CN104569673B - Test circuit, method and apparatus - Google Patents

Test circuit, method and apparatus Download PDF

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Publication number
CN104569673B
CN104569673B CN201410848749.1A CN201410848749A CN104569673B CN 104569673 B CN104569673 B CN 104569673B CN 201410848749 A CN201410848749 A CN 201410848749A CN 104569673 B CN104569673 B CN 104569673B
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China
Prior art keywords
test pattern
voltage
terminal device
magnitude
usb interface
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CN201410848749.1A
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Chinese (zh)
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CN104569673A (en
Inventor
陈延
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广东欧珀移动通信有限公司
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Priority to CN201410848749.1A priority Critical patent/CN104569673B/en
Publication of CN104569673A publication Critical patent/CN104569673A/en
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Publication of CN104569673B publication Critical patent/CN104569673B/en

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Abstract

The embodiment of the invention discloses a kind of test circuit, method and apparatus.The test circuit includes:Terminal device and USB interface wire rod with USB interface and control unit;The connection corresponding with each pin of the USB interface of the terminal device of each pin of the USB interface wire rod;Resistance is connected between the ID pins and GND pin of the USB interface wire rod;Described control unit is connected with each pin of the USB interface of the terminal device, and the ID pins of the USB interface of the terminal device are connected with power supply.The embodiment of the present invention judges whether to enter test pattern, so as to complete the performance test of the terminal device to on-keyboard input by detecting the magnitudes of voltage of the ID pins of the USB interface of terminal device in test circuit according to the magnitude of voltage detected.

Description

Test circuit, method and apparatus

Technical field

The present embodiments relate to terminal device measuring technology, more particularly to a kind of test circuit, method and apparatus.

Background technology

In the production process of terminal device, in order to ensure the quality of terminal device, it is necessary to the various soft of terminal device Hardware module progress engineering test, and this engineering test, for ordinary consumer, take less than.Therefore, Ji Yaofang Just the production of terminal device, avoids consumer from entering test pattern when in use again, and a kind of good method of testing is just particularly heavy Will.

In existing terminal device, for example, there is the terminal device of keyboard entry function for mobile phone etc., can be soft Solidify some engineering test patterns in part, some special numerals or character can enter test pattern by input through keyboard.

But there is no the terminal device of input through keyboard for some, to carry out engineering test pattern just in process of production It is extremely difficult.

The content of the invention

In view of this, the embodiment of the present invention provides a kind of test circuit, method and apparatus, to optimize existing terminal device Measuring technology, meet the test for the terminal device that developer inputs to on-keyboard.

In a first aspect, the embodiments of the invention provide a kind of test circuit, including:With USB interface and control unit Terminal device and USB interface wire rod;

The connection corresponding with each pin of the USB interface of the terminal device of each pin of the USB interface wire rod;It is described Resistance is connected between the ID pins and GND pin of USB interface wire rod;Described control unit and the USB interface of the terminal device The connection of each pin, and the ID pins of the USB interface of the terminal device are connected with power supply.

In second aspect, the embodiment of the present invention additionally provides a kind of method of testing based on above-mentioned test circuit, including:

Described control unit detects the magnitude of voltage of the ID pins of the USB interface of the terminal device;

Described control unit judges whether to enter test pattern according to the magnitude of voltage detected.

In the third aspect, the embodiment of the present invention additionally provides a kind of test device based on above-mentioned test circuit, including:

Detection module, the magnitude of voltage of the ID pins of the USB interface for detecting the terminal device;

Judge module, for judging whether to enter test pattern according to the magnitude of voltage detected.

Test circuit provided in an embodiment of the present invention, method and apparatus, by the USB for detecting terminal device in test circuit The magnitude of voltage of the ID pins of interface, judged whether to enter test pattern according to the magnitude of voltage detected, so as to complete to on-keyboard The performance test of the terminal device of input.

Brief description of the drawings

Fig. 1 is a kind of test circuit schematic diagram that first embodiment of the invention provides;

Fig. 2 is a kind of schematic flow sheet for method of testing that second embodiment of the invention provides;

Fig. 3 is a kind of schematic flow sheet for method of testing that third embodiment of the invention provides;

Fig. 4 is a kind of schematic flow sheet for method of testing that fourth embodiment of the invention provides;

Fig. 5 is a kind of structural representation for test device that fifth embodiment of the invention provides;

Fig. 6 is a kind of structural representation for test device that sixth embodiment of the invention provides.

