CN105067902B - A kind of OVP of extension, short-circuit test circuit and test method - Google Patents
A kind of OVP of extension, short-circuit test circuit and test method Download PDFInfo
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- CN105067902B CN105067902B CN201510391626.4A CN201510391626A CN105067902B CN 105067902 B CN105067902 B CN 105067902B CN 201510391626 A CN201510391626 A CN 201510391626A CN 105067902 B CN105067902 B CN 105067902B
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Abstract
The present invention relates to measurement test field of electronic devices, disclose the OVP, short-circuit test circuit and test method of a kind of extension.The OVP test circuit of extension includes built-in testing circuit and external test loop, the equipment interface channel in the built-in testing circuit is separately connected the switching device control terminal on the equipment interface channel of external test loop, the switching device control terminal crossed on potential source interface channel crossed potential source interface channel and connect external test loop in the built-in testing circuit.The present invention, which can be applied to small-power test occasion, can also be used for large power test occasion, use same set of control logic, it is only necessary to change the mode of connection, increase corresponding external module, can realize extension function, without increasing additional control management.
Description
Technical field
The present invention relates to measurement test field of electronic devices, and in particular to a kind of OVP test circuit of extension and test
Method.
Background technique
It is all doing short-circuit test or OVP test in Auto-Test System, it usually can all use relay, but relay
Device huge number switches small-power circuit using powerful relay, can not accomplish economy, also not can guarantee its precision,
And switch powerful circuit using low power relay, then there is risk that is easy to damage or can not accomplishing at all, if
Switched using more set systems, though can guarantee precision, each control loop requires a set of control system, can not be built in
Instrument internal, management are got up more difficult.
Summary of the invention
For prior art disadvantage, the present invention proposes a kind of expansible handover scheme, tests occasion for OVP, can be with
In the case where not modifying control flow, electric current and power expansion can be realized by only modifying the mode of connection, simplify management work
It measures.
In order to solve the above-mentioned technical problem, the present invention is realized by the following technical scheme:
A kind of OVP test circuit of extension, it is characterised in that described interior including built-in testing circuit and external test loop
Set test loop and external test loop include an at least equipment interface channel interconnected, one cross potential source interface channel and
One OVP TCH test channel, the equipment interface channel are equipped with the switch that control channel opens or closes with potential source interface channel is crossed
Device；
The equipment interface channel in the built-in testing circuit is separately connected on the equipment interface channel of external test loop
Switching device control terminal, the potential source connection of crossing that the potential source interface channel excessively in the built-in testing circuit connects external test loop are led to
Switching device control terminal on road；
The built-in testing circuit is built in test equipment, and the external test loop extends outside test equipment.
Preferably, the control of the equipment interface channel of the external test loop and the switching device crossed on potential source interface channel
Source processed is provided by built-in testing circuit.
In the occasion for needing to carry out short-circuit test, the built-in testing circuit and external test loop can also include and set
The short-circuit test channel of standby interface channel connection, short-circuit test channel be equipped with the switching device that control channel opens or closes and
Sampling resistor, the short-circuit test channel in built-in testing circuit connect the switching device on the short-circuit test channel of external test loop
Control terminal.
The test method of the OVP test circuit of previous extension is:
Small-power test:
The equipment interface channel in built-in testing circuit and the signal flow crossed on potential source interface channel are input, OVP test
Signal flow on channel is output；
When testing OVP voltage, it is closed the switching device crossed on potential source interface channel in built-in testing circuit and corresponding equipment
Switching device on interface channel will be crossed potential source voltage and be applied on the corresponding equipment interface channel in built-in testing circuit, from interior
It sets and measures current OVP voltage on the port of test loop OVP TCH test channel；
Large power test:
The equipment interface channel in built-in testing circuit and the signal flow crossed on potential source interface channel are output, OVP test
Channel connection switch device power supply；
When testing OVP voltage, it is closed the switching device crossed on potential source interface channel in built-in testing circuit and corresponding equipment
Switching device power supply is loaded on the potential source interface channel excessively of external test loop by the switching device on interface channel
Switching device on switching device and corresponding equipment interface channel will cross potential source voltage and be applied to that external test loop is corresponding to be set
On standby interface channel, current OVP voltage is measured from the port of external test loop OVP TCH test channel.
