CN104655272B - Zeeman background correction light path and its system - Google Patents
Zeeman background correction light path and its system Download PDFInfo
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- CN104655272B CN104655272B CN201510067759.6A CN201510067759A CN104655272B CN 104655272 B CN104655272 B CN 104655272B CN 201510067759 A CN201510067759 A CN 201510067759A CN 104655272 B CN104655272 B CN 104655272B
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Abstract
The present invention relates to a kind of Zeeman background correction light path and its systems.Including：Light source sends out light, stationary magnetic field and atomizer receive the light and transmit light to the first semi-transparent semi-reflecting lens that light source is sent out, first semi-transparent semi-reflecting lens receive light, split the light into the first light beam and the second light beam, and vertically it is reflected into the first total reflection mirror by the first light beam along linear transmission to the first Rochon prism and by the second light beam, first light beam is sent to chopper by the first Rochon prism, first total reflection mirror receives the second light beam and the second light beam is sent to the second Rochon prism, second Rochon prism receives the second light beam and the second light beam is sent to the second total reflection mirror, second light beam is sent to chopper by the second total reflection mirror, chopper machine blocks the light beam of the first light beam and the second light beam one of both by rotary cutting mating plate, and the light beam not being blocked is sent to monochromator and detector.Enhance the stability and reliability of instrument.
Description
Technical field
The present invention relates to optical field more particularly to a kind of Zeeman background correction light paths and its system.
Background technology
Currently, the light path of transverse zeeman background correction includes：Rochon prism mode and Wollaston prism mode.Wherein,
The advantages of Rochon prism mode is：The signal of twice than more consistent, two-beam overlap it is relatively good, the shortcomings that Rochon prism mode
It is：Motor is needed to drive prism rotation that could separate two-beam, the performance of motor largely affects background correction and instrument
The stability of device.And the advantages of Wollaston prism mode, is：Prism is stationary, does not need moving component, and reliability is high, lacks
Putting is：Twice signal conformance is poor, and optical mirror slip is more.Therefore, Rochon prism mode and Wollaston prism mode all exist
Defect.
As shown in Figure 1, the Zeeman background correction light path principle figure of the prior art, including：Light source 1, stationary magnetic field and atom
Change device 2, Rochon prism and electric rotating machine 3 and monochromator and detector 4, wherein the light that light source 1 is sent out passes through atomizer 2
Afterwards, include the light of the light in parallel vibrating direction and vertical vibration direction, to realize that background correction needs to isolate both light
To measure.Currently existing technology is the Rochon prism 3 that light is rotated by one, and Rochon prism 3 is parallel in a certain angle
The light of direction of vibration, along straightline propagation, is received by Rochon prism by detector 4, and the light in vertical vibration direction deviates former propagation side
To cannot be received by detector 4；Rochon prism 3 is rotated by 90 ° the light in rear vertical vibration direction by Rochon prism 3 along straight-line transmitting
It broadcasts, is received by detector 4, and the light in parallel vibrating direction deviates the former direction of propagation and cannot be received by detector.It is achieved in two
Kind light is detached, and timesharing measures.The disadvantages of this solution is：The factors such as motor rotation speed, noise, temperature liter can all influence
Measure stability and reliability.
In view of the above shortcomings, the designer, is actively subject to research and innovation, to found a kind of Zeeman of novel method
Background correction light path makes it with more the utility value in industry.
Invention content
In order to solve the above technical problems, the object of the present invention is to provide a kind of are fixedly mounted using two pieces of Rochon prisms to realize
Light beam separates to enhance the stability of instrument and the Zeeman background correction light path and system of reliability.
The present invention provides a kind of Zeeman background correction light path, including：Light source, stationary magnetic field and atomizer, first is semi-transparent
Semi-reflective mirror, the first Rochon prism, the first total reflection mirror, the second Rochon prism, the second total reflection mirror, chopper and monochromator and
Detector, wherein the light source sends out light, and the stationary magnetic field and atomizer receive the light that the light source is sent out and will be described
Light is sent to first semi-transparent semi-reflecting lens, and first semi-transparent semi-reflecting lens receive the light, the light is divided into the first light beam
With the second light beam, and by first light beam along linear transmission to first Rochon prism and by second light beam along hang down
For histogram to first total reflection mirror is reflected into, the first light beam is sent to the chopper by first Rochon prism, described
First total reflection mirror receives second light beam and second light beam is sent to second Rochon prism, second Lip river
Breast prism receives second light beam and second light beam is sent to second total reflection mirror, second total reflection mirror
Second light beam is sent to the chopper, the chopper machine blocks first light beam and described by rotary cutting mating plate
The light beam of two light beam one of both, and the light beam not being blocked is sent to the monochromator and detector.
Further, above-mentioned Zeeman background correction light path further includes the second semi-transparent semi-reflecting lens, from first total reflection mirror
Second light beam is received, and first light beam is sent to the monochromator and detector.
