CN105092037B - A kind of method for obtaining measure spectrum - Google Patents
A kind of method for obtaining measure spectrum Download PDFInfo
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- CN105092037B CN105092037B CN201510378261.1A CN201510378261A CN105092037B CN 105092037 B CN105092037 B CN 105092037B CN 201510378261 A CN201510378261 A CN 201510378261A CN 105092037 B CN105092037 B CN 105092037B
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Abstract
The invention discloses a kind of method for obtaining measure spectrum, comprise the following steps：A, reference light are received after entrance slit, dispersion element, exit slit, and optical flat is also placed with above-mentioned light path；With the rotation of dispersion element, progressively obtain comprising relative wavenumbers information, with periodic reference signal；B, the characteristic point extracted in the reference signal, the characteristic point are corresponding with the present position of the dispersion element；C, measurement light are received after the entrance slit, the dispersion element, the exit slit；When the dispersion element turns to the corresponding dispersion element present position of the characteristic point, the collection of triggering measurement optical signal, so as to obtain measurement luminous intensity measure spectrum corresponding with relative wavenumbers.Simple in construction, performance of the invention is good, calibration is easy.
Description
Technical field
The present invention relates to sub-ray spectrometer, the method for more particularly to obtaining measure spectrum.
Background technology
Most widely used in sub-ray spectrometer is Fourier transform type spectrometer and grating type sub-ray spectrometer.
Fourier transform type spectrometer uses two-beam interference principle, makes the phase difference consecutive variations between coherent beam, together
Step records the light intensity curve i.e. interference pattern of striped, then carries out Fourier transform to interference pattern and obtains spectrogram.Fu
Vertical leaf transformation type spectrometer has the advantages that wavelength interval is small, wavelength repeatability is good, but has that volume is heavy, noise is poor etc. and lack
Point.
Grating beam splitting type spectrometer is to use the dispersion light-dividing principle of grating that polychromatic light is spatially separated, will be incident narrow
Seam is imaged on exit slit, and spectrogram is obtained on exit slit.
United States Patent (USP) US4969739 discloses a kind of sweep type sub-ray spectrometer, as shown in figure 1, concrete technical scheme is：
Motor drives grating high-speed to rotate, and the position of grating is positioned by the encoder being connected with grating, and feeds back to motor
It is controlled.The spectrometer can obtain nearly 2 spectrum with per second, and noise is relatively good；But also there is following deficiency：1st, structure is more multiple
It is miscellaneous, it is necessary to go to position the grating using encoder, feedback device, optical position assemble；2nd, poor-performing, the performance of encoder
Some performances of spectrometer are determined, because the mechanical requirements of the optical position assemble of encoder are high, spectrometer are as a result caused
Poor-performing, such as minimum wavelength interval are larger, wavelength repeatability is poor；Meanwhile, the machinery change of introducing also reduces wavelength
Accuracy；3rd, calibration trouble, because the mechanical location that the spaced points of its sampling are gratings is determined, so also must pass through machinery
Wavelength points are determined with optical relation, it is necessary to which multiple standard wave lengths point could accurate calibration wavelength.
The content of the invention
Above-mentioned not enough there is provided operating accuracy is good, calibration is readily obtained present invention aim to address of the prior art
The method for obtaining measure spectrum.
To achieve the above object, the present invention uses following technical scheme：
A kind of method for obtaining measure spectrum, comprises the following steps：
A, reference light are received after the second entrance slit, dispersion element, the second exit slit, are also put in above-mentioned light path
Optical flat is equipped with, with the rotation of dispersion element, is progressively obtained comprising relative wavenumbers information, with periodic with reference to letter
Number；
Measurement light is received after the first entrance slit, the dispersion element of the rotation, the first exit slit；
B, when detecting characteristic point in the reference signal progressively obtained and occurring, the collection of triggering measurement optical signal, from
And obtain measuring the measure spectrum of luminous intensity and relative wavenumbers relation.
Preferably, the characteristic point is the point periodically occurred.
Preferably, methods described also includes demarcating steps：Calibrating source is seated in before the entrance slit, nominal light
Received after the entrance slit, the dispersion element, the exit slit, with the rotation of the dispersion element, by
Step obtains demarcation light intensity signal corresponding with the dispersion element present position；Utilize the characteristic wave demarcated in light intensity signal
The long measure spectrum gone in demarcating steps b, so as to obtain measurement luminous intensity measure spectrum corresponding with absolute wave number.