The present invention also provides a kind of short-circuit test circuits of extension, it is characterised in that including built-in testing circuit and external
Test loop, the built-in testing circuit and external test loop include an at least equipment interface channel and respectively with each equipment
The connected short-circuit test channel of interface channel, each equipment interface channel and short-circuit test channel be equipped with control channel open or
The switching device of closing, the equipment connection that the equipment interface channel in the built-in testing circuit is separately connected external test loop are logical
The short-circuit test channel of switching device control terminal on road, the built-in testing circuit connects the short-circuit test of external test loop
Switching device control terminal on channel；The built-in testing circuit is built in test equipment, and the external test loop is being surveyed
Try device external extension.
The invention has the following beneficial effects:
1, no matter using high-power switch device progress large power test, or the small function of small power switch device progress is used
Rate test, uses same set of control logic, it is only necessary to change the mode of connection, increase corresponding external module, can realize expansion
Function is opened up, without increasing additional control management.
2, built in the instrument of built-in testing circuit, external test loop instrument is external, and small-power is tested occasion built-in testing and returned
Road directly participates in measuring, and large power test occasion participates in measurement, circuit by the external external test loop of built-in testing circuit driving
It is practical, it can be widely applied on various test platforms.
3, expansion is required low, it is consistent to require nothing more than driving voltage specification, no matter DC communication, voltage levels are equal
It can drive, reduce expansion apolegamy and require.
Detailed description of the invention
Fig. 1 is small-power test loop schematic diagram；
Fig. 2 is large power test circuit theory figure.
Specific embodiment
The test loop that the present invention tests in circuit is not limited to power test circuit, is also possible to voltage, testing current returns
Road.The present embodiment is only further described in detail the invention by taking power test circuit as an example, wherein small-power test
Circuit is built-in testing circuit, and large power test circuit is external test loop.
Such as Fig. 1, it is the OVP test circuit middle low power test loop schematic diagram that the present invention extends, is tested with traditional OVP
Loop structure is similar, including three equipment interface channels (input 1, input 2, input 3), one cross potential source interface channel (OVP be defeated
Enter), OVP TCH test channel (test lead that OVP test point 12,13 is channel) and a short-circuit test channel (short circuit current
Test point 7,8 is the test lead in channel, is drawn by the both ends sampling resistor R1), each channel is connected with each other.In small-power test,
Equipment interface channel is used to connect the output of Devices to test, and signal flow is input, crosses potential source interface channel for connecting
Potential source, signal flow are input.It is logical that control is respectively equipped on equipment interface channel, excessively potential source interface channel, short-circuit test channel
Low power relay K1-K3, K4, K5 that road opens or closes (the present embodiment only by taking relay as an example, in other embodiments,
Those skilled in the art are easy to know that other switching device generations of such as tongue tube, contact-making switch or analog switch also can be used in relay
For).The short-circuit test channel of small-power test loop be equipped with fuse F1, be connected to relay K5 and sampling resistor R1 it
Between, the both ends fuse F1 are used for the intact test of fuse, and for driving the short-circuit test channel in large power test circuit
High power relay.
Such as Fig. 2, large power test circuit is similar with small-power test loop structure, also includes three equipment interface channels
(input 1, input 2, input 3), mistake potential source interface channel (OVP input), an OVP TCH test channel and a short-circuit test
Channel (is drawn) by the both ends sampling resistor RX1, and each channel is connected with each other.Equipment interface channel crosses potential source interface channel, short circuit survey
It pings and is respectively equipped with high power relay KX1-KX3, KX4, KX5 that control channel opens or closes.
The extension of OVP test circuit can be realized in the mode of connection for only needing to simply change small-power test loop, real
Existing large power test function.The specific mode of connection is: the equipment interface channel of small-power test loop is separately connected high-power survey
Relay (KX1-KX3) power end on the equipment interface channel in circuit is tried, small-power test loop crosses potential source interface channel
Connect relay (KX4) power end crossed on potential source interface channel in large power test circuit, the short circuit of small-power test loop
TCH test channel connects relay (KX5) power supply on the short-circuit test channel in large power test circuit by the both ends fuse F1
End.In large power test, the OVP TCH test channel of small-power test loop connects relay power supply, and signal flow is defeated
Enter, equipment interface channel and the signal flow crossed on potential source interface channel are output, and relay power supply is high-power survey
It tries the equipment interface channel in circuit, cross the relay (KX1-KX3, KX4, KX5) on potential source interface channel and short-circuit test channel
Power supply.As another embodiment, large power test circuit units interface channel, excessively potential source interface channel and short-circuit test are logical
The individual port that relay (KX1-KX3, KX4, KX5) on road can also be provided by built-in testing circuit is supplied
Electricity.
