CN103940512A - Polarization calibrating method and device for direct current Zeeman atomic absorption of two detectors - Google Patents
Polarization calibrating method and device for direct current Zeeman atomic absorption of two detectors Download PDFInfo
- Publication number
- CN103940512A CN103940512A CN201410136156.2A CN201410136156A CN103940512A CN 103940512 A CN103940512 A CN 103940512A CN 201410136156 A CN201410136156 A CN 201410136156A CN 103940512 A CN103940512 A CN 103940512A
- Authority
- CN
- China
- Prior art keywords
- atomic absorption
- polarization
- direct current
- dual
- zeeman atomic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses a polarization calibrating method and device for direct current Zeeman atomic absorption of two detectors. According to the polarization calibrating method and device for the direct current Zeeman atomic absorption of the two detectors, a polarizing prism rotating around a central shaft is used for separating a calibration light source, polarized light, rotating along with the polarizing prism, of a polarization plane polarization plane is made to enter an outlet slit along an optical axis for atomic absorption, and the rest of polarization light is separated; two photomultipliers in the two detectors are made to obtain two sine wave optical signals respectively, and then optical calibration is conducted on direct current Zeeman atomic absorption of the two detectors according to the two sine wave optical signals, so that the troughs of the two sine wave optical signals are zero. By the adoption of the polarization calibrating method and device for the direct current Zeeman atomic absorption of the two detectors, accurate calibration of the polarization light generated during direct current Zeeman atomic absorption of the two detectors can be achieved, and the accuracy of a detection result is guaranteed.
Description
Technical field
The present invention relates to a kind of Zeeman atomic absorption technique, be specifically related to the polarization Calibration Technology of Zeeman Atomic absorption.
Background technology
Atomic Absorption Spectrometer is very high in the popularity rate of China, and one of its reason is exactly the domestic condition of producing Atomic absorption instrument that possesses very early, has many enterprises can produce Atomic absorption instrument.In recent years, external many apparatus manufactures start to set up at home Sole Proprietorship, produce Atomic absorption instrument, with domestic instrument manufacturing competition among enterprises.Therefore,, when focusing on instrument quality, develop characteristic high-end Atomic Absorption Spectrometer and seem particularly important.
High-end Atomic Absorption Spectrometer mainly refers to Zeeman AAS instrument and continuum source atomic absorption spectrometer.Although had very long history from the Atomic Absorption Spectrometer of Hitachi, Ltd's production First Zeeman effect correcting background in 1976, but because the topmost spectrum of atomic absorption spectrography (AAS) disturbs, be molecule absorption and light scattering, and Zeeman background correction is to solve preferably the method for this interference; In addition, due to its twin-beam characteristic, can in flame and graphite furnace analysis, obtain good signal to noise ratio (S/N ratio), be subject to vast analytical work person's favor always.
Notification number CN1270174C(patent No. ZL200410026878.9) Chinese patent discloses method and the device thereof of the anti-Zeeman effect atomic absorption analysis in a kind of stationary magnetic field, this patent provides a kind of D.C. magnetic field Zeeman background correction light channel structure design, can form thus dual-detector direct current Zeeman background correction atomic absorption unit or instrument, what they were different from Zeeman background correction in traditional Zeeman Atomic absorption is after exit slit and polarizing prism, used two photoelectric detectors, can carry out " background correction simultaneously " (referring to Fig. 5).
Whether the gordian technique for the performance of dual-detector Zeeman Atomic absorption instrument is: be parallel to magnetic field and can separate completely perpendicular to two polarized lights in magnetic field, shining respectively on two detecting devices.
But the dual-detector direct current Zeeman background correction device in existing dual-detector Zeeman Atomic absorption instrument cannot carry out effective adjustment to its light path in use, to guarantee to be parallel to magnetic field and to separate completely perpendicular to two polarized lights in magnetic field, and correspondence shines on two detecting devices, thereby cause testing result to have larger deviation.
As can be seen here, how the polarization of adjustment dual-detector direct current Zeeman Atomic absorption is that this area is needed the problem solving badly.
