CN104776819A - Ultrasonic thickness measuring method - Google Patents
Ultrasonic thickness measuring method Download PDFInfo
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- CN104776819A CN104776819A CN201510189290.3A CN201510189290A CN104776819A CN 104776819 A CN104776819 A CN 104776819A CN 201510189290 A CN201510189290 A CN 201510189290A CN 104776819 A CN104776819 A CN 104776819A
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- thickness
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- sample block
- ultrasonic
- detected sample
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
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- General Physics & Mathematics (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
Abstract
The invention discloses an ultrasonic thickness measuring method which comprises the following steps: measuring the sound speed of an upper layer of material standard samples and a lower layer of material standard samples to obtain Supper and Slower; making a detection to obtain the thickness value H of a measured sample block, and carrying out ultrasonic detection to obtain the time interval deltaT of echoes from an upper surface and a lower surface; finally, obtaining the thickness value of an upper layer of materials and a lower layer of materials according to a formula. According to the ultrasonic thickness measuring method, the thickness values of the upper layer of materials and the lower layer of materials are calculated indirectly by measuring the time intervals of the echoes from the upper and the lower surfaces, so that the ultrasonic detection accuracy is improved greatly without increasing a sampling clock frequency.
Description
Technical field
The present invention relates to a kind of method utilizing ultrasonic technology to carry out test material thickness, particularly relating to the thickness for detecting double layer material.
Background technology
Ultrasonic thickness test technology is a kind of conventional Dynamic Non-Destruction Measurement, carries out thickness measure according to Ultrasonic Pulse-Echo principle.The general measure method of ultrasonic survey double layer material thickness launches ultrasound wave by ultrasonic probe, when ultrasound wave to reach the interphase of double layer material by testee, pulse is reflected back toward probe, the transmission time of ultrasound wave in tested physics is calculated by upper surface and interfacial echoed signal, this time is multiplied with the velocity of propagation of ultrasound wave in measured object, obtains the thickness of measured object.
According to the principle of ultrasonic thickness measurement, obtain high-precision measurement result and namely will obtain high-precision echo time interval delta T, and the precision of echo time interval delta T depends on the sample frequency f of digital to analog converter, the sample frequency f of digital to analog converter is larger, the precision of Δ T is higher, and the computational solution precision obtained is also higher.When upper surface or lower surface thickness very little time, upper surface or lower surface and interfacial close echo easily overlap, thus cause metrical error, now general by improve sample frequency meet the demands, and the sample frequency of digital to analog converter is higher, price is more expensive, and power consumption is also larger, is unfavorable for promoting the use of.
China Patent Publication No.: CN 103486987A, disclose a kind of method utilizing curve to improve ultrasonic thickness measurement precision, ultrasonic signal is utilized to be similar to straight line within upper and lower minor time slice at zero point, and signal amplitude is higher, more be similar to straight line, by gathering the upper and lower two adjacent sampled points at zero point of the positive peak-peak of echoed signal or negative peak-peak both sides, fitting a straight line is carried out by sampled point, calculate unique point respective coordinates in matched curve, and this coordinate is delivered to THICKNESS CALCULATION module calculating testee thickness.When Ultrasonic Detection double layer material thickness, when bilayer material thickness is very little, echoed signal overlaps, and the method still can not meet the demands to the precision that it detects when sample clock frequency is constant.
Summary of the invention
The present invention is directed to and do not improve sample clock frequency to improve the problem of ultrasonic thickness measurement precision, propose a kind of new ultrasonic thickness-measuring method, ultrasonic thickness measurement accuracy of detection when sample clock frequency is constant has been had and significantly promotes.
For achieving the above object, the technical solution used in the present invention is: by measuring the echo time interval delta T of detected sample block upper and lower surface, the known double layer material velocity of sound separately, the general thickness of double layer material, calculate the thickness of required upper strata or subsurface material.
A kind of ultrasonic thickness-measuring method, comprises following steps:
Step one: respectively the velocity of sound is surveyed to levels material standard specimen, obtains upper layer of material velocity of sound S
on, subsurface material velocity of sound S
under; The levels material of levels material standard specimen and detected sample block adopts same process, with batch material;
Step 2: detect the one-tenth-value thickness 1/10 H obtaining detected sample block;
Step 3: by ultrasound examination, obtains detected sample block upper and lower surface close echo time interval Δ T;
Step 4: pass through formula:
h again
on=S
onΔ T
on, H
under=S
underΔ T
under, obtain
Δ T
on, Δ T
underbe respectively the time of ultrasound wave by detected sample block levels material;
Due to S
on, S
under, H is all known, as long as so obtain the time interval Δ T of detected sample block upper and lower surface close echo, just can draw the one-tenth-value thickness 1/10 of upper layer of material and subsurface material.
