CN105043268A - Long-distance laser interference scale and measuring method - Google Patents
Long-distance laser interference scale and measuring method Download PDFInfo
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- CN105043268A CN105043268A CN201510389515.XA CN201510389515A CN105043268A CN 105043268 A CN105043268 A CN 105043268A CN 201510389515 A CN201510389515 A CN 201510389515A CN 105043268 A CN105043268 A CN 105043268A
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- main casing
- light
- chi
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- catoptron
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Abstract
The invention relates to a long-distance laser interference scale and a measuring method. The long-distance laser interference scale comprises a main shell (1), of which the front end is provided with light exit holes (1, 1). A left housing (2) and a right housing (3) are symmetrically connected to the left and right sides of the front end of the main shell (1), and a laser source (4) is installed in the left housing (2). A first reflector (5) and a semi-reflective semitransparent mirror (6) are installed in the main shell (1), and a second reflector (7) is installed in the right housing (3). The measurement is rapid and accurate, and the application scope is wide.
Description
Technical field
The present invention relates to a kind of long distance laser and interfere chi and measuring method thereof, belong to optical gauge technical field.
Background technology
At present, for the height of buildings, width etc. measure many employing trigonometric function computing method, as Chinese patent application 200610065882.5 disclosed " a kind of fast building height measuring process ", disclosed 201410575353.4 " measuring method of vertical buildings verticality ", need in these measuring methods to measure current measurement point and the air line distance measuring thing, and line between current measurement point and measurement thing peak and the angle between surface level, thus utilize trigonometric function to measure depth of building, which wastes time and energy, inefficiency, and need professional to operate professional apparatus just to carry out, its scope of application is less.
Summary of the invention
The object of the invention is to overcome above-mentioned deficiency, provide a kind of and measure long distance laser interference chi accurate and applied widely fast and measuring method thereof.
The object of the present invention is achieved like this:
A kind of long distance laser interferes chi, and described long distance laser interferes chi to include main casing, and the front end of described main casing is provided with light hole, and the left and right sides, front end of described main casing is symmetrically connected with left shell and right shell body;
In described left shell, lasing light emitter is installed, catoptron one and half-reflecting half mirror are installed in described main casing, catoptron two is installed in described right shell body, the laser that lasing light emitter sends is divided into reflected light path and refractive light paths after being incident to half-reflecting half mirror, reflected light path forms emergent light one through half-reflecting half mirror refraction again after catoptron one reflects, refractive light paths reflects to form emergent light two through half-reflecting half mirror again after catoptron two reflects, through being penetrated by light hole after the emergent light one of formation coherent light and emergent light two gather.
A kind of long distance laser of the present invention interferes chi, and there are left sleeve and right sleeve in the left and right sides of described main casing respectively cross-under, and on described left shell and right shell body, cross-under has left insertion tube and right insertion tube respectively, and left insertion tube and right insertion tube are inserted in left sleeve and right sleeve respectively.
A kind of long distance laser of the present invention interferes chi, described main casing is also provided with laser range finder and CCD module, is also provided with processor in described main casing.
Long distance laser interferes a measuring method for chi, and this measuring method long distance laser interferes chi to be radiated on measured object by interference fringe, utilizes CCD module to obtain the picture of interference fringe, carries out image procossing in treated device, obtain the number of interference fringe; The distance between long distance laser interference chi and measured object is obtained by laser range finder, in conjunction with the spacing between lasing light emitter and catoptron two, and the optical maser wavelength information that lasing light emitter sends, processor calculates the spacing between adjacent interference fringe, by the number of this spacing and interference fringe, height or the length of measured object can be drawn.
Compared with prior art, the invention has the beneficial effects as follows:
The present invention utilizes interference fringe to realize the dimensional measurement to measured object, and the little precision of convenient to use and measuring error is high, and can realize fast automatic calculating after adopting processor, thus also can not be convenient to use through the personnel of professional technique training; Which is not when seeing night etc. simultaneously, and interference fringe is more obvious on the contrary, and therefore its scope of application is wider.
Accompanying drawing explanation
Fig. 1 is the structural representation that a kind of long distance laser of the present invention interferes chi.
Fig. 2 is that a kind of long distance laser of the present invention interferes the main casing of chi, left shell and right shell body analysing and observe the structure diagram under state.
Wherein:
Main casing 1, left shell 2, right shell body 3, lasing light emitter 4, catoptron 1, half-reflecting half mirror 6, catoptron 27, laser range finder 8, CCD module 9, processor 10;
Light hole 1.1, left sleeve 1.2, right sleeve 1.3;
Left insertion tube 2.1, right insertion tube 3.1.
