CN105021848A - General test device - Google Patents
General test device Download PDFInfo
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- CN105021848A CN105021848A CN201410153404.4A CN201410153404A CN105021848A CN 105021848 A CN105021848 A CN 105021848A CN 201410153404 A CN201410153404 A CN 201410153404A CN 105021848 A CN105021848 A CN 105021848A
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- determinand
- test device
- carrier
- briquetting
- positioning piece
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- Testing Of Individual Semiconductor Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
A general test device is used for testing an object to be tested. The general test device comprises a bearing disc, a pressurized head and a plurality of elastic positioning components. The bearing disc is provided with a test groove. A probe is arranged in the test groove. The pressurized head is movably arranged on the bearing disc and possesses a briquetting. The briquetting can be close to the test groove along with movement of the pressurized head and exert pressure on the object to be tested. The elastic positioning components are arranged on the bearing disc, surround and are close to an outer periphery of the test groove. Therefore, because of the elastic positioning components, the object to be tested with a thin thickness is not easy to be influenced by an outer force so as to be out of the test groove. And during a test process, the elastic positioning components do not influence the briquetting to push against the object to be tested. The briquetting does not need to be designed individually and can be used generally so that usage is convenient.
Description
Technical field
The present invention relates to a kind of proving installation, be specifically related to a kind of structural improvement of proving installation, it, for testing and installing several flexible positioning pieces additional near the test trough of fixing determinand, helps the position of location determinand.
Background technology
Traditional survey is chosen a place to give a banquet, and please refer to Fig. 1, and wherein, the central authorities of carrier 71 are provided with test trough 72, and with accommodating determinand 73, the bottom of test trough 72 is provided with several probes 74, and the degree of depth of test trough 72 is suitable with the thickness of determinand 73 haply.Therefore, when performing a test, pressurizing block 75 downwards force promotes determinand 73, and the pin of determinand 73 (not shown) is electrically connected with the probe 74 of test trough 72, thus whether carry out every test to determinand 73 and test determinand 73 can normal operation.But, along with the development of encapsulation technology, increasing determinand, particularly the thickness of system in package (System in Package, SiP) module is more and more thinner, therefore, when testing, the degree of depth of test trough 72 is correspondingly designed to be more and more thinner, makes determinand 73 location difficulty, is easy to the impact because being subject to external force and runs out of outside test trough 72.
In order to prevent the problems referred to above from occurring, a kind of method is that the degree of depth increasing test trough 72 is run out of outside test trough 72 to prevent determinand 73, please refer to Fig. 2.So, in order to pressurizing block 75 can be allowed can to promote downwards determinand 73 smoothly, determinand 73 can be electrically connected with probe 74, the size of pressurizing block 75 not only must be also less than test trough 72, simultaneously in order to prevent determinand 73 from occurring the problem of excessively exerting pressure, the dimension and weight of pressurizing block 75 needs special design and cannot one size fits all especially, so very inconvenient.
Summary of the invention
In view of this, fundamental purpose of the present invention is to provide a kind of proving installation, accurately can locate the determinand of thinner thickness, and its for determinand is executed stressed briquetting can one size fits all in the determinand of different size, add the convenience in use.
To achieve these goals, the invention provides a kind of universal test device, for testing determinand, above-mentioned universal test device includes carrier, polishing head and multiple flexible positioning piece.Wherein, the central fovea of carrier is provided with test trough, and test trough is provided with at least one probe; Polishing head, the mode of movement can be arranged at the top of carrier, can move at pressing position and leaving between position, with respectively near or away from test trough, and the surface of polishing head is connected with briquetting, to apply pressure to determinand; Multiple flexible positioning piece is arranged at carrier, and around and press close to the outer peripheral edges of test trough.
Thus, the flexible positioning piece being arranged at test trough outer peripheral edges can help to locate determinand, even if the thinner thickness of determinand, determinand is also not easily because running out of outside test trough by the impact of external force or moving of carrier.
Accompanying drawing explanation
Fig. 1 is the use schematic diagram of conventional a kind of packaging and testing device.
Fig. 2 is the use schematic diagram of conventional another kind of packaging and testing device.
Fig. 3 is the side view of the universal test device of present pre-ferred embodiments.
Fig. 4 is the stereographic map of the carrier in present pre-ferred embodiments.
Fig. 5 is the cut-open view of carrier along 5-5 Section line of Fig. 4.
(symbol description)
1 universal test device
10 carriers
11 test trough
12 base plates
13 sidewalls
14 accommodation spaces
15 probes
16 mounting holes
20 polishing heads
21 briquettings
30 flexible positioning pieces
31 heads
32 springs
40 web members
71 carriers
72 test trough
73 determinands
74 probes
75 pressurizing block
Embodiment
In order to feature place of the present invention more can be understood, the invention provides a preferred embodiment, and accompanying drawings is as follows, please refer to Fig. 3 to Fig. 5.