Summary of the invention
For the not high problem of existing dual-detector direct current Zeeman Atomic absorption accuracy of detection, the object of the present invention is to provide a kind of polarization adjusting process for dual-detector direct current Zeeman Atomic absorption, to realize the polarization adjustment to dual-detector direct current Zeeman Atomic absorption, guarantee accuracy of detection.
Another object of the present invention is to, a kind of polarization calibration apparatus for dual-detector direct current Zeeman Atomic absorption is provided.
In order to achieve the above object, the present invention adopts following technical scheme:
A kind of polarization adjusting process for dual-detector direct current Zeeman Atomic absorption, described adjusting process utilizes a polarizing prism rotating around central shaft, adjustment light source is carried out to separation, allow plane of polarization along the optical axis of Atomic absorption, enter exit slit with the polarized light of polarizing prism rotation, and all the other polarized lights separately; Make two photomultipliers in dual-detector obtain respectively the light signal that is sinusoidal wave, then according to the light signal of two sine waves to the adjustment of dual-detector direct current Zeeman Atomic absorption optics, the light signal the lowest point that makes two sine waves is zero.
In the preferred embodiment of adjusting process, described two light signal phase differential, 180 degree.
Further, when described polarizing prism drives the plane of polarization of the polarized light that enters exit slit to rotate, when plane of polarization is during perpendicular to magnetic direction, the polarized light that enters exit slit all enters the first photomultiplier, and the light signal that the second photomultiplier detects is zero; When plane of polarization is parallel to magnetic direction, the polarized light that enters exit slit should all enter the second photomultiplier, and the light signal that the first photomultiplier detects is zero.
As the second object of the present invention, a kind of polarization calibration apparatus for dual-detector direct current Zeeman Atomic absorption, this device comprises:
Hollow motor;
Polarizing prism, described polarizing prism is coaxially placed in the sleeve rotor of hollow motor;
Light source, described light source passes through the coaxial exit slit of settling the central axial alignment dual-detector Zeeman Atomic absorption of the polarizing prism in hollow motor, and overlaps with Atomic absorption optical axis.
In the preferred embodiment of polarization calibration apparatus, described polarizing prism is Romania and Hungary's prism.
Further, described light source is laser instrument.
The polarization adjusting process forming according to such scheme can carry out accurate adjustment to the polarization of light in dual-detector direct current Zeeman Atomic absorption process, guarantees the degree of accuracy of testing result.
Meanwhile, this polarization calibration apparatus is simple in structure, is easy to realize.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments, further illustrate the present invention.
Fig. 1 is structure principle chart of the present invention;
Tu2Wei Romania and Hungary prism schematic diagram;
Fig. 3 is the assembling schematic diagram of hollow motor and Romania and Hungary's prism;
Fig. 4 is the cross sectional representation of Fig. 3;
Fig. 5 is the light path schematic diagram of dual-detector direct current Zeeman background correction device in dual-detector Zeeman Atomic absorption;
Fig. 6 is for being used the schematic diagram of the present invention's gained signal on two detecting devices.
Embodiment
For technological means, creation characteristic that the present invention is realized, reach object and effect is easy to understand, below in conjunction with concrete diagram, further set forth the present invention.
Referring to Fig. 5, it is depicted as the light path schematic diagram of dual-detector direct current Zeeman background correction in dual-detector direct current Zeeman Atomic absorption instrument.As seen from the figure, whole background correction optical routing exit slit S, two Wo Lasite prism P, spherical reflector M1, triangle mirror M 2, the first photomultiplier PMT1, the second photomultiplier PMT2 pass through light path cooperation mix proportion as shown in Figure 5.
Thus, in Zeeman Atomic absorption, perpendicular to magnetic field and the polarized light that is parallel to magnetic direction, by exit slit S, entering in this light path, first the polarizer of being installed by exit slit S place (i.e. two Wo Lasite prism P) becomes P ∥ and P ⊥ two bundle polarized lights by radiation of light source, imports respectively the first photomultiplier PMT1 and the second photomultiplier PMT2.
