CN103543346A - Film capacitor service life predicting method - Google Patents
Film capacitor service life predicting method Download PDFInfo
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- CN103543346A CN103543346A CN201210240751.1A CN201210240751A CN103543346A CN 103543346 A CN103543346 A CN 103543346A CN 201210240751 A CN201210240751 A CN 201210240751A CN 103543346 A CN103543346 A CN 103543346A
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Abstract
The invention discloses a film capacitor service life predicting method. The method mainly includes: using a programmable temperature and humidity control box to simulate working environment conditions of a capacitor according to actual application conditions of the film capacitor, using a special signal generator to generate a current voltage waveform identical with the working hours of the capacitor, and using theoretical formulas and experience formulas to predict the service life of the capacitor through a acceleration test method and calculation of capacitor parameter variation before and after the test, wherein the actual application conditions include temperature and humidity of an application site, waveforms of current and voltage borne by the capacitor, and frequency borne by the capacitor. The method is short in testing time, and accurate and reliable in results.
Description
Technical field
The present invention relates to the detection field of capacitor, relate in particular to a kind of thin film capacitor life-span prediction method.
Background technology
Application number is 200710300742.6, the applying date is the life test method that the Chinese invention patent application instructions on Dec 28th, 2007 discloses a kind of power condenser element, it comprises the following steps: step 1, capacitor element is sampled, the capacitor element of sampling is positioned in the oil groove of sealing, oil groove fills after insulating oil, is placed in the baking oven of temperature constant, and oven temperature is 55 ℃ ~ 65 ℃; Step 2, apply successively the capacitor element rated voltage UNE of 1.15 ~ 1.25,1.35 ~ 1.45,1.55 ~ 1.65,1.75 ~ 1.85,1.95 ~ 2.05,2.15 ~ 2.25 times to sampling capacitor element, be 17 ~ 15h, 15 ~ 13h, 9 ~ 7h, 5 ~ 3h, 5 ~ 5h, 5 ~ 3h corresponding working time; Step 3, statistics capacitor element punctures quantity, and capacitor element punctures quantity and is less than sampling capacitor element 1/3rd, and durability test is qualified.The pilot production time has been saved in this invention, by the method in accelerated test life-span of this invention, can to the life-span of capacitor original paper and performance, judge very soon, if capacitor element is defective, just need not make capacitor, until capacitor element qualified after, make again capacitor, saved a large amount of production times; Material has been saved in this invention.But also there are some shortcomings of self in this invention, for example, what it adopted is national standard, and the test condition of national Specification can not cover the situation that existing thin film capacitor may be applied to completely, and its experimental result can not represent reliability or the life-span of capacitor completely.The method is applicable to the life experiment of power condenser element, and during for life-span of testing film capacitor, due to the difference between all the other power capacitors, makes its test condition not be suitable for thin film capacitor completely.
And thin film capacitor is carried out to endurancing to the general employing of the life-span prediction method of traditional thin film capacitor and fail-test is carried out, these two kinds of methods have certain confidence level, but exist a lot of not enough, the one, need the time long, experimentation cost is high, reaction velocity is slow, as endurancing time of thin film capacitor be 1000 hours or 2000 hours; The 2nd, specific aim is not strong, carry out at present above-mentioned test according to standard mainly contain international standard, national standard, industry standard and company standard, all above-mentioned standards are all the universal standards at present, the test condition of most standard codes can not cover the situation that existing thin film capacitor may be applied to completely, and the test findings that therefore general method obtains can not represent reliability or the life-span of thin film capacitor completely.
summary of the invention:
For overcome conventional films capacitor life-span Forecasting Methodology expend time in long, cost is high, reaction velocity is slow, the inaccurate defect of test findings, the invention provides a kind of thin film capacitor life-span prediction method, the method can shorten the test duration greatly, thereby reaction velocity has reduced testing cost soon and test findings is accurate, can represent reliability and the life-span of thin film capacitor completely.
