CN104714153A

CN104714153A - Winding test device

Info

Publication number: CN104714153A
Application number: CN201410714351.9A
Authority: CN
Inventors: 梅津洁
Original assignee: Co Ltd Electronics Zhi Yu Is International
Current assignee: Co Ltd Electronics Zhi Yu Is International
Priority date: 2013-12-11
Filing date: 2014-11-28
Publication date: 2015-06-17
Anticipated expiration: 2034-11-28
Also published as: JP2015114195A; TWI522629B; JP5537721B1; CN104714153B; KR101700808B1; TW201522991A; KR20150068286A

Abstract

Disclosed is a winding test device capable of accurately and rapidly performing a test of tested coils of low inductance at a sufficiently high voltage. The winding test device 100 comprises output terminal 151 and 152 which can be connected with a coaxial cable 161 capable of applying a voltage between terminals of a tested coil M, output terminals 153 and 154 which can be connected with a coaxial cable 162 capable of receiving a measurement voltage that occurs between the terminals of the tested coil M, an impulse voltage generator 110 which generates a pulse voltage applied between the terminals of the tested coil M and which outputs the pulse voltage to the output terminals 151 and 152, an inter-terminal voltage detector 120 which detects a waveform of the voltage that occurs between the terminals of the tested coil M, and a test controller 140 which determines the acceptability of the tested coil M based on the measured waveform and which controls the abovementioned various parts.

Description

Winding proving installation

Technical field

The present invention relates to a kind of winding proving installation testing the quality of coil assembly.

Background technology

As the coil assembly possessing winding, can list inductor, transformer, magnetic field generation coil etc., this coil assembly uses in a large number in electronics/electrical equipment.

Due to popularizing of smart mobile phone, tablet terminal etc., the turnout of chip part increases.Wherein, especially in order to extend the actuation time of battery, chip inductor (chipinductor) inductance while raising the efficiency being used in power circuit etc. is low, advances high capacity, miniaturization, and requires higher reliability.

Describe a kind of testing fixture of winding in patent documentation 1, the testing fixture of this winding possesses: pulse voltage generation unit, and it is applied pulse voltage to the winding as check object by between the terminal of test coil; Voltage between terminals detecting unit, it detects the waveform of the vibration voltage produced between by the terminal of test coil; Electromagnetic Wave Detection unit, it detects the electromagnetic wave produced because of the electric discharge by test coil; And display unit, its display detected by vibration voltage waveform and electromagnetic waveform.

Patent documentation 1: Japanese Unexamined Patent Publication 2009-115505 publication

Summary of the invention

the problem that invention will solve

But in this winding testing fixture in the past, be there is following problem by the test of test coil in (such as 1 below μ H) low at inductance.

When to inductance low tested by test coil, because inductance is low, cause from proving installation apply pulse voltage reduced by the two ends of test coil.Therefore, cannot carry out executing the test of alive proof voltage based on high.Such as 1 below μ H ultra-low inductance by test coil, the test of more than more high voltage (test voltage 1000V) cannot be implemented.

In addition, in winding proving installation in the past, though want to measure by apply pulse voltage and test circuit and by test coil between the voltage attenuation waveform that produces because of resonance, also cannot can obtain voltage attenuation waveform accurately because inductance is low.As its countermeasure, the dummy capacitors (dummy condenser) considering to install in test circuit for the formation of resonant condition increases the cycle of decay waveform.But, in the method for this installation dummy capacitors, there is following problem: cannot obtain based on by the response wave shape of test coil originally characteristic, and need large electric energy in the applying of pulse voltage, its result, cannot test at high speed.

The present invention completes in light of this situation, and its problem is to provide a kind of can carry out high precision with sufficiently high voltage and at high speed to the winding proving installation tested by test coil of low inductance.

for the scheme of dealing with problems

In order to solve the problem, the feature of winding proving installation of the present invention is, possess: the first lead-out terminal and the second lead-out terminal, this first lead-out terminal can be connected the first concentric cable with the second lead-out terminal, and this first concentric cable is for being executed alive applying voltage test cable between the terminal of test coil, 3rd lead-out terminal and the 4th lead-out terminal, the 3rd lead-out terminal can be connected the second concentric cable with the 4th lead-out terminal, and this second concentric cable is above-mentioned by the detection voltage test cable of measuring voltage produced between the terminal of test coil for being received in, pulse voltage generation unit, it produces to above-mentioned by the pulse voltage applied between the terminal of test coil, and outputs to above-mentioned first lead-out terminal and the second lead-out terminal, voltage between terminals detecting unit, it is connected with above-mentioned 3rd lead-out terminal and the 4th lead-out terminal, detect by apply from above-mentioned pulse voltage generation unit pulse voltage and above-mentioned by the terminal of test coil between the waveform of voltage between terminals that produces, and identifying unit, it judges above-mentioned by the quality of test coil based on the measured waveform that above-mentioned voltage between terminals detecting unit detects, wherein, above-mentioned voltage between terminals detecting unit detects the measured waveform comprised because of the above-mentioned back-emf voltage produced by the resonance of the inductance of test coil and the electrostatic capacitance between above-mentioned 3rd lead-out terminal and above-mentioned 4th lead-out terminal, the reference waveform utilizing reference coil to obtain (Japanese: マスタ waveform) and the above-mentioned measured waveform by test coil compare by above-mentioned identifying unit, converge in upper and lower threshold range according to side-play amount and be judged to be that above-mentioned is certified products by test coil, and, when there is specified quantity continuously in the above-mentioned defective judgement by test coil, above-mentioned upper and lower threshold range is moved to there is not underproof side.

In addition, the feature of winding proving installation of the present invention is, possess: the first lead-out terminal and the second lead-out terminal, this first lead-out terminal can be connected the first concentric cable with the second lead-out terminal, and this first concentric cable is for being executed alive applying voltage test cable between the terminal of test coil, 3rd lead-out terminal and the 4th lead-out terminal, the 3rd lead-out terminal can be connected the second concentric cable with the 4th lead-out terminal, and this second concentric cable is above-mentioned by the detection voltage test cable of measuring voltage produced between the terminal of test coil for being received in, pulse voltage generation unit, it produces to above-mentioned by the pulse voltage applied between the terminal of test coil, and outputs to above-mentioned first lead-out terminal and the second lead-out terminal, voltage between terminals detecting unit, it is connected with above-mentioned 3rd lead-out terminal and the 4th lead-out terminal, detect by apply from above-mentioned pulse voltage generation unit pulse voltage and above-mentioned by the terminal of test coil between the waveform of voltage between terminals that produces, and identifying unit, it judges above-mentioned by the quality of test coil based on the measured waveform that above-mentioned voltage between terminals detecting unit detects, wherein, above-mentioned voltage between terminals detecting unit detects the measured waveform comprised because of the above-mentioned back-emf voltage produced by the resonance of the inductance of test coil and the electrostatic capacitance between above-mentioned 3rd lead-out terminal and above-mentioned 4th lead-out terminal, above-mentioned identifying unit obtains first wave graphic data row based on the reference waveform utilizing reference coil to obtain, differential is carried out calculate the first differential value to this first wave graphic data row, preserve the value that obtained for the summation of above-mentioned reference waveform entirety by the first differential value calculated in advance as reference value, and, above-mentioned identifying unit obtains Second Wave graphic data row based on above-mentioned measured waveform, differential is carried out calculate the second differential value to this Second Wave graphic data row, obtain the value obtained for the summation of above-mentioned measured waveform entirety by the second differential value calculated, the said reference value obtained based on above-mentioned reference waveform and the value obtained based on above-mentioned measured waveform compare by above-mentioned identifying unit, if side-play amount is below defined threshold, certified products will be judged to be by test coil, otherwise be judged to be unacceptable product.

