CN105043268B - Long distance laser interferes chi and its measuring method - Google Patents
Long distance laser interferes chi and its measuring method Download PDFInfo
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- CN105043268B CN105043268B CN201510389515.XA CN201510389515A CN105043268B CN 105043268 B CN105043268 B CN 105043268B CN 201510389515 A CN201510389515 A CN 201510389515A CN 105043268 B CN105043268 B CN 105043268B
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- main casing
- chi
- light
- long distance
- distance laser
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Abstract
The present invention relates to a kind of long distance laser interference chi and its measuring method, the long distance laser interference chi includes main casing（1）, the main casing（1）Front end be provided with light hole（1.1）, the main casing（1）The front end left and right sides be symmetrically connected with left shell（2）And right shell body（3）, the left shell（2）Lasing light emitter is inside installed（4）, the main casing（1）Speculum one is inside installed（5）And half-reflecting half mirror（6）, the right shell body（3）Speculum two is inside installed（7）.The present invention relates to a kind of long distance laser interference chi and its measuring method, measurement is quick accurate and applied widely.
Description
Technical field
The present invention relates to a kind of long distance laser interference chi and its measuring method, belong to optical gauge technical field.
Background technology
The measurement such as height, width at present, for building uses trigonometric function computational methods, such as Chinese patent application
" a kind of fast building height measuring process " disclosed in 200610065882.5, " vertically builds disclosed in 201410575353.4
Build the measuring method of thing perpendicularity ", need to measure current measurement point in these measuring methods with measuring the air line distance of thing, with
And the angle between the line and horizontal plane between current measurement point and measurement thing peak, so that using trigonometric function to building
Thing is highly measured, and which wastes time and energy, inefficiency；And need the professional apparatus of professional's operation to carry out, its
The scope of application is smaller.
The content of the invention
It is an object of the invention to overcome above-mentioned not enough there is provided a kind of to measure quick accurate and applied widely remote
Laser interference chi and its measuring method.
The object of the present invention is achieved like this：
A kind of long distance laser interferes chi, and the long distance laser interference chi includes before main casing, the main casing
End is provided with light hole, and the front end left and right sides of the main casing is symmetrically connected with left shell and right shell body；
It is provided with the left shell in lasing light emitter, the main casing and speculum one and half-reflecting half mirror is installed, it is described
It is provided with right shell body after speculum two, the laser light incident that lasing light emitter is sent to half-reflecting half mirror and is divided into reflected light path and refraction light
Road, the reflected mirror one of reflected light path reflects to form emergent light one again after reflecting through half-reflecting half mirror, the reflected mirror two of refractive light paths
Reflect to form emergent light two through half-reflecting half mirror again after reflection, constitute coherent light emergent light one and emergent light two collect after pass through by
Light hole is projected.
A kind of long distance laser interference chi of the present invention, the left and right sides of the main casing is worn respectively is connected to left sleeve and right set
Worn respectively on cylinder, the left shell and right shell body and be connected to left insertion tube and right insertion tube, left insertion tube and right insertion tube insert left sleeve respectively
In right sleeve.
Laser range finder and CCD modules, institute are also equipped with a kind of long distance laser interference chi of the present invention, the main casing
State and processor is also equipped with main casing.
A kind of long distance laser interferes the measuring method of chi, and measuring method long distance laser interference chi shines interference fringe
Penetrate on measured object, the picture of interference fringe is obtained using CCD modules, through carrying out image procossing in processor, obtain interference bar
The bar number of line；Long distance laser is obtained by laser range finder and interferes the distance between chi and measured object, with reference to lasing light emitter and instead
The spacing penetrated between mirror two, and the optical maser wavelength information that lasing light emitter is sent, processor are calculated between adjacent interference fringe
Spacing, pass through the bar number of the spacing and interference fringe, you can draw the height or length of measured object.
Compared with prior art, the beneficial effects of the invention are as follows：
The present invention realizes the dimensional measurement to measured object, the small essence of convenient to use and measurement error using interference fringe
Degree is high, and using that can realize fast automatic calculating after processor, also may be used from without the personnel Jing Guo professional technique training
It is convenient to use；Which is not in the case where night etc. sees simultaneously, and interference fringe becomes apparent on the contrary, therefore it is applicable model
Enclose wider.
