CN105093096A - 一种fpga的测试装置 - Google Patents
一种fpga的测试装置 Download PDFInfo
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105510744A (zh) * | 2015-12-18 | 2016-04-20 | 杭州士兰微电子股份有限公司 | 编程器测试装置及测试方法 |
CN106933757A (zh) * | 2017-03-14 | 2017-07-07 | 郑州云海信息技术有限公司 | 一种扩展fpga存储资源的方法 |
CN110473589A (zh) * | 2019-07-19 | 2019-11-19 | 苏州浪潮智能科技有限公司 | 一种多功能存储器芯片测试系统 |
CN110961364A (zh) * | 2019-12-18 | 2020-04-07 | 浪潮(北京)电子信息产业有限公司 | 一种基于fpga平台的芯片全功能自测系统及其方法 |
Citations (5)
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JP2002305438A (ja) * | 2001-04-05 | 2002-10-18 | Hitachi Ltd | Fpga、fpgaの機能変更方法、および、それを利用した通信装置 |
CN201698002U (zh) * | 2010-06-29 | 2011-01-05 | 北京自动测试技术研究所 | 一种针对fpga芯片的通用测试装置 |
CN102129025A (zh) * | 2011-01-04 | 2011-07-20 | 苏州瀚瑞微电子有限公司 | 芯片测试装置及方法 |
US20110202894A1 (en) * | 2010-02-12 | 2011-08-18 | Springsoft, Inc. | Method and Apparatus for Versatile Controllability and Observability in Prototype System |
CN102183726A (zh) * | 2011-03-16 | 2011-09-14 | 建荣集成电路科技(珠海)有限公司 | 一种基于fpga的集成电路芯片测试系统与方法 |
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- 2015-08-13 CN CN201510497069.4A patent/CN105093096B/zh active Active
Patent Citations (5)
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JP2002305438A (ja) * | 2001-04-05 | 2002-10-18 | Hitachi Ltd | Fpga、fpgaの機能変更方法、および、それを利用した通信装置 |
US20110202894A1 (en) * | 2010-02-12 | 2011-08-18 | Springsoft, Inc. | Method and Apparatus for Versatile Controllability and Observability in Prototype System |
CN201698002U (zh) * | 2010-06-29 | 2011-01-05 | 北京自动测试技术研究所 | 一种针对fpga芯片的通用测试装置 |
CN102129025A (zh) * | 2011-01-04 | 2011-07-20 | 苏州瀚瑞微电子有限公司 | 芯片测试装置及方法 |
CN102183726A (zh) * | 2011-03-16 | 2011-09-14 | 建荣集成电路科技(珠海)有限公司 | 一种基于fpga的集成电路芯片测试系统与方法 |
Non-Patent Citations (1)
Title |
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张凯虹: "一种FPGA验证与测试的方法介绍", 《计算机与数字工程》 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105510744A (zh) * | 2015-12-18 | 2016-04-20 | 杭州士兰微电子股份有限公司 | 编程器测试装置及测试方法 |
CN106933757A (zh) * | 2017-03-14 | 2017-07-07 | 郑州云海信息技术有限公司 | 一种扩展fpga存储资源的方法 |
CN110473589A (zh) * | 2019-07-19 | 2019-11-19 | 苏州浪潮智能科技有限公司 | 一种多功能存储器芯片测试系统 |
CN110961364A (zh) * | 2019-12-18 | 2020-04-07 | 浪潮(北京)电子信息产业有限公司 | 一种基于fpga平台的芯片全功能自测系统及其方法 |
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Address after: 250100 Ji'nan science and technology zone, Shandong high tide Road, No. 1036 wave of science and Technology Park, building S06 Patentee after: Tidal Cloud Information Technology Co.,Ltd. Address before: 250100 Ji'nan science and technology zone, Shandong high tide Road, No. 1036 wave of science and Technology Park, building S06 Patentee before: SHANDONG INSPUR CLOUD INFORMATION TECHNOLOGY Co.,Ltd. Address after: 250100 Ji'nan science and technology zone, Shandong high tide Road, No. 1036 wave of science and Technology Park, building S06 Patentee after: SHANDONG INSPUR CLOUD INFORMATION TECHNOLOGY Co.,Ltd. Address before: 250100 Ji'nan science and technology zone, Shandong high tide Road, No. 1036 wave of science and Technology Park, building S06 Patentee before: SHANDONG LANGCHAO YUNTOU INFORMATION TECHNOLOGY Co.,Ltd. |
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