In addition, the feature of winding proving installation of the present invention is, possess: the first lead-out terminal and the second lead-out terminal, this first lead-out terminal can be connected the first concentric cable with the second lead-out terminal, and this first concentric cable is for being executed alive applying voltage test cable between the terminal of test coil, 3rd lead-out terminal and the 4th lead-out terminal, the 3rd lead-out terminal can be connected the second concentric cable with the 4th lead-out terminal, and this second concentric cable is above-mentioned by the detection voltage test cable of measuring voltage produced between the terminal of test coil for being received in, pulse voltage generation unit, it produces to above-mentioned by the pulse voltage applied between the terminal of test coil, and outputs to above-mentioned first lead-out terminal and the second lead-out terminal, voltage between terminals detecting unit, it is connected with above-mentioned 3rd lead-out terminal and the 4th lead-out terminal, detect by apply from above-mentioned pulse voltage generation unit pulse voltage and above-mentioned by the terminal of test coil between the waveform of voltage between terminals that produces, identifying unit, it judges above-mentioned by the quality of test coil based on the measured waveform that above-mentioned voltage between terminals detecting unit detects, and current detecting unit, its detection is flow through above-mentioned by the electric current of test coil, wherein, above-mentioned voltage between terminals detecting unit detects the measured waveform comprised because of the above-mentioned back-emf voltage produced by the resonance of the inductance of test coil and the electrostatic capacitance between above-mentioned 3rd lead-out terminal and above-mentioned 4th lead-out terminal, above-mentioned winding proving installation also possesses above-mentioned pulse voltage generation unit, above-mentioned voltage between terminals detecting unit and above-mentioned identifying unit carry out the control module controlled, above-mentioned control module controls above-mentioned pulse voltage generation unit according to the value of the electric current detected by above-mentioned current detecting unit, make to flow through the value that the above-mentioned value by the electric current of test coil becomes the electric current preset.

In addition, the feature of winding proving installation of the present invention is, possess: the first lead-out terminal and the second lead-out terminal, this first lead-out terminal can be connected the first concentric cable with the second lead-out terminal, and this first concentric cable is for being executed alive applying voltage test cable between the terminal of test coil; 3rd lead-out terminal and the 4th lead-out terminal, the 3rd lead-out terminal can be connected the second concentric cable with the 4th lead-out terminal, and this second concentric cable is above-mentioned by the detection voltage test cable of measuring voltage produced between the terminal of test coil for being received in; Pulse voltage generation unit, it produces to above-mentioned by the pulse voltage applied between the terminal of test coil, and outputs to above-mentioned first lead-out terminal and the second lead-out terminal; Voltage between terminals detecting unit, it is connected with above-mentioned 3rd lead-out terminal and the 4th lead-out terminal, detect by apply from above-mentioned pulse voltage generation unit pulse voltage and above-mentioned by the terminal of test coil between the waveform of voltage between terminals that produces; Identifying unit, it judges above-mentioned by the quality of test coil based on the measured waveform that above-mentioned voltage between terminals detecting unit detects; And current detecting unit, its detection is flow through above-mentioned by the electric current of test coil, wherein, above-mentioned voltage between terminals detecting unit detects the measured waveform comprised because of the above-mentioned back-emf voltage produced by the resonance of the inductance of test coil and the electrostatic capacitance between above-mentioned 3rd lead-out terminal and above-mentioned 4th lead-out terminal, above-mentioned current detecting unit detects and flows through above-mentioned by the pulse current of test coil, and above-mentioned identifying unit is based on judging above-mentioned by the characteristic of test coil to the phase place of the above-mentioned pulse voltage that applied by test coil and above-mentioned pulse current.

the effect of invention

According to the present invention, by using four terminal mensurations of two concentric cable to measure back-emf voltage, can be carried out high precision with sufficiently high voltage by test coil and test at high speed therefore for low inductance.

Accompanying drawing explanation

Fig. 1 is the block diagram of the structure of the winding proving installation represented involved by the first embodiment of the present invention.

Fig. 2 be the pulse voltage generating unit of winding proving installation involved by the first embodiment apply pulse voltage, when to the voltage between terminals detected by voltage between terminals testing circuit when being applied with pulse voltage by test coil and the oscillogram of electric current detected by current detection circuit.

Fig. 3 is the schematic diagram of four terminal test circuits of the use concentric cable of the winding proving installation illustrated involved by the first embodiment, a () represents four terminal test circuits of the winding proving installation of present embodiment, (b) represents the two-terminal test circuit as comparative example.

Fig. 4 illustrates the oscillogram utilizing the pulse waveform of back-emf voltage to test in the winding proving installation involved by the first embodiment, a () represents the pulse waveform based on back-emf voltage of the winding proving installation of present embodiment, (b) represents the pulse waveform as the hollow coil of 1 μ H of comparative example.

Fig. 5 is the process flow diagram of the voltage rise insulation breakdown test action of the winding proving installation represented involved by the first embodiment.

Fig. 6 is the oscillogram of the reference waveform of the voltage rise insulation breakdown test of the winding proving installation illustrated involved by the first embodiment.

Fig. 7 is the oscillogram of the decision content of the test result of the winding proving installation illustrated involved by the first embodiment.

Fig. 8 is the oscillogram illustrating that the high speed of being undertaken by comparison peak threshold voltage of winding proving installation involved by the first embodiment is judged.

Fig. 9 is the block diagram of the structure of the winding proving installation represented involved by the second embodiment of the present invention.

Figure 10 is the oscillogram by controlling to apply the pulse evaluation assessment that electric current carries out of the winding proving installation illustrated involved by the second embodiment.

description of reference numerals

100,200: winding proving installation; 110: pulse voltage generating unit (pulse voltage generation unit); 111: high voltage generation circuit; 112: high-voltage capacitor; 113: high voltage switching circuit; 114: gate pulse control circuit; 120: voltage between terminals testing circuit (voltage between terminals detecting unit); 130,230:A/D converter; 140: testing and control portion; 141: control part (identifying unit, control module); 142: high voltage control circuit; 143: operation inputting part; 144: display part; 145: peripheral equipment control portion; 151: lead-out terminal (the first lead-out terminal); 152: lead-out terminal (the second lead-out terminal); 153: lead-out terminal (the 3rd lead-out terminal); 154: lead-out terminal (the 4th lead-out terminal); 161: concentric cable (applying voltage test cable); 162: concentric cable (detecting voltage test cable); 220: current detection circuit (current detecting unit).

Embodiment

Below, embodiments of the present invention are described in detail with reference to accompanying drawing.

(the first embodiment)

Winding proving installation 100 shown in Fig. 1, for being applied electric energy as tested object in a pulsed fashion by test coil M, using being obtained as waveform by the both end voltage of test coil M now, judges by the state of test coil M (quality).

For this reason, winding proving installation 100 is configured to possess pulse voltage generating unit 110 (pulse voltage generation unit), voltage between terminals testing circuit 120 (voltage between terminals detecting unit), A/D converter 130, testing and control portion 140 and lead-out terminal 151 (the first lead-out terminal), lead-out terminal 152 (the second lead-out terminal), lead-out terminal 153 (the 3rd lead-out terminal), lead-out terminal 154 (the 4th lead-out terminal).

Be connected with the lead-out terminal 151 ~ 154 of winding proving installation 100 by concentric cable 161,162 by test coil M.

In this manual, the electric energy exported in a pulsed fashion is called pulse voltage, pulse current or pulse waveform.

[pulse voltage generating unit 110]

Pulse voltage generating unit 110 is for generation of pulse voltage and be supplied to by test coil M, possesses high voltage generation circuit 111, high-voltage capacitor 112, the high voltage switching circuit 113 be made up of thyristor etc. and gate pulse control circuit 114.The charge accumulation that theres is provided from high voltage generation circuit 111 to high-voltage capacitor 112, utilizes high voltage switching circuit 113 to carry out switch to this accumulated electric charge, produces high voltage pulse (pulse voltage) thus by pulse voltage generating unit 110.

High voltage generation circuit 111 is filled with electric charge to high-voltage capacitor 112.In high voltage generation circuit 111, produce the high voltage that can carry out the degree (usual a few kV) of the Insulation test of general coil.

The electric charge provided from high voltage generation circuit 111 accumulated by high-voltage capacitor 112, by the on-off action (gate pole control) of high voltage switching circuit 113, releases the electric charge accumulated instantaneously.The condenser capacity of high-voltage capacitor 112 is such as 0.01 μ F.

