for assessing the ability that solar components bears system's bias voltage, at rational cost with in the time, the test solar components bears the various environmental factor abilities such as system voltage, humidity, temperature, and reduce and prevention PID phenomenon etc. had directive significance.
In order to solve the existing problem of background technology, the present invention is by the following technical solutions: its test suite is comprised of aluminium foil 1, moisture film 2, glass 3, aluminium frame 4, solar panel 5, EVA 6 and TPT 7, glass 3, EVA 6 and TPT 7 stack successively, and the two ends of glass 3, EVA 6 and TPT 7 are provided with aluminium frame 4, be provided with solar panel 5 between glass 3 and the EVA 6, be provided with aluminium foil 1, moisture film 2 between the aluminium frame 4 of glass 3 upper ends, and aluminium foil 1 is arranged on the moisture film 2; Test suite is arranged in the climatic chamber 8.
Its method of testing is: a, prepare the assembly of 3 specifications of the same race, randomly draw 1 as control piece, other 2 as testing component;
Pre-service is tanned by the sun in b, the day illumination of at first assembly being carried out some strength, carries out preliminary survey after pre-service finishes, and comprises outward appearance, insulating property, electrical property, EL test and the wet leakage current test of assembly;
After c, preliminary survey are passed through, begin test, an end of testing component output terminal linked to each other with the both positive and negative polarity of high-voltage power supply with the aluminium frame, to testing component apply-2000V~+ bias voltage of 2000V, frame is carried out grounding, guarantee the voltage constant that provides by voltage controller;
D, according to demand, the aluminium frame connects "+" utmost point when applying negative bias, assembly output termination "-" utmost point;
E, such as the hot and humid condition of need, regulate control by climatic chamber, control piece places under the same environment, does not apply bias voltage;
In f, the process of the test, record leakage current numerical value after the off-test, recovers the assembly taking-up to carry out insulating property, EL test, wet electric leakage and electric performance test after a period of time.
The instrument that the present invention mainly adopts is climatic chamber, dielectric voltage withstand tester, high-voltage power supply, voltage table, voltage controller, and climatic chamber is used for simulating the experimental enviroment of uniform temperature and humidity; The dielectric voltage withstand tester is used for the insulating property of test suite; High-voltage power supply be used to provide the magnitude of voltage-2000V of certain numerical value~+ 2000V; Wet leakage current refers to the leakage current that forms between battery component and the ground connection frame, measures by being connected a resistance measurement voltage method between assembly and the ground; Voltage controller is used for detecting the stability of the voltage that provides, and guarantees the accuracy of test.
Test scene of the present invention mainly is that the electromotive force of solar components under simulation uniform temperature, humidity and the bias value environment is induced the decay situation.
The present invention is used for the test that the solar components electromotive force is induced decay.This method of testing is used for assessing the ability that solar components bears system's bias voltage, at rational cost with in the time, the test solar components bears the various environmental factor abilities such as system voltage, humidity, temperature, and reduce and prevention PID phenomenon etc. had directive significance.
Description of drawings:
Fig. 1 is the test connection layout of assembly of the present invention and testing tool.
Embodiment:
With reference to Fig. 1, this embodiment is by the following technical solutions: its test suite is comprised of aluminium foil 1, moisture film 2, glass 3, aluminium frame 4, solar panel 5, EVA 6 and TPT 7, glass 3, EVA 6 and TPT 7 stack successively, and the two ends of glass 3, EVA 6 and TPT 7 are provided with aluminium frame 4, be provided with solar panel 5 between glass 3 and the EVA 6, be provided with aluminium foil 1, moisture film 2 between the aluminium frame 4 of glass 3 upper ends, and aluminium foil 1 is arranged on the moisture film 2; Test suite is arranged in the climatic chamber 8.
Its method of testing is: a, prepare the assembly of 3 specifications of the same race, randomly draw 1 as control piece, other 2 as testing component;
Pre-service is tanned by the sun in b, the day illumination of at first assembly being carried out some strength, carries out preliminary survey after pre-service finishes, and comprises outward appearance, insulating property, electrical property, EL test and the wet leakage current test of assembly;
After c, preliminary survey are passed through, begin test, an end of testing component output terminal linked to each other with the both positive and negative polarity of high-voltage power supply with the aluminium frame, to testing component apply-2000V~+ bias voltage of 2000V, frame is carried out grounding, guarantee the voltage constant that provides by voltage controller;
