CN104375290B - Dottle pin object detecting method and equipment - Google Patents
Dottle pin object detecting method and equipment Download PDFInfo
- Publication number
- CN104375290B CN104375290B CN201410562621.9A CN201410562621A CN104375290B CN 104375290 B CN104375290 B CN 104375290B CN 201410562621 A CN201410562621 A CN 201410562621A CN 104375290 B CN104375290 B CN 104375290B
- Authority
- CN
- China
- Prior art keywords
- chock insulator
- insulator matter
- comparison unit
- base plate
- detection zone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1339—Gaskets; Spacers; Sealing of cells
Abstract
The present invention provides a kind of dottle pin object detecting method and equipment, belongs to display base plate detection technique field, and which can solve existing chock insulator matter and integrally lack manually to detect, the low problem of efficiency and reliability.The dottle pin object detecting method of the present invention includes：The image of the detection zone of collection display base plate, the detection zone are located in the viewing area of display base plate, have multiple chock insulator matter positions for arranging chock insulator matter in the detection zone；Multiple identical comparison units are divided into in the detection, structure all same is shown in each comparison unit except dottle pin beyond the region of objective existence is other, and the distribution of chock insulator matter position described at least part of comparison unit is different；The image of each comparison unit and adjacent contrast's unit is contrasted successively, if comparing result difference is designated as a defect；The defect of relatively detection zone is total with default marginal value, if defect sum is less than marginal value judges that display base plate has chock insulator matter and integrally lacks.
Description
Technical field
The invention belongs to display base plate detection technique field, and in particular to a kind of dottle pin object detecting method and equipment.
Background technology
Chock insulator matter (PS) plays dimension located between two pieces of display base plates (array base palte and color membrane substrates) of display panels
Hold display base plate spacing, keep the effect of thickness of liquid crystal box.On display base plate, chock insulator matter is with " chock insulator matter cycling element " as list
Position loop distribution, each chock insulator matter cycling element include that N number of (N be more than or equal to 2) comes pixel cell together (i.e. each dottle pin
Thing cycling element includes a piece " region " of display base plate), and multiple chock insulator matters are provided with, in each chock insulator matter cycling element
Chock insulator matter distribution situation is identical, and the viewing area of multiple chock insulator matter cycling element cycle arrangements composition display base plate is (for carrying out
The region of display).Wherein, each pixel cell is used for independent display one " point ", its sub-pixel by multiple different colours
(such as three sub-pixels of red, green, blue) composition.
Fig. 1 shows that a kind of chock insulator matter cycling element G includes the feelings of 6 pixel cells 1 of the matrix for lining up 3 row × 2 row
Condition, has 14 chock insulator matters 11 in chock insulator matter cycling element G；Multiple identical chock insulator matter cycling element G cycle arrangements compositions
The viewing area (region for being shown) of display base plate.It can be seen that, each pixel cell 1 in a chock insulator matter cycling element G
In 11 skewness of chock insulator matter, this is determined by support effect, space hold, display effect etc. are many-sided comprehensive.Certainly,
The concrete mode of actual chock insulator matter cycling element G is various, and number of pixels therein, pixel arrangement mode (are not such as square
Battle array but oblique array), 11 number of chock insulator matter, 11 position of chock insulator matter, (size such as different chock insulator matters 11 can not for 11 shape of chock insulator matter
All alterable such as together).
