CN105115940A - Curve measuring method and device for refractive index of optical material - Google Patents
Curve measuring method and device for refractive index of optical material Download PDFInfo
- Publication number
- CN105115940A CN105115940A CN201510562661.8A CN201510562661A CN105115940A CN 105115940 A CN105115940 A CN 105115940A CN 201510562661 A CN201510562661 A CN 201510562661A CN 105115940 A CN105115940 A CN 105115940A
- Authority
- CN
- China
- Prior art keywords
- optical material
- measured
- refractive index
- index value
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention relates to a curve measuring method and a curve measuring device for the refractive index of an optical material. The curve measuring method comprises the following steps: firstly, measuring group refractive index values of a to-be-tested optical material under different wave lengths through a broadband optical coherent interference system; then testing the corresponding refractive index value of the to-be-tested optical material under the determined laser wave length through a laser two-slit interference system; and finally, calculating the group refractive index values of the to-be-tested optical material within the whole wave length range by adopting an integration method and combining with the measurement result, and thus obtaining a refractive index curve of the to-be-tested optical material within the whole wave length range. According to the method and the device, the traditional complicated operation is simplified, the simple measurement for the refractive index curve of the material in the whole waveband is realized, and the method belongs to a measuring method for the refractive index of the material which is rapid, convenient, high in precision, and strong in practicability.
Description
Technical field
The invention belongs to field of optical measurements, be specifically related to a kind of optical material refractive index curve measuring method and device.
Background technology
Refractive index is the optical parametric having the molecular polarizability of material to determine, is an important physical quantity, which determines the travel path of light in material and speed.Also can change along with wavelength variations for general Refractive Index of Material, i.e. the dispersion of material.The light of each wavelength has different refractive indexes and will the light path in the material of a wavelength be caused different with speed, and the simplest example is exactly the aberration of optical lens.Measurement is carried out to the refractive index of each wavelength of material significant.
The measuring method of conventional refractive index curve has angle-measuring method and the large class of interferometric method two.Angle-measuring method comprises minimum deflectometry, V prism and autocollimation method etc.These methods are that materials processing is become specific shape, are obtained the refractive index value of specific several wavelength by the operation of complexity, adopt the method for data fitting finally to obtain the refractive index curve of whole wave band to these discrete refractive index value.This method complex operation is not a kind of measuring method of aspect.Interferometric method comprises F-P interferometer and broadband light coherent interference method etc.F-P interferometer only can be measured thin transparency, and light path to adjust complicated Measuring Time long; Broadband light coherent interference method is the light path utilizing the interference information of Michelson interferometer device acquisition different wave length and then obtain introducing because of testing sample, but the method can only measure the group index information obtaining material, can not obtain the refractive index curve of material.
The present invention is on existing broadband light coherent interference basis, by analyzing the relation of group index and refractive index, propose a kind of approximate calculation method asking refractive index curve from group index curve of data fitting, and devise the laser two-slit interference device refractive index value determined corresponding to a certain wavelength, a kind of algorithm of accurate refractive index curve of integration is proposed in conjunction with this refractive index value.The present invention can measure the refractive index curve of optical material, has the advantages such as efficient, high precision.
Summary of the invention
The object of the present invention is to provide a kind of can measurement the refractive index curve of optical material, there is optical material refractive index curve measuring method and the device of the advantages such as efficient, high precision.
For achieving the above object, technical scheme of the present invention is: a kind of optical material refractive index curve measuring method, comprises the steps,
S1: by the group index value of broadband light coherent interference systematic survey optical material different wave length to be measured;
S2: by the refractive index value that laser two-slit interference systematic survey optical material to be measured is corresponding under the wavelength of the laser determined;
S3: adopt the measurement result of integral algorithm integrating step S1 and S2 to treat photometry material and calculate in the group index value of whole wavelength coverage, and then obtain the refractive index curve of optical material to be measured in whole wavelength coverage.
