CN105203879A - Pot-type insulator lifetime assessment method based on artificial accelerated aging test - Google Patents
Pot-type insulator lifetime assessment method based on artificial accelerated aging test Download PDFInfo
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- CN105203879A CN105203879A CN201510600294.6A CN201510600294A CN105203879A CN 105203879 A CN105203879 A CN 105203879A CN 201510600294 A CN201510600294 A CN 201510600294A CN 105203879 A CN105203879 A CN 105203879A
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Abstract
The invention provides a pot-type insulator lifetime assessment method based on an artificial accelerated aging test. According to the characterizes of sealing, high temperature and long-time bearing on high voltage of a pot-type insulator, an artificial accelerated aging test platform with electric heating comprehensive factors is designed by means of a multiple-factor laboratory, and characteristic quantities of multiple epoxy resin samples under different degrees of aging are measured. On this basis, analyzing is conducted on test data, by means of an existing empirical formula, a curve-fitting technique and a Weibull probability distribution method are adopted, internal relations among all aging factors, the electrical test quantity and the aging life are researched, relationship is established between the test data of epoxy resin materials and the aging assessment of the pot-type insulator, and the pot-type insulator lifetime assessment method is provided.
Description
Technical field
The invention belongs to solid dielectric aging life-span electric powder prediction, particularly a kind of disc insulator lifetime estimation method based on artificial accelerated aging test.
Background technology
Disc insulator is the main building block of GIS, and it has two large functions: one is contact noble potential parts and earth potential shell, plays a part to support and insulation against ground; Two is connect moving contact between fracture and static contact respective element, plays a part to connect and insulate with fracture.Along with the widespread use of GIS, the reliable sex chromosome mosaicism of GIS device has caused extensive concern both domestic and external, and GIS device event of failure happens occasionally in recent years.According to operating experience, in all GIS fault cases, the defective proportion that disc insulator and disconnector cause is the highest, and wherein the failure rate of disc insulator is up to 26.6%.
Disc insulator is operated in GIS closed metal shell, for normal disc insulator, there will be maximum field strength with conductor connection, the most easily insulation ag(e)ing and damage occurs; For the disc insulator containing other defect, electric field distortion can occur at fault location, local field strength is obviously increased, edge flashing voltage significantly declines, and easily causes shelf depreciation at fault location, is the important aging action of disc insulator.Based on " trap theory " that solid dielectric insulation is aging, dielectric always first occurs aging in the weakest place of insulation and insulation is impaired, then spreads as chain centered by this point, finally causes insulation breakdown and inefficacy.Disc insulator is in course of normal operation, and under executing electric field action outside, surface meeting accumulation free charge, makes internal field distort, edge flashing voltage drop; In addition, may there is quality in the solidification process of disc insulator own control is tight, there is air blister defect in inside, or mechanical collision occurs in installation process, bring impurity etc. into.Above factor all can cause disc insulator generation shelf depreciation, accelerates the aging of disc insulator.Disc insulator is the important insulating element in GIS, long-term work is also in high voltage and hot environment, the totally-enclosed environment of GIS make its duty and fault detect more difficult, when there is edge flashing or breakdown fault in it, power failure area can be caused large, the serious consequence that the time between overhauls(TBO) is long.
The constituent material of disc insulator is epoxy resin.Epoxy resin is one of current three large interchangeable heat thermosetting resins, is the kind that in thermosetting plastics, consumption is maximum, most widely used, has excellent mechanical property and electrical insulation capability, however its weatherability and toughness poor, easily there is photooxidation and heat ageing.For the disc insulator in GIS environment, bear high voltage for a long time, hot environment, its aging mainly voltage ageing and heat ageing.How analyzing the aging action in the disc insulator course of work, obtaining effective state of insulation and aging life-span appraisal procedure, is problem demanding prompt solution.
In current domestic and international all documents, less to the research of disc insulator aging mechanism, do not have to form rule and the conclusion that can supply the actual reference of engineering.Although along with the research of widespread use to disc insulator of GIS gets more and more, be all confined to the research of single problem, be not deep into insulation ag(e)ing assessment and life prediction part.Artificial accelerated aging test aspect, current IEC and GB not yet have the aging testing method of the electric heating composite factor about solid dielectric, but define the standard of comparison system about the aging testing method of composite insulator, can be for reference.Under laboratory condition, all kinds of aging action in atmospheric environment is considered to the aging testing method of transmission line composite insulator simultaneously, in like manner, can consider that the internal aging factor of GIS carries out experimental design to disc insulator.Because directly carry out the too high and operating difficulties of aging test cost to disc insulator, the artificial accelerated aging test under electric heating composite factor can be carried out to the epoxide resin material for pouring into a mould disc insulator.By relating to disc insulator Aging Assessment to the test data analyzer of epoxide resin material, to need to analyze test figure, setting up contacting between sample and actual disc insulator by the related physical quantity in ageing process.Solid dielectric Life Prediction Model aspect always is a difficult problem, at present mostly empirically formula.