D, according to demand, the aluminium frame connects "+" utmost point when applying negative bias, assembly output termination "-" utmost point;
E, such as the hot and humid condition of need, regulate control by climatic chamber, control piece places under the same environment, does not apply bias voltage;
In f, the process of the test, record leakage current numerical value after the off-test, recovers the assembly taking-up to carry out insulating property, EL test, wet electric leakage and electric performance test after a period of time.
The instrument that this embodiment mainly adopts is climatic chamber, dielectric voltage withstand tester, high-voltage power supply, voltage table, voltage controller, and climatic chamber is used for simulating the experimental enviroment of uniform temperature and humidity; The dielectric voltage withstand tester is used for the insulating property of test suite; High-voltage power supply be used to provide the magnitude of voltage-2000V of certain numerical value~+ 2000V; Wet leakage current refers to the leakage current that forms between battery component and the ground connection frame, measures by being connected a resistance measurement voltage method between assembly and the ground; Voltage controller is used for detecting the stability of the voltage that provides, and guarantees the accuracy of test.
The test scene of this embodiment mainly is that the electromotive force of solar components under simulation uniform temperature, humidity and the bias value environment is induced the decay situation.
This embodiment is used for the test that the solar components electromotive force is induced decay.This method of testing is used for assessing the ability that solar components bears system's bias voltage, at rational cost with in the time, the test solar components bears the various environmental factor abilities such as system voltage, humidity, temperature, and reduce and prevention PID phenomenon etc. had directive significance.
Embodiment one:
Testing component must tan by the sun 12h under the 10KWH/m2 sunshine condition.Testing component is carried out outward appearance by IEC61730-2MST 01 standard detect, carry out insulating property, EL, wet leakage current and electrical property preliminary survey after qualified.After the preliminary survey indices passed through, in normal temperature environment, according to Fig. 1 connecting test assembly, the glass plate upper surface of assembly was with moisture film aluminium coating paper tinsel, apply at output terminal and the aluminium frame of assembly-voltage of 1000VDC continues 168 hours.In the test process, guarantee to apply bias voltage by the observation voltage controller constant.After the off-test, carry out outward appearance detection, EL, wet leakage current test and final electric performance test after the assembly surface wiping cleaned up, calculate the attenuation ratio that the testing component electromotive force is induced decay, the disposal data result is completed.
Embodiment two:
Testing component must tan by the sun 12h under the 10KWH/m2 sunshine condition.Testing component is carried out outward appearance by IEC61730-2MST 01 standard detect, carry out insulating property, EL, wet leakage current and electrical property preliminary survey after qualified.After the preliminary survey indices is qualified, according to accompanying drawing 1 connecting test assembly, the glass plate upper surface of assembly moisture film aluminium coating paper tinsel, open climatic chamber, 25 ± 1 ℃ of adjusting ambient conditions, 50 ± 5%RH, after stable, apply at output terminal and the aluminium frame of assembly-voltage of 1000VDC continues 168 hours.In the test process, guarantee to apply bias voltage by the observation voltage controller constant.After the off-test, after the assembly outlet recovered 3-5h, rear outward appearance detection, EL, wet leakage current and the final electric performance test of carrying out equally cleaned out in wiping, calculates the attenuation ratio that the testing component electromotive force is induced decay, and the disposal data result is completed.
Embodiment three:
Testing component must tan by the sun 12h under the 10KWH/m2 sunshine condition.Testing component is carried out outward appearance by IEC61730-2 MST 01 standard detect, carry out insulating property, EL, wet leakage current and electrical property preliminary survey after qualified.After the preliminary survey indices is qualified, according to accompanying drawing 1 connecting test assembly, the glass plate upper surface of assembly moisture film aluminium coating paper tinsel.Open climatic chamber, 85 ± 1 ℃ of adjusting ambient conditions, 85 ± 2%RH, after stable, apply at output terminal and the aluminium frame of assembly-voltage of 1000VDC continues 168 hours.In the test process, guarantee to apply bias voltage by the observation voltage controller constant.After the off-test, behind the component recovery 3-5h, rear outward appearance detection, EL, wet leakage current and the final electric performance test of carrying out equally cleaned out in wiping, calculates the attenuation ratio that the testing component electromotive force is induced decay, and the arrangement experimental data is completed.