High voltage switching circuit 113 makes the electric charge of accumulation in high-voltage capacitor 112 release instantaneously by on-off action (gate pole control), produces high voltage pulse thus.High voltage switching circuit 113 is such as made up of thyristor (Thyristor).When being formed high voltage switching circuit 113 with thyristor, anode is connected with high-voltage capacitor 112, negative electrode is connected with high voltage switching circuit 113 outgoing side, gate pole is connected with gate pulse control circuit 114, from gate pole to cathodic circulation gate current, make conducting between anode and negative electrode (turn on) thus.Thyristor becomes non-conduction (cut-off) state automatically flowing through the time point with the side's electric current in the opposite direction from anode to negative electrode, there is no need for the special circuit making it end.In addition, also can replace above-mentioned thyristor, and form high voltage switching circuit 113 by other on-off elements such as MOSFET (metal-oxide-semiconductorfield-effect transistor: mos field effect transistor).

Gate pulse control circuit 114 applies predetermined pulse according to the instruction from control part 141 to the gate pole of high voltage switching circuit 113 (in this case thyristor), controls thus to the conducting state of thyristor and cut-off state.

At this, by the high voltage pulse produced from pulse voltage generating unit 110, the electric charge be charged in high-voltage capacitor 112 becomes 0 with the charging voltage applied.Therefore, if high-voltage capacitor 112 during the termination of high voltage pulse in be constantly charged electric charge from high voltage generation circuit 111, just can produce high voltage pulse (pulse action) continuously.

[voltage between terminals testing circuit 120]

Voltage between terminals testing circuit 120 is made up of voltage divider etc., detect the pulse voltage produced from pulse voltage generating unit 110 be applied to by during test coil M by the voltage (voltage be applied between terminal, voltage between terminals) between the terminal of test coil M.

In addition, voltage between terminals testing circuit 120 is connected with lead-out terminal 153,154, and lead-out terminal 153,154 is connected to by the two ends of test coil M via the concentric cable 162 with electrostatic capacitance (wiring capacitance C).By this structure, voltage between terminals testing circuit 120 detect from pulse voltage generating unit 110 to when being applied with high voltage pulse by test coil M because of by the inductance L of test coil M and concentric cable 162 the electrostatic capacitance (wiring capacitance C) that has and the back-emf voltage produced between by the terminal of test coil M, then detect to depend on by the inductance L of test coil M and concentric cable 162 the resonance frequency of electrostatic capacitance (wiring capacitance C) that has carry out the voltage (resonant vibration voltage) that vibrates.

[A/D converter 130]

A/D converter 130 is converted to digital signal by what detected by voltage between terminals testing circuit 120 by the voltage between terminals of test coil M, and is input to the control part 141 in testing and control portion 140.As mentioned above, comprise in voltage between terminals because of by the inductance L of test coil M and concentric cable 162 the electrostatic capacitance (wiring capacitance C) that has and the back-emf voltage produced and with depend on by the inductance L of test coil M and concentric cable 162 the resonance frequency of electrostatic capacitance (wiring capacitance C) that has carry out the voltage (resonant vibration voltage) that vibrates.In addition, the waveform of the voltage between terminals comprising this back-emf voltage and resonant vibration voltage is referred to as measured waveform.

[testing and control portion 140]

Testing and control portion 140 controls for unifying winding proving installation 100 entirety, and the pulse voltage of pulse voltage generating unit 110 produces timing etc. and controls, and is also performed waveform processing, determination processing and waveform Graphics Processing based on detected by the voltage between terminals of test coil M.For this reason, testing and control portion 140 possesses control part 141 (identifying unit, control module), high voltage control circuit 142, operation inputting part 143, display part 144 and peripheral equipment control portion 145.

Control part 141 has following function: judged by the decision-making function of the quality of test coil M based on detected by the measured waveform of test coil M; And pulse voltage generating unit 110, A/D converter 130 and above-mentioned decision-making function carry out the controlling functions that controls.Control part 141 is configured to comprise CPU (CentralProcessing Unit: CPU (central processing unit)), ROM (Read Only Memory: ROM (read-only memory)), RAM (Random Access Memory: random access memory), CPU by the control program preserved in ROM being launched and performed in RAM realize above-mentioned decision-making function and controlling functions.

High voltage control circuit 142 exports according to the control signal from control part 141 steering order controlled high voltage generation circuit 111.

Operation inputting part 143, for inputting for carrying out by the various setting of the test of test coil M and operation information, comprises action button, operation driver plate, pattern/scope change-over switch etc.

Display part 144 for showing for by the applying voltage waveform of the test of test coil M, current waveform, measured waveform, reference waveform, setup parameter and result of determination etc., such as, is made up of LCD, CRT monitor and control and drive system etc.

Peripheral equipment control portion 145, according to the settling signal from control part 141, controls to carry out to next chip inductor (by test coil M) processor (handler) that switches.

[lead-out terminal 151 ~ 154]

Lead-out terminal 151 (the first lead-out terminal) exports with the hot side of pulse voltage generating unit 110 and is connected, and lead-out terminal 152 (the second lead-out terminal) exports with the low potential side of pulse voltage generating unit 110 (in the present embodiment for GND ()) be connected.In addition, lead-out terminal 153 (the 3rd lead-out terminal) is connected with voltage between terminals testing circuit 120 respectively with lead-out terminal 154 (the 4th lead-out terminal).

When carrying out four terminals and measuring, connecting coaxial cable 161 (applying voltage test cable) on lead-out terminal 151,152, connecting coaxial cable 162 (detecting voltage test cable) on lead-out terminal 153,154.In detail, the outgoing side of pulse voltage generating unit 110 is connected to by one end of test coil M via the inner conductor 161a of lead-out terminal 151 and concentric cable 161, and the GND of pulse voltage generating unit 110 is connected to by the other end of test coil M via the external conductor 161b of lead-out terminal 152 and concentric cable 161.The measurement terminal of voltage between terminals testing circuit 120 is connected to by one end of test coil M via the inner conductor 162a of lead-out terminal 153 and concentric cable 162, and the measurement terminal of voltage between terminals testing circuit 120 is connected to by the other end of test coil M via the external conductor 162b of lead-out terminal 154 and concentric cable 162.Thus, by the inner conductor 162a of the inner conductor 161a of connecting coaxial cable 161 on one end of test coil M and concentric cable 162, by the external conductor 162b of the external conductor 161b of connecting coaxial cable 161 on the other end of test coil M and concentric cable 162.

[concentric cable 161,162]

Concentric cable 161 is the applying voltage test cables forming the path applying voltage.Concentric cable 162 is the detection voltage test cables forming the path detecting voltage.A concentric cable 161 one terminal is connected with the lead-out terminal 151,152 of winding proving installation 100, and another terminal is connected with by the two ends of test coil M.In addition, a concentric cable 162 one terminal is connected with the lead-out terminal 153,154 of winding proving installation 100, and another terminal is connected with by the two ends of test coil M.

As shown in Figure 1, from winding proving installation 100 side, lead-out terminal 151 ~ 154 with carried out four terminals by the two ends of test coil M by concentric cable 161,162 and be connected.

Concentric cable 161,162 has electrostatic capacitance (wiring capacitance C) and resistance value R.Be connected to and become by the LCR circuit formed by the electrostatic capacitance (wiring capacitance C) of the inductance L of test coil M, concentric cable 161,162 and resistance value R by the concentric cable 161,162 of test coil M.

[by test coil M]

By the coil component that test coil M is the ultra-low inductances such as chip inductor (1 below μ H).

Below, the action of the winding proving installation 100 formed as described above is described with reference to Fig. 2 (suitably with reference to Fig. 1).

First, the summary of the pulse test of winding proving installation 100 is described.

Fig. 2 be the pulse voltage of being undertaken by pulse voltage generating unit 110 applying, in the oscillogram to the voltage between terminals detected by voltage between terminals testing circuit 120 when being applied with pulse voltage by test coil M, the electric current detected by not shown current detection circuit.Longitudinal axis power taking pressure (V) and electric current (mA), transverse axis is got the time (μ sec).The left side of Fig. 2 represents the pulse waveform to being applied by test coil M, the right side of Fig. 2 represent apply pulse waveform after by the both end voltage of test coil M and current waveform.

What use in the measurement of the test waveform shown in Fig. 2 is ultra-low inductance (1 below μ H) by test coil M, magnetically saturated coil component does not occur core.In addition, pulse voltage generating unit 110 is the pulse voltage applying voltage-10V to the applying voltage applied by test coil M.The applying peak value of this pulse voltage is-10V.Current waveform lags behind voltage waveform, and current peak is-2.8A.

