CN105158277B - 一种大截面大厚度红外玻璃内部缺陷检测装置 - Google Patents
一种大截面大厚度红外玻璃内部缺陷检测装置 Download PDFInfo
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- CN105158277B CN105158277B CN201510644476.3A CN201510644476A CN105158277B CN 105158277 B CN105158277 B CN 105158277B CN 201510644476 A CN201510644476 A CN 201510644476A CN 105158277 B CN105158277 B CN 105158277B
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- 238000003384 imaging method Methods 0.000 claims abstract description 34
- 238000003331 infrared imaging Methods 0.000 claims abstract description 24
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Families Citing this family (5)
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CN108036860A (zh) * | 2017-12-02 | 2018-05-15 | 北京工业大学 | 一种用于红外热成像仪测温的快速定位调焦装置 |
CN108375584A (zh) * | 2018-03-14 | 2018-08-07 | 宁波舜宇红外技术有限公司 | 红外光学材料微观缺陷检测装置及远红外显微镜头 |
CN110505407B (zh) * | 2019-09-04 | 2021-02-12 | 烟台艾睿光电科技有限公司 | 红外成像设备的镜头调焦方法、装置及设备 |
CN111307814B (zh) * | 2019-11-29 | 2022-10-04 | 宜昌南玻硅材料有限公司 | 一种基于图像处理的硅块杂质检测方法 |
CN113176223A (zh) * | 2021-03-23 | 2021-07-27 | 中山大学新华学院 | 一种红外分光光度检测仪 |
Citations (2)
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CN102175690A (zh) * | 2011-01-24 | 2011-09-07 | 宁波大学 | 一种红外玻璃内部宏观缺陷检测装置 |
CN205080072U (zh) * | 2015-10-08 | 2016-03-09 | 吴礼刚 | 一种大截面大厚度红外玻璃内部缺陷检测装置 |
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JP2009085617A (ja) * | 2007-09-27 | 2009-04-23 | Fujifilm Corp | 欠陥検出装置及び方法 |
JP2009150772A (ja) * | 2007-12-20 | 2009-07-09 | Nikon Corp | 基板検査装置、およびマスク用基板の製造方法 |
JP2009229085A (ja) * | 2008-03-19 | 2009-10-08 | Nikon Corp | 欠陥抽出装置、方法、プログラム |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN102175690A (zh) * | 2011-01-24 | 2011-09-07 | 宁波大学 | 一种红外玻璃内部宏观缺陷检测装置 |
CN205080072U (zh) * | 2015-10-08 | 2016-03-09 | 吴礼刚 | 一种大截面大厚度红外玻璃内部缺陷检测装置 |
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Effective date of registration: 20180322 Address after: Zhejiang city of Ningbo Province in 315040 Road No. 298 building 308 room 3 Building Applicant after: NINGBO ABNEY INFRARED TECHNOLOGY CO.,LTD. Address before: 315040 Zhejiang city of Ningbo province high tech Zone Juxian Road No. 99 island garden 3 No. 7 room 505 Applicant before: Wu Ligang |
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Denomination of invention: Detecting device for internal defects of large-section and big-thickness infrared glass Effective date of registration: 20190329 Granted publication date: 20180629 Pledgee: Ningbo Tianjin Enterprise Service Co.,Ltd. Pledgor: NINGBO ABNEY INFRARED TECHNOLOGY CO.,LTD.|NINGBO LIGHT PUPIL PHOTOELECTRIC SCIENCE AND TECHNOLOGY Co.,Ltd. Registration number: 2019330000087 |
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Date of cancellation: 20200916 Granted publication date: 20180629 Pledgee: Ningbo Tianjin Enterprise Service Co.,Ltd. Pledgor: NINGBO ABNEY INFRARED TECHNOLOGY Co.,Ltd. Registration number: 2019330000087 |
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Denomination of invention: An internal defect detection device for large section and thick infrared glass Effective date of registration: 20200917 Granted publication date: 20180629 Pledgee: Ningbo Tianjin Enterprise Service Co.,Ltd. Pledgor: NINGBO ABNEY INFRARED TECHNOLOGY Co.,Ltd. Registration number: Y2020330000722 |
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Date of cancellation: 20210922 Granted publication date: 20180629 Pledgee: Ningbo Tianjin Enterprise Service Co.,Ltd. Pledgor: NINGBO ABNEY INFRARED TECHNOLOGY Co.,Ltd. Registration number: Y2020330000722 |
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Denomination of invention: An internal defect detection device for large section and large thickness infrared glass Effective date of registration: 20210923 Granted publication date: 20180629 Pledgee: Ningbo Tianjin Enterprise Service Co.,Ltd. Pledgor: NINGBO ABNEY INFRARED TECHNOLOGY Co.,Ltd. Registration number: Y2021330001758 |
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Denomination of invention: A Device for Detecting Internal Defects of Large Section and Thick Infrared Glass Effective date of registration: 20220927 Granted publication date: 20180629 Pledgee: Ningbo Tianjin Enterprise Service Co.,Ltd. Pledgor: NINGBO ABNEY INFRARED TECHNOLOGY CO.,LTD. Registration number: Y2022980016558 |