Embodiment

In order that the object, technical solutions and advantages of the present invention are clearer, below in conjunction with the accompanying drawings to the specific reality of the present invention Example is applied to be described in further detail.It is understood that specific embodiment described herein is used only for explaining the present invention, Rather than limitation of the invention.It also should be noted that for the ease of describing, illustrate only in accompanying drawing related to the present invention Part rather than full content.

First embodiment

Fig. 1 is the test circuit that first embodiment of the invention provides, and can be completed to terminal device by the test circuit Performance test.As shown in figure 1, the test circuit includes:With usb 1 11 and the terminal device of control unit 112 11, And USB interface wire rod 12.Control unit 112 can be specifically MCU (micro-control unit).

Each pin of the USB interface wire rod 12 is corresponding with each pin of the usb 1 11 of the terminal device 11 to be connected Connect;Resistance 13 is connected between the ID pins and GND pin of the USB interface wire rod 12;Described control unit 112 and the terminal Each pin connection of the usb 1 11 of equipment 11, and the ID pins of the usb 1 11 of the terminal device 11 and power supply phase Even.Wherein, terminal device can be the electronic product of on-keyboard input, such as smart camera, intelligent sound box etc., not do here It is specific to limit.

The resistance of the resistance connected between ID pins and GND pin by changing the USB interface wire rod described in the present embodiment Value, judged whether according to caused magnitude of voltage on the resistance detected to enter test pattern by control unit, so as to complete to nothing The performance test of the terminal device of input through keyboard.

Exemplary, on the basis of above-described embodiment, the resistance 13 is variable resistor.

For example, can according to the size of voltage on variable resistor, control terminal whether enter test pattern or into which kind of Test pattern.For example, the corresponding relation of resistance, voltage and test pattern is as shown in following table one:

Table one

The test circuit proposed for above-mentioned first embodiment, the present invention also provide a kind of method of testing, and the present invention is implemented The method of example by the control unit in terminal device or can be integrated in the test device in terminal device to perform, the control Unit or device can be realized by way of hardware and/or software, to this and be not limited.

Second embodiment

Fig. 2 is a kind of schematic flow sheet for method of testing that second embodiment of the invention provides, as shown in Fig. 2 specific bag Include following steps:

Step 21, control unit detection terminal equipment USB interface ID pins magnitude of voltage, perform step 22.

For example, according to test circuit as shown in Figure 1, the ID pins and USB interface of the usb 1 11 of terminal device 11 The ID pins of wire rod 12 are linked together, and resistance, therefore institute are connected between the ID pins and GND pin of USB interface wire rod 12 The magnitude of voltage for stating the ID pins of the USB interface of terminal device is magnitude of voltage caused by the resistance, and the terminal device 11 The ID pins of usb 1 11 be connected with power supply, such as the magnitude of voltage of the power supply is Vcc, wherein, the USB of terminal device connects The magnitude of voltage of the ID pins of mouth can change with the change of the resistance value of the resistance, then the ID of the USB interface of terminal device The range of voltage values of pin is between 0~Vcc.

Step 22, control unit judge whether to enter test pattern according to the magnitude of voltage detected.

The present embodiment detects the magnitude of voltage of the ID pins of the USB interface of the terminal device by control unit, according to inspection The magnitude of voltage measured judges whether to enter test pattern, can complete the performance test of the terminal device to on-keyboard input.

Exemplary, on the basis of above-described embodiment, described control unit judges whether according to the magnitude of voltage detected Into test pattern, including:

Whether the magnitude of voltage that described control unit determines to detect is more than 0 and is less than Vcc, if so, then judging to enter test Pattern, otherwise, judgement do not enter test pattern or exit test pattern;Wherein Vcc is the voltage of the power supply.

For example, when control unit is 0 or Vcc according to the magnitude of voltage detected, then the terminal device does not enter survey Die trial formula;When control unit according to the magnitude of voltage detected between 0 and Vcc when, then the terminal device enters test pattern.

Exemplary, methods described also includes:

After judging to enter test pattern, according to magnitude of voltage set in advance and the corresponding relation of test pattern, it is determined that working as Before test pattern corresponding to the magnitude of voltage that detects, and control terminal device to enter the test pattern determined.

For example, the corresponding relation of the magnitude of voltage and test pattern as shown in following table two can be pre-set, control terminal is set It is standby to enter test pattern corresponding with magnitude of voltage.

Table two

Exemplary, the test pattern includes following one kind:Power supply test pattern, LED test pattern and battery fill Discharging function test pattern.

Wherein, power supply test pattern is whether the power supply signal of test terminal device is normal.LED test pattern is tested Whether the LED of terminal device normally shows.Battery charging and discharging function testing mode tests terminal device battery charging and discharging work( Can whether normal.

