CN104635104B - A kind of breaking short-circuit ATE of camera module and its method of testing - Google Patents
A kind of breaking short-circuit ATE of camera module and its method of testing Download PDFInfo
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- CN104635104B CN104635104B CN201410566861.6A CN201410566861A CN104635104B CN 104635104 B CN104635104 B CN 104635104B CN 201410566861 A CN201410566861 A CN 201410566861A CN 104635104 B CN104635104 B CN 104635104B
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Abstract
The present invention relates to a kind of short-circuit ATE of camera module open circuit and its method, the short-circuit ATE of the camera module open circuit includes：One logic control element；One parameter testing unit；An and AD conversion unit, wherein, the logic control element, the parameter testing unit and the AD conversion unit electrically connect to form a detection circuit, the parameter set unit is able to drive at least one set of electric current to be connected into the detection circuit by an at least pin for the chip to detect the situation of the chip open circuit short circuit by the AD conversion unit and the logic control element in the detection circuit, at least chip of a camera module.
Description
Technical field
The present invention relates to a kind of short-circuit ATE of camera module open circuit, especially a kind of camera module open circuit short circuit
ATE and its method of testing.
Background technology
The electronic products such as cell phone, tablet personal computer, notebook computer, LCD TV are widely popularized in camera module
Today, the demand of miniature and high-quality camera module is just urgently provided with imponderable daily demand amout.Wherein,
Breaking short-circuit detecting to camera module is the key means of the quality and performance that ensure camera module.It is however, traditional to taking the photograph
As module breaking short-circuit conditions detect equipment be all with PC and for control centre, and then, detection means is huge and price is high
Camera module is developed Deng inevitable reality.Meanwhile traditional detection means is surveyed by using one group of electric current of driving
The breaking short-circuit conditions of camera module are tried, this method, which is inevitably present, tests busy go, that is to say, that traditional detection dress
Putting can not ensure that the product of the camera module goes out yield.In addition, also very important be a bit, traditional detection means due to
The problem of interface difference of interface and tested camera module be present, it is necessary to by designing special pinboard, by switching
Plate realizes the connection between test device and tested camera module, and inconvenience is caused to production.As can be seen here, once
Development of the short-circuit ATE of camera module open circuit for helping effective and easy to use to ensureing the high quality of camera module has
There is very important meaning.
The content of the invention
It is an object of the present invention to provide a kind of short-circuit ATE of camera module open circuit, the equipment is able to
A detection circuit is provided to screen the camera module that breaking short-circuit conditions be present.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the equipment is able to
Online version flow is provided with the detection data by the camera module of the computer installation to being obtained by the detection data to enter
Row analysis and parameter configuration.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the equipment is able to
By offline version flow with the camera module progress short-circuit to open circuit be present in the case where departing from the computer installation
Screening.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the equipment includes
One logic control element；One parameter testing unit；And an AD conversion unit, wherein, the logic control element, the ginseng
Number test cells and the AD conversion unit electrically connect to form the detection circuit, the parameter testing unit be able to drive to
Few one group of electric current is connected into institute in the detection circuit, at least chip of a camera module by an at least pin for the chip
Detection circuit is stated to detect the situation of the chip open circuit short circuit by the AD conversion unit and the logic control element.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the parameter testing
Unit is able to drive two groups of electric currents to mutually compensate for the testing blind zone of single group electric current, improve the camera module product go out it is good
Rate.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the parameter testing
Unit is able to drive two groups of electric currents with so that the electric current is able to detect the accuracy of data described in mutual auxiliary judgment.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the analog-to-digital conversion
Unit has an at least interface and the interface is consistent with the pin of the chip, matches so as to be avoided special configuration
Pinboard to connect the interface of the AD conversion unit and the pin, cost-effective and time.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the logic control
Unit further comprises a storage chip, has setting data in the storage chip, and the detection data are able to set with described
Fixed number is according to comparing to judge that the camera module whether there is breaking short-circuit state.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the equipment includes
One selected control unit, the selected control unit are able to select the logic control element, and the parameter testing unit and the modulus turn
Change unit and perform offline version flow or online version flow.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the equipment is also wrapped
A Tip element is included, shown Tip element is able to make display according to judgement of the logic control element to the detection data
And prompting.
