CN105092037A - Method for obtaining measurement spectrum - Google Patents
Method for obtaining measurement spectrum Download PDFInfo
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- CN105092037A CN105092037A CN201510378261.1A CN201510378261A CN105092037A CN 105092037 A CN105092037 A CN 105092037A CN 201510378261 A CN201510378261 A CN 201510378261A CN 105092037 A CN105092037 A CN 105092037A
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Abstract
The invention discloses a method for obtaining measurement spectrum, comprising that: reference light is absorbed after going through an incident slit, a dispersion element and an emitting slit, wherein an optical panel is arranged in the light path; reference signals containing relative wave quantity information and having periodicity are gradually obtained along the rotation of the dispersion member; characteristic points are extracted from the reference signals, wherein the positions of the characteristic points are corresponding to the positions of the dispersion member; the measurement light is absorbed after going through the incident slit, the dispersion member and the emission slit; and when the dispersion member is rotated to the position of the dispersion member corresponding to the characteristic point and the collection of the measurement light signal is triggered so as to obtain the measurement spectrum corresponding to the measurement intensity and the relative wave quantity. The invention is simple in structure, good in performance and easy to calibrate.
Description
Technical field
The present invention relates to sub-ray spectrometer, particularly obtain the method for measure spectrum.
Background technology
Most widely used in sub-ray spectrometer is Fourier transform type spectrometer and grating type sub-ray spectrometer.
Fourier transform type spectrometer adopts two-beam interference principle, makes the phase differential consecutive variations between coherent light beam, and under synchronous recording, the light intensity curve of striped and interferogram, then carry out Fourier transform to interferogram and obtain spectrogram.Fourier transform type spectrometer has the advantages such as wavelength interval is little, wavelength repeatability is good, but has the shortcomings such as volume is heavy, signal to noise ratio (S/N ratio) is poor.
Grating beam splitting type spectrometer adopts the dispersion light-dividing principle of grating that polychromatic light is spatially separated, and imaged in by entrance slit on exit slit, exit slit obtains spectrogram.
US Patent No. 4969739 discloses a kind of sweep type sub-ray spectrometer, and as shown in Figure 1, concrete technical scheme is: driven by motor grating high-speed rotates, and is positioned by the position of scrambler to grating be connected with grating, and feedback controls motor.This spectrometer can nearly 2 spectrum of acquisition per second, and signal to noise ratio (S/N ratio) is better; But also there is following deficiency: 1, structure is more complicated, need to use scrambler, feedback assembly, optical position assemble to go to locate described grating; 2, poor-performing, the performance of scrambler determines some performances of spectrometer, and because the mechanical requirements of the optical position assemble of scrambler is high, result causes the poor-performing of spectrometer, as minimum wavelength interval is comparatively large, wavelength repeatability is poor; Meanwhile, the machinery change of introducing also reduces the accuracy of wavelength; 3, calibration trouble, the spaced points due to its sampling is that the mechanical location of grating determines, so also must pass through machinery to determine wavelength points with the relation of optics, needing multiple standard wavelength to put could calibrate wavelength more accurately.
Summary of the invention
The object of the invention is to solve above-mentioned deficiency of the prior art, provide the method that operating accuracy is good, calibration is easy to obtain measure spectrum.
For achieving the above object, the present invention is by the following technical solutions:
Obtain a method for measure spectrum, comprise the following steps:
A, reference light are received after the second entrance slit, dispersion element, the second exit slit, be also placed with optical flat, along with the rotation of dispersion element, progressively obtain comprising relative wavenumbers information, having periodic reference signal in above-mentioned light path;
Measure light received after the dispersion element, the first exit slit of the first entrance slit, described rotation;
B, when detecting that unique point occurs in the reference signal progressively obtained, triggering and measuring the collection of light signal, thus obtaining the measure spectrum of measured light intensity and relative wavenumbers relation.
As preferably, described unique point is the point periodically occurred.
As preferably, described method also comprises demarcating steps: before Calibrating source is seated in described entrance slit, nominal light is received after described entrance slit, described dispersion element, described exit slit, along with the rotation of described dispersion element, progressively obtain the nominal light strength signal corresponding with described dispersion element present position; Utilize the measure spectrum that the characteristic wavelength in nominal light strength signal goes in demarcating steps b, thus obtain the measured light intensity measure spectrum corresponding with absolute wave number.