Summary of the invention
Based on this, the invention discloses a kind of disc insulator lifetime estimation method based on artificial accelerated aging test, said method comprising the steps of:
Multi-stress aging laboratory put into by S100, the sample two groups being provided with electrode; Setting test temperature and voltage, start artificial accelerated aging test;
S200, take out one every one section of digestion time t is each from two groups of samples, adopt identical numbering, carry out insulation resistivity measurement, generate dielectric features curve based on digestion time and insulation resistivity percentage relation;
S300, maintenance test temperature are constant, separately get multiple trial voltage value, repeat step S100 and S200, obtain many group insulation characterisitic curves altogether;
Data in many groups insulation characterisitic curve under S400, the different magnitudes of voltage that obtained by S300, are set up the relation curve of electric field intensity and aging life-span, obtain the relational expression (1) of electric field intensity and digestion time;
t
1/t
2＝(E
2/E
1)
n(1)
Wherein, t
1for at field intensity E
1aging life-span under effect, t
2for at field intensity E
2aging life-span under effect;
If the test temperature set in S500 step S100 and disc insulator operating ambient temperature relative error within 5 DEG C, then carry out step S600; If the test temperature set in step S100 is higher than disc insulator operating ambient temperature more than 5 DEG C, then utilize the relation curve of Arrhenius equation determination thermal aging time and temperature, the fit equation of described relation curve is such as formula shown in (2):
lnt＝lnA
0-E
a/RT(2)
Wherein, A
0for prefactor, t is thermal aging time, E
afor the active energy of heat ageing, R is gas law constant;
Utilize formula (2) to revise the dielectric features curve described in step S200, obtain the dielectric features curve under disc insulator operating ambient temperature, and replace the dielectric features curve described in step S200 with this dielectric features curve;
S600, measurement have the insulation resistivity of the disc insulator of tenure of use and record this tenure of use, and many groups dielectric features curve that S300 obtains finds corresponding point;
S700, based on the corresponding point found described in step S600, utilize formula (1) further, the digestion time under conversion disc insulator working field strength, made comparisons with the tenure of use of the disc insulator described in step S600;
S800, time limit comparative result based on S700, in many groups insulation characterisitic curve in step S300, choose the immediate dielectric features curve with the tenure of use of disc insulator, immediate dielectric features curve tenure of use is carried out curve fitting, obtains fitting function;
Wherein, A is constant, and K is the coefficient relevant to material, and t is digestion time, and δ is time index, and z represents insulation resistivity;
S900, the finally Life Prediction Model obtained under disc insulator work field intensity are shown below;
In above formula, t
1for field intensity E
1digestion time under effect, t
2for field intensity E
2digestion time under effect; A
0for prefactor, t is thermal lifetime, E
afor the active energy of heat ageing, R is gas law constant, and T is thermodynamic temperature, and A is constant, and K is the coefficient relevant to material, and t is digestion time, and δ is time index;
S1000, Life Prediction Model based on S900, assess the disc insulator life-span, and based on assessment result, perform different life conservation strategies to disc insulator.
Compared with prior art, the present invention is by establishing the contact between epoxy resin samples test figure and disc insulator life prediction to the data processing of artificial accelerated aging, open the approach that of disc insulator life prediction is feasible, have very large directive significance to disc insulator and other dielectric life predictions.
Accompanying drawing explanation
Fig. 1 is epoxy resins insulation aging character curve map of the present invention; Wherein 1 represents insulation resistivity smaller value insulation curve, and 2 represent insulation resistivity higher value insulation curve, and 3 represent insulation resistivity mean value insulation curve;
Fig. 2 is the graph of relation of the thermal lifetime determined by Arrhenius equation of the present invention and temperature;
Fig. 3 is the field intensity of Weibull probability method of the present invention reckoning and the graph of relation of aging life-span;
Fig. 4 is disc insulator Life Prediction Model Establishing process figure of the present invention.
Embodiment
Below in conjunction with specific embodiment and accompanying drawing, the present invention will be further elaborated.