In practical applications, small-power test loop can be built in Devices to test, and large power test circuit is to be measured
Device external extension.
Test method is as follows:
Small-power tests (low current test):
When testing short circuit current, it is closed short-circuit relay K5 and corresponding input channel selects switch K1-K3
Corresponding short circuit current is read from sampling resistor R1,
When testing OVP voltage, it is closed OVP relay K4, and corresponding closure input channel selects switch K1-K3, it can be by
It crosses potential source voltage to be applied in corresponding input channel, current OVP electrical voltage point can be measured from OVP measurement terminal, it is real
The test effect of existing OVP.
When electric current is larger, and above-mentioned sampling and control loop cannot be met the requirements, it is extended by attached drawing 2.Electric current input
The heavy relay that high-power circuit is controlled by the electric current input channel in small-power circuit (is illustrated as 3, by K1-
K3 controls external KX1-KX3 respectively), the channel OVP in small-power circuit switches relay to control the high voltage in high-power circuit
Device (KX4 outside K4 control), the short-circuit test channel in small-power circuit passes through the big of the high-power circuit of fuse Interface Controller
Short circuit current relay (K5 controls external KX5), the power supply of high-power circuit relay passes through the OVP measurement end in small-power circuit
Son input.
Large power test:
It is still short-circuit relay K5 and the choosing of corresponding input channel for being closed small-power circuit when testing short circuit current
Switch K1-K3 is selected, then relay power supply, by the above relay, the synchronous high power relay for driving high-power circuit
The short-circuit current value of high current can be read from external sampling resistor RX1 in KX1-KX3, KX5.
It is still that the OVP relay K4 for being closed small-power circuit and the selection of corresponding input channel are opened when testing OVP voltage
K1-3 is closed, relay power supply can synchronize the high power relay KX1- for being loaded into high-power circuit by the above relay
On KX4, the OVP voltage in high-power circuit can be applied on corresponding Measurement channel, be measured by the OVP in high-power circuit
Terminal can measure OVP voltage, realize measurement function.
Claims (9)
1. a kind of OVP of extension tests circuit, it is characterised in that described built-in including built-in testing circuit and external test loop
Test loop and external test loop include an at least equipment interface channel interconnected, one cross potential source interface channel and one
OVP TCH test channel, the equipment interface channel are equipped with the derailing switch that control channel opens or closes with potential source interface channel is crossed
Part；
The equipment interface channel in the built-in testing circuit is separately connected the switch on the equipment interface channel of external test loop
The potential source interface channel excessively of device control terminal, the built-in testing circuit connects on the potential source interface channel excessively of external test loop
Switching device control terminal；
The built-in testing circuit is built in test equipment, and the external test loop extends outside test equipment.
2. the OVP test circuit extended as described in claim 1, it is characterised in that the equipment of the external test loop connects
The voltage input of channel and the switching device crossed on potential source interface channel is provided by built-in testing circuit.
3. the OVP test circuit extended as claimed in claim 2, it is characterised in that the OVP TCH test channel in built-in testing circuit
Connect a voltage source.
4. the OVP test circuit extended as claimed in claim 1 or 2, it is characterised in that the built-in testing circuit and external
Test loop further includes the short-circuit test channel connecting with equipment interface channel, and short-circuit test channel is opened equipped with control channel
Or the switching device and sampling resistor closed, the short circuit that the short-circuit test channel in built-in testing circuit connects external test loop are surveyed
The switching device control terminal pinged.
5. the OVP test circuit extended as claimed in claim 4, it is characterised in that the short-circuit test channel in built-in testing circuit
Opening on the short-circuit test channel of external test loop is connect with two ports of the concatenated fuse of its sampling resistor by one
Close device control terminal.
6. a kind of short-circuit test circuit of extension, it is characterised in that described interior including built-in testing circuit and external test loop
It sets test loop and external test loop includes an at least equipment interface channel and is connected respectively with each equipment interface channel
One short-circuit test channel, each equipment interface channel and short-circuit test channel are equipped with the derailing switch that control channel opens or closes
Part, the equipment interface channel in the built-in testing circuit are separately connected the derailing switch on the equipment interface channel of external test loop
Part control terminal, the short-circuit test channel in the built-in testing circuit connect the switch on the short-circuit test channel of external test loop
Device control terminal；The built-in testing circuit is built in test equipment, and the external test loop expands outside test equipment
Exhibition.