As shown in Figure 2, pulse voltage generating unit 110 is to the pulse voltage being applied negative polarity by test coil M.

If pulse voltage apply start time (i), pulse voltage applying peak value (-10V) time (ii), current peak (about-2.8A) time (iii), high voltage switching circuit 113 thyristor cut off (iv).The above-mentioned moment (i ~ iv) is the one-period applying waveform, and applying pulsewidth is about 1.5 μ sec.

As shown in Figure 2, when during applying pulsewidth about 1.5 μ sec to applied by test coil M the applying peak value-10V of pulse voltage, current peak about-2.8A electric energy time, the crest voltage of maximum-17V is applied to by the two ends of test coil M in very short time.

As shown in Figure 2, during the one-period (i ~ iv) applying waveform, voltage waveform is roughly symmetrical relative to the zero point of negative peak and positive peak.Delayed relative to voltage waveform about 90 degree of current waveform, and electric current also produces cause because of overshoot (overshoot) delayed, and thyristor cut off (iv) thyristor intersected at voltage waveform and current waveform ends.

As shown in the crest voltage (V) of Fig. 2, ended by thyristor, be accumulated in and become back-emf voltage by the electric energy in test coil M, become the voltage of more than applying voltage and be output, crest voltage is now test voltage (setting voltage).The crest voltage produced because of this back-emf voltage is about-17V.

As shown in Figure 2, the pulse with the spike shape of this crest voltage is due to the tested loss of coil M inside, the loss of internal resistance and along with the waveform of time decay.Voltage waveform, owing to being vibration, is therefore also referred to as vibration voltage, until the time of the vibration convergence of vibration voltage is about 40 μ sec.

Like this, when being applied in high voltage pulse by the two ends of test coil M, by the two ends of test coil M, first the back-emf voltage because being produced as spike waveform by the wiring capacitance C of the inductance L of test coil M and concentric cable 162, then produces with based on the voltage (resonant vibration voltage) being undertaken by the resonance frequency of the wiring capacitance C of the inductance L of test coil M and concentric cable 161,162 vibrating, decay gradually in one side.About back-emf voltage, described later by Fig. 4.

In addition, when applying pulse voltage, the electric energy being charged high-voltage capacitor 112 (with reference to Fig. 1) flows through by test coil M quickly, therefore in very short time, flows through big current.But, in fact, the impact of the pressure drop caused by the resistance components of each circuit part and the internal resistance of thyristor, flow through by the electric current of test coil M be theoretical value ten part left and right.In addition, as shown in the waveform attenuating part of Fig. 2, after thyristor cut-off, becoming based on being accumulated in by the electric current of the magnetic energy in test coil M, therefore flowing through by the electric current of test coil M little.

Then, four terminal mensurations of the use concentric cable 161,162 of winding proving installation 100 are described.

[using four terminal mensurations of concentric cable 161,162]

Fig. 3 is the schematic diagram of four terminal test circuits of the use concentric cable 161,162 that winding proving installation 100 is described.(a) of Fig. 3 represents four terminal test circuits of the winding proving installation 100 of present embodiment, and (b) of Fig. 3 represents the two-terminal test circuit as comparative example.

First, the comparative example of (b) of Fig. 3 is described.

As shown in (b) of Fig. 3, the winding proving installation 10 of this comparative example possesses high-voltage pulse power source 11, waveform measurement circuit 12 and lead-out terminal 13,14, and lead-out terminal 13,14 is connected by a concentric cable 15 with by the two ends of test coil M.A terminal of high-voltage pulse power source 11 and waveform measurement circuit 12 is connected to lead-out terminal 13 jointly, and another terminal of high-voltage pulse power source 11 and waveform measurement circuit 12 is connected to lead-out terminal 14 jointly.Lead-out terminal 13 is connected to by one end of test coil M via the inner conductor 15a of concentric cable 15, and lead-out terminal 14 is connected to by the other end of test coil M via the external conductor 15b of concentric cable 15.

The winding proving installation 10 of comparative example is the common two-terminal test circuit in applying path and detection path, measures apply waveform at the two ends of lead-out terminal 13,14.

Therefore, branch is become to be included in test to by the inductance of the test cable (concentric cable 15) test coil M.In addition, when test cable (concentric cable 15) length, high voltage cannot be applied to by the two ends of test coil M.Further, there is following unfavorable condition: to inductance low applied voltage by test coil M time, the pressure drop that produces due to the resistance of the wiring because applying, cannot apply suitable voltage to the two ends of tester.

Then, four terminal test circuits of the winding proving installation 100 shown in (a) of key diagram 3.

As shown in (a) of Fig. 3, winding proving installation 100 uses four terminal mensurations (four terminal test circuits), and this four terminals mensuration employs concentric cable 161,162.Winding proving installation 100 use by applied by test coil M pulse voltage applying voltage path and detect the structure being divided into different paths by the path of the detection voltage of the voltage between terminals at the two ends of test coil M.In detail, in winding proving installation 100, the outgoing side of pulse voltage generating unit 110 is connected to by one end of test coil M via lead-out terminal 151 and the inner conductor 161a of the concentric cable 161 (applying voltage test cable) applied, and the GND of pulse voltage generating unit 110 is connected to by the other end of test coil M via the external conductor 161b of lead-out terminal 152 with the concentric cable 161 applied.The measurement terminal of voltage between terminals testing circuit 120 is connected to by one end of test coil M via the inner conductor 162a of lead-out terminal 153 and measuring concentric cable 162 (detecting voltage test cable), and the measurement terminal of voltage between terminals testing circuit 120 is connected to by the other end of test coil M via the external conductor 162b of lead-out terminal 154 and measuring concentric cable 162.

Like this, winding proving installation 100 forms the four terminal test circuits possessed as different paths in the path in the path and detection voltage that apply voltage, the outgoing side of pulse voltage generating unit 110, lead-out terminal 151,152 and concentric cable 161 are connected to by test coil M by the path of this applying voltage, and voltage between terminals testing circuit 120 input side, lead-out terminal 153,154 and concentric cable 162 are connected to by test coil M by the path of this detection voltage.

Winding proving installation 100 is by applying the path of voltage to the high voltage (pulse voltage) being applied pulse type by the two ends of test coil M.Then, the path by detecting voltage is detected in the crest voltage etc. produced because of back-emf voltage occurred by the two ends of test coil M.

The path detecting voltage is not subject to the impact in the path applying voltage, therefore, it is possible to measure in the voltage between terminals produced by the two ends of test coil M undampedly.

In addition, apply the impact connected up etc. in the path of voltage, by the voltage attenuation at the two ends of test coil M, but this pressure drop to carry out correcting in the path detecting voltage, therefore, it is possible to the voltage set by applying.

In addition, two concentric cable 161,162 are used to by the two ends of test coil M.Concentric cable 161,162 originally its inductance value and resistance value is just few, therefore, it is possible to improve measuring accuracy.

In addition, due to the inductance value of concentric cable 161,162 and resistance value few, be therefore difficult to the impact being subject to cable length, thus high voltage can be applied to by the two ends of test coil M.In other words, can the cable length of prolonging coaxial cable 161,162, therefore, it is possible to improve convenience.

Above, by using the four terminal mensurations (four terminal test circuits) of concentric cable 161,162, can measure accurately in the voltage between terminals produced by the two ends of test coil M.

In addition, in four terminal mensurations, in the past to be used as the supervision terminal etc. that resistance measurement method exists Kelvin's terminal, power circuit.They are all to be corrected to object to the pressure drop applied.Winding proving installation 100 involved by present embodiment is except the correction of above-mentioned pressure drop, different from four terminal mensurations of past case in the following areas: to obtain the back-emf voltage because being caused by the resonance of the wiring capacitance C of the inductance L of test coil M and concentric cable 162 and resonant vibration voltage.

Except as above by by the path of above-mentioned detection voltage with apply except effect that the path of voltage is set to different paths to obtain, in the present embodiment, by concentric cable 161,162 is used as test cable (measurement cable), the pulse waveform of back-emf voltage can also be utilized as following to test.