Compared with prior art, the present invention has following beneficial effect:
The present invention carrys out the one-tenth-value thickness 1/10 of indirect calculation upper layer of material or subsurface material by the echo time interval measuring upper and lower surface, solve and the upper surface that cause too thin by material and interphase echo overlapping, cannot separate, that causes cannot detect or metrical error problem, when not improving sample clock frequency, significantly improve ultrasonic detection precision.
Accompanying drawing explanation
Fig. 1 is detected sample block sketch of the present invention;
In figure: 1 is upper layer of material, 2 is interphase, and 3 is subsurface material.
Embodiment
Be further described technical scheme of the present invention below, the following description is only the use understanding technical solution of the present invention, and be not used in and limit scope of the present invention, protection scope of the present invention is as the criterion with claims.
Embodiment 1
As shown in Figure 1, be the double-deck plain film of a uniform thickness, its upper layer of material is adamas, and subsurface material is wimet.Measure the one-tenth-value thickness 1/10 H of the double-deck plain film of uniform thickness, respectively sound speed detection is done to adamas and wimet, obtains S
on, S
under, and pass through the echo time interval delta T of Ultrasonic Detection upper and lower surface, required upper layer of material or the one-tenth-value thickness 1/10 of subsurface material can be obtained by formulae discovery.
Concrete, the concrete implementation step of the present embodiment is as follows:
Step one: respectively the velocity of sound is surveyed to adamas and Hardmetal materials standard specimen (the levels material of this standard specimen and detected sample block adopts same process, with batch material), obtains S
on, S
under;
Step 2: detect the one-tenth-value thickness 1/10 H obtaining detected sample block;
Step 3: by ultrasound examination, obtains upper and lower surface close echo time interval Δ T;
Step 4: pass through formula:
h again
on=S
onΔ T
on, H
under=S
underΔ T
under, can obtain
Δ T
on, Δ T
underbe respectively the time of ultrasound wave by levels material;
The adamas standard specimen velocity of sound that upper layer of material adopts, be 15000m/s after testing, the wimet standard specimen velocity of sound is 10000m/s, and measured object thickness H is 2.0mm after testing, as long as so obtain the time interval Δ T of upper and lower surface close echo, the one-tenth-value thickness 1/10 of upper layer of material or subsurface material just can be calculated.When Δ T be 0.28 delicate time, can obtain upper layer of material thickness is 1.8mm.
The foregoing is only section Example of the present invention, not do any restriction to technical scope of the present invention, all any amendments made within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (2)
1. a ultrasonic thickness-measuring method, is characterized in that, comprises following steps:
Step one: respectively the velocity of sound is surveyed to levels material standard specimen, obtains upper layer of material velocity of sound S
on, subsurface material velocity of sound S
under; The levels material of levels material standard specimen and detected sample block adopts same process, with batch material;
Step 2: detect the one-tenth-value thickness 1/10 H obtaining detected sample block;
Step 3: by ultrasound examination, obtains detected sample block upper and lower surface close echo time interval Δ T;
Step 4: pass through formula:
h again
on=S
onΔ T
on, H
under=S
underΔ T
under, obtain
Δ T
on, Δ T
underbe respectively the time of ultrasound wave by detected sample block levels material;
Due to S
on, S
under, H is all known, as long as so obtain the time interval Δ T of upper and lower surface close echo, just can draw the one-tenth-value thickness 1/10 of upper layer of material and subsurface material.
2. ultrasonic thickness-measuring method according to claim 1, is characterized in that, described one-tenth-value thickness 1/10 H, if detected sample block is wait chunk, then H is numerical value; If the non-uniform thickness of detected sample block, then H is matrix.