Ultimate principle of the present invention is: utilize reference light occur in optical flat multiple-beam interference obtain etalon striped (as, two peak-to-peak wave number difference 1/2nL, n is the refractive index of optical flat, L is the thickness of optical flat), utilize in waveform the unique point (point as periodically occurred) comprising relative wavenumbers information to go to trigger the collection of measuring light signal, thus obtain the equally spaced measure spectrum of wave number.
Compared with prior art, the present invention has following technique effect: 1, structure is simple, without the need to scrambler, FEEDBACK CONTROL and mechanical positioner; 2, better performances, the sampling interval of measure spectrum is directly determined by wavelength characteristic, and sampling interval realizes by the thickness changing optical flat, without the need to the conversion of machinery with optical relation, affect by mechanical stability little, ensure that the accuracy of height and repeatability; 3, calibration easily, because the measure spectrum obtained is the corresponding relation between measured light intensity and relative wavenumbers, therefore, only need can complete demarcation to wavelength domain by a wavelength points.
Accompanying drawing explanation
Fig. 1 is a kind of structural representation of existing spectrometer;
Fig. 2 is the structural representation of a kind of spectrometer of the present invention;
Fig. 3 is the structural representation of another kind of spectrometer of the present invention;
Fig. 4 is reference signal, the spectrum schematic diagram that spectrometer of the present invention obtains.
Embodiment
Below in conjunction with drawings and Examples, the present invention is further described in detail.
Embodiment 1:
A kind of sweep type sub-ray spectrometer, is applied in the near-infrared spectrum analysis measurement of sample.As shown in Figure 2, described spectrometer comprises point optical channel be made up of optical flat 11, control device 51, entrance slit 12, rotating concave grating 31, exit slit 13, detector 14 and signal processing module, wherein, before described optical flat 11 can be arranged on described entrance slit 12, and described control device 61 be arranged on described optical flat 11 after (also can before optical flat 11), for selectively making reference light or measuring light by described entrance slit 12; Described signal processing module comprises detection module, memory module, trigger module, sampling module and microprocessor.
In the course of the work, the light that light source sends is drawn by optical fiber 41, separates two-beam 42,43 afterwards again, and wherein a branch of reference light is transferred to before described spectrometer through optical fiber 42; Another bundle is measured light and is irradiated on sample through optical fiber 43, before being transferred to described spectrometer by optical fiber 44 after diffusing that sample produces is collected.
Present invention further teaches a kind of method obtaining measure spectrum, also namely obtain the method for the above-mentioned spectrum diffused, comprise the following steps:
Before a, reference light transmit collimation lens 45 by optical fiber 42, through optical flat 11 after collimation, be focused in optical fiber 47 through lens 46 again, through optical fiber 47 transmission control unit 61, as photoswitch, photoswitch 61 makes reference light pass through (measuring light not pass through), then is transferred to before described entrance slit 12 through optical fiber 48, is received after entrance slit 12, concave grating 31, exit slit 13 by described detector 14; Along with concave grating 31 rotates one-period, thus obtain comprising relative wavenumbers information, there is periodic reference signal 51; Also be, multiple-beam interference is there is in reference light when optical flat 11, thus form etalon striped, as shown in Figure 4, the wave number of adjacent peak is spaced apart 1/2nL, and n is the refractive index of optical flat 11, and L is the thickness of optical flat 11, therefore, can go to adjust described wave number interval by the thickness L adjusting optical flat 11;
B, go to extract the unique point in described reference signal 51 by detection module, as the point periodically occurred, stain in Fig. 4, point in reference signal 51 is corresponding with grating 31 present position in rotation, the present position of grating 31 corresponds to its rotation time, and described memory module stores the rotation time of the grating 31 of described Feature point correspondence;
C, measure light and be transferred to described control device 61 by optical fiber 44, control device 61 makes measurement light by (reference light does not pass through), measure light and be transferred to described entrance slit 12 through optical fiber 48 again, afterwards by the light splitting of described concave grating 31, be detected device 14 through described exit slit 13 afterwards to receive, described concave grating 31 starts a new rotation period, when the rotation time of described concave grating 31 equals the rotation time of the grating of described Feature point correspondence, the collection of measuring light signal is triggered by described trigger module, thus obtain the signal light intensity measure spectrum 52 corresponding with relative wavenumbers (wave-number difference between neighbouring sample point is equal),
D, in order to obtain the measured light intensity measure spectrum corresponding with absolute wave number, also need to demarcate the measure spectrum in step c: by a Calibrating source as high-pressure sodium lamp is connected to entrance slit place, nominal light is received after described entrance slit 12, concave grating 31, exit slit 13, along with the rotation of concave grating, obtain nominal light signal 53, use the characteristic spectral line in signal, as v=9682cm
-1, the measure spectrum in step c is calibrated, thus obtains the measured light intensity measure spectrum corresponding with absolute wave number.