Need to detect whether which there are the defects such as light leak, dust in display base plate manufacturing process, the available total inspection of the detection
The machine of looking into is carried out, and is specifically included：As shown in figure 1, the image of the viewing area of collection display base plate, and it is single to be divided into multiple contrasts
First J (being divided into multiple shape and size identicals " region "), each comparison unit J includes multiple pixel cells for coming together
1 (such as the matrix for multiple pixel cells 1)；Afterwards, it is right to carry out each comparison unit J and the image of adjacent contrast unit J successively
Than (such as contrast gray scale), comparison unit J of existing defects (if any dust) is necessarily different from the image of adjacent contrast unit J, therefore
Can be contrasted out.Obviously, the condition of above detection be display structure in each comparison unit J (chock insulator matter 11, electrode, lead,
Color filter film etc.) under normal circumstances must be identical, otherwise flawless comparison unit J can also contrast difference；For this purpose, right
Must be identical with chock insulator matter cycling element G (or multiple chock insulator matter cycling element G) than the necessary divisions of unit J, in other words each
Comparison unit J is exactly a chock insulator matter cycling element G, identical with the distribution for ensureing chock insulator matter 11 in each comparison unit J.
Wherein, can be without gap in practical situations both between each pixel cell, chock insulator matter cycling element, comparison unit, but
In the accompanying drawing of the present invention, it is each interstructural relation of clear sign, therefore gap is increased between adjacent structure.
But, in some cases, the chock insulator matter on display base plate may occur overall disappearance (such as chock insulator matter material exposure
Shi Guangyuan is damaged, and is caused chock insulator matter material all unexposed and is all washed off), now in all comparison units without chock insulator matter,
Therefore its equal zero defect when being detected by above control methods.Therefore, the problem that present chock insulator matter is integrally lacked can only manually meat
Eye observation (though chock insulator matter is little but quantity is more, therefore naked eyes remain to find out during overall disappearance), manual detection efficiency is low, and exists tired
The anthropic factors such as labor, paralysis, reliability are low.
The content of the invention
The present invention is integrally lacked for existing chock insulator matter and is manually detected, the low problem of efficiency and reliability, there is provided
Plant the high dottle pin object detecting method of efficiency and reliability and equipment.
The technical scheme adopted by solution present invention problem is a kind of dottle pin object detecting method, and which includes：
The image of the detection zone of collection display base plate, the detection zone are located in the viewing area of display base plate, the detection
There are in area multiple chock insulator matter positions for arranging chock insulator matter；
Multiple identical comparison units are divided into in the detection, in each comparison unit, knot are shown except dottle pin beyond the region of objective existence is other
Structure all same, and at least partly distribution difference of chock insulator matter position described in comparison unit；
The image of each comparison unit and adjacent contrast's unit is contrasted successively, if comparing result difference is designated as a defect；
The defect of relatively detection zone is total with default marginal value, judges to show if defect sum is less than marginal value
There is chock insulator matter and integrally lack in substrate.
Preferably, multiple identical chock insulator matter cycling elements are divided in the display, each chock insulator matter cycling element bag
Include multiple pixel cells and it is interior have multiple chock insulator matter positions, in each chock insulator matter cycling element, the distribution of chock insulator matter position is identical；Its
In, each pixel cell by multiple different colours sub-pixel group into；Each comparison unit includes at least one pixel cell.
It may further be preferable that the number of pixel cell is than pixel cell in chock insulator matter cycling element in the comparison unit
Number it is few.
It may further be preferable that the comparison unit is a pixel cell.
Preferably, the number of the comparison unit in each described detection zone is between 10 to 5000.
Preferably, the span of the marginal value is between 5 to 50.
Preferably, the image for contrasting each comparison unit and adjacent contrast's unit successively, if comparing result difference
Being designated as a defect includes：The gray value of each comparison unit and the image of adjacent contrast's unit is contrasted successively, if the difference of gray value
A defect is designated as then more than threshold value
Preferably, the display base plate includes multiple exposure regions, has at least one detection zone in each exposure region, described
Chock insulator matter in display base plate is formed by exposure technology.
Preferably, the display base plate is color membrane substrates.