[utilizing the pulse waveform of back-emf voltage to test]

Fig. 4 is the oscillogram utilizing the pulse waveform of back-emf voltage to test that winding proving installation 100 is described, (a) of Fig. 4 represents the pulse waveform based on back-emf voltage of the winding proving installation 100 of present embodiment, and (b) of Fig. 4 represents the pulse waveform as the hollow coil of 1 μ H of comparative example.In the diagram, the example when pulse voltage being applied with positive polarity is shown.

First, comparative example is described.

As shown in (b) of Fig. 4, when the hollow coil of 1 μ H, apply pulse voltage, detect the voltage between terminals (owing to being vibration, therefore also referred to as vibration voltage) of two terminals of this hollow coil.The waveform of this voltage between terminals is larger, then more can improve accuracy of detection.But when being coil monomer as this hollow coil, the waveform of voltage between terminals (vibration voltage) is little, decay also fast.When the inductance of the coil of test body as this comparative example low (such as 1 below μ H), be difficult to the good measured waveform of the coil obtaining test body.Therefore, need other additional resonance electricity container or apply the pulse of excessive electric energy.

On the other hand, the winding proving installation 100 involved by present embodiment, to by the two ends circulating current of test coil M, detects the response wave shape of the spike be made up of the back-emf voltage produced by making thyristor end.As shown in (a) of Fig. 4, in the present embodiment, by using concentric cable 161,162, the response wave shape being produced the spike be made up of back-emf voltage by the voltage between terminals of test coil M is made.Electrostatic capacitance that this back-emf voltage is had by concentric cable 161,162 (the wiring capacitance C with reference to (a) of Fig. 3) with effectively produced by the resonance of the inductance L of test coil M.The waveform of the spike be made up of back-emf voltage, for being reacted sensitively by the characteristic of test coil M as test body, therefore can carry out highly sensitive test compared with the comparative example shown in (b) of Fig. 4.In addition, by back-emf voltage, low inductance by test coil M in also can make by the two ends of test coil M produce high voltage.

At this, if the waveform of spike just will be produced, as long as then additional resonance electricity container.But according to addition of which type of resonance electricity container, measurement result likely occurs significantly to change.The electrostatic capacitance (the wiring capacitance C with reference to (a) of Fig. 3) that present embodiment has by using concentric cable 161,162, just achieves back-emf voltage without the need to additional resonance electricity container.In addition, in the present embodiment, due to not additional resonance electricity container, therefore, it is possible to obtain, based on by the response wave shape of test coil M characteristic originally, can high-precision test being carried out.Further, large electric energy is not needed, therefore, it is possible to test at high speed when applying pulse voltage.

The design of the wiring capacitance C of above-mentioned use concentric cable 161,162 is the present inventor's Late Cambrian in four terminal mensurations of above-mentioned use concentric cable 161,162.Namely, the present inventor consider low inductance by test coil M because inductance is low whether can and concentric cable 161,162 in carry out resonance between the small wiring capacitance C that exists, by using the four terminal mensurations (four terminal test circuits) of concentric cable 161,162 to carry out the result of testing, obtain good result.In addition, also understood at concentric cable to be that in the two-terminal test circuit of, wiring capacitance is not enough, above-mentioned resonance cannot have been caused.

[reference waveform registration]

When carrying out being evaluated by the proof voltage of test coil M, if be applied with excessive voltage, then insulation breakdown can be there is as test body by test coil M.

In the present embodiment, winding proving installation 100 makes voltage rise gradually while all waveforms applying pulse voltage and obtain store when voltage rise insulation breakdown is tested to passing through, after being punctured by test coil M, reproduce the waveform stored.Below, flow process is further illustrated.

Fig. 5 is the process flow diagram of voltage rise insulation breakdown test (the Break DownVoltage Test) action representing winding proving installation 100.

First, in step sl, the initial value of control part 141 setting voltage rising insulation breakdown test.

In step s 2, high voltage pulse is applied to by the two ends of test coil M via lead-out terminal 151,152 and concentric cable 161 by pulse voltage generating unit 110.As mentioned above, concentric cable 161 is the applying voltage test cable forming the path applying voltage in four terminal mensurations (four terminal test circuits).

In step s3, voltage between terminals testing circuit 120 detects by the voltage between terminals of test coil M (comprising the measured waveform of the voltage between terminals of back-emf voltage and resonant vibration voltage) via concentric cable 162 and lead-out terminal 153,154.Then, the measured waveform detected by voltage between terminals testing circuit 120 is converted to digital signal by A/D converter 130, and is input to control part 141.

In step s 4 which, control part 141 based on the digital signal inputted from A/D converter 130, store by apply pulse voltage and obtain by the measured waveform of test coil M (numerical data).

When to when being applied with high voltage pulse by test coil M, (when measuring the initial stage) is low by the resistance value of test coil M at first, but due to the resonance etc. in four terminal test circuits, proportionally uprised by the electric current of test coil M with flowing through by the resistance value of test coil M.Then, between by the terminal of test coil M, produce to depend on by the inductance L of test coil M and concentric cable 161,162 the resonance frequency of electrostatic capacitance (the wiring capacitance C with reference to (a) of Fig. 3) that has carry out the voltage (resonant vibration voltage) that vibrates.In addition, voltage between terminals testing circuit 120 detected because of the back-emf voltage that produces by the inductance L of test coil M and the resonance of wiring capacitance C of concentric cable 162 being connected to lead-out terminal 153 and 154 at the measurement initial stage.

In step s 5, whether control part 141 judges by test coil M by insulation breakdown.Described later by the details of judgement when insulation breakdown by test coil M.

When insulation breakdown non-by test coil M (step S5: "No"), testing and control portion 140 carries out making applying voltage increase the control of assigned voltage from low-voltage to high voltage at every turn in step s 6.Specifically, the control signal that applying voltage is increased from low-voltage to high voltage is outputted to high voltage control circuit 142 by control part 141, and high voltage control circuit 142 exports corresponding steering order according to this control signal to the high voltage generation circuit 111 of pulse voltage generating unit 110.In addition, when by test coil M by (step S5: "Yes") when insulation breakdown, enter step S7.

In the step s 7, control part 141, after being punctured by test coil M, reproduces the waveform process ends that store.Specifically, control part 141 is after being punctured by test coil M, and by causing the voltage punctured by test coil M, the situation punctured outputs to display part 144.Thus, after being punctured by test coil M, also can using the shape information of the arbitrary waveform before stored reaching punctures as with reference waveform (reference waveform) compare data to register.

Thereby, it is possible to know cause punctured by test coil M voltage, by the situation punctured of test coil M.In addition, after being punctured by test coil M, also can by reached by test coil M puncture before the shape information that stores in advance be registered as reference waveform (reference waveform).

Fig. 6 is the oscillogram of being tested the reference waveform obtained by voltage rise insulation breakdown that winding proving installation 100 is described.

By performing the voltage rise formula insulation breakdown testing process shown in Fig. 5, the reference waveform (reference waveform) shown in Fig. 6 can be obtained.Fig. 6 be make from execute alive voltage 15V be that step-length is to rise to the example of end voltage 30V with 5V.Waveform V1 ~ V3 be insulation breakdown before waveform.Waveform V4 represents the situation producing insulation breakdown and waveform attenuating when applying 25V.In addition, the rising waveform 301 of waveform V1 ~ V3 because being had sharply by the resonance of test coil M before the insulation breakdown of Fig. 6, after reaching the maximum, becomes vibrational waveform 303 through monotone decreasing waveform 302.But, the waveform V4 creating insulation breakdown of Fig. 6 can not become the anxious rising waveform, the vibrational waveform that swash, therefore, it is possible to utilize crest voltage described later (PkStb), waveform area (Area), waveform difference area (Dif.Area) easily to judge.

Like this, preserving all waveforms, reproducing afterwards by making applying voltage rise test, the sound waveform before can adopting insulation breakdown is thus as reference waveform (reference waveform).