In the above-mentioned methods, by the less thick of described optical flat, and then the little reference signal in wave number interval can be obtained, and then obtain the closeer measure spectrum of sampled point.
Embodiment 2:
A kind of sweep type sub-ray spectrometer, is applied in the near-infrared spectrum analysis measurement of sample.As shown in Figure 3, described spectrometer comprises first point of optical channel and second point of optical channel, described first point of optical channel is by the first entrance slit 21, rotating concave grating 31, first exit slit 22, first detector 23 and signal processing module composition, second point of optical channel is by optical flat 11, second entrance slit 12, described rotating concave grating 31, second exit slit 13, second detector 14 and described signal processing module composition, wherein, before described optical flat 11 can be arranged on described second entrance slit 13, described signal processing module comprises detection module, trigger module, sampling module and microprocessor.
In measuring process, the light that light source sends is drawn by optical fiber 41, and be divided into two bundles 42,43 afterwards, wherein a branch of reference light is transferred to before described spectrometer through optical fiber 42; Another bundle is measured light and is irradiated on sample through optical fiber 43, before being transferred to described spectrometer by optical fiber 44 after diffusing that sample produces is collected.
Present invention further teaches a kind of method obtaining measure spectrum, also namely obtain the method for the above-mentioned spectrum diffused, comprise the following steps:
Before a, reference light transmit collimation lens 45 by optical fiber 42, through optical flat 11 after collimation, be focused in optical fiber 47 through lens 46 again, be transferred to before described second entrance slit 12 through optical fiber 47, received by described second detector 14 after the second entrance slit 12, concave grating 31, second exit slit 13; Along with the rotation of concave grating 31, thus will progressively obtain comprising relative wavenumbers information, there is periodic reference signal 51; Also be, multiple-beam interference is there is in reference light when optical flat 11, thus form etalon striped, as shown in Figure 3, the wave number of adjacent peak is spaced apart 1/2nL, and n is the refractive index of optical flat 11, and L is the thickness of optical flat 11, therefore, can go to adjust described wave number interval by the thickness L adjusting optical flat 11;
Measure light through after described first entrance slit 21 by concave grating 31 light splitting of described rotation, received by the second detector 23 through described second exit slit 22 afterwards;
B, to be gone to detect unique point in the reference signal 51 that progressively obtains by detection module, as the point periodically occurred, stain in reference signal 51, when having detected that unique point occurs, described trigger module goes to trigger the collection of measuring light signal, thus obtains the signal light intensity measure spectrum 52 corresponding with relative wavenumbers (wave-number difference between neighbouring sample point is equal);
C, in order to obtain the measured light intensity measure spectrum corresponding with absolute wave number, also need to demarcate the measure spectrum in step b: by a Calibrating source as high-pressure sodium lamp is connected to entrance slit place, nominal light is received after described first entrance slit 21, concave grating 31, first exit slit 22, along with the rotation of concave grating 31, obtain nominal light signal, use the characteristic spectral line in signal, as v=9682cm
-1, the measure spectrum in step b is calibrated, thus obtains the measured light intensity measure spectrum corresponding with absolute wave number.
In the above-mentioned methods, by the less thick of described optical flat, and then the little reference signal in wave number interval can be obtained, and then obtain the closeer measure spectrum of sampled point.
It is pointed out that above-mentioned embodiment should not be construed as limiting the scope of the invention.If unique point in embodiment utilizes the point periodically occurred in reference signal, can certainly be the point that aperiodicity occurs, if first order derivative in reference signal is the point of zero, first order derivative be the point of extreme value, etc.Key of the present invention is, utilize reference light occur in optical flat multiple-beam interference obtain etalon striped (as, two peak-to-peak wave number difference 1/2nL, thickness L by changing optical flat adjusts wave-number difference), utilize in waveform the unique point (point as periodically occurred) comprising relative wavenumbers information to go to trigger the collection of measuring light signal, thus obtain the equally spaced measure spectrum of wave number.Without departing from the spirit of the invention, all should fall within protection scope of the present invention any type of change that the present invention makes.