The technical scheme adopted by solution present invention problem is a kind of chock insulator matter testing equipment, and which includes：
Image acquisition units, for gathering the image of the detection zone of display base plate, the detection zone is located at display base plate
In viewing area, there are in the detection zone multiple chock insulator matter positions for arranging chock insulator matter；
Zoning unit, for the detection is divided into multiple identical comparison units, removes chock insulator matter in each comparison unit
Outer other display structure all sames, and at least partly distribution difference of chock insulator matter position described in comparison unit；
Comparison unit, for contrasting the image of each comparison unit and adjacent contrast's unit successively, if comparing result difference
It is designated as a defect；
Judging unit, the defect for comparing detection zone are total with default marginal value, if defect sum is less than facing
Dividing value then judges that display base plate has chock insulator matter and integrally lacks.
Detection method of the invention, chock insulator matter position (chock insulator matter) distribution in the comparison unit of part are different, therefore are having
In the case of chock insulator matter, the distribution of the chock insulator matter in many comparison units is all different (being not excluded for certainly part identical), so
After contrast, a large amount of comparison units can all be considered as the presence of " defect ", and " defect " number can be a lot；Relative, if chock insulator matter integrally lacks
Lose, all without chock insulator matter in each comparison unit, then the comparison unit that only there is individually other defect (such as dust) can just be detected
Defect, and generally other defect number is little (typically only several in a viewing area), therefore can be by the magnitude of defects count
Judge that whether chock insulator matter occurs integrally lacks.Thus, the present invention is capable of achieving the automatic detection integrally lacked to chock insulator matter, it is to avoid
The impact of anthropic factor, efficiency and reliability it is high；Meanwhile, the main process of the detection can be by existing exhaustive test machine reality
Existing (as long as carrying out one-time detection with which) more, therefore which had not both resulted in the increase of cost, will not make complex process yet.
Description of the drawings
Fig. 1 is the schematic diagram of existing display base plate detection method；
Flow charts of the Fig. 2 for the dottle pin object detecting method of embodiments of the invention 1；
Schematic diagrams of the Fig. 3 for a kind of dottle pin object detecting method of embodiments of the invention 1；
Schematic diagrams of the Fig. 4 for another kind of dottle pin object detecting method of embodiments of the invention 1；
Wherein, reference is：1st, pixel cell；11st, chock insulator matter；G, chock insulator matter cycling element；J, comparison unit.
Specific embodiment
To make those skilled in the art more fully understand technical scheme, below in conjunction with the accompanying drawings and specific embodiment party
Formula is described in further detail to the present invention.
Embodiment 1：
As shown in Figures 2 to 4, the present embodiment provides a kind of dottle pin object detecting method, and which is used to detect on display base plate
Whether chock insulator matter 11 there is overall disappearance.
Wherein, display base plate is preferably color membrane substrates, this is because chock insulator matter more than 11 is located in color membrane substrates.Certainly, if
It is also feasible that display base plate is array base palte etc..Meanwhile, the display base plate can be used for liquid crystal indicator, organic light-emitting diodes
Pipe (OLED) display device etc..
The dottle pin object detecting method of the present embodiment specifically includes following steps：
The image of S101, the detection zone of collection display base plate, detection zone are located in the viewing area of display base plate, in detection zone
With multiple chock insulator matter positions for arranging chock insulator matter 11.
That is, in the viewing area of display base plate, delimiting the region of a part as detection zone, and gathering the detection
The image in area, the collection can be carried out by high resolution CCD (charge coupled cell) etc..
Why thus, being because that the method for the present embodiment is lacked mainly for detection of chock insulator matter 11 is overall, as long as therefore really
Whether chock insulator matter 11 is had in the part (detection zone) for determining viewing area, you can it is determined that whether have chock insulator matter in whole display base plate,
Therefore whole substrate can all be detected, so as to reduce detecting workload.Certainly, to using whole viewing area as inspection
Area is surveyed, is also feasible.
Wherein, " chock insulator matter position " refer to according to normal technological process, the position of chock insulator matter 11 can be formed on, herein
Why which is made a distinction with " chock insulator matter 11 ", be because that the display base plate of the present embodiment may occur chock insulator matter 11 overall scarce
Lose, therefore may not wherein there is no the chock insulator matter 11 of reality, and the only predetermined position for arranging chock insulator matter 11.