Claims (3)

1. the electromotive force of a silicon solar assembly is induced decay testing method, the test suite that it is characterized in that it is by aluminium foil (1), moisture film (2), glass (3), aluminium frame (4), solar panel (5), EVA (6) and TPT (7) form, glass (3), EVA (6) and TPT (7) stack successively, and glass (3), the two ends of EVA (6) and TPT (7) are provided with aluminium frame (4), be provided with solar panel (5) between glass (3) and the EVA (6), be provided with aluminium foil (1) between the aluminium frame (4) of glass (3) upper end, moisture film (2), and aluminium foil (1) is arranged on the moisture film (2); Test suite is arranged in the climatic chamber (8).
2. the electromotive force of a kind of silicon solar assembly according to claim 1 is induced decay testing method, the method of testing that it is characterized in that it is: (a), prepare the assembly of 3 specifications of the same race, randomly draw 1 as control piece, other 2 as testing component;
(b), at first assembly is carried out the day illumination of some strength and tan by the sun pre-service, pre-service is carried out preliminary survey after finishing, and comprises outward appearance, insulating property, electrical property, EL test and the wet leakage current test of assembly;
(c), after preliminary survey is passed through, begin test, an end of testing component output terminal linked to each other with the both positive and negative polarity of high-voltage power supply with the aluminium frame, to testing component apply-2000V~+ bias voltage of 2000V, frame is carried out grounding, guarantee the voltage constant that provides by voltage controller;
(d), according to demand, the aluminium frame connects "+" utmost point when applying negative bias, assembly output termination "-" utmost point;
(e), such as the hot and humid condition of need, regulate control by climatic chamber, control piece places under the same environment, does not apply bias voltage;
(f), in the process of the test, record leakage current numerical value after the off-test, will assembly takes out and recovers carry out insulating property, EL test, wet electric leakage and electric performance test after a period of time.
3. the electromotive force of a kind of silicon solar assembly according to claim 1 is induced decay testing method, it is characterized in that the instrument that described method of testing mainly adopts is climatic chamber, dielectric voltage withstand tester, high-voltage power supply, voltage table, voltage controller, climatic chamber is used for simulating the experimental enviroment of uniform temperature and humidity; The dielectric voltage withstand tester is used for the insulating property of test suite; High-voltage power supply be used to provide the magnitude of voltage-2000V of certain numerical value~+ 2000V; Wet leakage current refers to the leakage current that forms between battery component and the ground connection frame, measures by being connected a resistance measurement voltage method between assembly and the ground; Voltage controller is used for detecting the stability of the voltage that provides, and guarantees the accuracy of test.
CN2012103233589A 2012-09-04 2012-09-04 Potential induced attenuation testing method of silicon solar assemblies CN102866342A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012103233589A CN102866342A (en) 2012-09-04 2012-09-04 Potential induced attenuation testing method of silicon solar assemblies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2012103233589A CN102866342A (en) 2012-09-04 2012-09-04 Potential induced attenuation testing method of silicon solar assemblies

Publications (1)

Publication Number Publication Date
CN102866342A true CN102866342A (en) 2013-01-09