Brief description of the drawings
Fig. 1 interferes the structural representation of chi for a kind of long distance laser of the invention.
Fig. 2 is a kind of main casing, left shell and the right shell body of long distance laser interference chi of the invention under section view state
Structure diagram.
Wherein：
Main casing 1, left shell 2, right shell body 3, lasing light emitter 4, speculum 1, half-reflecting half mirror 6, speculum 27, laser
Rangefinder 8, CCD modules 9, processor 10；
Light hole 1.1, left sleeve 1.2, right sleeve 1.3；
Left insertion tube 2.1, right insertion tube 3.1.
Embodiment
Referring to Fig. 1 and Fig. 2, a kind of long distance laser interference chi of the present invention, the long distance laser interferes chi bag
Containing main casing 1, the front end of the main casing 1 is provided with light hole 1.1, and the front end left and right sides of the main casing 1 symmetrically connects
Left shell 2 and right shell body 3 are connected to, concretely, the left and right sides of the main casing 1 is worn respectively is connected to left sleeve 1.2 and right set
Worn respectively on cylinder 1.3, the left shell 2 and right shell body 3 and be connected to left insertion tube 2.1 and right insertion tube 3.1, left insertion tube 2.1 and right insertion tube
3.1 insert in left sleeve 1.2 and right sleeve 1.3 respectively；
It is provided with the left shell 2 in lasing light emitter 4, the main casing 1 and speculum 1 and half-reflecting half mirror 6 is installed,
It is divided into reflected light path after speculum 27, the laser light incident that lasing light emitter 4 is sent to half-reflecting half mirror 6 are installed in the right shell body 3
And refractive light paths, form emergent light one, refractive light paths through the refraction of half-reflecting half mirror 6 again after the reflected reflection of mirror 1 of reflected light path
Reflected mirror 27 reflects to form emergent light two through half-reflecting half mirror 6 again after reflecting, and constitutes the emergent light one and emergent light of coherent light
Two collect after through being projected by light hole 1.1；
Further, it is also equipped with also pacifying in laser range finder 8 and CCD modules 9, the main casing 1 on the main casing 1
Equipped with processor 10；
A kind of long distance laser interferes the measuring method of chi, and interference fringe is radiated at by it using long distance laser interference chi
On measured object, the picture of interference fringe is obtained using CCD modules 9, through carrying out image procossing in processor 10, interference bar is obtained
The bar number of line；Long distance laser is obtained by laser range finder 8 and interferes the distance between chi and measured object, with reference to the He of lasing light emitter 4
Spacing between speculum 27, and the optical maser wavelength information that lasing light emitter 4 is sent, processor 10 calculate adjacent interference bar
Spacing between line, passes through the bar number of the spacing and interference fringe, you can draw the height or length of measured object；
In addition：It should be noted that above-mentioned embodiment is only a prioritization scheme of this patent, the skill of this area
Any change or improvement that art personnel are done according to above-mentioned design, within the protection domain of this patent.
Claims (2)
1. a kind of long distance laser interferes the measuring method of chi, it is characterised in that：The measuring method utilizes a kind of long distance laser
Interference fringe is radiated on measured object by interference chi, and the long distance laser interference chi includes main casing（1）, the main casing
（1）Front end be provided with light hole（1.1）, the main casing（1）The front end left and right sides be symmetrically connected with left shell（2）And the right side
Housing（3）,
The left shell（2）Lasing light emitter is inside installed（4）, the main casing（1）Speculum one is inside installed（5）And half-reflection and half-transmission
Mirror（6）, the right shell body（3）Speculum two is inside installed（7）, lasing light emitter（4）The laser light incident sent is to half-reflecting half mirror（6）
After be divided into reflected light path and refractive light paths, the reflected mirror one of reflected light path（5）Again through half-reflecting half mirror after reflection（6）Refraction is formed
Emergent light one, the reflected mirror two of refractive light paths（7）Again through half-reflecting half mirror after reflection（6）Emergent light two is reflected to form, phase is constituted
The emergent light one and emergent light two of dry light are passed through by light hole after collecting（1.1）Project；The main casing（1）On be also equipped with laser
Rangefinder（8）With CCD modules（9）, the main casing（1）Inside it is also equipped with processor（10）, utilize CCD modules（9）Obtain dry
The picture of striped is related to, through processor（10）Interior carry out image procossing, obtains the bar number of interference fringe；Pass through laser range finder（8）
The distance between long distance laser interference chi and measured object are obtained, with reference to lasing light emitter（4）With speculum two（7）Between spacing,
And lasing light emitter（4）The optical maser wavelength information sent, processor（10 ）The spacing between adjacent interference fringe is calculated, is led to
Cross the bar number of the spacing and interference fringe, you can draw the height or length of measured object.
