CN104898035A - High-temperature reverse bias testing system for real-time data collection - Google Patents

High-temperature reverse bias testing system for real-time data collection Download PDF

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Publication number
CN104898035A
CN104898035A CN201510325910.1A CN201510325910A CN104898035A CN 104898035 A CN104898035 A CN 104898035A CN 201510325910 A CN201510325910 A CN 201510325910A CN 104898035 A CN104898035 A CN 104898035A
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China
Prior art keywords
chip
temperature
real
reverse bias
data collection
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CN201510325910.1A
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Chinese (zh)
Inventor
贺先忠
孔凡伟
段花山
贾林
夏金龙
刘君
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Shandong Jing Dao Microtronics AS
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Shandong Jing Dao Microtronics AS
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Priority to CN201510325910.1A priority Critical patent/CN104898035A/en
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Abstract

The invention discloses a high-temperature reverse bias testing system for real-time data collection, and the system comprises a high-temperature box. The interior of the high-temperature box is provided with an inner box body for placing a test sample, a blower fan, a temperature controller, a temperature sensor, and an air duct, wherein the air duct is disposed at the periphery of the inner box body. An air outlet of the blower fan is communicated with the air duct. A probe of the temperature sensor is disposed in the air duct, and the temperature sensor is connected with the temperature controller. The interior of the high-temperature box is also provided with a data collection unit, a microcomputer, and a data communication unit, wherein the microcomputer and the data communication unit are respectively connected with the data collection unit. The data collection unit is electrically connected with the test sample in the inner box body, and the data communication unit is connected with an external upper computer. The system can achieve the real-time collection of a leaked current in a high-temperature reverse bias test process of diode-type devices, can achieve remote control, can achieve the check of test data at any time and any place under the condition of a wired network or a wifi, and facilitates the data analysis, quality management, and reliability verification.