7. the test method of the OVP test circuit extended as described in claim 1, it is characterised in that:
Small-power test:
The equipment interface channel in built-in testing circuit and the signal flow crossed on potential source interface channel are input, OVP TCH test channel
On signal flow be output；
When testing OVP voltage, it is closed the switching device crossed on potential source interface channel in built-in testing circuit and corresponding equipment connection
Switching device on channel will be crossed potential source voltage and be applied on the corresponding equipment interface channel in built-in testing circuit, from built-in survey
It tries to measure current OVP voltage on the port of circuit OVP TCH test channel；
Large power test:
The equipment interface channel in built-in testing circuit and the signal flow crossed on potential source interface channel are output, OVP TCH test channel
Connection switch device power supply；
When testing OVP voltage, it is closed the switching device crossed on potential source interface channel in built-in testing circuit and corresponding equipment connection
Switching device power supply is loaded into the switch of external test loop crossed on potential source interface channel by the switching device on channel
Switching device on device and corresponding equipment interface channel will cross potential source voltage and be applied to the corresponding equipment company of external test loop
It connects on road, current OVP voltage is measured from the port of external test loop OVP TCH test channel.
8. extend as claimed in claim 7 OVP test circuit test method, it is characterised in that the built-in testing circuit and
External test loop further includes the short-circuit test channel connecting with equipment interface channel, and short-circuit test channel is equipped with control channel
The short-circuit test channel of the switching device and sampling resistor opened or closed, built-in testing circuit connects the short of external test loop
Switching device control terminal on the TCH test channel of road.
9. the test method of the OVP test circuit extended as claimed in claim 7, it is characterised in that:
Small-power test:
The switching device being closed in built-in testing circuit on short-circuit test channel when testing short circuit current and the connection of corresponding equipment
Switching device on channel reads corresponding short circuit current from its sampling resistor；
Large power test:
The switching device being closed in built-in testing circuit on short-circuit test channel when testing short circuit current and the connection of corresponding equipment
Switching device power supply is loaded into the derailing switch on the short-circuit test channel of external test loop by the switching device on channel
Switching device on part and corresponding equipment interface channel, from the sampling resistor in the short-circuit test channel of external test loop
Read corresponding short circuit current.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510391626.4A CN105067902B (en) | 2015-07-07 | 2015-07-07 | A kind of OVP of extension, short-circuit test circuit and test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510391626.4A CN105067902B (en) | 2015-07-07 | 2015-07-07 | A kind of OVP of extension, short-circuit test circuit and test method |
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| Publication Number | Publication Date |
|---|---|
| CN105067902A CN105067902A (en) | 2015-11-18 |
| CN105067902B true CN105067902B (en) | 2019-08-16 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4192076B2 (en) * | 2003-11-19 | 2008-12-03 | 株式会社日立製作所 | Power supply evaluation method, evaluation device and production facility |
| CN103454508A (en) * | 2012-05-30 | 2013-12-18 | 路华科技(深圳)有限公司 | Four-channel overcurrent and overvoltage protecting tester |
| US8767357B2 (en) * | 2012-06-14 | 2014-07-01 | Analog Devices, Inc. | Overvoltage protection system for power system with multiple parallel-connected switching power supplies |
-
2015
- 2015-07-07 CN CN201510391626.4A patent/CN105067902B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4192076B2 (en) * | 2003-11-19 | 2008-12-03 | 株式会社日立製作所 | Power supply evaluation method, evaluation device and production facility |
| CN103454508A (en) * | 2012-05-30 | 2013-12-18 | 路华科技(深圳)有限公司 | Four-channel overcurrent and overvoltage protecting tester |
| US8767357B2 (en) * | 2012-06-14 | 2014-07-01 | Analog Devices, Inc. | Overvoltage protection system for power system with multiple parallel-connected switching power supplies |
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| Publication number | Publication date |
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| CN105067902A (en) | 2015-11-18 |
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Address after: Zhimengyuan, No.4 gupinggang, Gulou District, Nanjing, Jiangsu Province, 210009 Patentee after: ADEX Electronics (Nanjing) Co.,Ltd. Address before: Building 1, No. 108, xishanqiao South Road, Yuhuatai District, Nanjing City, Jiangsu Province, 210012 Patentee before: ADEX Electronics (Nanjing) Co.,Ltd. |