In one embodiment, the invention discloses a kind of disc insulator lifetime estimation method based on artificial accelerated aging test, said method comprising the steps of:
Multi-stress aging laboratory put into by S100, the sample two groups being provided with electrode; Setting test temperature and voltage, start artificial accelerated aging test;
S200, take out one every one section of digestion time t is each from two groups of samples, adopt identical numbering, carry out insulation resistivity measurement, generate dielectric features curve based on digestion time and insulation resistivity percentage relation;
S300, maintenance test temperature are constant, separately get multiple trial voltage value, repeat step S100 and S200, obtain many group insulation characterisitic curves altogether;
Data in many groups insulation characterisitic curve under S400, the different magnitudes of voltage that obtained by S300, are set up the relation curve of electric field intensity and aging life-span, obtain the relational expression (1) of electric field intensity and digestion time;
t
1/t
2＝(E
2/E
1)
n(1)
Wherein, t
1for at field intensity E
1aging life-span under effect, t
2for at field intensity E
2aging life-span under effect;
If the test temperature set in S500 step S100 and disc insulator operating ambient temperature relative error within 5 DEG C, then carry out step S600; If the test temperature set in step S100 is higher than disc insulator operating ambient temperature more than 5 DEG C, then utilize the relation curve of Arrhenius equation determination thermal aging time and temperature, the fit equation of described relation curve is such as formula shown in (2):
lnt＝lnA
0-E
a/RT(2)
Wherein, A
0for prefactor, t is thermal aging time, E
afor the active energy of heat ageing, R is gas law constant;
Utilize formula (2) to revise the dielectric features curve described in step S200, obtain the dielectric features curve under disc insulator operating ambient temperature, and replace the dielectric features curve described in step S200 with this dielectric features curve;
S600, measurement have the insulation resistivity of the disc insulator of tenure of use and record this tenure of use, and many groups dielectric features curve that S300 obtains finds corresponding point;
S700, based on the corresponding point found described in step S600, utilize formula (1) further, the digestion time under conversion disc insulator working field strength, made comparisons with the tenure of use of the disc insulator described in step S600;
S800, time limit comparative result based on S700, in many groups insulation characterisitic curve in step S300, choose the immediate dielectric features curve with the tenure of use of disc insulator, immediate dielectric features curve tenure of use is carried out curve fitting, obtains fitting function;
Wherein, A is constant, and K is the coefficient relevant to material, and t is digestion time, and δ is time index, and z represents insulation resistivity;
S900, the finally Life Prediction Model obtained under disc insulator work field intensity are shown below;
In above formula, t
1for field intensity E
1digestion time under effect, t
2for field intensity E
2digestion time under effect; A
0for prefactor, t is thermal lifetime, E
afor the active energy of heat ageing, R is gas law constant, and T is thermodynamic temperature, and A is constant, and K is the coefficient relevant to material, and t is digestion time, and δ is time index;
S1000, Life Prediction Model based on S900, assess the disc insulator life-span, and based on assessment result, perform different life conservation strategies to disc insulator.
Digestion time described in the present embodiment remains on more than 3000h, the digestion time t of being separated by described step S200 desirable 500h, 1000h, 1500h, 2000h or 3000h.
The present embodiment comprises two groups of test specimens, therefore insulation resistivity is measured at every turn and can be obtained two values, to two the insulation resistivity value averaged recorded, the dielectric features curve generated as shown in Figure 1 is a belt-like zone, to the higher value in the two groups of dielectric features curve values recorded, smaller value and mean value respectively plot a curve.
The determination of the n value in the present embodiment in step S400 in relational expression (1) is under different trial voltages, calculate multiple n value, then gets average and obtains final n value.
The meaning of the model described in the present embodiment is: the artificial accelerated aging test epoxy resin board identical with disc insulator material being carried out to electricity, hot composite factor, obtains dielectric features curve, and approximate function form is
then by using the insulation resistivity of the disc insulator of certain time limit to measure, this formula is brought into, formula t
1/ t
2=(E
2/ E
1)
nthe digestion time under disc insulator work field intensity can be calculated; If the temperature set in aging test keeps off GIS internal temperature, then again by the relational expression lnt=lnA of digestion time and temperature
0-E
a/ RT can obtain the digestion time of the final disc insulator calculated.Namely digestion time when disc insulator insulation resistivity number percent reduces to certain value can be extrapolated by dielectric features curvilinear function and two other relational expression, if disc insulator insulation breakdown, can obtain the end-of-life time (aging life-span) when knowing that insulation resistance number percent reduces to b value.