Further, the mating plate of cutting of above-mentioned chopper is light transmission and total reflection two states, when the chopper is light transmission
When state, receive the first light beam that first Rochon prism is sent, and by first light beam be transparent to the monochromator and
Detector；When the chopper is total reflection state, the second light beam that second total reflection mirror is sent is received, and will be described
Second light beam is reflected into the monochromator and detector.
The present invention provides a kind of Zeeman background correction light path system, including above-mentioned arbitrary Zeeman background correction light path.
According to the above aspect of the present invention, the present invention has at least the following advantages：
Both light path design schemes of the present invention solve dependence of the similar product to high-precision motor, chopper motor
Load it is small, can use small power DC brushless motor, rotating speed is not strict with, Rochon prism of the invention is fixed
Place it is reliable and stable, convenient for adjust and safeguard, Rochon prism fixed placement make optical signal more stablize, improve the property of instrument
Energy.It is expensive due to high-precision motor, and by optical element instead of high-precision motor, reduce whole system at
This.
The above description is merely an outline of the technical solution of the present invention, in order to better understand the technology hand of the present invention
Section, and can be implemented in accordance with the contents of the specification, and with presently preferred embodiments of the present invention and attached drawing be coordinated to be described in detail such as below
Afterwards.
Description of the drawings
Fig. 1 is the structural schematic diagram of the transverse zeeman background correction light path of the prior art；
Fig. 2 is a kind of Zeeman background correction light channel structure schematic diagram of the present invention；
Fig. 3 is the structural schematic diagram of another Zeeman background correction light path of the present invention.
Specific implementation mode
With reference to the accompanying drawings and examples, the specific implementation mode of the present invention is described in further detail.Implement below
Example is not limited to the scope of the present invention for illustrating the present invention.
Shown in referring to figure 2-3, a kind of Zeeman background correction light path, including：Light source 11, stationary magnetic field and atomizer 12,
First semi-transparent semi-reflecting lens 13, the first Rochon prism 14, the first total reflection mirror 15, the second Rochon prism 16, the second total reflection mirror 17,
Chopper 18, the second semi-transparent semi-reflecting lens 19 and monochromator and detector 20, wherein light source 11 sends out light and transmits light to perseverance
Fixed-field and atomizer 12, stationary magnetic field and atomizer 12 receive the light that light source 11 is sent out and to transmit light to first semi-transparent
Semi-reflective mirror 13, the first semi-transparent semi-reflecting lens 13 receive light, split the light into the first light beam and the second light beam, and by the first light beam along straight line
It is sent to the first Rochon prism 14 and the second light beam is vertically reflected into the first total reflection mirror 15, the first Rochon prism
First light beam is sent to chopper 18 by 14, and the first total reflection mirror 15 receives the second light beam and the second light beam is sent to the second Lip river
Breast prism 16, the second Rochon prism 16 receive the second light beam and the second light beam are sent to the second total reflection mirror 17, and second is all-trans
It penetrates mirror 17 and second light beam is sent to chopper 18, chopper machine 18 blocks first light beam and described by rotary cutting mating plate
The light beam of second light beam one of both, and the light beam not being blocked is sent to the monochromator and detector 20.Further,
Also as shown in Fig. 2, further including the second semi-transparent semi-reflecting lens 19, the second light beam is received from the first total reflection mirror 15, and by the first light beam
It is sent to monochromator and detector 20.Further, as shown in figure 3, the mating plate of cutting of chopper 18 is two kinds of light transmission and total reflection
State receives the first light beam that the first Rochon prism 14 is sent, and by the first light beam transparent transmission when chopper 18 is light transmission state
To monochromator and detector 20；When chopper 18 is total reflection state, the second light beam that the second total reflection mirror 17 is sent is received,
And the second light beam 17 is reflected into monochromator and detector 20.It should be noted that：Chopper 18 is that mating plate rotation is cut in motor driving
Turn, the first light beam by when the second light beam be blocked, the second light beam by when the first light beam be blocked, to realize to two-beam
Timesharing measure.As long as at this point, the first Rochon prism 14 is adjusted to make the light in parallel vibrating direction along straightline propagation, by second
Rochon prism 16 is adjusted to make the light in vertical vibration direction that i.e. the first light beam is the light in parallel vibrating direction along straightline propagation,
Second light beam is the light in vertical vibration direction.
Still as Figure 2-3, the present invention also provides a kind of Zeeman background correction light path system, which includes：It is above-mentioned
Any one Zeeman background correction light path.