In an embodiment of the present invention, described integral algorithm formula is as follows:
Wherein,
the refractive index value to be asked of optical material to be measured,
be
corresponding wave number,
the refractive index value that optical material to be measured is corresponding under the wavelength of the laser determined,
be
corresponding wave number,
be the group index value of optical material to be measured, k is
corresponding wave number.
In an embodiment of the present invention, in step sl, described broadband light coherent interference system take wideband light source as Michael's interferometer of light emitting source, inserted the interference spectrum signal before and after optical sample to be measured by the wherein light beam arm gathering Michael's interferometer and then obtained the group index value of optical material to be measured.
In an embodiment of the present invention, the concrete obtain manner of the group index value of described optical material different wave length to be measured is:
S11: under the wideband light source of different wave length, inserts the interference spectrum signal before and after optical sample to be measured by the wherein light beam arm gathering Michael's interferometer, thus obtains the interference spectrum signal of the whole wave band of optical material to be measured;
S12: the interference spectrum signal of whole wave band is carried out segmentation by wavelength, adopts Short Time Fourier Transform technology to process it, obtains the light path increased because optical sample to be measured introduces, and utilize
, calculate the group index value corresponding to each wavelength, wherein,
be optical path difference, d is the thickness of optical material to be measured.
In an embodiment of the present invention, after described step S12, also comprise a step, the group index value namely corresponding to each wavelength of step S12 acquisition, adopt the method for data fitting to obtain the refractive index value of each approximate wavelength, specific as follows:
By group's refraction value
series expansion is carried out by wave number k by following formula:
Then approximate refractive index value
can be calculated as follows:
Wherein, n is positive integer;
According to the refractive index value of each approximate wavelength of above-mentioned acquisition, broadband light coherent interference system can be obtained in the integral part side-play amount inserting the fringes shift before and after optical sample to be measured.
In an embodiment of the present invention, in step s 2, by the mode of the refractive index value corresponding under the wavelength of the laser determined of described laser two-slit interference systematic survey optical material to be measured be: by between single patch of optical material to be measured being positioned over described laser two-slit interference system and double slit sheet, and make the edge of optical material to be measured be in double slit sheet two slit central authorities, with the slit making optical material to be measured just block double slit sheet; Under the optical maser wavelength determined, by analyzing the interference fringe image inserting before and after optical material to be measured twice, obtain the fraction part side-play amount of fringes shift, thus obtain fringes shift amount, the optical maser wavelength determined is multiplied by according to fringes shift amount, obtaining the optical path difference increased because inserting optical material to be measured, accurately determining the refractive index value that optical material to be measured is corresponding under this optical maser wavelength determined
Present invention also offers a kind of optical material refractive index curve measurement mechanism, comprise the broadband light coherent interference system of the group index value for measuring optical material different wave length to be measured and the laser two-slit interference system for measuring this optical material to be measured refractive index value corresponding under the optical maser wavelength determined, in conjunction with the group index value of optical material different wave length to be measured and refractive index value corresponding under the optical maser wavelength determined thereof, by integral algorithm, the refractive index curve of optical material to be measured in whole wavelength coverage can be obtained.
In an embodiment of the present invention, described integral algorithm formula is as follows:
Wherein,
the refractive index value to be asked of optical material to be measured,
be
corresponding wave number,
the refractive index value that optical material to be measured is corresponding under the wavelength of the laser determined,
be
corresponding wave number,
be the group index value of optical material to be measured, k is
corresponding wave number.
In an embodiment of the present invention, described broadband light coherent interference system comprises wideband light source, the first lens, the second lens, spectroscope, the first catoptron, the second catoptron, spectrometer; The light that wideband light source sends is after the first collimated, the mirror that is split is divided into reference arm light beam and sample arm light beam, the wherein intrafascicular insertion of sample ami light optical material to be measured, two light beams, after the first catoptron, the second catoptron reflection, returns spectroscope and to converge and by spectrometer collection after the second lens focus.