The present invention is removed by measuring failure of insulation the insulation resistivity of disc insulator come, and calculates insulation resistivity number percent, as end-of-life mark, namely to think failure of insulation when insulation resistivity number percent reduces to this value when epoxide resin material is aged to.
Method described in the present embodiment is closed for disc insulator, high temperature and bear high-tension feature for a long time, utilize factorial experiment room to design the artificial accelerated aging test platform of electric heating composite factor, measure the characteristic quantity under the different degree of aging of multiple epoxy resin samples.On this basis, experimental data is analyzed, utilize existing experimental formula, adopt curve fitting technique and Weibull probability distribution, study the inner link between each aging action, electric test amount and aging life-span, contacting setting up the test figure of epoxide resin material and the Aging Assessment of disc insulator, proposing a set of disc insulator lifetime estimation method.
Based on the disc insulator lifetime estimation method of above-mentioned artificial accelerated aging test method, need to carry out electric measurement, analytical test data to the epoxy resin board after aging, set up contacting between disc insulator by physical quantity.Electron microscopic observation and measurement of electric parameter are carried out to the sample after different time is aging, find out the characteristic quantity that can represent degree of aging, draw epoxy resins insulation aging character curve, in conjunction with the disc insulator correlation parameter of existing certain tenure of use, curve and Weibull probability distribution is utilized to extrapolate the Life Prediction Model of disc insulator.
The present embodiment utilizes the state of insulation of insulation resistivity to epoxy resin board and disc insulator to assess, if the epoxy resin board after overtesting is aging is identical with the insulation resistivity of the disc insulator using certain time limit, roughly can think that the two degree of aging is identical.Adopt existing experimental formula, set up temperature, relation between electric field and aging life-span, the rate of ageing of insulator under GIS internal temperature and current field condition can be inferred thus.Be combined with experimental formula by the iunction for curve of test specimen data, the residual life of disc insulator under different conditions can be inferred.
In one embodiment, the sample described in step S100 adopts epoxy resin board, and described electrode adopts copper rod, and described copper rod is positioned over the both sides of epoxy resin board.
In the present embodiment, every physics and the electrical performance demands of testing epoxy resin board used are consistent with disc insulator material.
In one embodiment, the often group sample in described step S100 is the epoxy resin board that multiple both sides are placed with copper rod.
In the present embodiment, the number of test specimens often organized can be the epoxy resin board that five both sides are placed with copper rod.
In one embodiment, in described step S100, artificial accelerated aging test platform is built based on factorial experiment room, has high temperature and high-tension environment.
Multi-stress aging laboratory internal structure described in the present embodiment is: earth potential end is annular steel frame construction, the test specimen dropped into is uniformly distributed ringwise, the bare copper wire being 2mm by radius connects and is suspended on steelframe, and high-pressure side exports from ground level transformer terminal.
In one embodiment, the spacing between two copper rod on described test specimen and test setting magnitude of voltage by disc insulator normally work field intensity determine.
More excellent, in one embodiment, the setting principle of magnitude of voltage of the spacing between described two copper rod and test setting is specially two copper rod zone line field intensity and normally works higher than disc insulator more than 2 to 3 times of field intensity, is less than test gained breakdown field strength.
In one embodiment, described test temperature higher than GIS environment temperature, but is no more than the glass temperature of epoxide resin material itself.
Insulation resistivity number percent described in step S200 is the number percent that test specimen carries out between insulation resistivity when artificial accelerated aging dispatches from the factory and the insulation resistivity after test;
The curve of dielectric features described in step S200 comprises three curves, is insulation resistivity higher value insulation curve respectively, insulation resistivity smaller value insulation curve and insulation resistivity mean value insulation curve;
Insulation resistivity higher value insulation curve generates based on the relation of insulation resistivity higher value number percent in digestion time and two groups of samples;
Insulation resistivity minimum value insulation curve generates based on the relation of insulation resistivity smaller value number percent in digestion time and two groups of samples;
Insulation resistivity average insulation curve generates based on the relation of the insulation resistivity average number percent of digestion time and two groups of samples.
In the present embodiment, every physics and the electrical performance demands of testing epoxy resin board used are consistent with disc insulator material, and namely we can think that the insulation resistivity of the epoxy resin board that just dispatched from the factory and disc insulator is identical value, with this value for initial value.The insulation resistivity of the insulator of certain tenure of use obtains an insulation resistivity number percent compared with initial value, and the insulation resistivity of the sample after certain hour is aging obtains the insulation resistivity number percent of aged samples compared with initial value.