3rd embodiment

Fig. 3 is a kind of schematic flow sheet for method of testing that third embodiment of the invention provides, as shown in figure 3, specific bag Include following steps:

Step 31, control unit detection terminal equipment USB interface ID pins magnitude of voltage, perform step 32.

Whether the magnitude of voltage that step 32, control unit determine to detect is more than 0 and is less than Vcc.

For example, Vcc=3.3V, if the magnitude of voltage that control unit determines to detect is more than 0 and is less than 3.3V, performs step 33, otherwise, perform step 36.

Step 33, control unit judge to enter test pattern, execution step 34.

Step 34, control unit determine current detection according to magnitude of voltage set in advance and the corresponding relation of test pattern The test pattern corresponding to magnitude of voltage arrived, perform step 35.

For example, the corresponding relation of magnitude of voltage set in advance and test pattern is as shown in following table three:

Table three

Magnitude of voltage Test pattern Magnitude of voltage 1 (such as 1.65V) Power supply test pattern Magnitude of voltage 2 (such as 2.48V) LED test pattern Magnitude of voltage 3 (such as 0.82V) Battery charging and discharging function testing mode

Step 35, control unit control terminal device enter the test pattern determined.

For example, when the magnitude of voltage that control unit determines to detect is magnitude of voltage 1 (such as 1.65V), then terminal is controlled to set It is standby to enter power supply test pattern, that is, the power switch for the equipment that opens a terminal, whether normal test power supply signal;When control unit is true When the magnitude of voltage that regular inspection measures is magnitude of voltage 2 (such as 2.48V), then terminal device is controlled to enter LED test pattern, i.e., one by one The LED of terminal device is lighted, determines whether LED can normally show;When the magnitude of voltage that control unit determines to detect is During magnitude of voltage 3 (such as 0.82V), then terminal device is controlled to enter battery charging and discharging function testing mode, i.e. reading terminal equipment The battery information of internal battery, is transmitted by usb data, is sent on the software kit at PC ends, charge and discharge monitoring is carried out, with true Whether determine battery being capable of normal discharge and recharge.

Step 36, control unit control terminal device do not enter test pattern or exit test pattern.

For example, when the magnitude of voltage that control unit determines to detect is 0 or Vcc (such as 3.3V), then terminal is controlled to set It is standby not enter test pattern or exit test pattern.

The present embodiment detects the magnitude of voltage of the ID pins of the USB interface of the terminal device by control unit, according to inspection The magnitude of voltage measured judges whether to enter test pattern, and enters different test patterns according to different magnitudes of voltage, can be complete The performance test of the terminal device of paired on-keyboard input.

Fourth embodiment

Fig. 4 is a kind of schematic flow sheet for method of testing that fourth embodiment of the invention provides, as shown in figure 4, specific bag Include following steps:

Step 41, control unit start work, perform step 42.

The magnitude of voltage of the ID pins of the USB interface of the real-time detection terminal equipment of step 42, control unit, perform step 43.

Step 43, control unit determine the magnitude of voltage Vid detected, perform step 44.

Step 44, control unit determine current detection according to magnitude of voltage set in advance and the corresponding relation of test pattern The test pattern corresponding to magnitude of voltage arrived.

For example, when the magnitude of voltage that control unit determines to detect is 0 or Vcc, then terminal device is controlled not enter survey Die trial formula exits test pattern;When the magnitude of voltage that control unit determines to detect is magnitude of voltage 1, then terminal device is controlled Into test pattern 1;When the magnitude of voltage that control unit determines to detect is magnitude of voltage 2, then terminal device is controlled to enter test Pattern 2;When the magnitude of voltage that control unit determines to detect is magnitude of voltage 3, then terminal device is controlled to enter test pattern 3, etc. Deng.

The present embodiment detects the magnitude of voltage of the ID pins of the USB interface of the terminal device by control unit, according to inspection The magnitude of voltage measured judges whether to enter test pattern, and enters different test patterns according to different magnitudes of voltage, can be complete The performance test of the terminal device of paired on-keyboard input.

5th embodiment

Fig. 5 is a kind of structural representation for test device that fifth embodiment of the invention provides, as shown in figure 5, specific bag Include:Detection module 51 and judge module 52.

Detection module 51 is used for the magnitude of voltage for detecting the ID pins of the USB interface of the terminal device;

Judge module 52 is used to judge whether to enter test pattern according to the magnitude of voltage detected.

For example, according to test circuit as shown in Figure 1, the ID of detection module 51 and the usb 1 11 of terminal device 11 draws Pin is connected, to detect the change of the magnitude of voltage of the ID pins of the USB interface of the terminal device.Wherein, the terminal device The excursion of the magnitude of voltage of the ID pins of USB interface is between 0~Vcc.Judge module 52 detects according to detection module 51 Magnitude of voltage judge whether to enter test pattern.