The present invention general principle be：Occur multiple-beam interference in optical flat using reference light and obtain etalon stripeds
(e.g., two peak-to-peak wave number difference 1/2nL, n are the refractive index of optical flat, and L is the thickness of optical flat), wraps using in waveform
The characteristic point (such as the point periodically occurred) of the information containing relative wavenumbers goes the collection of triggering measurement optical signal, so as to obtain wave number etc.
The measure spectrum at interval.
Compared with prior art, the present invention has the following technical effect that：1st, it is simple in construction, without encoder, feedback control
And mechanical positioner；2nd, better performances, the sampling interval of measure spectrum is directly determined by wavelength characteristic, and the sampling interval can lead to
Cross and change the thickness of optical flat to realize, without the conversion of machinery and optical relation, influenceed small by mechanical stability, it is ensured that
The accuracy of height and repeatability；3rd, it is easy to calibrate, because the measure spectrum of acquisition is between measurement luminous intensity and relative wavenumbers
Corresponding relation, therefore, only need to can complete the demarcation to wavelength domain with a wavelength points.
Brief description of the drawings
Fig. 1 is a kind of structural representation of existing spectrometer；
Fig. 2 is a kind of structural representation of spectrometer of the present invention；
Fig. 3 is the structural representation of another spectrometer of the present invention；
Fig. 4 is the reference signal of the spectrometer acquisition of the present invention, spectrum schematic diagram.
Embodiment
With reference to the accompanying drawings and examples, the present invention is further described in detail.
Embodiment 1：
A kind of sweep type sub-ray spectrometer, is applied in the near-infrared spectrum analysis measurement of sample.As shown in Fig. 2 described
Spectrometer is included by optical flat 11, control device 61, entrance slit 12, rotatable concave grating 31, exit slit 13, spy
The light splitting passage of device 14 and signal processing module composition is surveyed, wherein, the optical flat 11 can be arranged on the entrance slit 12
Before, and the control device 61 is arranged on after the optical flat 11 (can also be before optical flat 11), for may be selected
Ground makes reference light or measurement light pass through the entrance slit 12；The signal processing module includes detection module, memory module, touched
Send out module, sampling module and microprocessor.
In the course of the work, the light that light source is sent is drawn by optical fiber 41, two-beam 42,43 is separated again afterwards, wherein one
Beam reference light is transferred to before the spectrometer through optical fiber 42；Another beam measurement light is irradiated on sample through optical fiber 43, in sample
Diffusing of being produced on product is transferred to before the spectrometer after being collected by optical fiber 44.
Present invention further teaches a kind of method for obtaining measure spectrum, namely obtain the side of the above-mentioned spectrum diffused
Method, comprises the following steps：
A, reference light are transmitted before collimation lens 45 by optical fiber 42, collimated to pass through optical flat 11, then through lens 46
It is focused in optical fiber 47, through the transmission control unit 61 of optical fiber 47, such as photoswitch, photoswitch 61 makes reference light by the way that (measurement light is not
Pass through), then be transferred to through optical fiber 48 before the entrance slit 12, after entrance slit 12, concave grating 31, exit slit 13
Received by the detector 14；As concave grating 31 rotates a cycle, so as to obtain comprising relative wavenumbers information, with week
The reference signal 51 of phase property；That is, when passing through optical flat 11 multiple-beam interference occurs for reference light, so as to form etalon bars
Line, as shown in figure 4, the wave number of adjacent peak is at intervals of 1/2nL, n is the refractive index of optical flat 11, and L is the thickness of optical flat 11
Degree, therefore, it can go to adjust the wave number interval by adjusting the thickness L of optical flat 11；
B, go by detection module to extract the characteristic point in the reference signal 51, the point such as periodically occurred, in Fig. 4
Point in stain, reference signal 51 is corresponding with the present position of grating 31 in rotation, and the present position of grating 31 is corresponding to its turn
The dynamic time, the memory module stores the rotation time of the corresponding grating 31 of the characteristic point；
C, measurement light are transferred to the control device 61 by optical fiber 44, and control device 61 makes measurement light pass through (reference light
Do not pass through), measurement light is transferred to the entrance slit 12 by optical fiber 48 again, afterwards by the light splitting of concave grating 31, afterwards
Received through the exit slit 13 by detector 14, the concave grating 31 starts a new rotation period, when described recessed
When the rotation time of concave grating 31 is equal to the rotation time of the corresponding grating of the characteristic point, is triggered and surveyed by the trigger module
The collection of optical signal is measured, so as to obtain signal light intensity survey corresponding with relative wavenumbers (wave-number difference between neighbouring sample point is equal)
Measure spectrum 52；
D, in order to obtain corresponding with the absolute wave number measure spectrum of measurement luminous intensity, also need to the measure spectrum in step c
Demarcated：One Calibrating source such as high-pressure sodium lamp is connected at entrance slit, nominal light passes through the entrance slit 12, concave surface
Received after grating 31, exit slit 13, with the rotation of concave grating, obtain demarcation optical signal 53, use the spy in signal
Levy spectral line, such as v=9682cm-1, the measure spectrum in step c is calibrated, so as to obtain measurement luminous intensity and absolute wave number
Corresponding measure spectrum.