But when reality is used, optical device in these light paths (two Wo Lasite prism P, spherical reflector M1, triangle mirror M 2, the first photomultiplier PMT1, the second photomultiplier PMT2), cannot reach the mated condition of standard, thereby cause Zeeman Atomic absorption to detect, have error.
Therefore in use, just need to carry out adjustment to the polarization of dual-detector direct current Zeeman Atomic absorption.
Thus, the present invention utilizes a polarizing prism rotating around central shaft, and adjustment light source is carried out to separation, allows plane of polarization along the optical axis of Atomic absorption, enter exit slit with the polarized light of polarizing prism rotation, and all the other polarized lights separately; Make two photomultipliers in dual-detector obtain respectively the light signal that is sinusoidal wave, then according to the light signal of two sine waves to the adjustment of dual-detector direct current Zeeman Atomic absorption optics, the light signal the lowest point that makes two sine waves is zero.
Referring to Fig. 1, it is depicted as the structural representation of the polarization calibration apparatus forming based on above-mentioned principle.This polarization calibration apparatus can carry out adjustment accurately and fast to the polarization of dual-detector direct current Zeeman Atomic absorption instrument, guarantees graceful Atomic absorption accuracy of detection.
As seen from the figure, whole calibration apparatus mainly comprises light source 1, hollow motor 2 and polarizing prism 3 three parts.
Hollow motor 2 is as the power part of whole device, for driving polarizing prism 3 to rotate.The rotor axis of this hollow motor is hollow, and rotor can rotate (referring to Fig. 3 and Fig. 4) around its axle center after energising.
Polarizing prism 3, for separating of adjustment light source, forms satisfactory polarized light.Shown in Fig. 2, the concrete Romania and Hungary's prism that adopts of this polarizing prism 3, wherein has a branch of direction of propagation identical with the direction of propagation of incident light through the polarized radiation of this prism separation.
Referring to Fig. 3 and Fig. 4, this polarizing prism 3(Ji Romania and Hungary prism) be specifically coaxially placed in the sleeve rotor of hollow motor, the prism 3 that shakes is placed in the sleeve rotor of hollow motor, and the central shaft of prism 3 that shakes overlaps with the central shaft of sleeve rotor (being also the axle center of hollow motor), when hollow motor rotates like this, can drive polarizing prism 3 to rotate around central shaft, in the exit direction of polarizing prism 3, just can obtain a direction of propagation identical with incident beam, the polarized light that plane of polarization rotates again together with hollow motor.
Light source 1 is for generation of adjustment light beam, and it specifically can adopt laser instrument, but is not limited to this, equally also can adopt the light source of other structure.
When concrete cooperation, this light source 1 is arranged in the light incident side that is placed in hollow motor 2 polarizing prisms 3, and the axle center of light source 1 and hollow motor (the namely central shaft of polarizing prism) aims at the exit slit S of dual-detector Zeeman Atomic absorption, and overlap with Atomic absorption optical axis (referring to Fig. 1).
Referring to Fig. 1, the polarization calibration apparatus forming according to such scheme in use, point bright light source 1, light source luminescent is along direction (central axis direction of polarizing prism) in figure, through the polarizing prism 3 in hollow motor 2, according to the exit slit S to dual-detector Zeeman Atomic absorption instrument, by the centrifugation of polarizing prism 3, polarizing prism 3 enters exit slit 3 by the direction of propagation a part of polarized light identical with incident beam along the optical axis of Atomic absorption, and another part is by separately.When hollow motor rotates, the plane of polarization that enters the polarized light of exit slit rotates with hollow motor.
When plane of polarization (entering the plane of polarization of the polarized light of exit slit) is during perpendicular to magnetic direction (in Fig. 1 perpendicular to paper direction), the polarized light that enters exit slit should all be polarized prism P separation, and enter PMT1, and the light signal that PMT2 detects is zero; When plane of polarization is parallel to magnetic direction when (being parallel to paper direction in Fig. 1), the polarized light that enters exit slit should all be polarized prism P separation, and enters PMT2, and the light signal that PMT1 detects is zero.
