CN104917563B - Optical module high/low temperature test system - Google Patents
Optical module high/low temperature test system Download PDFInfo
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- CN104917563B CN104917563B CN201510231035.0A CN201510231035A CN104917563B CN 104917563 B CN104917563 B CN 104917563B CN 201510231035 A CN201510231035 A CN 201510231035A CN 104917563 B CN104917563 B CN 104917563B
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Abstract
The invention belongs to optical communication field, and in particular to a kind of optical module test system.Propose a kind of optical module high/low temperature test system, including testboard, test gate and casing, testboard and test gate fixing assembling, it is placed in casing, test gate is assembled with box sealing, it is provided with to offer in gathering hole, the casing at the position just to optical module test cell on optical module test cell, the test gate on the testboard and is provided with temperature control system and refrigeration system.Present invention design is succinct, cost is low, compatibility XFP and SFP/SFP+ high/low temperature test simultaneously, in the adjacent position of XFP and SFP test troughs, pre- cold trap is set, precooling in advance, greatlys save the test stand-by period, improves testing efficiency, the bottleneck of optical module low-temperature test is solved, a blank when front optical module high/low temperature test system has been filled up.
Description
Technical field
The invention belongs to optical communication field, and in particular to a kind of optical module test system.
Technical background
The integrated module of optical transceiver（XFP, SFP, SFP+, SFF etc.）It is indispensable core component in Optical Access Network.Light
Receiver-transmitter integrated module（Hereinafter referred to as optical module）It is to realize photoelectricity and electro-optic conversion and drive and receive with independent transmission to amplify
The photonics of circuit, is a kind of to integrate the small-sized powered pluggable of optical transmitting set, optical receiver and drive circuit board
Product.Optical module serves the effect of optical repeater in optical fiber distance communication.The test of optical module is to ensure properties of product
With the premise of quality, can the test that carry out complete and accurate directly determine the quality and cost of product.The test step of optical module
Compare many, including normal temperature preliminary survey, survey eventually, high temperature test, low-temperature test.The high temperature test of current optical module is typically in warm table
Upper to carry out, low-temperature test is completed in cryogenic box body, and conventional low temperature test system is all that module manufacturers carry out changing for tool
Make and form, and the general volume ratio of low temperature casing is larger, inconvenient operation, and a product can only be tested every time, and during due to refrigeration
Between it is long, stand-by period of the module from normal temperature to low-temperature test is also long, probably needs the precooling of 15 minutes, could complete 5 points
The test of clock, testing efficiency is low.There is presently no the high/low temperature test system for being exclusively used in optical module, therefore, the height of optical module
Temperature test is always the bottleneck of optical module production, and the refrigeration plant of in the market is expensive, causes the testing cost of optical module higher.
The content of the invention
For problems of the prior art, the present invention devises a kind of optical module high/low temperature test system, can be achieved
Standard optical module applicable XFP and SFP/SFP+ high/low temperature test, effectively increase testing efficiency, and steady with cost performance height, performance
In fixed reliable, easy to use the advantages of, the production field that can be widely applied to optical module.
To realize above-mentioned mesh, the technical solution adopted by the present invention is：A kind of optical module high/low temperature test system is proposed, including
Testboard, test gate and casing, testboard and test gate fixing assembling, are placed in casing, and test gate is assembled with box sealing,
It is provided with optical module test cell, the test gate and is opened up at the position just to optical module test cell on the testboard
Have in gathering hole, the casing and be provided with temperature control system and refrigeration system.
The testboard is internally provided with refrigeration piping, and refrigeration piping is located at the lower section of optical module test cell, refrigerator pipes
Liquid nitrogen access conduit in the air admission hole connection refrigeration system in road.
The optical module test cell includes XFP test cells and SFP test cells.
The XFP test cells include XFP test troughs and the pre- cold traps of XFP, and SFP test cells include SFP test troughs and SFP
Pre- cold trap.
4 boss are additionally provided with the testboard, screw and test gate fixing assembling is respectively adopted in 4 boss.
The gathering hole has two, respectively XFP gathering holes and SFP gathering holes.
The length of the XFP gathering holes is 80mm, and width is 24mm, and the length of SFP gathering holes is 60mm, and width is
24mm。
The both sides of the testboard are provided with cushion block.
