CN104656117B - Method for identifying proton or alpha particle with fully-depleted silicon detector - Google Patents
Method for identifying proton or alpha particle with fully-depleted silicon detector Download PDFInfo
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- CN104656117B CN104656117B CN201510046357.8A CN201510046357A CN104656117B CN 104656117 B CN104656117 B CN 104656117B CN 201510046357 A CN201510046357 A CN 201510046357A CN 104656117 B CN104656117 B CN 104656117B
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- 239000002245 particle Substances 0.000 title claims abstract description 64
- 238000000034 method Methods 0.000 title claims abstract description 38
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 17
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 17
- 239000010703 silicon Substances 0.000 title claims abstract description 17
- 238000001228 spectrum Methods 0.000 claims abstract description 11
- LBDSXVIYZYSRII-IGMARMGPSA-N alpha-particle Chemical compound [4He+2] LBDSXVIYZYSRII-IGMARMGPSA-N 0.000 claims description 25
- 230000009466 transformation Effects 0.000 claims description 8
- 230000015572 biosynthetic process Effects 0.000 claims description 5
- 230000002596 correlated effect Effects 0.000 claims 1
- 238000012545 processing Methods 0.000 abstract description 2
- 238000004458 analytical method Methods 0.000 description 10
- 238000002474 experimental method Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 3
- 230000005658 nuclear physics Effects 0.000 description 3
- 238000002315 alpha-particle spectrum Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000002366 time-of-flight method Methods 0.000 description 2
- 244000187801 Carpobrotus edulis Species 0.000 description 1
- 241000196324 Embryophyta Species 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 229910052770 Uranium Inorganic materials 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 210000001367 artery Anatomy 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 238000004347 surface barrier Methods 0.000 description 1
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 description 1
- 210000003462 vein Anatomy 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
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Abstract
The invention provides a method for identifying a proton or an alpha particle with a fully-depleted silicon detector. The method is characterized by comprising the following steps: injecting a particle to be detected into the fully-depleted silicon detector, and recording energy E of the particle and the frequency spectrum of an obtained pulse signal; calculating an identification parameter k according to the amplitude ratio of a harmonic wave component to a direct current component at 7.8 MHz in the frequency spectrum of the pulse signal; taking the energy E as an abscissa and taking the identification parameter k of the particle as an ordinate to obtain a point in a plain; if the point is above an identification straight line tau, identifying that the particle is the alpha particle; if the point is below the identification line tau, identifying that the particle is the proton. Compared with the conventional time-domain identification method, the method provided by the invention needs no dedicated de-noising processing, and is higher in anti-noise capability and proton/alpha particle identification performance.
Description
Technical field
The invention belongs to charged particle detection technical field, it is related to one kind and utilizes complete depletion type silicon detector, by analysis
Its frequency domain characteristic carries out proton and alpha-particle discriminates method for distinguishing.
Background technology
The examination of charged particle is by space radiation protection, Space environment monitor, particle event forecast, space science spy
Rope and the important foundation studied, are also the important guarantee of nuclear physics experiment and Radionuclide analysis.Traditional charged particle discriminating method
Mainly detector telescope method, time-of-flight method, magnetic analysis method and coulostatic analysis method etc., are shown in《Nuclear Physics experiment side
Method》, Beijing：Atomic Energy Press, 1985.Detector telescope method and time-of-flight method are simple due to equipment, identification result
Preferably, many detectors are obtained for application.But telescope method requires particle to have enough energy and passes through transmission detection
Device, detection threshold energy is higher, and flight time rule can only measure the quality information of particle, and charge information cannot obtain.Impulse wave
Conformal analysis method (Pulse Shape Analysis, PSA) is shown in " Identification of light charged
particles and heavy ions in silicon detectors by means of pulse shape
Discrimination ", IEEE Trans.Nucl.Sci, 1996,43 (3):1097-1101, relatively low due to detecting threshold energy, only
Need one piece of sufficiently thick detector, and the particle information comprising is enriched, thus more and more paid attention to, in charged particle
More and more applied in examination.Have been presented for many kind pulse form analysis methods at present, including integral charge method, rising
Time Method, Peak Intensity Method etc., but these are all time domain approachs, and frequency domain method is also unmanned in terms of charged particle examination at present
Propose.
It has been used for the frequency spectrum analysis method that neutron/γ screens, seen that " one kind utilizes liquid scintillation bulk detector to patent of invention
Screen neutron and gamma-ray method ", patent No. ZL201010049329.9, authorize time in August, 2013, this patent belongs to non-
Powered neutron, the examination of γ, and the present invention be directed to charged particle, especially proton, alpha-particle and propose, the work of the two
Different with object.Additionally, neutron/γ screens selects liquid scintillation bulk detector, and the present invention adopts semiconductor silicon detector, visits
Survey means are different.