In one embodiment, the electric field intensity in described step S400 is determined by the spacing between the copper rod of two on trial voltage and test specimen; Aging life-span in step S400 is the digestion time corresponding when the aging rear insulation resistivity of different tests magnitude of voltage test specimen reduces to 40%-55%.
Preferably, the present invention, using insulation resistivity as the parameter weighing dielectric insulation degree of aging, can think that when insulation resistivity reaches identical value the degree of aging of sample is identical.So the insulation resistivity the chosen number percent at place is reduced to 60% as a reference point, under different voltage, all reach this value through certain hour is aging like this, namely under different voltage, sample reaches identical degree of aging through different time.
Preferably, the point (also other points desirable) that desirable insulation resistivity reduces to 50% is reference point, and the digestion time that aging rear insulation resistivity is reduced to corresponding to 50% under different magnitude of voltage is like this aging life-span.
In one embodiment, choose the immediate dielectric features curve with the tenure of use of disc insulator in described step S800, comprise the following steps:
S1, to using the disc insulator of certain time limit to carry out insulation resistivity measurement, obtaining insulation resistivity number percent compared with the insulation resistivity without aging epoxy resin samples, being set to α %;
S2, the point finding corresponding insulation resistivity number percent to be α % on 5 groups of different dielectric features curves, suppose lower envelope line, and the digestion time on coenvelope line and mean value line is respectively tm, tn, tf;
S3, suppose that the epoxy resin samples surface maximum field strength that dielectric features curve is corresponding is F1, the maximum field intensity on surface during the work of simulation calculation disc insulator, is designated as E2, utilizes formula t
1/ t
2=(E
2/ E
1)
n, make t1=tf, determine the disc insulator digestion time t2 determined by each dielectric features curve;
S4, the disc insulator digestion time of being converted by each characteristic curve and actual useful year to be contrasted, choose immediate one, be dielectric features curve immediate with disc insulator insulation ag(e)ing trend.
In one embodiment, the life conservation strategy in described step S1000 comprises: before disc insulator is installed and used, carry out withstand voltage test, ensures that insulator itself does not exist mass defect; Come into operation when ensureing that disc insulator itself does not exist mass defect, and according to the assessment the Ageing of Insulators life-span of Life Prediction Model described in step S900, after reaching 80% of aging life-span tenure of use, the shelf depreciation situation of monitoring disc insulator; As there is partial discharge phenomenon, the disc insulator of described detection being replaced, as do not there is shelf depreciation situation, then the shelf depreciation situation continued of described disc insulator being monitored.
In one embodiment, Fig. 1 is epoxide resin material insulation ag(e)ing characteristic curve of the present invention.Horizontal ordinate for test digestion time, ordinate be the insulation resistivity number percent insulation resistivity of the sample after aging (/ without aging sample insulation resistivity).Solid dielectric aging or insulate impaired after, insulation resistivity can reduce gradually, and namely insulation resistance number percent is less, and the degree of aging representing material is more serious.
Fig. 2 is the graph of relation of the thermal lifetime determined by Arrhenius equation of the present invention and temperature.
Arrhenius equation is:
K＝A
0exp(-E/RT)
In formula, K is reaction rate constant, A
0for prefactor, E is reaction activity, and R is gas law constant, and T is thermodynamic temperature.In order to study the relation of aging life-span and aging temperature, above formula can be changed into
t＝A
0exp(-E
a/RT)
Wherein t is thermal lifetime, E
afor the active energy of heat ageing.
By formula t=A
0exp (-E
a/ RT) both sides get natural logarithm simultaneously, can obtain the fit equation of the relation curve of thermal aging time and temperature:
lnt＝lnA
0-E
a/RT
Linear equation can be further converted to
Y＝a+bX
In formula, Y=lnt, a=lnA
0, b=-E
a/ R, T=1/ (θ+273.15).θ is with degree Celsius temperature represented.
Thus, we can do heat ageing accelerated test under 3 ~ 4 temperature values higher than GIS internal temperature, obtain the time (i.e. half life period) of material performance degradation to 50% at such a temperature, the linear relationship curve of the logarithm of digestion time and the inverse of temperature can be drawn, the parameter a in formula (4) and b can be determined, material aging life-span when temperature is set as GIS internal operating temperature can be obtained by this relation curve.