The present invention proposes a kind of inexpensive, efficient optical module high/low temperature test system.Mark is provided with testboard
Quasi-optical module testing unit, can be while the high/low temperature test of compatibility XFP modules and SFP/SFP+ modules, each test cell be all provided with
Adjacent test trough and pre- cold trap are equipped with, while testing an optical module, another optical module to be measured can be entered
Row precooling, just the test of next optical module to be measured can be carried out after the completion of test, substantially reduce the test stand-by period so that surveyed
The time of one product of examination was tapered to 2 minutes by original 20 minutes.As a further improvement, the module testing inside testboard
Refrigeration piping is additionally arranged below unit, liquid nitrogen enters refrigeration piping through liquid nitrogen access conduit, directly test cell can be carried out fast
Speed refrigeration, is conducive to shortening cooling time, improves testing efficiency.
Gathering hole is offered at the position of correspondence test cell on test gate, light-metering module is conveniently treated and is operated.Survey
Test stand is put into casing after being assembled with test gate, and box sizes of the invention are 300mm*270mm*210mm, and small volume can
It is placed directly on desktop and is tested, facilitates and temperature control system and refrigeration system are provided with the operation of tester, casing
System, can be needed to be heated and be freezed according to test, and the temperature in casing is carried out to monitor and control in real time, it is ensured that optical module
High/low temperature test environment.
Present invention design is succinct, and cost is low, while compatibility XFP and SFP/SFP+ high/low temperature test, is surveyed in XFP and SFP
The adjacent position of experimental tank sets pre- cold trap, treats the precooling in advance of light-metering module, greatlys save the test stand-by period, improves test
Efficiency, solves the bottleneck of optical module low-temperature test, has filled up a blank when front optical module high/low temperature test system.
Brief description of the drawings
Fig. 1 is the structural representation of testboard in the present invention；
Fig. 2 is the structural representation of test gate in the present invention；
Fig. 3 is the assembling side view of testboard and test gate in the present invention；
Fig. 4 is the structural representation of casing in the present invention；
Fig. 5 is the structural representation with refrigeration piping testboard in the present invention；
Fig. 6 is the structural representation of refrigeration piping in the present invention,
In figure：The pre- cold traps of 1-XFP, 2-XFP test troughs, the pre- cold traps of 3- SFP, 4- SFP test troughs, 5- cushion blocks, 6- is convex
Platform, 7- lower convex platforms, 8-XFP gathering holes, 9- SFP gathering holes, 10- testboards, 11- test gates, 12- temperature displays, 13- temperature
Spend detector, 14- liquid nitrogen access conduit, 15- refrigeration pipings, 16- air admission holes, 17- ventholes.
Embodiment
The present invention is described in detail below in conjunction with the accompanying drawings：
Embodiment 1
Optical module test cell, optical module test cell bag are provided with optical module testboard as shown in Figure 1, testboard
Include 1 XFP test cell and 1 SFP test cell.XFP units include 1 XFP test trough 2 and the pre- cold traps 1, XFP of 1 XFP
The depth of test trough 2 is 1/2nd of XFP module heights, plus tolerance 2mm scope of its width control system in XFP module widths
It is interior, it is ensured that the contact area of module and test trough is maximum, to reach optimal refrigeration, and can be with circuit intact and above
Plate Molex Interference fit.The width of the pre- cold traps 1 of XFP is identical with XFP test troughs 2, and its depth ratio XFP test troughs 2 are deep
2mm, can carry out precooling to module well.SFP test cells include SFP test troughs 4 and the pre- cold traps 3 of SFP, SFP test troughs 4
Depth be SFP module heights 1/2nd, its width control system is in the range of the plus tolerance 2mm of SFP module widths, and SFP is pre-
The width of cold trap 3 is identical with SFP test troughs 4, the depth of its depth ratio SFP test troughs 4 2mm.
The both sides of testboard are provided with cushion block 5, and cushion block 5 is the high 2mm cushion block being integrated on testboard, so lucky
Circuit board can be supported, and ensure that the module to be measured inserted on circuit boards matches with following test trough well, it is to be measured
Module is inverted on testboard position, reaches optimal refrigeration.
It is provided with 4 boss on testboard, including 1 convex platform 6 being arranged on above testboard and is arranged on test
3 lower convex platforms, 7,4 boss below platform are used for testboard and test gate assembling is fixed.