Preferably, detection zone is made up of multiple pixel cells 1 for coming together.Wherein, each pixel cell 1 by it is multiple not
With color sub-pixel group into, i.e., each pixel cell 1 be when showing one can independent control " point ".
That is, detection zone can be divided with " pixel cell 1 " as ultimate unit, to choose in step afterwards
Comparison unit J.More specifically, detection zone can be the multiple pixel cells 1 for lining up matrix form.
Preferably, if display base plate includes multiple exposure regions, during detection, at least one to be selected in each exposure region
Individual detection zone, and the chock insulator matter 11 in display base plate is formed by exposure technology.
If that is, display base plate is the form (multiple display floaters are formed after cutting) of " motherboard ", including many
Individual viewing area, then its area can be very big, therefore which will generally be divided into multiple exposure regions (exposure shot), and each exposure region leads to respectively
Cross different step of exposure and form display structure therein.And as chock insulator matter 11 is formed by exposure region, therefore which may
The situation for not lacking and lacking in another exposure region in occurring in an exposure region, therefore in this case should be in each exposure
A detection zone is selected in area at least, with the comprehensive and accuracy for ensureing to detect.Certainly, for formed by additive method every
Underbed 11, then detection zone can not be with exposure region as foundation.
S102, multiple identical comparison units J are divided into in detection, it is other in addition to chock insulator matter 11 in each comparison unit J
Show that the distribution of chock insulator matter position (" chock insulator matter 11 " in other words) in structure all same, and at least part of comparison unit J is different.
That is, as shown in figure 3, similarly to the prior art, by detection zone be evenly dividing for multiple shapes, size it is homogeneous
Same region (comparison unit J), and its dividing mode will ensure that in each comparison unit J, in addition to chock insulator matter 11, others show
The distribution of structure (electrode, lead, color filter film etc.) is all identical.
Preferably, each comparison unit J includes at least one pixel cell 1, and wherein each pixel cell 1 is more preferably arranged
Into matrix form.
That is, comparison unit J is preferably also divided with " pixel cell 1 " as ultimate unit.Why thus, being
Because in each pixel cell 1 in addition to chock insulator matter 11, other to show that structure is generally identical, therefore divided most in units of which
The condition of " other in addition to chock insulator matter 11 in each comparison unit J to show that structure is identical " is realized easily.If conversely, according to its other party
Formula, such as with sub-pixel as comparison unit J, then due to color filter film (for the color membrane substrates) color in different subpixel not
Together, thus more difficult meet above-mentioned condition.Certainly, above scheme is not limitation of the invention, as long as can guarantee that each comparison unit J
In it is other in addition to chock insulator matter 11 show that structures are identical, then can also sub-pixel etc. as minimum division unit.
Unlike the prior art, in each comparison unit J of the present embodiment, at least part of comparison unit J
The distribution of chock insulator matter position is different.That is, the dividing mode of comparison unit J should meet：In all of comparison unit J,
The distribution of chock insulator matter position is not identical.
Preferably, show and divide into multiple identical chock insulator matter cycling element G, have in each chock insulator matter cycling element G
Multiple chock insulator matter positions, in each chock insulator matter cycling element G, the distribution of chock insulator matter position is identical, and each chock insulator matter cycling element G is also wrapped
Include multiple pixel cells 1.
That is, in display base plate, " chock insulator matter cycling element G " of the chock insulator matter 11 preferably with more than is circulated for unit
Distribution.Clearly as now chock insulator matter 11 is loop distribution, therefore to realize the distribution of chock insulator matter position in each comparison unit J
Difference, then comparison unit J can not be exactly chock insulator matter cycling element G, nor the chock insulator matter circulation of multiple arranged adjacents is single
First G；In other words, the incomplete chock insulator matter cycling element G in part must be included in comparison unit J.
