CN104502646B - A kind of mobile terminal test fixture protective device - Google Patents
A kind of mobile terminal test fixture protective device Download PDFInfo
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- CN104502646B CN104502646B CN201410830138.4A CN201410830138A CN104502646B CN 104502646 B CN104502646 B CN 104502646B CN 201410830138 A CN201410830138 A CN 201410830138A CN 104502646 B CN104502646 B CN 104502646B
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- power supply
- test probe
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Abstract
The invention discloses a kind of mobile terminal test fixture protective devices, including test probe and the protection circuit being electrically connected with the test probe；Wherein, the test probe includes: VBUS power supply signal test probe, VBAT power supply signal test probe, other signal test probes and earth signal test probe；The protection circuit includes VBUS power supply signal protection circuit, and VBAT power supply signal protects circuit, other signal protection circuits.Beneficial effect is: by the setting for the protection circuit being electrically connected to test probe and the test probe; mobile terminal can be protected to damage in the high voltage pulse generated using the ESD and fixture powered on moment that are not generated by external environment in fixture test process, ensure that the product quality of mobile terminal.
Description
Technical field
The present invention relates to mobile terminal production test technical fields, protect more particularly, to a kind of mobile terminal test fixture
Device.
Background technique
With the rapid development of mobile communication technology, mobile terminal has become a part indispensable in our lives,
With the sustainable growth of mobile terminal shipment amount, the production test quality of mobile terminal is also increasingly paid attention to by manufacturer.Very
Multi-mobile-terminal manufacturer only focuses on during production test ESD protection and the worker operation of workshop environment
ESD protection, test fixture usually not protect circuit, this will lead to occur certain probability during testing using fixture
Due to external environment generate ESD or fixture powered on moment generate high voltage pulse cause the certain chips of mainboard dominant or hidden
Property damage, and then caused terminal function directly fails or terminal has damage and do not fail temporarily, but damages in user's use process
Accumulative the case where leading to disabler, the quality and acceptance of the users of product are affected, reprocesses and also results in very huge economic loss.
Therefore, the invention proposes a kind of mobile terminal test fixture protective device, mobile terminal can be protected to use
The high voltage pulse that the ESD and fixture powered on moment not generated by external environment in fixture test process are generated damages, and ensure that
The product quality of mobile terminal.
Summary of the invention
The present invention provides a kind of mobile terminal test fixture protective device, to solve to test using fixture in the prior art
What the high voltage pulse that mobile terminal is easy that the ESD generated by external environment and fixture powered on moment generate in journey damaged asks
Topic.
Technical problem solved by the invention is realized using following technical scheme:
A kind of mobile terminal test fixture protective device is electrically connected including test probe and with the test probe
Protect circuit；
The test probe includes: VBUS power supply signal test probe, VBAT power supply signal test probe, the survey of other signals
It sounds out needle and earth signal tests probe；
The protection circuit includes VBUS power supply signal protection circuit, and VBAT power supply signal protects circuit, other signals are protected
Protection circuit；
The VBUS power supply signal protection circuit is correspondingly connected with VBUS power supply signal test probe, the VBAT power supply letter
Number protection circuit and VBAT power supply signal test probe are to being correspondingly connected with, other described signal protection circuits and other signals test
Probe is correspondingly connected with, and the earth signal test probe protects circuit, VBAT power supply signal protection electricity with VBUS power supply signal respectively
Road, other signal protection circuits are electrically connected, to be grounded protection.
The VBUS power supply signal protection circuit includes the low of resistance R1, capacitor C1 composition as a preferred technical solution,
Bandpass filter circuit and ESD protection device D1, the low-pass filter circuit and ESD protection device D1 are connected in parallel；In operator
During mobile terminal to be tested is assembled to test fixture, VBUS power supply signal tests probe and mobile terminal VBUS power supply
To together, the ESD generated in operation and contact process can be released to rapidly signal testing point contact by ESD protection device D1
Fixture on the ground, exempts from mobile terminal chip VBUS pin and is generated damage by ESD.Terminal to be tested is being assembled to test clip
After on tool, tester will open VBUS power supply, can generate the electricity for being higher than VBUS power supply in the moment of VBUS power supply electrifying
Pulse is pressed, the low-pass filter circuit being made of R1, C1 can filter out this voltage pulse, make VBUS is signal-stabilized to pass through
Probe transmission is tested to mobile terminal VBUS power supply signal test point, separately when VBUS power supply has fluctuation, capacitor C1 can make
VBUS power good can protect mobile terminal chip VBUS pin not generated the damage of energy by high voltage pulse.