As shown in Fig. 2 being provided with two gathering holes, respectively XFP gathering holes 8 and SFP gathering holes 9, two on test gate
The position of gathering hole is respectively just to XFP test cells and SFP test cells, and the gathering hole size on test gate needs Precise spraying,
Opening is excessive, and icing phenomenon is had around opening；Too small openings, it has not been convenient to operate.Specific design value is in the present embodiment：XFP
The length that 8 mouthfuls of gathering hole is 80mm, and width is 24mm；The length of SFP gathering holes 9 is 60mm, and width is 24mm.
Screw and survey is respectively adopted in 4 boss on assembling figure such as Fig. 3 of testboard 10 and test gate 11, testboard 10
Try the fixing assembling of door 11.Testboard 10 and test gate 11 are put into casing as shown in Figure 4 after assembling, the surrounding of test gate 11
It is installed to after being wrapped up in flexible glue suitcase on casing, it is ensured that the sealing with casing is assembled.Be provided with casing temperature control system and
Refrigeration system, temperature control system includes temperature display 12 and hygrosensor 13, and refrigeration system includes liquid nitrogen access tube 14
And liquid nitrogen flow controller.When carrying out high temperature test, the temperature needed for test is heated to by heating rod, treated on testboard
Survey module and carry out high temperature test；During low-temperature test, liquid nitrogen is conveyed into casing by liquid nitrogen access tube 14, passes through liquid nitrogen flow control
Valve processed controls the charge of liquid nitrogen, so as to meet the temperature conditionss needed for optical module low-temperature test.Hygrosensor 13 is used for supervising
Temperature in measuring tank body, and shown in real time by temperature display 12, it is easy to tester to observe, detector 13 is led by flexibility
Line is placed proximate to the position of testboard and is fixedly mounted on by heat-conducting silicone grease in the hole of convex platform 7.
It is as follows that the step of optical module high/low temperature is tested is carried out using the present invention：
1. opening high/low temperature test box temperature switch, nitrogen access valve is opened, setting needs the temperature tested, for example, set
It is fixed：-5℃.
2. waiting facilities is run 10 minutes, temperature is reached after design temperature and stabilization, and product to be measured is placed on precooling
On groove, precooling two minutes.XFP is for example tested, product is placed in the pre- cold traps 1 of XFP.
3. the product of a precooling, which is pulled up, is put into test trough, carries out electric property and test automatically, the testing time is 2 minutes, together
When another product to be measured be put into pre- cold trap carry out precooling.For example in step 2 product is extracted from the pre- cold traps 1 of XFP, be put into
In XFP test troughs 2, while another product to be measured is put into the pre- cold traps 1 of XFP.
4. the product being completed is put into Yi Ce areas, circulation step 3 is tested product to be measured one by one.
5. test SFP+/SFP use same principle, can also XFP and SFP+/SFP simultaneously tested.
6. carry out high temperature test, only casing need to be preset high-temperature temperature, for example, set 75 DEG C.Follow-up test step
Ibid.
Embodiment 2
Optical module high/low temperature test system in the present embodiment is essentially identical with structure in embodiment 1, and difference exists
In：As shown in Figure 5,6, refrigeration piping 15 is additionally arranged inside testboard 10, refrigeration piping 15 is located under optical module test cell
Side, the air admission hole 16 of refrigeration piping 15 is connected by flexible pipe with the liquid nitrogen access conduit 14 in refrigeration system, and venthole 17 is located at
Inside test platform 10.During low-temperature test, liquid nitrogen is inputted into refrigeration piping 15 by liquid nitrogen access conduit 14, liquid nitrogen is from air inlet
Mouth 16 is discharged after inner loop pipeline by venthole 17, because refrigeration piping 15 is located at the glazing module testing unit of testboard 10
Underface, therefore can directly to test cell freeze, reach fast-refrigerating purpose.
Present invention design is succinct, and cost is low, while compatibility XFP and SFP/SFP+ high/low temperature test, by setting precooling
Groove greatlys save the test stand-by period, improves testing efficiency, solves the bottleneck of optical module low-temperature test, has filled up current
One blank of optical module high/low temperature test system.