2. a kind of long distance laser interferes the measuring method of chi as claimed in claim 1, it is characterised in that：The main casing（1）
The left and right sides wear be connected to left sleeve respectively（1.2）With right sleeve（1.3）, the left shell（2）And right shell body（3）It is upper to wear respectively
It is connected to left insertion tube（2.1）With right insertion tube（3.1）, left insertion tube（2.1）With right insertion tube（3.1）Left sleeve is inserted respectively（1.2）And the right side
Sleeve（1.3）It is interior.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510389515.XA CN105043268B (en) | 2015-07-06 | 2015-07-06 | Long distance laser interferes chi and its measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510389515.XA CN105043268B (en) | 2015-07-06 | 2015-07-06 | Long distance laser interferes chi and its measuring method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105043268A CN105043268A (en) | 2015-11-11 |
| CN105043268B true CN105043268B (en) | 2017-11-03 |
Family
ID=54450008
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510389515.XA Expired - Fee Related CN105043268B (en) | 2015-07-06 | 2015-07-06 | Long distance laser interferes chi and its measuring method |
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| Country | Link |
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| CN (1) | CN105043268B (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1056930A (en) * | 1991-05-08 | 1991-12-11 | 中国科学院工程热物理研究所 | Process for measuring on line length by laser microcomputer and device |
| US5361308A (en) * | 1992-01-10 | 1994-11-01 | General Motors Corporation | 3-D measurement of cutting tool wear |
| CN1275712A (en) * | 1999-05-27 | 2000-12-06 | 中国科学院光电技术研究所 | Laser interference length-measuring method |
| CN1831897A (en) * | 2006-04-10 | 2006-09-13 | 四川大学 | Integral semiconductor laser Michelson interferometer |
| CN1837756A (en) * | 2006-04-25 | 2006-09-27 | 中国地质大学（武汉） | Laser-interfering measurement device |
| CN101046376A (en) * | 2006-03-29 | 2007-10-03 | 刘雁 | Fast building height measuring process |
| CN104280020A (en) * | 2014-10-25 | 2015-01-14 | 中国二十二冶集团有限公司 | Method for measuring perpendicularity of vertical building |
| CN204757923U (en) * | 2015-07-06 | 2015-11-11 | 张泽宇 | Remote laser Interferometer chi |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08219722A (en) * | 1995-02-17 | 1996-08-30 | Tokyo Seimitsu Co Ltd | Method and apparatus for measuring bump height |
-
2015
- 2015-07-06 CN CN201510389515.XA patent/CN105043268B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1056930A (en) * | 1991-05-08 | 1991-12-11 | 中国科学院工程热物理研究所 | Process for measuring on line length by laser microcomputer and device |
| US5361308A (en) * | 1992-01-10 | 1994-11-01 | General Motors Corporation | 3-D measurement of cutting tool wear |
| CN1275712A (en) * | 1999-05-27 | 2000-12-06 | 中国科学院光电技术研究所 | Laser interference length-measuring method |
| CN101046376A (en) * | 2006-03-29 | 2007-10-03 | 刘雁 | Fast building height measuring process |
| CN1831897A (en) * | 2006-04-10 | 2006-09-13 | 四川大学 | Integral semiconductor laser Michelson interferometer |
| CN1837756A (en) * | 2006-04-25 | 2006-09-27 | 中国地质大学（武汉） | Laser-interfering measurement device |
| CN104280020A (en) * | 2014-10-25 | 2015-01-14 | 中国二十二冶集团有限公司 | Method for measuring perpendicularity of vertical building |
| CN204757923U (en) * | 2015-07-06 | 2015-11-11 | 张泽宇 | Remote laser Interferometer chi |
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| Publication number | Publication date |
|---|---|
| CN105043268A (en) | 2015-11-11 |
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