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CN201510189290.3A CN104776819A (en) | 2015-04-18 | 2015-04-18 | Ultrasonic thickness measuring method |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105128525A (en) * | 2015-09-30 | 2015-12-09 | 中国人民解放军海军工程大学 | Ultrasonic single-double detection sensor |
CN105466345A (en) * | 2015-12-21 | 2016-04-06 | 中国科学院长春光学精密机械与物理研究所 | Optical lens center thickness measuring method based on thickness reference transmission |
CN105606043A (en) * | 2015-09-11 | 2016-05-25 | 东莞职业技术学院 | Cable core eccentricity detection apparatus and cable core eccentricity detection method |
CN105758347A (en) * | 2016-03-18 | 2016-07-13 | 浙江大学 | Product parameter ultrasonic on-line measuring method in co-injection |
CN106248009A (en) * | 2016-08-31 | 2016-12-21 | 南昌航空大学 | A kind of ultrasonic thickness-measuring method of highly attenuating fiberglass |
CN112433217A (en) * | 2020-11-10 | 2021-03-02 | 广州市东儒电子科技有限公司 | Object thickness measuring method, device, system, equipment and medium based on ultrasonic waves |
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JPH08219750A (en) * | 1995-02-16 | 1996-08-30 | Nippon Steel Corp | Method and apparatus for measuring thickness of clad material |
CN1235270A (en) * | 1998-05-12 | 1999-11-17 | 埃莫森电器公司 | Method and apparatus for measuring thickness of coated material |
JP2001208527A (en) * | 1999-11-15 | 2001-08-03 | Just | Method of measuring carbon fiber cover layer |
CN101883526A (en) * | 2007-12-03 | 2010-11-10 | 朱卡·朱韦林 | Method for measuring of thicknesses of materials using an ultrasound technique |
CN102305607A (en) * | 2011-05-24 | 2012-01-04 | 华北电力大学 | Calibration method for measuring thickness of oxidation layer on inner wall of boiler tube by ultrasonic wave |
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Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH01244307A (en) * | 1988-03-25 | 1989-09-28 | Sumitomo Metal Ind Ltd | Thickness measuring method of double-layered body |
CN1059029A (en) * | 1990-06-08 | 1992-02-26 | 法玛通公司 | Bimetallic tube thickness and faying face thereof link the detection method and the pick-up unit of situation |
JPH08219750A (en) * | 1995-02-16 | 1996-08-30 | Nippon Steel Corp | Method and apparatus for measuring thickness of clad material |
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Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105606043A (en) * | 2015-09-11 | 2016-05-25 | 东莞职业技术学院 | Cable core eccentricity detection apparatus and cable core eccentricity detection method |
CN105128525A (en) * | 2015-09-30 | 2015-12-09 | 中国人民解放军海军工程大学 | Ultrasonic single-double detection sensor |
CN105128525B (en) * | 2015-09-30 | 2019-01-18 | 中国人民解放军海军工程大学 | A kind of ultrasonic wave list double sheet detection sensor |
CN105466345A (en) * | 2015-12-21 | 2016-04-06 | 中国科学院长春光学精密机械与物理研究所 | Optical lens center thickness measuring method based on thickness reference transmission |
CN105758347A (en) * | 2016-03-18 | 2016-07-13 | 浙江大学 | Product parameter ultrasonic on-line measuring method in co-injection |
CN105758347B (en) * | 2016-03-18 | 2018-06-19 | 浙江大学 | Product parameter ultrasound On-line Measuring Method in co-injection molding |
CN106248009A (en) * | 2016-08-31 | 2016-12-21 | 南昌航空大学 | A kind of ultrasonic thickness-measuring method of highly attenuating fiberglass |
CN112433217A (en) * | 2020-11-10 | 2021-03-02 | 广州市东儒电子科技有限公司 | Object thickness measuring method, device, system, equipment and medium based on ultrasonic waves |
CN112433217B (en) * | 2020-11-10 | 2024-05-14 | 广州市东儒电子科技有限公司 | Object thickness measuring method, device, system, equipment and medium based on ultrasonic wave |
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Address after: 200240 Shanghai city Minhang District Jianchuan road 953 Lane 322 building Applicant after: SHANGHAI HEWU PRECISION APPARATUS CO., LTD. Address before: No. 955 Cangyuan science and Technology Park, 200240 Shanghai city Minhang District Jianchuan Road Building 9 floor, I enjoy my home Applicant before: Shanghai Hiwave Advanced Materials Technology Co., Ltd. |
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Application publication date: 20150715 |
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