Description

The high temperature reverse bias experimental system of real-time data collection
Technical field
The present invention relates to the high temperature reverse bias experimental system of a kind of high temperature reverse bias experimental system, particularly a kind of real-time data collection.
Background technology
Along with mobile informatiom product, the development in the field such as household electronic products and green illumination, for its supporting electronic product has used rectifier bridge in a large number, diode, the diode-like devices such as stabilivolt, and very high requirement is put forward to the hot operation stability of this kind of device products, the ability that diode-like device at high temperature bears reverse biased weighs its functional reliability Key Experiment project, at present, most of user producer does not also possess similar test experience equipment, and dependence is verified in circuit, because the reliability redundancy of circuit itself designs, electric stress is obviously not enough, can not the reliability of abundant verifying parts, also supplied materials quality checking in advance cannot be accomplished, and original laboratory equipment is also only limitted to high temperature reverse bias itself, all cannot automatically complete the data acquisition of experimentation and analyzing, integrality and the confidence level of experiment are had a greatly reduced quality.
Summary of the invention
The present invention, in order to overcome the deficiency of above technology, provides a kind of high temperature reverse bias experimental system of real-time data collection, can realize Real-time Collection and the Long-distance Control of data.
the present invention overcomes the technical scheme that its technical matters adopts:
A kind of high temperature reverse bias experimental system of real-time data collection, comprise high-temperature cabinet, the internal box placing laboratory sample is provided with in high-temperature cabinet, fan blower, temperature controller, temperature sensor and air channel, described air channel is arranged at the periphery of internal box, the air outlet of fan blower is connected with air channel, the probe of temperature sensor is arranged in air channel, temperature sensor is connected with temperature controller, data acquisition unit and the microcomputer be connected with data acquisition unit respectively and data communication unit is also provided with in described high-temperature cabinet, described data acquisition unit is electrically connected with the laboratory sample in internal box, data communication unit is connected with outside host computer.
Preferred according to the present invention, the low-tension supply also comprising the high-voltage power supply of powering for the laboratory sample in internal box in described high-temperature cabinet and power for data acquisition unit; Described high-voltage power supply is that 0-1000V is adjustable, and described low-tension supply is ± 5V and 12V.
Preferred according to the present invention, described data acquisition unit comprises microprocessor chip M430F169, leakage current sample circuit, operational amplifier 7650, modulus conversion chip AD7705, operational amplifier OP27G and interface chip MAX489 and hex inverter SN74HC04, described leakage current sample circuit comprises some sampling resistors, the electronic switch 4051 be connected with sampling resistor and the eight road bidirectional bus transceiver SN47HC245N be connected with electronic switch, described eight road bidirectional bus transceiver SN47HC245N are connected with the control end of microprocessor chip M430F169, the output terminal of electronic switch 4051 is connected with the input end of operational amplifier 7650, the output terminal of operational amplifier 7650 is connected with first differential input end of modulus conversion chip AD7705, the output terminal of operational amplifier OP27G is connected with second differential input end of modulus conversion chip AD7705, the output terminal of modulus conversion chip AD7705 is connected with the input end of microprocessor chip M430F169, the output terminal of microprocessor chip M430F169 is connected with hex inverter SN74HC04 with interface chip MAX489 respectively.
Preferred according to the present invention, described data communication unit 16 comprises modular power source S05IS05, interface chip MAX489, two photoelectrical coupler 6N136 and level transferring chip MAX232; After interface chip MAX489 in described data acquisition unit 11 is connected with the interface chip MAX489 in data communication unit 16 by interface RJ45, interface chip MAX489 in data communication unit be connected with two photoelectrical coupler 6N136 isolate after be connected with level transferring chip MAX232 again, the output terminal of described level transferring chip MAX232 is connected with outside host computer.
Preferred according to the present invention, be provided with more than 1 piece brassboard in described internal box, further preferably, in described internal box, be provided with 3 pieces of brassboards.
Preferred according to the present invention, described high-temperature cabinet is of a size of 570mm × 400mm × 385mm; Internal box is of a size of 240mm × 200mm × 200mm, and the high-temperature cabinet size of this size is little, and inner structure is compact, efficient, is easy to carry.
the invention has the beneficial effects as follows:
1, do at diode-like device can to leakage current Real-time Collection in high temperature reverse bias experimentation for experimental system of the present invention, and can Long-distance Control be carried out, can check experimental data whenever and wherever possible under cable network or wifi, be convenient to data analysis, qualitative control and reliability demonstration etc., the fields such as reliability laboratory, the checking of production quality, user producer Incoming Quality Control can be widely used in.
2, experimental system size of the present invention is little, and inner structure is compact, efficient, is convenient to portable.
Accompanying drawing explanation
Fig. 1 is Facad structure schematic diagram of the present invention.
Fig. 2 is structure schematic diagram of the present invention.
Fig. 3 is Principle of Communication schematic diagram of the present invention.
Fig. 4 is the circuit theory diagrams of microprocessor chip M430F169 in data acquisition unit of the present invention.
Fig. 5 is the circuit theory diagrams of voltage stabilizer AMS1117 in data acquisition unit of the present invention.
Fig. 6 is the schematic diagram of leakage current sample circuit in data acquisition unit of the present invention.
Fig. 7 is the circuit theory diagrams of operational amplifier 7650 in data acquisition unit of the present invention.
Fig. 8 is the circuit theory diagrams of operational amplifier OP27G in data acquisition unit of the present invention.
Fig. 9 is the circuit theory diagrams of modulus conversion chip AD7705 in data acquisition unit of the present invention.
Figure 10 is the circuit theory diagrams of interface chip MAX489 and hex inverter SN74HC04 in data acquisition unit of the present invention.
Figure 11 is data communication unit circuit theory diagrams of the present invention.
In figure, 1, high-temperature cabinet, 2, internal box, 3, high-voltage power supply, 5, fan blower, 6, temperature controller, 8, temperature sensor, 9, air channel, 11, data acquisition unit, 14, microcomputer, 15, low-tension supply, 16, data communication unit.
Embodiment