In order to solve the problems of the technologies described above, the technical solution used in the present invention is:
A kind of thin film capacitor life-span prediction method comprises following test procedure:
A, utilize thermometer and hygrometer that temperature, the humidity of the environment for use of the thin film capacitor of needs test are measured and placed on record;
B, electric current, voltage, frequency and waveform during to the thin film capacitor real work of needs tests are understood or measure, utilize the signal generator generation electric signal consistent with thin film capacitor operating voltage, power frequency and waveform;
C, the voltage, electric current, waveform and the frequency that according to temperature, humidity and the thin film capacitor work of thin film capacitor in steps A, B step, are, material and self-characteristic in conjunction with capacitor, determine testing program, temperature, humidity, voltage, electric current, waveform and the frequency and the test period that when scheme content comprises test, adopt, according to the mathematical model of above-mentioned parameter resume life prediction;
D, the thin film capacitor that needs are tested are numbered;
E, the thin film capacitor of the number of volume of step D is carried out to the test value of electric parameters testing, good every the capacitor of record;
F, the thin film capacitor of having tested is placed on fixture, fixture is put into together with thin film capacitor to temperature and humidity control box able to programme, open temperature and humidity control box power supply able to programme, according to experimental program, carry out temperature, humidity programming, start signal generator when temperature, humidity reach the temperature and humidity in step C in temperature and humidity control box able to programme, temperature predetermined in step C, humidity, voltage, electric current, waveform and frequency are applied on thin film capacitor, start timing, in process of the test, the numbering of inefficacy capacitor and out-of-service time are carried out to record;
G, after the test period in step C, close temperature and humidity control box able to programme and signal generator, take out test products, place at normal temperatures more than 4 hours, capacitor parameters is tested;
H, the time quantity and the capacitor parameters variable quantity that do not lose efficacy that according to capacitor in process of the test, lost efficacy, utilize the mathematical model of setting up in testing program, and the life-span of capacitor is predicted.
The present invention has the following advantages:
1, adopt technical scheme of the present invention, the test duration shortens greatly, and its test duration is generally 8-10 hour, compares traditional test duration totally to have shortened 100 times.
2, adopt technical scheme provided by the invention be according to the actual working environment of thin film capacitor to be measured predict the serviceable life of thin film capacitor rather than adopt international standards, the universal standard such as national standard, industry standard and company standard, such method of testing is more pressed close to the actual service condition of thin film capacitor, in the life-span that its energy Accurate Prediction goes out thin film capacitor, reliability is high.
3, the various testing tools that the present invention adopts are all existing equipment, easy operating.
Accompanying drawing explanation
Fig. 1 is thin film capacitor Lifetime Forecasting Test device schematic diagram
Mark 1, fixture in figure, 2, signal generator, 3, temperature and humidity control box able to programme, 4, programming Control unit.
Embodiment
A kind of thin film capacitor life-span prediction method comprises following test procedure:
A, utilize thermometer and hygrometer that temperature, the humidity of the environment for use of the thin film capacitor of needs test are measured and placed on record;
B, electric current, voltage, frequency and waveform during to the thin film capacitor real work of needs tests are understood or measure, utilize the signal generator generation electric signal consistent with thin film capacitor operating voltage, power frequency and waveform;
C, the voltage, electric current, waveform and the frequency that according to temperature, humidity and the thin film capacitor work of thin film capacitor in steps A, B step, are, material and self-characteristic in conjunction with capacitor, determine testing program, temperature, humidity, voltage, electric current, waveform and the frequency and the test period that when scheme content comprises test, adopt, according to the mathematical model of above-mentioned parameter resume life prediction;
D, the thin film capacitor that needs are tested are numbered;
E, the thin film capacitor of the number of volume of step D is carried out to the test value of electric parameters testing, good every the capacitor of record;
F, the thin film capacitor of having tested is placed on fixture 1, fixture 1 is put into temperature and humidity control box 3 able to programme together with thin film capacitor, open temperature and humidity control box 3 power supplys able to programme, according to experimental program, carry out temperature, humidity programming, start signal generator 2 when the interior temperature of temperature and humidity control box 3 able to programme, humidity reach the temperature and humidity in step C, temperature predetermined in step C, humidity, voltage, electric current, waveform and frequency are applied on thin film capacitor, start timing, in process of the test, the numbering of inefficacy capacitor and out-of-service time are carried out to record;
G, after the test period in step 3, close temperature and humidity control box 3 able to programme and signal generator 2, take out test products, place at normal temperatures more than 4 hours, capacitor parameters is tested;
H, the time quantity and the capacitor parameters variable quantity that do not lose efficacy that according to capacitor in process of the test, lost efficacy, utilize the mathematical model of setting up in testing program, and the life-span of capacitor is predicted.