Another object of the present invention is to provide a kind of camera module open circuit short-circuit ATE, the equipment volume
Only 15cm*10cm*5cm sizes, that is to say, that the volume of the equipment is petite, and the cost Control of the equipment is in RMB
1000 yuan, it is easy to promote the wider application.
To realize object above, the present invention provides a kind of camera module open circuit short-circuit ATE, the equipment bag
Include：
One logic control element, the logic control element are a single-chip microcomputers；
One parameter testing unit；And
One AD conversion unit, wherein, the logic control element, the parameter testing unit and the analog-to-digital conversion list
Member electrically connects to form a detection circuit, and the parameter testing unit is able to drive at least one set of electric current in the detection circuit, extremely
The chip of a few camera module is connected into the detection circuit to turn by the modulus by an at least pin for the chip
Change unit and the logic control element detects the situation of the chip open circuit short circuit.
Preferably, the AD conversion unit is able to detect the voltage between the pin to obtain described in detection data and general
Detection data are delivered to the logic control element, and the logic control element is according to the testing number it is judged that the shooting mould
The situation of the open circuit short circuit of the chip of group.
It is noted that cause described when the parameter testing unit drives two groups of electric currents in the detection circuit
When AD conversion unit is able to obtain the two detection data, two groups of electric currents are able to compensate the survey being likely to occur in testing mutually
Blind area is tried, and then the product for improving the camera module goes out yield, avoids the outflow of defective products.
It is noted that it is able to detect the accurate of data described in mutual auxiliary judgement by the detection data of contrast two
Property.
It is worth mentioning to being that the AD conversion unit has an at least interface consistent with the pin.
Preferably, the logic control element further comprises an at least storage chip, is set with the storage chip
Set data, by contrast the detection data and the setting data be able to judge the chip open circuit short circuit situation with
The bad camera module is filtered out to perform offline version flow.
Preferably, the logic control element is connected with a computer installation, and the detection data are able to patrol by described
Volume control unit is sent to the computer installation, and the computer installation is able to the detection data analyze bad
The configuration of product and parameter is to perform online version flow.
Preferably, it is characterised in that the short-circuit ATE of open circuit also includes a Tip element, and the prompting is single
Member be communicatively coupled to the logic control element and show and prompt according to the logic control element it is described detection data with
The comparing result of the setting data, the display and prompting of comparing result be able to by, the Tip element be selected from buzzer and
One or more in light-emitting diode display.
Preferably, the short-circuit ATE of open circuit also includes a selected control unit, connects to the selected control unit communication
The logic control element is connected to, it is described to patrol when the logic control element receives the signal from the computer installation
Collect control unit and be carried out the online version flow.
Preferably, it is characterised in that the short-circuit ATE of open circuit also includes a selected control unit, the selected control list
Member further comprises a control unit, is connected to the logic control element to the selected control unit communication, when the control is single
When member is in running order, the logic control element performs the offline version flow.
It is noted that the logic control element is the single-chip microcomputer of STC125A32S2 series, the parameter testing
Unit is a digital regulation resistance AD5220, and the AD conversion unit is a modulus conversion chip AD7663.
Present invention also offers the method for testing that a kind of open circuit short circuit of camera module is tested automatically, methods described includes as follows
Step：
A：Drive the electric current of the detection circuit；
B：Connection is detected the pin of chip in the detection circuit；
C：Obtain breaking short-circuit detecting data；And
D：Judge whether to complete test, if otherwise performing step B, if then performing step A.
Preferably, also comprise the following steps before the step A：Process mode is selected, wherein, the production model includes
In the line production model and the offline production model.And wherein in the online production pattern, using computer as
Control centre, in the offline production model, control centre is used as using single-chip microcomputer.