Better understand the present invention for the ease of those skilled in the art, be described in further details below in conjunction with the drawings and specific embodiments to the present invention, following is only exemplary do not limit protection scope of the present invention.
As Figure 1-3, the high temperature reverse bias experimental system of real-time data collection of the present invention, comprises high-temperature cabinet 1, and it is of a size of 570mm × 400mm × 385mm, and temperature controlling range is 25-150 DEG C, and temperature-controlled precision can reach ± and 0.5 DEG C, the internal box 2 placing laboratory sample is provided with in high-temperature cabinet, fan blower 5, temperature controller 6, temperature sensor 8 and air channel 9, described internal box 2 is of a size of 240mm × 200mm × 200mm, 3 pieces of brassboards are provided with in internal box 2, every block brassboard places 20 laboratory samples, 60 laboratory samples can be placed simultaneously, such as place 60 diodes, described air channel 9 is arranged at the periphery of internal box, the air outlet of fan blower 5 is connected with air channel, the probe of temperature sensor 8 is arranged in air channel, temperature sensor 8 is connected with temperature controller 6, the high-voltage power supply 3 of powering for laboratory sample is also comprised in high-temperature cabinet, described high-voltage power supply is that 0-1000V is adjustable, and protective current 0-300mA can be set arbitrarily.Special feature of the present invention is: the low-tension supply 15 of be provided with data acquisition unit 11 in described high-temperature cabinet, powering for data acquisition unit and the microcomputer 14 be connected with data acquisition unit respectively and data communication unit 16, and low-tension supply is ± 5V and 12V; Described data acquisition unit 11 is electrically connected with the laboratory sample in internal box, and data communication unit 16 is connected with outside host computer; Data acquisition unit 11 also can set arbitrarily the experiment end time in setting data acquisition time interval, and its acquisition time interval is 1min-99min.
As shown in figs. 4 through 10, data acquisition unit 11 of the present invention comprises microprocessor chip M430F169, the voltage stabilizer AMS1117 providing voltage stabilizing for microprocessor chip M430F169, leakage current sample circuit, operational amplifier 7650, modulus conversion chip AD7705, operational amplifier OP27G and interface chip MAX489 and hex inverter SN74HC04; Described microprocessor chip M430F169 is 16-Bit RISC framework, 1.8-3.6V Width funtion working range, be less than the wakeup time of 6 μ s and allow two operate outside frequency input, built-in integration many moneys low-power consumption peripheral module, super low-power consumption, the execution cycle of ns level can high speed acquisition signal, and described modulus conversion chip AD7705 has the features such as high resolving power, wide dynamic range, self calibration, excellent noise robustness and Low-voltage Low-power.Described leakage current sample circuit comprises some sampling resistor R1001-R1064, the electronic switch 4051 be connected with sampling resistor R1001-R1064 and the eight road bidirectional bus transceiver SN47HC245N be connected with electronic switch, described eight road bidirectional bus transceiver SN47HC245N are connected with the control end of microprocessor chip M430F169, the output terminal of electronic switch 4051 is connected with the input end of operational amplifier 7650, the output terminal of operational amplifier 7650 is connected with first differential input end of modulus conversion chip AD7705, the output terminal of operational amplifier OP27G is connected with second differential input end of modulus conversion chip AD7705, the output terminal of modulus conversion chip AD7705 is connected with the input end of microprocessor chip M430F169, the output terminal of microprocessor chip M430F169 is connected with hex inverter SN74HC04 with interface chip MAX489 respectively.
As shown in figure 11, data communication unit 16 of the present invention comprises modular power source S05IS05, interface chip MAX489, two photoelectrical coupler 6N136 and level transferring chip MAX232.After interface chip MAX489 in described data acquisition unit 11 is connected with the interface chip MAX489 in data communication unit 16 by interface RJ45, interface chip MAX489 in data communication unit 16 be connected with two photoelectrical coupler 6N136 isolate after be connected with level transferring chip MAX232 again, the output terminal of described level transferring chip MAX232 is connected with outside host computer.
principle of work of the present invention:
First, in the brassboard of internal box 2, place laboratory sample, turn on the power switch, set temperature required, be then heated to temperature required, by high-voltage power supply 3 for laboratory sample is powered, fan blower 5 is toward air-supply in air channel 9, and the temperature field be equivalent to around to internal box is stirred, and makes homogeneous temperature.Temperature in temperature sensor 8 Real-Time Monitoring air channel 9, when temperature is higher or lower than time temperature required, temperature controller 6 can automatically adjust.
Secondly, the leakage current Real-time Collection of data acquisition unit 11 pairs of laboratory samples, the collection of leakage current is the voltage being gathered resistance R1001-R1064 two ends by microprocessor chip M430F169 by the switching of eight road bidirectional bus transceiver SN47HC245N control electronic switches 4051, then the signal collected is amplified through operational amplifier 7650, through modulus conversion chip AD7705, simulating signal is converted to digital signal again, digital signal after modulus signal conversion is amplified through operational amplifier OP27G again, by hex inverter SN74HC04, current unit is carried out switching so that computer identification after again being processed by microprocessor chip M430F169 again, the signal that final data collecting unit 11 exports is connected with the interface chip MAX489 in data communication unit 16 by the interface RJ45 of the interface chip MAX489 in data acquisition unit 11, the signal that data acquisition unit 11 collects in addition also can be stored in microcomputer 14, described interface chip MAX489 adopts modbus communications protocol, 256 road signals can be processed at most simultaneously, interface chip MAX489 in data communication unit 16 is connected with level transferring chip MAX232 after being isolated by two photoelectrical coupler 6N136 again, the output terminal of last level transferring chip MAX232 is connected with outside host computer, so just the leakage current that data acquisition unit 11 collects is transferred to outside host computer by data communication unit 16, Long-distance Control can be carried out by host computer, can check experimental data whenever and wherever possible under cable network or wifi, be convenient to data analysis, qualitative control and reliability demonstration etc., reliability laboratory can be widely used in, production quality is verified, the fields such as user producer Incoming Quality Control.
Above only describes ultimate principle of the present invention and preferred implementation, those skilled in the art can make many changes and improvements according to foregoing description, and these changes and improvements should belong to protection scope of the present invention.