In an embodiment of the present invention, described laser two-slit interference system comprises LASER Light Source, single patch, double slit sheet, film viewing screen, the principle of the refractive index value that described laser two-slit interference systematic survey optical material to be measured is corresponding under the optical maser wavelength determined is: first, the light that LASER Light Source is launched is through single patch, double slit sheet, formed on the viewing screen with reference to interference fringe image, then, optical material to be measured is placed in single patch, between double slit sheet, and make optical material to be measured just block a slit of double slit sheet, the light launched by LASER Light Source is through single patch, optical material to be measured, double slit sheet, form shifting interference stripe pattern on the viewing screen, by analyzing contrast shifting interference stripe pattern and reference interference fringe image, the refractive index value that optical material to be measured is corresponding under the optical maser wavelength determined can be obtained.
Compared to prior art, the present invention has following beneficial effect: this invention simplifies the operation that tradition is complicated, realizing the ordinary surveying of material in the refractive index curve of whole wave band, is a kind of high-precision practical Refractive Index of Material measuring method quickly and easily.
Accompanying drawing explanation
Fig. 1 is broadband light coherent interference system of the present invention.
Fig. 2 is laser two-slit interference system.
Fig. 3 is the broadband light coherent interference signal figure of the invention process example.
Fig. 4 is the approximated refractive rate curve that the group index of the invention process example and fitting algorithm obtain.
Fig. 5 is the laser two-slit interference pattern of the invention process example.
Fig. 6 is the measurement result figure of the invention process example.
Embodiment
Below in conjunction with accompanying drawing, technical scheme of the present invention is specifically described.
As shown in figures 1 to 6, a kind of optical material refractive index curve measuring method of the present invention, comprises the steps,
S1: by the group index value of broadband light coherent interference systematic survey optical material different wave length to be measured;
S2: by the refractive index value that laser two-slit interference systematic survey optical material to be measured is corresponding under the wavelength of the laser determined;
S3: adopt the measurement result of integral algorithm integrating step S1 and S2 to treat photometry material and calculate in the group index value of whole wavelength coverage, and then obtain the refractive index curve of optical material to be measured in whole wavelength coverage, described integral algorithm formula is as follows:
Wherein,
the refractive index value to be asked of optical material to be measured,
be
corresponding wave number,
the refractive index value that optical material to be measured is corresponding under the wavelength of the laser determined,
be
corresponding wave number,
be the group index value of optical material to be measured, k is
corresponding wave number.
In step sl, described broadband light coherent interference system take wideband light source as Michael's interferometer of light emitting source, inserted the interference spectrum signal before and after optical sample to be measured by the wherein light beam arm gathering Michael's interferometer and then obtained the group index value of optical material to be measured, concrete obtain manner is:
S11: under the wideband light source of different wave length, inserts the interference spectrum signal before and after optical sample to be measured by the wherein light beam arm gathering Michael's interferometer, thus obtains the interference spectrum signal of the whole wave band of optical material to be measured;
S12: the interference spectrum signal of whole wave band is carried out segmentation by wavelength, adopts Short Time Fourier Transform technology to process it, obtains the light path increased because optical sample to be measured introduces, and utilize
, calculate the group index value corresponding to each wavelength, wherein,
be optical path difference, d is the thickness of optical material to be measured.
Group index value corresponding to each wavelength that step S12 obtains, adopts the method for data fitting to obtain the refractive index value of each approximate wavelength, specific as follows:
By group's refraction value
series expansion is carried out by wave number k by following formula:
Then approximate refractive index value
can be calculated as follows:
Wherein, n is positive integer;
According to the refractive index value of each approximate wavelength of above-mentioned acquisition, broadband light coherent interference system can be obtained in the integral part side-play amount inserting the fringes shift before and after optical sample to be measured.