Preferably, when the logic control element 10 selects to carry out offline version production model, the step C is further wrapped
Include following steps
C1：The voltage at the pin both ends is measured to obtain the detection data；And
C2：The testing number is uploaded according to this to calculate the detection data, show.
Preferably, when the logic control element 10 selects online version production model, the step C further comprise as
Lower step
C1：The voltage at the pin both ends is measured to obtain the detection data；And
C2：Contrast draws the break-make of pin both ends electric current, wherein, the break-make of the pin is by the detection data
Contrast with setting data is drawn.
Preferably, the step A further comprises step：
A1：Initiation parameter test cell and AD conversion unit treat working condition to cause the detection circuit to be in；
And
A2：The parameter testing unit is set to add stream pressure measurement pattern to drive the electric current of the detection circuit.
Preferably, the step B further comprises following steps：The tested pin of selection, wherein, to tested
The pin selection by adjust single-pole double-throw switch (SPDT) matrix realize.
It is worth mentioning to being, the step A is able to drive two groups of electric currents to obtain the two detection data and by two
It is described detection data contrast with ensure it is described detection data accuracy.
Brief description of the drawings
Such as the structural representation that Fig. 1 is a kind of short-circuit ATE of camera module open circuit of the present invention.
Such as another structural representation that Fig. 2 is a kind of short-circuit ATE of camera module open circuit of the present invention.
Such as the work relationship schematic diagram that Fig. 3 is a kind of short-circuit ATE of camera module open circuit of the present invention.
Such as another flow chart that Fig. 4 is a kind of short-circuit automatic test approach of camera module open circuit of the present invention.
Such as the another flow chart that Fig. 5 is a kind of short-circuit automatic test approach of camera module open circuit of the present invention.
Such as the partial process view that Fig. 6 is a kind of short-circuit automatic test approach of camera module open circuit of the present invention.
Such as another partial process view that Fig. 7 is a kind of short-circuit automatic test approach of camera module open circuit of the present invention.
Such as the another partial process view that Fig. 8 is a kind of short-circuit automatic test approach of camera module open circuit of the present invention.
Such as the also flow chart that Fig. 9 is a kind of short-circuit automatic test approach of camera module open circuit of the present invention.
Such as the specific implementation that Figure 10 is a kind of short-circuit preferred embodiment of automatic test approach one of camera module open circuit of the present invention
Mode.
Embodiment
According to the claim and specification disclosure of that of the present invention, technical scheme literary institute specific as follows
State.
The present invention relates to a kind of short-circuit ATE of camera module open circuit, and the one kind for being especially adapted for use in camera module is taken the photograph
As the short-circuit ATE of module open circuit, described device obtains the breaking short-circuit detecting for camera module, with described in guarantee
The product of camera module goes out yield.In the preferred embodiment, it is corresponding with the short-circuit ATE of camera module open circuit
Exemplified by the camera module in mobile phone.
The camera module includes a module main body, and the module main body includes an at least chip, and the chip has extremely
A few pin, the short-circuit ATE of the camera module open circuit are able to the institute for providing a test circuit and passing through the chip
State pin and the chip is accessed into the test circuit, and then be able to by described in the circuit phenomenon judgement in the test circuit
Camera module whether there is breaking short-circuit conditions.
Specifically, as shown in Figure 1 to Figure 2, the short-circuit ATE of the camera module open circuit includes a logic control
Unit 10, a parameter testing unit 20 and AD conversion unit 30, involved chip, the logic control element 10, the ginseng
Number test cell 20 and the AD conversion unit 30 are mutually electrically connected to form a detection circuit to the breaking short of the chip
Road situation is detected.
More specifically, in one aspect of the invention, the parameter testing unit 20 is able to drive in the detection circuit
Electric current, when the pin of the chip is accessed the detection circuit, the electric current in the detection circuit is able to from described
The pin of chip is able to voltage and institute according to whether between measuring the pin of the chip by the chip
The magnitude of voltage stated between pin detects to the breaking short-circuit conditions of the chip.