Embodiment
See Fig. 1 and Fig. 2, a kind of long distance laser that the present invention relates to interferes chi, described long distance laser interferes chi to include main casing 1, the front end of described main casing 1 is provided with light hole 1.1, the left and right sides, front end of described main casing 1 is symmetrically connected with left shell 2 and right shell body 3, concretely, there are left sleeve 1.2 and right sleeve 1.3 in the left and right sides of described main casing 1 respectively cross-under, on described left shell 2 and right shell body 3, cross-under has left insertion tube 2.1 and right insertion tube 3.1 respectively, and left insertion tube 2.1 and right insertion tube 3.1 are inserted in left sleeve 1.2 and right sleeve 1.3 respectively;
In described left shell 2, lasing light emitter 4 is installed, catoptron 1 and half-reflecting half mirror 6 are installed in described main casing 1, in described right shell body 3, catoptron 27 is installed, the laser that lasing light emitter 4 sends is divided into reflected light path and refractive light paths after being incident to half-reflecting half mirror 6, reflected light path reflects through half-reflecting half mirror 6 again and forms emergent light one after catoptron 1 reflects, refractive light paths reflects to form emergent light two through half-reflecting half mirror 6 again after catoptron 27 reflects, through being penetrated by light hole 1.1 after the emergent light one of formation coherent light and emergent light two gather;
Further, described main casing 1 is also provided with laser range finder 8 and CCD module 9, in described main casing 1, processor 10 is also installed;
Long distance laser interferes a measuring method for chi, and it utilizes long distance laser to interfere chi to be radiated on measured object by interference fringe, utilizes CCD module 9 to obtain the picture of interference fringe, carries out image procossing in treated device 10, obtain the number of interference fringe; The distance between long distance laser interference chi and measured object is obtained by laser range finder 8, in conjunction with the spacing between lasing light emitter 4 and catoptron 27, and the optical maser wavelength information that lasing light emitter 4 sends, processor 10 calculates the spacing between adjacent interference fringe, by the number of this spacing and interference fringe, height or the length of measured object can be drawn;
In addition: it should be noted that above-mentioned embodiment is only a prioritization scheme of this patent, any change that those skilled in the art does according to above-mentioned design or improvement, all within the protection domain of this patent.
Claims (5)
1. a long distance laser interferes chi, it is characterized in that: described long distance laser interferes chi to include main casing (1), the front end of described main casing (1) is provided with light hole (1.1), and the left and right sides, front end of described main casing (1) is symmetrically connected with left shell (2) and right shell body (3)
Lasing light emitter (4) is installed in described left shell (2), catoptron one (5) and half-reflecting half mirror (6) are installed in described main casing (1), catoptron two (7) is installed in described right shell body (3), the laser that lasing light emitter (4) sends is divided into reflected light path and refractive light paths after being incident to half-reflecting half mirror (6), reflected light path forms emergent light one through half-reflecting half mirror (6) refraction again after catoptron one (5) reflects, refractive light paths reflects to form emergent light two through half-reflecting half mirror (6) again after catoptron two (7) reflects, through being penetrated by light hole (1.1) after the emergent light one of formation coherent light and emergent light two gather.
2. a kind of long distance laser interferes chi as claimed in claim 1, it is characterized in that: there are left sleeve (1.2) and right sleeve (1.3) in the left and right sides of described main casing (1) respectively cross-under, on described left shell (2) and right shell body (3), cross-under has left insertion tube (2.1) and right insertion tube (3.1) respectively, and left insertion tube (2.1) and right insertion tube (3.1) are inserted in left sleeve (1.2) and right sleeve (1.3) respectively.
3. a kind of long distance laser interferes chi as claimed in claim 1 or 2, it is characterized in that: described main casing (1) is also provided with laser range finder (8) and CCD module (9), is also provided with processor (10) in described main casing (1).
4. the measuring method of a long distance laser interference chi, it is characterized in that: this measuring method utilizes a kind of long distance laser to interfere chi to be radiated on measured object by interference fringe, described long distance laser interferes chi to include main casing (1), the front end of described main casing (1) is provided with light hole (1.1), the left and right sides, front end of described main casing (1) is symmetrically connected with left shell (2) and right shell body (3)
Lasing light emitter (4) is installed in described left shell (2), catoptron one (5) and half-reflecting half mirror (6) are installed in described main casing (1), catoptron two (7) is installed in described right shell body (3), the laser that lasing light emitter (4) sends is divided into reflected light path and refractive light paths after being incident to half-reflecting half mirror (6), reflected light path forms emergent light one through half-reflecting half mirror (6) refraction again after catoptron one (5) reflects, refractive light paths reflects to form emergent light two through half-reflecting half mirror (6) again after catoptron two (7) reflects, through being penetrated by light hole (1.1) after the emergent light one of formation coherent light and emergent light two gather, described main casing (1) is also provided with laser range finder (8) and CCD module (9), processor (10) is also installed in described main casing (1), utilize CCD module (9) to obtain the picture of interference fringe, treated device carries out image procossing in (10), obtains the number of interference fringe, the distance between long distance laser interference chi and measured object is obtained by laser range finder (8), in conjunction with the spacing between lasing light emitter (4) and catoptron two (7), and the optical maser wavelength information that lasing light emitter (4) sends, processor (10) calculates the spacing between adjacent interference fringe, by the number of this spacing and interference fringe, height or the length of measured object can be drawn.