By the mode of the refractive index value corresponding under the wavelength of the laser determined of described laser two-slit interference systematic survey optical material to be measured be: by between single patch of optical material to be measured being positioned over described laser two-slit interference system and double slit sheet, and make the edge of optical material to be measured be in double slit sheet two slit central authorities, with the slit making optical material to be measured just block double slit sheet; Under the optical maser wavelength determined, by analyzing the interference fringe image inserting before and after optical material to be measured twice, obtain the fraction part side-play amount of fringes shift, thus obtain fringes shift amount, the optical maser wavelength determined is multiplied by according to fringes shift amount, obtaining the optical path difference increased because inserting optical material to be measured, accurately determining the refractive index value that optical material to be measured is corresponding under this optical maser wavelength determined
Present invention also offers a kind of optical material refractive index curve measurement mechanism, comprise the broadband light coherent interference system of the group index value for measuring optical material different wave length to be measured and the laser two-slit interference system for measuring this optical material to be measured refractive index value corresponding under the optical maser wavelength determined, in conjunction with the group index value of optical material different wave length to be measured and refractive index value corresponding under the optical maser wavelength determined thereof, by integral algorithm, the refractive index curve of optical material to be measured in whole wavelength coverage can be obtained.
Described broadband light coherent interference system comprises wideband light source, the first lens, the second lens, spectroscope, the first catoptron, the second catoptron, spectrometer; The light that wideband light source sends is after the first collimated, the mirror that is split is divided into reference arm light beam and sample arm light beam, the wherein intrafascicular insertion of sample ami light optical material to be measured, two light beams, after the first catoptron, the second catoptron reflection, returns spectroscope and to converge and by spectrometer collection after the second lens focus.
Described laser two-slit interference system comprises LASER Light Source, single patch, double slit sheet, film viewing screen, the principle of the refractive index value that described laser two-slit interference systematic survey optical material to be measured is corresponding under the optical maser wavelength determined is: first, the light that LASER Light Source is launched is through single patch, double slit sheet, formed on the viewing screen with reference to interference fringe image, then, optical material to be measured is placed in single patch, between double slit sheet, and make optical material to be measured just block a slit of double slit sheet, the light launched by LASER Light Source is through single patch, optical material to be measured, double slit sheet, form shifting interference stripe pattern on the viewing screen, by analyzing contrast shifting interference stripe pattern and reference interference fringe image, the refractive index value that optical material to be measured is corresponding under the optical maser wavelength determined can be obtained.
Be below specific embodiments of the invention.
As Fig. 1, shown in 2, optical material refractive index curve measurement mechanism of the present invention, comprise broadband light coherent interference and subsystem is overlapped in laser two-slit interference two, broadband light coherent interference system is used as the light source of broadband light coherent interference system by a wideband light source (1), the light that light source sends is after lens (2) collimation, the mirror (4) that is split is divided into reference arm light beam and sample arm light beam, two light beams is through mirror (5, 6) reflection after return spectroscope (4) converge through lens (3) focus on after gathered by spectrometer (8), optical material thin slice (7) to be measured is inserted in sample arm, when adjust mirror (5) make reference arm and sample arm light beam spatial attitude or light path all consistent time, two light beams interferes, this interference light intensity signal is recorded by spectrometer (8).And be sent in computer (9) and carry out analyzing and processing, its measuring process is as follows:
First according to putting up broadband coherent interference system shown in Fig. 1, now sample (7) not yet inserts sample arm, the position of adjustment mirror 5, make the spatial attitude of reference beam arm and sample beam arm symmetrical with point optical interface of spectroscope (4), interference signal recorded by spectrometer (8).By in the sample arm of optical material sample sheet insertion system as shown in Figure 1, spectrometer (8) is again used to record interference signal.Now interference signal as shown in Figure 3.Twice, front and back interference signal is split respectively, do Short Time Fourier Transform operation, obtain the optical path difference of the different wave length inserting two-beam arm before and after sample respectively, both subtract each other the light path obtaining different wave length and increase because inserting sample, light path is divided by sample sheet thickness d, we obtain group index curve, as shown in Figure 4.