It is noted that the parameter testing unit 20 is able to provide the test circuit stable electric current, Jin Erbao
Demonstrate,prove the stability of the magnitude of voltage between the pin and the accuracy of test data.
There is sampling hold circuit in the AD conversion unit 30, and then be able to remove from and be related to peripheral sampling hold circuit
Work, be advantageous to investigate the breaking short-circuit state of the chip.
The AD conversion unit 30 is used to detect the voltage condition between the pin of the chip to obtain testing number
According to and further will detection data be delivered to the logic control element 10, the logic control element 10 is further detected
Whether the data meet the requirements.
It is noted that the AD conversion unit 30 is able to that the data format of the detection data will be changed simultaneously,
And then the logic control element 10 is able to judge the detection data.
In another aspect of this invention, the parameter testing unit 20 is also able to drive the voltage in the detection circuit,
When the pin of the chip is accessed the detection circuit, the voltage in the detection circuit is able to cause the chip
The pin between curent change, and then be able to according to the electric current that can measure between the pin of the chip and described draw
Current value between pin detects to the breaking short-circuit conditions of the chip.
It is noted that the parameter testing unit 20 is able to provide the voltage of the detection circuit stability, and then really
The stability for the electric current protected between the pin and the accuracy of test data.
Preferably, in the preferred embodiment, the parameter testing unit 20 is arranged to plus flowed pressure measurement pattern, that is,
Say, in the preferred embodiment, the parameter testing unit 20 by the test circuit driving current realize to institute
State the detection of the open circuit short circuit of chip.
The logic control element 10 further comprises an at least storage chip 11, is provided with the storage chip 11
Fixed number evidence, the detection data are able to short with the presence or absence of open circuit by being compared to determine the chip with the setting data
The situation on road, and then be improved product and go out yield.
It is worth mentioning to being, the storage chip 11 will not there is a situation where breaking and lose institute because of the detection circuit
State setting data, that is to say, that the storage chip 11 is able to after the chip for detecting breaking short-circuit conditions to be present still
It is able to continue to come into operation.
It is noted that the setting data in the storage chip 11 be able to by it is secondary editor it is different to meet
The use demand of data.
Preferably, in the preferred embodiment, the storage chip 11 is a band EEPROM
(EEPROM：Electrically Erasable Programmable Read-Only Memory).
It is noted that there is the AD conversion unit 30 diversified output interface to be able to select a variety of outputs
Mode, improve the flexibility of the AD conversion unit 30.
In the preferred embodiment, the interface of the AD conversion unit 30 is consistent with the pin, and then is able to directly
For the test to the chip without designing special pinboard, cost-effective and time.
It is worth mentioning to being that the logic control element 10 is able to be communicatively coupled to a computer installation to carry out parameter
Configuration.
Preferably, in the preferred embodiment, the short-circuit ATE of the camera module open circuit also includes a prompting
Unit 40, the Tip element 40 are communicatively coupled to the logic control element 10, when the chip has open circuit short circuit
During situation, the Tip element 40 is able to send cue, and then the chip for being able to exist breaking short-circuit conditions is made
Screening goes out yield with improve the camera module.
It is noted that the Tip element 40 is able to the modes such as sound, action as cue.
Preferably, in the preferred embodiment, the Tip element 40 be able to show by LED and buzzer at least
One kind is used as prompting means.
In the preferred embodiment, the pin of the chip is preferably connected into by a single-pole double-throw switch (SPDT) matrix
The test circuit simultaneously switches over.