Claims (3)
1. obtain a method for measure spectrum, comprise the following steps:
A, reference light are received after the second entrance slit, dispersion element, the second exit slit, be also placed with optical flat, along with the rotation of dispersion element, progressively obtain comprising relative wavenumbers information, having periodic reference signal in above-mentioned light path;
Measure light received after the dispersion element, the first exit slit of the first entrance slit, described rotation;
B, when detecting that unique point occurs in the reference signal progressively obtained, triggering and measuring the collection of light signal, thus obtaining the measure spectrum of measured light intensity and relative wavenumbers relation.
2. method according to claim 1, is characterized in that: described unique point is the point periodically occurred.
3. method according to claim 1 and 2, is characterized in that: described method also comprises demarcating steps:
Before Calibrating source is seated in described entrance slit, nominal light is received after described entrance slit, described dispersion element, described exit slit, along with the rotation of described dispersion element, progressively obtain the nominal light strength signal corresponding with described dispersion element present position; Utilize the measure spectrum that the characteristic wavelength in nominal light strength signal goes in demarcating steps b, thus obtain the measured light intensity measure spectrum corresponding with absolute wave number.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111707370A (en) * | 2020-06-30 | 2020-09-25 | 中国计量大学 | Large-diameter light-splitting color photometer and color measuring method |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5652654A (en) * | 1996-08-12 | 1997-07-29 | Asimopoulos; George | Dual beam spectrophotometer |
| US6204919B1 (en) * | 1993-07-22 | 2001-03-20 | Novachem Bv | Double beam spectrometer |
| US6392748B1 (en) * | 1999-04-09 | 2002-05-21 | Plain Sight Systems, Inc. | Radiation filter, spectrometer and imager using a micro-mirror array |
| CN101034006A (en) * | 2007-03-13 | 2007-09-12 | 郑晓明 | Method for improving measurement precision of photometry measuring instrument |
| CN101038212A (en) * | 2007-02-15 | 2007-09-19 | 太原理工大学 | light intensity signal measuring system in multi-phase optical catalytic reactor and method of use thereof |
| CN101354287A (en) * | 2007-07-24 | 2009-01-28 | 杭州远方光电信息有限公司 | Spectrometer and method for correcting the same |
| CN102928078A (en) * | 2012-11-19 | 2013-02-13 | 天津理工大学 | Spectrophotometer scanning mechanism |
| CN103284691A (en) * | 2003-10-27 | 2013-09-11 | 通用医疗公司 | Method and apparatus for performing optical imaging using frequency-domain interferometry |
| CN104019900A (en) * | 2014-06-20 | 2014-09-03 | 华南师范大学 | Grating spectrometer system based on associated wavelet interference and method for improving resolution |
| CN104655278A (en) * | 2015-02-13 | 2015-05-27 | 上海交通大学 | Wavelength calibration instrument |
-
2015
- 2015-06-29 CN CN201510378261.1A patent/CN105092037B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6204919B1 (en) * | 1993-07-22 | 2001-03-20 | Novachem Bv | Double beam spectrometer |
| US5652654A (en) * | 1996-08-12 | 1997-07-29 | Asimopoulos; George | Dual beam spectrophotometer |
| US6392748B1 (en) * | 1999-04-09 | 2002-05-21 | Plain Sight Systems, Inc. | Radiation filter, spectrometer and imager using a micro-mirror array |
| CN103284691A (en) * | 2003-10-27 | 2013-09-11 | 通用医疗公司 | Method and apparatus for performing optical imaging using frequency-domain interferometry |
| CN101038212A (en) * | 2007-02-15 | 2007-09-19 | 太原理工大学 | light intensity signal measuring system in multi-phase optical catalytic reactor and method of use thereof |
| CN101034006A (en) * | 2007-03-13 | 2007-09-12 | 郑晓明 | Method for improving measurement precision of photometry measuring instrument |
| CN101354287A (en) * | 2007-07-24 | 2009-01-28 | 杭州远方光电信息有限公司 | Spectrometer and method for correcting the same |
| CN102928078A (en) * | 2012-11-19 | 2013-02-13 | 天津理工大学 | Spectrophotometer scanning mechanism |
| CN104019900A (en) * | 2014-06-20 | 2014-09-03 | 华南师范大学 | Grating spectrometer system based on associated wavelet interference and method for improving resolution |
| CN104655278A (en) * | 2015-02-13 | 2015-05-27 | 上海交通大学 | Wavelength calibration instrument |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111707370A (en) * | 2020-06-30 | 2020-09-25 | 中国计量大学 | Large-diameter light-splitting color photometer and color measuring method |
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