Family

ID=47445331

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2012103233589A CN102866342A (en) 2012-09-04 2012-09-04 Potential induced attenuation testing method of silicon solar assemblies

Country Status (1)

Country Link
CN (1) CN102866342A (en)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103326398A (en) * 2013-06-09 2013-09-25 阳光电源(上海)有限公司 Voltage compensation device, current converter comprising same and photovoltaic power generation system comprising same
CN103336233A (en) * 2013-06-04 2013-10-02 泰通(泰州)工业有限公司 A solar energy battery piece electric potential induction attenuation detection apparatus and a detection method thereof
CN103424680A (en) * 2013-08-29 2013-12-04 中利腾晖光伏科技有限公司 Testing device and testing method of solar cell assembly potential induction attenuation
CN103454567A (en) * 2013-08-29 2013-12-18 上海晶澳太阳能科技有限公司 PV component PID horizontal test method and system with set water film thickness
CN103618499A (en) * 2013-10-18 2014-03-05 浙江晶科能源有限公司 Solar cell piece PID (potential induced degradation) test device and test method
CN103795341A (en) * 2014-03-03 2014-05-14 江苏万丰光伏有限公司 Method for testing PID-attenuation-proof performance of photovoltaic assembly
CN103904993A (en) * 2014-03-13 2014-07-02 苏州阿特斯阳光电力科技有限公司 PID test method for solar cell
CN104065339A (en) * 2014-07-15 2014-09-24 江苏顺风光电科技有限公司 Experiment board of solar battery assembly PID and testing method thereof
CN104079241A (en) * 2014-07-15 2014-10-01 江苏顺风光电科技有限公司 Experimental board and test method for battery module PID
CN104167989A (en) * 2013-05-20 2014-11-26 晶科能源有限公司 Detection device and detection method for detecting anti-PID effect ability of solar cells
CN104345276A (en) * 2013-08-01 2015-02-11 普德光伏技术(苏州)有限公司 Method for testing attenuation of photovoltaic assembly
CN105074940A (en) * 2013-02-27 2015-11-18 日本瑞翁株式会社 Solar cell module and method for manufacturing same
CN105281664A (en) * 2015-03-04 2016-01-27 常州天合光能有限公司 Device and method for detecting solar assembly potential-induced degradation (PID) effect resisting capacity
CN106208964A (en) * 2016-09-22 2016-12-07 尚德太阳能电力有限公司 Analog solar assembly acceleration PID performance test methods under actual application environment
JP2017060369A (en) * 2015-09-18 2017-03-23 信越化学工業株式会社 Photovoltaic power generation system and method for using the same
CN106656041A (en) * 2016-12-26 2017-05-10 常州天合光能有限公司 Device and method for rapidly testing potential induced degradation of solar cell