Group's refraction of material and refractive index have following relation:
, wherein k is wave number,
the function of refractive index about wave number k,
the function of group index about wave number k,
right
get and lead.By group's refraction value
series expansion is carried out by wave number by following formula:
then approximate refractive index value
can by following formula:
calculate, because there is error in data fitting itself, each coefficient
,
,
deng value and out of true.The refractive index value that the method is calculated is the approximate value of result.
Afterwards according to putting up laser two-slit interference system shown in Fig. 2, now sample (7) is not yet in insertion system, record the interference fringe image on film viewing screen (13), afterwards optical material thin slice (7) is inserted between single patch (11) and double slit sheet (12), optical material thin slice (7) is made just to block a slit of double slit sheet (12), again record the interference fringe image on film viewing screen (13), the interference fringe image that front and back are twice as shown in Figure 5.Obtaining through picture analyzing, making interference fringe offset by 66 ° because inserting sample, corresponding 0.183 fringe number.The 659.2nm during wavelength of LASER Light Source.The approximated refractive rate curve obtained by fitting algorithm obtains when wavelength is 659.2nm, the approximate refractive index of material is n=1.5784, the thickness of optical material print is 77.4um, the integral part that in fact we obtain the interference fringe offset numbers caused because inserting sample according to this approximate refractive index is 58, so actual fringes shift number is 58.183.According to this fringes shift number, refractive index value can be corrected to when wavelength is 659.2nm by we, and the refractive index of material is 1.5803.
According to this refractive index value and group index curve, adopt integral algorithm:
, calculate the refractive index curve of whole wave band, result as shown in Figure 6.
Be more than preferred embodiment of the present invention, all changes done according to technical solution of the present invention, when the function produced does not exceed the scope of technical solution of the present invention, all belong to protection scope of the present invention.
Claims (10)
1. an optical material refractive index curve measuring method, is characterized in that: comprise the steps,
S1: by the group index value of broadband light coherent interference systematic survey optical material different wave length to be measured;
S2: by the refractive index value that laser two-slit interference systematic survey optical material to be measured is corresponding under the wavelength of the laser determined;
S3: adopt the measurement result of integral algorithm integrating step S1 and S2 to treat photometry material and calculate in the group index value of whole wavelength coverage, and then obtain the refractive index curve of optical material to be measured in whole wavelength coverage.
2. optical material refractive index curve measuring method according to claim 1, is characterized in that: described integral algorithm formula is as follows:
Wherein,
the refractive index value to be asked of optical material to be measured,
be
corresponding wave number,
the refractive index value that optical material to be measured is corresponding under the wavelength of the laser determined,
be
corresponding wave number,
be the group index value of optical material to be measured, k is
corresponding wave number.
3. optical material refractive index curve measuring method according to claim 1 and 2, it is characterized in that: in step sl, described broadband light coherent interference system take wideband light source as Michael's interferometer of light emitting source, inserted the interference spectrum signal before and after optical sample to be measured by the wherein light beam arm gathering Michael's interferometer and then obtained the group index value of optical material to be measured.
4. optical material refractive index curve measuring method according to claim 3, is characterized in that: the concrete obtain manner of the group index value of described optical material different wave length to be measured is:
S11: under the wideband light source of different wave length, inserts the interference spectrum signal before and after optical sample to be measured by the wherein light beam arm gathering Michael's interferometer, thus obtains the interference spectrum signal of the whole wave band of optical material to be measured;
S12: the interference spectrum signal of whole wave band is carried out segmentation by wavelength, adopts Short Time Fourier Transform technology to process it, obtains the light path increased because optical sample to be measured introduces, and utilize
, calculate the group index value corresponding to each wavelength, wherein,
be optical path difference, d is the thickness of optical material to be measured.