In the above-mentioned methods, the thickness of the optical flat can be diminished, and then obtains the small reference signal in wave number interval,
And then obtain the closeer measure spectrum of sampled point.
Embodiment 2：
A kind of sweep type sub-ray spectrometer, is applied in the near-infrared spectrum analysis measurement of sample.As shown in figure 3, described
Spectrometer includes the first light splitting passage and the second light splitting passage, and the first light splitting passage is by the first entrance slit 21, rotatable
Concave grating 31, the first exit slit 22, the first detector 23 and signal processing module composition, the second light splitting passage is by optics
Flat board 11, the second entrance slit 12, the rotatable concave grating 31, the second exit slit 13, the second detector 14 and institute
Signal processing module composition is stated, wherein, the optical flat 11 can be arranged on before second entrance slit 13, at the signal
Managing module includes detection module, trigger module, sampling module and microprocessor.
In measurement process, the light that light source is sent is drawn by optical fiber 41, and two beams 42,43 are divided into afterwards, wherein a branch of ginseng
Light is examined to be transferred to before the spectrometer through optical fiber 42；Another beam measurement light is irradiated on sample through optical fiber 43, on sample
Produce diffuse be collected after be transferred to by optical fiber 44 before the spectrometer.
Present invention further teaches a kind of method for obtaining measure spectrum, namely obtain the side of the above-mentioned spectrum diffused
Method, comprises the following steps：
A, reference light are transmitted before collimation lens 45 by optical fiber 42, collimated to pass through optical flat 11, then through lens 46
It is focused in optical fiber 47, is transferred to through optical fiber 47 before second entrance slit 12, by the second entrance slit 12, concave grating
31st, received after the second exit slit 13 by second detector 14；With the rotation of concave grating 31, so as to will progressively obtain
Comprising relative wavenumbers information, with periodic reference signal 51；That is, when passing through optical flat 11 multiple beam occurs for reference light
Interference, so as to form etalon stripeds, as shown in figure 3, the wave number of adjacent peak is at intervals of 1/2nL, n is the refraction of optical flat 11
Rate, L is the thickness of optical flat 11, therefore, it can go to adjust the wave number interval by adjusting the thickness L of optical flat 11；
Measure light to pass through after first entrance slit 21 by the light splitting of concave grating 31 of the rotation, afterwards through described
Second exit slit 22 is simultaneously received by the second detector 23；
B, go by detection module to detect the characteristic point in the reference signal 51 progressively obtained, the point such as periodically occurred,
Stain in reference signal 51, when having detected characteristic point and occurring, the trigger module goes the collection of triggering measurement optical signal,
So as to obtain signal light intensity measure spectrum 52 corresponding with relative wavenumbers (wave-number difference between neighbouring sample point is equal)；
C, in order to obtain corresponding with the absolute wave number measure spectrum of measurement luminous intensity, also need to the measure spectrum in step b
Demarcated：One Calibrating source such as high-pressure sodium lamp is connected at entrance slit, nominal light by first entrance slit 21,
Received after concave grating 31, the first exit slit 22, with the rotation of concave grating 31, obtain demarcation optical signal, use letter
Characteristic spectral line in number, such as v=9682cm-1, the measure spectrum in step b is calibrated, thus obtain measurement luminous intensity with
The corresponding measure spectrum of absolute wave number.
