CN104502646A - Mobile terminal test fixture protecting device - Google Patents
Mobile terminal test fixture protecting device Download PDFInfo
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- CN104502646A CN104502646A CN201410830138.4A CN201410830138A CN104502646A CN 104502646 A CN104502646 A CN 104502646A CN 201410830138 A CN201410830138 A CN 201410830138A CN 104502646 A CN104502646 A CN 104502646A
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- power supply
- test probe
- mobile terminal
- protection circuit
- supply signal
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Abstract
The invention discloses a mobile terminal test fixture protecting device. The mobile terminal test fixture protecting device comprises a test probe and a protecting circuit, wherein the protecting circuit is electrically connected with the test probe; the test probe comprises a VBUS (video bus) power signal test probe, a VBAT (voltage of battery) power signal test probe, a rest signal test probe and a ground signal test probe; and the protecting circuit comprises a VBUS power signal protecting circuit, a VBAT power signal protecting circuit and a rest signal protecting circuit. The mobile terminal test fixture protecting device has the advantages that by the test probes and the protecting circuit which is electrically connected with the test probes, a mobile terminal can be protected from being damaged by ESD (electronic static discharge) generated in an external environment and high-voltage pulse generated at the moment of electrification of a fixture when the mobile terminal is tested by the fixture, and the product quality of the mobile terminal is guaranteed.
Description
Technical field
The present invention relates to mobile terminal production test technical field, especially relate to a kind of mobile terminal test fixture protective device.
Background technology
Along with the develop rapidly of mobile communication technology, mobile terminal has become a part indispensable in our life, and along with the sustainable growth of mobile terminal shipment amount, the production test quality of mobile terminal is also day by day by manufacturer is paid attention to.A lot of mobile terminal manufacturer only focuses on the ESD protection of workshop environment and the ESD protection of operative in the process of production test, test fixture does not have protection circuit usually, this will cause occurring in the process using fixture test that the high voltage pulse that the ESD produced due to external environment of certain probability or fixture powered on moment produce causes the dominant or implicit damage of some chip of mainboard, and then the termination function caused directly lost efficacy or terminal has damage not lose efficacy temporarily, but the accumulative situation causing disabler of damage in user's use procedure, have impact on quality and the acceptance of the users of product, reprocess and also cause very large economic loss.
Therefore; the present invention proposes a kind of mobile terminal test fixture protective device; the high voltage pulse that mobile terminal to use in fixture test process the ESD that do not produced by external environment and fixture powered on moment to produce can be protected to damage, ensure that the product quality of mobile terminal.
Summary of the invention
The invention provides a kind of mobile terminal test fixture protective device, to solve in prior art the problem using mobile terminal in fixture test process to be easily subject to the ESD of external environment generation and the high voltage pulse damage of fixture powered on moment generation.
Technical matters solved by the invention realizes by the following technical solutions:
A kind of mobile terminal test fixture protective device, the protection circuit comprising test probe and be electrically connected with described test probe;
Described test probe comprises: VBUS power supply signal test probe, VBAT power supply signal test probe, other signal test probes and earth signal test probe;
Described protection circuit comprises VBUS power supply signal protection circuit, VBAT power supply signal protection circuit, other signal protection circuit;
Described VBUS power supply signal protection circuit is corresponding with VBUS power supply signal test probe to be connected; described VBAT power supply signal protection circuit connects corresponding with VBAT power supply signal test probe; other signal protection circuit described are corresponding with other signal test probe to be connected; described earth signal test probe respectively with VBUS power supply signal protection circuit; VBAT power supply signal protection circuit; other signal protection circuit are electrically connected, to be grounded protection.
As preferred technical scheme, described VBUS power supply signal protection circuit comprises low-pass filter circuit and the ESD protective device D1 of resistance R1, electric capacity C1 composition, and described low-pass filter circuit and ESD protective device D1 are connected in parallel; Operating personnel, mobile terminal to be tested is assembled in the process of test fixture, together with VBUS power supply signal test probe touches with mobile terminal VBUS power supply signal test point, the ESD operated and produce in contact process can release rapidly fixture on the ground by ESD protective device D1, mobile terminal chip VBUS pin is exempted from and is subject to ESD generation damage.Terminal to be tested is being assembled to after on test fixture; tester will open VBUS power supply; a potential pulse higher than VBUS power supply can be produced in the moment of VBUS power supply electrifying; this potential pulse can filter out by the low-pass filter circuit be made up of R1, C1; what make VBUS signal stabilization is transferred to mobile terminal VBUS power supply signal test point by test probe; it is another when VBUS power supply has fluctuation; electric capacity C1 can make VBUS power good, can protect mobile terminal chip VBUS pin not by the energy-producing infringement of high voltage pulse.
As preferred technical scheme, described VBAT power supply signal protection circuit comprises electric capacity C2 parallel with one another, voltage stabilizing diode D2 and ESD protective device D3; Operating personnel, mobile terminal to be tested is assembled in the process of test fixture, together with VBAT power supply signal test probe touches with mobile terminal VBAT power supply signal test point, the ESD operated and produce in contact process can release rapidly fixture on the ground by ESD protective device D3, mobile terminal chip VBAT pin is exempted from and is subject to ESD generation damage.Terminal to be tested is being assembled to after on test fixture; tester will open VBAT power supply; a potential pulse higher than VBAT power supply can be produced in the moment of VBAT power supply electrifying; this potential pulse can filter out by electric capacity C2; what make VBAT signal stabilization is transferred to mobile terminal VBAT power supply signal test point by test probe, protects mobile terminal chip VBAT pin not by the infringement of the surge energy of high voltage pulse generation.When VBUS power supply electrifying, the charging module of mobile terminal can charge to VBAT power supply, the moment VBAT power supply of charging circuit work has voltage surge, voltage stabilizing diode D2 is then clamped rapidly, the energy of voltage surge is released on the ground by voltage stabilizing diode D2, avoids mobile terminal chip VBAT pin to be subject to voltage surge and impact appearance damage.
As preferred technical scheme; other signal protection circuit described comprise ESD protective device D4; operating personnel, mobile terminal to be tested is assembled in the process of test fixture; other signal testing point cantact of other signal test probes and mobile terminal to together with; the ESD operated and produce in contact process can release rapidly fixture on the ground by ESD protective device D4, mobile terminal chip test signal pin is exempted from and is subject to ESD generation damage.
As preferred technical scheme, described VBUS power supply signal test probe, VBAT power supply signal test probe, other signal test probe length are identical.
As preferred technical scheme, described earth signal test probe 1mm ~ 2mm longer than VBUS power supply signal test probe, VBAT power supply signal test probe, other signal test probe length; When using fixture test, described earth signal probe first contacts mobile terminal earth signal test point; the ESD produced when power supply and other signal probes contact mobile terminal and potential pulse can be released on the ground in time by protection circuit, avoid causing damage to mobile terminal chip.
The beneficial effect that the present invention has is: by the setting of protection circuit be electrically connected test probe and described test probe; the high voltage pulse that mobile terminal to use in fixture test process the ESD that do not produced by external environment and fixture powered on moment to produce can be protected to damage, ensure that the product quality of mobile terminal.
Accompanying drawing explanation
In order to be illustrated more clearly in embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only embodiments more of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the present invention: a kind of structural representation of mobile terminal test fixture protective device;
Fig. 2 is the schematic diagram of the VBUS power supply signal protection circuit in the present invention;
Fig. 3 is the schematic diagram of the VBAT power supply signal protection circuit in the present invention;
Fig. 4 is the schematic diagram of other signal protection circuit in the present invention;
Fig. 5 is the structural representation of the test probe in the present invention.
Embodiment
The technological means realized to make the present invention, creation characteristic, reaching object and effect is easy to understand, below in conjunction with concrete diagram, setting forth the present invention further.
With reference to shown in Fig. 1, a kind of mobile terminal test fixture protective device, the protection circuit 10 comprising test probe 20 and be electrically connected with described test probe 20, test probe 20 one end is fixed on test fixture, and one end contacts with mobile terminal 30 test point to be tested; Wherein, described test probe 20 comprises: VBUS power supply signal test probe 21, VBAT power supply signal test probe 22, other signal test probes 23 and earth signal test probe 24; Described protection circuit 10 comprises VBUS power supply signal protection circuit 11, VBAT power supply signal protection circuit 12, other signal protection circuit 13; Described VBUS power supply signal protection circuit 11 is corresponding with VBUS power supply signal test probe 21 to be connected; described VBAT power supply signal protection circuit 12 connects corresponding with VBAT power supply signal test probe 22; other signal protection circuit 13 described are corresponding with other signal test probe 20 to be connected; described earth signal test probe 24 respectively with VBUS power supply signal protection circuit 11; VBAT power supply signal protection circuit 12; other signal protection circuit 13 are electrically connected, to be grounded protection.
With reference to shown in Fig. 2, described VBUS power supply signal protection circuit 11 comprises low-pass filter circuit and the ESD protective device D1 of resistance R1, electric capacity C1 composition, and described low-pass filter circuit and ESD protective device D1 are connected in parallel; Operating personnel, mobile terminal 30 to be tested is assembled in the process of test fixture, together with VBUS power supply signal test probe 21 touches with the VBUS power supply signal test point of mobile terminal 30, the ESD operated and produce in contact process can release rapidly fixture on the ground by ESD protective device D1, the chip VBUS pin of mobile terminal 30 is exempted from and is subject to ESD generation damage.Terminal to be tested is being assembled to after on test fixture; tester will open VBUS power supply; a potential pulse higher than VBUS power supply can be produced in the moment of VBUS power supply electrifying; this potential pulse can filter out by the low-pass filter circuit be made up of R1, C1; make the VBUS power supply signal test point being transferred to mobile terminal 30 by test probe 20 of VBUS signal stabilization; it is another when VBUS power supply has fluctuation; electric capacity C1 can make VBUS power good, and the chip VBUS pin of mobile terminal 30 can be protected not by the energy-producing infringement of high voltage pulse.
With reference to shown in Fig. 3, described VBAT power supply signal protection circuit 12 comprises electric capacity C2 parallel with one another, voltage stabilizing diode D2 and ESD protective device D3; Operating personnel, mobile terminal 30 to be tested is assembled in the process of test fixture, together with VBAT power supply signal test probe 22 touches with mobile terminal 30VBAT power supply signal test point, the ESD operated and produce in contact process can release rapidly fixture on the ground by ESD protective device D3, the chip VBAT pin of mobile terminal 30 is exempted from and is subject to ESD generation damage.Terminal to be tested is being assembled to after on test fixture; tester will open VBAT power supply; a potential pulse higher than VBAT power supply can be produced in the moment of VBAT power supply electrifying; this potential pulse can filter out by electric capacity C2; what make VBAT signal stabilization is transferred to mobile terminal 30VBAT power supply signal test point by test probe 20, protects the chip VBAT pin of mobile terminal 30 not by the infringement of the surge energy of high voltage pulse generation.When VBUS power supply electrifying, the charging module of mobile terminal 30 can charge to VBAT power supply, the moment VBAT power supply of charging circuit work has voltage surge, voltage stabilizing diode D2 is then clamped rapidly, the energy of voltage surge is released on the ground by voltage stabilizing diode D2, avoids the chip VBAT pin of mobile terminal 30 to be subject to voltage surge and impact appearance damage.
With reference to shown in Fig. 4; other signal protection circuit 13 described comprise ESD protective device D4; operating personnel, mobile terminal 30 to be tested is assembled in the process of test fixture; other signal testing point cantact of other signal test probes 23 and mobile terminal 30 to together with; the ESD operated and produce in contact process can release rapidly fixture on the ground by ESD protective device D4, the chip testing signal pin of mobile terminal 30 is exempted from and is subject to ESD generation damage.
With reference to shown in Fig. 5, described VBUS power supply signal test probe 21, VBAT power supply signal test probe 22, other signal test probe 23 length are identical.Described earth signal test probe 24 1mm ~ 2mm longer than VBUS power supply signal test probe 21, VBAT power supply signal test probe 22, other signal test probe 23 length; When using fixture test, described earth signal probe first contacts mobile terminal 30 earth signal test point; the ESD produced when power supply and other signal probes contact mobile terminal 30 and potential pulse can be released on the ground in time by protection circuit 10, avoid causing damage to the chip of mobile terminal 30.
The present invention by increasing ESD protective device on other signal probes of fixture, VBUS power probe increases RC filtering device and ESD protective device, VBAT power probe increases Zener diode and bulky capacitor, and make earth signal probe increase 1mm than power supply and other signal probes, earth signal probe is made first to contact mobile terminal earth signal test point when using fixture test, the ESD produced when power supply and other signal probes contact mobile terminal and potential pulse can be released on the ground by protection circuit in time, the high voltage pulse that the ESD avoiding external environment to produce and test fixture powered on moment produce is because of the damage caused mobile terminal of cannot releasing, and then reach the object of protection mobile terminal.
More than show and describe ultimate principle of the present invention and principal character and advantage of the present invention.The technician of the industry should understand; the present invention is not restricted to the described embodiments; what describe in above-described embodiment and instructions just illustrates principle of the present invention; without departing from the spirit and scope of the present invention; the present invention also has various changes and modifications, and these changes and improvements all fall in the claimed scope of the invention.Application claims protection domain is defined by appending claims and equivalent thereof.
Claims (6)
1. a mobile terminal test fixture protective device, is characterized in that, the protection circuit comprising test probe and be electrically connected with described test probe;
Described test probe comprises: VBUS power supply signal test probe, VBAT power supply signal test probe, other signal test probes and earth signal test probe;
Described protection circuit comprises VBUS power supply signal protection circuit, VBAT power supply signal protection circuit, other signal protection circuit;
Described VBUS power supply signal protection circuit is corresponding with VBUS power supply signal test probe to be connected; described VBAT power supply signal protection circuit connects corresponding with VBAT power supply signal test probe; other signal protection circuit described are corresponding with other signal test probe to be connected; described earth signal test probe respectively with VBUS power supply signal protection circuit; VBAT power supply signal protection circuit; other signal protection circuit are electrically connected, to be grounded protection.
2. a kind of mobile terminal test fixture protective device according to claim 1; it is characterized in that; described VBUS power supply signal protection circuit comprises low-pass filter circuit and the ESD protective device D1 of resistance R1, electric capacity C1 composition, and described low-pass filter circuit and ESD protective device D1 are connected in parallel.
3. a kind of mobile terminal test fixture protective device according to claim 1, is characterized in that, described VBAT power supply signal protection circuit comprises electric capacity C2 parallel with one another, voltage stabilizing diode D2 and ESD protective device D3.
4. a kind of mobile terminal test fixture protective device according to claim 1, is characterized in that, other signal protection circuit described comprise ESD protective device D4.
5. a kind of mobile terminal test fixture protective device according to claim 1, is characterized in that, described VBUS power supply signal test probe, VBAT power supply signal test probe, other signal test probe length are identical.
6. a kind of mobile terminal test fixture protective device according to claim 5, is characterized in that, described earth signal test probe 1mm ~ 2mm longer than VBUS power supply signal test probe, VBAT power supply signal test probe, other signal test probe length.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410830138.4A CN104502646B (en) | 2014-12-22 | 2014-12-22 | A kind of mobile terminal test fixture protective device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410830138.4A CN104502646B (en) | 2014-12-22 | 2014-12-22 | A kind of mobile terminal test fixture protective device |
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| CN104502646A true CN104502646A (en) | 2015-04-08 |
| CN104502646B CN104502646B (en) | 2019-07-05 |
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| CN201410830138.4A Active CN104502646B (en) | 2014-12-22 | 2014-12-22 | A kind of mobile terminal test fixture protective device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105098703A (en) * | 2015-09-25 | 2015-11-25 | 上海斐讯数据通信技术有限公司 | Test system |
| CN105356422A (en) * | 2015-10-22 | 2016-02-24 | 上海斐讯数据通信技术有限公司 | Method and system for preventing overcurrent and overvoltage damages in test of electronic equipment |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7301229B2 (en) * | 2004-06-25 | 2007-11-27 | Taiwan Semiconductor Manufacturing Company | Electrostatic discharge (ESD) protection for integrated circuit packages |
| CN102116806B (en) * | 2009-12-31 | 2015-06-03 | 无锡中星微电子有限公司 | ESD (Electro-Static Discharge) test method of chip |
| CN201946973U (en) * | 2011-01-17 | 2011-08-24 | 惠州Tcl移动通信有限公司 | Static protection device of mobile terminal with touch screen |
| CN202757965U (en) * | 2012-08-29 | 2013-02-27 | 德尔福派克电气系统有限公司 | Electrostatic protection electrical testboard for automobile wire harness |
-
2014
- 2014-12-22 CN CN201410830138.4A patent/CN104502646B/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105098703A (en) * | 2015-09-25 | 2015-11-25 | 上海斐讯数据通信技术有限公司 | Test system |
| CN105356422A (en) * | 2015-10-22 | 2016-02-24 | 上海斐讯数据通信技术有限公司 | Method and system for preventing overcurrent and overvoltage damages in test of electronic equipment |
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| Publication number | Publication date |
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| CN104502646B (en) | 2019-07-05 |
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Effective date of registration: 20201103 Address after: 318015 no.2-3167, zone a, Nonggang City, no.2388, Donghuan Avenue, Hongjia street, Jiaojiang District, Taizhou City, Zhejiang Province Patentee after: Taizhou Jiji Intellectual Property Operation Co.,Ltd. Address before: 201616 Shanghai city Songjiang District Sixian Road No. 3666 Patentee before: Phicomm (Shanghai) Co.,Ltd. |
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