Utilize finished product temperature and humidity control box able to programme, Temperature and Humidity Control is accurately reliable, simulation thin film capacitor is in the situation of real work chamber completely, adopt rational accelerating type quadrat method and life prediction mathematical model, shortened test period, the construction cycle and the more traditional fail-test that are conducive to shorten thin film capacitor have been saved test period and have reduced experimentation cost, more approach the real work situation of capacitor with traditional experiment method than proof stress, test and predict the outcome more accurate.
Test principle of the present invention is:
According to the actual service conditions of thin film capacitor, comprise current waveform, voltage waveform and frequency that temperature, humidity, the capacitor of field of employment bear, by adopting the working environment of temperature and humidity control box analog capacitor able to programme, adopt Special Signal-generator to produce current-voltage waveform identical while working with capacitor, pass through accelerated test method, calculating with to capacitor parameters variable quantity before and after test, utilizes theoretical formula and experimental formula to predict the life-span of capacitor.
Claims (1)
1. a thin film capacitor life-span prediction method, is characterized in that: comprise following test procedure:
A, utilize thermometer and hygrometer that temperature, the humidity of the environment for use of the thin film capacitor of needs test are measured and placed on record;
B, electric current, voltage, frequency and waveform during to the thin film capacitor real work of needs tests are understood or measure, utilize the signal generator generation electric signal consistent with thin film capacitor operating voltage, power frequency and waveform;
C, the voltage, electric current, waveform and the frequency that according to temperature, humidity and the thin film capacitor work of thin film capacitor in steps A, B step, are, material and self-characteristic in conjunction with capacitor, determine testing program, temperature, humidity, voltage, electric current, waveform and the frequency and the test period that when scheme content comprises test, adopt, according to the mathematical model of above-mentioned parameter resume life prediction;
D, the thin film capacitor that needs are tested are numbered;
E, the thin film capacitor of the number of volume of step D is carried out to the test value of electric parameters testing, good every the capacitor of record;
F, the thin film capacitor of having tested is placed on fixture, fixture is put into together with thin film capacitor to temperature and humidity control box able to programme, open temperature and humidity control box power supply able to programme, according to experimental program, carry out temperature, humidity programming, start signal generator when temperature, humidity reach the temperature and humidity in step C in temperature and humidity control box able to programme, temperature predetermined in step C, humidity, voltage, electric current, waveform and frequency are applied on thin film capacitor, start timing, in process of the test, the numbering of inefficacy capacitor and out-of-service time are carried out to record;
G, after the test period in step C, close temperature and humidity control box able to programme and signal generator, take out test products, place at normal temperatures more than 4 hours, capacitor parameters is tested;
?h, the time quantity and the capacitor parameters variable quantity that do not lose efficacy that according to capacitor in process of the test, lost efficacy, utilize the mathematical model of setting up in testing program, and the life-span of capacitor is predicted.
