CN110632407A - Method for evaluating service life of direct-current metallized film capacitor - Google Patents
Method for evaluating service life of direct-current metallized film capacitor Download PDFInfo
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- CN110632407A CN110632407A CN201810655684.7A CN201810655684A CN110632407A CN 110632407 A CN110632407 A CN 110632407A CN 201810655684 A CN201810655684 A CN 201810655684A CN 110632407 A CN110632407 A CN 110632407A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
A method for evaluating the service life of a direct-current metallized film capacitor comprises a voltage aging test, a temperature change test and a comprehensive analysis, wherein a curve formula is established to calculate the service life of rated voltage through test time of different voltages and temperatures; and further calculating the service life of the actual working voltage according to a formula. The invention can evaluate the service life of the capacitor by a test method, and can predict the design service life and judge the process quality in the production process.
Description
Technical Field
The invention belongs to the field of power electronic capacitors, and particularly relates to a method for evaluating the service life of a direct-current metallized film capacitor.
Background
In the field of power electronics, a direct-current metallized film capacitor is used as a key component of a current transformation device. In all the technical conditions of the product, the service life is taken as a key index.
Generally, the lifetime index of the DC metallized film capacitor is more than 100000 hours. In the rail transit industry, the service life of the capacitor is 30 years or 25 ten thousand hours along with the requirement of the whole vehicle. In an electric power system, the lifetime of a capacitor is required to be 40 years or 26 ten thousand hours. However, in the practical use of the capacitor, the practical service life of the capacitor has obvious deviation from the requirements of the technical specification.
Only specified durability tests are carried out in the capacitor standard GB/T25121 rail transit locomotive equipment power electronic capacitor (corresponding to IEC 61881:2010 MOD Rail access applications-rolling stock requirements-Capacitors for power electronics) of power electronics and GB/T17702-2013 power electronic capacitor (IEC 61071:2007 Capacitors for power electronics). Therefore, there is no good way to validate the lifetime indicator in capacitor technology conditions.
In summary, the evaluation method of such capacitors is a technique to be solved at present under the regulation of standards and the permanence of time.
Disclosure of Invention
The invention provides a method for evaluating the service life of a direct-current metallized film capacitor based on a durability test method, aiming at the requirements of service life indexes of power electronic capacitors in the field of power electronics.
The technical scheme adopted by the invention is as follows.
The service life evaluation method comprises a voltage aging test, a temperature change test and comprehensive analysis.
The voltage aging test comprises the following steps:
(1) taking a certain number of test capacitors or models;
(2) the test voltage is different from the voltage Us;
(3) during the test, the temperature W is constant, the voltage Us is maintained, and after 250 hours, the peak current is rated and the test is carried out
The operation is continued for 250 hours or the capacity value is reduced to-5 percent;
(4) respectively recording the time for the capacitance value of the capacitor to be reduced to-5% under different voltages Us;
(5) establishing a curve formula to calculate the service life of the Un according to the recorded time;
(6) the life time of the actual operating voltage Uw can be further calculated according to a formula.
The temperature change test comprises the following steps:
(1) taking a certain number of test capacitors or models;
(2) taking different temperatures W for test voltage;
(3) during the test, the voltage Us is constant, the temperature W is maintained, and after 250 hours, the peak current rating and the post-holding time are tested in the charge-discharge test
The operation is continued for 250 hours or the capacity value is reduced to-5 percent;
(4) respectively recording the time for the capacitance value of the capacitor to be reduced to-5% at different temperatures W;
(5) establishing a curve formula to calculate the service life of the Un according to the recorded time;
(6) the life time of the actual operating voltage Uw can be further calculated according to a formula.
The comprehensive analysis comprises the following steps:
(1) according to experimental data, verifying by establishing an Arrhenius (Arrhenius) model;
(2) drawing a curve according to the test data;
(3) the lifetime of the capacitor was evaluated by means of curves and models.
The invention can evaluate the service life of the capacitor by a test method, and can predict the design service life and judge the process quality in the production process.
Detailed Description
The following specific examples further illustrate the invention.
Voltage aging test:
(1) taking a certain number of test capacitors or models, wherein the number is 5 or 10;
(2) the test voltage is different voltages Us, such as 1.9Un, 1.8Un, 1.7 Un, 1.6 Un, 1.5Un, 1.4Un, 1.3 Un;
(3) during the test, the temperature W is constant, the voltage Us is maintained, and after 250 hours, the peak current is rated and the test is carried out
The operation is continued for 250 hours or the capacity value is reduced to-5 percent; if the capacitance value drops by-5% in the first 250 hours, the test needs to be performed again,
recording time is 50 hours; the subsequent 250 hours, record the time interval 50 hours;
(4) respectively recording the time for the capacitance value of the capacitor to be reduced to-5% under different voltages Us;
(5) establishing a curve formula to calculate the service life of the Un according to the recorded time;
(6) the life time of the actual operating voltage Uw can be further calculated according to a formula.