The VBAT power supply signal protection circuit includes capacitor C2 parallel with one another, pressure stabilizing as a preferred technical solution,
Diode D2 and ESD protection device D3；During mobile terminal to be tested is assembled to test fixture by operator, VBAT
Power supply signal is tested probe and is touched together with mobile terminal VBAT power supply signal test point, generates in operation and contact process
ESD can be released to rapidly fixture on the ground by ESD protection device D3, exempt from mobile terminal chip VBAT pin by ESD
Generate damage.After terminal to be tested is assembled on test fixture, tester will open VBAT power supply, on VBAT power supply
The moment of electricity can generate the voltage pulse for being higher than VBAT power supply, this voltage pulse can be filtered out, be made by capacitor C2
VBAT is signal-stabilized by testing probe transmission to mobile terminal VBAT power supply signal test point, protects mobile terminal chip
The damage for the surge energy that VBAT pin is not generated by high voltage pulse.When VBUS power supply electrifying, the charging mould of mobile terminal
Block can charge to VBAT power supply, have voltage surge, zener diode D2 on the moment VBAT power supply of charging circuit work
It is then clamped rapidly, the energy of voltage surge is released on the ground by zener diode D2, mobile terminal chip VBAT is avoided to manage
Foot is damaged by voltage surge impact.
Other described signal protection circuits include ESD protection device D4 as a preferred technical solution, are incited somebody to action in operator
During mobile terminal to be tested is assembled to test fixture, other signal test probes and other signal testing points of mobile terminal
It touching together, the ESD generated in operation and contact process can be released to rapidly fixture on the ground by ESD protection device D4,
It exempts from mobile terminal chip test signal pin and is generated damage by ESD.
The VBUS power supply signal tests probe as a preferred technical solution, VBAT power supply signal tests probe, other
Signal test probe length is identical.
The earth signal test probe ratio VBUS power supply signal tests probe, VBAT power supply as a preferred technical solution,
Signal test probe, the long 1mm~2mm of other signal test probe length；When being tested using fixture, the earth signal probe is first
The ESD and voltage pulse generated when contacting mobile terminal earth signal test point, power supply and other signal probes contact mobile terminal
It by protecting circuit to be released in time on the ground can avoid that mobile terminal chip is caused to damage.
The invention has the advantages that: pass through the protection circuit being electrically connected to test probe and the test probe
Setting, can protect mobile terminal in using fixture test process not by external environment generate ESD and fixture power on wink
Between generate high voltage pulse damage, ensure that the product quality of mobile terminal.
Detailed description of the invention
It, below will be to embodiment in order to illustrate more clearly of embodiment of the present invention or technical solution in the prior art
Or attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description is only
It is some embodiments of the invention, for those of ordinary skill in the art, in the premise of not making the creative labor property
Under, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of present invention: structural schematic diagram of mobile terminal test fixture protective device；
Fig. 2 is the schematic diagram of the VBUS power supply signal protection circuit in the present invention；
Fig. 3 is the schematic diagram of the VBAT power supply signal protection circuit in the present invention；
Fig. 4 is the schematic diagram of other signal protection circuits in the present invention；
Fig. 5 is the structural schematic diagram of the test probe in the present invention.
Specific embodiment
In order to be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, tie below
Conjunction is specifically illustrating, and the present invention is further explained.
Referring to Fig.1 shown in, a kind of mobile terminal test fixture protective device, including test probe 20 and with the test
The protection circuit 10 that probe 20 is electrically connected, test 20 one end of probe are fixed on test fixture, and one end and movement to be tested are eventually
30 test point contact of end；Wherein, the test probe 20 includes: VBUS power supply signal test probe 21, the survey of VBAT power supply signal
It sounds out needle 22, other signal test probes 23 and earth signal and tests probe 24；The protection circuit 10 includes VBUS power supply signal
Circuit 11 is protected, VBAT power supply signal protects circuit 12, other signal protection circuits 13；The VBUS power supply signal protects circuit
11 are correspondingly connected with VBUS power supply signal test probe 21, and the VBAT power supply signal protection circuit 12 and VBAT power supply signal are surveyed
Needle 22 is soundd out to being correspondingly connected with, other described signal protection circuits 13 are correspondingly connected with other signals test probe 20, describedly
Signal test probe 24 protects circuit 11 with VBUS power supply signal respectively, and VBAT power supply signal protects circuit 12, other signals are protected
Protection circuit 13 is electrically connected, to be grounded protection.