5. optical material refractive index curve measuring method according to claim 4, it is characterized in that: after described step S12, also comprise a step, namely the group index value corresponding to each wavelength of step S12 acquisition, the method of data fitting is adopted to obtain the refractive index value of each approximate wavelength, specific as follows:
By group's refraction value
series expansion is carried out by wave number k by following formula:
Then approximate refractive index value
can be calculated as follows:
Wherein, n is positive integer;
According to the refractive index value of each approximate wavelength of above-mentioned acquisition, broadband light coherent interference system can be obtained in the integral part side-play amount inserting the fringes shift before and after optical sample to be measured.
6. optical material refractive index curve measuring method according to claim 5, it is characterized in that: in step s 2, by the mode of the refractive index value corresponding under the wavelength of the laser determined of described laser two-slit interference systematic survey optical material to be measured be: by between single patch of optical material to be measured being positioned over described laser two-slit interference system and double slit sheet, and make the edge of optical material to be measured be in double slit sheet two slit central authorities, with the slit making optical material to be measured just block double slit sheet; Under the optical maser wavelength determined, by analyzing the interference fringe image inserting before and after optical material to be measured twice, obtain the fraction part side-play amount of fringes shift, thus obtain fringes shift amount, the optical maser wavelength determined is multiplied by according to fringes shift amount, obtaining the optical path difference increased because inserting optical material to be measured, accurately determining the refractive index value that optical material to be measured is corresponding under this optical maser wavelength determined.
7. an optical material refractive index curve measurement mechanism, it is characterized in that: comprise the broadband light coherent interference system of the group index value for measuring optical material different wave length to be measured and the laser two-slit interference system for measuring this optical material to be measured refractive index value corresponding under the optical maser wavelength determined, in conjunction with the group index value of optical material different wave length to be measured and refractive index value corresponding under the optical maser wavelength determined thereof, by integral algorithm, the refractive index curve of optical material to be measured in whole wavelength coverage can be obtained.
8. a kind of optical material refractive index curve measurement mechanism according to claim 7, is characterized in that: described integral algorithm formula is as follows:
Wherein,
the refractive index value to be asked of optical material to be measured,
be
corresponding wave number,
the refractive index value that optical material to be measured is corresponding under the wavelength of the laser determined,
be
corresponding wave number,
be the group index value of optical material to be measured, k is
corresponding wave number.
9. a kind of optical material refractive index curve measurement mechanism according to claim 7, is characterized in that: described broadband light coherent interference system comprises wideband light source, the first lens, the second lens, spectroscope, the first catoptron, the second catoptron, spectrometer; The light that wideband light source sends is after the first collimated, the mirror that is split is divided into reference arm light beam and sample arm light beam, the wherein intrafascicular insertion of sample ami light optical material to be measured, two light beams, after the first catoptron, the second catoptron reflection, returns spectroscope and to converge and by spectrometer collection after the second lens focus.