Preferably, in the preferred embodiment, online version flow and offline version flow are tackled, the camera module open circuit is short
Road ATE is able to correspondingly make different settings.In one aspect of the invention, when the camera module open circuit is short
When road ATE is used for offline version examination flow, the logic control element 10 is able to the detection data in institute
Setting data are stated to carry out judging to compare to filter out the camera module that breaking short-circuit conditions be present, meanwhile, the prompting is single
Member 40 is able to be directed to the undesirable detection data, i.e., when described chip has breaking short-circuit conditions, the prompting is single
Member 40 is able to send prompt message.In another aspect of this invention, when the short-circuit ATE of camera module open circuit is used
When online version flow, the logic control element 10 is able to the detection information being uploaded to the computer installation and to institute
Detection information is stated further calculate and show.That is, the short-circuit ATE of the camera module open circuit only needs
Need to be connected with the computer installation when performing online version flow, and when performing offline version flow, the logic control
Unit 10, which is able to depart from the computer installation, to be operated, i.e. the short-circuit ATE of the camera module open circuit is able to root
Optionally it is attached according to being realized needed for production with the computer installation, it is short so as to be improved the camera module open circuit
The practicality of road ATE, at the same be achieved the short-circuit ATE of camera module open circuit it is light simplify with
Convenient use.
Preferably, the offline version flow is preferably adapted for producing, the online version flow be preferably adapted for analysis,
Bad product and the parameter configuration in the camera module are screened, is then improved the production efficiency of the camera module
And product goes out yield.
Preferably, in the preferred embodiment, the logic control element 10 is the monolithic of STC125A32S2 series
Machine, the parameter testing unit 20 are a digital regulation resistance AD5220, and the modulus control unit 30 is a modulus conversion chip
AD7663。
Preferably, in the preferred embodiment, the short-circuit ATE of the camera module open circuit also includes a selected control
Unit 50, the selected control unit 50 are communicatively coupled to the logic control element 10, and the selected control unit 50 is controlled institute
State logic control element 10 and carry out corresponding flow action.In the preferred embodiment, the logic control element 10 is examined
The working condition for surveying the selected control unit 50 is detected, if the selected control unit 50 is in running order, the shooting mould
The short-circuit ATE of group open circuit is then able to enter offline version flow by the logic control element 10；If the logic control
It is in running order that unit 10 processed is not detected by the selected control unit 50, then the short-circuit ATE of the camera module open circuit
Not performed by detection of the logic control element 10 to the selected control unit 50 and enter offline flow.
The logic control element 10 is also able to carry out the action signal of the computer installation detection receiving and foundation
The action signal of the computer installation makes action, in the preferred embodiment, if the logic control element 10 is examined
The action signal that the computer installation is sent is measured, then the short-circuit ATE of the camera module open circuit is able to described
The detection of logic control element 10 judges lower into online flow；If the logic control element 10 does not receive the computer dress
The action signal sent is put, then the short-circuit ATE of the camera module open circuit, which not performs, enters the action of online flow.
To sum up state, in the preferred embodiment, if the logic control element 10 detects that the selected control unit 50 is in
The signal of working condition, then the short-circuit ATE of camera module open circuit be able to perform offline flow to the chip
The chips of breaking short-circuit conditions be present and go out yield with improve the camera module in action to screen；If the logic control
Unit 10 detects the action command that the computer installation is sent, then the short-circuit ATE of the camera module open circuit obtains
The chips of breaking short-circuit conditions to screen to perform online flow be present and go out yield with improve the camera module.Namely
It is to say, when the selected control unit 50 is in running order, the computer installation will not be sent out to the logic control element 10
Go out action signal, accordingly, when the computer installation sends action signal to the logic control element 10, the control
Unit 50 is in off working state.
Preferably, in the preferred embodiment, the logic control element 10 is able to by One serial interface and the meter
Calculation machine device communicatedly connects.
Preferably, in the preferred embodiment, the selected control unit 50 further comprises a control unit 51, when the control
When unit 51 processed is in running order, the logic control element 10 is carried out the offline version flow, and then realizes manual
Select the workflow of the short-circuit ATE of the camera module open circuit.