Claims (6)
1. optical module high/low temperature test system, it is characterised in that：Including testboard, test gate and casing, testboard and test gate
Fixing assembling, is placed in casing, and test gate is assembled with box sealing, and optical module test cell is provided with the testboard,
Offered on the test gate at the position just to optical module test cell in gathering hole, the casing and be provided with temperature control
System and refrigeration system；The optical module test cell includes XFP test cells and SFP test cells, and XFP test cells include
XFP test troughs and the pre- cold traps of XFP, SFP test cells include SFP test troughs and the pre- cold traps of SFP, and the depth of XFP test troughs is XFP
/ 2nd of module height, its width control system in the range of the plus tolerance 2mm of XFP module widths, the width of the pre- cold traps of XFP with
XFP test troughs it is identical, its depth ratio XFP test groove depth 2mm, SFP test trough depth for SFP module heights two/
One, its width control system is in the range of the plus tolerance 2mm of SFP module widths, the width and the phase of SFP test troughs of the pre- cold traps of SFP
Together, its depth ratio SFP tests groove depth 2mm.
2. optical module high/low temperature test system according to claim 1, it is characterised in that：The testboard is internally provided with
Refrigeration piping, refrigeration piping is located at the liquid in the lower section of optical module test cell, the air admission hole connection refrigeration system of refrigeration piping
Nitrogen access conduit.
3. optical module high/low temperature test system according to claim 1 or 2, it is characterised in that：Also set on the testboard
4 boss are equipped with, screw and test gate fixing assembling is respectively adopted in 4 boss.
4. the optical module high/low temperature test system according to claim 1 or 2, it is characterised in that：The gathering hole has two
It is individual, respectively XFP gathering holes and SFP gathering holes.
5. optical module high/low temperature test system according to claim 4, it is characterised in that：The length of the XFP gathering holes
For 80mm, width is 24mm, and the length of SFP gathering holes is 60mm, and width is 24mm.
6. optical module high/low temperature test system according to claim 1 or 2, it is characterised in that：The both sides of the testboard
It is provided with cushion block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510231035.0A CN104917563B (en) | 2015-05-08 | 2015-05-08 | Optical module high/low temperature test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510231035.0A CN104917563B (en) | 2015-05-08 | 2015-05-08 | Optical module high/low temperature test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104917563A CN104917563A (en) | 2015-09-16 |
| CN104917563B true CN104917563B (en) | 2017-08-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510231035.0A Active CN104917563B (en) | 2015-05-08 | 2015-05-08 | Optical module high/low temperature test system |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108732199B (en) * | 2018-08-13 | 2020-11-06 | 苏州联讯仪器有限公司 | Ultra-efficient small-size high-low temperature control equipment |
| CN109505433A (en) * | 2018-12-29 | 2019-03-22 | 江苏伊施德创新科技有限公司 | A kind of low temperature detection room and its application method for electronic component |
| CN112346495B (en) * | 2020-11-23 | 2021-08-31 | 广州市优仪科技股份有限公司 | Temperature regulation control method and device for test chamber, electronic equipment and storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN201114069Y (en) * | 2007-10-09 | 2008-09-10 | 四川光恒通信技术有限公司 | Drawer type high and low-temperature circulating box for rapid temperature change |
| CN202721679U (en) * | 2012-07-30 | 2013-02-06 | 成都新易盛通信技术股份有限公司 | Loopback optical module of QSFP+ packaging |
| CN203090942U (en) * | 2012-08-06 | 2013-07-31 | 深圳市宇泰试验设备有限公司 | Cold/thermal shock test box |
| CN204027951U (en) * | 2014-08-06 | 2014-12-17 | 东莞市众志检测仪器有限公司 | A kind of cold shock testing machine |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011160111A1 (en) * | 2010-06-18 | 2011-12-22 | B/E Aerospace, Inc. | Modular light emitting diode system for vehicle illumination |
-
2015
- 2015-05-08 CN CN201510231035.0A patent/CN104917563B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201114069Y (en) * | 2007-10-09 | 2008-09-10 | 四川光恒通信技术有限公司 | Drawer type high and low-temperature circulating box for rapid temperature change |
| CN202721679U (en) * | 2012-07-30 | 2013-02-06 | 成都新易盛通信技术股份有限公司 | Loopback optical module of QSFP+ packaging |
| CN203090942U (en) * | 2012-08-06 | 2013-07-31 | 深圳市宇泰试验设备有限公司 | Cold/thermal shock test box |
| CN204027951U (en) * | 2014-08-06 | 2014-12-17 | 东莞市众志检测仪器有限公司 | A kind of cold shock testing machine |
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| CN104917563A (en) | 2015-09-16 |
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