[not by being judged by the waveform of the impact of the deviation of test coil M]

In proving installation in the past, for the decision content (judging the parameter of normal product and unacceptable product) when measured waveform and reference waveform being compared, be set to a fixing decision content respectively in positive side and minus side.This causes when skew occurs the tendency due to product normal by the change of batch (lot) of test coil M etc., and decision space diminishes.That is, by the manufacturing process of test coil M, due to batch change etc., sometimes manufacturedly (or under continuous state) certain decision content can be exceeded continuously by the test result of test coil M.Now known, in this case, even if test result exceedes decision content, be also probably certified products by test coil M.Coil component sometimes due to component the reason mechanically such as installation site, engagement state and characteristic can change.Batch in general, change etc. is main cause.As the feature of coil component, even if certain test result exceedes decision content, sometimes also no problem according to purposes, what also can not produce in actual installation is improper.If got rid of described as unacceptable product without exception by test coil M, then percent defective increases, thus causes manufacturing cost to increase.

In the present embodiment, the bound of the decision content of test result is set mutually independently.Thereby, it is possible to eliminate because of a batch not impact for the deviation (movement of decision content) of the test result caused on an equal basis.Specifically, when by the continuous regulation number of the test result of test coil M exceed higher limit, make this higher limit upwards move Rack in side.Even if when also being exceeded this higher limit by the test result of test coil M like this, be judged to be unacceptable product.When being no more than this higher limit by the test result of test coil M, this is judged to be certified products by test coil M.In addition, when the continuous regulation number of the state being no more than the higher limit after moving by the test result of test coil M, higher limit is made to revert to the value of original higher limit.For lower limit too.

Fig. 7 is the oscillogram of the decision content of the test result that winding proving installation 100 is described.In the figure 7, reference waveform (reference waveform), with completely the same by the measured waveform of test coil M, is therefore seen as a waveform.

In the present embodiment, as the judgement of test result, use waveform area (Area) judgement, waveform difference area (Dif.Area) judges and crest voltage (PkStb) judges.

Waveform area (Area) judges to judge by the certified products/unacceptable product of test coil M by benchmark waveform (reference waveform) with by the measured waveform of test coil M relative to the area ratio of time shaft.In Area judges, by by the measured waveform of test coil M relative to the higher limit of the decision content of reference waveform (reference waveform) and lower limit be such as set to respectively ± 10%, be judged to be defective when test result deviate from specified percentage relative to this decision content.In addition, as mentioned above, in the present embodiment, the bound of the decision content judged by Area sets mutually independently.

Waveform difference area (Dif.Area) judges to judge by the certified products/unacceptable product of test coil M by benchmark waveform (reference waveform) with by the waveform difference of the measured waveform of test coil M.As this waveform difference, there is wave height value, phase differential.In Dif.Area judges, such as 30% is set to relative to the higher limit of the decision content of reference waveform by by the measured waveform of test coil M, lower limit is such as set to 0%, is judged to be when test result deviate from specified percentage relative to this decision content defective.

Crest voltage (PkStb) judges to judge by the certified products/unacceptable product of test coil M by benchmark waveform (reference waveform) with by the crest voltage of the measured waveform of test coil M.This crest voltage judges to compare between reference waveform (reference waveform) and the crest voltage of measured waveform, therefore, it is possible to carry out judgement at a high speed.Namely, crest voltage judges owing to being the comparison to value, therefore there is the advantage of the delay caused because of signal transacting do not existed as other judges, and crest voltage is the waveform of the initial appearance in measured waveform, and as the distinctive technology of present embodiment, the crest voltage that produces because of back-emf voltage, therefore there is the advantage that accuracy of detection is high.In PkStb judges, such as set ± 10% respectively by by the crest voltage of test coil M relative to the higher limit of the decision content of reference waveform (reference waveform) and lower limit, be judged to be when test result deviate from specified percentage relative to the decision content of this crest voltage defective.In addition, describe the high speed of being undertaken by comparison peak threshold voltage later by Fig. 8 to judge.

[high speed of being undertaken by comparison peak threshold voltage is judged]

Use crest voltage to carry out had by the judgement of test coil M computing easily, the advantage that judges can be carried out at high speed.The present inventor to reference waveform (reference waveform) with when being compared by the measured waveform of test coil M, confirms respectively to be shown in crest voltage by the significant difference of the inductance of test coil M.

Fig. 8 is the oscillogram illustrating that the high speed of being undertaken by comparison peak threshold voltage of winding proving installation 100 is judged.

The control part 141 (with reference to Fig. 1) in testing and control portion 140 judges by the certified products/unacceptable product of test coil M by benchmark waveform (reference waveform) with by the crest voltage of the measured waveform of test coil M.

As shown in Figure 8, by the decision content (such as-10%) of the crest voltage of the measured waveform 401 of test coil M relative to the crest voltage small leak voltage of reference waveform (reference waveform) 400.When the example of Fig. 8, control part 141 (with reference to Fig. 1) is judged to be that by test coil M be unacceptable product.

In the present embodiment, the crest voltage of comparison other is the crest voltage produced because of back-emf voltage, and therefore the difference of the crest voltage of comparison other is large, and thus accuracy of detection is high.Incidentally, in proving installation in the past, there is not the judgement that the crest voltage produced because of back-emf voltage is compared.

Crest voltage judge due to computing easily and there is not the delay caused because of signal transacting, and crest voltage is the waveform of the initial appearance in measured waveform, therefore, it is possible to judge at high speed.

[parallel processing]

As shown in Figure 1, the pulse voltage generating unit 110 (with reference to Fig. 1) of winding proving installation 100 is filled with high-voltage capacitor 112 by the electric energy of the pulse voltage applied by test coil M, connects (cut-off (TURN OFF) when using thyristor being thyristor) to apply pulse voltage to by test coil M by making high voltage switching circuit 113.In addition, voltage between terminals testing circuit 120 (with reference to Fig. 1) detects by the voltage between terminals of test coil M based on by the response wave shape of test coil M, the voltage between terminals detected is converted to digital signal by A/D converter 130 (with reference to Fig. 1), and is input to the control part 141 (with reference to Fig. 1) in testing and control portion 140.Control part 141 carries out signal transacting according to the measured waveform being converted to digital signal, judges by the certified products/unacceptable product of test coil M.The required time of above-mentioned each operation is discussed.

In the winding proving installation 100 shown in Fig. 1, use high-voltage capacitor 112 (0.011 μ F), when thyristor is used as semiconductor element, the capacitor charge time of high-voltage capacitor 112 is roughly 10msec.In addition, the voltage between terminals detection time of voltage between terminals testing circuit 120 and the waveform to inputting from A/D converter 130 are taken into cost 2msec.In addition, the waveform processing of being undertaken by control part 141, determination processing and waveform display etc. are roughly 8msec.Thus, one after these being added up to is about 20msec by the test duration of test coil M.

In addition, in the test of nearest chip inductor, seek continuously and test at a high speed by carrying out combining with the processor apparatus as peripheral equipment control portion 145 (with reference to Fig. 1).This is continuous and test at a high speed tests more than 600 in specifically one minute.

As mentioned above, the charging of high-voltage capacitor 112, the applying of pulse voltage, waveform is taken into and waveform processing, determination processing and waveform display needed for a series of test durations (about 20msec) in, to high-voltage capacitor 112 charge capacitor charge time (about 10msec) expend time in most.

Thus, continuous high speed test time, this capacitor charge time becomes bottleneck, produce waste stand-by period.

Therefore, in the present embodiment, execution makes capacitor charge time, waveform is taken into and waveform processing, determination processing and waveform show equitant parallel processing.Specifically, winding proving installation 100 pairs of high-voltage capacitors 112 charge (initial one-period needs the duration of charging), in the after-applied pulse voltage of charging complete, carry out waveform and are taken into.In this timing, control part 141 (with reference to Fig. 1) exports to outside device control unit 145 (with reference to Fig. 1) signal applied.Peripheral equipment control portion 145, according to the settling signal from control part 141, is switched to the next one to processor (omitting diagram) and is controlled by the switching of test coil M.

Namely, control part 141 is entering that the waveform undertaken by voltage between terminals testing circuit 120 and A/D converter 130 is taken into, before the process of the waveform processing, determination processing and the waveform that are taken into based on this waveform display, outside device control unit 145 is exported to the signal applied, meanwhile started for the next one by the charging of the high-voltage capacitor 112 of the test of test coil M by high voltage control circuit 142.Carry out for the next one by the charging of the high-voltage capacitor 112 of the test of test coil M during, control part 141 makes the process of current waveform processing, determination processing and the waveform display being taken into by the waveform of test coil M and being taken into based on this waveform complete.