Referring to shown in Fig. 2, the VBUS power supply signal protection circuit 11 includes the low-pass filtering of resistance R1, capacitor C1 composition
Circuit and ESD protection device D1, the low-pass filter circuit and ESD protection device D1 are connected in parallel；Operator will be to be measured
During examination mobile terminal 30 is assembled to test fixture, VBUS power supply signal tests the VBUS electricity of probe 21 and mobile terminal 30
Source signal test point touches together, and the ESD generated in operation and contact process can be released rapidly by ESD protection device D1
On the ground to fixture, it exempts from the chip VBUS pin of mobile terminal 30 and is generated damage by ESD.It is assembled to by terminal to be tested
After on test fixture, tester will open VBUS power supply, can generate one in the moment of VBUS power supply electrifying and be higher than VBUS electricity
The voltage pulse in source, the low-pass filter circuit being made of R1, C1 can filter out this voltage pulse, make VBUS signal stabilization
Be transferred to the VBUS power supply signal test point of mobile terminal 30 by testing probe 20, separately when VBUS power supply has fluctuation, electricity
VBUS power good can be made by holding C1, and the chip VBUS pin of mobile terminal 30 can be protected not generated energy by high voltage pulse
Damage.
Referring to shown in Fig. 3, the VBAT power supply signal protection circuit 12 includes capacitor C2 parallel with one another, zener diode
D2 and ESD protection device D3；During mobile terminal 30 to be tested is assembled to test fixture by operator, VBAT power supply
Signal test probe 22 touches together with mobile terminal 30VBAT power supply signal test point, generates in operation and contact process
ESD can be released to rapidly by ESD protection device D3 fixture on the ground, make the chip VBAT pin of mobile terminal 30 exempt from by
ESD generates damage.After terminal to be tested is assembled on test fixture, tester will open VBAT power supply, in VBAT electricity
The moment that source powers on can generate the voltage pulse for being higher than VBAT power supply, and capacitor C2 can filter out this voltage pulse,
Keep VBAT signal-stabilized and be transferred to mobile terminal 30VBAT power supply signal test point by testing probe 20, protects mobile whole
The damage for the surge energy that the chip VBAT pin at end 30 is not generated by high voltage pulse.It is mobile whole when VBUS power supply electrifying
The charging module at end 30 can charge to VBAT power supply, have voltage surge on the moment VBAT power supply of charging circuit work,
Zener diode D2 is then clamped rapidly, and the energy of voltage surge is released on the ground by zener diode D2, avoids mobile whole
The chip VBAT pin at end 30 is damaged by voltage surge impact.
Referring to shown in Fig. 4, other described signal protection circuits 13 include ESD protection device D4, operator will be to be measured
During examination mobile terminal 30 is assembled to test fixture, other signal test probes 23 and other signal testings of mobile terminal 30
For point contact to together, the ESD generated in operation and contact process can be by ESD protection device D4 with being released to fixture rapidly
On, it exempts from the chip testing signal pin of mobile terminal 30 and is generated damage by ESD.
Referring to Figure 5, the VBUS power supply signal test probe 21, VBAT power supply signal test probe 22, other letters
Number 23 length of test probe is identical.The earth signal test probe 24 is than VBUS power supply signal test probe 21, VBAT power supply letter
Number test probe 22, the long 1mm~2mm of other 23 length of signal test probe；The earth signal probe when being tested using fixture
The ESD and electricity generated when first contacting 30 earth signal test point of mobile terminal, power supply and other signal probes contact mobile terminal 30
Pressure pulse can be released on the ground in time by protection circuit 10, and the chip to mobile terminal 30 is avoided to cause to damage.
The present invention increases RC in VBUS power probe by increasing ESD protection device on other signal probes of fixture
Filtering device and ESD protection device increase Zener diode and bulky capacitor in VBAT power probe, and make earth signal probe ratio
Power supply and other signal probes increase 1mm, and earth signal probe is made first to contact the survey of mobile terminal earth signal when testing using fixture
The ESD and voltage pulse generated when pilot, power supply and other signal probes contact mobile terminal can be timely by protection circuit
The high voltage pulse of the ESD for avoiding external environment to generate on the ground and the generation of test fixture powered on moment is released to because that can not release
It is damaged caused by mobile terminal, and then achievees the purpose that protect mobile terminal.
The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and the above embodiments and description only describe this
The principle of invention, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these changes
Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and its
Equivalent thereof.