Time-domain signal is converted to frequency-region signal by Fourier transformation, is a kind of highly useful signal analysis instrument.Pass through
Impulse waveform after experiment measurement proton and alpha-particle incidence complete depletion type silicon detector, carries out Fourier transformation to it, obtains two
Plant the frequency spectrum of particle.Find after analysis to be screened using the ratio of the Fourier transformation value on two Frequency points.At present, also
Have not seen that open source literature relates to the use of FRA (Frequency Ratio Analysis, frequency ratio is analyzed) method by using complete
Depletion type silicon detector carries out charged particle examination.
Content of the invention
The present invention provides a kind of method that utilization complete depletion type silicon detector screens proton and alpha-particle, first by frequency domain side
Method introduces among charged particle examination, is screened using complete depletion type silicon detector, significantly improves examination effect.
The technical scheme is that：
Known particle to be measured is one of proton and alpha-particle, and particle to be measured is injected in complete depletion type silicon detector, note
Record pulse signal and its crest amplitude of the formation of this particle.Obtain particle energy E using crest amplitude, pulse signals carry out Fu
In leaf transformation, obtain the frequency spectrum of pulse signal.Using harmonic component X at 7.8MHz in pulse signal frequency spectrum7.8With DC component
The ratio of X (0) amplitude calculates screens parameter k：
With ENERGY E as abscissa, the k value of particle is vertical coordinate, obtains a point in plane.If this point is located at differentiating directly
On line τ, it is alpha-particle；If this point is located at differentiating under straight line τ, it is proton.Wherein, differentiate that the selection of straight line τ needs
Experimental data is demarcated and is drawn, concrete grammar is listed in embodiments.
Following technique effect can be reached using the present invention：
1. screen present invention firstly provides charged particle is introduced using complete depletion type silicon detector, carry out proton/alpha-particle and discriminate
Not, there is very strong novelty.
2. the characteristic parameter that the present invention extracts in a frequency domain is only made up of low-frequency component, the arteries and veins therefore high-frequency noise being caused
Rush alteration of form insensitive, compared with traditional time domain discriminating method, denoising Processing that need not be special, there is stronger anti-noise
Ability, has preferable proton/alpha-particle and screens performance.
3. the characteristic parameter in the inventive method only chooses DC component X (0) and X in Fourier space7.8, amount of calculation
Little, therefore it is easy to be implemented in combination with real-time charged particle examination with embedded system.
Brief description
The schematic flow sheet of the specific embodiment of the FRA method that Fig. 1 provides for the present invention；
Fig. 2 is the pulse scatterplot of known type particle (proton and alpha-particle).
Fig. 3 is the scattergram of the proton and alpha-particle being obtained using FRA principle.
Specific embodiment
The FRA method that Fig. 1 provides for the present invention be embodied as schematic flow sheet.Flow process can be divided into learning process and screen
Journey two parts：
Learning process is to be carried out using the particle of known type, and main purpose is to determine judgement threshold τ.First, choose N (N
>=1000) particle of individual known type, the number of wherein proton isThe number of alpha-particle isAll particles are injected one
Individual complete depletion type silicon detector, obtains pulse signal.Record the crest amplitude of the pulse signal of each particle formation, thus obtaining
Particle energy E；Pulse signals carry out Fourier transformation, calculate examination parameter k of the pulse signal of each particle formation.So
Afterwards, with the ENERGY E of each particle as transverse axis, with corresponding particle discrimination parameter k as the longitudinal axis, make pulse scatterplot.Dissipate in pulse
Point in figure determines straight line τ, makes two kinds of particles be located at the both sides of straight line τ respectively, and makes wrong gradation subnumber minimum.
Examination process is that the particle to UNKNOWN TYPE is carried out.Particle to any one UNKNOWN TYPE, is injected complete
Depletion type silicon detector, records the crest amplitude of the pulse signal of this particle formation, obtains corresponding particle energy E, calculates this grain
Examination parameter k of the pulse signal that son is formed.If (E, k) ＞ τ then it is assumed that this particle be alpha-particle, if (E, k)≤τ, then
Think that this particle is proton.Wherein, judgement threshold τ is straight line determined by above-mentioned learning process, (E, k) ＞ τ represent point (E, k)
Positioned at the top of straight line τ, (E, k)≤τ represent point, and (E, k) not above straight line τ.