Universal test device 1 of the present invention is for testing determinand, determinand is SiP module (System in Package, system-in-package module) in the present embodiment, it also can be S oC module (System on Chip, System on Chip/SoC) or other forms of determinand, and is not limited with the present embodiment.The primary clustering of universal test device 1 of the present invention includes carrier 10, polishing head 20 and multiple flexible positioning piece 30 (be six at the present embodiment), and details are as follows for the structure of each assembly and mutual relation.
Please refer to Fig. 4, the central fovea of carrier 10 is provided with base plate 12, and the surrounding of base plate 12 end face is equipped with sidewall 13 makes its inside be formed with accommodation space 14.The central authorities of base plate 12 are also arranged with test trough 11, and the bottom of test trough 11 is provided with several probes 15, for carrying out every test to determinand.In addition, base plate 12 is also arranged with six mounting holes 16, these six mounting holes 16 around and be arranged in the outer peripheral edges of test trough 11 closely.In other embodiments, test trough also can recessed other positions at base plate 12, do not limit recessed in the central authorities of base plate 12.
Polishing head 20 be oppositely arranged on carrier 10 top and with one end pivoted linkage 40, and as shown in Figure 3, web member 40 is connected with carrier 10, and polishing head 20 can be moved at pressing position and leaving between position, with respectively near or away from test trough 11.In addition, the surface of polishing head 20 is connected with briquetting 21, and when polishing head 20 pivot pendulum is to pressing position, briquetting 21 can enter accommodation space 14 with polishing head 20.
Please refer to Fig. 5, above-mentioned six flexible positioning pieces 30 are placed in above-mentioned six mounting holes 16 separately, and each flexible positioning piece 30 all comprises head 31 and spring 32, and the two ends of spring 32 support the bottom of mounting hole 16 and the bottom of head 31 respectively.Head 31 is for supporting briquetting 21, and when head 31 do not supported by briquetting 21, head 31 has at least a part can protrude from outside mounting hole 16.In addition, be less than the area for executing stressed surface to determinand of briquetting 21 around the area formed by each flexible positioning piece 30.
Use, when testing, first determinand is placed into the top of test trough 11, pivotable polishing head 20 makes it from leaving position pivot pendulum to pressing position more afterwards.Now, briquetting 21 can enter accommodation space 14 and support above-mentioned each flexible positioning piece 30 and determinand downwards, briquetting 21 can elasticity of compression keeper 30 and head 31 is submerged mounting hole 16, and promotes determinand and its pin is contacted with probe 15, to carry out every test of determinand.Because above-mentioned each flexible positioning piece 30 is arranged at the place of test trough 11 outer peripheral edges, and, the head 31 of each flexible positioning piece 30 all has at least a part to protrude from outside mounting hole 16 when not applying pressure, thus played good locating effect, therefore, even if the thinner thickness of determinand to be measured, determinand is also not easily because being subject to the impact of external force or moving of carrier 10 and running out of outside test trough 11 and to leave the top of test trough 11.
On the other hand, in the middle of whole test process, briquetting 21 is when pressing down, and determinand and flexible positioning piece 30 can be subject to compressing and moving down simultaneously of briquetting 21, until briquetting 21 abuts against in base plate 12 and stops, therefore can not there is briquetting 21 and excessively to exert pressure the problem of determinand.And now flexible positioning piece 30, because submerging in mounting hole 16 completely, more can not have influence on briquetting 21 and compress determinand, therefore for the determinand of different-thickness, briquetting 21 is the energy one size fits all without the need to Separate designs all, can reach object easy to use.
It should be noted that, those skilled in the art can increase and decrease the magnitude setting of flexible positioning piece 30 or change arrangement position according to actual needs.And polishing head 20 also can change into its one end directly with carrier 10 pivot joint, or change other drive unit (not shown) of use into and drive polishing head 20, make it move up and down at pressing position and leaving between position.
Finally, what must again illustrate is, constituent components disclosed by the present invention is in the aforementioned embodiment only and illustrates, not be used for limiting the scope of the invention, the every structure that other is easily expected change, or with the alternate variation of other equivalence elements, also should contain by claim of the present invention.
Claims (7)
1. a universal test device, for testing determinand, described universal test device includes:
Carrier, described carrier is arranged with test trough, and described test trough is provided with multiple probe;
Polishing head, it is the mode of movement can be arranged at the top of described carrier, can pressing position and leave between position mobile with respectively near or away from described test trough, the surface of described polishing head is connected with briquetting, to apply pressure to described determinand;
Multiple flexible positioning piece, it is arranged at described carrier, and around and press close to the outer peripheral edges of described test trough, for locating described determinand.
2. universal test device as claimed in claim 1, is characterized in that,
Described carrier is also arranged with multiple mounting hole, and each described flexible positioning piece is placed in each described mounting hole respectively.
3. universal test device as claimed in claim 2, is characterized in that,
Each described flexible positioning piece has head and spring respectively, the two ends of each described spring support the bottom of described mounting hole and the bottom of described head respectively, and the head of each described flexible positioning piece has at least a part to protrude from outside described mounting hole when not applying pressure.