Thus, by making capacitor charge time (about 10msec) be taken into the total ascent time (about 10msec) with the process of waveform processing, determination processing and waveform display for waveform, the cycle of capacitor charge time (about 10msec) can be made to become the cycle (about 10msec) of test duration.Control part 141 has completed the charging to high-voltage capacitor 112 when outputing result of determination, therefore, it is possible to N-free diet method carries out the applying of next pulse voltage temporally.

[not by the test of the impact of the value of L]

Winding proving installation 100 comes to apply pulse voltage to by test coil M by using four terminal measurements of concentric cable 161,162, and the change according to its measured waveform is tested by the property difference of test coil M.Determination processing is reference waveform (reference waveform) and comparing by the measured waveform of test coil M, and specifically the waveform area (Area) of waveform judges, waveform difference (Dif.Area) judges and crest voltage (PkStb) judges.

But, no matter judge at above-mentioned Area (waveform area), waveform difference (Dif.Area) judge and crest voltage (PkStb) judge in which to judge, all newly specify that following opinion.That is, can be shown in measured waveform significantly by the difference of the value slightly of the inductance L of test coil M, the waveform patterns between reference waveform (reference waveform) and measured waveform can significantly offset.In other words, to react and waveform patterns changes by the value tetchiness of the inductance L of test coil M.Being shown in measured waveform by the significant difference of the value of the inductance L of test coil M, is useful in this judgement precision in raising inductance L.Even if but by the value of the inductance L of test coil M existence difference slightly, be also normal product sometimes by test coil M.As the feature of coil component, sometimes no problem according to purposes, what also can not produce in actual installation is improper.If got rid of described as unacceptable product without exception by test coil M, then percent defective increases, thus causes manufacturing cost to increase.

The present inventor contemplates and ignores to a certain extent by the difference of the value of the inductance L of test coil M to judge the difference of waveform patterns.

In the present embodiment, control part 141 obtains the variable quantity of reference waveform (reference waveform) and measured waveform waveform shape separately, compares the ratio that the waveform of respective waveform changes.Specifically, control part 141 obtains continuous print Wave data row based on reference waveform (reference waveform), and differential is carried out to this Wave data row and carrys out computing differential value, obtain the value obtained for the summation of said reference waveform entirety by the differential value calculated, and this value is preserved in advance as reference value.Similarly, control part 141 arranges based on being obtained continuous print Wave data by the measured waveform of test coil M, and this Wave data row are carried out to differential and carry out computing differential value, obtains the value obtained for the summation of above-mentioned measured waveform entirety by the differential value calculated.Then, the reference value obtained based on reference waveform and the value obtained based on measured waveform compare by control part 141, calculate the variable quantity of waveform and the ratio of waveform change thus.Such as, if the reference value obtained based on reference waveform is below defined threshold with the comparative result of the value obtained based on measured waveform, then will be judged to be certified products by test coil M, otherwise be judged to be unacceptable product.

Undertaken by the judgement of the certified products/unacceptable product of test coil M thereby, it is possible to ignore by the difference slightly of the value of the inductance L of test coil M.

In addition, this determination processing can also detect to judge at above-mentioned waveform area (Area), waveform difference area (Dif.Area) judge and crest voltage (PkStb) judge in which judge in be all difficult to determine by the structural defect of test coil M.Such as, when being there is certain defect by the insulated part of test coil M, charge leakage to surrounding material between.And the deterioration aggravation due to change year in year out sometimes of this defect.Which be all difficult to judge in the judgement of this unfavorable condition in above-mentioned waveform area (Area) judgement, waveform difference area (Dif.Area) judgement and crest voltage (PkStb) judge, but confirm by experiment: according to this determination processing, by the ratio value changed by waveform, there is the possibility that can detect.

As discussed above, the winding proving installation 100 of present embodiment possesses: lead-out terminal 151,152, and this lead-out terminal 151,152 can connect for being executed alive concentric cable 161 between the terminal of test coil M; Lead-out terminal 153,154, this lead-out terminal 153,154 can connect for being received in by the concentric cable 162 of the measuring voltage produced between the terminal of test coil M; Pulse voltage generating unit 110, it produces by the pulse voltage applied between the terminal of test coil M, and outputs to lead-out terminal 151,152; Voltage between terminals testing circuit 120, it is connected with lead-out terminal 153,154, detects by applying pulse voltage from pulse voltage generating unit 110 and the waveform of the voltage between terminals produced between by the terminal of test coil M; And testing and control portion 140, it judges by the quality of test coil M based on the measured waveform that voltage between terminals testing circuit 120 detects, and controls above-mentioned each portion.Voltage between terminals testing circuit 120 detect comprise because of by the inductance L of test coil M and be connected to lead-out terminal 153,154 concentric cable 162 the resonance of wiring capacitance C that has and the measured waveform of back-emf voltage that produces.

By this structure, in the present embodiment, be separated into applying voltage by four terminal test circuits and use and detect voltage use, can more correctly measure by the voltage between terminals at the two ends of test coil M thus.Specifically, can to inductance the coil component as the ultra-low inductances such as chip inductor (1 below μ H), direct current resistance all low applied sufficiently high voltage by between the two-terminal of test coil M, carry out by the proof voltage of test coil M test (insulation breakdown test).Such as, can to 1 μ H by test coil M apply more than 1000V.

In addition, by measuring back-emf voltage, highly sensitive test can be carried out at high speed, can also measure the script characteristic that has by test coil M.Such as, can carry out being judged by the quality of test coil M with the shortest test duration 10msec, thus can use on volume production streamline.

In general, when being chip inductor by test coil M, as performance evaluation, require withstand voltage (heating, the fusing etc.) to electric current and the permanance to voltage (withstand voltage, insulation etc.).Even if winding proving installation 100 also can apply high voltage without the need to using high frequency when low by the impedance of test coil M.That is, winding proving installation 100 is to the high voltage being applied pulse type by the two ends of test coil M, even if also can test by the presence or absence etc. of the layer insulation short circuit of test coil M without the need to using high frequency when low by the impedance of test coil M.The voltage and current that winding proving installation 100 can be applied for proof voltage test within a few μ sec such extremely short time is evaluated.

Be applicable to the fine or not proving installation of the coil insulations such as chip inductor, power inductor, power choke coil, motor winding, coil that the number of turn is few.In addition, chip inductor both can be winding type, also can be rete stacked.

(the second embodiment)

Fig. 9 is the block diagram of the structure of the winding proving installation represented involved by the second embodiment of the present invention.To the structure division identical with Fig. 1 mark same tag, omit the explanation of repeating part.

As shown in Figure 9, winding proving installation 200 also possesses on the basis of the winding proving installation 100 of Fig. 1: current detection circuit 220 (current detecting unit), its low potential side being arranged at pulse voltage generating unit 110 exports between (being GND in the present embodiment) and lead-out terminal 152, detects the electric current to being applied by test coil M; And A/D converter 230, the electric current detected by current detection circuit 220 is converted to digital signal by it.

As shown in Figure 9, the control part 141 in testing and control portion 140 is tested being specified applying electric current by test coil M.Specifically, current detection circuit 220 detects and flows through by the pulse current of test coil M when applying pulse voltage.The electric current detected is input to control part 141 after being converted to digital signal by A/D converter 230.Control part 141 carries out following control: based on flowing through of being detected by current detection circuit 220 by the pulse current of test coil M apply with by the specified suitable electric current conformed to of test coil M.

Control part 141 can carry out being applied with when applying pulse voltage with by the test of the specified suitable electric current conformed to of test coil M.

In addition, by pulsed current measurement, can know based on the phase place of the waveform of the waveform of voltage and electric current the property difference that tester is intrinsic.

Figure 10 is the oscillogram illustrated by controlling to apply the pulse evaluation assessment that electric current carries out.

As shown in Figure 10, winding proving installation 200 measurement when applying pulse voltage is flow through by the electric current of test coil M, peak value display current value.

Winding proving installation 200, except being tested by setting applying voltage, can also be set to flow through and be tested by the value of the peak point current of test coil M.

Be described in more detail.