Both light path design schemes of the present invention solve dependence of the similar product to high-precision motor, chopper motor
Load it is small, can use small power DC brushless motor, rotating speed is not strict with, Rochon prism of the invention is fixed
Place it is reliable and stable, convenient for adjust and safeguard, Rochon prism fixed placement make optical signal more stablize, improve the property of instrument
Energy.And it is expensive due to high-precision motor, by optical element instead of high-precision motor, reduce whole system at
This.Wherein, two pieces of semi-transparent semi-reflecting lens have been used in Fig. 2, have been decayed to light energy larger, but it is relatively low to chopper requirement, as long as
Being in the light can meet the requirements with light transmission.And one piece of semi-transparent semi-reflecting lens has been used in Fig. 3, light energy losses are reduced, but cut light
Device is to transmit and be totally reflected state, and the stability for cutting mating plate rotation is must assure that in total reflection.Two schemes respectively have advantage and disadvantage.
Multiple optical elements have been used in the two methods of aforementioned present invention, have been merged again after light beam is separated, two light beams
Registration after merging is critically important, and the effect of the better background correction of coincidence is better.Semi-transparent semi-reflecting lens and complete have been used in scheme
Speculum, these optical elements have decaying to optical signal, should improve the characteristic of optical element as possible, reduce light energy losses.
It must assure that the stability for cutting mating plate rotation when operational version two.
The above is only a preferred embodiment of the present invention, it is not intended to restrict the invention, it is noted that for this skill
For the those of ordinary skill in art field, without departing from the technical principles of the invention, can also make it is several improvement and
Modification, these improvements and modifications also should be regarded as protection scope of the present invention.
Claims (4)
1. a kind of Zeeman background correction light path, which is characterized in that including：Light source, stationary magnetic field and atomizer, first semi-transparent half
Anti- mirror, the first Rochon prism, the first total reflection mirror, the second Rochon prism, the second total reflection mirror, chopper and monochromator and inspection
Survey device, wherein the light source sends out light, and the stationary magnetic field and atomizer receive the light that the light source is sent out and by the light
Be sent to first semi-transparent semi-reflecting lens, first semi-transparent semi-reflecting lens receive the light, the light is divided into the first light beam and
Second light beam, and by first light beam along linear transmission to first Rochon prism and by second light beam along vertical
Direction is reflected into first total reflection mirror, and the first light beam is sent to the chopper by first Rochon prism, and described
One total reflection mirror receives second light beam and second light beam is sent to second Rochon prism, second Lip river breast
Prism receives second light beam and second light beam is sent to second total reflection mirror, and second total reflection mirror will
Second light beam is sent to the chopper, and the chopper machine blocks first light beam and described second by rotary cutting mating plate
The light beam of light beam one of both, and the light beam not being blocked is sent to the monochromator and detector.
2. Zeeman background correction light path according to claim 1, which is characterized in that the Zeeman background correction light path further includes
Two semi-transparent semi-reflecting lens receive second light beam from first total reflection mirror, and first light beam are sent to the list
Color device and detector.
3. Zeeman background correction light path according to claim 1, which is characterized in that the mating plate of cutting of the chopper is light transmission and complete
Two states are reflected, when the chopper is light transmission state, receive the first light beam that first Rochon prism is sent, and will
First light beam is transparent to the monochromator and detector；When the chopper is total reflection state, described second is received
The second light beam that total reflection mirror is sent, and second light beam is reflected into the monochromator and detector.
4. a kind of Zeeman background correction light path system, which is characterized in that including as described in any one of claims 1 to 3 item
Zeeman background correction light path.
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| CN201510067759.6A CN104655272B (en) | 2015-02-10 | 2015-02-10 | Zeeman background correction light path and its system |
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| CN201510067759.6A CN104655272B (en) | 2015-02-10 | 2015-02-10 | Zeeman background correction light path and its system |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4948250A (en) * | 1983-06-16 | 1990-08-14 | Hitachi, Ltd. | Atomic absorption spectrophotometer |
| CN101806718A (en) * | 2009-02-13 | 2010-08-18 | 上海光谱仪器有限公司 | AC/DC double-purpose Zeeman effect atomic absorption background correcting system and using method |
| CN103940512A (en) * | 2014-04-04 | 2014-07-23 | 上海光谱仪器有限公司 | Polarization calibrating method and device for direct current Zeeman atomic absorption of two detectors |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4343015B2 (en) * | 2004-04-13 | 2009-10-14 | 株式会社日立ハイテクマニファクチャ＆サービス | Atomic absorption photometer |
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2015
- 2015-02-10 CN CN201510067759.6A patent/CN104655272B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4948250A (en) * | 1983-06-16 | 1990-08-14 | Hitachi, Ltd. | Atomic absorption spectrophotometer |
| CN101806718A (en) * | 2009-02-13 | 2010-08-18 | 上海光谱仪器有限公司 | AC/DC double-purpose Zeeman effect atomic absorption background correcting system and using method |
| CN103940512A (en) * | 2014-04-04 | 2014-07-23 | 上海光谱仪器有限公司 | Polarization calibrating method and device for direct current Zeeman atomic absorption of two detectors |
Non-Patent Citations (1)
| Title |
|---|
| 《原子吸收光谱仪的背景校正》;吴华等;《环境监测管理与技术》;19951231;第7卷(第6期);第12-16页 * |
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