Exemplary, on the basis of above-described embodiment, the judge module 52 is specifically used for:

It is determined that whether the magnitude of voltage detected is more than 0 and is less than Vcc, if so, then judging to enter test pattern, otherwise, sentence It is disconnected not enter test pattern or exit test pattern;Wherein Vcc is the voltage of the power supply.

For example, when it is 0 or Vcc that the judge module 52, which determines the magnitude of voltage that the detection module 51 detects, then The terminal device is controlled not enter test pattern;When the judge module 52 determines the voltage that the detection module 51 detects When value is between 0 and Vcc, then the terminal device is controlled to enter test pattern.

Exemplary, described device also includes:

Test pattern determining module, for after the judge module 52 judges to enter test pattern, according to presetting Magnitude of voltage and test pattern corresponding relation, determine the test pattern corresponding to currently detected magnitude of voltage, and control end End equipment enters the test pattern determined.

For example, the magnitude of voltage that test pattern determining module can be prestored as shown in upper table two is corresponding with test pattern Relation, and control terminal device to enter test pattern corresponding with magnitude of voltage according to corresponding relation.

Exemplary, the test pattern includes following one kind:Power supply test pattern, LED test pattern and battery fill Discharging function test pattern.

Wherein, power supply test pattern is whether the power supply signal of test terminal device is normal.LED test pattern is tested Whether the LED of terminal device normally shows.Battery charging and discharging function testing mode tests terminal device battery charging and discharging work( Can whether normal.

The test device that the embodiment of the present invention is provided can be used for performing the method for testing that any embodiment of the present invention provides, Possess corresponding functional module, realize identical beneficial effect.

Sixth embodiment

Fig. 6 is a kind of structural representation for test device that sixth embodiment of the invention provides, as shown in fig. 6, specific bag Include:Detection module 61, judge module 62 and test pattern determining module 63.

Detection module 61 is used for the magnitude of voltage for detecting the ID pins of the USB interface of the terminal device;

Judge module 62 is used to judge whether to enter test pattern according to the magnitude of voltage detected.

Further, the judge module 62 is specifically used for:

It is determined that whether the magnitude of voltage detected is more than 0 and is less than Vcc, if so, then judging to enter test pattern, otherwise, sentence It is disconnected not enter test pattern or exit test pattern;Wherein Vcc is the voltage of the power supply.

Further, described device also includes:

Test pattern determining module 63 is used for after the judge module 62 judges to enter test pattern, according to presetting Magnitude of voltage and test pattern corresponding relation, determine the test pattern corresponding to currently detected magnitude of voltage, and control end End equipment enters the test pattern determined.

Further, the test pattern includes following one kind:Power supply test pattern, LED test pattern and battery fill Discharging function test pattern.

The test device that the embodiment of the present invention is provided can be used for performing the method for testing that any embodiment of the present invention provides, Possess corresponding functional module, realize identical beneficial effect.

Obviously, it will be understood by those skilled in the art that above-mentioned each module of the invention or each step can be by as above Described server implementation.Alternatively, the embodiment of the present invention can be realized with the program that computer installation can perform, so as to To be stored in storage device by processor to perform, described program can be stored in a kind of computer-readable storage In medium, storage medium mentioned above can be read-only storage, disk or CD etc.;Or they are fabricated to respectively each Individual integrated circuit modules, or the multiple modules or step in them are fabricated to single integrated circuit module to realize.So, The present invention is not restricted to the combination of any specific hardware and software.

The preferred embodiments of the present invention are the foregoing is only, are not intended to limit the invention, for those skilled in the art For, the present invention can have various changes and change.All any modifications made within spirit and principles of the present invention, it is equal Replace, improve etc., it should be included in the scope of the protection.

Claims (5)