10. a kind of optical material refractive index curve measurement mechanism according to claim 7, it is characterized in that: described laser two-slit interference system comprises LASER Light Source, single patch, double slit sheet, film viewing screen, the principle of the refractive index value that described laser two-slit interference systematic survey optical material to be measured is corresponding under the optical maser wavelength determined is: first, the light that LASER Light Source is launched is through single patch, double slit sheet, formed on the viewing screen with reference to interference fringe image, then, optical material to be measured is placed in single patch, between double slit sheet, and make optical material to be measured just block a slit of double slit sheet, the light launched by LASER Light Source is through single patch, optical material to be measured, double slit sheet, form shifting interference stripe pattern on the viewing screen, by analyzing contrast shifting interference stripe pattern and reference interference fringe image, the refractive index value that optical material to be measured is corresponding under the optical maser wavelength determined can be obtained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510562661.8A CN105115940B (en) | 2015-09-08 | 2015-09-08 | Optical material refractive index curve measuring method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510562661.8A CN105115940B (en) | 2015-09-08 | 2015-09-08 | Optical material refractive index curve measuring method and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105115940A true CN105115940A (en) | 2015-12-02 |
| CN105115940B CN105115940B (en) | 2017-10-20 |
Family
ID=54663980
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510562661.8A Expired - Fee Related CN105115940B (en) | 2015-09-08 | 2015-09-08 | Optical material refractive index curve measuring method and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105115940B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113899697A (en) * | 2021-09-24 | 2022-01-07 | 五邑大学 | Fringe image-based crystal refractive index measuring method and device and storage medium |
| CN114199525A (en) * | 2021-12-10 | 2022-03-18 | 南京迈得特光学有限公司 | Integrated lens measuring device and measuring method thereof |
| CN114636678A (en) * | 2022-03-17 | 2022-06-17 | 福州大学 | Refractometer capable of measuring group refractive index and thickness of crystal and working method thereof |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09218016A (en) * | 1995-12-08 | 1997-08-19 | Kagaku Gijutsu Shinko Jigyodan | Simultaneous measuring method of refractive index and thickness of subject by light interference method and apparatus therefor |
| US20080266574A1 (en) * | 2003-03-06 | 2008-10-30 | Groot Peter De | Interferometer and method for measuring characteristics of optically unresolved surface features |
| CN101458211A (en) * | 2007-12-12 | 2009-06-17 | 中国科学院高能物理研究所 | Multi-slilt filtering double slit interferometer |
| CN101755187A (en) * | 2007-07-19 | 2010-06-23 | 齐戈股份有限公司 | Generating model signals for interferometry |
| CN102023165A (en) * | 2010-12-08 | 2011-04-20 | 福州大学 | Three-dimensional imaging and damage detection device for interior structure of glass fiber composite material |
| CN102607435A (en) * | 2012-03-27 | 2012-07-25 | 黑龙江工程学院 | Device and method for measuring thickness of optical film by adopting double-slit interference method |
| CN102680830A (en) * | 2012-05-22 | 2012-09-19 | 福州大学 | Calibration device of piezoelectric actuator |
| CN103983610A (en) * | 2014-05-12 | 2014-08-13 | 复旦大学 | Trace fluid refractive index measuring device and measuring method based on spectrum interference |
-
2015
- 2015-09-08 CN CN201510562661.8A patent/CN105115940B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09218016A (en) * | 1995-12-08 | 1997-08-19 | Kagaku Gijutsu Shinko Jigyodan | Simultaneous measuring method of refractive index and thickness of subject by light interference method and apparatus therefor |
| US20080266574A1 (en) * | 2003-03-06 | 2008-10-30 | Groot Peter De | Interferometer and method for measuring characteristics of optically unresolved surface features |
| CN101755187A (en) * | 2007-07-19 | 2010-06-23 | 齐戈股份有限公司 | Generating model signals for interferometry |
| CN101458211A (en) * | 2007-12-12 | 2009-06-17 | 中国科学院高能物理研究所 | Multi-slilt filtering double slit interferometer |
| CN102023165A (en) * | 2010-12-08 | 2011-04-20 | 福州大学 | Three-dimensional imaging and damage detection device for interior structure of glass fiber composite material |