Wherein, it is preferred that in comparison unit J, the number of pixel cell 1 is than pixel cell 1 in chock insulator matter cycling element G
Number is few；It is furthermore preferred that comparison unit J is a pixel cell 1.
That is, comparison unit J is preferably than chock insulator matter cycling element G " little ", more preferably comparison unit J is exactly single
Pixel cell 1.This is because when the difference of chock insulator matter 11 is identical, the image of more little then different comparison units J of comparison unit J
Relative difference is bigger.For example, if comparison unit J is a pixel cell 1, when the number of chock insulator matter 11 in two comparison units J
When amount differs from one, difference is obvious；If there is 100 pixel cells 1 in comparison unit J, when in two comparison units J every
When the quantity of underbed 11 equally differs from one, this difference is difficult to be observed.
Certainly, above scheme is nor limitation of the invention.For example, as shown in figure 4, comparison unit J may also comprise it is many
Individual pixel cell 1, and comparison unit J may span across different chock insulator matter cycling element G；But in a word, if comparison unit J not
It is chock insulator matter cycling element G nor multiple chock insulator matter cycling element G and other in addition to chock insulator matter 11 in each comparison unit J
Show that structure is identical.
Wherein, it is preferred that the selection of detection zone and comparison unit J should meet：Comparison unit J in each detection zone
Number is between 10 to 5000.
As it was previously stated, the present invention there is no need to detect whole viewing area, but in order to ensure the reliability of testing result
Property, it is to avoid the impact of accidentalia, therefore detection zone also should not be too little, generally including 10 to 5000 comparison units J is
Can meet requirement (if each comparison unit J be a pixel cell 1, now the size of detection zone in several millimeters to several centimeters
Between).
S103, the image for contrasting each comparison unit J and adjacent contrast unit J successively, are designated as one if comparing result difference
Individual defect.
That is, similarly to the prior art, successively by the figure of the image of each comparison unit J and adjacent comparison unit J
As being contrasted, if it find that the two is different, then it is assumed that existing defects in comparison unit J, number of defects plus one.
Wherein, it is preferred that contrast above includes：The ash of each comparison unit J and the image of adjacent contrast unit J is contrasted successively
Angle value, is designated as a defect if the difference of gray value exceedes threshold value.
That is, the overall intensity object as a comparison of the image of each comparison unit J is can use, if two adjacent contrast's lists
The difference of the overall intensity of the image of first J exceedes predetermined threshold value, then it is assumed that the two is different, is designated as a defect.Wherein, threshold value
Can set as the case may be, such as threshold value can be 20 tonal gradations (by taking 256 tonal gradations altogether as an example), or, threshold
Value is alternatively specific percentage ratio (i.e. with the gray scale of certain comparison unit J as 100%).Why gray scale is preferably adopted for contrast
Object, is that to should be the specific comparison process be existing and fairly simple, easily realizes.
Certainly, the method that the contrast of the above also can take other different, such as color, detailed structure to image etc. are carried out
Contrast.
Meanwhile, " the contrasting successively " of the above may also be employed different methods, and for example, which can be will be adjacent along line direction
Comparison unit J is contrasted successively, or will be contrasted along adjacent comparison unit J of column direction successively, it is also possible to be expert at, column direction
On all contrasted.For another example, for tetra- pixels adjacent successively of ABCD, can be that A, B are contrasted, then C, D are carried out
Contrast；Can also first contrast A, B, then contrast B, C, finally contrast C, D again.
Specifically, each step of the above can be realized by existing exhaustive test.
S104, the defect for comparing detection zone are total with default marginal value, judge to show if defect sum is less than marginal value
Show that substrate has 11 overall disappearance of chock insulator matter.
That is, after the completion of to a detection zone detection, the total number of defect therein can be obtained, it is afterwards that this is total
The number marginal value predetermined with compares, if defect sum is less than the marginal value, then it is assumed that there is chock insulator matter in display base plate
The situation (exposure region for being at least detection zone place has 11 overall disappearance of chock insulator matter) of 11 overall disappearances, if defect sum is big
In equal to marginal value, then it is assumed that it is overall scarce that display base plate (being at least the exposure region that the detection zone is located) does not have chock insulator matter 11
Lose.
Obviously, when there is chock insulator matter 11 (11 overall disappearance of chock insulator matter does not occur) on display base plate, then in comparison unit J
Chock insulator matter position on have a chock insulator matter 11, and in different comparison units J the situation of the distribution of chock insulator matter 11 be it is different (because every
The distribution situation of underbed position is different), so, when being contrasted, the image of many comparison units J all with adjacent contrast unit J
Image difference (being likely to certainly part identical), therefore its defect sum for detecting is inevitable a lot.
And when working as no chock insulator matter 11 (there occurs that chock insulator matter 11 is overall to lack) on display base plate, all comparison units J
In without chock insulator matter 11 (only chock insulator matter position, but chock insulator matter position has no practical structures).As other in each comparison unit J are tied
Structure is all identical, therefore in contrast, in addition to comparison unit J of other defect (such as dust) is implicitly present in individually, other are most
All without detection defect in comparison unit J.And in most cases, the other defect in display base plate be it is little,
It is be up to several in each detection zone.
As can be seen here, when occurring and 11 overall disappearance of chock insulator matter does not occur, detect that the defect number for obtaining can be in magnitude
On have a very big difference, therefore a display base plate (at least exposure of display base plate can be judged by the analysis to defects count
Area) whether there is the overall disappearance of chock insulator matter 11.
Preferably, the span of the marginal value of the above is between 5 to 50.
That is, according to the difference of detection zone, comparison unit J, chock insulator matter cycling element G etc., whether the above is distinguished and is sent out
The marginal value of the defects count of 11 overall disappearance of raw chock insulator matter can be different, but which is generally selected between 5 to 50.
So, the detection method of the present embodiment is capable of achieving the automatic detection to 11 overall disappearance of chock insulator matter, efficiency and reliability
Property is high.
Obviously, the method for the present embodiment is for detecting whether chock insulator matter occurs overall disappearance.Therefore, if it is desirable to,
Also display base plate can be detected with existing method before it or afterwards, to determine the situation of wherein other defect.
The present embodiment also provides a kind of chock insulator matter testing equipment, and which includes：
Image acquisition units, for gathering the image of the detection zone of display base plate, detection zone is located at the display of display base plate
Qu Zhong, has multiple chock insulator matter positions for arranging chock insulator matter in detection zone；
Zoning unit, for detection is divided into multiple identical comparison units, in each comparison unit except dottle pin beyond the region of objective existence its
In his display structure all same, and at least part of comparison unit, the distribution of chock insulator matter position is different；
Comparison unit, for contrasting the image of each comparison unit and adjacent contrast's unit successively, if comparing result difference
It is designated as a defect；
Judging unit, the defect for comparing detection zone are total with default marginal value, if defect sum is less than marginal value
Then judge that display base plate has chock insulator matter and integrally lacks.
The chock insulator matter testing equipment of the present embodiment can carry out above-mentioned detection method, so as to realize that chock insulator matter is integrally lacked
Automatic detection.Meanwhile, the main body of the chock insulator matter testing equipment can be using " exhaustive test machine " (as long as being further added by judging unit i.e.
Can), therefore its cost is relatively low, easily realizes.
It is understood that the embodiment of above principle being intended to be merely illustrative of the present and the exemplary enforcement for adopting
Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention
In the case of god and essence, various modifications and improvement can be made, these modifications and improvement are also considered as protection scope of the present invention.
Claims (10)
1. a kind of dottle pin object detecting method, it is characterised in that include：
The image of the detection zone of collection display base plate, the detection zone are located in the viewing area of display base plate, in the detection zone
With multiple chock insulator matter positions for arranging chock insulator matter；
Multiple identical comparison units are divided into in the detection, in each comparison unit, shows that structure is equal except dottle pin beyond the region of objective existence is other
It is identical, and at least partly distribution difference of chock insulator matter position described in comparison unit；
The image of each comparison unit and adjacent contrast's unit is contrasted successively, if comparing result difference is designated as a defect；
The defect of relatively detection zone is total with default marginal value, if defect sum is less than marginal value judges display base plate
There is chock insulator matter integrally to lack.
2. dottle pin object detecting method according to claim 1, it is characterised in that
Multiple identical chock insulator matter cycling elements are divided in the display, and each chock insulator matter cycling element includes multiple pixel cells
And it is interior have multiple chock insulator matter positions, in each chock insulator matter cycling element, the distribution of chock insulator matter position is identical；Wherein, each pixel cell
By multiple different colours sub-pixel group into；
Each comparison unit includes at least one pixel cell.
3. dottle pin object detecting method according to claim 2, it is characterised in that
In the comparison unit, the number of pixel cell is fewer than the number of pixel cell in chock insulator matter cycling element.
4. dottle pin object detecting method according to claim 3, it is characterised in that
The comparison unit is a pixel cell.
5. dottle pin object detecting method according to claim 1, it is characterised in that
The number of the comparison unit in each described detection zone is between 10 to 5000.
6. dottle pin object detecting method according to claim 1, it is characterised in that
The span of the marginal value is between 5 to 50.
7. dottle pin object detecting method as claimed in any of claims 1 to 6, it is characterised in that described to contrast successively
The image of each comparison unit and adjacent contrast's unit, if comparing result difference being designated as a defect includes：
The gray value of each comparison unit and the image of adjacent contrast's unit is contrasted successively, is designated as if the difference of gray value exceedes threshold value
One defect.
8. dottle pin object detecting method as claimed in any of claims 1 to 6, it is characterised in that
The display base plate includes multiple exposure regions, has at least one detection zone, in the display base plate in each exposure region
Chock insulator matter is formed by exposure technology.
9. dottle pin object detecting method as claimed in any of claims 1 to 6, it is characterised in that
The display base plate is color membrane substrates.
10. a kind of chock insulator matter testing equipment, it is characterised in that include：
Image acquisition units, for gathering the image of the detection zone of display base plate, the detection zone is located at the display of display base plate
Qu Zhong, has multiple chock insulator matter positions for arranging chock insulator matter in the detection zone；
Zoning unit, for by it is described detection divide into multiple identical comparison units, in each comparison unit except dottle pin beyond the region of objective existence its
His display structure all same, and at least partly distribution difference of chock insulator matter position described in comparison unit；
Comparison unit, for contrasting the image of each comparison unit and adjacent contrast's unit successively, is designated as if comparing result difference
One defect；
Judging unit, the defect for comparing detection zone are total with default marginal value, if defect sum is less than marginal value
Then judge that display base plate has chock insulator matter and integrally lacks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410562621.9A CN104375290B (en) | 2014-10-21 | 2014-10-21 | Dottle pin object detecting method and equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410562621.9A CN104375290B (en) | 2014-10-21 | 2014-10-21 | Dottle pin object detecting method and equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104375290A CN104375290A (en) | 2015-02-25 |