Claims (4)
1. a kind of mobile terminal test fixture protective device, which is characterized in that including test probe and with the test probe
The protection circuit of electric connection；
The test probe includes: VBUS power supply signal test probe, VBAT power supply signal test probe, the spy of other signal testings
Needle and earth signal test probe；
The protection circuit includes VBUS power supply signal protection circuit, and VBAT power supply signal protects circuit, other signal protections electricity
Road；
The VBUS power supply signal protection circuit is correspondingly connected with VBUS power supply signal test probe, and the VBAT power supply signal is protected
Protection circuit is correspondingly connected with VBAT power supply signal test probe, other described signal protection circuits and other signals test probe pair
It should connect, the earth signal test probe protects circuit with VBUS power supply signal respectively, and VBAT power supply signal protects circuit, other
Signal protection circuit is electrically connected, to be grounded protection；
The VBUS power supply signal protection circuit includes the low-pass filter circuit and ESD protection device of resistance R1, capacitor C1 composition
D1, the low-pass filter circuit and ESD protection device D1 are connected in parallel；
The VBAT power supply signal protection circuit includes capacitor C2 parallel with one another, zener diode D2 and ESD protection device D3.
2. a kind of mobile terminal test fixture protective device according to claim 1, which is characterized in that other described signals
Protecting circuit includes ESD protection device D4.
3. a kind of mobile terminal test fixture protective device according to claim 1, which is characterized in that the VBUS power supply
Signal test probe, VBAT power supply signal test probe, other signal test probe length are identical.
4. a kind of mobile terminal test fixture protective device according to claim 3, which is characterized in that the earth signal is surveyed
Exploration needle ratio VBUS power supply signal test probe, VBAT power supply signal test probe, the long 1mm of other signal test probe length~
2mm。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410830138.4A CN104502646B (en) | 2014-12-22 | 2014-12-22 | A kind of mobile terminal test fixture protective device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410830138.4A CN104502646B (en) | 2014-12-22 | 2014-12-22 | A kind of mobile terminal test fixture protective device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104502646A CN104502646A (en) | 2015-04-08 |
| CN104502646B true CN104502646B (en) | 2019-07-05 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410830138.4A Active CN104502646B (en) | 2014-12-22 | 2014-12-22 | A kind of mobile terminal test fixture protective device |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105098703A (en) * | 2015-09-25 | 2015-11-25 | 上海斐讯数据通信技术有限公司 | Test system |
| CN105356422A (en) * | 2015-10-22 | 2016-02-24 | 上海斐讯数据通信技术有限公司 | Method and system for preventing overcurrent and overvoltage damages in test of electronic equipment |
Citations (4)
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| CN1713380A (en) * | 2004-06-25 | 2005-12-28 | 台湾积体电路制造股份有限公司 | Electrostatic discharge (ESD) protection for integrated circuit packages |
| CN102116806A (en) * | 2009-12-31 | 2011-07-06 | 无锡中星微电子有限公司 | ESD (Electro-Static Discharge) test method of chip |
| CN201946973U (en) * | 2011-01-17 | 2011-08-24 | 惠州Tcl移动通信有限公司 | Static protection device of mobile terminal with touch screen |
| CN202757965U (en) * | 2012-08-29 | 2013-02-27 | 德尔福派克电气系统有限公司 | Electrostatic protection electrical testboard for automobile wire harness |
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2014
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Patent Citations (4)
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|---|---|---|---|---|
| CN1713380A (en) * | 2004-06-25 | 2005-12-28 | 台湾积体电路制造股份有限公司 | Electrostatic discharge (ESD) protection for integrated circuit packages |
| CN102116806A (en) * | 2009-12-31 | 2011-07-06 | 无锡中星微电子有限公司 | ESD (Electro-Static Discharge) test method of chip |
| CN201946973U (en) * | 2011-01-17 | 2011-08-24 | 惠州Tcl移动通信有限公司 | Static protection device of mobile terminal with touch screen |
| CN202757965U (en) * | 2012-08-29 | 2013-02-27 | 德尔福派克电气系统有限公司 | Electrostatic protection electrical testboard for automobile wire harness |
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| CN104502646A (en) | 2015-04-08 |
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Effective date of registration: 20201103 Address after: 318015 no.2-3167, zone a, Nonggang City, no.2388, Donghuan Avenue, Hongjia street, Jiaojiang District, Taizhou City, Zhejiang Province Patentee after: Taizhou Jiji Intellectual Property Operation Co.,Ltd. Address before: 201616 Shanghai city Songjiang District Sixian Road No. 3666 Patentee before: Phicomm (Shanghai) Co.,Ltd. |
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