| CN102607435A (en) * | 2012-03-27 | 2012-07-25 | 黑龙江工程学院 | Device and method for measuring thickness of optical film by adopting double-slit interference method |
| CN102680830A (en) * | 2012-05-22 | 2012-09-19 | 福州大学 | Calibration device of piezoelectric actuator |
| CN103983610A (en) * | 2014-05-12 | 2014-08-13 | 复旦大学 | Trace fluid refractive index measuring device and measuring method based on spectrum interference |
Non-Patent Citations (8)
| Title |
|---|
| D.N. STACEY: "The relationship between the fringes produced by Youngs slits and by the Michelson interferometer", 《EUROPEAN JOURNAL OF PHYSICS》 * |
| JORGE GARCÍA-SUCERQUIA: "Spatial coherence and Young-Michelson interferometry", 《INTERNATIONAL JOURNAL FOR LIGHT AND ELECTRON OPTICS》 * |
| PETR HLUBINA: "White-light spectral interferometer with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica", 《OPTICS COMMUNICATIONS》 * |
| 古丽姗: "杨氏双缝干涉条纹移动问题的探讨", 《枣庄学院学报》 * |
| 张淑娜等: "利用白光干涉技术测量块状材料的群折射率", 《物理学报》 * |
| 李晖等: "色散、群速与群折射率", 《光子学报》 * |
| 游腾飞等: "二维频域光学相干层析系统研究", 《机电工程》 * |
| 罗曼婷等: "基于平稳小波变换的时域光学相干层析系统", 《应用光学》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113899697A (en) * | 2021-09-24 | 2022-01-07 | 五邑大学 | Fringe image-based crystal refractive index measuring method and device and storage medium |
| CN114199525A (en) * | 2021-12-10 | 2022-03-18 | 南京迈得特光学有限公司 | Integrated lens measuring device and measuring method thereof |
| CN114636678A (en) * | 2022-03-17 | 2022-06-17 | 福州大学 | Refractometer capable of measuring group refractive index and thickness of crystal and working method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105115940B (en) | 2017-10-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104215176B (en) | High accuracy optical interval measurement device and method | |
| KR100916618B1 (en) | Method for measuring thickness profile of thin-film layers by dispersive white-light interferometry based on spectroscopic reflectometry | |
| CN108061639B (en) | A kind of Larger Dynamic range of combining adaptive optical technology, high-precision phase position difference method wavefront measurement instrument | |
| KR20200118218A (en) | Measurement of multilayer stacks | |
| CN105180892A (en) | Femtosecond laser frequency comb pulse chirp interferometry ranging method and ranging system | |
| CN103454249B (en) | Based on optical glass homogeneity detection method and the device of white light interference | |
| US20180045500A1 (en) | Method of air refractive index correction for absolute long distance measurement | |
| CN104165758B (en) | Lens focal length measuring device and method based on Fizeau interferomenter | |
| CN105044035A (en) | Spectral domain interferometer-based refractive index and thickness synchronous measurement method and system thereof | |
| CN105091781B (en) | A kind of method and apparatus of single hardwood interference fringe picture measurement optical surface | |
| CN105115940A (en) | Curve measuring method and device for refractive index of optical material | |
| JP3426552B2 (en) | Shape measuring device | |
| CN110319769A (en) | Anti-vibration Feisuo interferometric measuring means and method | |
| CN107064067A (en) | The measuring system and method for a kind of air refraction profile of dual interferometer | |
| CN105784129A (en) | Low-frequency heterodyne ineterferometer used for laser wavefront detection | |
| CN113639661B (en) | Morphology detection system and morphology detection method | |
| CN205003080U (en) | Refracting index and thickness synchronous measurement system based on spectral domain interferometer | |
| CN105698702B (en) | A kind of diplopore heterodyne ineterferometer based on acousto-optic low frequency differences phase shift | |
| CN111998782B (en) | Optical measuring device and method | |
| Zhang et al. | Ultrahigh-accuracy measurement of refractive index curves of optical materials using interferometry technology | |
| CN102607435A (en) | Device and method for measuring thickness of optical film by adopting double-slit interference method | |
| CN205049478U (en) | Optical material refracting index curve measuring device | |
| CN100449260C (en) | Method for precision measuring space offset of telephotolens and eyepiece using interferometer | |
| CN110030921A (en) | Shearing-quantity-adjustable transmission-type dual-frequency laser differential interference measuring device and method | |
| CN110006356B (en) | Real-time calibration device and method based on SS-OCT (SS-OCT) distance measurement system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171020 Termination date: 20200908 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |