CN104561518A - Method and device for processing rolled goods in rolling mill - Google Patents

Method and device for processing rolled goods in rolling mill Download PDF

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Publication number
CN104561518A
CN104561518A CN201410552845.1A CN201410552845A CN104561518A CN 104561518 A CN104561518 A CN 104561518A CN 201410552845 A CN201410552845 A CN 201410552845A CN 104561518 A CN104561518 A CN 104561518A
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rolled piece
ray
intensity
ray detector
structural parameters
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约翰内斯·达格内
汉斯-乌尔里希·勒夫勒
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Primetals Technologies Germany GmbH
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Siemens AG
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21BROLLING OF METAL
    • B21B38/00Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention relates to a method for processing rolled goods in a rolling mill. The rolled goods are illuminated by X-rays during processing. The rolling mill is provided with at least one X-ray detector; strength of X-raysdiffracted from at least one preset direction from the rolled goods can be measured via the X-ray detector; at least one X-ray detector is arranged in a preset refraction position; according to the strength, at least one practical value of the structural parameters of the rolled goods can be measured; the rolled goods are provided with a poloycrystalline structure in a static orientation of the rolled goods; and a preset to-be-studied position of refraction to grains based on a Bragg condition. The invention further relates to a device having at least one X light source producing X-rays, at least one X-ray detector measuring X-rays diffracted along the at least one preset direction from the rolled goods, and a control and evaluation unit executing a software applying any claims in the embodiment.

Description

For processing the method and apparatus of rolled piece in rolling mill
Technical field
The present invention relates to a kind of method and apparatus for processing rolled piece in rolling mill.
Background technology
When rolled piece being processed in rolling mill plate, line or belt, such as in the hot rolling heating and cooling time cause phase transformation in rolled piece and/or tissue change.To this example be: in steel making, convert body-centred cubic iron to from face-centred cubic iron; Mg in aluminium alloy 2recrystallization after the precipitation of Si or forming process.This phase transformation or tissue change have conclusive impact for the mechanical property of rolled piece, therefore attempt on purpose controlling this transition process, to obtain the rolled piece with certain material characteristics at the end of the operation of rolling.
But, during the operation of rolling to this process or material behavior carry out without destroy measurement normally difficulty.Such as it is known that: take out rolled piece selective examination sample and therefrom determine mechanical property.But at this disadvantageously, this selective examination sample only can at specific position, such as in the top of rolled piece or end, such as online sharp place or take out in the front end of steel band, and the assessment of described selective examination sample needs high time consumption.
Another kind of feasibility is: by means of on-line measurement, namely measure during processing rolled piece, determines granularity and therefrom draw the conclusion of the mechanical property of material from the magnetic characteristic of material.Although the method is without destruction and have detected the major part of rolled piece, but the structure that or only can not very restrictively can detect rolled piece or the phase be present in rolled piece.In addition, Magnetic Measurement touches its limit on Curie temperature, makes reliable conclusion be no longer feasible.
In addition, there is known as to the additional of selective examination sample extraction or supplement: utilize organize models to evaluate the mechanical property of whole rolled piece or organizational component, namely such as to the whole length evaluation of line or steel band.But need to carry out adjustment to selective examination sample in advance to this.
Such as known from DE 199 41 736 A1: rolled piece between processing period, carry out transmission with x-ray and determination and analysis at the diffracted intensity of the x-ray of rolled piece diffraction.But the method has following shortcoming: significantly to have been weakened by the absorption in rolled piece and measured intensity is relevant to the thickness of rolled piece from the x-ray of rolled piece.
Summary of the invention
Therefore the object of the invention is, proposing a kind of method of the improvement for processing rolled piece, reliably can determine the characteristic of workpiece by described method during the operation of rolling.In addition, the object of the invention is to propose the equipment for implementing the method.
First the object proposed is realized by the method for feature according to claim 1.According to of the present invention for processing in the method for rolled piece in rolling mill, with x-ray irradiation rolled piece between processing period.Measure from rolled piece along the intensity of the x-ray of at least one predetermined direction diffraction by least one X-ray detector, and at least one actual value of structural parameters according to intensity determination rolled piece.This at least one X-ray detector is arranged on expection at this and occurs in the position of reflection, wherein rolled piece has the polycrystalline structure of the static orientation of the crystal grain be present in rolled piece, and determines the position of reflection relative to the phase that will study of crystal grain of expection by means of Bragg condition.
In other words: the x-ray of diffraction or the intensity of reflection that specific lattice plane is expected on the specific lattice plane measuring the phase of expecting in rolled piece in the position preset.This has following advantage: the x-ray namely such as caused by X-ray fluorescence is not affected or affects measurement hardly.
Therefore, during the operation of rolling, rolled piece performs online x-ray diffraction approach, and determine the structural parameters of rolled piece from the intensity measured by the x-ray at rolled piece diffraction, namely implement presence to a certain extent and determine.This actual value of structural parameters is: be such as present in rolled piece or that expect wherein, can according to the orientation of reflection or the phase of location recognition; Be present in the component of phase that is in rolled piece or that expect wherein; Or microstructure parameters, be such as present in precipitation in rolled piece and its size or mutually in granularity, described granularity such as can measure according to the intensity distribution of reflection or reflection acutance.
Rolled piece is the polycrystalline material with each crystal grain, described crystal grain orientation statically in rolled piece.There is crystal grain fully due to the polycrystalline structure of rolled piece, the lattice plane of described crystal grain is different angles ground orientation relative to the surface of rolled piece, makes to produce the reflection with abundant intensity for each lattice plane.Each crystal grain and temperature or deformation extent be arranged in relatively different mutually, be such as arranged in the austenite with face-centred cubic structure (fcc) or the ferrite with body-centered cubic structure (bcc), it affects the mechanical property of rolled piece.Therefore, by determining that between processing period the structural parameters of rolled piece can control by modification quality.
At this, the present invention is based on following thought: measured by X-ray detector on the direction that at least one is predetermined in the intensity of the x-ray of rolled piece place diffraction.In other words, X-ray detector is arranged in certain position, makes it can detect on the specific lattice plane of rolled piece, such as diffraction or reflection in (the 111)-plane of austenite crystal x-ray.Therefore, the preposition being furnished with X-ray detector above according to study or to expect in rolled piece or expect mutually in the appearance of reflection expected select.This has following advantage: X-ray detector need not be made during measuring to move through specific angular range, but on purpose can detect the reflection from rolled piece.In addition, in predetermined, namely according to the reflection location of expection X-ray detector, there is no need for determining method, such as Rietveld method that the height of structural parameters expends, described method is especially problematic in real time.
For orientation or the position of the reflection desired mutually that will study, or diffraction angle can by means of Bragg condition-n λ=2dsin θ-determine, wherein the lattice plane of phase is with described angle of diffraction diffracted X-ray ray.At this, diffraction angle is the angle that incident x-ray and the lattice plane meeting Bragg condition are surrounded in-between.Because conditioned reflex is that incidence angle is identical with the angle of emergence, X-ray detector and X source are positioned to, make the angle between both be 180 ° of-2 θ.Therefore, predetermined direction can be interpreted as following direction, specific phase specific through the x-ray of plane along described direction diffract incident.Which kind of lattice plane of phase is anticipated reflection and triggers described reflection for described in which kind of through plane, and this can determine by means of structural model or structure factor.
Be present in phase that is in rolled piece or that expect due to procedure of processing before to determine according to form or empirical value in principle.As already mentioned, the orientation of the reflection of the lattice plane of the phase of expection or position can be determined according to structural model via Bragg condition.In one preferred embodiment, determine the phase of expecting in rolled piece according to organize models, and and then determine to expect the position occurring reflection.By organize models, according to the deformation extent of rolled piece, temperature, cool time and composition determine to be present in phase in rolled piece or ad-hoc location be in expect in rolling mill phase, the phase transformation occurred between processing period in rolled piece or recrystallization process.From expect according to organize models mutually determine for the reflection desired by this phase, and correspondingly locate this at least one X-ray detector.
First feasibility of the method is: the actual value as structural parameters is determined, within the given time, whether there is the phase of expecting in rolled piece; And determine that component of the phase existed in rolled piece.If along predetermined direction diffracted X-ray ray, so measure reflection, can therefrom draw: exist mutually or lattice plane in rolled piece, from described phase or create reflection through plane.Therefore the phase be present in rolled piece identifies according in specific location generation reflection or the absolute intensity along the x-ray of predetermined direction diffraction.In addition, by demarcating that component that can measure the phase be present in rolled piece in advance.
Advantageously, measure the intensity of the x-ray from rolled piece diffraction at least two different positions respectively, and at least determine to be present in that component of the phase in rolled piece by comparing as the intensity measured by the actual value of structural parameters.If if application can detect X-ray detector or the reflection of enough large angular range or be arranged in enough little angular range along the x-ray of at least both direction diffraction, so application has the X-ray detector of corresponding large receiving area is enough.But propose to use two or more to be arranged in the X-ray detector at diverse location place.The comparison of measured intensity can such as by forming difference or by determining that the ratio of maximum intensity realizes at this.If the phase that such as existence two is different in rolled piece, so two X-ray detector are arranged in for respective desired mutually two positions occurring reflection.The conclusion of the mutual ratio about phase can be determined from the ratio of these two the mutual maximum intensitys of reflection, and and then determine that component of the corresponding phase in rolled piece.Therefore, that component of phase is determined according to the relative intensity of the x-ray of diffraction.Thus it is possible that determine multiple phase simultaneously, and and then after demarcating in advance, detect the institutional framework of rolled piece quantitatively.
In another favourable design of the method, by comparing from rolled piece along the intensity distribution of the intensity distribution measured by the x-ray of this at least one predetermined direction diffraction and expection the actual value determining structural parameters.Due to fluctuate in measuring tempeature fluctuation and micro-structural and rolled piece polycrystalline characteristic during the motion of rolled piece, for reflection, do not obtain each peak value of intensity, but obtain the intensity distribution that expands on little angular range.Such as, less granularity causes less coherence length and expansion therefore, the propagation of namely reflecting.At this, such as, can determine the intensity distribution of expecting according to the phase of expection and granularity and temperature, and demarcate the intensity distribution of expection by means of measuring condition, such as focused condition.By comparing with measured intensity distribution subsequently, therefrom, such as can determine that component of phase from maximum intensity, or for the granularity being less than 0.2 μm, from the half breadth of intensity distribution, measuring granularity by means of Scherrer formula.
In another preferred embodiment of the method, measure the time changing curve of the intensity of the x-ray along this at least one predetermined direction diffraction, and therefrom determine the change of the actual value of structural parameters with the position in rolled piece relatively.In other words: during processing rolled piece, the partial-length at least for rolled piece measures the intensity of identical reflection with certain hour interval, such as every 0.1 to 15s, and therefrom determines the actual value of structural parameters, that component of such as phase respectively.Therefore it is possible that: check whether the actual value about the structural parameters of length of rolled piece is constant or whether occurs deviation or fluctuation.
In addition, if measure the temperature of rolled piece, and considering the correlation of the intensity of temperature when determining the actual value of structural parameters, so improving the precision of method.At this, measuring tempeature in focus as far as possible.The lattice paprmeter of each phase is temperature correlation, therefore can occur two kinds of effects in online x-ray diffraction approach.First, crystal vibration rises with temperature and rises, and this causes less reflected intensity.In addition, when temperature improves, obtain larger lattice paprmeter by thermal expansion, make the diffraction maxima of reflected intensity move to less angle.When temperature is less, correspondingly there is the movement to greater angle.In order to eliminate temperature impact as much as possible, the intensity measured by correcting according to the known relation of temperature impact, namely therefrom calculates temperature impact.With temperature correlation ground, the position that reflection appears in expection can be corrected equally, and then X-ray detector is arranged in described corrected position.
During processing rolled piece, can change its length, namely rolled piece fluctuates a little in its height, and and then moves out from the focus of X source or X-ray detector.But, in a preferred design of the method, between processing period, determine the orientation of rolled piece, and by constant to the spacing maintenance of rolled piece at least one X source for generation of x-ray and this at least one X-ray detector during processing rolled piece.In other words: the height and position of rolled piece such as detects by means of laser measurement, and adjusts X source and X-ray detector, so as to realize focus correction or keep it about the working time constant.
In one of the method favourable design, the actual value of the structural parameters of rolled piece and the theoretical value of structural parameters are compared, and difference correlation between the actual value and theoretical value of structural parameters affect or change at least one procedure parameter for processing rolled piece.At this, this at least one procedure parameter especially mates according to the model describing the operation of rolling.Alternatively or additionally feasibility is: control and/or adjustment process parameter.This theoretical value of structural parameters is such as determined according to organize models or directly makes a reservation for, and therefore rolled piece has the mechanical property of expectation at the end of the operation of rolling.If there is difference between the actual value and theoretical value of structural parameters, so such as determine at least one procedure parameter that will change, actual value is matched with theoretical value according to the model describing the operation of rolling.Such as, temperature or cooling rate can be introduced as procedure parameter, and such as can mate the control of the cooling path of rolling mill.Other procedure parameter may be such as the speed that rolled piece passes rolling mill.
Preferably, procedure parameter actual value, be especially present in rolled piece for mating organize models.Again can draw according to set procedure parameter and its impact for rolled piece structure the conclusion that occurs phase transformation and improve organize models.
In the first alternative scheme of the method, the x-ray that application is monochromatic.To this, before X source, arrange monochromator, such as only to apply the K with high strength αradiation.In order to avoid interfering X-ray fluorescence, using be matched with rolled piece material, be such as used for Fe or Cr of steel as anode material.
Second alternative scheme is: application white x-ray and perform intensity energy dispersion measurement.To this, X-ray spectrometer is used as X-ray detector.
Second object proposed is realized by the equipment of feature according to claim 16, and it has: at least one is for generation of the X source of x-ray; At least one X-ray detector is for measuring from rolled piece along the x-ray of at least one predetermined direction diffraction; With control and assessment unit, in described control and assessment unit, be integrated with the software for performing the method according to any one in aforementioned claim.
This at least one X source and this at least one X-ray detector are with the pitch arrangement apart from rolled piece 0.1-3m, approximately 2m.This coherence for X-ray beam and collimation propose high requirement, therefore advantageously apply the X-ray tube than roughly strong 10 times of performance in laboratory equipment.
In a preferred design of this equipment, X source that X source is thickness for measuring rolled piece, that exist, makes to arrange additional X source in rolling mill.
In principle it is possible that spot detector, such as counter or scintillation counter are applied as X-ray detector, and described X-ray detector is run during measured intensity in certain angular range.But advantageously: X-ray detector is area detector.Because lattice paprmeter is temperature correlation, so cause the slight movement of maximum of intensity, less granularity causes the expansion of reflection.By advantageously having the area detector being greater than 0.1 ° of resolution ratio, this movement can be detected, and can reliably detection of reflected expansion, namely about the distribution of the intensity of angular range.
In addition, this equipment advantageously comprises first measurement mechanism in the orientation for determining rolled piece between processing period.This measurement mechanism can be such as the optical interval measurement mechanism of the laser had as light source.
In addition, in one preferred embodiment, the second measurement mechanism of the temperature for determining rolled piece is provided with.At this, this measurement mechanism is especially arranged in the position of the temperature can measured in focus.To this, not only apply independent, also apply temperature measuring equipment in Already in rolling mill.
In addition advantageously: this at least one X source comprises shadow shield, described shadow shield has at least two regions with aperture different from each other.Due to the different angle of diffraction of each lattice plane of the phase of expection, the focus of the reflection of corresponding expection be not all located at protractor circle upper, be namely positioned at and be furnished with thereon apart from the identical X source of spacing of rolled piece and the circle of X-ray detector, but be located at and have apart from the different focal circle of rolled piece different spacing.Therefore, by application, there is the shadow shield that different apertures maybe can be matched with the A/F of each focal circle, can focusing be improved.
In addition, in order to improve focusing advantageously, this at least one X-ray detector can radially move, and can be positioned in different focal circles.In other words, this at least one X-ray detector is arranged in the focus of the reflection of expection.Focal circle can be determined for the reflection of expection from its angle of diffraction by means of angle of circumference law.
Accompanying drawing explanation
Above-mentioned feature of the present invention, feature and advantage and the description that how to realize below its mode and methods combining embodiment and become more clear and apparent, wherein said embodiment is come to illustrate in detail by reference to the accompanying drawings.
In order to further describe the embodiment of the present invention with reference to accompanying drawing.It illustrates with the schematic diagram of signal respectively:
Fig. 1 illustrates the profile of the rolling mill for processing rolled piece, and this rolling mill has the equipment of the actual value of the structural parameters for determining rolled piece, and this equipment has an X source and an X-ray detector,
Fig. 2 illustrates and utilizes intensity measured by the equipment of Fig. 1 and the intensity of intensity measured by correcting and expection,
Fig. 3 illustrates the equipment of the actual value of the structural parameters for determining rolled piece, and this equipment has an X source and is arranged on two X-ray detector in diverse location,
Fig. 4 illustrates the intensity utilized according to the device measuring of Fig. 3,
Fig. 5 illustrates the equipment of the actual value of the structural parameters for determining rolled piece, and this equipment has an X source and is arranged in two X-ray detector in different focal circles,
Fig. 6 illustrates the shadow shield with two regions different from each other, aperture,
Fig. 7 illustrates the equipment of the actual value of the structural parameters for determining rolled piece, and this equipment has two X sources and is arranged in two X-ray detector in diverse location,
Fig. 8 illustrates the change of the time changing curve of measured intensity and the actual value of that therefrom determine, relevant to the position in rolled piece structural parameters,
Fig. 9 illustrates the equipment of the actual value of the structural parameters for determining rolled piece, and this equipment has the X-ray detector that an X source and are configured to X-ray spectrometer.
Detailed description of the invention
Fig. 1 show have example, for process rolled piece 6, the profile of the in this case rolling mill 2 of two milling trains 4 of steel plate.The X source 8 for utilizing x-ray X irradiation milling train 6 is furnished with in rolling mill 2.X source 8 is the X source 8 for carrying out thickness measure to milling train 6 at this.In addition, in rolling mill 2, X-ray detector 10 is arranged in the focus of x-ray X ', utilizes described X-ray detector to measure from rolled piece 6 along the intensity I of the x-ray X ' of predetermined direction R diffraction.X-ray detector 10 is configured to area detector.X source 8 and X-ray detector 10 are arranged to according to Fig. 1, they are expanded into be parallel to the plane of the rolling direction of rolled piece 6.But in principle, X source 8 and X-ray detector 10 can be arranged in the arbitrary position relative to rolling mill 2 or rolled piece 6, such as, also can be arranged so that the plane that this position is launched perpendicular to them or be transverse to rolling direction.At this, can the x place, position of unrestricted choice can also to perform, namely such as at the edge of rolled piece 6 and middle part not only side by side but also have and in turn perform X-ray and measure the multiple of rolling direction that are transverse to of rolled piece 6.In order to control X source 8 and X-ray detector 10 and there is control and assessment unit 12 to assess the measuring-signal that transmitted by X-ray detector 10.
According to Fig. 1, in rolling mill 2, be also provided with the first measurement mechanism 14 for determining the orientation of rolled piece 6 during processing rolled piece 6.During processing rolled piece 6, the height of described rolled piece fluctuates along the direction of arrow H.The first measurement mechanism 14 is utilized to determine the orientation of rolled piece 6, and X source 8 and X-ray detector 10 carry out the movement on height along the direction of arrow H, to guarantee described X source and the spacing d between X-ray detector and rolled piece 6, d ' is constant, also to obtain the reflection with high and similar intensity I in like fashion when the height fluctuation of rolled piece 6.In addition, be provided with the second measurement mechanism 16, by described second measurement mechanism determine as far as possible near x-ray focus or the temperature of rolled piece 6 in its region.
According to Fig. 1, with the x-ray X irradiation rolled piece 6 produced by X source 8 between processing period.X-ray detector 10 is utilized to measure intensity I from rolled piece 6 along the x-ray X ' of predetermined direction R diffraction.X-ray detector 10 is positioned to, namely detect from the crystal grain 18 of a phase of rolled piece 6 on described crystal grain diffraction or from described crystal grain along the intensity I of the x-ray X ' of direction R.At this, be present in rolled piece 6 or the phase of expecting wherein and for the reflection desired by this phase such as according to such as considering the deformation extent of rolled piece 6 and the organize models of temperature and determining via Bragg condition, and X-ray detector 10 is arranged in expection and occurs in the position of specific reflection.The crystal grain 18 of first-phase such as exists as the austenite with face cubic structure.Therefore X-ray detector 10 is arranged in following position, and in described position, expection occurs having specific diffraction angle ireflection, at this such as the angle of diffraction of austenite crystal 18 (111)-lattice plane.
Fig. 2 shows the intensity I utilized measured by the equipment of Fig. 1, according to the actual value S of the structural parameters of described intensity determination rolled piece 6 ist.Measured intensity I is in diffraction angle iwhen be maximum, for this angle of diffraction, the lattice plane of crystal grain 18, in this case (111)-lattice plane meet Bragg condition.Therefore, if in this diffraction angle ireflecting appears in when, so exists in rolled piece 6 and belongs to this diffraction angle iphase, be such as austenite at this, therefore described phase is identified as the actual value S of structural parameters ist.The actual value S of structural parameters istcan be used in again mating organize models.
Except measured intensity I, Fig. 2 also shows in the mode of dotted line the intensity I that the temperature measured by rolled piece 6 corrects k.The high temperature of rolled piece 6 causes maximum intensity I because lattice fluctuates maxreduction.By means of known relation, from intensity distribution, calculate temperature impact, and according to the actual value S of that correct, measured intensity determination structural parameters ist.The intensity I corrected ktherefore there is the maximum intensity I higher than measured intensity I max.In addition, high temperature can cause diffraction angle itowards less angular movement, there is the reflection of specific lattice plane when this angle of diffraction.Also can determine by means of temperature impact and such as consider this movement when locating X-ray detector 10.
Intensity distribution according to Fig. 2, can by means of Scherrer formula from half breadth FWHM, i.e. intensity distribution at maximum intensity I maxhalf in width in, especially from the half breadth FWHM of the intensity distribution corrected, for being less than the granularity of phase of granularity determination rolled piece 6 of 0.2 μm as the actual value S of structural parameters ist.By the intensity distribution I by measured intensity distribution and expection e(point-like illustrates) compares the actual value S that also can determine structural parameters ist, such as, determine that component of the phase in rolled piece 6.The measured intensity I corrected kintensity distribution at this, there is less maximum intensity I compared with the intensity distribution of expection max, the in esse component of the phase of expection is therefore less.More also phase component or granularity can be determined quantitatively by this.
According to Fig. 3, two X-ray detector 10 are utilized to measure the intensity I of the x-ray of diffraction from rolled piece 6 at two diverse location places.At this, two X-ray detector 10 are arranged in two positions, in described position, expect the specific reflection that appearance two is different.Fig. 4 shows the intensity distribution utilized measured by this equipment.Rolled piece 6 have two different, by the phase shown in two crystal grain 18.In these two crystal grain 18, there is lattice plane, described lattice plane meets Bragg condition when the incidence angle set by x-ray X.From these two crystal grain 18, the x-ray X ' of diffraction is at this along two different, predetermined direction diffraction, is furnished with X-ray detector 10 respectively in said direction.Crystal grain 18 such as exists as austenite, and described austenite has crystal grain different compared with ferrite, makes for different diffraction angle 1, θ 2all meet Bragg condition, and from the x-ray X ' of rolled piece 6 diffraction along the predetermined direction R diffraction of two differences.
By these two intensity are compared, such as by formation ratio I 1/ I 2, the component of at least one mutually can be determined.According to Fig. 4, the intensity I of first-phase 1show the intensity I relative to second-phase 2the maximum intensity I of twice max.Therefore, first-phase is 2:1 relative to the ratio of second-phase.Utilize the method can detect quantitatively and check the phase transformation in rolled piece, and determine the component of the phase be present in rolled piece.Therefore, that component of the phase in rolled piece is defined as the actual value S of structural parameters ist.
If utilize multiple X-ray detector 10 to measure the x-ray X ' of each self-diffraction in multiple different position, so need not forcibly from different, be arranged in rolled piece 6 derive the reflection expected in described position mutually.Equally can it is considered that, but measure the intensity of multiple reflections of the different crystalline lattice plane of phase homophase simultaneously, the such as profile radiation X ' of diffraction on (the 111)-lattice plane of austenitic phase and on (200)-lattice plane, to improve precision.The intensity distribution of acquisition like this can compare with the intensity distribution of expection again.
Fig. 5 shows the equipment with an X source 8 and two X-ray detector 10, wherein X source 8 can be positioned on protractor circle G, and X-ray detector 10 can be positioned on protractor circle G along shown arrow, and can along towards rolled piece 6 direction and with away from described workpiece motion s ground or freely locate.Therefore, X-ray detector 10 radially can move and can be positioned in different focal circles.This is not relative to hard-wired equipment, namely have movable X source 8 to have following advantage with X-ray detector 10: when X source 8 performance is identical, higher intensity can be detected, because always measure under the condition focused in X-ray detector 10.
In the rolled piece 6 that institutional framework is enough low, when namely distributing brokenly at crystal grain 18, there is the described lattice plane to become different angles orientation relative to the surface of rolled piece 6.Therefore, for obtain incident X-rays ray X multiple reflections, multiple on each lattice plane diffraction and from the x-ray X ' of rolled piece 6s because different lattice planes all meets Bragg condition.In other words, each lattice plane being present in phase in rolled piece 6 or phase has different diffraction angle i, and and then the x-ray X ' produced along different predetermined direction R diffraction.But due to different diffraction or Bragg angle θ i, the focus of each reflection is not positioned on protractor circle G at this, but lays respectively at corresponding diffraction angle ifocal circle F ion.According to Fig. 5, in diffraction angle iwhen little, focal circle F 2outside movement.By X-ray detector 10 is arranged in corresponding focal circle F ion, for each reflection, obtain maximum intensity I.For diffraction angle ithe focal circle F obtained ican determine from angle of circumference law at this.
In order to improve focusing further, application has the shadow shield 22 at least two regions different from each other, aperture.According to Fig. 6, shadow shield 22 is designed to long mouth shadow shield at this, and the long mouthpiece of described long mouth shadow shield has different A/F W 1, W 2, make shadow shield 22 can be matched with each focal circle.
If the x-ray X ' of diffraction has little intensity, so this provide: except multiple X-ray detector 10, also utilize multiple X source 8 to measure, as shown in Figure 7.When there is not the crystal grain 18 of enough static orientation or need the long time of integration for each measured value in rolled piece 6, there will be such as little intensity.By along arrow mobile X source 8 on protractor circle G, for the lattice plane of each existence or incidence angle can be set mutually, meet Bragg condition when described incidence angle and and then can high intensity I be measured.X-ray detector 10 is justified on G at protractor by running fix equally according to predetermined direction R, wherein occurs that each reflects along described predetermined direction with set incidence angle.This arrangement is also favourable, because X-ray detector 10 operates on protractor circle G, and described X-ray detector freely need not be positioned at its corresponding focal circle F ion, this is just enough.As an alternative, in order to set focal circle more accurately and and then obtain higher intensity, multiple X source 8 and multiple X-ray detector 10 also can be positioned in each focal circle respectively in couples.Monochromator 20 was arranged respectively, so that the x-ray X ' of focusing diffraction before X-ray detector 10.
Fig. 8 show the reflection of expection, the time changing curve of the intensity I of the reflection of the expection of austenitic phase in this case in rolled piece 6 and the actual value S of structural parameters that determines thus ist, the change curve of in this case that component of austenitic phase, this change curve relevant to rolled piece 6, i.e. the position x of the subregion of such as steel band.At time point t 0, intensity I departs from indeclinable circuit.According to the actual value S of the structural parameters that intensity I is determined istshow can with the position x of rolled piece 6 0the uniform deviation be associated.In the category of quality safety, such as, can sub-elect this seed region of rolled piece 6.In addition in order to process rolled piece 6 further, according to the actual value S by structural parameters istwith the theoretical value S of structural parameters sollcompare, the procedure parameter for processing work 6 can be affected relevantly with difference, make the actual value S of structural parameters istat time point t 1and at position x 1place corresponds to the theoretical value S of structural parameters again soll(dotted line illustrates).At this, the temperature of procedure parameter, such as rolled piece 6 or speed are especially mated according to the model describing the operation of rolling.To this alternatively or in addition to, can to control or adjustment process parameter.
Especially, utilize the x-ray of nitrogen to perform above-mentioned method.Fig. 9 shows the equipment of the alternative with a fixing X source 8 and a fixing X-ray detector 10, wherein applies the x-ray of white.At this, X-ray detector 10 is configured to X-ray spectrometer 24, and performs the measurement at the power dissipation of the intensity I of the x-ray X ' of rolled piece 6 place diffraction.At this, change the wavelength of incident x-ray X, be furnished with the position of X-ray detector 10 with this and then replacement, and with this and then replacement diffraction angle i.
Although set forth in detail in detail by preferred embodiment and describe the present invention, but the present invention is not limited to disclosed example, and other variant can be derived by professional, this does not depart from protection scope of the present invention.

Claims (22)

1. the method for processing rolled piece (6) in rolling mill (2), wherein between processing period, use rolled piece (6) described in x-ray (X) irradiation, described rolling mill has at least one X-ray detector (10), the intensity (I) of the x-ray (X ') from described rolled piece (6) along at least one predetermined direction (R) diffraction is measured by described X-ray detector, wherein said at least one X-ray detector (10) is arranged in expection and occurs in the position of reflection, and at least one actual value (S of the structural parameters of described rolled piece (6) is wherein measured according to described intensity (I) ist), it is characterized in that, described rolled piece has the polycrystalline structure of the static orientation of the crystal grain be present in described rolled piece, and determines the orientation of described reflection relative to the phase that will study of crystal grain of expection by Bragg condition.
2. method according to claim 1, wherein expection occurs that the described position of reflection measures according to the organize models of described rolled piece (6).
3. method according to claim 1 and 2, is wherein determined as the actual value (S of described structural parameters by the component of the phase be present in described rolled piece (6) ist).
4. the method according to any one in aforementioned claim, on at least two different positions, wherein measure the described intensity (I) of the described x-ray (X ') from described rolled piece (6) diffraction respectively, and at least one component of the described phase be present in described rolled piece (6) is determined the actual value (S as described structural parameters by relatively more measured described intensity (I) ist).
5. the method according to any one in aforementioned claim, wherein by comparing from described rolled piece (6) along the measured intensity distribution of described x-ray (X ') of described at least one predetermined direction (R) diffraction and the intensity distribution of expection the described actual value (S measuring described structural parameters ist).
6. the method according to any one in aforementioned claim, wherein measure the temporal change curve of the described intensity (I) of the x-ray (X ') along described at least one predetermined direction (R) diffraction, and measure the described actual value (S of described structural parameters thus with the position (x) in described rolled piece (6) relatively ist) change.
7. the method according to any one in aforementioned claim, wherein measures the temperature of described rolled piece (6), and is measuring the described actual value (S of described structural parameters ist) time consider measured by the correlation of described intensity (I) and described temperature.
8. the method according to any one in aforementioned claim, between processing period, wherein measure the orientation of described rolled piece (6), and in the described rolled piece of processing (6) period, at least one X source for generation of x-ray (8) and at least one X-ray detector described (10) are kept constant apart from the spacing (d, d ') of described rolled piece (6).
9. the method according to any one in aforementioned claim, wherein by the described actual value (S of the described structural parameters of described rolled piece (6) ist) with the theoretical value (S of described structural parameters soll) compare, and with the described actual value (S of described structural parameters ist) and described theoretical value (S soll) between difference correlation ground affect at least one procedure parameter for processing described rolled piece (6).
10. method according to claim 9, wherein mates at least one procedure parameter described according to one that describes in the model of the operation of rolling.
11. methods according to claim 9 or 10, wherein control at least one procedure parameter described.
12. methods according to any one in claim 9 to 11, wherein regulate at least one procedure parameter described.
13. methods according to any one in aforementioned claim, the described actual value (S of wherein said structural parameters ist) for mating described organize models.
14. methods according to any one in aforementioned claim, wherein apply monochromatic x-ray (X).
15. methods according to any one in aforementioned claim, wherein apply the x-ray (X) of white and the power dissipation ground performing described intensity (I) is measured.
16. 1 kinds of equipment with at least one X source for generation of x-ray (X) (8), have: at least one X-ray detector (10), for measuring the x-ray (X ') from rolled piece (6) along at least one predetermined direction (R) diffraction; With control and assessment unit (12), in described control and assessment unit, implement the software for performing the method according to any one in aforementioned claim.
17. equipment according to claim 16, wherein said X source (8) be for described rolled piece (6) thickness measure, the X source (8) that exists.
18. equipment according to claim 16 or 17, wherein said X-ray detector (10) is area detector.
19., according to claim 16 to the equipment described in any one in 18, have the first measurement mechanism (14), for measuring the orientation of described rolled piece during processing.
20., according to claim 16 to the equipment described in any one in 19, have the second measurement mechanism (16), for measuring the temperature of described rolled piece (6).
21. according to claim 16 to the equipment described in any one in 20, and wherein said at least one X source (8) comprises shadow shield (22), and described shadow shield has at least two regions with aperture different from each other.
22. according to claim 16 to the equipment described in any one in 21, and wherein said at least one X-ray detector (10) radially can be moved and can be positioned in different focal circles.
CN201410552845.1A 2013-10-18 2014-10-17 Method and device for processing rolled goods in rolling mill Pending CN104561518A (en)

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