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| CN201210240751.1A CN103543346A (en) | 2012-07-12 | 2012-07-12 | Film capacitor service life predicting method |
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| CN201210240751.1A CN103543346A (en) | 2012-07-12 | 2012-07-12 | Film capacitor service life predicting method |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105137246A (en) * | 2015-09-21 | 2015-12-09 | 华中科技大学 | Metallized film capacitor service life test system and method under repetition frequency pulse |
| CN106855596A (en) * | 2016-12-27 | 2017-06-16 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
| CN106950448A (en) * | 2017-04-06 | 2017-07-14 | 中国南方电网有限责任公司电网技术研究中心 | The life detecting device and method of protective relaying device |
| CN107621618A (en) * | 2017-09-08 | 2018-01-23 | 南方电网科学研究院有限责任公司 | A kind of integrated optics highfield sensor stability test system and method |
| CN109521292A (en) * | 2018-11-01 | 2019-03-26 | 南方电网科学研究院有限责任公司 | A kind of the capacitor group lifetime estimation method and device of modularization multi-level converter |
| CN110632407A (en) * | 2018-06-23 | 2019-12-31 | 无锡市电力滤波有限公司 | Method for evaluating service life of direct-current metallized film capacitor |
| CN111090034A (en) * | 2019-12-26 | 2020-05-01 | 苏州市运泰利自动化设备有限公司 | PCBA capacitance test system and method |
| CN111537817A (en) * | 2020-05-09 | 2020-08-14 | 南京麦澜德医疗科技有限公司 | Automatic testing tool and testing method for electrode aging life |
| CN113311265A (en) * | 2021-05-25 | 2021-08-27 | 华中科技大学 | Method and system for predicting service life of metallized film capacitor |
| CN113901675A (en) * | 2021-12-09 | 2022-01-07 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Electronic component service life prediction method and device, computer equipment and storage medium |
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2012
- 2012-07-12 CN CN201210240751.1A patent/CN103543346A/en active Pending
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105137246B (en) * | 2015-09-21 | 2018-02-02 | 华中科技大学 | The life testing method of metallization film capacitor under repetitive frequency pulsed |
| CN105137246A (en) * | 2015-09-21 | 2015-12-09 | 华中科技大学 | Metallized film capacitor service life test system and method under repetition frequency pulse |
| CN106855596A (en) * | 2016-12-27 | 2017-06-16 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
| CN106855596B (en) * | 2016-12-27 | 2019-05-28 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
| CN106950448A (en) * | 2017-04-06 | 2017-07-14 | 中国南方电网有限责任公司电网技术研究中心 | The life detecting device and method of protective relaying device |
| CN106950448B (en) * | 2017-04-06 | 2019-02-15 | 中国南方电网有限责任公司电网技术研究中心 | The life detecting device and method of protective relaying device |
| CN107621618A (en) * | 2017-09-08 | 2018-01-23 | 南方电网科学研究院有限责任公司 | A kind of integrated optics highfield sensor stability test system and method |
| CN110632407A (en) * | 2018-06-23 | 2019-12-31 | 无锡市电力滤波有限公司 | Method for evaluating service life of direct-current metallized film capacitor |
| CN109521292A (en) * | 2018-11-01 | 2019-03-26 | 南方电网科学研究院有限责任公司 | A kind of the capacitor group lifetime estimation method and device of modularization multi-level converter |
| CN109521292B (en) * | 2018-11-01 | 2021-07-20 | 南方电网科学研究院有限责任公司 | Capacitor bank service life assessment method and device of modular multilevel converter |
| CN111090034A (en) * | 2019-12-26 | 2020-05-01 | 苏州市运泰利自动化设备有限公司 | PCBA capacitance test system and method |
| CN111537817A (en) * | 2020-05-09 | 2020-08-14 | 南京麦澜德医疗科技有限公司 | Automatic testing tool and testing method for electrode aging life |
| CN113311265A (en) * | 2021-05-25 | 2021-08-27 | 华中科技大学 | Method and system for predicting service life of metallized film capacitor |
| CN113311265B (en) * | 2021-05-25 | 2022-03-18 | 华中科技大学 | Method and system for predicting service life of metallized film capacitor |
| CN113901675A (en) * | 2021-12-09 | 2022-01-07 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Electronic component service life prediction method and device, computer equipment and storage medium |
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Application publication date: 20140129 |