In order to preferably explain the present invention it is necessary to carry out experimental verification, grind in Mianyang, Sichuan China gongwu for this
Study carefully institute's nuclear physics and complete this work with chemistry institute.In experiment, alpha-particle is by removing235The natural uranium plating piece decay of U is produced
Raw, and proton then passes through252The neutron bombardment polyethylene film that Cf neutron source decay produces obtains.The proton producing and alpha-particle
Incide ORTEC B-017-150-300 type fully- depleted Au Si surface barrier detector from rear end, through preamplifier, fast amplification
Device and digital collection equipment etc., then be connected with computer by ICP/IP protocol, pulse signals carry out Fourier transformation, see
Examine the spectrum curve of proton and alpha-particle, choose the corresponding sampled point of 7.8MHz and calculate examination parameter k, finally use the inventive method
Obtain pulse scatterplot.The sample frequency of the digital collection equipment in this experiment is 2GS/s, 12, have chosen near peak value
256 sample points carry out Fourier transformation, the spectrum curve 7.8MHz respective frequencies sample point 1 obtaining, calculate screen parameter
k.Fig. 2 is the pulse scatterplot being obtained using 4000 particles of known type.X-axis represents the grain corresponding to pulse signal amplitude
Sub- energy, Y-axis represents examination parameter k of corresponding particle.Wherein "○" represents the point of proton determination, and " * " represents what alpha-particle determined
, as can be seen from the figure there is straight line, as judgement threshold τ, proton and alpha-particle be divided into two classes in point, and make wrong gradation subnumber
Minimum.When screening proton and alpha-particle using FRA method, the corresponding particle of point positioned at straight line bottom left section can be determined as proton,
The corresponding particle of point positioned at straight line upper right portion then can be determined as alpha-particle.Calculate each and put the distance differentiating straight line, and
The regulation above each point of straight line is to its distance for just, the following each point of straight line to its distance is negative, can make the distribution of particle event
Figure is as shown in Figure 3.X-axis represents that each point arrives the distance differentiating straight line, and Y-axis represents distribution proportion in these distances for the particle.Figure
The curve that middle solid line represents is the Gauss curve fitting curve of particle distribution.By in figure this it appears that two peaks, represent respectively not
Same particle types, the peak in left side represents proton, and the peak on right side represents alpha-particle, and they are come by examination.Discriminate to evaluate particle
The quality of other method performance, introduces the concept of FOM (Figure of Merit).For Gauss distribution, it can be expressed as：
Wherein, μ1、μ2It is respectively the expected value of particle spectra Gauss distribution, σ1、σ2It is respectively the standard of particle spectra Gauss distribution
Difference.For a kind of discriminating method, FOM value is bigger, and it is better that it screens performance.Proton and alpha particle spectrum Gauss can be obtained by Fig. 3
The expected value and standard deviation of distribution, can calculate FOM value further according to formula (2).The expected value of proton and alpha particle spectrum Gauss distribution divides
It is not -0.06989 and 0.06511, their standard deviation is 0.01612 and 0.01739 respectively, proton and α are screened using FRA method
The FOM value of particle is 1.7140.It has been generally acknowledged that FOM=1 is exactly the marginal value that particle discrimination can be come.Therefore, by reality
Demonstrate feasibility and the effectiveness of the present invention.
Claims (1)
1. a kind of method using complete depletion type silicon detector examination proton and alpha-particle is it is known that particle to be measured is proton and alpha-particle
One of it is characterised in that comprising the steps：
Particle to be measured is injected in complete depletion type silicon detector, records pulse signal and its crest amplitude of this particle formation；Profit
Obtain particle energy E with crest amplitude, pulse signals carry out Fourier transformation, obtain the frequency spectrum of pulse signal；Using pulse
Harmonic component X at 7.8MHz in signal spectrum7.8Calculate with the ratio of DC component X (0) amplitude and screen parameter k, that is,：
With ENERGY E as abscissa, the k value of particle is vertical coordinate, obtains a point in plane；If this point is located at differentiates straight line τ
On, it is alpha-particle；If this point is located at differentiating under straight line τ, it is proton；Wherein, the selection differentiating straight line τ is using
Know that the proton of classification and alpha-particle adopt above-mentioned correlated process to determine.
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| CN103954988A (en) * | 2014-04-03 | 2014-07-30 | 中国科学院高能物理研究所 | Space particle detector and data collecting and processing method thereof |
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| CN103954988A (en) * | 2014-04-03 | 2014-07-30 | 中国科学院高能物理研究所 | Space particle detector and data collecting and processing method thereof |
Non-Patent Citations (7)
| Title |
|---|
| A comparison of different discrimination parameters for the DFT-based PSD method in fast scintillators;G. Liu et al.;《Radiation Measurements》;20131231;第58卷;第12-17页 * |
| A Digital Method for the Discrimination of Neutrons and Rays With Organic Scintillation Detectors Using Frequency Gradient Analysis;Guofu Liu et al.;《IEEE TRANSACTIONS ON NUCLEAR SCIENCE》;20100630;第57卷(第3期);第1682-1691页 * |
| Au-Si面垒探测器及其在鉴别带电粒子研究中的应用;王柱生;《全国第十二届核电子学与核探测技术学术年会论文集》;20041231;第242-244页 * |
| cation using pulse shape discrimination and DE E methods between front and rear side njection in silicon detectors.《Nuclear Instruments and Methods in Physics Research A》.2013,第701卷第145-192页. * |
| N. Le Neindre et al..Comparison of charged particle identifi * |
| 带电粒子鉴别方法的发展与现状;朱金涛等;《核电子学与探测技术》;20140228;第34卷(第2期);第194-199，225页 * |
| 金硅面垒型半导体探测器在α能谱测量中的应用研究;丁卫撑等;《核电子学与探测技术》;20120731;第32卷(第7期);第844-847页 * |
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