In the above-mentioned methods, the thickness of the optical flat can be diminished, and then obtains the small reference signal in wave number interval,
And then obtain the closeer measure spectrum of sampled point.
It is pointed out that above-mentioned embodiment should not be construed as limiting the scope of the invention.As in embodiment
Characteristic point is to utilize the point periodically occurred in reference signal, naturally it is also possible to be the point that aperiodicity occurs, such as reference signal
Middle first derivative is zero point, and first derivative is point of extreme value, etc..The present invention's it is crucial that flat in optics using reference light
Multiple-beam interference occurs in plate to obtain etalon stripeds (e.g., two peak-to-peak wave numbers difference 1/2nL, can be by changing optical flat
Thickness L adjustment wave-number difference), using in waveform comprising relative wavenumbers information characteristic point (as periodically occur point) go triggering
The collection of optical signal is measured, so as to obtain the equally spaced measure spectrum of wave number.Without departing from the spirit of the invention, to this
Inventing any type of change made all should fall under the scope of the present invention.
Claims (2)
1. a kind of method for obtaining measure spectrum, comprises the following steps：
A. the reference light that light source is sent is transferred to before collimation lens by optical fiber, collimated to pass through optical flat, then through lens
It is focused in the optical fiber separately set, is transferred to through the optical fiber separately set before the second entrance slit；
Reference light is received after sequentially passing through the second entrance slit, dispersion element, the second exit slit, and reference light is flat by optics
Multiple-beam interference occurs during plate, so as to form etalon stripeds, with the rotation of dispersion element, progressively obtains including relative wavenumbers
Information, with periodic reference signal；
The measurement light that light source is sent by it is fiber-optic illuminated be collected to diffusing of on sample, being produced on sample after lead to
Optical fiber is crossed to be transferred to before the first slit；
Measurement light is received after the first entrance slit, the dispersion element of the rotation, the first exit slit；
B. when detecting characteristic point in the reference signal progressively obtained and occurring, the collection of triggering measurement optical signal, so that
To the measure spectrum of measurement luminous intensity and relative wavenumbers relation；
Methods described also includes demarcating steps：
Calibrating source is seated in before first entrance slit, nominal light is by first entrance slit, dispersion member
Received after part, first exit slit, with the rotation of the dispersion element, progressively obtain with residing for the dispersion element
The corresponding demarcation light intensity signal in position；Using demarcating the measurement light that the characteristic wavelength in light intensity signal is gone in demarcating steps b
Spectrum, so as to obtain measurement luminous intensity measure spectrum corresponding with absolute wave number.
2. according to the method described in claim 1, it is characterised in that：The characteristic point is the point periodically occurred.
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| US6204919B1 (en) * | 1993-07-22 | 2001-03-20 | Novachem Bv | Double beam spectrometer |
| US5652654A (en) * | 1996-08-12 | 1997-07-29 | Asimopoulos; George | Dual beam spectrophotometer |
| US6128078A (en) * | 1999-04-09 | 2000-10-03 | Three Lc, Inc. | Radiation filter, spectrometer and imager using a micro-mirror array |
| EP3009815B1 (en) * | 2003-10-27 | 2022-09-07 | The General Hospital Corporation | Method and apparatus for performing optical imaging using frequency-domain interferometry |
| CN101038212A (en) * | 2007-02-15 | 2007-09-19 | 太原理工大学 | light intensity signal measuring system in multi-phase optical catalytic reactor and method of use thereof |
| CN101034006A (en) * | 2007-03-13 | 2007-09-12 | 郑晓明 | Method for improving measurement precision of photometry measuring instrument |
| CN101354287B (en) * | 2007-07-24 | 2010-12-22 | 杭州远方光电信息有限公司 | Spectrometer and method for correcting the same |
| CN102928078A (en) * | 2012-11-19 | 2013-02-13 | 天津理工大学 | Spectrophotometer scanning mechanism |
| CN104019900A (en) * | 2014-06-20 | 2014-09-03 | 华南师范大学 | Grating spectrometer system based on associated wavelet interference and method for improving resolution |
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