Polarizing prism 3 is when rotating with hollow motor, and two photomultiplier PMT1, PMT2 are by the sinusoidal wave light signal obtaining as shown in Figure 6.These two signal phase differences, 180 degree, whether, when a PMT light signal is maximum, another PMT light signal is minimum (valley), can be zero realization the adjustment of dual-detector Zeeman Atomic absorption optics by observing this valley.
By oscillograph, observe this two paths of signals, or calculate the effective value of signal, whether the lowest point of signal shown in can judging is zero: if the lowest point of two paths of signals can arrive zero, the polarized light that represents to enter exit slit S is completely separated by the polarizing prism P after exit slit, and the light path after prism is adjusted entirely true; If the lowest point of measured signal is non-vanishing, that just need to check polarizing prism P, or adjusts the position of M1, M2, until the lowest point of two photomultiplier gained signals reaches zero.
Known by above-mentioned scheme, the present invention can very conveniently carry out accurate adjustment to the polarization of light in dual-detector direct current Zeeman Atomic absorption process by polarization calibration apparatus simple in structure, guarantees the degree of accuracy of testing result.
More than show and described ultimate principle of the present invention, principal character and advantage of the present invention.The technician of the industry should understand; the present invention is not restricted to the described embodiments; that in above-described embodiment and instructions, describes just illustrates principle of the present invention; without departing from the spirit and scope of the present invention; the present invention also has various changes and modifications, and these changes and improvements all fall in the claimed scope of the invention.The claimed scope of the present invention is defined by appending claims and equivalent thereof.
Claims (6)
1. the polarization adjusting process for dual-detector direct current Zeeman Atomic absorption, it is characterized in that, described adjusting process utilizes a polarizing prism rotating around central shaft, adjustment light source is carried out to separation, allow plane of polarization along the optical axis of Atomic absorption, enter exit slit with the polarized light of polarizing prism rotation, and all the other polarized lights separately; Make two photomultipliers in dual-detector obtain respectively the light signal that is sinusoidal wave, then according to the light signal of two sine waves to the adjustment of dual-detector direct current Zeeman Atomic absorption optics, the light signal the lowest point that makes two sine waves is zero.
2. according to a kind of polarization adjusting process for dual-detector direct current Zeeman Atomic absorption shown in claim 1, it is characterized in that described two light signal phase differential, 180 degree.
3. according to a kind of polarization adjusting process for dual-detector direct current Zeeman Atomic absorption shown in claim 1 or 2, it is characterized in that, when described polarizing prism drives the plane of polarization of the polarized light that enters exit slit to rotate, when plane of polarization is during perpendicular to magnetic direction, the polarized light that enters exit slit all enters the first photomultiplier, and the light signal that the second photomultiplier detects is zero; When plane of polarization is parallel to magnetic direction, the polarized light that enters exit slit should all enter the second photomultiplier, and the light signal that the first photomultiplier detects is zero.
4. for a polarization calibration apparatus for dual-detector direct current Zeeman Atomic absorption, it is characterized in that, described device comprises:
Hollow motor;
Polarizing prism, described polarizing prism is coaxially placed in the sleeve rotor of hollow motor;
Light source, described light source passes through the coaxial exit slit of settling the central axial alignment dual-detector Zeeman Atomic absorption of the polarizing prism in hollow motor, and overlaps with Atomic absorption optical axis.
5. a kind of polarization calibration apparatus for dual-detector direct current Zeeman Atomic absorption according to claim 4, is characterized in that, described polarizing prism is Romania and Hungary's prism.