4. universal test device as claimed in claim 1, is characterized in that,
Also comprise web member, described polishing head is with web member described in its one end pivot joint, and described web member is connected with described carrier.
5. universal test device as claimed in claim 1, it is characterized in that, described polishing head is with carrier described in its one end pivot joint.
6. universal test device as claimed in claim 1, it is characterized in that, each described probe is arranged at the bottom surface of described test trough.
7. universal test device as claimed in claim 1, is characterized in that,
Being greater than by each described flexible positioning piece around the area formed for the area described determinand being executed to stressed surface of described briquetting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410153404.4A CN105021848B (en) | 2014-04-17 | 2014-04-17 | Universal test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410153404.4A CN105021848B (en) | 2014-04-17 | 2014-04-17 | Universal test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105021848A true CN105021848A (en) | 2015-11-04 |
| CN105021848B CN105021848B (en) | 2018-06-19 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410153404.4A Active CN105021848B (en) | 2014-04-17 | 2014-04-17 | Universal test device |
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| Country | Link |
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| CN (1) | CN105021848B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109196364A (en) * | 2018-08-31 | 2019-01-11 | 深圳市汇顶科技股份有限公司 | A kind of chuck device |
| CN110967531A (en) * | 2019-11-25 | 2020-04-07 | 国网山东省电力公司滨州市沾化区供电公司 | Electric power operation and maintenance tool detection frame |
| CN111342910A (en) * | 2020-03-02 | 2020-06-26 | 瑞声精密制造科技(常州)有限公司 | Transmission line testing device |
| CN117368545A (en) * | 2023-12-05 | 2024-01-09 | 苏州微飞半导体有限公司 | Plug-injection type conductive adhesive testing module |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6086387A (en) * | 1998-05-14 | 2000-07-11 | International Business Machines Corporation | Cover assembly for a socket adaptable to IC modules of varying thickness used for burn-in testing |
| CN2881650Y (en) * | 2005-12-28 | 2007-03-21 | 宏连国际科技股份有限公司 | Testing apparatus |
| CN200962120Y (en) * | 2006-10-16 | 2007-10-17 | 宏连国际科技股份有限公司 | Test instrument |
| CN101131399A (en) * | 2006-08-21 | 2008-02-27 | 雅马哈株式会社 | Test chip socket |
| CN201096804Y (en) * | 2007-07-10 | 2008-08-06 | 翔宏兴业有限公司 | Chip testing device |
| CN202033387U (en) * | 2011-03-21 | 2011-11-09 | 沁业科技有限公司 | Chip clip structure |
| CN203117232U (en) * | 2013-03-13 | 2013-08-07 | 浦创电子科技（苏州）有限公司 | Novel integrated circuit (IC) simple testing seat |
-
2014
- 2014-04-17 CN CN201410153404.4A patent/CN105021848B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6086387A (en) * | 1998-05-14 | 2000-07-11 | International Business Machines Corporation | Cover assembly for a socket adaptable to IC modules of varying thickness used for burn-in testing |
| CN2881650Y (en) * | 2005-12-28 | 2007-03-21 | 宏连国际科技股份有限公司 | Testing apparatus |
| CN101131399A (en) * | 2006-08-21 | 2008-02-27 | 雅马哈株式会社 | Test chip socket |
| CN200962120Y (en) * | 2006-10-16 | 2007-10-17 | 宏连国际科技股份有限公司 | Test instrument |
| CN201096804Y (en) * | 2007-07-10 | 2008-08-06 | 翔宏兴业有限公司 | Chip testing device |
| CN202033387U (en) * | 2011-03-21 | 2011-11-09 | 沁业科技有限公司 | Chip clip structure |
| CN203117232U (en) * | 2013-03-13 | 2013-08-07 | 浦创电子科技（苏州）有限公司 | Novel integrated circuit (IC) simple testing seat |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109196364A (en) * | 2018-08-31 | 2019-01-11 | 深圳市汇顶科技股份有限公司 | A kind of chuck device |
| CN110967531A (en) * | 2019-11-25 | 2020-04-07 | 国网山东省电力公司滨州市沾化区供电公司 | Electric power operation and maintenance tool detection frame |
| CN110967531B (en) * | 2019-11-25 | 2022-09-20 | 国网山东省电力公司滨州市沾化区供电公司 | Electric power operation and maintenance tool detection frame |
| CN111342910A (en) * | 2020-03-02 | 2020-06-26 | 瑞声精密制造科技(常州)有限公司 | Transmission line testing device |
| CN111342910B (en) * | 2020-03-02 | 2021-06-11 | 瑞声精密制造科技(常州)有限公司 | Transmission line testing device |
| CN117368545A (en) * | 2023-12-05 | 2024-01-09 | 苏州微飞半导体有限公司 | Plug-injection type conductive adhesive testing module |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105021848B (en) | 2018-06-19 |
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