Fig. 3 is the field intensity of Weibull probability method reckoning and the graph of relation of aging life-span.Under different trial voltages, sample accumulation breakdown probability and life value near linear relation, its mathematic(al) representation is
F(t，E)＝1-exp(ct
aE
b)
In formula: E is for execute field intensity outward, and a, b, c are the constant relevant with temperature, material and structure etc.;
Taking the logarithm in both sides, makes n=b/a, can obtain
t＝KE
-n
In formula: K is and insulating material, constant that insulation system is relevant, and n is life factor.
Get 5 groups of trial voltages, control ageing oven temperature-resistant, take turns doing 5 groups of tests, under different tests voltage, obtain each sample insulation resistivity number percent by for 50% time aging life-span, i.e. median life span.
If at field intensity E
1median life span under effect is t
1, at field intensity E
2median life span under effect is t
2, then have
t
1/t
2＝(E
2/E
1)
n
When electrode structure and spacing constant, formula (7) can be derived from
t
1/t
2＝(U
2/U
1)
n
Formula t is substituted into according to trial voltage value adjacent between two
1/ t
2=(U
2/ U
1)
nin can calculate 4 groups of n values, average and can determine n value, obtain the trial voltage of epoxide resin material and the relational expression of aging life-span.
Fig. 4 is disc insulator Life Prediction Model Establishing process figure of the present invention.Set up disc insulator Life Prediction Model step as follows:
Artificial accelerated aging test platform put into by step 1, the sample (2 × 5) assembling electrode by two.Set temperature and voltage, start aging test.
Step 2, take out one every one section of digestion time t is each from two groups of samples, adopt identical numbering, carry out insulation resistivity measurement.Draw dielectric features curve map.
Step 3, keep temperature-resistant, separately get 4 magnitudes of voltage, repeat step 1 and 2.
Step 4, by the aging test data under different magnitude of voltage, set up the relation curve of electric field intensity and aging life-span, determine t
1/ t
2=(E
2/ E
1)
nin n value.
Step 5, as test temperature is close with disc insulator operating ambient temperature, then carry out step 6; If test temperature is higher than disc insulator operating ambient temperature, then the thermal lifetime determined by Arrhenius equation and the graph of relation of temperature are revised dielectric features curve, obtain the dielectric features curve under disc insulator operating ambient temperature.
Step 6, measurement have the insulation resistivity (or dielectric dissipation factor) of the disc insulator of certain tenure of use, and group dielectric features curve of 5 before finds corresponding point.
Step 7, utilize formula t
1/ t
2=(E
2/ E
1)
n, by the digestion time under the some conversion disc insulator work field intensity on each dielectric features curve, make comparisons with the tenure of use of this disc insulator.
Step 8, choose through conversion after dielectric features curve immediate with the tenure of use of this disc insulator, this curve is carried out curve fitting, obtains fitting function
Step 9, by fitting function and formula lnt=lnA
0-E
a/ RT and formula t
1/ t
2=(E
2/ E
1)
nin conjunction with, the Life Prediction Model under disc insulator work field intensity can be obtained.
Choose dielectric features curve immediate with disc insulator insulation ag(e)ing trend, its step is as follows:
Step 1, to using the disc insulator of certain time limit to carry out insulation resistivity measurement, obtaining insulation resistivity number percent compared with the insulation resistivity without aging epoxy resin samples, being set to α %.
Step 2, find on 5 groups of different dielectric features curves corresponding insulation resistivity number percent be the point of α % as Fig. 1, at lower envelope line, coenvelope line and mean value line obtain digestion time and are respectively t
m, t
n, t
f.
Step 3, suppose dielectric features curve corresponding epoxy resin samples surface maximum field strength be E
1, the maximum field intensity on the surface during work of simulation calculation disc insulator, is designated as E
2, utilize formula t
1/ t
2=(E
2/ E
1)
n, make t
1=t
f, calculate the disc insulator digestion time t converted by each characteristic curve
2.
Step 4, the disc insulator digestion time of being converted by each characteristic curve and actual useful year to be contrasted, choose immediate one, be dielectric features curve immediate with disc insulator insulation ag(e)ing trend.The aging tendency of disc insulator can be determined in conjunction with formula (2) by curve thus.
The establishment of the aging life-span forecast model of disc insulator is as follows with use:
To the aging character curve of epoxide resin material as shown in Figure 1, by experimental formula can set fitting function as:
Wherein z is insulation resistivity percentage, and z=(the sample insulation resistivity after digestion time t/without aging sample insulation resistivity) × 100%, y is insulation resistivity decline percentage.