5. a kind of long distance laser interferes the measuring method of chi as claimed in claim 4, it is characterized in that: there are left sleeve (1.2) and right sleeve (1.3) in the left and right sides of described main casing (1) respectively cross-under, on described left shell (2) and right shell body (3), cross-under has left insertion tube (2.1) and right insertion tube (3.1) respectively, and left insertion tube (2.1) and right insertion tube (3.1) are inserted in left sleeve (1.2) and right sleeve (1.3) respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510389515.XA CN105043268B (en) | 2015-07-06 | 2015-07-06 | Long distance laser interferes chi and its measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510389515.XA CN105043268B (en) | 2015-07-06 | 2015-07-06 | Long distance laser interferes chi and its measuring method |
Publications (2)
| Publication Number | Publication Date |
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| CN105043268A true CN105043268A (en) | 2015-11-11 |
| CN105043268B CN105043268B (en) | 2017-11-03 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510389515.XA Expired - Fee Related CN105043268B (en) | 2015-07-06 | 2015-07-06 | Long distance laser interferes chi and its measuring method |
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Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1056930A (en) * | 1991-05-08 | 1991-12-11 | 中国科学院工程热物理研究所 | Process for measuring on line length by laser microcomputer and device |
| US5361308A (en) * | 1992-01-10 | 1994-11-01 | General Motors Corporation | 3-D measurement of cutting tool wear |
| JPH08219722A (en) * | 1995-02-17 | 1996-08-30 | Tokyo Seimitsu Co Ltd | Method and apparatus for measuring bump height |
| CN1275712A (en) * | 1999-05-27 | 2000-12-06 | 中国科学院光电技术研究所 | Laser interference length-measuring method |
| CN1831897A (en) * | 2006-04-10 | 2006-09-13 | 四川大学 | Integral semiconductor laser Michelson interferometer |
| CN1837756A (en) * | 2006-04-25 | 2006-09-27 | 中国地质大学（武汉） | Laser-interfering measurement device |
| CN101046376A (en) * | 2006-03-29 | 2007-10-03 | 刘雁 | Fast building height measuring process |
| CN104280020A (en) * | 2014-10-25 | 2015-01-14 | 中国二十二冶集团有限公司 | Method for measuring perpendicularity of vertical building |
| CN204757923U (en) * | 2015-07-06 | 2015-11-11 | 张泽宇 | Remote laser Interferometer chi |
-
2015
- 2015-07-06 CN CN201510389515.XA patent/CN105043268B/en not_active Expired - Fee Related
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1056930A (en) * | 1991-05-08 | 1991-12-11 | 中国科学院工程热物理研究所 | Process for measuring on line length by laser microcomputer and device |
| US5361308A (en) * | 1992-01-10 | 1994-11-01 | General Motors Corporation | 3-D measurement of cutting tool wear |
| JPH08219722A (en) * | 1995-02-17 | 1996-08-30 | Tokyo Seimitsu Co Ltd | Method and apparatus for measuring bump height |
| CN1275712A (en) * | 1999-05-27 | 2000-12-06 | 中国科学院光电技术研究所 | Laser interference length-measuring method |
| CN101046376A (en) * | 2006-03-29 | 2007-10-03 | 刘雁 | Fast building height measuring process |
| CN1831897A (en) * | 2006-04-10 | 2006-09-13 | 四川大学 | Integral semiconductor laser Michelson interferometer |
| CN1837756A (en) * | 2006-04-25 | 2006-09-27 | 中国地质大学（武汉） | Laser-interfering measurement device |
| CN104280020A (en) * | 2014-10-25 | 2015-01-14 | 中国二十二冶集团有限公司 | Method for measuring perpendicularity of vertical building |
| CN204757923U (en) * | 2015-07-06 | 2015-11-11 | 张泽宇 | Remote laser Interferometer chi |
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| CN105043268B (en) | 2017-11-03 |
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Granted publication date: 20171103 Termination date: 20180706 |