Claims (8)

1. the high temperature reverse bias experimental system of a real-time data collection, comprise high-temperature cabinet (1), the internal box (2) placing laboratory sample is provided with in high-temperature cabinet, fan blower (5), temperature controller (6), temperature sensor (8) and air channel (9), described air channel (9) is arranged at the periphery of internal box, the air outlet of fan blower (5) is connected with air channel, the probe of temperature sensor (8) is arranged in air channel, temperature sensor (8) is connected with temperature controller (6), it is characterized in that: in described high-temperature cabinet, be also provided with data acquisition unit (11) and the microcomputer (14) be connected with data acquisition unit respectively and data communication unit (16), described data acquisition unit (11) is electrically connected with the laboratory sample in internal box, data communication unit (16) is connected with outside host computer.
2. the high temperature reverse bias experimental system of real-time data collection according to claim 1, is characterized in that: the low-tension supply (15) also comprising the high-voltage power supply (3) of powering for the laboratory sample in internal box in described high-temperature cabinet (1) and power for data acquisition unit; Described high-voltage power supply (3) for 0-1000V adjustable, described low-tension supply (15) is ± 5V and 12V.
3. the high temperature reverse bias experimental system of real-time data collection according to claim 1, it is characterized in that: described data acquisition unit (11) comprises microprocessor chip M430F169, leakage current sample circuit, operational amplifier 7650, modulus conversion chip AD7705, operational amplifier OP27G and interface chip MAX489 and hex inverter SN74HC04, described leakage current sample circuit comprises some sampling resistors, the electronic switch 4051 be connected with sampling resistor and the eight road bidirectional bus transceiver SN47HC245N be connected with electronic switch, described eight road bidirectional bus transceiver SN47HC245N are connected with the control end of microprocessor chip M430F169, the output terminal of electronic switch 4051 is connected with the input end of operational amplifier 7650, the output terminal of operational amplifier 7650 is connected with first differential input end of modulus conversion chip AD7705, the output terminal of operational amplifier OP27G is connected with second differential input end of modulus conversion chip AD7705, the output terminal of modulus conversion chip AD7705 is connected with the input end of microprocessor chip M430F169, the output terminal of microprocessor chip M430F169 is connected with hex inverter SN74HC04 with interface chip MAX489 respectively.
4. the high temperature reverse bias experimental system of real-time data collection according to claim 3, is characterized in that: described data acquisition unit (11) also comprises for microprocessor chip M430F169 provides the voltage stabilizer AMS1117 of voltage stabilizing.
5. the high temperature reverse bias experimental system of the real-time data collection according to claim 3 or 4, is characterized in that: described data communication unit (16) comprises modular power source S05IS05, interface chip MAX489, two photoelectrical coupler 6N136 and level transferring chip MAX232; After interface chip MAX489 in described data acquisition unit (11) is connected with the interface chip MAX489 in data communication unit (16) by interface RJ45, interface chip MAX489 in data communication unit (16) be connected with two photoelectrical coupler 6N136 isolate after be connected with level transferring chip MAX232 again, the output terminal of described level transferring chip MAX232 is connected with outside host computer.
6. the high temperature reverse bias experimental system of real-time data collection according to claim 1, is characterized in that: be provided with more than 1 piece brassboard in described internal box (2).
7. the high temperature reverse bias experimental system of real-time data collection according to claim 6, is characterized in that: be provided with 3 pieces of brassboards in described internal box (2).
8. the high temperature reverse bias experimental system of real-time data collection according to claim 1, is characterized in that: described high-temperature cabinet (1) is of a size of 570mm × 400mm × 385mm; Internal box (2) is of a size of 240mm × 200mm × 200mm.
CN201510325910.1A 2015-06-15 2015-06-15 High-temperature reverse bias testing system for real-time data collection Pending CN104898035A (en)

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CN105548853A (en) * 2015-10-29 2016-05-04 温州墨熵微电子有限公司 High temperature reverse bias and high temperature gate bias test system for power device
CN107861041A (en) * 2017-09-21 2018-03-30 全球能源互联网研究院有限公司 A kind of high temperature reverse bias test system and method

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Publication number Priority date Publication date Assignee Title
CN105548853A (en) * 2015-10-29 2016-05-04 温州墨熵微电子有限公司 High temperature reverse bias and high temperature gate bias test system for power device
CN107861041A (en) * 2017-09-21 2018-03-30 全球能源互联网研究院有限公司 A kind of high temperature reverse bias test system and method

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