It is noted that the volume only 15cm*10cm*5cm of the short-circuit ATE of the camera module open circuit,
That is the logic control element 10 is compact convenient, and when performing offline version flow, the logic control element 10
It is able to depart from the computer installation autonomous working.
It is worth mentioning to being, the short-circuit ATE of the camera module open circuit is cheap and controls in RMB
1000 yuan, be advantageous to cost-effectively screen the breaking short-circuit conditions of the camera module.
Preferably, in the preferred embodiment, the parameter testing unit 20 drives different size of electric current twice respectively,
And then the AD conversion unit 30 is able to obtain described in two groups and detects data, the logic control element 10 is able to each institute
Detection data are stated to be judged to ensure the accuracy of the detection data.Meanwhile the ash test cell 20 is passed through
Different size of electric current to clear away the testing blind zone that may be present when only one group of electric current, and then is ensured to described twice for driving
The detection of the breaking short-circuit state of camera module, improve product and go out yield and avoid the outflow of bad products.
It is worth mentioning to being, by being able to obtain the two detection data according to two groups of different size of electric currents, leads to
Cross the accuracy that the comparison to the detection data is able to determine the detection data, that is to say, that the detection data obtain
With another detection data of auxiliary judgment.
Preferably, in the preferred embodiment, the parameter testing unit 20 be able to drive size be respectively 100uA and
700uA two groups of electric currents.
It is noted that by initializing the parameter testing unit 20 such that the detection circuit is in and treats work
Make state to break to the camera module to drive the electric current in the detection circuit to realize by the parameter testing unit 20
The detection of road short-circuit conditions, and the parameter testing unit 20 supports cold plug.
As shown in Figures 3 to 8, the present invention also provides a kind of short-circuit automatic test approach of open circuit, and methods described includes as follows
Step：
A：Drive the electric current of the detection circuit；
B：Connection is detected the pin of chip in the detection circuit；
C：Obtain detection data；And
D：Judge whether to complete test, if otherwise performing step B, if then performing step A.
As shown in Figure 4, it is preferable that also comprise the following steps before the step A：Production model is selected, wherein, the stream
Journey pattern is included in the line production model and the offline production model.
As shown in figure 5, when the logic control element 10 selects to carry out offline version production model, the step C enters one
Step comprises the following steps
C1：The voltage at the pin both ends is measured to obtain the detection data；And
C2：The testing number is uploaded according to this to calculate the detection data, show.
As shown in fig. 6, when the logic control element 10 selects online version production model, the step C is also entered
One step comprises the following steps
C1：The voltage at the pin both ends is measured to obtain the detection data；And
C2：Contrast draws the break-make of pin both ends electric current, wherein, the break-make of the pin is by the detection data
Contrast with setting data is drawn.
As shown in fig. 7, the step A further comprises step：
A1：Initiation parameter test cell and AD conversion unit treat working condition to cause the detection circuit to be in；
And
A2：The parameter testing unit is set to add stream pressure measurement pattern to drive the electric current of the detection circuit.
As shown in figure 8, the step B further comprises following steps：The tested pin of selection, wherein, to quilt
The selection of the pin of test is realized by adjusting single-pole double-throw switch (SPDT) matrix.
It is worth mentioning to being, the step A is able to drive two groups of electric currents to obtain the two detection data and by two
It is described detection data contrast with ensure it is described detection data accuracy.
The above enumerates for the specific embodiment of the present invention, should for the equipment and structure of wherein not detailed description
When being interpreted as taking the existing common apparatus in this area and universal method to be practiced.
The above embodiment of the present invention is only to illustrate that technical solution of the present invention is used simultaneously, only the row of technical solution of the present invention
Lift, the technical scheme and its protection domain being not intended to limit the invention.Using equivalent technologies mean, equivalent apparatus etc. to this hair
The improvement of technical scheme disclosed in bright claims and specification is considered to be without departing from claims of the present invention
And the scope disclosed in specification.