Winding proving installation 200 is when carrying out test action, and the display can carrying out voltage waveform pattern and current waveform pattern switches.

Voltage waveform pattern specifies peak voltage, sets the reference waveform (reference waveform) based on voltage waveform.

Current waveform pattern specifies peak current value, and the electric current carried out based on current waveform adjusts.Thus, the reference waveform (reference waveform) based on voltage waveform is set.

As shown in Figure 10, current waveform and voltage waveform are taken into simultaneously, can overlapping show as waveform.

Above-mentioned current waveform pattern is the reference waveform setting specifying peak current value, automatically carries out adjusting making to become inputted current value.Finally, reference waveform (reference waveform) is set according to the voltage waveform becoming set current value.

Like this, in the present embodiment, winding proving installation 200 possesses and detects current detection circuit 220 to the electric current applied by test coil M, therefore when implementing pulse test, can carry out being applied with by the test of the specified suitable electric current conformed to of test coil M.In addition, by pulsed current measurement, can know that the intrinsic characteristic of tester is different based on the waveform of voltage and the phase place of the waveform of electric current.

The present invention is not limited to above-mentioned embodiment example, only otherwise depart from the aim of the present invention recorded in claims, comprises other variation, application examples.

Such as, understanding above-mentioned embodiment example in detail for ease of the present invention being described with understanding, may not be defined in and possess illustrated all structures.In addition, a part for the structure of certain embodiment example can be replaced into the structure of other embodiment example, and the structure of other embodiment example can be added the structure of certain embodiment example.In addition, for a part for the structure of each embodiment example, that can carry out other structure adds/deletes/displacement.

In addition, such as also can come by carrying out with integrated circuit designing etc. with part or all of the above-mentioned each structure of hardware implementing, function, handling part, processing unit etc.In addition, above-mentioned each structure, function etc. also can by for be explained by processor and the software performing the program realizing respective function realizes.The information realizing the program of each function, table, file etc. can be kept in the pen recorders such as storer, hard disk, SSD (Solid State Drive: solid-state drive) or the recording medium such as IC (Integrated Circuit: integrated circuit) card, SD (Secure Digital: secure digital) card, CD.In addition, in this manual, the treatment step describing the process of time series comprises the process carried out along time series by described order certainly, also comprise and may not temporally sequence carry out processing and the process (such as, parallel processing or object-based process) performed concurrently or independently.

In addition, about control line, information wire, show control line, the information wire thinking and need on illustrating, and not necessarily all control lines, information wire will be shown on product.In fact, can think that nearly all structure is all interconnective.

Claims

1. a winding proving installation, is characterized in that, possesses:

First lead-out terminal and the second lead-out terminal, this first lead-out terminal can be connected the first concentric cable with the second lead-out terminal, and this first concentric cable is for being executed alive applying voltage test cable between the terminal of test coil;

3rd lead-out terminal and the 4th lead-out terminal, the 3rd lead-out terminal can be connected the second concentric cable with the 4th lead-out terminal, and this second concentric cable is above-mentioned by the detection voltage test cable of measuring voltage produced between the terminal of test coil for being received in;

Pulse voltage generation unit, it produces to above-mentioned by the pulse voltage applied between the terminal of test coil, and outputs to above-mentioned first lead-out terminal and the second lead-out terminal;

Voltage between terminals detecting unit, it is connected with above-mentioned 3rd lead-out terminal and the 4th lead-out terminal, detect by apply from above-mentioned pulse voltage generation unit pulse voltage and above-mentioned by the terminal of test coil between the waveform of voltage between terminals that produces; And

Identifying unit, it judges above-mentioned by the quality of test coil based on the measured waveform that above-mentioned voltage between terminals detecting unit detects,

Wherein, above-mentioned voltage between terminals detecting unit detects the measured waveform comprised because of the above-mentioned back-emf voltage produced by the resonance of the inductance of test coil and the electrostatic capacitance between above-mentioned 3rd lead-out terminal and above-mentioned 4th lead-out terminal,

The reference waveform utilizing reference coil to obtain and the above-mentioned measured waveform by test coil compare by above-mentioned identifying unit, converge in upper and lower threshold range according to side-play amount and be judged to be that above-mentioned is certified products by test coil, and, when specified quantity appears in the above-mentioned defective judgement by test coil continuously, above-mentioned upper and lower threshold range is moved to there is not underproof side.

2. a winding proving installation, is characterized in that, possesses:

Above-mentioned identifying unit obtains first wave graphic data row based on the reference waveform utilizing reference coil to obtain, differential is carried out calculate the first differential value to this first wave graphic data row, preserve the value that obtained for the summation of above-mentioned reference waveform entirety by the first differential value calculated in advance as reference value, and

Above-mentioned identifying unit obtains Second Wave graphic data row based on above-mentioned measured waveform, carries out differential to calculate the second differential value to this Second Wave graphic data row, obtains the value obtained for the summation of above-mentioned measured waveform entirety by the second differential value calculated,

The said reference value obtained based on above-mentioned reference waveform and the value obtained based on above-mentioned measured waveform compare by above-mentioned identifying unit, if side-play amount is below defined threshold, will be judged to be certified products, otherwise be judged to be unacceptable product by test coil.

3. a winding proving installation, is characterized in that, possesses:

Voltage between terminals detecting unit, it is connected with above-mentioned 3rd lead-out terminal and the 4th lead-out terminal, detect by apply from above-mentioned pulse voltage generation unit pulse voltage and above-mentioned by the terminal of test coil between the waveform of voltage between terminals that produces;

Identifying unit, it judges above-mentioned by the quality of test coil based on the measured waveform that above-mentioned voltage between terminals detecting unit detects; And

Current detecting unit, its detection is flow through above-mentioned by the electric current of test coil,

Above-mentioned winding proving installation also possesses the control module controlled above-mentioned pulse voltage generation unit, above-mentioned voltage between terminals detecting unit and above-mentioned identifying unit,

Above-mentioned control module controls above-mentioned pulse voltage generation unit according to the value of the electric current detected by above-mentioned current detecting unit, makes to flow through the value that the above-mentioned value by the electric current of test coil becomes the electric current preset.

4. a winding proving installation, is characterized in that, possesses:

Above-mentioned current detecting unit detection is flow through above-mentioned by the pulse current of test coil,

Above-mentioned identifying unit is based on judging above-mentioned by the characteristic of test coil to the phase place of the above-mentioned pulse voltage that applied by test coil and above-mentioned pulse current.

5. the winding proving installation according to any one in Claims 1-4, is characterized in that,

Electrostatic capacitance between above-mentioned 3rd lead-out terminal and above-mentioned 4th lead-out terminal is the wiring capacitance that above-mentioned second concentric cable has.

6. the winding proving installation according to any one in Claims 1-4, is characterized in that,

Above-mentioned pulse voltage generation unit possesses the thyristor ended by reversal of poles, produces pulse voltage by the cut-off of this thyristor.

7. winding proving installation according to claim 1 and 2, is characterized in that,

Above-mentioned identifying unit by the size of the waveform area of more above-mentioned reference waveform and above-mentioned measured waveform, waveform difference area and peak value at least any one judges above-mentioned by the quality of test coil.

8. the winding proving installation according to any one in claim 1,2,4, is characterized in that,

Above-mentioned pulse voltage generation unit produces above-mentioned pulse voltage by capacitor charging process,

This winding proving installation also possesses the control module controlled above-mentioned pulse voltage generation unit, above-mentioned voltage between terminals detecting unit and above-mentioned identifying unit,

Waveform in capacitor charging process in above-mentioned pulse voltage generation unit, above-mentioned voltage between terminals detecting unit is taken in waveform processing in process, above-mentioned identifying unit and determination processing,

Above-mentioned control module does not wait for that above-mentioned capacitor charging process completes, just perform above-mentioned waveform be taken in process, above-mentioned waveform processing and above-mentioned determination processing at least more than any one.

9. the winding proving installation according to claim 3 or 8, is characterized in that,

Above-mentioned control module controls, and makes above-mentioned pulse voltage generation unit make pulse voltage increase gradually from low-voltage to high voltage,

Above-mentioned identifying unit stores the measured waveform obtained by making pulse voltage rise gradually from low-voltage to high voltage, above-mentioned breakdown by test coil after, reproduce this waveform of storing.