Temperature change test:
(1) taking a certain number of test capacitors or models, wherein the number is 5 or 10;
(2) the test voltage is obtained at different temperatures W, such as 50 deg.C, 60 deg.C, 70 deg.C, 80 deg.C, and 90 deg.C;
(3) during the test, the voltage Us is constant, the temperature W is maintained, and after 250 hours, the peak current rating and the post-holding time are tested in the charge-discharge test
The operation is continued for 250 hours or the capacity value is reduced to-5 percent; if the capacitance value is reduced by-5% in the first 250 hours, re-testing is needed, and the recording time is 50 hours; the subsequent 250 hours, record the time interval 50 hours;
(4) respectively recording the time for the capacitance value of the capacitor to be reduced to-5% at different temperatures W;
(5) establishing a curve formula to calculate the service life of the Un according to the recorded time;
(6) the life time of the actual operating voltage Uw can be further calculated according to a formula.
And (3) comprehensive analysis:
(1) according to experimental data, verifying by establishing an Arrhenius (Arrhenius) model;
(2) drawing a curve according to the test data;
(3) the lifetime of the capacitor was evaluated by means of curves and models.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (4)
1. A service life evaluation method for a direct-current metalized film capacitor comprises a voltage aging test, a temperature change test and comprehensive analysis.
2. The voltage aging test according to claim 1, characterized in that:
(1) taking a certain number of test capacitors or models;
(2) the test voltage is different from the voltage Us;
(3) during the test, the temperature W is constant, the voltage Us is maintained, and after 250 hours, the peak current is rated and the test is carried out
The operation is continued for 250 hours or the capacity value is reduced to-5 percent;
(4) respectively recording the time for the capacitance value of the capacitor to be reduced to-5% under different voltages Us;
(5) establishing a curve formula to calculate the service life of the Un according to the recorded time;
(6) the life time of the actual operating voltage Uw can be further calculated according to a formula.
3. The temperature change test according to claim 1, wherein:
(1) taking a certain number of test capacitors or models;
(2) taking different temperatures W for test voltage;
(3) during the test, the voltage Us is constant, the temperature W is maintained, and after 250 hours, the peak current rating and the post-holding time are tested in the charge-discharge test
The operation is continued for 250 hours or the capacity value is reduced to-5 percent;
(4) respectively recording the time for the capacitance value of the capacitor to be reduced to-5% at different temperatures W;
(5) establishing a curve formula to calculate the service life of the Un according to the recorded time;
(6) the life time of the actual operating voltage Uw can be further calculated according to a formula.
4. The integrated assay of claim 1, wherein:
(1) according to experimental data, verifying by establishing an Arrhenius model;
(2) drawing a curve according to the test data;
(3) the lifetime of the capacitor was evaluated by means of curves and models.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810655684.7A CN110632407A (en) | 2018-06-23 | 2018-06-23 | Method for evaluating service life of direct-current metallized film capacitor |
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| CN201810655684.7A CN110632407A (en) | 2018-06-23 | 2018-06-23 | Method for evaluating service life of direct-current metallized film capacitor |
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| CN110632407A true CN110632407A (en) | 2019-12-31 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113376465A (en) * | 2021-06-16 | 2021-09-10 | 桂林电力电容器有限责任公司 | Circuit and method for testing current carrying performance of metallized film capacitor element |
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| JP2001033504A (en) * | 1999-07-15 | 2001-02-09 | Matsushita Electric Works Ltd | Moisture resistance life prediction method of metallized film capacitor |
| CN102262191A (en) * | 2011-04-28 | 2011-11-30 | 北京航空航天大学 | Method for forecasting service life of solid tantalum electrolytic capacitor |
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| CN106501645A (en) * | 2016-10-25 | 2017-03-15 | 郑州航空工业管理学院 | A kind of capacitor life-span and reliability evaluation system and method |
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| CN106855596A (en) * | 2016-12-27 | 2017-06-16 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
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2018
- 2018-06-23 CN CN201810655684.7A patent/CN110632407A/en not_active Withdrawn
Patent Citations (8)
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| JP2001033504A (en) * | 1999-07-15 | 2001-02-09 | Matsushita Electric Works Ltd | Moisture resistance life prediction method of metallized film capacitor |
| CN102262191A (en) * | 2011-04-28 | 2011-11-30 | 北京航空航天大学 | Method for forecasting service life of solid tantalum electrolytic capacitor |
| CN103543346A (en) * | 2012-07-12 | 2014-01-29 | 四川云翔电子科技有限公司 | Film capacitor service life predicting method |
| CN104793111A (en) * | 2015-03-31 | 2015-07-22 | 华南理工大学 | Insulating cable residual service life comprehensive evaluation method based on physical, chemical and electric properties |
| CN105203879A (en) * | 2015-09-17 | 2015-12-30 | 广西电网有限责任公司电力科学研究院 | Pot-type insulator lifetime assessment method based on artificial accelerated aging test |
| CN106501645A (en) * | 2016-10-25 | 2017-03-15 | 郑州航空工业管理学院 | A kind of capacitor life-span and reliability evaluation system and method |
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| M. MAKDESSI ET AL.: "Metallized polymer film capacitors ageing law based on capacitance degradation", 《MICROELECTRONICS RELIABILITY》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113376465A (en) * | 2021-06-16 | 2021-09-10 | 桂林电力电容器有限责任公司 | Circuit and method for testing current carrying performance of metallized film capacitor element |
| CN113376465B (en) * | 2021-06-16 | 2024-04-26 | 桂林电力电容器有限责任公司 | Circuit and method for testing current-carrying performance of metallized film capacitor element |
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Application publication date: 20191231 |