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105074940B (en) * 2013-02-27 2017-04-26 日本瑞翁株式会社 Solar cell module and method for manufacturing same
CN105074940A (en) * 2013-02-27 2015-11-18 日本瑞翁株式会社 Solar cell module and method for manufacturing same
CN104167989A (en) * 2013-05-20 2014-11-26 晶科能源有限公司 Detection device and detection method for detecting anti-PID effect ability of solar cells
CN104167989B (en) * 2013-05-20 2016-08-31 晶科能源有限公司 The detection device of a kind of solar battery sheet anti-PID effect capability and detection method
CN103336233A (en) * 2013-06-04 2013-10-02 泰通(泰州)工业有限公司 A solar energy battery piece electric potential induction attenuation detection apparatus and a detection method thereof
CN103326398A (en) * 2013-06-09 2013-09-25 阳光电源(上海)有限公司 Voltage compensation device, current converter comprising same and photovoltaic power generation system comprising same
CN104345276A (en) * 2013-08-01 2015-02-11 普德光伏技术(苏州)有限公司 Method for testing attenuation of photovoltaic assembly
CN103424680A (en) * 2013-08-29 2013-12-04 中利腾晖光伏科技有限公司 Testing device and testing method of solar cell assembly potential induction attenuation
CN103454567A (en) * 2013-08-29 2013-12-18 上海晶澳太阳能科技有限公司 PV component PID horizontal test method and system with set water film thickness
CN103454567B (en) * 2013-08-29 2015-12-09 上海晶澳太阳能科技有限公司 The PV assembly PID horizontal checkout method of setting water film thickness and test macro
CN103618499A (en) * 2013-10-18 2014-03-05 浙江晶科能源有限公司 Solar cell piece PID (potential induced degradation) test device and test method
CN103618499B (en) * 2013-10-18 2016-01-20 浙江晶科能源有限公司 A kind of solar battery sheet PID testing apparatus and method of testing
CN103795341A (en) * 2014-03-03 2014-05-14 江苏万丰光伏有限公司 Method for testing PID-attenuation-proof performance of photovoltaic assembly
CN103904993A (en) * 2014-03-13 2014-07-02 苏州阿特斯阳光电力科技有限公司 PID test method for solar cell
CN104065339A (en) * 2014-07-15 2014-09-24 江苏顺风光电科技有限公司 Experiment board of solar battery assembly PID and testing method thereof
CN104079241A (en) * 2014-07-15 2014-10-01 江苏顺风光电科技有限公司 Experimental board and test method for battery module PID
CN105281664A (en) * 2015-03-04 2016-01-27 常州天合光能有限公司 Device and method for detecting solar assembly potential-induced degradation (PID) effect resisting capacity
JP2017060369A (en) * 2015-09-18 2017-03-23 信越化学工業株式会社 Photovoltaic power generation system and method for using the same
CN106208964A (en) * 2016-09-22 2016-12-07 尚德太阳能电力有限公司 Analog solar assembly acceleration PID performance test methods under actual application environment
CN106656041A (en) * 2016-12-26 2017-05-10 常州天合光能有限公司 Device and method for rapidly testing potential induced degradation of solar cell

Similar Documents

Publication Publication Date Title
CN101907688B (en) Method for detecting electrical property consistency of lithium ion battery
CN202957252U (en) Solar cell module
Luo et al. Potential-induced degradation in photovoltaic modules: a critical review
Ye et al. Performance degradation of various PV module technologies in tropical Singapore
Quintana et al. Commonly observed degradation in field-aged photovoltaic modules
Rajput et al. Degradation of mono-crystalline photovoltaic modules after 22 years of outdoor exposure in the composite climate of India
Sastry et al. Performance analysis of field exposed single crystalline silicon modules
Kahoul et al. Assessing the early degradation of photovoltaic modules performance in the Saharan region
Mäki et al. Effect of photovoltaic generator components on the number of MPPs under partial shading conditions
CN107275690B (en) A kind of battery self discharge rapid detection method
Hoffmann et al. Effect of humidity and temperature on the potential‐induced degradation
Sharma et al. A novel study for determining early life degradation of multi-crystalline-silicon photovoltaic modules observed in western Himalayan Indian climatic conditions
Holzhey et al. A full overview of international standards assessing the long-term stability of perovskite solar cells
JP4604250B2 (en) Solar cell array fault diagnosis method
Aste et al. PV technologies performance comparison in temperate climates
CN103208545B (en) A kind of solaode module
Wendlandt et al. Hot spot risk analysis on silicon cell modules
López-Escalante et al. Polyolefin as PID-resistant encapsulant material in PV modules
Sirisamphanwong et al. Impact of spectral irradiance distribution on the outdoor performance of photovoltaic system under Thai climatic conditions
TWI467202B (en) Evaluation device and evaluation method of flake battery
WO2007129512A1 (en) Improved durability test method of cis based thin film solar cell module
Ishii et al. Annual degradation rates of recent crystalline silicon photovoltaic modules
US9164149B2 (en) Testing device and testing method for quantum battery using semiconductor probe
Pingel et al. Potential induced degradation of solar cells and panels
CN103018566A (en) Lithium ion battery direct current internal resistance testing method and battery screening method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20130109