| CN104375290B true CN104375290B (en) | 2017-03-29 |
Family
ID=52554310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410562621.9A Expired - Fee Related CN104375290B (en) | 2014-10-21 | 2014-10-21 | Dottle pin object detecting method and equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104375290B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106290036B (en) * | 2016-08-26 | 2019-03-15 | 深圳市华星光电技术有限公司 | The quality detection apparatus of liquid crystal display panel inner support column |
| CN106646935B (en) * | 2016-09-26 | 2023-10-27 | 合肥京东方光电科技有限公司 | Display non-uniformity defect display device, method and detection equipment |
| CN114296278B (en) * | 2021-11-30 | 2023-04-25 | 滁州惠科光电科技有限公司 | Array substrate, display panel and display device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11194349A (en) * | 1998-01-07 | 1999-07-21 | Alps Electric Co Ltd | Spacer distribution device |
| KR20030085734A (en) * | 2002-05-01 | 2003-11-07 | 엘지.필립스 엘시디 주식회사 | Liquid crystal display device |
| JP2006003725A (en) * | 2004-06-18 | 2006-01-05 | Integrated Solutions:Kk | Spacer ejecting apparatus |
| CN103885217A (en) * | 2014-03-10 | 2014-06-25 | 京东方科技集团股份有限公司 | Method and device for detecting liquid crystal display panel column-shaped shock insulator defects |
-
2014
- 2014-10-21 CN CN201410562621.9A patent/CN104375290B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11194349A (en) * | 1998-01-07 | 1999-07-21 | Alps Electric Co Ltd | Spacer distribution device |
| KR20030085734A (en) * | 2002-05-01 | 2003-11-07 | 엘지.필립스 엘시디 주식회사 | Liquid crystal display device |
| JP2006003725A (en) * | 2004-06-18 | 2006-01-05 | Integrated Solutions:Kk | Spacer ejecting apparatus |
| CN103885217A (en) * | 2014-03-10 | 2014-06-25 | 京东方科技集团股份有限公司 | Method and device for detecting liquid crystal display panel column-shaped shock insulator defects |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104375290A (en) | 2015-02-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101769878B (en) | Array tester, method for measuring a point of substrate of the same and method for measuring a position coordinate photographed by a camera assembly | |
| CN103885217B (en) | A kind of method detecting liquid crystal panel cylindrical spacer defect and device | |
| CN104375290B (en) | Dottle pin object detecting method and equipment | |
| EP2378484B1 (en) | Inspection system | |
| CN111341233B (en) | Display panel ghost detection method and detection device | |
| CN106601167A (en) | Gray scale compensation method, apparatus and system of display panel | |
| CN104112763A (en) | Pixel arrangement structure, display device and display method thereof | |
| US20210271122A1 (en) | Detection method and device of display panel and automatic optic inspection apparatus | |
| KR20030089785A (en) | Image quality analysis method and system for display device | |
| CN105404041B (en) | Display base plate motherboard and its manufacture and detection method and display panel motherboard | |
| CN108877615A (en) | The image retention detection method and image retention detection device of display panel | |
| CN104867432A (en) | Method and device for testing splice liquid crystal display | |
| CN108986721B (en) | Detection graph generation method for display panel detection | |
| CN109191386A (en) | A kind of quick Gamma bearing calibration and device based on BPNN | |
| CN104101614B (en) | A kind of detection method and device | |
| CN104658461B (en) | The method of testing of display lighting uniformity | |
| CN102062725A (en) | Non-destructive analysis method for surface pigment characteristics of wall painting in museum | |
| CN105785610A (en) | Test circuit for liquid crystal display panel | |
| CN104576615B (en) | panel device and detection method thereof | |
| CN111061104A (en) | Array substrate defect repairing method and storage medium | |
| CN103713471B (en) | A kind of means for correcting of key size measuring and method | |
| KR101188756B1 (en) | Automatic inspection system for uneven dyeing in the polarizing film and method for inspecting uneven dyeing in the polarizing film using thereof | |
| WO2010146745A1 (en) | Method for inspecting display panel, and method for producing display device | |
| TWI238922B (en) | Manufacturing method of optical device and the defect detection tool used by the same | |
| CN105093631A (en) | Pixel structure, array substrate, display device and sub-pixel rendering method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170329 Termination date: 20201021 |