6. a kind of polarization calibration apparatus for dual-detector direct current Zeeman Atomic absorption according to claim 4, is characterized in that, described light source is laser instrument.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410136156.2A CN103940512B (en) | 2014-04-04 | 2014-04-04 | A kind of polarization adjusting process for dual detector direct current Zeeman atomic absorption and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410136156.2A CN103940512B (en) | 2014-04-04 | 2014-04-04 | A kind of polarization adjusting process for dual detector direct current Zeeman atomic absorption and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103940512A true CN103940512A (en) | 2014-07-23 |
| CN103940512B CN103940512B (en) | 2016-11-09 |
Family
ID=51188278
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410136156.2A Expired - Fee Related CN103940512B (en) | 2014-04-04 | 2014-04-04 | A kind of polarization adjusting process for dual detector direct current Zeeman atomic absorption and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103940512B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104655272A (en) * | 2015-02-10 | 2015-05-27 | 北京海光仪器有限公司 | Zeeman background correction light path and system thereof |
| CN105115923A (en) * | 2015-09-22 | 2015-12-02 | 上海光谱仪器有限公司 | Detachable AC Zeeman graphite furnace atomizer |
-
2014
- 2014-04-04 CN CN201410136156.2A patent/CN103940512B/en not_active Expired - Fee Related
Non-Patent Citations (2)
| Title |
|---|
| 杨啸涛 等: "两款原子吸收光谱仪的塞曼背景校正装置", 《分析化学 仪器装置与实验技术》, vol. 39, no. 10, 30 October 2011 (2011-10-30) * |
| 杨啸涛，何华混: "恒定横向磁场塞曼原子吸收吸光度的计算方法", 《分析测试学报》, vol. 14, no. 1, 25 January 1995 (1995-01-25) * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104655272A (en) * | 2015-02-10 | 2015-05-27 | 北京海光仪器有限公司 | Zeeman background correction light path and system thereof |
| CN104655272B (en) * | 2015-02-10 | 2018-07-24 | 北京海光仪器有限公司 | Zeeman background correction light path and its system |
| CN105115923A (en) * | 2015-09-22 | 2015-12-02 | 上海光谱仪器有限公司 | Detachable AC Zeeman graphite furnace atomizer |
| CN105115923B (en) * | 2015-09-22 | 2024-04-09 | 上海光谱仪器有限公司 | Detachable alternating current Zeeman graphite furnace atomizer |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103940512B (en) | 2016-11-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI280349B (en) | Spectrum measurement apparatus | |
| CN101859030B (en) | Device and method for coaxially adjusting double beams in real time | |
| CN103528797B (en) | A kind of new system detected for optical system eyeglass transmitance and reflectance | |
| CN106441125B (en) | A kind of measured film thickness method and system | |
| CN106124166B (en) | A kind of measuring device and measurement method of heavy-caliber optical grating diffraction efficiency | |
| WO2012075958A1 (en) | Real-time online absorption detection system | |
| CN103969215A (en) | Terahertz time-domain spectroscopy system and measurement method thereof | |
| CN103688156A (en) | Measurement of critical dimension | |
| CN105954209A (en) | Multichannel testing system for near-field spatial distribution of light source | |
| CN103712932B (en) | A kind of multi-channel optical absorption detection device | |
| CN102721528B (en) | The test device of a kind of photo-detector range of linearity and method of testing | |
| CN102323231B (en) | Multi-axial differential absorption spectrometer calibration system and method | |
| JP2009186256A (en) | Double refraction measuring method, double refraction measuring instrument and program | |
| CN102854149A (en) | Measuring apparatus for continuous spectrum bidirectional scattering distribution function | |
| CN103196552B (en) | Measuring device for light intensity of narrow-light-beam light-emitting diode (LED) lamp | |
| TWI231363B (en) | Multipoint measurement system and method | |
| CN103940512A (en) | Polarization calibrating method and device for direct current Zeeman atomic absorption of two detectors | |
| CN104169676B (en) | LED light source device, film thickness measurement device and film forming device | |
| CN103954436A (en) | High-precision spectral radiance calibration device | |
| CN205607626U (en) | Measure device of remote sensing instrument's linear polarization sensitivity | |
| KR101008376B1 (en) | Multichannel spectroscopic ellipsometer | |
| CN104215432B (en) | Device and method for detecting characteristics of phase retarder with light source polarization and dynamic feedback | |
| JP2009229229A (en) | Double refraction measuring instrument and double refraction measuring method | |
| CN203274910U (en) | Measuring device for light intensity of narrow-light-beam LED lamp | |
| JP2011117792A (en) | Device for measuring lamination angle of elliptically polarized light plate |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161109 |