  1. A kind of 1. test circuit, it is characterised in that including:Terminal device and USB with USB interface and control unit connect Mouth line material;
    The connection corresponding with each pin of the USB interface of the terminal device of each pin of the USB interface wire rod;The USB connects Resistance is connected between the ID pins and GND pin of mouth line material;Described control unit is respectively drawn with the USB interface of the terminal device Pin is corresponding to be connected, and the ID pins of the USB interface of the terminal device are connected with power supply, wherein, the resistance is can power transformation Resistance, described control unit detect the magnitude of voltage of the ID pins of the USB interface of the terminal device, and described control unit determines detection Whether the magnitude of voltage arrived is more than 0 and is less than Vcc, if so, then judging to enter test pattern, otherwise, judgement does not enter test pattern Or test pattern is exited, wherein Vcc is the voltage of the power supply.
  2. A kind of 2. method of testing based on test circuit described in claim 1, it is characterised in that including:
    Described control unit detects the magnitude of voltage of the ID pins of the USB interface of the terminal device;
    Whether the magnitude of voltage that described control unit determines to detect is more than 0 and is less than Vcc, if so, then judge to enter test pattern, Otherwise, judge not entering test pattern or exit test pattern;Wherein Vcc is the voltage of the power supply;
    After judging to enter test pattern, according to magnitude of voltage set in advance and the corresponding relation of test pattern, it is determined that current inspection The test pattern corresponding to magnitude of voltage measured, and control terminal device to enter the test pattern determined.
  3. 3. according to the method for claim 2, it is characterised in that the test pattern includes following one kind:Power supply test mould Formula, LED test pattern and battery charging and discharging function testing mode.
  4. A kind of 4. test device based on test circuit described in claim 1, it is characterised in that including:
    Detection module, the magnitude of voltage of the ID pins of the USB interface for detecting the terminal device;
    Judge module, whether the magnitude of voltage for determining to detect is more than 0 and is less than Vcc, if so, then judging to enter test mould Formula, otherwise, judgement do not enter test pattern or exit test pattern;Wherein Vcc is the voltage of the power supply;
    Test pattern determining module, for the judge module judge enter test pattern after, according to voltage set in advance Value and the corresponding relation of test pattern, determine the test pattern corresponding to currently detected magnitude of voltage, and control terminal device Into the test pattern of determination.
  5. 5. device according to claim 4, it is characterised in that the test pattern includes following one kind:Power supply test mould Formula, LED test pattern and battery charging and discharging function testing mode.
CN201410848749.1A 2014-12-30 2014-12-30 Test circuit, method and apparatus CN104569673B (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108700623A (en) * 2016-01-28 2018-10-23 深圳瀚飞科技开发有限公司 Charger tests system
CN107085180B (en) * 2017-04-10 2020-04-10 佛山市顺德区美的电热电器制造有限公司 Automatic detection method and device for touch keys, processor and household appliance
CN107632266A (en) * 2017-09-08 2018-01-26 奇酷互联网络科技(深圳)有限公司 The test system and method for testing of mobile terminal, mobile terminal
CN107864442A (en) * 2017-10-27 2018-03-30 Tcl通力电子(惠州)有限公司 Method of testing based on intelligent sound equipment, intelligent sound equipment and storage medium
CN108539536B (en) * 2018-03-13 2020-01-17 Oppo广东移动通信有限公司 Socket of electronic equipment, plug and data line

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1083285A (en) * 1992-07-21 1994-03-02 先进显微设备股份有限公司 The cordless telephone of the in-circuit emulation ability mode in the integrated circuit and this integrated circuit of use
US5953273A (en) * 1997-05-29 1999-09-14 Nec Corporation Semiconductor integrated circuit device having confirmable self-diagnostic function
CN101387686A (en) * 2008-10-22 2009-03-18 炬力集成电路设计有限公司 Apparatus and method for making system-on-a-chip into test mode
CN103064489A (en) * 2011-10-21 2013-04-24 华为终端有限公司 Method for selecting internal circuit according to conditions of universal serial bus (USB) interface and terminal
CN103344863A (en) * 2013-07-15 2013-10-09 惠州Tcl移动通信有限公司 Mobile terminal testing method and mobile terminal testing system
CN103869236A (en) * 2014-03-31 2014-06-18 广州华欣电子科技有限公司 Method and jig for testing infrared touch screen PCBA

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1083285A (en) * 1992-07-21 1994-03-02 先进显微设备股份有限公司 The cordless telephone of the in-circuit emulation ability mode in the integrated circuit and this integrated circuit of use
US5953273A (en) * 1997-05-29 1999-09-14 Nec Corporation Semiconductor integrated circuit device having confirmable self-diagnostic function
CN101387686A (en) * 2008-10-22 2009-03-18 炬力集成电路设计有限公司 Apparatus and method for making system-on-a-chip into test mode
CN103064489A (en) * 2011-10-21 2013-04-24 华为终端有限公司 Method for selecting internal circuit according to conditions of universal serial bus (USB) interface and terminal
CN103344863A (en) * 2013-07-15 2013-10-09 惠州Tcl移动通信有限公司 Mobile terminal testing method and mobile terminal testing system
CN103869236A (en) * 2014-03-31 2014-06-18 广州华欣电子科技有限公司 Method and jig for testing infrared touch screen PCBA

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