Claims (15)
1. the short-circuit automatic test approach of a kind of camera module open circuit, it is characterised in that methods described comprises the following steps：
A：The electric current of driving testing circuit；
B：Connection is detected the pin of chip in the detection circuit；
C：Obtain breaking short-circuit detecting data；And
D：Judge whether to complete test, if otherwise performing step B, if then performing step A；
Also comprise the following steps before wherein described step A：Process mode is selected, wherein, the process mode includes online raw
Production pattern and offline production model, wherein in the online production pattern, using computer as control centre, described offline
In production model, control centre is used as using single-chip microcomputer.
2. the method as described in claim 1, the step C further comprises following steps：
C1：The voltage at the pin both ends is measured to obtain the detection data；And
C2：The testing number is uploaded according to this to analyze and parameter configuration the detection data.
3. the method as described in claim 1, the step C further comprises following steps：
C1：The voltage at the pin both ends is measured to obtain the detection data；And
C2：Contrast draws the break-make of pin both ends electric current, wherein, the break-make of the pin by the detection data with setting
The contrast of fixed number evidence is drawn.
4. method as claimed in claim 2 or claim 3, the step A further comprises step：
A1：Initiation parameter test cell and AD conversion unit treat working condition to cause the detection circuit to be in；And
A2：The parameter testing unit is set to add stream pressure measurement pattern to drive the electric current of the detection circuit.
5. method as claimed in claim 2 or claim 3, the step B further comprises following steps：Tested described of selection is drawn
Pin, wherein, the selection to the tested pin is realized by adjusting single-pole double-throw switch (SPDT) matrix.
6. the method as described in claim 1, the step A is able to drive two groups of electric currents to obtain the two detection data and lead to
The contrast for detecting data described to two is crossed to ensure the accuracy of the detection data.
7. the short-circuit ATE of a kind of camera module open circuit, it is characterised in that the equipment includes：
One logic control element, the logic control element are a single-chip microcomputers；
One parameter testing unit；And
One AD conversion unit, wherein, the logic control element, the parameter testing unit and the AD conversion unit are electric
Connection forms a detection circuit, and the parameter testing unit is able to drive at least one set of electric current in the detection circuit, and at least one
The chip of camera module is connected into the detection circuit with by the analog-to-digital conversion list by an at least pin for the chip
First and described logic control element detects the situation of the chip open circuit short circuit, and the AD conversion unit is able to draw described in detection
Voltage between pin is to obtain detection data and the detection data are delivered into the logic control element, the logic control list
Member is according to the testing number it is judged that the situation of the open circuit short circuit of the chip of the camera module, the logic control element
Further comprise an at least storage chip, setting data be set with the storage chip, by contrast it is described detection data and
The situation that the setting data are able to judge the open circuit short circuit of the chip is performed with filtering out the bad camera module
Offline version flow.
8. the short-circuit ATE of camera module open circuit as claimed in claim 7, when the parameter testing unit drives two
When group electric current make it that the AD conversion unit is able to obtain the two detection data when detection circuit, two groups of electric currents
It is able to compensate the testing blind zone being likely to occur in testing mutually, and then the product for improving the camera module goes out yield, avoids
The outflow of defective products.
9. the short-circuit ATE of camera module open circuit as claimed in claim 8, data are detected described in two groups by contrasting
It is able to detect the accuracy of data described in mutual auxiliary judgement.
10. the short-circuit ATE of camera module open circuit as claimed in claim 9, the AD conversion unit have and institute
State the consistent at least interface of pin.
11. the short-circuit ATE of camera module open circuit as described in any in claim 7 to 10, the open circuit short circuit is certainly
Dynamic test equipment also includes a Tip element, and the Tip element is communicatively coupled to the logic control element and according to described
Logic control element shows and prompted the comparing result of the detection data and the setting data, the display of comparing result and carries
Show and be able to by one or more of the Tip element in buzzer and light-emitting diode display.
12. the short-circuit ATE of camera module open circuit as claimed in claim 7, the short-circuit ATE of open circuit
Also include a selected control unit, the selected control unit further comprises a control unit, is connected to institute to the selected control unit communication
Logic control element is stated, when described control unit is in running order, the logic control element performs the offline version stream
Journey.