A is constant, and K is the coefficient relevant to material, and t is digestion time, and δ is time index.
By carrying out curve fitting to insulation ag(e)ing characteristic curve, each undetermined parameter in fitting function can be asked for.
If the test temperature chosen in aging test close to GIS disc insulator working temperature, then aging life-span forecast model can be determined by following system of equations:
If the test temperature that aging test is chosen is higher than GIS disc insulator working temperature, then need to do for supplement 3 ~ 4 higher than the heat ageing accelerated test under the temperature value of GIS internal temperature, draw the linear relationship curve lnt=lnA of the logarithm of digestion time and the inverse of temperature
0-E
a/ RT.Now the aging life-span forecast model of disc insulator can be determined by following system of equations:
The meaning of the model described in the present embodiment is: the artificial accelerated aging test epoxy resin board identical with disc insulator material being carried out to electricity, hot composite factor, obtains dielectric features curve, and approximate function form is
then by using the insulation resistivity of the disc insulator of certain time limit to measure, this formula is brought into, formula t
1/ t
2=(E
2/ E
1)
nthe digestion time under disc insulator work field intensity can be calculated; If the temperature set in aging test keeps off GIS internal temperature, then again by the relational expression lnt=lnA of digestion time and temperature
0-E
a/ RT can obtain the digestion time of the final disc insulator calculated.Namely digestion time when disc insulator insulation resistivity number percent reduces to certain value can be extrapolated by dielectric features curvilinear function and two other relational expression, if disc insulator insulation breakdown, can obtain the end-of-life time (aging life-span) when knowing that insulation resistance number percent reduces to b value.
The present invention is removed by measuring failure of insulation the insulation resistivity of disc insulator come, and calculates insulation resistivity number percent, as end-of-life mark, namely to think failure of insulation when insulation resistivity number percent reduces to this value when epoxide resin material is aged to.
Above to invention has been detailed introduction, applying specific case herein and setting forth principle of the present invention and embodiment, the explanation of above embodiment just understands method of the present invention and core concept thereof for helping; Meanwhile, for those skilled in the art, according to thought of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.
Claims (10)
1., based on a disc insulator lifetime estimation method for artificial accelerated aging test, it is characterized in that, said method comprising the steps of:
Multi-stress aging laboratory put into by S100, the sample two groups being provided with electrode; Setting test temperature and voltage, start artificial accelerated aging test;
S200, take out one every one section of digestion time t is each from two groups of samples, adopt identical numbering, carry out insulation resistivity measurement, generate dielectric features curve based on digestion time and insulation resistivity percentage relation;
S300, maintenance test temperature are constant, separately get multiple trial voltage value, repeat step S100 and S200, obtain many group insulation characterisitic curves altogether;
Data in many groups insulation characterisitic curve under S400, the different magnitudes of voltage that obtained by S300, are set up the relation curve of electric field intensity and aging life-span, obtain the relational expression (1) of electric field intensity and digestion time;
t
1/t
2＝(E
2/E
1)
n(1)
Wherein, t
1for at field intensity E
1aging life-span under effect, t
2for at field intensity E
2aging life-span under effect;
If the test temperature set in S500 step S100 and disc insulator operating ambient temperature relative error within 5 DEG C, then carry out step S600; If the test temperature set in step S100 is higher than disc insulator operating ambient temperature more than 5 DEG C, then utilize the relation curve of Arrhenius equation determination thermal aging time and temperature, the fit equation of described relation curve is such as formula shown in (2):
lnt＝lnA
0-E
a/RT(2)
Wherein, A
0for prefactor, t is thermal aging time, E
afor the active energy of heat ageing, R is gas law constant;
Utilize formula (2) to revise the dielectric features curve described in step S200, obtain the dielectric features curve under disc insulator operating ambient temperature, and replace the dielectric features curve described in step S200 with this dielectric features curve;
S600, measurement have the insulation resistivity of the disc insulator of tenure of use and record this tenure of use, and many groups dielectric features curve that S300 obtains finds corresponding point;
S700, based on the corresponding point found described in step S600, utilize formula (1) further, the digestion time under conversion disc insulator working field strength, made comparisons with the tenure of use of the disc insulator described in step S600;
S800, time limit comparative result based on S700, in many groups insulation characterisitic curve in step S300, choose the immediate dielectric features curve with the tenure of use of disc insulator, immediate dielectric features curve tenure of use is carried out curve fitting, obtains fitting function;
Wherein, A is constant, and K is the coefficient relevant to material, and t is digestion time, and δ is time index, and z represents insulation resistivity;
S900, the finally Life Prediction Model obtained under disc insulator work field intensity are shown below;
In above formula, t
1for field intensity E
1digestion time under effect, t
2for field intensity E
2digestion time under effect; A
0for prefactor, t is thermal lifetime, E
afor the active energy of heat ageing, R is gas law constant, and T is thermodynamic temperature, and A is constant, and K is the coefficient relevant to material, and t is digestion time, and δ is time index;
S1000, Life Prediction Model based on S900, assess the disc insulator life-span, and based on assessment result, perform different life conservation strategies to disc insulator.
2. method according to claim 1, is characterized in that: preferred, and the sample described in step S100 adopts epoxy resin board, and described electrode adopts copper rod, and described copper rod is positioned over the both sides of epoxy resin board.
3. method according to claim 2, is characterized in that: the often group sample in described step S100 is the epoxy resin board that multiple both sides are placed with copper rod.
4. method according to claim 1, is characterized in that: in described step S100, artificial accelerated aging test platform is built based on factorial experiment room, has high temperature and high-tension environment.
5. method according to claim 2, it is characterized in that, the setting principle of magnitude of voltage of the spacing between two copper rod on described test specimen and test setting specifically comprises: two copper rod zone line field intensity normally work higher than disc insulator more than 2 to 3 times of field intensity, are less than test gained breakdown field strength.
6. method according to claim 1, is characterized in that: the test temperature in described step S100 higher than GIS environment temperature, but is no more than the glass temperature of epoxide resin material itself.
7. method according to claim 1, is characterized in that:
Insulation resistivity number percent described in step S200 is the number percent that test specimen carries out between insulation resistivity when artificial accelerated aging dispatches from the factory and the insulation resistivity after test;
The curve of dielectric features described in step S200 comprises three curves, is insulation resistivity higher value insulation curve respectively, insulation resistivity smaller value insulation curve and insulation resistivity mean value insulation curve;
Insulation resistivity higher value insulation curve generates based on the relation of insulation resistivity higher value number percent in digestion time and two groups of samples;
Insulation resistivity minimum value insulation curve generates based on the relation of insulation resistivity smaller value number percent in digestion time and two groups of samples;
Insulation resistivity average insulation curve generates based on the relation of the insulation resistivity average number percent of digestion time and two groups of samples.
8. method according to claim 5, is characterized in that: the electric field intensity in described step S400 is determined by the spacing between the copper rod of two on trial voltage and test specimen; Aging life-span in step S400 is the digestion time corresponding when the aging rear insulation resistivity of different tests magnitude of voltage test specimen reduces to 40%-55%.
9. method according to claim 7, is characterized in that, chooses the immediate dielectric features curve with the tenure of use of disc insulator, comprise the following steps in described step S800:
S1, insulation resistivity measurement is carried out to the disc insulator employing 5 ~ 10 years, obtain insulation resistivity number percent compared with the insulation resistivity without aging epoxy resin samples, be set to α %;
S2, the point finding corresponding insulation resistivity number percent to be α % on the dielectric features curve that many groups are different, suppose insulation resistivity higher value insulation curve, the digestion time that insulation resistivity smaller value insulation curve and insulation resistivity mean value insulate on curve is respectively tm, tn, tf;
S3, suppose dielectric features curve corresponding epoxy resin samples surface maximum field strength be E1, the maximum field intensity on the surface during work of simulation calculation disc insulator, be designated as E2, utilize formula (1), make t1=tf, determine by disc insulator digestion time t2 corresponding to each dielectric features Curves;
S4, the disc insulator digestion time of being converted by each characteristic curve and actual useful year to be contrasted, choose immediate one, as dielectric features curve immediate with disc insulator insulation ag(e)ing trend.
10. method according to claim 1, is characterized in that, the life conservation strategy in described step S1000 comprises: before disc insulator is installed and used, carry out withstand voltage test, ensures that insulator itself does not exist mass defect; Come into operation when ensureing that disc insulator itself does not exist mass defect, and according to the assessment the Ageing of Insulators life-span of Life Prediction Model described in step S900, after reaching 80% of aging life-span tenure of use, the shelf depreciation situation of monitoring disc insulator; As there is partial discharge phenomenon, the disc insulator of described detection is replaced; As do not there is shelf depreciation situation, then the shelf depreciation situation continued of described disc insulator is monitored.
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