13. the short-circuit ATE of camera module open circuit as claimed in claim 11, the logic control element are one
The single-chip microcomputer of STC125A32S2 series, the parameter testing unit is a digital regulation resistance AD5220, the AD conversion unit
For a modulus conversion chip AD7663.
14. the short-circuit ATE of a kind of camera module open circuit, it is characterised in that the equipment includes：
One logic control element, the logic control element are a single-chip microcomputers；
One parameter testing unit；And
One AD conversion unit, wherein, the logic control element, the parameter testing unit and AD conversion unit electricity
Connection forms a detection circuit, and the parameter testing unit is able to drive at least one set of electric current in the detection circuit, and at least one
The chip of camera module is connected into the detection circuit with by the analog-to-digital conversion list by an at least pin for the chip
First and described logic control element detects the situation of the chip open circuit short circuit, and the AD conversion unit is able to draw described in detection
Voltage between pin is to obtain detection data and the detection data are delivered into the logic control element, the logic control list
Member is according to the testing number it is judged that the situation of the open circuit short circuit of the chip of the camera module, the logic control element
It is connected with a computer installation, the detection data are able to be sent to the computer installation by the logic control element,
The computer installation is able to analyze the configuration of bad product and parameter to the detection data to perform online version stream
Journey.
15. the short-circuit ATE of camera module open circuit as claimed in claim 14, surveyed wherein the open circuit short circuit is automatic
Examination equipment also includes a selected control unit, the selected control unit communication the logic control element is connected to, when the selected control list
When member receives the signal from the computer installation, it is described online that the selected control unit is controlled the selected control unit execution
Version flow.
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| CN106124916A (en) * | 2016-08-05 | 2016-11-16 | 歌尔股份有限公司 | A kind of test equipment for photographic head module |
| CN106249097A (en) * | 2016-08-05 | 2016-12-21 | 歌尔股份有限公司 | A kind of test equipment for photographic head module |
| CN106093689A (en) * | 2016-08-05 | 2016-11-09 | 歌尔股份有限公司 | A kind of test equipment for photographic head module |
| BR112020006261A2 (en) * | 2017-09-29 | 2020-10-20 | Boehringer Ingelheim Vetmedica Gmbh | testing and calibration of a circuit arrangement |
| CN109655702A (en) * | 2018-12-20 | 2019-04-19 | 安徽优旦科技有限公司 | A kind of open circuit detection system |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101435841A (en) * | 2007-11-16 | 2009-05-20 | 鸿富锦精密工业（深圳）有限公司 | Test system and method |
| CN201812014U (en) * | 2010-08-06 | 2011-04-27 | 上海宏测半导体科技有限公司 | Automatic open-circuit and short-circuit testing system for integrated circuits |
| CN102053200A (en) * | 2009-11-09 | 2011-05-11 | 神讯电脑(昆山)有限公司 | Power failure detection device |
| CN103149527A (en) * | 2013-04-02 | 2013-06-12 | 精成科技电子(东莞)有限公司 | Printed circuit board (PCB) detecting device and corresponding method |
-
2014
- 2014-10-22 CN CN201410566861.6A patent/CN104635104B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101435841A (en) * | 2007-11-16 | 2009-05-20 | 鸿富锦精密工业（深圳）有限公司 | Test system and method |
| CN102053200A (en) * | 2009-11-09 | 2011-05-11 | 神讯电脑(昆山)有限公司 | Power failure detection device |
| CN201812014U (en) * | 2010-08-06 | 2011-04-27 | 上海宏测半导体科技有限公司 | Automatic open-circuit and short-circuit testing system for integrated circuits |
| CN103149527A (en) * | 2013-04-02 | 2013-06-12 | 精成科技电子(东莞)有限公司 | Printed circuit board (PCB) detecting device and corresponding method |
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